CN104167225B - A kind of semi-open-type test chassis - Google Patents
A kind of semi-open-type test chassis Download PDFInfo
- Publication number
- CN104167225B CN104167225B CN201310185800.0A CN201310185800A CN104167225B CN 104167225 B CN104167225 B CN 104167225B CN 201310185800 A CN201310185800 A CN 201310185800A CN 104167225 B CN104167225 B CN 104167225B
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- China
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- top panel
- gusset plate
- semi
- open
- pedestal
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Abstract
The present invention relates to a kind of semi-open-type test chassis, including pedestal, gusset plate and top panel, described top panel is connected with pedestal by gusset plate, and described pedestal, gusset plate, top panel enclose and be set as a cavity, described pedestal is provided with testboard, and described top panel is provided with opening.Compared with prior art, the present invention can find to more convenient and quicker the fault of test board, improves maintenance efficiency.
Description
Technical field
The present invention relates to a kind of test chassis, especially relate to a kind of semi-open-type test chassis.
Background technology
At present, high precision measurement equipment is widely used in production, manufacture field, for product test and inspection
Test.Being typically provided with test chassis in existing high precision measurement equipment, test chassis is to be made up of section bar welding,
It is easy to product test.Existing test chassis is usually totally enclosed frame, as it is shown in figure 1, in maintainability test mistake
Cheng Zhonghui causes certain maintenance difficult to Maintenance Engineer: when board has met mistake in energising test process,
Now engineer cannot go to judge the erroneous bearin of board by various measuring instruments in board galvanization and which is
A little electronic devices and components are out of joint.
In order to allow Maintenance Engineer more can find error reason conveniently and efficiently in maintenance process, need test machine
Frame is improved.
Summary of the invention
Defect that the purpose of the present invention is contemplated to overcome above-mentioned prior art to exist and provide a kind of semi-open-type to survey
Test-run a machine frame, can find to more convenient and quicker the fault of test board in maintenance process, improve maintenance efficiency.
The purpose of the present invention can be achieved through the following technical solutions:
A kind of semi-open-type test chassis, including pedestal, gusset plate and top panel, described top panel passes through gusset
Plate is connected with pedestal, and described pedestal, gusset plate, top panel enclose and be set as a cavity, and described pedestal is provided with survey
Test stand, described top panel is provided with opening.
Described opening be shaped as rectangle.
Described opening is provided with 1～3, and distribution is arranged above on plate.
Described gusset plate is provided with the slot for inserting test board.
Described gusset plate is provided with electrical power connection block.
Compared with prior art, the present invention arranges opening on the top panel of test chassis, in maintenance process, and can
Measure when test board is stuck in energising with the most random, solve maintenance personal at maintenance process
In because can not get the data that occur under electrical condition and cannot the difficulty of the quick root of correct decision problem, it is possible to
The real progress accelerating maintenance, it is ensured that the time of shipment.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing test chassis；
Fig. 2 is the structural representation of frame of the present invention.
Detailed description of the invention
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.The present embodiment is with the technology of the present invention side
Implement premised on case, give detailed embodiment and concrete operating process, but the protection model of the present invention
Enclose and be not limited to following embodiment.
As in figure 2 it is shown, a kind of semi-open-type test chassis, including pedestal, gusset plate 1 and top panel 2, described
Top panel 2 be connected with pedestal by gusset plate 1, described pedestal, gusset plate 1, top panel 2 enclose and are set as one
Cavity, described pedestal is provided with testboard, and described top panel 2 is provided with opening 3.Described opening 3
It is shaped as rectangle, 1～3 can be arranged as required to, be distributed on top panel.The present embodiment opening is provided with two.
Described gusset plate is provided with the slot for inserting test board and electrical power connection block.
Using frame of the present invention, Maintenance Engineer the most directly can use measuring instrument under test board card electrical condition
Board is measured, can correctly quickly determine that the root gone wrong in test board, improve maintenance effect
Rate, it is ensured that go out ETCD estimated time of commencing discharging.
Claims (4)
1. a semi-open-type test chassis, including pedestal, gusset plate and top panel, described top panel passes through
Gusset plate is connected with pedestal, and described pedestal, gusset plate, top panel enclose and be set as a cavity, and described pedestal sets
Having testboard, it is characterised in that described top panel is provided with opening, described opening is provided with 1～3, distribution
It is arranged above on plate.
A kind of semi-open-type test chassis the most according to claim 1, it is characterised in that described opening
Be shaped as rectangle.
A kind of semi-open-type test chassis the most according to claim 1, it is characterised in that described gusset
Plate is provided with the slot for inserting test board.
A kind of semi-open-type test chassis the most according to claim 1, it is characterised in that described gusset
Plate is provided with electrical power connection block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310185800.0A CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310185800.0A CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104167225A CN104167225A (en) | 2014-11-26 |
| CN104167225B true CN104167225B (en) | 2016-09-07 |
Family
ID=51911003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310185800.0A Active CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104167225B (en) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100547357C (en) * | 2007-09-27 | 2009-10-07 | 成都多沐汽车工程有限公司 | Measure with the adjustable firmware device that detects support |
| KR100890174B1 (en) * | 2007-10-02 | 2009-03-25 | 주식회사 이노와이어리스 | Measuring instrument with pront panel opened and closed slidably |
| JP2010261947A (en) * | 2009-04-30 | 2010-11-18 | Koh Young Technology Inc | Housing for measuring equipment, and the measuring equipment including the same |
| CN102594962A (en) * | 2012-03-05 | 2012-07-18 | 东莞市每通电子科技有限公司 | Testing system for mobile terminal and testing method thereof |
| CN102901528B (en) * | 2012-09-25 | 2015-04-29 | 昆山荣科钣金科技有限公司 | Testing machine frame and manufacture process thereof |
| CN102879029A (en) * | 2012-09-29 | 2013-01-16 | 苏州新里程电控系统有限公司 | Control wheel debugging table |
-
2013
- 2013-05-17 CN CN201310185800.0A patent/CN104167225B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN104167225A (en) | 2014-11-26 |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |