CN104111384A - Electronic device testing system and method - Google Patents
Electronic device testing system and method Download PDFInfo
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- CN104111384A CN104111384A CN201310135250.1A CN201310135250A CN104111384A CN 104111384 A CN104111384 A CN 104111384A CN 201310135250 A CN201310135250 A CN 201310135250A CN 104111384 A CN104111384 A CN 104111384A
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Abstract
Provided is an electronic device testing system that comprises an outputting module, a calculating module, an analyzing module, and a determining module. The outputting module is used for outputting predetermined voltage to an electronic device when the electronic device is not connected with a display and one output port of a graphic card is connected with a testing tool. The calculating module is used for calculating the current value of the graphic card. The analyzing module is used for acquiring the current value of the graphic card within a predetermined time segment and determining the distributed data, in multiple predetermined current segments, of the acquired current value. The determining module is used for determining that the electronic device operates normally when the determined distributed data is consistent with predetermined reference data within an error range or that the electronic device is abnormal when the determined distributed data is not consistent with the predetermined reference data within the error range. The invention also provides an electronic device testing method. The electronic device can be tested while not connected with the display by using the electronic device testing system and the electronic device testing method.
Description
Technical field
The present invention relates to measuring technology, relate in particular to a kind of system and method that electronic installation is tested.
Background technology
For example, in the time that electronic installation (, computing machine, server, workstation etc.) is carried out to burn-in test, normally this electronic installation is not connected with display.But if do not connect display, the equipment such as video card can not be exported, cannot make display system be operated under predetermined power, thereby affect the test result of display system.
Recoverable extremely identification and solution that also can occur test in time under the situation that does not connect display in addition.
Summary of the invention
In view of above content, be necessary to provide a kind of electronic device test system and method, can, under the condition of not connection of electronic devices and display, complete the test to electronic installation.
A kind of electronic device test method, described electronic installation comprises video card and memory storage, described memory device stores described electronic installation while being connected with display under predetermined voltage output described display distribution of current data within a predetermined period of time, using described distributed data as with reference to data, the method comprises: in the time that described electronic installation does not connect display, an output port of described video card is connected with measurement jig; Export described predetermined voltage to described electronic installation; Calculate the current value of described video card; Obtain the current value of the described video card in predetermined amount of time; Definite current value obtaining is at the distributed data of multiple predetermined current sections; Judge that whether determined distributed data is consistent in error range with described reference data; And in the time that determined distributed data and described reference data are consistent in error range, determine that described electronic installation normally moves; Or when inconsistent in error range, determine that described electronic installation occurs abnormal in determined distributed data and described reference data.
A kind of electronic device test system, described electronic installation comprises video card and memory storage, described memory device stores described electronic installation while being connected with display under predetermined voltage output described display distribution of current data within a predetermined period of time, using described distributed data as with reference to data, this system comprises: output module, while being connected with measurement jig for do not connect an output port of display and described video card at described electronic installation, export described predetermined voltage to described electronic installation; Computing module, for calculating the current value of described video card; Analysis module, for obtaining the current value of the described video card in predetermined amount of time, and definite current value obtaining is at the distributed data of multiple predetermined current sections; And judge module, for in the time that determined distributed data and described reference data are consistent in error range, determine that described electronic installation normally moves, or when inconsistent in error range, determine that described electronic installation occurs abnormal in determined distributed data and described reference data.
Compared to prior art, described electronic device test system and method, can make display system in electronic installation (for example, the display devices such as video card) simulate the condition that described electronic installation connects display, thereby under the condition of not connection of electronic devices and display, just can judge whether normal operation of described electronic installation according to the current data of video card, to complete the test to electronic installation.
Brief description of the drawings
Fig. 1 is the first test environment schematic diagram of the preferred embodiments of electronic device test system of the present invention.
Fig. 2 is the second test environment schematic diagram of the preferred embodiments of electronic device test system of the present invention.
Fig. 3 is the functional block diagram of the preferred embodiments of electronic device test system of the present invention.
Fig. 4 is the current value schematic diagram of the preferred embodiments of electronic device test system of the present invention.
Fig. 5 is the reference data setting procedure figure of the preferred embodiments of electronic device test method of the present invention.
Fig. 6 is the process flow diagram of the preferred embodiments of electronic device test method of the present invention.
Main element symbol description
| Electronic installation | 1 |
| Electronic device test system | 10 |
| Module is set | 100 |
| Output module | 102 |
| Computing module | 104 |
| Analysis module | 106 |
| Judge module | 108 |
| Processor | 12 |
| Memory storage | 14 |
| Video card | 16 |
| Display | 2 |
| Measurement jig | 3 |
Following embodiment further illustrates the present invention in connection with above-mentioned accompanying drawing.
Embodiment
Fig. 1 is the first test environment schematic diagram of the preferred embodiments of electronic device test system of the present invention.Fig. 2 is the second test environment schematic diagram of the preferred embodiments of electronic device test system of the present invention.For the ease of understanding, below Fig. 1, Fig. 2, Fig. 3 are combined and described.
As shown in Figure 3, be the functional block diagram of the preferred embodiments of electronic device test system of the present invention.Described electronic device test system 10 is applied in electronic installation 1, and described electronic installation 1 can be the equipment such as computing machine, server, workstation (Workstation).
As shown in Figure 1, described electronic installation 1 is connected with display 2.As shown in Figure 2, described electronic installation 1 disconnection is connected with described display 2, then the video card 16 in described electronic installation 1 is connected with measurement jig 3.Described measurement jig 3 can be video card loop (video graphics array (VGA) loopback).
In this preferred embodiments, described electronic device test system 10 is in the time that described electronic installation 1 is connected with described display 2, under predetermined condition, obtain multiple current values of this display 2, determine the distributed data of this current value obtaining according to default multiple electric current sections, and using this distributed data as with reference to data.Further, described electronic device test system 10 is also in the time that described electronic installation 1 disconnects with described display 2, and in the time that described video card 16 is connected with described measurement jig 3, under above-mentioned predetermined condition, obtain multiple current values of video card 16, and whether the multiple current values that judge this video card 16 obtaining are consistent in error range with described reference data at the distributed data of described multiple electric current sections, thereby judge the whether normally operation of described electronic installation 1.
Utilize described electronic device test system 10 can make display system in described electronic installation 1 (for example, the display devices such as video card) simulate the condition that described electronic installation 1 connects described display 2, thus guarantee not connect at described electronic installation 1 accuracy of the test to described electronic installation 1 under the condition of described display 2.
Described electronic installation 1 also comprises processor 12, such as, for carrying out all kinds of softwares of described electronic device test system 10 and the 1 interior installation of described electronic installation, operating system etc.Described memory storage 14 can be hard disk, or the storage card of other types or memory device.Described memory storage 14 is for storing Various types of data, for example, test data, utilizes the information such as the set and data obtained of described electronic device test system 10.
As shown in Figure 2, be the functional block diagram of the preferred embodiments of electronic device test system of the present invention.Described electronic device test system 10 comprises multiple functional modules, respectively: module 100, output module 102, computing module 104, analysis module 106 and judge module 108 are set.
The described module 100 that arranges, for the required all kinds of parameters of test process are set, specifically describes in connection with following description the setting of parameter.
First, judge the whether normally operation of described electronic installation 1 for the ease of follow-up according to measurement data, reference data need to be first set and carry out follow-up comparison as standard.
In this preferred embodiments, described reference data is to obtain in the time that described electronic installation 1 is connected with described display 2.
Described output module 102, in the time that described electronic installation 1 is connected with described display 2, output predetermined voltage is to described electronic installation 1.Described output module 102 can utilize power management bus (Power Management Bus) (for example to export described predetermined voltage, 12 volts) to described electronic installation 1, in addition, in other embodiments, described output module 102 also can be controlled normal power cord output predetermined voltage to described electronic installation 1.
Described computing module 104, for calculating described display 2 multiple current values within a predetermined period of time.For example, described computing module 104 can utilize the survey instrument of software or example, in hardware directly to read corresponding current value from described display 2.In addition, described computing module 104 also can read from described power management bus the total current of described electronic installation 1, and the electric current that described total current is deducted to all the other elements in described electronic installation 1 is to determine the electric current (below will describe in detail) of described display 2.
Described analysis module 106, for determining that the current value of described display 2 is at the distributed data of multiple predetermined current sections.For example, multiple electric current sections can be set to [0,1], [2,4], [5,12], [13, *].Described * can be for to be greater than arbitrary natural number of 13, and described multiple electric current sections are only given an example for the ease of hereinafter illustrating, in practical application, are not limited to this.
Described distributed data is illustrated in the quantity of the current value of described display 2 included in each electric current section, for example, comprises 8 current values in electric current section [5,12], comprises 2 current values etc. in electric current section [0,1].
Described analysis module 106 is also set to reference data for described distributed data, and by extremely described memory storage 14 of this reference data storage.
Predetermined voltage, predetermined amount of time and predetermined current section mentioned above can utilize the described module 100 that arranges to set in advance and revise.
Complete after setting to reference data and storage, disconnect being connected of described electronic installation 1 and described display 2, an output port of described video card 16 is being connected with described measurement jig 3.
Described output module 102, also for example, for exporting described predetermined voltage (, 12 volts) to described electronic installation 1.
Described computing module 104, for calculating the current value of described video card 16.Described computing module 104 can read from described power management bus the total current of described electronic installation 1, and the electric current that described total current is deducted to all the other elements in described electronic installation 1 is to determine the electric current of described display 2.For example, because processor and hard disk electric current can directly measure, and the wattage of the wattage (for example, 5 watts) of internal memory in the mainboard of described electronic installation 1, north and south bridge chip (for example, 10 watts) etc. be confirmable, the rotating speed of fan is also to can be used as to calculate the basis of corresponding electric current.
Therefore, in described electronic installation 1, the electric current of all the other elements can calculate.Then the electric current that, total current is deducted to all the other elements in described electronic installation 1 just can be determined the current value of described video card.
For example, with reference in current value schematic diagram as shown in Figure 4, described computing module 104 calculates multiple current values of described video card 16.
Described analysis module 106, also for example, for obtaining the current value of the described video card 16 in described predetermined amount of time (, 48 hours), and definite current value obtaining is at the distributed data of multiple predetermined current sections.In practical application, described analysis module 106 can arbitrarily intercept the current value of the video card 16 in predetermined amount of time.
Described judge module 108, whether consistent in error range with described reference data for judging determined distributed data.In the time that determined distributed data and described reference data are consistent in error range, described judge module 108 determines that described electronic installation 1 normally moves.In determined distributed data and described reference data, when inconsistent in error range, described judge module 108 determines that described electronic installation 1 occurs abnormal.Described error range can be set in advance and be revised by the described module 100 that arranges.For example, described error range can be ± 5.
For example, for example, in the time that obtained current value is less than or equal to the first threshold values (, 1 ampere), described judge module 108 determines that deadlock event occurred described electronic installation 1 in test process.
At obtained current value, for example, when pre-set interval (, 2 amperes to 4 amperes), described judge module 108 determines that colored screen event occurred described electronic installation 1 in test process.
While again variation after obtained current value reaches zero, described judge module 108 determines that overweight notice part occurs described electronic installation 1 in test process.
While no longer variation after obtained current value reaches zero, described judge module 108 determines that described electronic installation 1 is out of service.
The parameters such as the first threshold values, pre-set interval mentioned above all can be preset, revise or be deleted by the described module 100 that arranges.
As shown in Figure 5, be the reference data setting procedure figure of the preferred embodiments of electronic device test method of the present invention.First, step S2, described output module 102 is in the time that described electronic installation 1 is connected with described display 2, and output predetermined voltage is to described electronic installation 1.
Step S4, described computing module 104 calculates described display 2 multiple current values within a predetermined period of time.
Step S6, described analysis module 106 determines that the current value of described display 2 is at the distributed data of multiple predetermined current sections.
Step S8, the described described distributed data of analysis module 106 is set to reference data, and by extremely described memory storage 14 of this reference data storage.
Step S10, disconnects being connected of described electronic installation 1 and described display 2, then, and process ends.
As shown in Figure 6, be the process flow diagram of the preferred embodiments of electronic device test method of the present invention.First, step S12, connects output port and the described measurement jig 3 of described video card 16.
Step S14, described output module 102 is exported described predetermined voltage (for example, 12 volts) to described electronic installation 1.
Step S16, described computing module 104 calculates the current value of described video card 16.
Step S18, described analysis module 106 obtains the current value of for example, described video card 16 in described predetermined amount of time (, 48 hours).
Step S20, the described definite current value obtaining of analysis module 106 is at the distributed data of multiple predetermined current sections.
Step S22, described judge module 108 judges that whether determined distributed data is consistent in error range with described reference data.
In the time that determined distributed data and described reference data are consistent in error range, execution step S24, or in the time that determined distributed data and described reference data are inconsistent in error range, perform step S26.
Step S24, described judge module 108 determines that described electronic installation 1 normally moves, then, process ends.
Step S26, it is abnormal that described judge module 108 determines that described electronic installation 1 occurs, then, process ends.
Above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although the present invention is had been described in detail with reference to above preferred embodiments, those of ordinary skill in the art should be appreciated that and can modify or be equal to the spirit and scope that replacement should not depart from technical solution of the present invention technical scheme of the present invention.
Claims (10)
1. an electronic device test method, described electronic installation comprises video card and memory storage, it is characterized in that, described memory device stores described electronic installation while being connected with display under predetermined voltage output described display distribution of current data within a predetermined period of time, using described distributed data as with reference to data, the method comprises:
In the time that described electronic installation does not connect display, an output port of described video card is connected with measurement jig;
Export described predetermined voltage to described electronic installation;
Calculate the current value of described video card;
Obtain the current value of the described video card in predetermined amount of time;
Definite current value obtaining is at the distributed data of multiple predetermined current sections;
Judge that whether determined distributed data is consistent in error range with described reference data; And
In the time that determined distributed data and described reference data are consistent in error range, determine that described electronic installation normally moves; Or
When inconsistent in error range, determine that described electronic installation occurs abnormal in determined distributed data and described reference data.
2. electronic device test method as claimed in claim 1, is characterized in that, described reference data is obtained as follows:
Connect described electronic installation and display, export described predetermined voltage to described electronic installation;
Calculate described display current value within a predetermined period of time;
Determine that the current value of described display is at the distributed data of described multiple electric current sections;
Described distributed data is set to reference data; And
Disconnect being connected of described display and described electronic installation.
3. electronic device test method as claimed in claim 1 or 2, is characterized in that, the step of the current value of the described described video card of calculating comprises:
Read the total current of described electronic installation from power management bus; And
Described total current is deducted to the electric current of all the other elements in described electronic installation to determine the electric current of described video card.
4. electronic device test method as claimed in claim 1 or 2, is characterized in that, in determined distributed data and described reference data, when inconsistent in error range, the method also comprises:
In the time that obtained current value is less than or equal to the first threshold values, determine that deadlock event occurred described electronic installation in test process;
During in pre-set interval, determine that flower screen event occurred described electronic installation in test process at obtained current value;
While again variation, determine that overweight notice part occurs described electronic installation in test process after obtained current value reaches zero; Or
While no longer variation, determine that described electronic installation is out of service after obtained current value reaches zero.
5. electronic device test method as claimed in claim 1 or 2, is characterized in that, described measurement jig is video card loop.
6. an electronic device test system, described electronic installation comprises video card and memory storage, it is characterized in that, described memory device stores described electronic installation while being connected with display under predetermined voltage output described display distribution of current data within a predetermined period of time, using described distributed data as with reference to data, this system comprises:
Output module, while being connected, exports described predetermined voltage to described electronic installation for do not connect an output port of display and described video card at described electronic installation with measurement jig;
Computing module, for calculating the current value of described video card;
Analysis module, for obtaining the current value of the described video card in predetermined amount of time, and definite current value obtaining is at the distributed data of multiple predetermined current sections; And
Judge module, for in the time that determined distributed data and described reference data are consistent in error range, determine that described electronic installation normally moves, or when inconsistent in error range, determine that described electronic installation occurs abnormal in determined distributed data and described reference data.
7. electronic device test system as claimed in claim 6, is characterized in that, described reference data is obtained in the following way:
Described output module, in the time that described electronic installation is connected with display, is exported described predetermined voltage to described electronic installation;
Described computing module calculates described display current value within a predetermined period of time;
Described analysis module determines that the current value of described display is at the distributed data of described multiple electric current sections, and described distributed data is set to reference data.
8. the electronic device test system as described in claim 6 or 7, it is characterized in that, described computing module reads the total current of described electronic installation from power management bus, and the electric current that described total current is deducted to all the other elements in described electronic installation is to determine the electric current of described video card.
9. the electronic device test system as described in claim 6 or 7, is characterized in that, in determined distributed data and described reference data when inconsistent in error range, described judge module also for:
In the time that obtained current value is less than or equal to the first threshold values, determine that deadlock event occurred described electronic installation in test process;
During in pre-set interval, determine that flower screen event occurred described electronic installation in test process at obtained current value;
While again variation, determine that overweight notice part occurs described electronic installation in test process after obtained current value reaches zero; Or
While no longer variation, determine that described electronic installation is out of service after obtained current value reaches zero.
10. the electronic device test system as described in claim 6 or 7, is characterized in that, described measurement jig is video card loop.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310135250.1A CN104111384A (en) | 2013-04-18 | 2013-04-18 | Electronic device testing system and method |
| TW102114207A TW201502768A (en) | 2013-04-18 | 2013-04-22 | System and method for testing electronic devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310135250.1A CN104111384A (en) | 2013-04-18 | 2013-04-18 | Electronic device testing system and method |
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| Publication Number | Publication Date |
|---|---|
| CN104111384A true CN104111384A (en) | 2014-10-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310135250.1A Pending CN104111384A (en) | 2013-04-18 | 2013-04-18 | Electronic device testing system and method |
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| CN (1) | CN104111384A (en) |
| TW (1) | TW201502768A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105842554A (en) * | 2016-01-29 | 2016-08-10 | 维沃移动通信有限公司 | Hardware failure detection method and detection system for intelligent terminal and intelligent terminal |
-
2013
- 2013-04-18 CN CN201310135250.1A patent/CN104111384A/en active Pending
- 2013-04-22 TW TW102114207A patent/TW201502768A/en unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105842554A (en) * | 2016-01-29 | 2016-08-10 | 维沃移动通信有限公司 | Hardware failure detection method and detection system for intelligent terminal and intelligent terminal |
| CN105842554B (en) * | 2016-01-29 | 2019-01-11 | 维沃移动通信有限公司 | Hardware fault detection method, detection system and the intelligent terminal of intelligent terminal |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201502768A (en) | 2015-01-16 |
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Application publication date: 20141022 |