CN104020115A - Dual-wavelength compound structure analyzer - Google Patents

Dual-wavelength compound structure analyzer Download PDF

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Publication number
CN104020115A
CN104020115A CN201410230717.5A CN201410230717A CN104020115A CN 104020115 A CN104020115 A CN 104020115A CN 201410230717 A CN201410230717 A CN 201410230717A CN 104020115 A CN104020115 A CN 104020115A
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CN
China
Prior art keywords
light
light source
detection
light beam
source device
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Pending
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CN201410230717.5A
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Chinese (zh)
Inventor
储冬红
彭飞
郭睦庚
严方园
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Chengdu Zhong Yuan Chiba Science And Technology Ltd
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Chengdu Zhong Yuan Chiba Science And Technology Ltd
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Priority to CN201410230717.5A priority Critical patent/CN104020115A/en
Publication of CN104020115A publication Critical patent/CN104020115A/en
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Abstract

A dual-wavelength compound structure analyzer is characterized by mainly comprising a first light source apparatus, a second light source apparatus, a light-beam separating apparatus, a sampling apparatus, a first detection apparatus, a second detection apparatus, a light-beam signal analysis apparatus and a detection-result display apparatus; the first light source apparatus comprises an ion-beam emission electrode, and the electrode material is cadmium gadolinium oxide; the second light source apparatus comprises a high-energy light-beam emission electrode, and the electrode material is samarium erbium oxide; the light-beam separating apparatus comprises a dodecagonal-prism transmission grating, and the grating surface is covered with a zirconium neodymate octasulfide composite light-transmitting film with the thickness of 5.98 mu m; the first detection apparatus comprises a photoelectric tube, and the photoelectric tube material comprises a darmstadtium barium dodecasulphate-osmium chloride nanometer composite film; and the second detection apparatus comprises a photomultiplier, and the material of a cathode comprises a scandium metabromate-chromic oxide nanometer composite film.

Description

Dual wavelength compound structure analyzer
Technical Field
The invention relates to the field of structural analysis, in particular to a dual-wavelength compound structural analyzer.
Background
The dual wavelength analysis technique is essentially the result of molecules and atoms in a substance absorbing light energy at certain specific wavelengths in the incident light, and molecular vibrational energy level transitions and electronic energy level transitions occurring accordingly. Since each substance has different molecules, atoms and different molecular spatial structures, the absorption of light energy will not be the same. Therefore, each substance has a specific and fixed absorption spectrum curve, the content of the substance can be distinguished or measured according to the absorbance at certain characteristic wavelengths on the absorption spectrum, and effective means for researching the components, structures and material interaction of the substance according to the absorption spectrum of the substance are researched, but the traditional single-wavelength analysis technology has the problems of stray light flash, low sensitivity, low selection degree and the like, so that the defects can be effectively solved by designing a device for analyzing the dual-wavelength light beam.
Disclosure of Invention
In order to overcome the defects of the prior device, the invention adopts the following technical scheme:
dual wavelength compound structure analysis appearance, its characterized in that mainly includes:
1-a first light source device, 2-a second light source device, 3-a light beam separation device,
4-a sample introduction device, 5-a first detection device, 6-a second detection device,
7-light beam signal analysis device, 8-detection result display device,
wherein,
the first light source device (1) comprises an ion beam emitting electrode made of gadolinium cadmium oxide,
the second light source device (2) contains a high-energy beam emitting electrode which is made of samarium erbium oxide,
the light beam separation device (3) comprises a dodecagonal transmission grating, the surface of the grating is covered with a zirconium octasulfide composite light-transmitting film with the thickness of 5.98um,
the first detection device (5) comprises a photoelectric tube, cathode material of the photoelectric tube comprises barium dodecasulfate osmium chloride nano-composite film,
the second detection device (6) comprises a photomultiplier tube, and the surface of the cathode material of the photomultiplier tube comprises a scandium bromide chromium oxide zirconium nanocomposite film.
The first light source device (1) is mainly used for generating a heat radiation light beam and can provide a light beam in a visible spectrum region; the second light source device (2) is mainly used for generating gas discharge beams and can provide ultraviolet spectrums with enough intensity and good stability; the light beam separation device (3) is mainly used for correcting incident light beams and screening and separating light spectrums, and the light spectrum range and the light beam wavelength can be effectively adjusted through the incident slit, the dispersion device, the gathering device and the emergent slit.
The sample introduction device (4) is mainly used for introducing a sample and absorbing a light beam with wavelength; the first detection device (5) is mainly used for converting and recording photoelectric signals, and can identify the spectral interval range of the photoelectric signals in different wave bands, so that the device has high sensitivity; the second detection device (6) is mainly used for amplifying and converting photoelectric signals, is sensitive to spectral change, has a wide application range and is not easy to fatigue. The light beam signal analysis device (7) is mainly used for the spectral analysis of the wave band change after the light beam is absorbed, and combines the group, the conjugated system and the conformation of an analysis substance to analyze the structural characteristics of a compound. The detection result display device (8) is mainly used for displaying and recording the structure spectral analysis result of the sample.
Compared with the prior art, the invention has the beneficial effects that:
(1) groups, conjugated systems and conformations capable of binding to the analyte, analyzing structural features of the compound;
(2) the device is sensitive to spectral change, has wide application range and is not easy to fatigue;
(3) the device can identify the spectral interval range of different wave bands, and has high sensitivity.
Drawings
FIG. 1 is a schematic diagram of a dual wavelength compound structure analyzer
As shown in fig. 1, the dual wavelength compound structure analyzer of the present invention mainly comprises:
1-a first light source device, 2-a second light source device, 3-a light beam separation device,
4-a sample introduction device, 5-a first detection device, 6-a second detection device,
7-light beam signal analysis device, 8-detection result display device,
the following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
Detailed Description
Firstly, a light beam with a proper spectral range is generated by a first light source device (1), a second light source device (2) is introduced for eliminating the influence of interference wave bands, coherent light beams with enough intensity are generated by the second light source device (2), and the interference wave bands are counteracted by combining the wave band screening and the spectral separation of a light beam separation device (3). The sample is manufactured and introduced through the sample introduction device (4), and the spectrum of a part of wave bands is absorbed after the light beam passes through the sample; the light beam after being partially absorbed is converted through the common signal of the first detection device (5) and the second detection device (6), the improvement of the spectrum absorption change conversion efficiency is realized, the analysis sensitivity and the spectrum analysis range are convenient to improve, the detection signal is amplified and then is transmitted to the light beam signal analysis device (7), the physical and chemical parameters of the sample are further analyzed by combining the characteristics of the structure of the analysis compound, and finally, the analysis result is displayed and recorded through the detection result display device (8).

Claims (1)

1. Dual wavelength compound structure analysis appearance, its characterized in that mainly includes:
1-a first light source device, 2-a second light source device, 3-a light beam separation device,
4-a sample introduction device, 5-a first detection device, 6-a second detection device,
7-light beam signal analysis device, 8-detection result display device,
wherein,
the first light source device (1) comprises an ion beam emitting electrode made of gadolinium cadmium oxide,
the second light source device (2) contains a high-energy beam emitting electrode which is made of samarium erbium oxide,
the light beam separation device (3) comprises a dodecagonal transmission grating, the surface of the grating is covered with a zirconium octasulfide composite light-transmitting film with the thickness of 5.98um,
the first detection device (5) comprises a photoelectric tube, cathode material of the photoelectric tube comprises barium dodecasulfate osmium chloride nano-composite film,
the second detection device (6) comprises a photomultiplier tube, and the surface of the cathode material of the photomultiplier tube comprises a scandium bromide chromium oxide zirconium nanocomposite film.
CN201410230717.5A 2014-05-28 2014-05-28 Dual-wavelength compound structure analyzer Pending CN104020115A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410230717.5A CN104020115A (en) 2014-05-28 2014-05-28 Dual-wavelength compound structure analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410230717.5A CN104020115A (en) 2014-05-28 2014-05-28 Dual-wavelength compound structure analyzer

Publications (1)

Publication Number Publication Date
CN104020115A true CN104020115A (en) 2014-09-03

Family

ID=51436993

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410230717.5A Pending CN104020115A (en) 2014-05-28 2014-05-28 Dual-wavelength compound structure analyzer

Country Status (1)

Country Link
CN (1) CN104020115A (en)

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Application publication date: 20140903