CN104035021B - The method of testing of clock chip and system - Google Patents
The method of testing of clock chip and system Download PDFInfo
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- CN104035021B CN104035021B CN201310074100.4A CN201310074100A CN104035021B CN 104035021 B CN104035021 B CN 104035021B CN 201310074100 A CN201310074100 A CN 201310074100A CN 104035021 B CN104035021 B CN 104035021B
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Abstract
The present invention relates to integrated circuit testing field, disclose a kind of clock chip method of testing and system.In the present invention, according to clock chip test philosophy, design and manufacture test load plate and measured device interface, when the memorizer of clock chip can normally work, the precision of inspection crystal oscillator frequency, and in the operating temperature range of clock chip, use high precision cymometer that crystal oscillator frequency is measured, and calculate in the operating temperature range of clock chip according to measured value, the temperature compensation value of crystal oscillator frequency, it is stored in the memorizer of clock chip, read the most again, and when the numerical value read meets simulation curve set in advance, judge that clock chip is tested by temperature-compensating.So that the crystal oscillator frequency of clock chip obtains temperature-compensating test within the scope of the temperature that 40 degrees below zero to 85 degree is wider, improve clock accuracy.
Description
Technical field
The present invention relates to integrated circuit testing field, particularly to clock chip method of testing and system.
Background technology
Clock chip is built-in 32.768kHz crystal oscillator, with I2C EBI is communication mode,
In addition to having calendar and time clock feature, also having warning, fixed cycle Interruption, the time updates
The functions such as the 32.768kHz rate-adaptive pacemaker of interruption and enable OE, are described as follows:
1. real-time clock function: this function is used to set and read year, the moon, day, week, time, point,
Second temporal information, the time is that rear two bit digital represent, any time can divided exactly by 4 is treated as the leap year
Process；
2. Interruption generating function: fixed cycle Interruption generating function can produce a fixing week
The interrupt event of phase, the fixed cycle can random time between 244.14uS to 4095 minute set；
3. the time updates interrupt function: this function can be per second or every according to the timing setting of internal clocking
Minute produce an interrupt event；
4. warning interrupt function: this function can produce an interruption according to alarm settings.
The time error of clock chip is mainly derived from the frequency error of crystal oscillator in clock chip, and crystal oscillator
Frequency error causes mainly due to variations in temperature, so typically needing when clock chip designs to consider
Carry out temperature-compensating.At present, the frequency error of this clock chip is carried out test is at 40 degrees below zero, often
Temperature 25 degree, 55 degree, 80 degree of four processes tests, and make simulation curve；Its compensation way is: adopt
Be the mode of design, after digital compensation is crystal oscillating circuit output 32.768kHz,
The compensation carried out during frequency dividing circuit divides, 32.768kHz does not carries out temperature-compensating；Use 20S
Compensating working method once, the time gate limit value of test should be set to the integral multiple of 20S or 20S, as
Fruit can only be arranged to 10S, please test for continuous two times, average.Owing to not carrying out temperature-compensating test,
Therefore clock chip it is likely to result in unreliable in the precision of some temperature range, so that clock chip
Can not reliably be operated in wider temperature range.
Summary of the invention
It is an object of the invention to provide a kind of clock chip method of testing and system so that clock chip
Crystal oscillator frequency obtains temperature-compensating test within the scope of the temperature that 40 degrees below zero to 85 degree is wider, during raising
Clock precision.
For solving above-mentioned technical problem, embodiments of the present invention provide a kind of clock chip test side
Method, comprises the steps of
A. according to the test philosophy of clock chip, prepare before carrying out test, comprise: on test platform
Editor's test program；Connect described test platform, test load plate, measured device interface, described clock
Chip and cymometer；
B. described test program is performed, it is judged that whether the memorizer of described clock chip can normally work；
And when judging that described memorizer normally works, use described cymometer to measure the crystal oscillator of described clock chip
Frequency, checks the precision of described crystal oscillator frequency；And crystal oscillator frequency measurement obtained converts the numerical value obtained
Write in the first preset address of described memorizer；
If the precision of the most described crystal oscillator frequency meets the frequency requirement of described clock chip, then described
In the operating temperature range of clock chip, take at least four temperature spot, use cymometer to measure described clock
The crystal oscillator frequency of chip, and the crystal oscillator frequency numerical value and described first that obtains of conversion measurement obtained presets
Numerical value in address is respectively written in the second preset address section；Wherein, described second preset address section is individual
Number is corresponding with the number of described temperature spot；
D. according to the numerical value in described second preset address section, the work temperature at described clock chip is calculated
In the range of degree, the temperature compensation value of described crystal oscillator frequency, and it is stored in the 3rd preset address of described memorizer
In section；
E. read the numerical value in described 3rd preset address section, observe the numerical value of described reading；And institute
State the numerical value of reading when meeting simulation curve set in advance, it is determined that described clock chip passes through temperature-compensating
Test.
Embodiments of the present invention additionally provide a kind of clock chip test system, comprise: test platform,
Test load plate, measured device interface and cymometer；Described test platform connects described test load plate；
Described test load plate connects described measured device interface, and described measured device interface connects described clock core
Sheet；Described cymometer is connected with described clock chip and described test platform respectively；
Wherein, described test platform is edited test program；
Described test platform performs described test program, it is judged that whether the memorizer of described clock chip can be just
Often work；And when judging that described memorizer normally works, use described cymometer to measure described clock core
The crystal oscillator frequency of sheet, checks the precision of described crystal oscillator frequency；And crystal oscillator frequency measurement obtained converts
The numerical value arrived writes in the first preset address of described memorizer；
When the precision judging described crystal oscillator frequency meets the frequency requirement of described clock chip, described test
Platform, in the operating temperature range of described clock chip, takes at least four temperature spot, uses frequency measurement
Measure the crystal oscillator frequency of described clock chip, and the numerical value that obtains of the crystal oscillator frequency conversion that measurement is obtained and institute
State the numerical value in the first preset address to be respectively written in the second preset address section；Wherein, described second preset
The number of address field is corresponding with the number of described temperature spot；
Described test platform, according to the numerical value in described second preset address section, calculates at described clock chip
Operating temperature range in, the temperature compensation value of described crystal oscillator frequency, and be stored in the 3rd of described memorizer the
In preset address section；
Described test platform reads the numerical value in described 3rd preset address section, observes the number of described reading
Value；And when the numerical value of described reading meets simulation curve set in advance, it is determined that described clock chip leads to
Excess temperature compensating test.
In terms of existing technologies, according to clock chip test philosophy, design is also for embodiment of the present invention
Manufacture test load plate and measured device interface, when the memorizer of clock chip can normally work, inspection
Test the precision of crystal oscillator frequency, and in the operating temperature range of clock chip, use high precision cymometer
Crystal oscillator frequency is measured, and calculates in the operating temperature range of clock chip according to measured value, brilliant
The temperature compensation value of vibration frequency, is stored in the memorizer of clock chip, reads, and at the number read
When value meets simulation curve set in advance, it is determined that clock chip is tested by temperature-compensating.Make clock
The crystal oscillator frequency of chip obtains temperature-compensating test within the scope of the temperature that 40 degrees below zero to 85 degree is wider,
Improve clock accuracy.
Furthermore it is possible to judge that the memorizer of described clock chip whether can normal work by following sub-step
Make:
According to clock 400kHz, all addresses after address reserved by described memorizer write Arbitrary Digit,
And read, compare, if the read out data and write data consistent, then judge that described memorizer can be just
Often work；
Wherein, when writing, after write an address more；8 clock cycle are taken during write, and the 6th
The individual clock cycle waits 2.5 milliseconds；During reading, before read an address more.
By writing Arbitrary Digit in memorizer, and read, be compared, memorizer can be checked whether
Can normally work, simple to operate, it is easy to accomplish.
Furthermore it is possible to the crystal oscillator frequency obtained by equation below conversion measurement: (f-32768)
/32768*1000000；Wherein, f is to measure the crystal oscillator frequency obtained.Clock chip is made by this conversion
Memorizer precision reaches 0.00001Hz, to meet the clock chip strict demand to frequency accuracy.
Furthermore it is possible to take four temperature spots, respectively 40 degrees below zeros, 25 degree, 55 degree, 80 degree.Logical
Cross and measure the crystal oscillator frequency of clock chip under representative temperature, can reflect that the frequency error of crystal oscillator becomes with temperature
The relation changed, makes temperature-compensating test apply closer to reality, so that test result is more reliable.
Furthermore it is possible to employing high precision, the cymometer of band general purpose interface bus gpib interface；Described
The crystal oscillator frequency that cymometer measurement obtains is sent to described test by general purpose interface bus GPIB communication and puts down
On platform.Measured the crystal oscillator frequency of clock chip by the cymometer of high precision, clock chip can be met
Strict demand to frequency accuracy.
Accompanying drawing explanation
Fig. 1 is the flow chart of the clock chip method of testing according to first embodiment of the invention；
Fig. 2 is the structural representation of the clock chip test system according to second embodiment of the invention.
Detailed description of the invention
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with accompanying drawing to this
Bright each embodiment is explained in detail.But, it will be understood by those skilled in the art that
In each embodiment of the present invention, propose many technology to make reader be more fully understood that the application thin
Joint.But, even if there is no these ins and outs and many variations based on following embodiment and amendment,
The application each claim technical scheme required for protection can also be realized.
First embodiment of the present invention relates to a kind of clock chip method of testing, and the method makes clock core
The crystal oscillator frequency of sheet obtains temperature-compensating test within the scope of the temperature that 40 degrees below zero to 85 degree is wider, carries
High clock accuracy, so that clock chip can be suitably used for 40 degrees below zero to 85 degree of wider temperature ranges,
Idiographic flow is as it is shown in figure 1, comprise the steps of
Step 101, according to the test philosophy of clock chip, prepares before carrying out test, comprises: in test
Test program is edited on platform；Connecting test platform, test load plate, measured device interface, clock core
Sheet and cymometer.
Specifically, following sub-step is comprised:
According to the test philosophy of clock chip, design and manufacture test load plate and measured device (DUT)
Interface.
According to the test specification of clock chip, test platform is edited test program；Such as, according to survey
Examination specification, edits test program on MTS747.
Connect test load plate and measured device interface, and get out clock chip and measured device interface
Connection with cymometer.
Whether step 102, performs test program, can normally work the memorizer of clock chip and survey
Examination；
Step 103, it is judged that whether the memorizer of clock chip can normally work；In this way, then step is performed
104,；As no, then terminate this test.
Can judge whether the memorizer of clock chip can normally work by following sub-step:
According to clock 400kHz, all addresses write Arbitrary Digit after address reserved by memorizer, and read
Go out, compare, if the read out data and write data consistent, then judge that memorizer can normally work；
Wherein, when writing, after write an address more；8 clock cycle are taken during write, and when the 6th
Clock cycle latency 2.5 milliseconds；During reading, before read an address more.
Such as, have in clock chip 255 storage addresses, 00H-0FH address as reserved address,
According to clock 400kHz write after all addresses, when writing, after write an address (number of addresses more
According to writing Arbitrary Digit), 8 clock cycle (clk), wait 2.5mS at the 6th clk；During reading,
Above one address of many readings.
By writing Arbitrary Digit in memorizer, and read, be compared, memorizer can be checked whether
Can normally work, simple to operate, it is easy to accomplish.
Step 104, uses cymometer to measure the crystal oscillator frequency of clock chip, the precision of inspection crystal oscillator frequency；
And in the first preset address of numerical value write memorizer of obtaining of the crystal oscillator frequency conversion that measurement obtained.
Clock chip is relatively strict for frequency requirement, is accurate to 0.00001Hz, thus need external specially
Industry cymometer, passes to the value on cymometer on MTS747；Crystal oscillator frequency root measurement obtained is according to public affairs
Formula (f-32768)/32768*1000000 converts, and value write 12H(conversion obtained is i.e.,
12H is the first preset address).The memorizer precision being made clock chip by this conversion reaches 0.00001Hz,
To meet the clock chip strict demand to frequency accuracy.
Additionally, what deserves to be explained is, present embodiment uses high precision, band general purpose interface bus (GPIB)
The cymometer of interface, the crystal oscillator frequency that cymometer measurement obtains is sent to test platform by GPIB communication
On.Measured the crystal oscillator frequency of clock chip by the cymometer of high precision, clock chip pair can be met
The strict demand of frequency accuracy.
Step 105, it is judged that whether the precision of crystal oscillator frequency meets the frequency requirement of clock chip, in this way,
Then perform step 106；As no, then terminate this test.
Step 106, in the operating temperature range of clock chip, takes at least four temperature spot, uses frequency
The crystal oscillator frequency of rate measurement amount clock chip, and the crystal oscillator frequency numerical value that obtains of conversion that measurement is obtained and
Numerical value in first preset address is respectively written in the second preset address section.Wherein, the second preset address section
Number corresponding with the number of temperature spot.
Such as, when clock chip is tested, four temperature spots can be taken, the most subzero 40
Degree, 25 degree, 55 degree, 80 degree of tests, along with the change of temperature, value in 12H address and reading
Frequency values is the most different, reads the value of 12H address respectively and crystal oscillator frequency conversion that each temperature survey obtains
Numerical value afterwards；By measuring the crystal oscillator frequency of clock chip under representative temperature, the frequency of crystal oscillator can be reflected
The relation that rate error varies with temperature, makes temperature-compensating test apply closer to reality, so that test knot
The most more reliable.
Specifically, the numerical value after 40 degrees below zero, the crystal oscillator frequency that measurement is obtained conversion and 12H
Address date is respectively written into address 1AH, 1BH, 1CH, here, 1AH, 1BH, 1CH are 40 degrees below zero pair
The the second preset address section answered；Number at subzero 10 degree, after the crystal oscillator frequency that measurement is obtained conversion
Value and 12H address date are respectively written into address 23H, 24H, 25H；At 25 degree, the crystalline substance that measurement is obtained
Numerical value and 12H address date after vibration frequency conversion are respectively written into address 17H, 18H, 19H；55
Degree, numerical value and 12H address date after crystal oscillator frequency measurement obtained conversion are respectively written into address
1DH,1EH,1FH；At 80 degree, the numerical value after the crystal oscillator frequency that measurement is obtained conversion and 12H ground
Location data are respectively written into address 20H, 21H, 22H.
Step 107, according to the numerical value in the second preset address section, calculates the operating temperature at clock chip
In the range of, the temperature compensation value of crystal oscillator frequency, and be stored in the 3rd preset address section of memorizer.
In the present embodiment, can use and solve quaternary cubic equation and carry out analog temperature compensation curve, tool
Say, 40 degrees below zero body, read the worthwhile y1 that is of 1AH, 1BH address, read the value of 1CH address
As x1；25 degree, read the worthwhile y2 that is of 17H, 18H address, read the worthwhile of 19H address and be x2；
55 degree, read the worthwhile y3 that is of 1DH, 1EH address, read the worthwhile of 1FH address and be x3；80 degree,
Read the worthwhile y4 that is of 20H, 21H address, read the worthwhile of 22H address and be x4；Substitute into respectively
Y=A*x*x*x+B*x*x+C*x+D, asks for quaternary cubic equation, draws A, B, C, D.Then, from 25H
Address starts to these 218 addresses of FFH(25H-FFH to be the 3rd preset address section), enter 16
System (25H-FFH) is converted into decimal number, as x, all substitutes into y=A*x*x*x+B*x*x+C*x+D
In, draw y, then y value is respectively written in these 218 addresses of 25H-FFH.
Step 108, reads the numerical value in the 3rd preset address section, observes the numerical value read.Namely read
Take the data in this sector address of 25H-FFH, obtain simulation curve.Owing to using quaternary three in step 107
Equation of n th order n, therefore, what this step obtained should be for parabola.
Step 109, it is judged that the numerical value of reading meets simulation curve set in advance, in this way, then when judging
Clock chip tests (step 110) by temperature-compensating；As no, then judge that clock chip is not over temperature
Degree compensating test (step 111), terminates this test.
It is to say, whether the parabola read by observation is as expection, if unanimously, then it is assumed that
Measured clock chip has passed through temperature-compensating test.
Compared with prior art, according to clock chip test philosophy, design and manufacture test load plate and quilt
Survey device interface, when the memorizer of clock chip can normally work, the precision of inspection crystal oscillator frequency,
And in the operating temperature range of clock chip, use high precision cymometer that crystal oscillator frequency is measured,
And calculate in the operating temperature range of clock chip according to measured value, the temperature compensation value of crystal oscillator frequency,
It is stored in the memorizer of clock chip, reads the most again, and meet simulation set in advance at the numerical value read
During curve, it is determined that clock chip is tested by temperature-compensating.Make the crystal oscillator frequency of clock chip subzero
Obtain temperature-compensating test within the scope of 40 degree to 85 degree wider temperature, improve clock accuracy.
The step of the most various methods divides, and is intended merely to describe clear, it is achieved time can merge into one
Step or split some step, is decomposed into multiple step, as long as comprising identical logical relation,
All in the protection domain of this patent；To adding inessential amendment in algorithm or in flow process or drawing
Enter inessential design, but do not change the core design of its algorithm and flow process all at the protection model of this patent
In enclosing.
Second embodiment of the invention relates to a kind of clock chip test system, as in figure 2 it is shown, comprise:
Test platform, test load plate, measured device interface and cymometer；Test platform connecting test load board；
Test load plate connects measured device interface, and measured device interface connects clock chip；Cymometer respectively with
Clock chip and test platform connect；
Wherein, test platform is edited test program；
Test platform performs test program, it is judged that whether the memorizer of clock chip can normally work；Its tool
Body examination examination is as follows:
According to clock 400kHz, all addresses write Arbitrary Digit after address reserved by memorizer, and read
Go out, compare, if the read out data and write data consistent, then judge that memorizer can normally work；
Wherein, when writing, after write an address more；8 clock cycle are taken during write, and when the 6th
Clock cycle latency 2.5 milliseconds；During reading, before read an address more.
Test platform, when judging that memorizer normally works, uses cymometer to measure the crystal oscillator frequency of clock chip
Rate, the precision of inspection crystal oscillator frequency；And the numerical value write that crystal oscillator frequency conversion measurement obtained obtains deposits
In first preset address of reservoir；The crystal oscillator frequency obtained by equation below conversion measurement: (f-32768)
/32768*1000000；Wherein, f is to measure the crystal oscillator frequency obtained.
When the precision judging crystal oscillator frequency meets the frequency requirement of clock chip, test platform is at clock core
In the operating temperature range of sheet, take at least four temperature spot, such as, take four temperature spots, be respectively
40 degrees below zero, 25 degree, 55 degree, 80 degree；Cymometer is used to measure the crystal oscillator frequency of clock chip, and
Numerical value in the crystal oscillator frequency numerical value that obtains of conversion measurement obtained and the first preset address is respectively written into the
In two preset address sections；Wherein, the number of the second preset address section is corresponding with the number of temperature spot；
Test platform, according to the numerical value in the second preset address section, calculates the operating temperature model at clock chip
In enclosing, the temperature compensation value of crystal oscillator frequency, and be stored in the 3rd preset address section of memorizer；
Test platform reads the numerical value in the 3rd preset address section, observes the numerical value read；And in reading
When numerical value meets simulation curve set in advance, it is determined that clock chip is tested by temperature-compensating.
Additionally, what deserves to be explained is, owing to clock chip is relatively stricter for frequency requirement, it is accurate to
0.00001Hz, so present embodiment uses high precision, band general purpose interface bus (GPIB) interface
Cymometer, the crystal oscillator frequency that cymometer measurement obtains is sent on test platform by GPIB communication.
It is seen that, present embodiment is the system embodiment corresponding with the first embodiment, this enforcement
Mode can be worked in coordination enforcement with the first embodiment.The relevant technical details mentioned in first embodiment
The most effective, in order to reduce repetition, repeat no more here.Correspondingly, this enforcement
The relevant technical details mentioned in mode is also applicable in the first embodiment.
It is noted that each module involved in present embodiment is logic module, in reality
In application, a logical block can be a physical location, it is also possible to be one of a physical location
Point, it is also possible to realize with the combination of multiple physical locations.Additionally, for the innovative part highlighting the present invention,
Not by the unit the closest with solving technical problem relation proposed by the invention in present embodiment
Introduce, but this is not intended that in present embodiment the unit that there is not other.
It will be understood by those skilled in the art that the respective embodiments described above are realize the present invention concrete
Embodiment, and in actual applications, can to it, various changes can be made in the form and details, and the most inclined
From the spirit and scope of the present invention.
Claims (10)
1. a clock chip method of testing, it is characterised in that comprise the steps of
A. according to the test philosophy of clock chip, prepare before carrying out test, comprise: on test platform
Editor's test program；Connect described test platform, test load plate, measured device interface, described clock
Chip and cymometer；
B. described test program is performed, it is judged that whether the memorizer of described clock chip can normally work；
And when judging that described memorizer normally works, use described cymometer to measure the crystal oscillator of described clock chip
Frequency, checks the precision of described crystal oscillator frequency；And crystal oscillator frequency measurement obtained converts the numerical value obtained
Write in the first preset address of described memorizer；
If the precision of the most described crystal oscillator frequency meets the frequency requirement of described clock chip, then described
In the operating temperature range of clock chip, take at least four temperature spot, use cymometer to measure described clock
The crystal oscillator frequency of chip, and the crystal oscillator frequency numerical value and described first that obtains of conversion measurement obtained presets
Numerical value in address is respectively written in the second preset address section；Wherein, described second preset address section is individual
Number is corresponding with the number of described temperature spot；
D. according to the numerical value in described second preset address section, the work temperature at described clock chip is calculated
In the range of degree, the temperature compensation value of described crystal oscillator frequency, and it is stored in the 3rd preset address of described memorizer
In section；
E. read the numerical value in described 3rd preset address section, observe the numerical value read；And in described reading
When the numerical value taken meets simulation curve set in advance, it is determined that described clock chip is surveyed by temperature-compensating
Examination.
Clock chip method of testing the most according to claim 1, it is characterised in that in described step
In rapid B, judged by following sub-step whether the memorizer of described clock chip can normally work:
According to clock 400kHz, all addresses write after the reserved address of described memorizer is arbitrarily
Number, and read, compare, if the read out data and write data consistent, then judge described memorizer
Can normally work；
Wherein, when writing, after write an address more；8 clock cycle are taken during write, and the 6th
The individual clock cycle waits 2.5 milliseconds；During reading, before read an address more.
Clock chip method of testing the most according to claim 1, it is characterised in that in described step
In rapid B and described step C, the crystal oscillator frequency obtained by equation below conversion measurement:
(f-32768)/32768*1000000；
Wherein, f is to measure the crystal oscillator frequency obtained.
Clock chip method of testing the most according to claim 1, it is characterised in that in described step
In rapid C, take four temperature spots, respectively 40 degrees below zeros, 25 degree, 55 degree, 80 degree.
Clock chip method of testing the most according to claim 1, it is characterised in that in described step
In rapid B and step C, use high precision, the cymometer of band general purpose interface bus gpib interface；Institute
State the crystal oscillator frequency that cymometer measurement obtains to be sent on described test platform by GPIB communication.
6. a clock chip test system, it is characterised in that comprise: test platform, test load
Plate, measured device interface and cymometer；Described test platform connects described test load plate；Described test
Load board connects described measured device interface, and described measured device interface connects described clock chip；Described
Cymometer is connected with described clock chip and described test platform respectively；
Wherein, described test platform is edited test program；
Described test platform performs described test program, it is judged that whether the memorizer of described clock chip can be just
Often work；And when judging that described memorizer normally works, use described cymometer to measure described clock core
The crystal oscillator frequency of sheet, checks the precision of described crystal oscillator frequency；And crystal oscillator frequency measurement obtained converts
The numerical value arrived writes in the first preset address of described memorizer；
When the precision judging described crystal oscillator frequency meets the frequency requirement of described clock chip, described test
Platform, in the operating temperature range of described clock chip, takes at least four temperature spot, uses frequency measurement
Measure the crystal oscillator frequency of described clock chip, and the numerical value that obtains of the crystal oscillator frequency conversion that measurement is obtained and institute
State the numerical value in the first preset address to be respectively written in the second preset address section；Wherein, described second preset
The number of address field is corresponding with the number of described temperature spot；
Described test platform, according to the numerical value in described second preset address section, calculates at described clock chip
Operating temperature range in, the temperature compensation value of described crystal oscillator frequency, and be stored in the 3rd of described memorizer the
In preset address section；
Described test platform reads the numerical value in described 3rd preset address section, observes the numerical value read；And
When the numerical value of described reading meets simulation curve set in advance, it is determined that described clock chip passes through temperature
Compensating test.
Clock chip the most according to claim 6 test system, it is characterised in that described test
Platform judges whether the memorizer of described clock chip can normally work in the following way:
According to clock 400kHz, all addresses write after the reserved address of described memorizer is arbitrarily
Number, and read, compare, if the read out data and write data consistent, then judge described memorizer
Can normally work；
Wherein, when writing, after write an address more；8 clock cycle are taken during write, and the 6th
The individual clock cycle waits 2.5 milliseconds；During reading, before read an address more.
Clock chip the most according to claim 6 test system, it is characterised in that described test
The crystal oscillator frequency that platform is obtained by equation below conversion measurement:
(f-32768)/32768*1000000；
Wherein, f is to measure the crystal oscillator frequency obtained.
Clock chip the most according to claim 6 test system, it is characterised in that described test
Platform takes four temperature spots, respectively 40 degrees below zeros, 25 degree, 55 degree, 80 degree.
Clock chip the most according to claim 6 test system, it is characterised in that described frequency
It is calculated as high precision, the cymometer of band general purpose interface bus gpib interface；Described cymometer measurement obtains
Crystal oscillator frequency be sent on described test platform by GPIB communication.
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| CN106445756A (en) * | 2016-09-27 | 2017-02-22 | 乐视控股（北京）有限公司 | Terminal testing method and device |
| CN108226756B (en) * | 2018-01-29 | 2020-06-02 | 深圳市兴威帆电子技术有限公司 | Test system and test method of clock chip |
| CN109444723B (en) * | 2018-12-24 | 2020-07-24 | 成都华微电子科技有限公司 | Chip testing method based on J750 |
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