CN104007224A - Focusing gauge plate - Google Patents

Focusing gauge plate Download PDF

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Publication number
CN104007224A
CN104007224A CN201410257784.6A CN201410257784A CN104007224A CN 104007224 A CN104007224 A CN 104007224A CN 201410257784 A CN201410257784 A CN 201410257784A CN 104007224 A CN104007224 A CN 104007224A
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China
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sample application
plane
focusing
point
point sample
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CN201410257784.6A
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CN104007224B (en
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于清峰
赵骥
肖莹
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China Pharmaceutical University
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China Pharmaceutical University
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Abstract

The invention discloses a focusing gauge plate and relates to the field of planar chromatography analysis. The focusing gauge plate is a component of a novel planar chromatographic sample application instrument and is a fixing size template used for adjusting and specifying the distance between a trace nozzle and a sample application plane and the distance between a sample application needle point and the sample application plane. When the novel planar chromatographic sample application instrument carries out sample application, the distance between the trace nozzle and the sample application plane and the distance between the sample application needle point and the sample application plane are the important factors affecting the sample application effect. The focusing gauge plate is manufactured by analyzing the process of a liquid drop located at the sample application needle point to be separated from a sample application needle to reach the sample application plane under the action of surrounding jet stream. When the sample application instrument uses stationary phases of different thicknesses, the distance between the trace nozzle and the sample application plane and the distance between the sample application needle point and the sample application plane can be adjusted and specified conveniently by the focusing gauge plate. The focusing gauge plate is simple in structure, the design and use of the instrument are simplified, and the novel sample application instrument can be applicable to sample application of the stationary phases of various thicknesses.

Description

Focusing rule plate
Technical field
The present invention is the fixed measure template of a kind of adjustment and specification slight distance scope, refers in particular to a kind of rule of the focusing for the micro-nozzle of control plane chromatogram point sample instrument and the distance of point sample plane and spotting needle needle point and point sample plan range plate.The present invention is applicable to planar chromatograph analysis field.
Background technology
Planar chromatograph technology in analytical chemistry mainly comprises thin-layer chromatography (fixing phase can adopt silica gel, polyamide, aluminium oxide etc.) and paper chromatography, and process of the test mid point quadrat method is very large on the impact of separating effect.At present conventional point sample method mainly contains two kinds of spot application and band point samples, and research in recent years shows that ribbon point sample can significantly improve the degree of separation of each component in the separation capacity of planar chromatograph and sample.But manual point sample is difficult to obtain the uniform band of sample, adopt point sample instrument can realize uniform ribbon point sample.Use instrument point sample often to adopt noncontact spraying point sample, the effect of the sample strip that now obtained is relevant with many factors, wherein ensures the distance that the most important factor of band point sample repeatability is nozzle to the distance of point sample plane and dot needle-point to point sample plane.Because chromatography is not quite identical with the thickness of thin layer plate or paper, may cause point sample repeatability bad, can make the repeated variation of band point sample.
The present invention is on the basis of micro-nozzle ejection micro solution principle, in order accurately to control the distance of spotting needle needle point and point sample plane, by arrangement, analysis, the summary of lot of experimental data, design a kind of for adjusting and the fixed measure template of specification slight distance scope, it is simple in structure clear, easy to use, simplified the structure of instrument simultaneously, make novel planar chromatogram point sample instrument applicable to the thin layer plate of various thickness and the point sample of paper.
Summary of the invention
In the time using novel planar chromatogram point sample instrument to carry out point sample, mostly be noncontact ribbon point sample, coordinated (seeing accompanying drawing 1) with micro-nozzle and micro-sampling pin.Can be found out by accompanying drawing 1, in the time that point sample instrument moves, air-flow is enclosed in around point sample needle tubing, sample solution is ejected in point sample plane (thin layer plate or paper), now air-flow is from tack needle point to the spatial form point sample plane, can be similar to and regard an inverted conical platform being surrounded by air-flow as, the xsect of its a certain height in lower end is a circle, and the diameter of establishing this circular cross section is d.If when this xsect and point sample planes overlapping, when spotting needle does linear uniform motion perpendicular to point sample plane and along the direction that is parallel to point sample plane, the solution of at the uniform velocity being released by spotting needle can be put becomes a linear pattern band, and its width is d.
But from accompanying drawing 1, the size of the diameter d of circular cross section depends on the height M of dot needle-point to point sample plane.In the time that M is excessive, be M > h+ Δ h, the area of the circular cross section of inverted-cone shape round platform in point sample plane diminishes, the fixing phase area that absorbs sample solution diminishes, but due to the airshed spraying from nozzle with to blow the sample solution amount of being with constant, and the speed of fixing phase absorbent solution is constant, therefore excessive sample solution is blown away by air-flow, and when sample drop is blown away, fallen vestige just causes forming Divergent Phenomenon in point sample plane.
When M too small, be M < h (seeing accompanying drawing 1), the area that is the circular cross section of inverted-cone shape round platform in point sample plane becomes large, the fixing phase area that absorbs sample solution becomes large, due to the airshed spraying from nozzle, blow the sample solution amount be with and the speed of fixing phase absorbent solution still keeps necessarily by air-flow, fixing at the inner sample solution that promptly absorbs same volume of very short time (t).Because solution is not to arrive fixing phase plane from spotting needle needle point continuously, arrive after fixing phase plane at last solution, a rear solution may also hang on spotting needle needle point, at this moment (Δ t) to have produced an off time, and continuous air-flow is in this off time, (Δ blows in t) in fixing phase plane, form diffuse reflection, form uncontrollable air-flow with fixing between mutually at the tack needle point of spotting needle, the solution droplets just having formed on spotting needle needle point is blown away to any direction, also can cause point sample band Divergent Phenomenon.
Therefore, only have when micro-sampling pin is perpendicular to the distance between point sample plane and spotting needle needle point and point sample plane in a certain scope time, air-flow blows the amount of the sample solution of being with, match with the fixing speed absorbing mutually, just in time can blow away to inverted conical platform inside by stop portions diffuse reflection air-flow again on point sample plane top, under this condition, point sample instrument can be pointed out sharply marginated sample strip.The process of the similar camera focusing of mode of this adjustment height M size, the present invention uses for reference this title of camera focusing, and by this process, also referred to as focusing, its physical phenomenon is explained as mentioned above.
Carry out point sample test by the size that changes M, the relatively asynchronous point sample effect of M, and a large amount of experimental datas is arranged and summed up, obtain sample strip effect minor increment h and ultimate range h+ Δ h between micro-sampling pin needle point and point sample plane preferably time, design accordingly a kind of fixed measure template, as shown in Figure 2.When use, template is placed between spotting needle needle point and point sample plane, spotting needle needle point should be higher than h, and needle point moves not interrupted above h elevation plane; Micro-sampling pin needle point must be lower than the height of h+ Δ h, and when movable platen, needle point does not surmount the plane of h+ Δ h height, and the distance between needle point and point sample plane meets the requirement of h < M < h+ Δ h.As long as within the height M between guarantee needle point and point sample plane is positioned at the scope of h~h+ Δ h, the strip width that point sample instrument is pointed out is consistent, edge clear.Because this template is for adjusting and specification height or altitude range, therefore called after of the present invention focusing rule plate.Focusing rule plate and micro-sampling pin needle point are used in conjunction with figure as shown in Figure 3.Designed focusing rule plate maximum height H also can be used for adjusting the distance between micro-nozzle and point sample plane.
Due to the fixing phase thickness difference using in planar chromatograph, for example the thinnest as chromatogram paper using, thick in preparation silica gel thin-layer plate, its thickness can be from 0.1mm to 3mm left and right.Focusing rule plate and novel planar chromatogram point sample instrument are used in conjunction with, can realize different-thickness fix mutually on repeat the object of point sample.When use, as long as focusing rule plate is placed between micro-nozzle and fixing phase point sample plane, the highest plane contact by micro-nozzle with focusing rule plate, then fixes micro-nozzle, and the distance between micro-nozzle and point sample plane has just been adjusted.Insert again spotting needle, the position of mobile rule plate, can detect spotting needle needle point and fixing phase point sample plane height whether meet the requirements, be used in conjunction with novel planar chromatogram point sample instrument, now can go out satisfactory sample strip at point sample Plane-point.
In addition, when novel planar chromatogram point sample instrument is when the paper chromatography point sample, may the smooth not size that changes M due to chromatogram paper using, also likely blown to obtain by air-flow and shake, affect point sample effect.Now can utilize the deadweight of focusing rule plate, as paperweight, can keep point sample time paper smooth, do not shake, be conducive to point sample.The side gear of being advised plate for the air-flow that prevents from producing by boasting by focusing goes back, and the side elevation of 90 degree is changed into the inclined-plane of certain angle.The design of focusing rule plate top column is in order can conveniently to take and mobile focusing rule plate, and focusing rule plate is carried out to counterweight.
Brief description of the drawings
Relative position relation and the point sample schematic diagram of accompanying drawing 1 planar chromatograph sample application instrument trace nozzle exit air-flow and micro-sampling pin needle point.In figure: 1 is micro-nozzle, 2 is spotting needle needle tubing, and 3 is point sample plane, and 4 is airflow direction.H is the minor increment of spotting needle needle point to point sample plane, and h+ Δ h is the ultimate range of spotting needle needle point to point sample plane, and M is the distance of spotting needle needle point to point sample plane.
Accompanying drawing 2 focusing rule plate design concept schematic diagram.In figure: 1 is micro-nozzle, 2 is spotting needle needle tubing, and 3 is point sample plane, and 4 is airflow direction, and 5 is focusing rule plate.H is the minor increment of spotting needle needle point to point sample plane, and h+ Δ h is the ultimate range of spotting needle needle point to point sample plane, and M is the distance of spotting needle needle point to point sample plane.
Accompanying drawing 3 focusing rule plates are used in conjunction with schematic diagram between micro-nozzle, spotting needle needle point and fixing phase point sample plane.1 is micro-nozzle, and 2 is spotting needle needle tubing, and 3 is point sample plane, and 4 is focusing rule plate.H is the minor increment of spotting needle needle point to point sample plane, and h+ Δ h is the ultimate range of spotting needle needle point to point sample plane, and H is the distance of nozzle to point sample plane.
Accompanying drawing 4 linear pattern focusing rule plates
Embodiment
Specific embodiment 1. linear pattern focusing rule plates
For being used in conjunction with novel planar chromatogram point sample instrument, on the basis that is 2.8mm at the height between fixing micro-nozzle and point sample plane, arrange summary through lot of experiments and to data, obtain the scope of the optimum distance M value of a series of micro-sampling pin needle points and point sample plane, the scope that the present embodiment is got M value is that 1.5-1.9mm (is h=1.5mm, Δ h is 0.4mm), in the time that the height M between spotting needle needle point and point sample plane is within the scope of this, all can obtain desirable sample strip.Make linear pattern focusing as shown in Figure 4 with stainless steel material and advised plate.

Claims (5)

1. the present invention is a kind of focusing rule plate, its architectural feature is that this focusing rule plate is highly respectively h, the parallel plane of h+ Δ h, H (h < h+ Δ h < H) and the side elevation of two inclinations by three and forms, and highly in the plane for H, is having a column.
2. focusing as claimed in claim 1 rule plate, its design feature is that the height h of two planes wherein, the concrete value of h+ Δ h can change.
3. focusing rule plate as claimed in claim 1, is parts that coordinate planar chromatograph sample application instrument to use, and when use, spotting needle needle point need be in h~h+ Δ h altitude range to the height of point sample plane, and H is the height of micro-nozzle to point sample plane.
4. focusing rule plate as claimed in claim 1, can be made into linear pattern stepped, and any change in shape that focusing rule plate is made all belongs to interest field of the present invention.
5. as claimed in claim 1, focusing rule plate can adopt stainless steel to make, and also can adopt other corrosion-resistant hard materials to make, and the change of making focusing rule material that plate uses is all belonged to interest field of the present invention.
CN201410257784.6A 2014-06-09 2014-06-09 focusing gauge plate Active CN104007224B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104965047A (en) * 2014-10-13 2015-10-07 中国药科大学 Novel planar chromatography sample application instrument and step repeated sample application method
CN105334707A (en) * 2015-12-15 2016-02-17 天津津芯微电子科技有限公司 Multistage focusing device and method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3843053A (en) * 1973-03-29 1974-10-22 Kontes Glass Co Spotter for use in thin layer chromatography and method of forming drops therewith
US3895758A (en) * 1973-03-29 1975-07-22 Kontes Glass Co Spotter for use in thin layer chromatography
CN2349111Y (en) * 1998-10-23 1999-11-17 胡新宜 Tricycle with sunshade and goods carrier
CN202603587U (en) * 2012-04-24 2012-12-19 红云红河烟草(集团)有限责任公司 Rapid assembling device of cutting head swing frame assembly of cigarette making machine
CN202779498U (en) * 2012-06-26 2013-03-13 苏州市永固金属制品有限公司 Multi-section bending locating mechanism on bending machine

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3843053A (en) * 1973-03-29 1974-10-22 Kontes Glass Co Spotter for use in thin layer chromatography and method of forming drops therewith
US3895758A (en) * 1973-03-29 1975-07-22 Kontes Glass Co Spotter for use in thin layer chromatography
CN2349111Y (en) * 1998-10-23 1999-11-17 胡新宜 Tricycle with sunshade and goods carrier
CN202603587U (en) * 2012-04-24 2012-12-19 红云红河烟草(集团)有限责任公司 Rapid assembling device of cutting head swing frame assembly of cigarette making machine
CN202779498U (en) * 2012-06-26 2013-03-13 苏州市永固金属制品有限公司 Multi-section bending locating mechanism on bending machine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104965047A (en) * 2014-10-13 2015-10-07 中国药科大学 Novel planar chromatography sample application instrument and step repeated sample application method
CN105334707A (en) * 2015-12-15 2016-02-17 天津津芯微电子科技有限公司 Multistage focusing device and method

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