CN104101810B - A kind of testing circuit based on LED group and detector - Google Patents
A kind of testing circuit based on LED group and detector Download PDFInfo
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- CN104101810B CN104101810B CN201310127738.XA CN201310127738A CN104101810B CN 104101810 B CN104101810 B CN 104101810B CN 201310127738 A CN201310127738 A CN 201310127738A CN 104101810 B CN104101810 B CN 104101810B
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Abstract
The present invention is applicable to circuit field, particularly relates to a kind of testing circuit based on LED group and detector.When power switch circuit controls main switch (switch K1) Guan Bi, circuit and square-wave produces square-wave signal, the square wave number of the square-wave signal that D flip chip U2 produces according to circuit and square-wave, control the first switching tube, second switch pipe, the 3rd switching tube, the conducting of the 4th switching tube, each light sensitive diode circuit in the welding circuit of detection LED group, ensure that the welding quality of each light sensitive diode circuit, quality testing efficiency is high, and saves human and material resources.
Description
Technical field
The invention belongs to circuit field, particularly relate to a kind of testing circuit based on LED group and detector.
Background technology
Along with the development of science and technology, LED lamp is as novel, environmental protection, electricity-saving lamp that volume is little
Tool, is widely used and is applied to every field；Especially, along with the raising of quality of life, light fixture is as one
Environmental decoration product and welcome, therefore, people are more and more higher to the prescription of LED group；Existing inspection
Surveying the detection mode of the quality of LED group, also rest on use circuit tester detection, detection efficiency is low, and waste is big
Amount manpower and materials, and easily flase drop.
Summary of the invention
It is an object of the invention to provide a kind of testing circuit based on LED group, it is desirable to provide a kind of to welding
LED group circuit carry out the circuit of Intelligent Measurement.
The present invention is achieved in that a kind of testing circuit based on LED group, described based on LED group
The input of testing circuit and outfan connect power circuit and the welding circuit of LED group respectively, described based on
The testing circuit of LED group includes:
Power switch circuit, circuit and square-wave, divider resistance R5, divider resistance R6, divider resistance R7, point
Piezoresistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17, point
Leakage resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, the first switch
Pipe, second switch pipe, the 3rd switching tube, the 4th switching tube and D flip chip U2；
Described power switch circuit connects described power circuit and described circuit and square-wave, described divider resistance respectively
First end of R11 and the second end meet described power switch circuit and first end of described switch K2, institute respectively
State between the second end and the ground that divider resistance R9 is connected to described switch K2, second end of described switch K2
Connect the reset pin RESET of described D flip chip U2, first end and second of described divider resistance R5
End connects the triggering pin CLK of described circuit and square-wave and described D flip chip U2, described divider resistance respectively
R6, filter capacitor C3 are connected between triggering pin CLK and the ground of described D flip chip U2 respectively,
Described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described divider resistance
R7 is connected between replacement pin EN and the ground of described D flip chip U2, and described divider resistance R8 is even
Being connected on the carry pin COUT of described D flip chip U2 and reset between pin EN, described D triggers
Power pins VDD of chip U2 connects described power switch circuit, the grounding lead of described D flip chip U2
Foot VSS ground connection, described shunt resistance R16 is connected to first output pin of described D flip chip U2
Between the control end of Q0 and described first switching tube, described shunt resistance R17 is connected to described D and triggers core
Between second output pin Q1 and the control end of described second switch pipe of sheet U2, described shunt resistance R18
Be connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube control end it
Between, described shunt resistance R19 is connected to the 4th output pin Q3 of described D flip chip U2 with described
Between the control end of the 4th switching tube, the cold end of described first switching tube, described second switch pipe low
Potential end, the cold end of described 3rd switching tube, the equal ground connection of cold end of described 4th switching tube, institute
State the hot end of the first switching tube, the hot end of described second switch pipe, the height of described 3rd switching tube
Potential end, the hot end of described 4th switching tube all connect the welding circuit of described LED group.
The present invention also provides for a kind of detector, and described detector includes power circuit and detection based on LED group
Circuit, the input of described testing circuit based on LED group and outfan connect respectively described power circuit and
The welding circuit of LED group, described testing circuit based on LED group includes:
Power switch circuit, circuit and square-wave, divider resistance R5, divider resistance R6, divider resistance R7, point
Piezoresistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17, point
Leakage resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, the first switch
Pipe, second switch pipe, the 3rd switching tube, the 4th switching tube and D flip chip U2；
Described power switch circuit connects described power circuit and described circuit and square-wave, described divider resistance respectively
First end of R11 and the second end meet described power switch circuit and first end of described switch K2, institute respectively
State between the second end and the ground that divider resistance R9 is connected to described switch K2, second end of described switch K2
Connect the reset pin RESET of described D flip chip U2, first end and second of described divider resistance R5
End connects the triggering pin CLK of described circuit and square-wave and described D flip chip U2, described divider resistance respectively
R6, filter capacitor C3 are connected between triggering pin CLK and the ground of described D flip chip U2 respectively,
Described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described divider resistance
R7 is connected between replacement pin EN and the ground of described D flip chip U2, and described divider resistance R8 is even
Being connected on the carry pin COUT of described D flip chip U2 and reset between pin EN, described D triggers
Power pins VDD of chip U2 connects described power switch circuit, the grounding lead of described D flip chip U2
Foot VSS ground connection, described shunt resistance R16 is connected to first output pin of described D flip chip U2
Between the control end of Q0 and described first switching tube, described shunt resistance R17 is connected to described D and triggers core
Between second output pin Q1 and the control end of described second switch pipe of sheet U2, described shunt resistance R18
Be connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube control end it
Between, described shunt resistance R19 is connected to the 4th output pin Q3 of described D flip chip U2 with described
Between the control end of the 4th switching tube, the cold end of described first switching tube, described second switch pipe low
Potential end, the cold end of described 3rd switching tube, the equal ground connection of cold end of described 4th switching tube, institute
State the hot end of the first switching tube, the hot end of described second switch pipe, the height of described 3rd switching tube
Potential end, the hot end of described 4th switching tube all connect the welding circuit of described LED group.
In the present invention, when power switch circuit controls main switch (switch K1) Guan Bi, circuit and square-wave is produced
Raw square-wave signal, the square wave number of the square-wave signal that D flip chip U2 produces according to circuit and square-wave, control
First switching tube, second switch pipe, the 3rd switching tube, the conducting of the 4th switching tube, the weldering of detection LED group
Each light sensitive diode circuit in connection circuit, it is ensured that the welding quality of each light sensitive diode circuit, matter
Amount detection efficiency is high, and saves human and material resources.
Accompanying drawing explanation
Fig. 1 is the circuit structure diagram of the testing circuit based on LED group that the embodiment of the present invention provides；
Fig. 2 is the circuit diagram of the testing circuit based on LED group that the embodiment of the present invention provides；
Fig. 3 is the circuit diagram of the testing circuit based on LED group that another embodiment of the present invention provides；
Fig. 4 is the flow chart of the detection method of the testing circuit based on LED group that the embodiment of the present invention provides.
Detailed description of the invention
In order to make the purpose of the present invention, technical scheme and advantage clearer, below in conjunction with accompanying drawing and reality
Execute example, the present invention is further elaborated.Only should be appreciated that specific embodiment described herein
Only in order to explain the present invention, it is not intended to limit the present invention.
Fig. 1 shows the structure of the testing circuit based on LED group that the embodiment of the present invention provides, for the ease of
Illustrating, illustrate only the part relevant to the embodiment of the present invention, details are as follows.
A kind of testing circuit based on LED group, the input of described testing circuit based on LED group and defeated
Going out end and connect power circuit and the welding circuit of LED group respectively, described testing circuit based on LED group includes:
Power switch circuit 1, circuit and square-wave 2, divider resistance R5, divider resistance R6, divider resistance R7,
Divider resistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17,
Shunt resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, first open
Close pipe 31, second switch pipe the 32, the 3rd switching tube the 33, the 4th switching tube 34 and D flip chip U2；
Described power switch circuit 1 connects described power circuit and described circuit and square-wave 2, described dividing potential drop electricity respectively
First end and second end of resistance R11 connect described power switch circuit 1 and first end of described switch K2 respectively,
Described divider resistance R9 is connected between the second end and the ground of described switch K2, the second of described switch K2
Terminate the reset pin RESET of described D flip chip U2, first end of described divider resistance R5 and
Two ends connect the triggering pin CLK of described circuit and square-wave 2 and described D flip chip U2, described dividing potential drop respectively
Resistance R6, filter capacitor C3 are connected to triggering pin CLK and the ground of described D flip chip U2 respectively
Between, described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described point
Piezoresistance R7 is connected between replacement pin EN and the ground of described D flip chip U2, described divider resistance
R8 is connected to the carry pin COUT of described D flip chip U2 and resets between pin EN, described D
Power pins VDD of flip chip U2 connects described power switch circuit 1, described D flip chip U2's
Grounding pin VSS ground connection, described shunt resistance R16 is connected to first output of described D flip chip U2
Between the control end of pin Q0 and described first switching tube 31, described shunt resistance R17 is connected to described D
Between second output pin Q1 and the control end of described second switch pipe 32 of flip chip U2, described point
Leakage resistance R18 is connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube
Between the control end of 33, described shunt resistance R19 is connected to the 4th output of described D flip chip U2 and draws
Between the control end of foot Q3 and described 4th switching tube 34, the cold end of described first switching tube 31,
The cold end of described second switch pipe 32, the cold end of described 3rd switching tube 33, the described 4th open
Close the equal ground connection of cold end of pipe 34, the hot end of described first switching tube 31, described second switch pipe
The hot end of 32, the hot end of described 3rd switching tube 33, the high potential of described 4th switching tube 34
End all connects the welding circuit of described LED group.
Fig. 2 shows the physical circuit of the testing circuit based on LED group that the embodiment of the present invention provides, in order to
Being easy to explanation, illustrate only the part relevant to the embodiment of the present invention, details are as follows.
As one embodiment of the invention, described power switch circuit 1 includes:
Diode D1, rechargeable battery BT, switch K1, filter capacitor C1, divider resistance R10 and photosensitive
Diode (LED) 5；
The anode of described diode D1 and negative electrode are just meeting described power circuit and described rechargeable battery BT respectively
Pole, the negative pole of described rechargeable battery BT ground connection and described power circuit, first end of described switch K1 respectively
Connect the positive pole of described rechargeable battery BT, described filter capacitor C1 be connected to second end of described switch K1 with
Between ground, described divider resistance R10 is connected to second end of described switch K1 and described light sensitive diode
The anode of LED5, the minus earth of described light sensitive diode LED5, second end of described switch K1 is respectively
Connect described circuit and square-wave 2 and first end of described divider resistance R11.
As one embodiment of the invention, described circuit and square-wave 2 includes:
Divider resistance R3, divider resistance R4, feedback resistance R1, feedback resistance R2, operation amplifier chip
U1 and polar capacitor C2；
Described divider resistance R3 is connected to second end of described switch K1 with described operation amplifier chip U1's
Between positive pole input pin VI+, described divider resistance R4 is connected to the positive pole of described operation amplifier chip U1
Between input pin VI+ and ground, described feedback resistance R1 is connected to the output of described operation amplifier chip U1
Between pin VOUT and positive pole input pin VI+, described feedback resistance R2 is connected to described operation amplifier
Between the output pin VOUT and negative pole input pin VI-of chip U1, the positive pole of described polar capacitor C2
Negative pole input pin VI-and ground, the described operation amplifier core of described operation amplifier chip U1 is connect respectively with negative pole
The output pin VOUT of sheet U1 connects first end of described divider resistance R5.
As one embodiment of the invention, described first switching tube 31 uses NPN type triode Q1, described
The colelctor electrode of NPN type triode Q1, base stage, emitter stage are respectively the high potential of described first switching tube 31
End, control end, cold end；
As one embodiment of the invention, described second switch pipe 32 uses NPN type triode Q2, described
The colelctor electrode of NPN type triode Q2, base stage, emitter stage are respectively the high potential of described second switch pipe 32
End, control end, cold end；
As one embodiment of the invention, described 3rd switching tube 33 uses NPN type triode Q3, described
The colelctor electrode of NPN type triode Q3, base stage, emitter stage are respectively the high potential of described 3rd switching tube 33
End, control end, cold end；
As one embodiment of the invention, described 4th switching tube 34 uses NPN type triode Q4, described
The colelctor electrode of NPN type triode Q4, base stage, emitter stage are respectively the high potential of described 4th switching tube 34
End, control end, cold end.
Fig. 3 shows the physical circuit of the testing circuit based on LED group that the embodiment of the present invention provides, in order to
Being easy to explanation, illustrate only the part relevant to the embodiment of the present invention, details are as follows.
As another embodiment of the present invention, described first switching tube 31 uses N-type metal-oxide-semiconductor Q5, described
The drain electrode of N-type metal-oxide-semiconductor Q5, grid, source electrode be respectively described first switching tube 31 hot end,
Control end, cold end；
As another embodiment of the present invention, described second switch pipe 32 uses N-type metal-oxide-semiconductor Q6, described
The drain electrode of N-type metal-oxide-semiconductor Q6, grid, source electrode be respectively described second switch pipe 32 hot end,
Control end, cold end；
As another embodiment of the present invention, described 3rd switching tube 33 uses N-type metal-oxide-semiconductor Q7, described
The drain electrode of N-type metal-oxide-semiconductor Q7, grid, source electrode be respectively described 3rd switching tube 33 hot end,
Control end, cold end；
As another embodiment of the present invention, described 4th switching tube 34 uses N-type metal-oxide-semiconductor Q8, described
The drain electrode of N-type metal-oxide-semiconductor Q8, grid, source electrode be respectively described 4th switching tube 34 hot end,
Control end, cold end.
As another embodiment of the present invention, present invention also offers a kind of detector, described detector includes electricity
Source circuit and testing circuit based on LED group, the input of described testing circuit based on LED group and defeated
Go out end and connect described power circuit and the welding circuit of LED group, described testing circuit based on LED group respectively
Including:
Power switch circuit 1, circuit and square-wave 2, divider resistance R5, divider resistance R6, divider resistance R7,
Divider resistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17,
Shunt resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, first open
Close pipe 31, second switch pipe the 32, the 3rd switching tube the 33, the 4th switching tube 34 and D flip chip U2；
Described power switch circuit 1 connects described power circuit and described circuit and square-wave 2, described dividing potential drop electricity respectively
First end and second end of resistance R11 connect described power switch circuit 1 and first end of described switch K2 respectively,
Described divider resistance R9 is connected between the second end and the ground of described switch K2, the second of described switch K2
Terminate the reset pin RESET of described D flip chip U2, first end of described divider resistance R5 and
Two ends connect the triggering pin CLK of described circuit and square-wave 2 and described D flip chip U2, described dividing potential drop respectively
Resistance R6, filter capacitor C3 are connected to triggering pin CLK and the ground of described D flip chip U2 respectively
Between, described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described point
Piezoresistance R7 is connected between replacement pin EN and the ground of described D flip chip U2, described divider resistance
R8 is connected to the carry pin COUT of described D flip chip U2 and resets between pin EN, described D
Power pins VDD of flip chip U2 connects described power switch circuit 1, described D flip chip U2's
Grounding pin VSS ground connection, described shunt resistance R16 is connected to first output of described D flip chip U2
Between the control end of pin Q0 and described first switching tube 31, described shunt resistance R17 is connected to described D
Between second output pin Q1 and the control end of described second switch pipe 32 of flip chip U2, described point
Leakage resistance R18 is connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube
Between the control end of 33, described shunt resistance R19 is connected to the 4th output of described D flip chip U2 and draws
Between the control end of foot Q3 and described 4th switching tube 34, the cold end of described first switching tube 31,
The cold end of described second switch pipe 32, the cold end of described 3rd switching tube 33, the described 4th open
Close the equal ground connection of cold end of pipe 34, the hot end of described first switching tube 31, described second switch pipe
The hot end of 32, the hot end of described 3rd switching tube 33, the high potential of described 4th switching tube 34
End all connects the welding circuit of described LED group.
As another embodiment of the present invention, described power switch circuit 1 includes:
Diode D1, rechargeable battery BT, switch K1, filter capacitor C1, divider resistance R10 and photosensitive
Diode (LED) 5；
The anode of described diode D1 and negative electrode are just meeting described power circuit and described rechargeable battery BT respectively
Pole, the negative pole of described rechargeable battery BT ground connection and described power circuit, first end of described switch K1 respectively
Connect the positive pole of described rechargeable battery BT, described filter capacitor C1 be connected to second end of described switch K1 with
Between ground, described divider resistance R10 is connected to second end of described switch K1 and described light sensitive diode
The anode of LED5, the minus earth of described light sensitive diode LED5, second end of described switch K1 is respectively
Connect described circuit and square-wave 2 and first end of described divider resistance R11.
As another embodiment of the present invention, described circuit and square-wave 2 includes:
Divider resistance R3, divider resistance R4, feedback resistance R1, feedback resistance R2, operation amplifier chip
U1 and polar capacitor C2；
Described divider resistance R3 is connected to second end of described switch K1 with described operation amplifier chip U1's
Between positive pole input pin VI+, described divider resistance R4 is connected to the positive pole of described operation amplifier chip U1
Between input pin VI+ and ground, described feedback resistance R1 is connected to the output of described operation amplifier chip U1
Between pin VOUT and positive pole input pin VI+, described feedback resistance R2 is connected to described operation amplifier
Between the output pin VOUT and negative pole input pin VI-of chip U1, the positive pole of described polar capacitor C2
Negative pole input pin VI-and ground, the described operation amplifier core of described operation amplifier chip U1 is connect respectively with negative pole
The output pin VOUT of sheet U1 connects first end of described divider resistance R5.
As another embodiment of the present invention, described first switching tube 31 uses NPN type triode Q1, described
The colelctor electrode of NPN type triode Q1, base stage, emitter stage are respectively the high potential of described first switching tube 31
End, control end, cold end；
As another embodiment of the present invention, described second switch pipe 32 uses NPN type triode Q2, described
The colelctor electrode of NPN type triode Q2, base stage, emitter stage are respectively the high potential of described second switch pipe 32
End, control end, cold end；
As another embodiment of the present invention, described 3rd switching tube 33 uses NPN type triode Q3, described
The colelctor electrode of NPN type triode Q3, base stage, emitter stage are respectively the high potential of described 3rd switching tube 33
End, control end, cold end；
As another embodiment of the present invention, described 4th switching tube 34 uses NPN type triode Q4, described
The colelctor electrode of NPN type triode Q4, base stage, emitter stage are respectively the high potential of described 4th switching tube 34
End, control end, cold end.
As another embodiment of the present invention, described first switching tube 31 uses N-type metal-oxide-semiconductor Q5, described
The drain electrode of N-type metal-oxide-semiconductor Q5, grid, source electrode be respectively described first switching tube 31 hot end,
Control end, cold end；
As another embodiment of the present invention, described second switch pipe 32 uses N-type metal-oxide-semiconductor Q6, described
The drain electrode of N-type metal-oxide-semiconductor Q6, grid, source electrode be respectively described second switch pipe 32 hot end,
Control end, cold end；
As another embodiment of the present invention, described 3rd switching tube 33 uses N-type metal-oxide-semiconductor Q7, described
The drain electrode of N-type metal-oxide-semiconductor Q7, grid, source electrode be respectively described 3rd switching tube 33 hot end,
Control end, cold end；
As another embodiment of the present invention, described 4th switching tube 34 uses N-type metal-oxide-semiconductor Q8, described
The drain electrode of N-type metal-oxide-semiconductor Q8, grid, source electrode be respectively described 4th switching tube 34 hot end,
Control end, cold end.
In order to preferably explain the present invention, with operation amplifier chip U1 use operation amplifier chip LM258,
As a example by D flip chip U2 uses D flip chip CD4017, in conjunction with Fig. 2, illustrate based on LED group
The operation principle of testing circuit:
Power switch circuit 1 provides a main switch (switch K1), is controlled based on LED by this main switch
Whether the testing circuit of group works；Specifically, when switching K1 and disconnecting, circuit and square-wave 2 and D triggers
Chip U2 does not has power supply to power, and quits work, do not have simultaneously yet supply voltage through divider resistance R10 to
Light sensitive diode LED5 powers, and the light sensitive diode LED5 accordingly, as power supply indicator is non-lit up,
When switching K1 Guan Bi, the light sensitive diode LED5 as power supply indicator lights.
It addition, in order to keep testing circuit based on LED group the most normally to work, the present invention uses charged electrical
Pond BT, while testing circuit based on LED group is powered, goes back external power supply circuit；Power circuit is permissible
Charge to rechargeable battery BT, it is also possible to directly power to testing circuit based on LED group；More optimizedly,
In order to prevent the high level output pin of power circuit and low level output pin respectively with the negative pole of rechargeable battery
With positive pole incorrect link, damage rechargeable battery, the invention provides diode D1, it is ensured that the height of power circuit
Level output pin connects the positive pole of rechargeable battery by diode D1, it is achieved the protection to rechargeable battery BT.
When switching K1 first closure, the high level of second end of switch K1 is through divider resistance R3 and divides
After piezoresistance R4 dividing potential drop, provide divider resistance to the positive pole input pin VI+ of operation amplifier chip LM258
The voltage at R4 two ends, at this moment, the negative pole input pin VI-of operation amplifier chip LM258 is low level, fortune
The output pin VOUT calculating amplification chip LM258 exports high level signal；Operation amplifier chip LM258
Output pin VOUT by feedback resistance R2 to polar capacitor C2 charge, by operation amplifier chip
The output pin VOUT that the negative pole input pin VI-of LM258 charges to operation amplifier chip LM258 is defeated
The high voltage gone out, meanwhile, the output pin VOUT of operation amplifier chip LM258 is through feedback resistance R1
With divider resistance R4 dividing potential drop, therefore, the voltage of the positive pole input pin VI+ of operation amplifier chip LM258
The voltage of the negative pole input pin VI-less than operation amplifier chip LM258, thus, operation amplifier chip
The output pin VOUT output low level signal of LM258, at this moment, polar capacitor C2 is through feedback resistance
R2 discharges, until the voltage at divider resistance R4 two ends is higher than the voltage at polar capacitor C2 two ends, computing is put
The output pin VOUT of large chip LM258 exports high level signal；By that analogy, this circuit and square-wave 2
Persistently produce square-wave signal.
In the present embodiment, the welding circuit 4 of described LED group includes: divider resistance R17, divider resistance
R18, divider resistance R19, light sensitive diode LED1, light sensitive diode LED2, light sensitive diode LED3,
Light sensitive diode LED4, test point 41, test point 42, test point 43, test point 44, pad 45；
Wherein, divider resistance R17 is connected between the anode of power supply VCC1 and light sensitive diode LED1, dividing potential drop
Resistance R18 is connected between the anode of power supply VCC1 and light sensitive diode LED2, and divider resistance R19 is even
It is connected between the anode of power supply VCC1 and light sensitive diode LED3, the sun of described light sensitive diode LED4
Pole and negative electrode connect between pad 45 and ground respectively.Below with to the test point 41 of welding, survey on pcb board
As a example by pilot 42, test point 43, test point 44 detect successively, details are as follows:
By the colelctor electrode of NPN type triode Q1, the colelctor electrode of NPN type triode Q2, NPN type three pole
The colelctor electrode of pipe Q3, the colelctor electrode of NPN type triode Q4 connect test point 41, test point 42 respectively, survey
Pilot 43, test point 44.
This circuit and square-wave 2 is sent out to the triggering pin CLK of D flip chip CD4017 through divider resistance R5
Send square-wave signal, when the triggering pin CLK of D flip chip CD4017 receives the upper of this square-wave signal
Rise along time, count value is added 1 by D flip chip CD4017；When count value is followed successively by 1,2,3,4,
The first output pin Q0 of D flip chip CD4017, the second output pin Q1, the 3rd output pin Q2,
4th output pin Q3 exports high level the most one by one, thus, NPN type triode Q1, NPN type three
Pole pipe Q2, NPN type triode Q3, NPN type triode Q4 turn on the most one by one, test the most one by one
Test point 41, test point 42, test point 43, test point 44；When light sensitive diode LED1 does not works,
There is the situations such as wrong weldering, rosin joint in the light sensitive diode LED1 then not worked, similarly, when to light sensitive diode
During LED2, light sensitive diode LED3 detection, if situation about not working occurs, there is mistake weldering, rosin joint too
Etc. situation；When light sensitive diode LED1, light sensitive diode LED2, light sensitive diode LED3 exist two
When individual and above light sensitive diode is lighted simultaneously, then there is even weldering in the light sensitive diode that mistake is lighted；When to survey
When pilot 44 detects, if light sensitive diode LED4 lights, then represent light sensitive diode LED4 and there is even weldering
Situation, if light sensitive diode LED4 is non-lit up, then light sensitive diode LED4 welding is normal.
Preferably, before detecting the welding circuit 4 of LED group, Guan Bi switch K2, logical in advance
Cross divider resistance R11, the circuit of switch K2, divider resistance R9 composition, to D flip chip CD4017
Reset pin RESET provide high level signal, count value is set to 0 by D flip chip CD4017.
Preferably, when count value is reached pre-set count values by D flip chip CD4017, (this presets counting
Value for user as required, the parameter configuration of D flip chip CD4017 preset, in the present embodiment,
This pre-set count values is set to 10) time, the high electricity of carry pin COUT output of D flip chip CD4017
Flat, thus, the voltage at divider resistance R7 two ends is set to high level, and D flip chip CD4017 is by count value
Set to 0.
Fig. 4 is the flow chart of the detection method of the testing circuit based on LED group that the embodiment of the present invention provides,
For the ease of describing, illustrate only the part relevant to the embodiment of the present invention.
Operation amplifier chip LM258, D flip chip U2 is used to use D to touch with operation amplifier chip U1
As a example by sending out chip CD4017, the testing circuit based on LED group provided in conjunction with Fig. 2, to based on LED
The detection method of the testing circuit of group describes in detail, specific as follows:
Step S101, power switch circuit is powered to circuit and square-wave and control circuit.
Described control circuit includes: divider resistance R5, divider resistance R6, divider resistance R7, divider resistance
R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17, shunt resistance
R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, NPN type triode
Q1, NPN type triode Q2, NPN type triode Q3, NPN type triode Q4 and D flip chip
CD4017；First end of described divider resistance R11 and the second end connect described power switch circuit and described respectively
First end of switch K2, described divider resistance R9 is connected between the second end and the ground of described switch K2,
The reset pin RESET of the second described D flip chip CD4017 of termination of described switch K2, described point
First end of piezoresistance R5 and the second end meet described circuit and square-wave and described D flip chip CD4017 respectively
Triggering pin CLK, described divider resistance R6, filter capacitor C3 be connected to respectively described D trigger core
Between triggering pin CLK and the ground of sheet CD4017, described filter capacitor C4 is connected to described divider resistance
Between first end and the ground of R11, described divider resistance R7 is connected to described D flip chip CD4017's
Resetting between pin EN and ground, described divider resistance R8 is connected to described D flip chip CD4017's
Between carry pin COUT and replacement pin EN, the power pins of described D flip chip CD4017
VDD connects described power switch circuit, the grounding pin VSS ground connection of described D flip chip CD4017,
Described shunt resistance R16 is connected to the first output pin Q0 of described D flip chip CD4017 with described
Between the base stage of NPN type triode Q1, described shunt resistance R17 is connected to described D flip chip
Between second output pin Q1 and the base stage of described NPN type triode Q2 of CD4017, described shunting
Resistance R18 is connected to the 3rd output pin Q2 of described D flip chip CD4017 and described NPN type three
Between the base stage of pole pipe Q3, described shunt resistance R19 is connected to the of described D flip chip CD4017
Between four output pin Q3 and the base stage of described NPN type triode Q4, described NPN type triode Q1
Emitter stage, the emitter stage of described NPN type triode Q2, the emitter stage of described NPN type triode Q3,
The equal ground connection of emitter stage of described NPN type triode Q4, the colelctor electrode of described NPN type triode Q1, institute
State the colelctor electrode of NPN type triode Q2, the colelctor electrode of described NPN type triode Q3, described NPN
The colelctor electrode of type audion Q4 all connects the welding circuit of described LED group.
Power switch circuit provides a main switch (switch K1), is controlled based on LED by this main switch
Whether the testing circuit of group works；Specifically, when switching K1 and disconnecting, circuit and square-wave and control circuit
Do not have power supply to power, quit work, do not have supply voltage through divider resistance R10 to photosensitive two poles simultaneously yet
Pipe LED5 powers, and the light sensitive diode LED5 accordingly, as power supply indicator is non-lit up, as switch K1
During Guan Bi, the light sensitive diode LED5 as power supply indicator lights.
Step S102, circuit and square-wave produces square-wave signal.
When switching K1 first closure, the high level of second end of switch K1 is through divider resistance R3 and divides
After piezoresistance R4 dividing potential drop, provide divider resistance to the positive pole input pin VI+ of operation amplifier chip LM258
The voltage at R4 two ends, at this moment, the negative pole input pin VI-of operation amplifier chip LM258 is low level, fortune
The output pin VOUT calculating amplification chip LM258 exports high level signal；Operation amplifier chip LM258
Output pin VOUT by feedback resistance R2 to polar capacitor C2 charge, by operation amplifier chip
The output pin VOUT that the negative pole input pin VI-of LM258 charges to operation amplifier chip LM258 is defeated
The high voltage gone out, meanwhile, the output pin VOUT of operation amplifier chip LM258 is through feedback resistance R1
With divider resistance R4 dividing potential drop, therefore, the voltage of the positive pole input pin VI+ of operation amplifier chip LM258
The voltage of the negative pole input pin VI-less than operation amplifier chip LM258, thus, operation amplifier chip
The output pin VOUT output low level signal of LM258, at this moment, polar capacitor C2 is through feedback resistance
R2 discharges, until the voltage at divider resistance R4 two ends is higher than the voltage at polar capacitor C2 two ends, computing is put
The output pin VOUT of large chip LM258 exports high level signal；By that analogy, this circuit and square-wave is held
Continuous generation square-wave signal.
Step S103, the square wave number of the square-wave signal that control circuit produces according to circuit and square-wave, it is right to control
The welding circuit of LED group carries out fault detect.
In the present embodiment, with on pcb board welding test point 41, test point 42, test point 43,
As a example by test point 44 detects successively, details are as follows:
This circuit and square-wave sends to the triggering pin CLK of D flip chip CD4017 through divider resistance R5
Square-wave signal, when the triggering pin CLK of D flip chip CD4017 receives the rising of this square-wave signal
Along time, count value is added 1 by D flip chip CD4017；When count value is followed successively by 1,2,3,4, D
The first output pin Q0 of flip chip CD4017, the second output pin Q1, the 3rd output pin Q2,
4th output pin Q3 exports high level the most one by one, thus, NPN type triode Q1, NPN type three
Pole pipe Q2, NPN type triode Q3, NPN type triode Q4 turn on the most one by one, test the most one by one
Test point 41, test point 42, test point 43, test point 44；When light sensitive diode LED1 does not works,
There is the situations such as wrong weldering, rosin joint in the light sensitive diode LED1 then not worked, similarly, when to light sensitive diode
During LED2, light sensitive diode LED3 detection, if situation about not working occurs, there is mistake weldering, rosin joint too
Etc. situation；When light sensitive diode LED1, light sensitive diode LED2, light sensitive diode LED3 exist two
When individual and above light sensitive diode is lighted simultaneously, then there is even weldering in the light sensitive diode that mistake is lighted；When to survey
When pilot 44 detects, if light sensitive diode LED4 lights, then represent light sensitive diode LED4 and there is even weldering
Situation, if light sensitive diode LED4 is non-lit up, then light sensitive diode LED4 welding is normal.
Preferably, before being detected the welding circuit of LED group by control circuit, Guan Bi is opened in advance
Close K2, by divider resistance R11, the circuit of switch K2, divider resistance R9 composition, trigger core to D
The reset pin RESET of sheet CD4017 provides high level signal, and D flip chip CD4017 is by count value
Set to 0.
Preferably, when count value is reached pre-set count values by D flip chip CD4017, (this presets counting
Value for user as required, the actual permission situation of D flip chip CD4017 presets, in this enforcement
In example, this pre-set count values is set to 10) time, the carry pin COUT of D flip chip CD4017 is defeated
Go out high level, thus, the voltage at divider resistance R7 two ends is set to high level, D flip chip CD4017
Count value is set to 0.
In embodiments of the present invention, when power switch circuit controls main switch (switch K1) Guan Bi, square wave
Circuit generation square-wave signal, the square wave number of the square-wave signal that D flip chip U2 produces according to circuit and square-wave,
Control the first switching tube, second switch pipe, the 3rd switching tube, the conducting of the 4th switching tube, detect LED group
Welding circuit in each light sensitive diode circuit, it is ensured that the welding quality of each light sensitive diode circuit,
Quality testing efficiency is high, and saves human and material resources.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all at this
Any amendment, equivalent and the improvement etc. made within bright spirit and principle, should be included in the present invention
Protection domain within.
Claims (10)
1. a testing circuit based on LED group, the input of described testing circuit based on LED group and
Outfan connects power circuit and the welding circuit of LED group respectively, it is characterised in that described based on LED group
Testing circuit include:
Power switch circuit, circuit and square-wave, divider resistance R5, divider resistance R6, divider resistance R7, point
Piezoresistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17, point
Leakage resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, the first switch
Pipe, second switch pipe, the 3rd switching tube, the 4th switching tube and D flip chip U2；
Described power switch circuit connects described power circuit and described circuit and square-wave, described divider resistance respectively
First end of R11 and the second end meet described power switch circuit and first end of described switch K2, institute respectively
State between the second end and the ground that divider resistance R9 is connected to described switch K2, second end of described switch K2
Connect the reset pin RESET of described D flip chip U2, first end and second of described divider resistance R5
End connects the triggering pin CLK of described circuit and square-wave and described D flip chip U2, described divider resistance respectively
R6, filter capacitor C3 are connected between triggering pin CLK and the ground of described D flip chip U2 respectively,
Described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described divider resistance
R7 is connected between replacement pin EN and the ground of described D flip chip U2, and described divider resistance R8 is even
Being connected on the carry pin COUT of described D flip chip U2 and reset between pin EN, described D triggers
Power pins VDD of chip U2 connects described power switch circuit, the grounding lead of described D flip chip U2
Foot VSS ground connection, described shunt resistance R16 is connected to first output pin of described D flip chip U2
Between the control end of Q0 and described first switching tube, described shunt resistance R17 is connected to described D and triggers core
Between second output pin Q1 and the control end of described second switch pipe of sheet U2, described shunt resistance R18
Be connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube control end it
Between, described shunt resistance R19 is connected to the 4th output pin Q3 of described D flip chip U2 with described
Between the control end of the 4th switching tube, the cold end of described first switching tube, described second switch pipe low
Potential end, the cold end of described 3rd switching tube, the equal ground connection of cold end of described 4th switching tube, institute
State the hot end of the first switching tube, the hot end of described second switch pipe, the height of described 3rd switching tube
Potential end, the hot end of described 4th switching tube all connect the welding circuit of described LED group.
2. testing circuit based on LED group as claimed in claim 1, it is characterised in that described power supply
On-off circuit includes:
Diode D1, rechargeable battery BT, switch K1, filter capacitor C1, divider resistance R10 and photosensitive
Diode (LED) 5；
The anode of described diode D1 and negative electrode are just meeting described power circuit and described rechargeable battery BT respectively
Pole, the negative pole of described rechargeable battery BT ground connection and described power circuit, first end of described switch K1 respectively
Connect the positive pole of described rechargeable battery BT, described filter capacitor C1 be connected to second end of described switch K1 with
Between ground, described divider resistance R10 is connected to second end of described switch K1 and described light sensitive diode
The anode of LED5, the minus earth of described light sensitive diode LED5, second end of described switch K1 is respectively
Connect described circuit and square-wave and first end of described divider resistance R11.
3. testing circuit based on LED group as claimed in claim 2, it is characterised in that described square wave
Circuit includes:
Divider resistance R3, divider resistance R4, feedback resistance R1, feedback resistance R2, operation amplifier chip
U1 and polar capacitor C2；
Described divider resistance R3 is connected to second end of described switch K1 with described operation amplifier chip U1's
Between positive pole input pin VI+, described divider resistance R4 is connected to the positive pole of described operation amplifier chip U1
Between input pin VI+ and ground, described feedback resistance R1 is connected to the output of described operation amplifier chip U1
Between pin VOUT and positive pole input pin VI+, described feedback resistance R2 is connected to described operation amplifier
Between the output pin VOUT and negative pole input pin VI-of chip U1, the positive pole of described polar capacitor C2
Negative pole input pin VI-and ground, the described operation amplifier core of described operation amplifier chip U1 is connect respectively with negative pole
The output pin VOUT of sheet U1 connects first end of described divider resistance R5.
4. testing circuit based on LED group as claimed in claim 1, it is characterised in that
Described first switching tube uses NPN type triode Q1, the colelctor electrode of described NPN type triode Q1,
Base stage, emitter stage are respectively the hot end of described first switching tube, control end, cold end；
Described second switch pipe uses NPN type triode Q2, the colelctor electrode of described NPN type triode Q2,
Base stage, emitter stage are respectively the hot end of described second switch pipe, control end, cold end；
Described 3rd switching tube uses NPN type triode Q3, the colelctor electrode of described NPN type triode Q3,
Base stage, emitter stage are respectively the hot end of described 3rd switching tube, control end, cold end；
Described 4th switching tube uses NPN type triode Q4, the colelctor electrode of described NPN type triode Q4,
Base stage, emitter stage are respectively the hot end of described 4th switching tube, control end, cold end.
5. testing circuit based on LED group as claimed in claim 1, it is characterised in that
Described first switching tube uses N-type metal-oxide-semiconductor Q5, the drain electrode of described N-type metal-oxide-semiconductor Q5, grid
Pole, source electrode are respectively the hot end of described first switching tube, control end, cold end；
Described second switch pipe uses N-type metal-oxide-semiconductor Q6, the drain electrode of described N-type metal-oxide-semiconductor Q6, grid
Pole, source electrode are respectively the hot end of described second switch pipe, control end, cold end；
Described 3rd switching tube uses N-type metal-oxide-semiconductor Q7, the drain electrode of described N-type metal-oxide-semiconductor Q7, grid
Pole, source electrode are respectively the hot end of described 3rd switching tube, control end, cold end；
Described 4th switching tube uses N-type metal-oxide-semiconductor Q8, the drain electrode of described N-type metal-oxide-semiconductor Q8, grid
Pole, source electrode are respectively the hot end of described 4th switching tube, control end, cold end.
6. a detector, described detector includes power circuit and testing circuit based on LED group, institute
State the input of testing circuit based on LED group and outfan connects described power circuit and LED group respectively
Welding circuit, it is characterised in that described testing circuit based on LED group includes:
Power switch circuit, circuit and square-wave, divider resistance R5, divider resistance R6, divider resistance R7, point
Piezoresistance R8, divider resistance R9, divider resistance R11, shunt resistance R16, shunt resistance R17, point
Leakage resistance R18, shunt resistance R19, switch K2, filter capacitor C3, filter capacitor C4, the first switch
Pipe, second switch pipe, the 3rd switching tube, the 4th switching tube and D flip chip U2；
Described power switch circuit connects described power circuit and described circuit and square-wave, described divider resistance respectively
First end of R11 and the second end meet described power switch circuit and first end of described switch K2, institute respectively
State between the second end and the ground that divider resistance R9 is connected to described switch K2, second end of described switch K2
Connect the reset pin RESET of described D flip chip U2, first end and second of described divider resistance R5
End connects the triggering pin CLK of described circuit and square-wave and described D flip chip U2, described divider resistance respectively
R6, filter capacitor C3 are connected between triggering pin CLK and the ground of described D flip chip U2 respectively,
Described filter capacitor C4 is connected between the first end and the ground of described divider resistance R11, described divider resistance
R7 is connected between replacement pin EN and the ground of described D flip chip U2, and described divider resistance R8 is even
Being connected on the carry pin COUT of described D flip chip U2 and reset between pin EN, described D triggers
Power pins VDD of chip U2 connects described power switch circuit, the grounding lead of described D flip chip U2
Foot VSS ground connection, described shunt resistance R16 is connected to first output pin of described D flip chip U2
Between the control end of Q0 and described first switching tube, described shunt resistance R17 is connected to described D and triggers core
Between second output pin Q1 and the control end of described second switch pipe of sheet U2, described shunt resistance R18
Be connected to the 3rd output pin Q2 of described D flip chip U2 and described 3rd switching tube control end it
Between, described shunt resistance R19 is connected to the 4th output pin Q3 of described D flip chip U2 with described
Between the control end of the 4th switching tube, the cold end of described first switching tube, described second switch pipe low
Potential end, the cold end of described 3rd switching tube, the equal ground connection of cold end of described 4th switching tube, institute
State the hot end of the first switching tube, the hot end of described second switch pipe, the height of described 3rd switching tube
Potential end, the hot end of described 4th switching tube all connect the welding circuit of described LED group.
7. detector as claimed in claim 6, it is characterised in that described power switch circuit includes:
Diode D1, rechargeable battery BT, switch K1, filter capacitor C1, divider resistance R10 and photosensitive
Diode (LED) 5；
The anode of described diode D1 and negative electrode are just meeting described power circuit and described rechargeable battery BT respectively
Pole, the negative pole of described rechargeable battery BT ground connection and described power circuit, first end of described switch K1 respectively
Connect the positive pole of described rechargeable battery BT, described filter capacitor C1 be connected to second end of described switch K1 with
Between ground, described divider resistance R10 is connected to second end of described switch K1 and described light sensitive diode
The anode of LED5, the minus earth of described light sensitive diode LED5, second end of described switch K1 is respectively
Connect described circuit and square-wave and first end of described divider resistance R11.
8. detector as claimed in claim 7, it is characterised in that described circuit and square-wave includes:
Divider resistance R3, divider resistance R4, feedback resistance R1, feedback resistance R2, operation amplifier chip
U1 and polar capacitor C2；
Described divider resistance R3 is connected to second end of described switch K1 with described operation amplifier chip U1's
Between positive pole input pin VI+, described divider resistance R4 is connected to the positive pole of described operation amplifier chip U1
Between input pin VI+ and ground, described feedback resistance R1 is connected to the output of described operation amplifier chip U1
Between pin VOUT and positive pole input pin VI+, described feedback resistance R2 is connected to described operation amplifier
Between the output pin VOUT and negative pole input pin VI-of chip U1, the positive pole of described polar capacitor C2
Negative pole input pin VI-and ground, the described operation amplifier core of described operation amplifier chip U1 is connect respectively with negative pole
The output pin VOUT of sheet U1 connects first end of described divider resistance R5.
9. detector as claimed in claim 6, it is characterised in that
Described first switching tube uses NPN type triode Q1, the colelctor electrode of described NPN type triode Q1,
Base stage, emitter stage are respectively the hot end of described first switching tube, control end, cold end；
Described second switch pipe uses NPN type triode Q2, the colelctor electrode of described NPN type triode Q2,
Base stage, emitter stage are respectively the hot end of described second switch pipe, control end, cold end；
Described 3rd switching tube uses NPN type triode Q3, the colelctor electrode of described NPN type triode Q3,
Base stage, emitter stage are respectively the hot end of described 3rd switching tube, control end, cold end；
Described 4th switching tube uses NPN type triode Q4, the colelctor electrode of described NPN type triode Q4,
Base stage, emitter stage are respectively the hot end of described 4th switching tube, control end, cold end.
10. detector as claimed in claim 6, it is characterised in that
Described first switching tube uses N-type metal-oxide-semiconductor Q5, the drain electrode of described N-type metal-oxide-semiconductor Q5, grid
Pole, source electrode are respectively the hot end of described first switching tube, control end, cold end；
Described second switch pipe uses N-type metal-oxide-semiconductor Q6,
The drain electrode of described N-type metal-oxide-semiconductor Q6, grid, source electrode are respectively the high electric of described second switch pipe
Position end, control end, cold end；
Described 3rd switching tube uses N-type metal-oxide-semiconductor Q7, the drain electrode of described N-type metal-oxide-semiconductor Q7, grid
Pole, source electrode are respectively the hot end of described 3rd switching tube, control end, cold end；
Described 4th switching tube uses N-type metal-oxide-semiconductor Q8, the drain electrode of described N-type metal-oxide-semiconductor Q8, grid
Pole, source electrode are respectively the hot end of described 4th switching tube, control end, cold end.
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| CN201310127738.XA CN104101810B (en) | 2013-04-12 | 2013-04-12 | A kind of testing circuit based on LED group and detector |
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| CN201310127738.XA CN104101810B (en) | 2013-04-12 | 2013-04-12 | A kind of testing circuit based on LED group and detector |
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| CN104101810B true CN104101810B (en) | 2016-12-28 |
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| CN106771807B (en) * | 2016-12-19 | 2019-08-13 | 杭州先途电子有限公司 | The detection method of heater switch fault |
| CN109831183B (en) * | 2019-03-27 | 2023-06-13 | 宝鸡国瑞达新能源科技有限公司 | Signal filter circuit of intelligent management system of air conditioner for grains |
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| CN102630114A (en) * | 2012-04-17 | 2012-08-08 | 泉芯电子技术(深圳)有限公司 | Closed-loop control LED (Light Emitting Diode) constant-current driving circuit |
| CN102695343B (en) * | 2012-06-06 | 2014-01-29 | 矽力杰半导体技术(杭州)有限公司 | LED (Light Emitting Diode) driving circuit |
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