CN104112267B - 一种简易、精确采集平面作品尺度信息的方法 - Google Patents
一种简易、精确采集平面作品尺度信息的方法 Download PDFInfo
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- CN104112267B CN104112267B CN201310138169.9A CN201310138169A CN104112267B CN 104112267 B CN104112267 B CN 104112267B CN 201310138169 A CN201310138169 A CN 201310138169A CN 104112267 B CN104112267 B CN 104112267B
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- 238000000034 method Methods 0.000 title claims abstract description 28
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CN104112267B true CN104112267B (zh) | 2018-01-23 |
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US10630895B2 (en) | 2017-09-11 | 2020-04-21 | Qualcomm Incorporated | Assist for orienting a camera at different zoom levels |
CN108647578B (zh) * | 2018-04-12 | 2021-10-29 | 朱建宗 | 一种对书画艺术品实物进行信息采集和识别验证的方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1298800A (zh) * | 2000-12-29 | 2001-06-13 | 北京清华试金石新技术有限公司 | 利用物体本身的显微状态进行防伪的方法 |
JP2008082740A (ja) * | 2006-09-26 | 2008-04-10 | Toshiba Corp | 半導体装置のパターン欠陥検査方法 |
CN101566581A (zh) * | 2009-05-27 | 2009-10-28 | 深圳市美威数控技术有限公司 | 一种自动光学检测方法及系统 |
CN102636120A (zh) * | 2012-05-10 | 2012-08-15 | 吴晓 | Led芯片视觉伺服二次定位系统及其定位方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1298800A (zh) * | 2000-12-29 | 2001-06-13 | 北京清华试金石新技术有限公司 | 利用物体本身的显微状态进行防伪的方法 |
JP2008082740A (ja) * | 2006-09-26 | 2008-04-10 | Toshiba Corp | 半導体装置のパターン欠陥検査方法 |
CN101566581A (zh) * | 2009-05-27 | 2009-10-28 | 深圳市美威数控技术有限公司 | 一种自动光学检测方法及系统 |
CN102636120A (zh) * | 2012-05-10 | 2012-08-15 | 吴晓 | Led芯片视觉伺服二次定位系统及其定位方法 |
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