CN108196215A - A kind of DC electronic transformer delay time test method and device - Google Patents
A kind of DC electronic transformer delay time test method and device Download PDFInfo
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- CN108196215A CN108196215A CN201810008039.6A CN201810008039A CN108196215A CN 108196215 A CN108196215 A CN 108196215A CN 201810008039 A CN201810008039 A CN 201810008039A CN 108196215 A CN108196215 A CN 108196215A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The present invention provides a kind of DC electronic transformer delay time test methods and device, this method to include：Step signal is applied to the primary side of DC electronic transformer, is sampled to obtain step standard source signal and step test product signal from the secondary side of DC electronic transformer；Generalized polynomial curve matching is carried out to step standard source signal and step test product signal, obtain standard source matched curve and test product matched curve, it takes the corresponding point of 90% peak value of standard source matched curve and test product matched curve as a reference point respectively, obtains standard source reference point and test product reference point；Cubic spline interpolation is carried out to the ordinate of test product reference point, obtains subject mutual inductor step end time, the determining and hithermost sampled point of standard source reference point in step standard source signal, using the abscissa of sampled point as standard source step end time；Delay time of the difference as DC electronic transformer of mutual inductor step end time and standard source step end time will be tested.
Description
Technical field
When being delayed the present invention relates to DC electronic transformer technical field more particularly to a kind of DC electronic transformer
Between test method and device.
Background technology
DC electronic transformer is the important primary equipment of DC transmission system construction and operation, general using number
Change output and provide voltage and current signal for bay device, this necessarily involves the delay time problem of the signal progress of disease.Direct current
The delay of minor mutual inductor is the time delay that a practical electrical quantity is converted to digital message output after direct current instrument transformer acquires
Difference is one of core index that the control handled in real time protection equipment is needed extremely to be concerned about.Direct-current power transmission control protection system pair
Requirement of real-time is high, if DC electronic transformer signal progress of disease delay time is excessive, will result directly in Control protection system
It is slack-off to the abnormality processing of primary system.When the delay time of DC electronic transformer is directly related to the reaction of whole system
Between, therefore the time response of DC electronic transformer is needed by stringent test.
Existing DC electronic transformer time-delay test method and conventional AC electronic mutual inductor steady state delayed test
Method is similar, and delay is measured using the Phase Difference Principle based on AC power frequency steady-state signal.In view of DC electronic transformer
Inside includes the AC coil module of direct current signal ripple of acquisition, and metastability exchange letter is passed through in direct current instrument transformer primary side
Number, the equilibrium transport potential difference by comparing original ac analog signal between the sampled digital signal through mutual inductor output, meter
The corresponding sampling delay time is calculated, reflects the delay-time characteristic of direct current instrument transformer indirectly with the time parameter.
However, since this method cannot differentiate the cyclically-varying of AC signal, can not detect in different cycles signal
Phase offset, i.e., can not calculate delay time between the signal under non-same period, therefore its existing defects in technical principle, therefore right
In the DC electronic transformer for not having exchange progress of disease ability, this method is entirely ineffective, therefore, current direct current transportation field
There is not the theoretical method that can completely support that DC electronic transformer delay time is tested also inside.
Invention content
An embodiment of the present invention provides a kind of DC electronic transformer delay time test method and devices, are current straight
Test is carried out in stream field of power transmission to DC electronic transformer delay time, complete theory and technology support is provided.
An embodiment of the present invention provides a kind of DC electronic transformer delay time test method, including：
S1：Step signal is applied to the primary side of DC electronic transformer, from the secondary side of DC electronic transformer
It is sampled to obtain step standard source signal and step test product signal；
S2：Generalized polynomial curve matching is carried out to step standard source signal and step test product signal, obtains standard source plan
Curve and test product matched curve are closed, takes corresponding conduct of 90% peak value of standard source matched curve and test product matched curve respectively
Reference point obtains standard source reference point and test product reference point；
S3：Cubic spline interpolation is carried out to the ordinate of test product reference point, obtains subject mutual inductor step end time,
The determining and hithermost sampled point of standard source reference point in step standard source signal, using the abscissa of sampled point as standard source rank
Jump end time；
S4：The difference of mutual inductor step end time and standard source step end time will be tested as DC electronic mutual inductance
The delay time of device.
Preferably, generalized polynomial curve matching is carried out to step standard source signal and step test product signal, obtains standard
Source matched curve and test product matched curve are specially：
By preset first formula to the abscissas of all sampled points of step standard source signal and step test product signal into
Row generalized polynomial curve matching, obtains standard source matched curve and test product matched curve；
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor step standard source signal or step test product signal
Each sampled point abscissa, ajFor multinomial coefficient, m is polynomial order.
Preferably, when carrying out generalized polynomial curve matching, step standard source signal is controlled by preset second formula
The residual error between residual error, step test product signal and test product matched curve between standard source matched curve；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIntend for standard source
Close the ordinate of curve or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wi
For weight.
Preferably, step S3 is specially：
Cubic spline interpolation is carried out to the ordinate of test product reference point by preset third formula group, obtains subject mutual inductor
Step end time, the determining and hithermost sampled point of standard source reference point in step standard source signal, by the horizontal stroke of sampled point
Coordinate is as standard source step end time；
Wherein, preset third formula group is：
In formula,B=1-A,X is
The ordinate of test product reference point, y are subject mutual inductor step end time.
Preferably, the embodiment of the present invention additionally provides a kind of DC electronic transformer time-delay time testing, including：
Sampling unit, for applying step signal to the primary side of DC electronic transformer, from DC electronic mutual inductance
The secondary side of device is sampled to obtain step standard source signal and step test product signal；
Fitting unit for carrying out generalized polynomial curve matching to step standard source signal and step test product signal, obtains
To standard source matched curve and test product matched curve, 90% peak value pair of standard source matched curve and test product matched curve is taken respectively
The point answered is as a reference point, obtains standard source reference point and test product reference point；
Interpolating unit for carrying out cubic spline interpolation to the ordinate of test product reference point, obtains subject mutual inductor step
End time, the determining and hithermost sampled point of standard source reference point in step standard source signal, by the abscissa of sampled point
As standard source step end time；
Poor unit is sought, for the difference of mutual inductor step end time and standard source step end time will to be tested as direct current
The delay time of electronic mutual inductor.
Preferably, fitting unit includes：
Subelement is fitted, for carrying out generalized polynomial curve matching to step standard source signal and step test product signal,
Obtain standard source matched curve and test product matched curve；
Value subelement, for the corresponding point of 90% peak value of standard source matched curve and test product matched curve to be taken to make respectively
For reference point, standard source reference point and test product reference point are obtained；
Fitting subelement is additionally operable to own step standard source signal and step test product signal by preset first formula
The abscissa of sampled point carries out generalized polynomial curve matching, obtains standard source matched curve and test product matched curve；
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor step standard source signal or step test product signal
Each sampled point abscissa, ajFor multinomial coefficient, m is polynomial order.
Preferably, fitting unit further includes：
Computation subunit, for when carrying out generalized polynomial curve matching, step mark to be controlled by preset second formula
The residual error between residual error, step test product signal and test product matched curve between quasi- source signal and standard source matched curve；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIntend for standard source
Close the ordinate of curve or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wi
For weight.
Preferably, interpolating unit is additionally operable to carry out sample three times to the ordinate of test product reference point by preset third formula group
Interpolation, obtains subject mutual inductor step end time, determined in step standard source signal with standard source reference point near
Sampled point, using the abscissa of sampled point as standard source step end time；
Wherein, preset third formula group is：
In formula,B=1-A,X is
The ordinate of test product reference point, y are subject mutual inductor step end time.
As can be seen from the above technical solutions, the embodiment of the present invention has the following advantages：
An embodiment of the present invention provides a kind of DC electronic transformer delay time test method and device, wherein, it should
Method includes：S1：Step signal is applied to the primary side of DC electronic transformer, from the secondary side of DC electronic transformer
It is sampled to obtain step standard source signal and step test product signal；S2：To step standard source signal and step test product signal into
Row generalized polynomial curve matching, obtains standard source matched curve and test product matched curve, take respectively standard source matched curve and
The corresponding point of 90% peak value of test product matched curve is as a reference point, obtains standard source reference point and test product reference point；S3：To examination
The ordinate of product reference point carries out cubic spline interpolation, subject mutual inductor step end time is obtained, in step standard source signal
In determine with the hithermost sampled point of standard source reference point, using the abscissa of sampled point as standard source step end time；S4：
The difference of mutual inductor step end time and standard source step end time will be tested as during the delay of DC electronic transformer
Between.The present invention proposes complete testing scheme, and propose to close for DC electronic transformer transient state step response delay test
Bond parameter computational algorithm efficiently solves the technology that DC electronic transformer time response measuring technology at this stage compares shortage
Problem.
Description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention, for those of ordinary skill in the art, without having to pay creative labor, may be used also
To obtain other attached drawings according to these attached drawings.
Fig. 1 is a kind of stream of one embodiment of DC electronic transformer delay time test method provided by the invention
Journey schematic diagram；
Fig. 2 is a kind of knot of one embodiment of DC electronic transformer time-delay time testing provided by the invention
Structure schematic diagram.
Specific embodiment
An embodiment of the present invention provides a kind of DC electronic transformer delay time test method and devices, are current straight
Test is carried out in stream field of power transmission to DC electronic transformer delay time, complete theory and technology support is provided.
In order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below in conjunction with the present invention
Attached drawing in embodiment is clearly and completely described the technical solution in the embodiment of the present invention, it is clear that disclosed below
Embodiment be only part of the embodiment of the present invention, and not all embodiment.Based on the embodiments of the present invention, this field
All other embodiment that those of ordinary skill is obtained without making creative work, belongs to protection of the present invention
Range.
Referring to Fig. 1, the one of a kind of DC electronic transformer delay time test method provided in an embodiment of the present invention
A embodiment, including：
101st, step signal is applied to the primary side of DC electronic transformer, from the secondary side of DC electronic transformer
It is sampled to obtain step standard source signal and step test product signal；
In the present embodiment, using step signal source as testing source.After test starts, in DC electronic mutual inductance
Device primary side applies test volume by step voltage signal source, and the rise time of step signal can be controlled on 30~100us left sides
It is right.
After step signal is applied, the secondary side needed in mutual inductor is carried out at the same time step standard source signal and step test product
The sampling of signal.
Sampling process to step standard source signal can be：By noninductive current divider and noninductive resistance divider, one
Secondary side high current and the high voltage progress of disease after signal condition, pass through zero propagation SAR types ADC into small magnitude step voltage signal
The high-speed sampling of 1MHz is carried out, the correct time capture and waveform recording of step signal are carried out, using the signal as time test
Step standard source signal.
Sampling process to step test product signal can be：To being tested the FT3 data of DC electronic transformer output,
Under the control of unified sequential, reception parsing is synchronized, obtains corresponding step signal test product data, and using the data as rank
Jump test product signal.
It is synchronous to the sampling process of step standard source signal with step test product signal above to carry out, and above is only to two
One example of a signal sampling means, those skilled in the art can be sampled by different means in practical application,
It does not limit herein.
102nd, by preset first formula to the horizontal seat of all sampled points of step standard source signal and step test product signal
Mark carries out generalized polynomial curve matching, obtains standard source matched curve and test product matched curve, takes standard source fitting bent respectively
Line and the corresponding point of 90% peak value of test product matched curve are as a reference point, obtain standard source reference point and test product reference point；
In the present embodiment, all sampled points of step standard source signal and step test product signal are the point of two dimension,
Abscissa can be the moment, and ordinate can be current amplitude.
Step signal is fitted using generalized polynomial fitting, calculates its step low value (low state of step signal
Value) and step high level (the high state value of step signal), noise error and the overshoot wave at step initial stage when eliminating low value
It is dynamic to influence, obtain the state value of an accurate stable.For step end time, (signal is passed through from low to high at step amplitude 90%
At the time of) the accurate foundation of offer is provided.Therefore, step 102 tries step standard source signal and step by preset first formula
The abscissa of all sampled points of product signal carries out generalized polynomial curve matching, obtains standard source matched curve and test product fitting
Curve.
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor step standard source signal or step test product signal
Each sampled point abscissa, ajFor multinomial coefficient, m is polynomial order.
When carrying out generalized polynomial curve matching, step standard source signal and standard source are controlled by preset second formula
The residual error between residual error, step test product signal and test product matched curve between matched curve；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIntend for standard source
Close the ordinate of curve or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wi
For weight.
In preset first formula in a step 102, least square method can be selected, is minimized according to preset second formula
Residual error between matched curve and original signal searches the multinomial coefficient a of multinomial modelj.Preset second formula is practical to be made
With the difference control that will be as fitted between obtained curve and original signal in a certain range.
After curve matching, standard source matched curve and test product matched curve are obtained, standard source matched curve can be taken
Upper 90% peak value is corresponding to be put as standard source reference point, and the corresponding point of 90% peak value in test product matched curve can be taken to be used as examination
Product reference point.
103rd, cubic spline interpolation is carried out to the ordinate of test product reference point by preset third formula group, it is mutual obtains subject
Sensor step end time, the determining and hithermost sampled point of standard source reference point, this is sampled in step standard source signal
The abscissa of point is as standard source step end time；
In the present embodiment, step standard source signal acquisition interval time can be 1us, for 30us or so rise time
Step signal record and ms grade mutual inductor delay tests for time enough resolution ratio, can be without interpolation at
Reason.Step test product signal is derived from the FT3 discrete data frames of DC electronic transformer output, sampling period maximum up to 100us,
For rise time and delay time calculate, there is too big error, in order to improve measuring accuracy, need to sample test product
Value carries out interpolation calculation, will be increased within 10us in the sampling period.
Therefore, cubic spline interpolation is carried out to the ordinate of test product reference point by preset third formula group in step 103,
Obtain subject mutual inductor step end time.
Wherein, preset third formula group is：
f(xi)=yi
Interpolating function g (x) is piecewise function in following equations：
Function pi(x) it is to meet three rank multinomials of following condition：
g(xi)=yi=pi(xi)
In xiThe single order and second dervative continuously located are continuous, i=1 ..., n-2.
g′(xi) be Cubic Spline first derivative,Second order for Cubic Spline is led
Number.In section [xi,xi+ 1] in, output interpolation y functions are represented by：
In formula,B=1-A,It will
The ordinate of test product reference point inputs above preset third formula group as x, can obtain y, and y is to be tested mutual inductor step end
The only moment.
104th, mutual inductor step end time will be tested and the difference of standard source step end time is mutual as DC electronic
The delay time of sensor.
The embodiment of the present invention proposes complete test system for DC electronic transformer transient state step response delay test
System implementation, and propose key parameter computational algorithm, efficiently solve DC electronic transformer time response survey at this stage
Try the problem of Technical comparing lacks.
The delay test mode based on transient state step response of the present invention, solves nothing under traditional stable state time-delay test method
Method differentiates the technical principle defect of progress of disease signal period variation.
The present invention introduces numerical analysis treatment technology on the basis of traditional transient test method, avoids step response
Incipient surge improves the time precision index of direct current transient delay test method to the calculating error of step signal amplitude.
It is that a kind of DC electronic transformer delay time test method provided by the invention is carried out specifically above
It is bright, structure and the connection of a kind of DC electronic transformer time-delay time testing are additionally provided to the embodiment of the present invention below
Relationship illustrates, referring to Fig. 2, the present apparatus includes：
Sampling unit 201, it is mutual from DC electronic for applying step signal to the primary side of DC electronic transformer
The secondary side of sensor is sampled to obtain step standard source signal and step test product signal；
Fitting unit 202, for carrying out generalized polynomial curve matching to step standard source signal and step test product signal,
Standard source matched curve and test product matched curve are obtained, takes 90% peak value of standard source matched curve and test product matched curve respectively
Corresponding point is as a reference point, obtains standard source reference point and test product reference point；
Interpolating unit 203 for carrying out cubic spline interpolation to the ordinate of test product reference point, obtains subject mutual inductor rank
Jump end time, the determining and hithermost sampled point of standard source reference point in step standard source signal, by the horizontal stroke of the sampled point
Coordinate is as standard source step end time；
Poor unit 204 is sought, for the difference conduct of mutual inductor step end time and standard source step end time will to be tested
The delay time of DC electronic transformer.
In the present embodiment, fitting unit 202 includes：
Subelement 2021 is fitted, for carrying out generalized polynomial curve plan to step standard source signal and step test product signal
It closes, obtains standard source matched curve and test product matched curve；
Value subelement 2022, for taking 90% peak value of standard source matched curve and test product matched curve corresponding respectively
Point is as a reference point, obtains standard source reference point and test product reference point；
Fitting subelement 2021 is additionally operable to through preset first formula to step standard source signal and step test product signal
The abscissa of all sampled points carries out generalized polynomial curve matching, obtains standard source matched curve and test product matched curve；
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor step standard source signal or step test product signal
Each sampled point abscissa, ajFor multinomial coefficient, m is polynomial order.
In the present embodiment, fitting unit 202 further includes：
Computation subunit 2023, for when carrying out generalized polynomial curve matching, rank to be controlled by preset second formula
The residual error between residual error, step test product signal and test product matched curve between jump standard source signal and standard source matched curve；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIntend for standard source
Close the ordinate of curve or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wi
For weight.
In the present embodiment, interpolating unit is additionally operable to carry out the ordinate of test product reference point by preset third formula group
Cubic spline interpolation obtains subject mutual inductor step end time, is determined and standard source reference point in step standard source signal
Hithermost sampled point, using the abscissa of sampled point as standard source step end time；
Wherein, preset third formula group is：
In formula,B=1-A,X is
The ordinate of test product reference point, y are subject mutual inductor step end time.
The present invention directly using step signal source as testing source, by the Spline smoothing of step signal source signal and
Mutual inductor actual samples output step response compares, and is made reference without using exchange data source, avoids exchange steady state test side
The principle defect of progress of disease signal period variation can not be differentiated under method, is applicable to mutual to all types of DC electronics at this stage
Sensor carries out delay test.It is distinguished particular for the physical characteristic of direct current signal and AC signal, to step response alignment algorithm
It is improved, improves the precision index of direct current transient state time-delay test method, the stable operation for direct current control and protection system provides
Important leverage.
It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description,
The specific work process of device and unit can refer to the corresponding process in preceding method embodiment, and details are not described herein.
In several embodiments provided herein, it should be understood that disclosed system, device and method can be with
It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the unit
It divides, only a kind of division of logic function can have other dividing mode, such as multiple units or component in actual implementation
It may be combined or can be integrated into another system or some features can be ignored or does not perform.Another point, it is shown or
The mutual coupling, direct-coupling or communication connection discussed can be the indirect coupling by some interfaces, device or unit
It closes or communicates to connect, can be electrical, machinery or other forms.
The unit illustrated as separating component may or may not be physically separate, be shown as unit
The component shown may or may not be physical unit, you can be located at a place or can also be distributed to multiple
In network element.Some or all of unit therein can be selected according to the actual needs to realize the mesh of this embodiment scheme
's.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it can also
That each unit is individually physically present, can also two or more units integrate in a unit.Above-mentioned integrated list
The form that hardware had both may be used in member is realized, can also be realized in the form of SFU software functional unit.
If the integrated unit is realized in the form of SFU software functional unit and is independent product sale or uses
When, it can be stored in a computer read/write memory medium.Based on such understanding, technical scheme of the present invention is substantially
The part to contribute in other words to the prior art or all or part of the technical solution can be in the form of software products
It embodies, which is stored in a storage medium, is used including some instructions so that a computer
Equipment (can be personal computer, server or the network equipment etc.) performs the complete of each embodiment the method for the present invention
Portion or part steps.And aforementioned storage medium includes：USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only
Memory), random access memory (RAM, Random Access Memory), magnetic disc or CD etc. are various can store journey
The medium of sequence code.
The above, the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although with reference to before
Embodiment is stated the present invention is described in detail, it will be understood by those of ordinary skill in the art that：It still can be to preceding
The technical solution recorded in each embodiment is stated to modify or carry out equivalent replacement to which part technical characteristic；And these
Modification is replaced, the spirit and scope for various embodiments of the present invention technical solution that it does not separate the essence of the corresponding technical solution.
Claims (8)
1. a kind of DC electronic transformer delay time test method, which is characterized in that including：
S1：Step signal is applied to the primary side of DC electronic transformer, from the secondary side of the DC electronic transformer
It is sampled to obtain step standard source signal and step test product signal；
S2：Generalized polynomial curve matching is carried out to the step standard source signal and the step test product signal, obtains standard
Source matched curve and test product matched curve take 90% peak value of the standard source matched curve and the test product matched curve respectively
Corresponding point is as a reference point, obtains standard source reference point and test product reference point；
S3：Cubic spline interpolation is carried out to the ordinate of the test product reference point, obtains subject mutual inductor step end time,
The determining and hithermost sampled point of standard source reference point in the step standard source signal, by the abscissa of the sampled point
As standard source step end time；
S4：Using the difference of the subject mutual inductor step end time and the standard source step end time as the direct current
The delay time of minor mutual inductor.
2. DC electronic transformer delay time test method according to claim 1, which is characterized in that described to institute
State step standard source signal and the step test product signal and carry out generalized polynomial curve matching, obtain standard source matched curve and
Test product matched curve is specially：
By preset first formula to the horizontal seat of all sampled points of the step standard source signal and the step test product signal
Mark carries out generalized polynomial curve matching, obtains standard source matched curve and test product matched curve；
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor each of step standard source signal or step test product signal
The abscissa of a sampled point, ajFor multinomial coefficient, m is polynomial order.
3. DC electronic transformer delay time test method according to claim 2, which is characterized in that carrying out extensively
During adopted polynomial curve fitting, the step standard source signal and the standard source matched curve are controlled by preset second formula
Between residual error, the residual error between the step test product signal and the test product matched curve；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIt is fitted for standard source bent
The ordinate of line or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wiFor power
Weight.
4. DC electronic transformer delay time test method according to claim 1, which is characterized in that step S3 has
Body is：
Cubic spline interpolation is carried out to the ordinate of the test product reference point by preset third formula group, obtains subject mutual inductor
Step end time, the determining and hithermost sampled point of standard source reference point in the step standard source signal, by institute
The abscissa of sampled point is stated as standard source step end time；
Wherein, the preset third formula group is：
f(xi)=yi
g(xi)=yi=pi(xi)
g′(xi)=p 'i(xi)=p 'i-1(xi)
g″(xi)=p "i(xi)=p "i-1(xi)
Y=Ayi+Byi+1+Cy″i+Dy″i+1
In formula,B=1-A,X is test product
The ordinate of reference point, y are subject mutual inductor step end time.
5. a kind of DC electronic transformer time-delay time testing, which is characterized in that including：
Sampling unit, for applying step signal to the primary side of DC electronic transformer, from the DC electronic mutual inductance
The secondary side of device is sampled to obtain step standard source signal and step test product signal；
Fitting unit, for carrying out generalized polynomial curve plan to the step standard source signal and the step test product signal
It closes, obtains standard source matched curve and test product matched curve, the standard source matched curve and the test product is taken to be fitted song respectively
The corresponding point of 90% peak value of line is as a reference point, obtains standard source reference point and test product reference point；
Interpolating unit for carrying out cubic spline interpolation to the ordinate of the test product reference point, obtains subject mutual inductor step
End time, the determining and hithermost sampled point of standard source reference point, is adopted described in the step standard source signal
The abscissa of sampling point is as standard source step end time；
Seek poor unit, for using it is described subject mutual inductor step end time and the standard source step end time difference as
The delay time of the DC electronic transformer.
6. DC electronic transformer time-delay time testing according to claim 5, which is characterized in that the fitting
Unit includes：
Subelement is fitted, for carrying out generalized polynomial curve plan to the step standard source signal and the step test product signal
It closes, obtains standard source matched curve and test product matched curve；
Value subelement, for taking 90% peak value of the standard source matched curve and the test product matched curve corresponding respectively
Point is as a reference point, obtains standard source reference point and test product reference point；
The fitting subelement is additionally operable to believe the step standard source signal and the step test product by preset first formula
Number the abscissas of all sampled points carry out generalized polynomial curve matching, obtain standard source matched curve and test product fitting be bent
Line；
Wherein, preset first formula is：
In formula, f be standard source matched curve or test product matched curve, xiFor each of step standard source signal or step test product signal
The abscissa of a sampled point, ajFor multinomial coefficient, m is polynomial order.
7. DC electronic transformer time-delay time testing according to claim 6, which is characterized in that the fitting
Unit further includes：
Computation subunit, for when carrying out generalized polynomial curve matching, the step mark to be controlled by preset second formula
Between residual error, the step test product signal and the test product matched curve between quasi- source signal and the standard source matched curve
Residual error；
Wherein, preset second formula is：
In formula, yiFor step standard source signal or the ordinate of each sampled point of step test product signal, fiIt is fitted for standard source bent
The ordinate of line or each point of test product matched curve, length of the N for step standard source signal or step test product signal, wiFor power
Weight.
8. DC electronic transformer time-delay time testing according to claim 5, which is characterized in that the interpolation
Unit is additionally operable to carry out cubic spline interpolation to the ordinate of the test product reference point by preset third formula group, is tested
Mutual inductor step end time determines and the hithermost sampling of standard source reference point in the step standard source signal
Point, using the abscissa of the sampled point as standard source step end time；
Wherein, the preset third formula group is：
f(xi)=yi
g(xi)=yi=pi(xi)
g′(xi)=p 'i(xi)=p 'i-1(xi)
g″(xi)=p "i(xi)=p "i-1(xi)
Y=Ayi+Byi+1+Cy″i+Dy″i+1
In formula,B=1-A,X is test product
The ordinate of reference point, y are subject mutual inductor step end time.
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