CN104049231A - Integrated system for testing delay of separated units of optical electronic transformer - Google Patents
Integrated system for testing delay of separated units of optical electronic transformer Download PDFInfo
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- CN104049231A CN104049231A CN201410247777.8A CN201410247777A CN104049231A CN 104049231 A CN104049231 A CN 104049231A CN 201410247777 A CN201410247777 A CN 201410247777A CN 104049231 A CN104049231 A CN 104049231A
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Abstract
The invention discloses an integrated system for testing the delay of separated units of an optical electronic transformer. The integrated system for testing the delay of the separated units of the optical electronic transformer comprises a standard transformer, an I/U converter, an A/D acquisition circuit, a CPU and an upper computer, wherein the CPU is connected with a digital quantity acquisition module based on an FPGA, a serial data interface of the digital quantity acquisition module based on the FPGA is externally connected with a collector, and an Ethernet data interface is externally connected with a combining unit. The integrated system for testing the delay of the separated units of the optical electronic transformer has all the functions of a conventional optical electronic transformer calibrator, process testing is added, testing of the separating time characteristic of the optical electronic transformer can be achieved through the system, the delay time of all the separated units of the optical electronic transformer can be tested accurately, and detection data are provided for testing of the separated units of the field optical electronic transformer of an intelligent substation.
Description
Technical field
The present invention relates to the integrated delay test system of a kind of optical electron formula mutual inductor separative element, belong to power measurement technical field.
Background technology
Optical electron formula mutual inductor is along with processing technology is constantly perfect, in electronic mutual inductor application, occupy a tiny space gradually, but because optical electron formula mutual inductor is all generally to adopt magneto-optic principle or electric light principle, so its sensing measurement unit is substantially all to obtain current/voltage value by the mode of measuring light step-length.In optical fiber circuit between collector and sensing head, transmitting is the analog signals that comprises current/voltage, and this signal lag is just relevant with on-the-spot fiber lengths and incident angle.General this time delay in collector, repairs after mode by specified time delay information delivered to merge cells unify repairing when synchronous by merge cells.And at present due to optical electron formula mutual inductor sensing head, collector is general and the manufacturer of merge cells in released state, even the product of same producer is also provided by different departments due to professional difference.Be that with electricity electronic mutual inductor difference optical electron formula mutual inductor collector and merge cells inside can repair the time delay of electronic mutual inductor, the very large trouble that this brings to on-the-spot operation maintenance personnel.
The privately owned FT3 agreement of general employing between optical electron formula mutual inductor body and merge cells, these protocol transmission data generally include delay parameter, and merge cells carries out interpolation and according to the time of autophage, fills up new specified delay time again after reading this time parameter.The time parameter that rear end equipment is filled according to merge cells carries out synchronously.
At present to test when frequent be that electronic mutual inductor body and merge cells are done to as a whole test to optical electron formula mutual inductor on site, and it is the error causing due to merge cells or due to the physics time delay of optical transformer itself that this test process is difficult to locate its absolute time delay once time of occurrence error.At this moment time-based correction is relatively difficult to locate easy appearance and repairs error.
Summary of the invention
The invention provides the integrated delay test system of a kind of optical electron formula mutual inductor separative element, solved time-based correction in optical electron formula transformer test process and be difficult to location, easily occur repairing the problem of error.
In order to solve the problems of the technologies described above, the technical solution adopted in the present invention is:
The integrated delay test system of a kind of optical electron formula mutual inductor separative element, comprise the standard mutual inductor, I/U transducer, A/D Acquisition Circuit, CPU, the host computer that connect successively, described CPU is also connected with the digital data acquisition module based on FPGA, the described digital data acquisition module based on FPGA alter the external collector of row data-interface, the external merge cells of Ethernet data interface; Described standard mutual inductor is arranged on cover to be had on the wire of fiber optic loop, as standard signal source; Described A/D Acquisition Circuit be take standard signal and is realized analog data collection as benchmark, and analog data is sent to the CPU that includes constant-temperature crystal oscillator; The described digital data acquisition module based on FPGA is in order to gather the serial data of collector output and the Ethernet data of merge cells output, and serial data and Ethernet data are sent to the CPU that includes constant-temperature crystal oscillator; Described CPU receives analog data, serial data and Ethernet data, and calculate fundamental phase angle separately, utilize the relation between fundamental phase angle to calculate the time delay between time delay, analog quantity and the merge cells between analog quantity and optical electron formula mutual inductor body, and calculate respectively t1, t2 and t3 according to the specified delay value of collector and merge cells demarcation, wherein t1 is the time delay of optical electron formula mutual inductor physics, t2 is collector for processing time delay, and t3 is that merge cells is processed time delay; Described host computer is in order to the data interaction between realization and CPU.
Between described digital data acquisition module based on FPGA and merge cells, be also provided with the DPLL that disappears and tremble in order to the time, described DPLL comprises phase detector, LPF and the voltage controlled oscillator connecting successively, and the feedback output end of described voltage controlled oscillator is connected with the feedback input end of phase detector.
Between described DPLL and merge cells, also establish the first optical receiver.
The described digital data acquisition module based on FPGA is connected with the output terminal of collector by optical splitter.
Between described digital data acquisition module based on FPGA and optical splitter, be also provided with the second optical receiver.
Described CPU is the CPU of built-in constant-temperature crystal oscillator, and built-in constant-temperature crystal oscillator is in order to stamp unified time reference to the collection of analog quantity, serial data collection and Ethernet data collection; The precision of described constant-temperature crystal oscillator is 0.001PPM.
Described A/D Acquisition Circuit adopts 24 A/D conversion chips.
Described host computer is computing machine.
The invention has the beneficial effects as follows: 1, all functions of the integrated conventional optical electron formula mutual-inductor tester of the present invention, increase procedural test, bring the disengaging time characteristic test of optical electron formula mutual inductor into test macro, the accurate delay time of each separative element of measuring optical electronic mutual inductor, for the separative element test of the live optical electronic mutual inductor of intelligent substation provides detection foundation; 2, A/D Acquisition Circuit of the present invention adopts 24 A/D conversion chips, has improved the sampling precision of whole system; 3, the present invention adopts embedded real-time operating system, makes whole system have very strong real-time; 4, need not import CID file layout, and the information of optical electron formula mutual inductor, automatically according to message format identification optical electron formula mutual inductor producer's message and Ethernet message; 5, adopt constant-temperature crystal oscillator as the unified timing system of whole system, adopt DPLL technology to eliminate time jitter, to improve the synchronization accuracy of analog data, serial data, Ethernet data; 6, the digital data acquisition module based on FPGA is connected with the output terminal of collector by optical splitter, guarantees that signal and actual signal that system obtains are same source signal; 7, utilize the concept of time domain to carry out computation delay, do not adopt interpolation technique, avoided interpolation technique can introduce new interpolation error.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Fig. 2 is the structural representation of DPLL.
Embodiment
Below in conjunction with Figure of description, the invention will be further described.Following examples are only for technical scheme of the present invention is more clearly described, and can not limit the scope of the invention with this.
As shown in Figure 1, the integrated delay test system of a kind of optical electron formula mutual inductor separative element, comprise the standard mutual inductor, I/U transducer, A/D Acquisition Circuit, CPU, the host computer that connect successively, described CPU is also connected with the digital data acquisition module based on FPGA, the described digital data acquisition module based on FPGA alter the external collector of row data-interface, the external merge cells of Ethernet data interface.
Standard mutual inductor is arranged on cover to be had on the wire of fiber optic loop, as standard signal source.I/U transducer has high stability and reliable temperature characterisitic realizes I/U conversion.A/D Acquisition Circuit adopts 24 A/D conversion chips, the ADS1271 chip of this chip WeiAD company, can improve the employing precision of whole system, A/D Acquisition Circuit be take standard signal and is realized analog data collection as benchmark, sampling rate is 100k, and A/D Acquisition Circuit sends to analog data the CPU that includes constant-temperature crystal oscillator.
Digital data acquisition module based on FPGA is in order to gather the serial data of collector output and the Ethernet data of merge cells output, and serial data and Ethernet data are sent to the CPU that includes constant-temperature crystal oscillator, should the digital data acquisition module based on FPGA adopt the SPARTEN3 of XILEX company Series FPGA.
In order to guarantee that signal and actual signal that described system obtains are same source signal, the serial data and the actual signal homology that gather, the digital data acquisition module based on FPGA is connected with the output terminal of collector by optical splitter.
Collector employing FT3 serial transmission due to optical electron formula mutual inductor, the stability of its time delay has certain guarantee, but merge cells (MU) is due to synchronous processing, data packing, program task scheduling, the impact of the links such as optical fiber transceiving interface, when Frame arrives protective device, there is certain random time shake, be that the due in θ 1 (t) of sampling value message is with randomized jitter, especially the jitter value of this after network can reach 30～40 microseconds, therefore in order to improve analog data, serial data, the synchronization accuracy of Ethernet data, described system adopts DPLL that markers θ 1 (t) is disappeared and trembled, obtain final markers θ 2 (t), between the digital data acquisition module based on FPGA and merge cells, DPLL is set.
DPLL as shown in Figure 2, comprises the phase detector, LPF and the voltage controlled oscillator that connect successively, and the feedback output end of voltage controlled oscillator is connected with the feedback input end of phase detector.Crude sampling value arrives the initial input amount θ 1 (t) that beat forms DPLL, at DPLL, start when initial, θ 2 (t)=θ 1 (t), no matter be the θ 1 (t) that causes of cumulative errors or time jitter and the step-out of θ 2 (t), by phase detector, completing both time differences calculates, this difference is as the input quantity V1 (t) of loop filter (LPF), design an IIR type low-pass filter and guarantee good tracking velocity and stability, filtering is output as V2 (t), V2 (t) is as the input quantity of voltage controlled oscillator, by the size of its amplitude, determine to follow the tracks of and regulate step-length, be no more than the whole tracing process that completes θ 2 (t) in the time of 1S, above link is carried out at the continuous circulation in service of DPLL.
Between the digital data acquisition module between DPLL and merge cells and based on FPGA and optical splitter, be provided with respectively the first optical receiver and the second optical receiver, both all adopt the optical receiver of Agilent (Agilent) company, interface adopts ST, serial fiber optic wavelength is 850nm, and Ethernet fiber optic wavelength adopts 1310nm.
CPU receives analog data, serial data and Ethernet data, and calculate fundamental phase angle separately, utilize the relation between fundamental phase angle to calculate the time delay between time delay, analog quantity and the merge cells between analog quantity and optical electron formula mutual inductor body, and calculate respectively t1, t2 and t3 according to the specified delay value of collector and merge cells demarcation, wherein t1 is the time delay of optical electron formula mutual inductor physics, t2 is collector for processing time delay, and t3 is that merge cells is processed time delay.This CPU is the CPU of built-in constant-temperature crystal oscillator, and the precision of constant-temperature crystal oscillator is 0.001PPM, and built-in constant-temperature crystal oscillator is in order to stamp unified time reference to the collection of analog quantity, serial data collection and Ethernet data collection; This CPU is the PowerPC model MPC8247 of Freescale.
Host computer, in order to the data interaction between realization and CPU, is generally computing machine, Computer display human-computer interaction interface, and interface software adopts VC programming to realize, and between computing machine and CPU, passes through ethernet communication.
Above-mentioned system is passed through the simulated data in collection signal source as the time reference of whole system, test obtains the time delay between time delay, analog quantity and the merge cells between analog quantity and optical electron formula mutual inductor body, read the specified delay value that collector and merge cells are demarcated, calculate the time delay of optical electron formula mutual inductor physics, collector for processing time delay and merge cells and process time delay; The all functions of the conventional optical electron formula of system integration mutual-inductor tester, increase procedural test, bring the disengaging time characteristic test of optical electron formula mutual inductor into test macro, the accurate delay time of each separative element of measuring optical electronic mutual inductor, for the separative element test of the live optical electronic mutual inductor of intelligent substation provides detection foundation.
More than show and described ultimate principle of the present invention, principal character and advantage.The technician of the industry should understand; the present invention is not restricted to the described embodiments; that in above-described embodiment and instructions, describes just illustrates principle of the present invention; without departing from the spirit and scope of the present invention; the present invention also has various changes and modifications, and these changes and improvements all fall in the claimed scope of the invention.The claimed scope of the present invention is defined by appending claims and equivalent thereof.
Claims (9)
1. the integrated delay test system of optical electron formula mutual inductor separative element, it is characterized in that: comprise the standard mutual inductor, I/U transducer, A/D Acquisition Circuit, CPU, the host computer that connect successively, described CPU is also connected with the digital data acquisition module based on FPGA, the described digital data acquisition module based on FPGA alter the external collector of row data-interface, the external merge cells of Ethernet data interface;
Described standard mutual inductor is arranged on cover to be had on the primary side wire of fiber optic loop, as standard signal source;
Described A/D Acquisition Circuit be take standard signal and is realized analog data collection as benchmark, and analog data is sent to the CPU that includes constant-temperature crystal oscillator;
The described digital data acquisition module based on FPGA is in order to gather the serial data of collector output and the Ethernet data of merge cells output, and serial data and Ethernet data are sent to the CPU that includes constant-temperature crystal oscillator;
Described CPU receives analog data, serial data and Ethernet data, and calculate fundamental phase angle separately, utilize the relation between fundamental phase angle to calculate the time delay between time delay, analog quantity and the merge cells between analog quantity and optical electron formula mutual inductor body, and calculate respectively t1, t2 and t3 according to the specified delay value of collector and merge cells demarcation, wherein t1 is the time delay of optical electron formula mutual inductor physics, t2 is collector for processing time delay, and t3 is that merge cells is processed time delay;
Described host computer is in order to the data interaction between realization and CPU.
2. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 1, it is characterized in that: between described digital data acquisition module based on FPGA and merge cells, be also provided with the DPLL that disappears and tremble in order to the time, described DPLL comprises phase detector, LPF and the voltage controlled oscillator connecting successively, and the feedback output end of described voltage controlled oscillator is connected with the feedback input end of phase detector.
3. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 2, is characterized in that: between described DPLL and merge cells, also establish the first optical receiver.
4. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 1, is characterized in that: the described digital data acquisition module based on FPGA is connected with the output terminal of collector by optical splitter.
5. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 4, is characterized in that: between described digital data acquisition module based on FPGA and optical splitter, be also provided with the second optical receiver.
6. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 1, it is characterized in that: the CPU that described CPU is built-in constant-temperature crystal oscillator, built-in constant-temperature crystal oscillator is in order to stamp unified time reference to the collection of analog quantity, serial data collection and Ethernet data collection.
7. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 6, is characterized in that: the precision of described constant-temperature crystal oscillator is 0.001PPM.
8. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 1, is characterized in that: described A/D Acquisition Circuit adopts 24 A/D conversion chips.
9. the integrated delay test system of a kind of optical electron formula mutual inductor separative element according to claim 1, is characterized in that: described host computer is computing machine.
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Cited By (5)
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| CN109375139A (en) * | 2018-11-06 | 2019-02-22 | 国网内蒙古东部电力有限公司电力科学研究院 | A kind of device and method of automatic testing light fiber current mutual inductor |
| CN110505259A (en) * | 2018-05-17 | 2019-11-26 | 许昌许继软件技术有限公司 | A kind of data processing method and device of intelligent substation |
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| CN108196215A (en) * | 2018-01-04 | 2018-06-22 | 广东电网有限责任公司电力科学研究院 | A kind of DC electronic transformer delay time test method and device |
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| CN109375139A (en) * | 2018-11-06 | 2019-02-22 | 国网内蒙古东部电力有限公司电力科学研究院 | A kind of device and method of automatic testing light fiber current mutual inductor |
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