CN104142481B - LED lamp accelerated ageing, life-span speculate method of testing - Google Patents
LED lamp accelerated ageing, life-span speculate method of testing Download PDFInfo
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- CN104142481B CN104142481B CN201410404327.5A CN201410404327A CN104142481B CN 104142481 B CN104142481 B CN 104142481B CN 201410404327 A CN201410404327 A CN 201410404327A CN 104142481 B CN104142481 B CN 104142481B
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- 230000032683 aging Effects 0.000 title claims abstract description 20
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Abstract
The invention discloses a kind of LED lamp accelerated ageing, the life-span speculates method of testing, comprises the following steps (1) and LED lamp to be measured is arranged on the upper lamp bracket of test box inner tip；(2) alternate of temperature in test box is set and to set 25 days be a season according to Four seasons change at main control unit；(3) setting, according to the actual sunshine time, the time that the electric filament lamp bottom test box is lighted and extinguished, concurrently set the time that LED lamp is lighted and extinguished, LED lamp is lighted corresponding with electric filament lamp extinguishing and the time lighted with the time extinguished；(4) luminosity of LED lamp, colorimetric parameter are sent to spectrogrph by the luminosity sensor in test box, chromaticity transducer, and spectrogrph completes test the collection of data and test data are sent to photoelectric parameter analytic unit；(5) photoelectric parameter analytic unit completes curve matching, and calculates the life-span of LED lamp, to calculate the gained minima life value as LED lamp.The method of testing that the present invention provides, can speculate the life-span of LED lamp.
Description
Technical field
The present invention relates to detect experimental technique field, particularly to a kind of LED lamp accelerated ageing, longevity
Life speculates method of testing.
Background technology
Existing LED lamp accelerated ageing and life-span test system use high-low temperature test chamber according to IES
The requirement of LM-80-08 carries out 55 DEG C in test determination to LED lamp, and 85 DEG C and the 3rd by manufacturing
The temperature that business selects carries out burn-in test, and in whole accelerated ageing is tested, humidity keeps below 65RH
, do not have clear and definite humidity to limit.
And the light-source encapsulation of LED lamp comprises the materials such as LED chip, fluorescent material, colloid.LED
Chip is in addition to sensitive, and the material deformation fatigue of expanding with heat and contract with cold producing variations in temperature is the quickest
Sense.And fluorescent material, colloid are in use more weak to the adaptation ability of environment, low temperature, high temperature, height
Low temperature alternation, humidity, sun exposure, all can produce large effect to fluorescent material and colloid, thus produce
The third contact of a total solar or lunar eclipse declines.
LED lamp, in addition to light source, also comprises driving power supply, drive power source life in addition to sensitive,
Low temperature, high/low temperature change impacts, on-off times, electrical network interference, humidity also had sensitivity.
Summary of the invention
Based on the problems referred to above, it is an object of the present invention to provide a kind of LED lamp accelerated ageing, life-span supposition
Test device, this test device can simulate LED lamp practical service environment so that test gained LED
The data of lamp life reflect the actually used performance of LED lamp more accurately.
It is a further object of the present invention to provide a kind of LED lamp accelerated ageing, life-span estimation method.
In order to overcome the deficiencies in the prior art, present invention provide the technical scheme that
A kind of LED lamp accelerated ageing, life-span speculate test device, it is characterised in that: include test
Case and the control device being connected with described test box, arrange lamp bracket and lower lamp bracket, institute in described test box
Stating lamp bracket and described lower lamp bracket is respectively provided with several lamp installation stations, described upper lamp bracket is used for installing
LED lamp, described lower lamp bracket is used for installing electric filament lamp, arranges temperature sensor in described test box,
On described lower lamp bracket, luminosity, chromaticity transducer are set；Described control device includes,
Main control unit, it is used for issuing control command, receives, stores test data；
Photoelectric parameter analytic unit, is used for the control to test environment conditions and completes to test dividing of data
Analysis calculates；
Spectrogrph, for gathering the test data of luminous flux, electrical quantity and color temperature parameters and being transferred to described
Photoelectric parameter analytic unit；
Switch control unit, for realizing the Automated condtrol to lamp circuit；
Described photoelectric parameter analytic unit, spectrogrph and switch control unit are with described main control unit communication even
Connecing, described temperature sensor is connected with described photoelectric parameter analytic unit signal, and described luminosity, colourity pass
Sensor is connected with described spectrogrph signal, described upper lamp bracket and described lower lamp bracket and described switch control unit
Electrical connection.
Further, described photoelectric parameter analytic unit includes fitting module, calculates module and test environment
Control module；Described fitting module has been used for LED lamp luminous flux and has maintained characteristic curve, temperature special
Linearity curve, humiture characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp merit
The matching of rate light varience curve；Described reckoning module pushes away according to the curve of described fitting module matching gained
Calculate the life-span of LED lamp, using wherein minima as calculating result；Described environmental control module is used for
The practical service environment of simulation LED lamp, including high temperature, low temperature, high/low temperature change impacts, humidity
Change, lamp switch number of times and sunlight.
As total inventive concept, the present invention a kind of LED lamp accelerated ageing, life-span estimation method,
It comprises the following steps:
(1) LED lamp to be measured is arranged on the upper lamp bracket of test box inner tip；
(2) set the alternate of temperature in described test box according to Four seasons change at main control unit and set
Fixed 25 days is a season；
(3) according to the actual sunshine time set the electric filament lamp bottom described test box light and extinguish time
Between, concurrently setting the time that LED lamp is lighted and extinguished, LED lamp is lighted and time of extinguishing is with white
Vehement lamp extinguishes corresponding with the time lighted, and i.e. when electric filament lamp is lighted, LED lamp is extinguished, and when white heat
When lamp extinguishes, LED lamp is lighted；
(4) luminosity sensor in described test box, chromaticity transducer are by the luminosity of LED lamp, colourity
Parameter is sent to spectrogrph, and described spectrogrph completes test the collection of data and test data are sent to light
Electrical parameter analysis unit；
(5) described photoelectric parameter analytic unit completes LED lamp luminous flux and maintains characteristic curve, temperature spy
Linearity curve, humiture characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp merit
The matching of rate light varience curve, and the life-span of the curve calculating LED lamp according to matching, to calculate
Obtain the minima life value as LED lamp.
Compared with prior art, the invention have the advantage that
(1) using technical scheme, the test device and method that the present invention provides can be simulated
LED lamp practical service environment, the simulation high temperature in the four seasons, low temperature, the change of high/low temperature change impacts,
Lamp switch number of times and the sunlight impact on the LED lamp life-span, the most accurately speculate
The LED lamp life-span；
(2) use technical scheme, LED lamp is installed in test box, passes through master control
Unit issues test command can carry out LED lamp accelerated ageing and life-span and speculate, whole-course automation,
Test acquired results is quick and precisely.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical scheme of the embodiment of the present invention, institute in embodiment being described below
Needing the accompanying drawing used to be briefly described, the accompanying drawing in describing below is only some enforcements of the present invention
Example, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to
Other accompanying drawing is obtained according to these accompanying drawings.
Fig. 1 is LED lamp accelerated ageing in the present invention, the structure of life-span supposition test device embodiment
Schematic diagram；
Wherein, 1, test box；11, LED lamp；12, electric filament lamp；13, luminosity sensor；14、
Chromaticity transducer；2, device is controlled；21, main control unit；22, photoelectric parameter analytic unit；23、
Spectrogrph；24, switch control unit.
Detailed description of the invention
Below in conjunction with specific embodiment, such scheme is described further.Should be understood that these embodiments are
For illustrating that the present invention is not limited to limit the scope of the present invention.The implementation condition used in embodiment is permissible
Condition according to concrete producer does adjustment further, and not marked implementation condition is usually in normal experiment
Condition.
See Fig. 1, speculate that test device is implemented for one LED lamp accelerated ageing of the present invention, life-span
The structural representation of example, it includes test box 1 and the control device 2 being connected with test box 1, test box
1 for LED lamp accelerated ageing, the life-span speculate test, be provided with in test box 1 lamp bracket and under
Being respectively equipped with several lamp installation stations on lamp bracket, upper lamp bracket and lower lamp bracket, upper lamp bracket is used for installing
LED lamp 11, lower lamp bracket is used for installing electric filament lamp 12, and LED lamp 11 is relative with electric filament lamp 12 to be set
Put, electric filament lamp 12 is installed and is used for testing the sunlight impact on LED lamp 11 life-span, simultaneously can root
According to the switch of electric filament lamp 12 simulate LED lamp 11 actually used during on-off times to its life-span
Impact.
It is provided with temperature sensor, in order to monitor the temperature in test box, it is simple to control device in test box 1
2 control the temperature in test box according to the actually used operating mode of LED lamp 11；Lower lamp bracket is provided with light
Degree sensor 13 and chromaticity transducer 14, in order to luminosity during detection LED lamp 11 uses in real time
Change with colourity also sends data to control device 2.
Control device 2 and include main control unit 21, photoelectric parameter analytic unit 22, spectrogrph 23 and switch
Control unit 24, main control unit 21 and photoelectric parameter analytic unit 22, spectrogrph 23 and on-off control
Between unit 24, communication connects；Wherein, main control unit 21 is industrial PC, is used for issuing control command,
Receive, data are tested in storage.
Photoelectric parameter analytic unit 22, is used for the control to test environment conditions and completes to test data
Analytical calculation, concrete it includes fitting module, calculates module and test environment control module；Temperature,
Humidity sensor is connected with photoelectric parameter analytic unit 22 signal, is passed by the temperature data in test box 1
Give test environment control module, with the control survey LED lamp 11 temperature in the case of actually used；Intend
Compound module has been used for LED lamp 11 luminous flux and has maintained characteristic curve, temperature characteristics, humiture
Characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp power light varience curve
Matching；Calculate the module life-span according to the curve calculating LED lamp of fitting module matching gained, with
Wherein minima is as calculating result；And environmental control module is for simulating the actually used of LED lamp
Environment, including high temperature, low temperature, the change of high/low temperature change impacts, lamp switch number of times and sunlight
Impact on LED lamp service life.
Spectrogrph 23, it connects with the luminosity sensor 13 in test box 1 and chromaticity transducer 14 signal
Connect, for gathering the test data of luminous flux, electrical quantity and color temperature parameters and being transferred to photoelectric parameter analysis
Unit 22, by matching and the reckoning of photoelectric parameter analytic unit 22 complete pairwise testing data.
Switch control unit 24, for realizing the Automated condtrol to lamp circuit, it includes that 16 tunnels are opened
Closing and control circuit, wherein 1～12 tunnels are the LED lamp circuit of upper lamp bracket, and 13～16 tunnels are lower lamp bracket
Electric filament lamp circuit, LED lamp 11 is set and lights and time of extinguishing extinguishes and point with electric filament lamp 12
The bright time is corresponding, and i.e. when electric filament lamp 12 is lighted, LED lamp 11 is extinguished, and when electric filament lamp 12
During extinguishing, LED lamp 11 is lighted, so lighting and extinguishing simulated solar irradiation pair by electric filament lamp 12
The impact in LED lamp 11 service life, also can detect switch lamp number of times simultaneously and make LED lamp 11
With the impact in life-span.
Below for using the LED lamp accelerated ageing of above-mentioned test device, life-span to speculate method of testing,
Comprise the following steps:
(1) LED lamp to be measured is arranged on the upper lamp bracket of test box inner tip；
(2) set the alternate of temperature in test box according to Four seasons change at main control unit and set 25
It is a season；
(3) set, according to the actual sunshine time, the time that the electric filament lamp bottom test box is lighted and extinguished, with
Time set LED lamp time of lighting and extinguishing, LED lamp is lighted and time of extinguishing puts out with electric filament lamp
The time gone out and light is corresponding, and i.e. when electric filament lamp is lighted, LED lamp is extinguished, and when electric filament lamp extinguishes
Time LED lamp light；
(4) luminosity sensor in test box, chromaticity transducer are by the luminosity of LED lamp, colorimetric parameter
Being sent to spectrogrph, described spectrogrph completes test the collection of data and test data are sent to photoelectricity ginseng
Number analytic unit；
(5) photoelectric parameter analytic unit completes LED lamp luminous flux and maintains characteristic curve, temperature characterisitic song
Line, humiture characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp power light
The matching of degree change curve, and life-span of the curve calculating LED lamp according to matching, to calculate that gained is
Little value is as the life value of LED lamp.
Said method can realize the accelerated ageing of LED lamp, during 2400 hours can simulate throughout the year
The variations in temperature impact on the LED lamp life-span, shortens the testing time relative to prior art；Pass through
The matching to test data of the photoelectric parameter analytic unit, and according to the matched curve life-span to LED lamp
Calculating, overall process realizes automatic test and reckoning, and test result is quick and precisely.
Examples detailed above only for technology design and the feature of the present invention are described, its object is to allow and is familiar with this skill
The people of art is to will appreciate that present disclosure and implement according to this, can not limit the protection of the present invention with this
Scope.All equivalent transformations done according to spirit of the invention or modification, all should contain the present invention's
Within protection domain.
Claims (2)
1. a LED lamp accelerated ageing, life-span speculate method of testing, it is characterised in that: use
LED lamp accelerated ageing, life-span speculate that test device detects, and comprise the following steps,
(1) LED lamp to be measured is arranged on the upper lamp bracket of test box inner tip；
(2) set the alternate of temperature in test box according to Four seasons change at main control unit and set 25
It is a season；
(3) set, according to the actual sunshine time, the time that the electric filament lamp bottom test box is lighted and extinguished, with
Time set LED lamp time of lighting and extinguishing, LED lamp is lighted and time of extinguishing puts out with electric filament lamp
The time gone out and light is corresponding, and i.e. when electric filament lamp is lighted, LED lamp is extinguished, and when electric filament lamp extinguishes
Time LED lamp light；
(4) luminosity sensor in test box, chromaticity transducer are by the luminosity of LED lamp, colorimetric parameter
Being sent to spectrogrph, spectrogrph completes to test the collection of data and test data are sent to photoelectric parameter to divide
Analysis unit；
(5) photoelectric parameter analytic unit completes LED lamp luminous flux and maintains characteristic curve, temperature characterisitic
Curve, humiture characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp power
The matching of light varience curve, and the life-span of the curve calculating LED lamp according to matching, to calculate
Obtain the minima life value as LED lamp；
Described LED lamp accelerated ageing, the life-span speculate test device, including test box and with described survey
The control device that examination case connects, arranges lamp bracket and lower lamp bracket, described upper lamp bracket and institute in described test box
Stating lower lamp bracket and be respectively provided with several lamp installation stations, described upper lamp bracket has for mounted LED lamp,
Described lower lamp bracket is used for installing electric filament lamp, arranges temperature sensor, on described lower lamp bracket in described test box
Luminosity, chromaticity transducer are set；Described control device includes,
Main control unit, it is used for issuing control command, receives, stores test data；
Photoelectric parameter analytic unit, is used for the control to test environment conditions and completes to test dividing of data
Analysis calculates；
Spectrogrph, for gathering the test data of luminous flux, electrical quantity and color temperature parameters and being transferred to described
Photoelectric parameter analytic unit；
Switch control unit, for realizing the Automated condtrol to lamp circuit；
Described photoelectric parameter analytic unit, spectrogrph and switch control unit are with described main control unit communication even
Connecing, described temperature sensor is connected with described photoelectric parameter analytic unit signal, and described luminosity, colourity pass
Sensor is connected with described spectrogrph signal, described upper lamp bracket and described lower lamp bracket and described switch control unit
Electrical connection.
LED lamp accelerated ageing the most according to claim 1, life-span speculate method of testing, its
It is characterised by: described photoelectric parameter analytic unit includes fitting module, calculates that module and test environment control
Module；
Described fitting module be used for LED lamp luminous flux maintain characteristic curve, temperature characteristics,
Humiture characteristic curve, color temperature characteristic curve, lamp Power x Time change curve and lamp power luminosity become
Change the matching of curve；
Described reckoning module is according to the longevity of the curve calculating LED lamp of described fitting module matching gained
Life, using wherein minima as calculating result；
Described environmental control module is for simulating the practical service environment of LED lamp, including high temperature, low
Temperature, the change of high/low temperature change impacts, humidity, lamp switch number of times and sunlight.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410404327.5A CN104142481B (en) | 2014-08-15 | LED lamp accelerated ageing, life-span speculate method of testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410404327.5A CN104142481B (en) | 2014-08-15 | LED lamp accelerated ageing, life-span speculate method of testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104142481A CN104142481A (en) | 2014-11-12 |
| CN104142481B true CN104142481B (en) | 2017-01-04 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288389A (en) * | 2011-05-11 | 2011-12-21 | 杭州远方光电信息股份有限公司 | Light source aging test measuring device |
| CN103267954A (en) * | 2013-04-19 | 2013-08-28 | 深圳莱特光电有限公司 | Feed and detection method of LED luminous energy and illuminating system |
| CN203721160U (en) * | 2013-12-31 | 2014-07-16 | 工业和信息化部电子第五研究所 | OLED module aging service life test system |
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288389A (en) * | 2011-05-11 | 2011-12-21 | 杭州远方光电信息股份有限公司 | Light source aging test measuring device |
| CN103267954A (en) * | 2013-04-19 | 2013-08-28 | 深圳莱特光电有限公司 | Feed and detection method of LED luminous energy and illuminating system |
| CN203721160U (en) * | 2013-12-31 | 2014-07-16 | 工业和信息化部电子第五研究所 | OLED module aging service life test system |
Non-Patent Citations (1)
| Title |
|---|
| 影响LED灯具寿命主要因素的分析;黄林木;《成都工业学院学报》;20140630;第17卷(第2期);第55-57页 * |
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