CN103969571B - The emulation test method of clock data recovery circuit - Google Patents
The emulation test method of clock data recovery circuit Download PDFInfo
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- CN103969571B CN103969571B CN201310042021.5A CN201310042021A CN103969571B CN 103969571 B CN103969571 B CN 103969571B CN 201310042021 A CN201310042021 A CN 201310042021A CN 103969571 B CN103969571 B CN 103969571B
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Abstract
The invention discloses the emulation test method of a kind of clock data recovery circuit, produce the step of circuit including a design pumping signal, pumping signal produces circuit and includes: variable voltage source, for producing different voltage signals；Voltage controlled oscillator, for producing a sine wave signal according to the voltage signal of variable voltage source output；Comparator, for comparing the pumping signal obtaining square wave configuration by sine wave signal and reference signal.The inventive method uses the pumping signal being made up of variable voltage source, voltage controlled oscillator and comparator produce circuit and just can easily produce pumping signal, and frequency size and the frequency range duration of pumping signal just can be conveniently regulated by the size and duration regulating the voltage signal of variable voltage source, the implementation method of pumping signal can be greatly simplified, testing efficiency can be improved and reduce testing cost.
Description
Technical field
The present invention relates to the method for designing of a kind of semiconductor integrated circuit, particularly relate to a kind of clock data recovery circuit
Emulation test method.
Background technology
Clock data recovery circuit (clock and data recovery, CDR) is widely used at communication field, is very
Core circuit in multisystem is also one of circuit that design difficulty is higher, such as, in serial communication data transmits, receiving
End needs to utilize CDR the clock signal in serial data to be extracted, and utilizes extracted clock signal to serial data
Carry out using and generating digital signal.
In the design process carrying out clock data recovery circuit, need to verify that clock data is extensive by the method for test
The performance quality of compound circuit, for cost-effective and raising efficiency, tests typically by emulation test method in prior art
The quality of the clock data recovery circuit designed by card.Need during emulation testing in simulation software, to form one with set
The clock and data recovery artificial circuit that the structure of clock data recovery circuit of meter is identical, by clock and data recovery artificial circuit
Simulate the performance of clock data recovery circuit；It is also required to provide a pumping signal to clock and data recovery artificial circuit simultaneously
Realize final test.
In existing emulation testing, the design comparison of clock and data recovery artificial circuit is easy, and completing the most easily can
Parameter i.e. provides the pumping signal problem that always designer compares headache according to the design of stream driving source.Owing to leading in actual serial
In letter data transmitting procedure, the time segment length of the frequency of the serial data received by clock data recovery circuit and each frequency
Value is all more complicated, in order to realize preferable simulated effect, needs to include an a series of frequency and right in pumping signal
So how the time segment length answered, realize that frequency size is adjustable and the adjustable pumping signal of frequency range duration is that existing clock data is extensive
A complicated problem during the emulation testing of compound circuit, in existing method, designer generally requires and writes more complicated letter
Number realizes the effect of variable ratio frequency changer driving source.
Summary of the invention
The technical problem to be solved is to provide the emulation test method of a kind of clock data recovery circuit, uses
Simple method provides for the variable exciting signal source variable with frequency range duration of frequency size, can improve testing efficiency, reduction
Testing cost.
For solving above-mentioned technical problem, the emulation test method of the clock data recovery circuit that the present invention provides includes as follows
Step:
Step one, according to design clock data recovery circuit formed a clock and data recovery artificial circuit, institute
State clock and data recovery artificial circuit for simulating the performance of described clock data recovery circuit.
Step 2, design pumping signal for described clock and data recovery artificial circuit and produce circuit, this pumping signal
Produce circuit for providing a pumping signal, described excitation for described clock and data recovery artificial circuit during emulation testing
Signal generating circuit includes:
Variable voltage source, for producing different voltage signals.
Voltage controlled oscillator, the input of described voltage controlled oscillator connects the outfan of described variable voltage source, described voltage-controlled
The outfan of agitator exports a sine wave signal, the frequency of described sine wave signal and described voltage signal direct ratio.
Comparator, an input of described comparator connects a reference signal, another input connects described voltage-controlled
The outfan of agitator, the described sine wave signal of described comparator input and described reference signal compares and at described ratio
Identical with described sine wave signal compared with the outfan output frequency of device and be the pumping signal of square wave configuration；Described comparator
Outfan is connected to described clock and data recovery artificial circuit.
Step 3, with described pumping signal produce circuit produce described pumping signal described clock and data recovery is emulated
Circuit carries out emulation testing.
Further improving is that described variable voltage source, described voltage controlled oscillator and described comparator are all respectively adopted imitative
The module carried in true software library realizes.
Further improving is that described pumping signal required during emulation testing in step 3 is changeable frequency and each frequency
The signal that corresponding frequency range duration is variable, arranges described adjustable according to the size of each frequency values needed for described pumping signal
The size of the voltage signal of voltage source, is arranged according to the frequency range duration size corresponding to each frequency needed for described pumping signal
The duration of the voltage signal of the described variable voltage source corresponding to each frequency.
The inventive method use the pumping signal being made up of variable voltage source, voltage controlled oscillator and comparator produce circuit
Just can easily produce pumping signal, and the size and duration by the voltage signal of regulation variable voltage source just can conveniently regulate
The frequency size of pumping signal and frequency range duration, it is possible to be greatly simplified the implementation method of pumping signal, testing efficiency can be improved also
Reduce testing cost.
Accompanying drawing explanation
The present invention is further detailed explanation with detailed description of the invention below in conjunction with the accompanying drawings:
Fig. 1 is the structure chart that the pumping signal in embodiment of the present invention method produces circuit；
Fig. 2 is the input-output curve of the voltage controlled oscillator in Fig. 1；
Fig. 3 is the input-output curve that the pumping signal in embodiment of the present invention method produces circuit.
Detailed description of the invention
As it is shown in figure 1, be the structure chart of the pumping signal generation circuit in embodiment of the present invention method；The embodiment of the present invention
The emulation test method of clock data recovery circuit comprises the steps:
Step one, according to design clock data recovery circuit formed a clock and data recovery artificial circuit (CDR
Artificial circuit) 4, described clock and data recovery artificial circuit 4 is for simulating the performance of described clock data recovery circuit.
Step 2, design pumping signal for described clock and data recovery artificial circuit 4 and produce circuit, this pumping signal
Produce circuit for providing pumping signal Multi-for described clock and data recovery artificial circuit during emulation testing
Frequency, described pumping signal produces circuit and includes:
Variable voltage source (VPWL) 1, for producing different voltage signals.
Voltage controlled oscillator (VCO) 2, the input of described voltage controlled oscillator 2 connects the outfan of described variable voltage source 1,
The outfan of described voltage controlled oscillator 2 exports a sine wave signal ωout, described sine wave signal ωoutFrequency and described electricity
Pressure signal direct ratio.As in figure 2 it is shown, be the input-output curve of voltage controlled oscillator 2；One its output of preferable voltage controlled oscillator 2
Frequency is the linear function of its input voltage:
ωout=ω0+Kvco×Vcont。
In above-mentioned formula, Vcont represents that the input voltage of voltage controlled oscillator 2, ω 0 represent corresponding to cutting during Vcont=0
Away from, and Kvco represents " gain " or " sensitivity " of agitator, the scope ω 1-ω 2 that frequency can reach, and is referred to as " adjusting
Adjusting range ".
Comparator 3, an input of described comparator 3 connects reference signal Vref, another input connects institute
State the outfan of voltage controlled oscillator 2, the described sine wave signal ω of described comparator 3 inputoutEnter with described reference signal Vref
Row compares and at the outfan output frequency of described comparator 3 and described sine wave signal ωoutIdentical and be square wave configuration
Pumping signal Multi-frequency；The outfan of described comparator 3 is connected to described clock and data recovery artificial circuit 4.
Described variable voltage source 1, described voltage controlled oscillator 2 and described comparator 3 are all respectively adopted in simulation software storehouse certainly
The module of band realizes.
Step 3, with described pumping signal produce circuit produce described pumping signal Multi-frequency to described
Clock and data recovery artificial circuit 4 carries out emulation testing.Described pumping signal Multi-frequency required during emulation testing
The signal that frequency range duration corresponding to changeable frequency and each frequency is variable, according to described pumping signal Multi-frequency
The size of required each frequency values arranges the size of the voltage signal of described variable voltage source, needed for described pumping signal
The frequency range duration size corresponding to each frequency arrange described variable voltage source corresponding to each frequency voltage signal time
Long.
As it is shown on figure 3, be the input-output curve of the pumping signal generation circuit in embodiment of the present invention method.Can root
Divide by frequency f3 needed for described pumping signal Multi-frequency, f2 and f1 according to the input-output curve of voltage controlled oscillator 2
Do not obtain value V3 of input voltage Vcont of voltage controlled oscillator 2, V2 and V1；Described adjustable voltage is obtained by voltage V3, V2 and V1
Source 1 needs the magnitude of voltage of the voltage signal VPWL provided；And by the frequency needed for described pumping signal Multi-frequency
Frequency range duration respectively t1, t2-t1 and t3-t2 of f1, f2 and f3 obtains the voltage signal that described variable voltage source 1 needs to provide
The duration of each magnitude of voltage of VPWL.
Above by specific embodiment, the present invention is described in detail, but these have not constituted the limit to the present invention
System.Without departing from the principles of the present invention, those skilled in the art it may also be made that many deformation and improves, and these also should
It is considered as protection scope of the present invention.
Claims (2)
1. the emulation test method of a clock data recovery circuit, it is characterised in that comprise the steps:
Step one, according to design clock data recovery circuit formed a clock and data recovery artificial circuit, time described
Clock data recover artificial circuit for simulating the performance of described clock data recovery circuit；
Step 2, designing pumping signal for described clock and data recovery artificial circuit and produce circuit, this pumping signal produces
Circuit is for providing a pumping signal, described pumping signal for described clock and data recovery artificial circuit during emulation testing
Generation circuit includes:
Variable voltage source, for producing different voltage signals；
Voltage controlled oscillator, the input of described voltage controlled oscillator connects the outfan of described variable voltage source, described VCO
The outfan of device exports a sine wave signal, the frequency of described sine wave signal and described voltage signal direct ratio；
Comparator, an input of described comparator connects a reference signal, another input connects described VCO
The outfan of device, the described sine wave signal of described comparator input and described reference signal compares and at described comparator
Outfan output frequency identical with described sine wave signal and be the pumping signal of square wave configuration；The output of described comparator
End is connected to described clock and data recovery artificial circuit；
Step 3, with described pumping signal produce circuit produce described pumping signal to described clock and data recovery artificial circuit
Carry out emulation testing；
Described pumping signal required during emulation testing is the signal that the frequency range duration corresponding to changeable frequency and each frequency is variable,
Size according to each frequency values needed for described pumping signal arranges the size of the voltage signal of described variable voltage source, according to
The frequency range duration size corresponding to each frequency needed for described pumping signal arranges the described adjustable voltage corresponding to each frequency
The duration of the voltage signal in source.
2. the emulation test method of clock data recovery circuit as claimed in claim 1, it is characterised in that: described adjustable voltage
Source, described voltage controlled oscillator and described comparator are all respectively adopted in simulation software storehouse the module carried and realize.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310042021.5A CN103969571B (en) | 2013-02-04 | 2013-02-04 | The emulation test method of clock data recovery circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310042021.5A CN103969571B (en) | 2013-02-04 | 2013-02-04 | The emulation test method of clock data recovery circuit |
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| CN103969571A CN103969571A (en) | 2014-08-06 |
| CN103969571B true CN103969571B (en) | 2016-12-28 |
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| CN115347970B (en) * | 2022-08-17 | 2023-12-01 | 南方电网科学研究院有限责任公司 | Clock synchronization method, device and equipment of electric power real-time simulation system |
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| JP2001202267A (en) * | 2000-01-24 | 2001-07-27 | Mitsubishi Electric Corp | Circuit and method for testing microcomputer |
| CN101714867A (en) * | 2008-10-07 | 2010-05-26 | 瑞昱半导体股份有限公司 | Clock-data recovery and method for binary signaling using low resolution adc |
| CN102315849A (en) * | 2010-07-01 | 2012-01-11 | 群联电子股份有限公司 | Method for generating reference clock signal and data receiving and transmitting system |
| CN102833064A (en) * | 2011-06-13 | 2012-12-19 | 中兴通讯股份有限公司 | Clock recovery method for microwave transmission and device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100432886B1 (en) * | 2002-01-30 | 2004-05-22 | 삼성전자주식회사 | Semiconductor memory device capable of performing a high-frequency wafer test operation |
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|---|---|---|---|---|
| JP2001202267A (en) * | 2000-01-24 | 2001-07-27 | Mitsubishi Electric Corp | Circuit and method for testing microcomputer |
| CN101714867A (en) * | 2008-10-07 | 2010-05-26 | 瑞昱半导体股份有限公司 | Clock-data recovery and method for binary signaling using low resolution adc |
| CN102315849A (en) * | 2010-07-01 | 2012-01-11 | 群联电子股份有限公司 | Method for generating reference clock signal and data receiving and transmitting system |
| CN102833064A (en) * | 2011-06-13 | 2012-12-19 | 中兴通讯股份有限公司 | Clock recovery method for microwave transmission and device |
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| 基于PLL的时钟数据恢复电路设计;刘期若;《中国优秀硕士学位论文全文数据库 信息科技辑》;20110515(第05期);第11-33、55-63页 * |
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