CN103983816A - High-precision test module - Google Patents
High-precision test module Download PDFInfo
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- CN103983816A CN103983816A CN201410205280.XA CN201410205280A CN103983816A CN 103983816 A CN103983816 A CN 103983816A CN 201410205280 A CN201410205280 A CN 201410205280A CN 103983816 A CN103983816 A CN 103983816A
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- probe
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- high precision
- measurement module
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Abstract
The invention discloses a high-precision test module, and aims to provide the high-precision test module which can avoid dependence on probe strength, lower requirements for working skills of operators and ensure stability of testing main boards of electronic products with small test points, small test distances and a large number of test points. The high-precision test module comprises an upper limiting probe plate (1), a probe head limiting plate (2), a first reinforcement plate (3), a middle probe plate (4), a second reinforcement plate (5), a probe tail limiting plate (6) and a lower limiting plate (7), a plurality of through holes I are formed in the probe head limiting plate (2), the first reinforcement plate (3), the middle probe plate (4), the second reinforcement plate (5) and the probe tail limiting plate (6), a plurality of through holes II are formed in the upper limiting probe plate (1), and a plurality of through holes III are formed in the lower limiting plate (7). The high-precision test module is applied to the technical field of automatic test equipment.
Description
Technical field
The present invention relates to a kind of high precision measurement module.
Background technology
For traditional test module, probe be fixedly that the friction force producing by probe and needle plate interference fit realizes, therefore the intensity of probe is had to higher requirement, so cannot accomplish less size, also cannot realize more high-precision test (test point spacing is less than 0.8mm).And the aligning accuracy of probe is to be all placed on above needle plate, by the precision of needle plate and the intensity of probe itself, guarantee, cannot guarantee the exactitude position of little test point (diameter 0.3mm-0.4mm).
Certainly the fixing of probe also can adopt other modes, and such as the Chinese patent that publication number is 102062791A, it discloses a kind of probe base, includes a pedestal, an insulation upper cover, insulation lower cover and a branched probe.Wherein, branched probe is located in respectively in a plurality of through holes of pedestal, and insulation upper cover and insulation lower cover are mounted on respectively the upper and lower surface of pedestal.And branched probe sees through respectively its radially enlarged shoulder, and lock, be limited between the upper perforation of insulation upper cover and the lower perforation of insulation lower cover.For above-mentioned probe, because it is provided with shoulder, the integrally-built size of inevitable probe can become large, cannot realize equally more high-precision test (test point spacing is less than 0.8mm), and aligning accuracy is to rely on the machining precision of through hole and the intensity of probe shoulder itself to guarantee, in actual mechanical process, find, want to guarantee that the difficulty of the machining precision of through hole and the intensity of probe shoulder itself is very large simultaneously, therefore cannot guarantee the exactitude position of the large quantity probe of little test point (0.3mm-0.4mm) (surpassing 200Pcs).
Adopt traditional probe fixed form, probe is stressed larger in installation process, to the intensity of probe itself and operating personnel's technical ability, requires very high.Particularly, for undersized probe (in diameter 0.8mm), very easily damage probe in installation process, and probe is interference fitted in needle plate, the probe of damage is difficult to take out.Allow to take out the probe damaging, the precision of the probe mounting hole on needle plate is also had to larger infringement.
Conventional probe aligning accuracy be to realize by the machining precision of needle plate pin hole and the intensity of probe itself.Support plate just plays the effect of placing test product and protection probe.In structural design, there is the inconsistent problem of benchmark.Equally also cannot guarantee the large quantity probe of little test point (diameter 0.3mm-0.4mm) exactitude position of (a needle plate number of probes surpasses 200Pcs).
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiencies in the prior art, a kind of dependence that can avoid intensity of probe is provided, reduces the requirement of operating personnel's workmanship and the high precision measurement module of the stability of the test of the electronic product mainboard of can guarantee well to there is little test point (test point diameter 0.3mm-0.4mm), little test spacing (test point spacing is less than 0.8mm), large quantity test point (a needle plate number of probes surpasses 200Pcs).
The technical solution adopted in the present invention is: the present invention includes the upper limit needle plate being fixedly installed successively from top to bottom, end of probe limiting plate, the first reinforcement plate, middle part needle plate, the second reinforcement plate, probe afterbody limiting plate and lower limiting board, described end of probe limiting plate, described the first reinforcement plate, described middle part needle plate, on described the second reinforcement plate and described probe afterbody limiting plate, be equipped with a plurality of and through hole I probe body clearance fit, described upper limit needle plate is provided with a plurality of and through hole II probe clearance fit, described lower limiting board is provided with a plurality of and through hole III probe tail clearance fit, the aperture of described through hole II and described through hole III is all less than the aperture of described through hole I.
Described the first reinforcement plate and described the second reinforcement plate are all made as hollow, form cavity, during work, probe is through hollow space, and the periphery of described the first reinforcement plate and described the second reinforcement plate is pressed by described middle part needle plate and described end of probe limiting plate or described probe afterbody limiting plate.
The bottom of described through hole II is coaxially provided with the described through hole I with described probe body clearance fit.
Described high precision measurement module also comprises the support plate that is arranged on described upper limit needle plate top, and described support plate is provided with guide pinhole a plurality of and that probe is suitable.
Described guide pinhole is comprised of upper pilot hole and lower pilot hole, and the aperture of described upper pilot hole is less than the aperture of described lower pilot hole, and passes through guiding surface transition between described upper pilot hole and described lower pilot hole.
Described guide pinhole is bellmouth, and it is large that the aperture of described guide pinhole from top to bottom becomes gradually.
On described end of probe limiting plate, be provided with several guide pillars, described support plate is provided with the guide pillar hole suitable with described guide pillar, and described support plate and described guide pillar are slidably matched.
The invention has the beneficial effects as follows: owing to the present invention includes the upper limit needle plate being fixedly installed successively from top to bottom, end of probe limiting plate, the first reinforcement plate, middle part needle plate, the second reinforcement plate, probe afterbody limiting plate and lower limiting board, described end of probe limiting plate, described the first reinforcement plate, described middle part needle plate, on described the second reinforcement plate and described probe afterbody limiting plate, be equipped with a plurality of and through hole I probe body clearance fit, described upper limit needle plate is provided with a plurality of and through hole II probe clearance fit, described lower limiting board is provided with a plurality of and through hole III probe tail clearance fit, the aperture of described through hole II and described through hole III is all less than the aperture of described through hole I, so, above-mentioned clearance fit can well have been avoided the mode that adopts probe and needle plate interference fit, thereby avoided the dependence to intensity of probe.As long as taking off described upper limit needle plate probe in the process of installing can take off easily and put into, the requirement of reduction to operating personnel's workmanship, adopt structure of the present invention can not consider the intensity of probe, thereby less probe can be installed, the stability of the test of the electronic product mainboard of can guarantee well to there is little test point (test point diameter 0.3mm-0.4mm), little test spacing (test point spacing is less than 0.8mm), large quantity test point (a needle plate number of probes surpasses 200Pcs).
Accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present invention;
Fig. 2 is the cut-open view of the D-D direction of Fig. 1;
Fig. 3 is the structure for amplifying schematic diagram at the A place of Fig. 2;
Fig. 4 is another structural representation of the present invention;
Fig. 5 is the structure for amplifying schematic diagram at the B place of Fig. 4;
Fig. 6 is another structure for amplifying schematic diagram at the B place of Fig. 4.
Embodiment
As shown in Figures 1 to 4, in the present embodiment, the present invention includes the upper limit needle plate 1 being fixedly installed successively from top to bottom, end of probe limiting plate 2, the first reinforcement plate 3, middle part needle plate 4, the second reinforcement plate 5, probe afterbody limiting plate 6 and lower limiting board 7, described end of probe limiting plate 2, described the first reinforcement plate 3, described middle part needle plate 4, on described the second reinforcement plate 5 and described probe afterbody limiting plate 6, be equipped with a plurality of and through hole I probe body 8 clearance fit, described upper limit needle plate 1 is provided with a plurality of and through hole II probe 9 clearance fit, described lower limiting board 7 is provided with a plurality of and through hole III probe tail 10 clearance fit, the aperture of described through hole II and described through hole III is all less than the aperture of described through hole I.
Described the first reinforcement plate 3 and described the second reinforcement plate 5 are all made as hollow, form cavity, during work, probe is through hollow space, and the periphery of described the first reinforcement plate 3 and described the second reinforcement plate 5 is pressed by described middle part needle plate 4 and described end of probe limiting plate 2 or described probe afterbody limiting plate 6.
The bottom of described through hole II is coaxially provided with the described through hole I with described probe body 8 clearance fit.
Described high precision measurement module also comprises the support plate 11 that is arranged on described upper limit needle plate 1 top, and described support plate 11 is provided with guide pinhole 12 a plurality of and that probe is suitable.
As shown in Figure 5, described guide pinhole 12 is comprised of upper pilot hole 13 and lower pilot hole 14, and the aperture of described upper pilot hole 13 is less than the aperture of described lower pilot hole 14, and passes through guiding surface 15 transition between described upper pilot hole 13 and described lower pilot hole 14.
As shown in Figure 6, described guide pinhole 12 can be also bellmouth, and it is large that the aperture of described guide pinhole 12 from top to bottom becomes gradually.
On described end of probe limiting plate 2, be provided with several guide pillars 16, described support plate 11 is provided with the guide pillar hole 17 suitable with described guide pillar 16, and described support plate 11 is slidably matched with described guide pillar 16.
In the present embodiment, probe is by probe body 8, the spring that is arranged on probe 9 and the probe tail 10 at described probe body 8 two ends and described probe body 8 is set forms, described upper limit needle plate 1 is upwards jumped out for preventing probe, described end of probe limiting plate 2 can limit the plane motion of controlling among a small circle probe, described the first reinforcement plate 3 and described the second reinforcement plate 5 are all for increasing height and the intensity of mechanism, described middle part needle plate 4 is for preventing that probe is out of shape when mounted, described probe afterbody limiting plate 6 is for limiting the afterbody of probe, described lower limiting board 7 moves downward for preventing probe.Between hole on every laminate and probe, be all gapped, take off described upper limit needle plate 1, probe can take off easily and put into.Between each layer, cooperatively interact, reduced the requirement of intensity of probe and the requirement to operating personnel's technical ability.
In addition, the exactitude position of pin mark is to realize by support plate, guarantee well to there is little test point (test point diameter 0.3mm-0.4mm), the stability of the test of the electronic product mainboard of little test spacing (test point spacing is less than 0.8mm), large quantity test point (a needle plate number of probes surpasses 200Pcs), in the present embodiment, described test point spacing is 0.6mm.
The present invention is applied to the technical field of automated test device.
Although embodiments of the invention are described with practical solution, do not form the restriction to implication of the present invention, for those skilled in the art, according to this instructions to the modification of its embodiment and with the combination of other schemes be all apparent.
Claims (7)
1. a high precision measurement module, it is characterized in that: described high precision measurement module comprises the upper limit needle plate (1) being fixedly installed successively from top to bottom, end of probe limiting plate (2), the first reinforcement plate (3), middle part needle plate (4), the second reinforcement plate (5), probe afterbody limiting plate (6) and lower limiting board (7), described end of probe limiting plate (2), described the first reinforcement plate (3), described middle part needle plate (4), on described the second reinforcement plate (5) and described probe afterbody limiting plate (6), be equipped with a plurality of and through hole I probe body (8) clearance fit, described upper limit needle plate (1) is provided with a plurality of and through hole II probe (9) clearance fit, described lower limiting board (7) is provided with a plurality of and through hole III probe tail (10) clearance fit, the aperture of described through hole II and described through hole III is all less than the aperture of described through hole I.
2. high precision measurement module according to claim 1, it is characterized in that: described the first reinforcement plate (3) and described the second reinforcement plate (5) are all made as hollow, form cavity, during work, probe is through hollow space, and the periphery of described the first reinforcement plate (3) and described the second reinforcement plate (5) is pressed by described middle part needle plate (4) and described end of probe limiting plate (2) or described probe afterbody limiting plate (6).
3. high precision measurement module according to claim 1, is characterized in that: the bottom of described through hole II is coaxially provided with the described through hole I with described probe body (8) clearance fit.
4. according to the high precision measurement module described in claims 1 to 3 any one, it is characterized in that: described high precision measurement module also comprises the support plate (11) that is arranged on described upper limit needle plate (1) top, described support plate (11) is provided with guide pinhole (12) a plurality of and that probe is suitable.
5. high precision measurement module according to claim 4, it is characterized in that: described guide pinhole (12) is comprised of upper pilot hole (13) and lower pilot hole (14), the aperture of described upper pilot hole (13) is less than the aperture of described lower pilot hole (14), and passes through guiding surface (15) transition between described upper pilot hole (13) and described lower pilot hole (14).
6. high precision measurement module according to claim 4, is characterized in that: described guide pinhole (12) is bellmouth, and it is large that the aperture of described guide pinhole (12) from top to bottom becomes gradually.
7. high precision measurement module according to claim 4, it is characterized in that: on described end of probe limiting plate (2), be provided with several guide pillars (16), described support plate (11) is provided with the guide pillar hole (17) suitable with described guide pillar (16), and described support plate (11) is slidably matched with described guide pillar (16).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410205280.XA CN103983816A (en) | 2014-05-15 | 2014-05-15 | High-precision test module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410205280.XA CN103983816A (en) | 2014-05-15 | 2014-05-15 | High-precision test module |
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| Publication Number | Publication Date |
|---|---|
| CN103983816A true CN103983816A (en) | 2014-08-13 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410205280.XA Pending CN103983816A (en) | 2014-05-15 | 2014-05-15 | High-precision test module |
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| CN (1) | CN103983816A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110456109A (en) * | 2019-08-22 | 2019-11-15 | 珠海市运泰利自动化设备有限公司 | A kind of novel test equipment |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050151550A1 (en) * | 2004-01-08 | 2005-07-14 | Chung-Shan Lee | Circuit board testing jig |
| CN1854744A (en) * | 2005-04-21 | 2006-11-01 | 株式会社光阳科技 | Inspection jig and inspection equipment |
| CN101793913A (en) * | 2010-04-30 | 2010-08-04 | 福建捷联电子有限公司 | Processing technology of protective plate of PCB (Printed Circuit Board) testing device |
| CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
| CN202994972U (en) * | 2012-11-26 | 2013-06-12 | 昆山威典电子有限公司 | PCB pushing two-stage test structure |
| CN203396909U (en) * | 2013-07-24 | 2014-01-15 | 昆山迈致治具科技有限公司 | PCB performance detection jig having locating stroke limiting function |
| CN203941196U (en) * | 2014-05-15 | 2014-11-12 | 珠海市运泰利自动化设备有限公司 | High precision measurement module |
-
2014
- 2014-05-15 CN CN201410205280.XA patent/CN103983816A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050151550A1 (en) * | 2004-01-08 | 2005-07-14 | Chung-Shan Lee | Circuit board testing jig |
| CN1854744A (en) * | 2005-04-21 | 2006-11-01 | 株式会社光阳科技 | Inspection jig and inspection equipment |
| CN101793913A (en) * | 2010-04-30 | 2010-08-04 | 福建捷联电子有限公司 | Processing technology of protective plate of PCB (Printed Circuit Board) testing device |
| CN202994972U (en) * | 2012-11-26 | 2013-06-12 | 昆山威典电子有限公司 | PCB pushing two-stage test structure |
| CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
| CN203396909U (en) * | 2013-07-24 | 2014-01-15 | 昆山迈致治具科技有限公司 | PCB performance detection jig having locating stroke limiting function |
| CN203941196U (en) * | 2014-05-15 | 2014-11-12 | 珠海市运泰利自动化设备有限公司 | High precision measurement module |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110456109A (en) * | 2019-08-22 | 2019-11-15 | 珠海市运泰利自动化设备有限公司 | A kind of novel test equipment |
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Application publication date: 20140813 |