CN104049231B - Integrated system for testing delay of separated units of optical electronic transformer - Google Patents
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- CN104049231B CN104049231B CN201410247777.8A CN201410247777A CN104049231B CN 104049231 B CN104049231 B CN 104049231B CN 201410247777 A CN201410247777 A CN 201410247777A CN 104049231 B CN104049231 B CN 104049231B
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Abstract
The invention discloses an integrated system for testing the delay of separated units of an optical electronic transformer. The integrated system for testing the delay of the separated units of the optical electronic transformer comprises a standard transformer, an I/U converter, an A/D acquisition circuit, a CPU and an upper computer, wherein the CPU is connected with a digital quantity acquisition module based on an FPGA, a serial data interface of the digital quantity acquisition module based on the FPGA is externally connected with a collector, and an Ethernet data interface is externally connected with a combining unit. The integrated system for testing the delay of the separated units of the optical electronic transformer has all the functions of a conventional optical electronic transformer calibrator, process testing is added, testing of the separating time characteristic of the optical electronic transformer can be achieved through the system, the delay time of all the separated units of the optical electronic transformer can be tested accurately, and detection data are provided for testing of the separated units of the field optical electronic transformer of an intelligent substation.
Description
Technical field
The present invention relates to a kind of optical electron formula transformer separative element integration delay test system, belong to power measurement
Technical field.
Background technology
Optical electron formula transformer with the constantly improve of processing technique, gradually in electronic mutual inductor application
Occupy a tiny space, but because optical electron formula transformer is typically all to adopt magneto-optic principle or electric light principle, so its sensing
Measuring unit is substantially and obtains current/voltage value with the mode measuring light step-length.Optical fiber between harvester and sensing head returns
In road transmission be the analog signalses comprising current/voltage, this signal lag just with live fiber lengths and incident angle
Relevant.Information is delivered to combining unit by merging list after repairing in harvester by way of specified time delay by this time delay general
Unit carries out when synchronous unifying to repair.And at present because optical electron formula transformer sensing head, harvester are general and combining unit
Manufacturer is in released state, even the product of same producer also due to the difference of specialty and provided by different departments.
Be can be to electricity inside optical electron formula transformer harvester and combining unit with electricity electronic mutual inductor difference
The time delay of minor transformer is repaired, and this gives the very big trouble that live operation maintenance personnel brings.
Privately owned ft3 agreement, this protocol transmission number is typically adopted between optical electron formula transformer body and combining unit
According to having generally comprised delay parameter, combining unit enter after reading this time parameter row interpolation further according to autophage when
Between fill up new specified delay time.Rear end equipment synchronizes according to the time parameter that combining unit is filled in.
At present optical electron formula mutual inductor on site test when frequent be using electronic mutual inductor body and combining unit as
Being tested, it is due to merging that this test process is difficult to position its absolute time delay when time of occurrence error for one entirety
Unit is still due to the error caused by the physics time delay of optical transformer itself.At this moment time-based correction is relatively difficult to fixed
Position easily occurs repairing error.
Content of the invention
The invention provides a kind of optical electron formula transformer separative element integration delay test system, solve in light
Learn time-based correction in electronic mutual inductor test process to be difficult to position, the problem easily occurring repairing error.
In order to solve above-mentioned technical problem, the technical solution adopted in the present invention is:
A kind of optical electron formula transformer separative element integration delay test system, including the standard mutual inductor being sequentially connected
Device, i/u changer, a/d Acquisition Circuit, cpu, host computer, described cpu is also associated with the digital data acquisition module based on fpga,
The external harvester of serial data interface of the described digital data acquisition module based on fpga, the external merging of Ethernet data interface
Unit；Described standard mutual inductor is arranged on the wire being cased with fiber optic loop, as standard signal source；Described a/d Acquisition Circuit with
Realize analog data collection on the basis of standard signal, and analog data is sent to the cpu including constant-temperature crystal oscillator；Described base
The ether netting index exporting in order to the serial data and combining unit gathering harvester output in the digital data acquisition module of fpga
According to, and serial data and Ethernet data are sent to the cpu including constant-temperature crystal oscillator；Described cpu receives analog data, serial
Data and Ethernet data, and calculate respective fundamental phase angle, calculate simulation using the relation between fundamental phase angle
Time delay between time delay between amount and optical electron formula transformer body, analog quantity and combining unit, and according to harvester with
The specified delay value that combining unit is demarcated calculates t1, t2 and t3 respectively, and wherein t1 is optical electron formula transformer physics time delay,
T2 is collector for processing time delay, and t3 processes time delay for combining unit；Described host computer is handed in order to realize the data and cpu between
Mutually.
It is additionally provided with the dpll trembling that disappears in order to the time between the described digital data acquisition module based on fpga and combining unit,
Described dpll includes phase discriminator, lpf and the voltage controlled oscillator being sequentially connected, the feedback output end of described voltage controlled oscillator and phase demodulation
The feedback input end of device connects.
The first optical receiver is also set between described dpll and combining unit.
The described digital data acquisition module based on fpga is connected with the outfan of harvester by beam splitter.
It is additionally provided with the second optical receiver between the described digital data acquisition module based on fpga and beam splitter.
Described cpu is the cpu of built-in constant-temperature crystal oscillator, and built-in constant-temperature crystal oscillator is in order to the collection of analog quantity, serial data
Unified time reference is stamped in collection and Ethernet data collection；The precision of described constant-temperature crystal oscillator is 0.001ppm.
Described a/d Acquisition Circuit adopts 24 a/d conversion chips.
Described host computer is computer.
The invention has the beneficial effects as follows: 1, the institute of the present invention integrated normal optical electronic transducer calibration instrument is functional,
Increase procedural test, the disengaging time characteristic test of optical electron formula transformer is brought into test system, can be accurate
The delay time of the test each separative element of optics electronic mutual inductor, is the live optical electronic mutual inductor of intelligent substation
Separative element test provides detection foundation；2nd, the a/d Acquisition Circuit of the present invention adopts 24 a/d conversion chips, improves whole
The sampling precision of system；3rd, the present invention using embedded real-time operating system so that whole system has very strong real-time；4、
Without importing cid file format, and the information of optical electron formula transformer, identify optical electron formula automatically according to message format
Transformer producer message and ether network packet；5th, adopt constant-temperature crystal oscillator as the unified timing system of whole system, adopt
Dpll technology eliminates time jitter, to improve the synchronization accuracy of analog data, serial data, Ethernet data；6th, it is based on
The digital data acquisition module of fpga is connected with the outfan of harvester by beam splitter it is ensured that the signal that system obtains is believed with actual
Number be homologous signal；7th, using time domain concept come computation delay, do not adopt interpolation technique, it is to avoid interpolation technique can introduce newly
Interpolation error.
Brief description
Fig. 1 is the structural representation of the present invention.
Fig. 2 is the structural representation of dpll.
Specific embodiment
Below in conjunction with Figure of description, the invention will be further described.Following examples are only used for clearly
Technical scheme is described, and can not be limited the scope of the invention with this.
As shown in figure 1, a kind of optical electron formula transformer separative element integration delay test system, including being sequentially connected
Standard mutual inductor, i/u changer, a/d Acquisition Circuit, cpu, host computer, described cpu is also associated with the digital quantity based on fpga
Acquisition module, the external harvester of serial data interface of the described digital data acquisition module based on fpga, Ethernet data interface
External combining unit.
Standard mutual inductor is arranged on the wire being cased with fiber optic loop, as standard signal source.I/u changer has high stable
Property and reliable temperature characterisitic realize i/u conversion.A/d Acquisition Circuit adopts 24 a/d conversion chips, and this chip is ad company
Ads1271 chip, it is possible to increase the employing precision of whole system, a/d Acquisition Circuit realizes analog quantity on the basis of standard signal
Data acquisition, sampling rate is 100k, and analog data is sent to the cpu including constant-temperature crystal oscillator by a/d Acquisition Circuit.
Digital data acquisition module based on fpga is in order to gather serial data and the combining unit output of harvester output
Ethernet data, and serial data and Ethernet data are sent to the cpu including constant-temperature crystal oscillator, should numeral based on fpga
Amount acquisition module adopts xilex company sparten3 series fpga.
In order to ensure that the signal that described system obtains is homologous signal with actual signal, that is, the serial data gathering with actual
Signal homology, the digital data acquisition module based on fpga is connected with the outfan of harvester by beam splitter.
Harvester due to optical electron formula transformer adopts ft3 serial transmission, and the stability of its time delay has certain
Ensure, but combining unit (mu) due to synchronization process, data is packed, and program task is dispatched, the link such as optical fiber transceiving interface
, when Frame reaches protection device, there is certain random time shake, i.e. due in θ 1 (t) of sampling value message in impact
It is with randomized jitter, this jitter value especially after network can reach 30～40 microseconds, therefore in order to improve mould
Analog quantity data, serial data, the synchronization accuracy of Ethernet data, described system carries out disappearing trembling to markers θ 1 (t) using dpll,
Obtain final markers θ 2 (t), dpll is set between the digital data acquisition module based on fpga and combining unit.
, as shown in Fig. 2 including phase discriminator, lpf and the voltage controlled oscillator being sequentially connected, the feedback of voltage controlled oscillator is defeated for dpll
Go out end to be connected with the feedback input end of phase discriminator.Original sample value reaches initial input amount θ 1 (t) that beat constitutes dpll,
When dpll starts initial, θ 2 (t)=θ 1 (t), the mistake of θ 1 (t) and the θ 2 (t) that whether cumulative errors or time jitter cause
Step, completes both time differences by phase discriminator and calculates, this difference, as input quantity v1 (t) of loop filter (lpf), designs
One iir type low pass filter, to ensure good tracking velocity and stability, filters and is output as v2 (t), v2 (t) is as voltage-controlled
By the size of its amplitude, the input quantity of agitator, to determine that tracking adjusts step-length, to complete θ's 2 (t) within the time less than 1s
Whole tracking process, the continuous circulation in the operation of dpll of above link is carried out.
It is respectively provided between digital data acquisition module between dpll and combining unit and based on fpga and beam splitter
First optical receiver and the second optical receiver, both of which adopts the optical receiver of agilent (Agilent) company, and interface adopts
St, serial fiber optic wavelength is 850nm, and Ethernet fiber optic wavelength adopts 1310nm.
Cpu receives analog data, serial data and Ethernet data, and calculates respective fundamental phase angle, utilizes
Relation between fundamental phase angle calculates time delay between analog quantity and optical electron formula transformer body, analog quantity and merges
Time delay between unit, and t1, t2 and t3 are calculated respectively according to the specified delay value that harvester is demarcated with combining unit, wherein
T1 is optical electron formula transformer physics time delay, and t2 is collector for processing time delay, and t3 processes time delay for combining unit.This cpu is
The cpu of built-in constant-temperature crystal oscillator, the precision of constant-temperature crystal oscillator is 0.001ppm, built-in constant-temperature crystal oscillator in order to the collection of analog quantity,
Unified time reference is stamped in serial data collection and Ethernet data collection；This cpu is the powerpc model of Freescale
mpc8247.
Host computer is in order to realize the data interaction and cpu between, generally computer, Computer display man-machine interaction circle
Face, interface software adopts vc programming realization, passes through ethernet communication between computer and cpu.
Above-mentioned system obtains analog quantity by gathering the time reference as whole system for the analog data of signal source, test
Time delay between time delay and optical electron formula transformer body between, analog quantity and combining unit, reads harvester and merges
The specified delay value that unit is demarcated, calculates optical electron formula transformer physics time delay, collector for processing time delay and combining unit
Process time delay；The institute of system integration normal optical electronic transducer calibration instrument is functional, increases procedural test, by optical electron
Test system is brought in the disengaging time characteristic test of formula transformer into, can accurately test each point of optics electronic mutual inductor
From the delay time of unit, for the live optical electronic mutual inductor of intelligent substation separative element test provide detection according to
According to.
Ultimate principle, principal character and the advantage of the present invention have been shown and described above.The technical staff of the industry should
Understand, the present invention is not restricted to the described embodiments, the simply explanation present invention's described in above-described embodiment and description is former
Reason, without departing from the spirit and scope of the present invention, the present invention also has various changes and modifications, these changes and improvements
Both fall within scope of the claimed invention.Claimed scope is by appending claims and its equivalent circle.
Fixed.
Claims (9)
1. a kind of optical electron formula transformer separative element integration delay test system it is characterised in that: include being sequentially connected
Standard mutual inductor, i/u changer, a/d Acquisition Circuit, cpu, host computer, described cpu is also associated with the digital quantity based on fpga
Acquisition module, the external harvester of serial data interface of the described digital data acquisition module based on fpga, Ethernet data interface
External combining unit；
Described standard mutual inductor is arranged on the primary side wire being cased with fiber optic loop, as standard signal source；
Described a/d Acquisition Circuit realizes analog data collection on the basis of standard signal, and analog data is sent to interior
Cpu containing constant-temperature crystal oscillator；
The described digital data acquisition module based on fpga is in order to gather serial data and the combining unit output of harvester output
Ethernet data, and serial data and Ethernet data are sent to the cpu including constant-temperature crystal oscillator；
Described cpu receives analog data, serial data and Ethernet data, and calculates respective fundamental phase angle, utilizes
Relation between fundamental phase angle calculates time delay between analog quantity and optical electron formula transformer body, analog quantity and merges
Time delay between unit, and t1, t2 and t3 are calculated respectively according to the specified delay value that harvester is demarcated with combining unit, wherein
T1 is optical electron formula transformer physics time delay, and t2 is collector for processing time delay, and t3 processes time delay for combining unit；
Described host computer is in order to realize the data interaction and cpu between.
2. a kind of optical electron formula transformer separative element integration delay test system according to claim 1, it is special
Levy and be: between the described digital data acquisition module based on fpga and combining unit, be additionally provided with the dpll trembling that disappears in order to the time, institute
State phase discriminator, lpf and the voltage controlled oscillator that dpll includes being sequentially connected, the feedback output end of described voltage controlled oscillator and phase discriminator
Feedback input end connect.
3. a kind of optical electron formula transformer separative element integration delay test system according to claim 2, it is special
Levy and be: between described dpll and combining unit, also set the first optical receiver.
4. a kind of optical electron formula transformer separative element integration delay test system according to claim 1, it is special
Levy and be: the described digital data acquisition module based on fpga is connected with the outfan of harvester by beam splitter.
5. a kind of optical electron formula transformer separative element integration delay test system according to claim 4, it is special
Levy and be: between the described digital data acquisition module based on fpga and beam splitter, be additionally provided with the second optical receiver.
6. a kind of optical electron formula transformer separative element integration delay test system according to claim 1, it is special
Levy and be: described cpu is the cpu of built-in constant-temperature crystal oscillator, built-in constant-temperature crystal oscillator is in order to adopt to the collection of analog quantity, serial data
Unified time reference is stamped in collection and Ethernet data collection.
7. a kind of optical electron formula transformer separative element integration delay test system according to claim 6, it is special
Levy and be: the precision of described constant-temperature crystal oscillator is 0.001ppm.
8. a kind of optical electron formula transformer separative element integration delay test system according to claim 1, it is special
Levy and be: described a/d Acquisition Circuit adopts 24 a/d conversion chips.
9. a kind of optical electron formula transformer separative element integration delay test system according to claim 1, it is special
Levy and be: described host computer is computer.
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| CN104237831B (en) * | 2014-10-13 | 2017-08-22 | 国家电网公司 | A kind of counter of lightning arrester tester calibration device |
| CN107907848A (en) * | 2017-10-27 | 2018-04-13 | 国网浙江省电力公司杭州供电公司 | detection method for electronic mutual inductor |
| CN108196215B (en) * | 2018-01-04 | 2020-05-01 | 广东电网有限责任公司电力科学研究院 | Method and device for testing delay time of direct-current electronic transformer |
| CN110505259B (en) * | 2018-05-17 | 2022-07-12 | 许昌许继软件技术有限公司 | Data processing method and device for intelligent substation |
| CN109375139B (en) * | 2018-11-06 | 2020-11-27 | 国网内蒙古东部电力有限公司电力科学研究院 | Device and method for automatically testing optical fiber current transformer |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102901874A (en) * | 2012-11-08 | 2013-01-30 | 江苏凌创电气自动化股份有限公司 | Phase- and time mark measurement-based electronic transformer absolute delay detection method |
| CN202903926U (en) * | 2012-11-15 | 2013-04-24 | 江苏凌创电气自动化股份有限公司 | Portable electronic transformer time characteristic tester |
| CN202948124U (en) * | 2012-10-31 | 2013-05-22 | 江苏省电力公司电力科学研究院 | Running error real-time comparison device for optical and electromagnetic current transformers |
| CN103135013A (en) * | 2012-12-28 | 2013-06-05 | 辽宁省电力有限公司 | Detecting and evaluating system of data acquisition unit |
| CN103777104A (en) * | 2014-02-24 | 2014-05-07 | 国家电网公司 | Time-delay characteristic testing device and method of digital substation secondary signal transmission system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10170603A (en) * | 1996-12-13 | 1998-06-26 | Ando Electric Co Ltd | Calibration method of ic tester |
-
2014
- 2014-06-05 CN CN201410247777.8A patent/CN104049231B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202948124U (en) * | 2012-10-31 | 2013-05-22 | 江苏省电力公司电力科学研究院 | Running error real-time comparison device for optical and electromagnetic current transformers |
| CN102901874A (en) * | 2012-11-08 | 2013-01-30 | 江苏凌创电气自动化股份有限公司 | Phase- and time mark measurement-based electronic transformer absolute delay detection method |
| CN202903926U (en) * | 2012-11-15 | 2013-04-24 | 江苏凌创电气自动化股份有限公司 | Portable electronic transformer time characteristic tester |
| CN103135013A (en) * | 2012-12-28 | 2013-06-05 | 辽宁省电力有限公司 | Detecting and evaluating system of data acquisition unit |
| CN103777104A (en) * | 2014-02-24 | 2014-05-07 | 国家电网公司 | Time-delay characteristic testing device and method of digital substation secondary signal transmission system |
Non-Patent Citations (2)
| Title |
|---|
| 电子式互感器校验仪的设计与实现;陈福胜 等;《电测与仪表》;20110131;第48卷(第1期);第55-58页 * |
| 电子式互感器采样系统固有延时测试研究;张晓华 等;《电测与仪表》;20110731;第48卷(第7期);第42-45页 * |
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