CN103926481A - Smart card testing device - Google Patents
Smart card testing device Download PDFInfo
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- CN103926481A CN103926481A CN201310044115.6A CN201310044115A CN103926481A CN 103926481 A CN103926481 A CN 103926481A CN 201310044115 A CN201310044115 A CN 201310044115A CN 103926481 A CN103926481 A CN 103926481A
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- proving installation
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- force fit
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- 238000012360 testing method Methods 0.000 title claims abstract description 85
- 239000000523 sample Substances 0.000 claims abstract description 139
- 238000009434 installation Methods 0.000 claims description 48
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 20
- 239000000853 adhesive Substances 0.000 claims description 14
- 230000001070 adhesive effect Effects 0.000 claims description 14
- 238000003825 pressing Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 238000013461 design Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a smart card testing device, which is used for testing smart cards, wherein each smart card is provided with a first connecting pad and a second connecting pad, the smart card testing device is provided with a first testing module and a second testing module, the first testing module is provided with a first circuit board, a first probe seat, a pressing plate and a first probe group, each first probe group corresponds to each first connecting pad to test each first connecting pad, the second testing module is provided with a second probe seat, a base and a second probe group, each second probe group corresponds to each second connecting pad to test each second connecting pad, the first testing module tests the first connecting pad of each smart card, and the second testing module tests the second connecting pad of each smart card, so that the testing flow of the smart cards can be simplified.
Description
Technical field
The present invention relates to a kind of smart card proving installation, particularly relate to a kind of the first connection gasket about testing the upper surface that is positioned at smart card and the smart card proving installation of the second connection gasket of lower surface that is positioned at smart card.
Background technology
Refer to Figure 11, a kind of proving installation in order to testing smart card, this proving installation 300 has test platform 310 and multiple probe 320, described probe 320 is arranged at this test platform 310, this smart card 400 has multiple connection gaskets 410, respectively respectively this connection gasket 410 of these probe 320 correspondences, with test, respectively whether this connection gasket 410 is normal, because this proving installation 300 only can be tested the connection gasket 410 of the upper surface 420 that is positioned at this smart card 400, be positioned at the connection gasket 410 of the lower surface 430 of this smart card 400 if test, need be after the connection gasket 410 of upper surface 420 that completes this smart card 400 of test, again these smart card 400 turn-overs are tested to the connection gasket 410 that is positioned at lower surface 430, and cause on testing process complicated with difficulty.
Because the defect that above-mentioned existing smart card proving installation exists, practical experience and the professional knowledge of the inventor based on being engaged in this type of product design manufacture and enriching for many years, and the utilization of cooperation scientific principle, actively research and innovation in addition, to founding a kind of novel smart card proving installation, can improve general existing smart card proving installation, make it have more practicality.Through constantly research, design, and after repeatedly studying sample and improving, finally create the present invention who has practical value.
Summary of the invention
Fundamental purpose of the present invention is, overcome the defect that existing smart card proving installation exists, and provide a kind of smart card proving installation in order to test card, can test the first connection gasket of the upper surface that is positioned at smart card and be positioned at the second connection gasket of the lower surface of smart card by the first test module and the second test module, to simplify the flow process of test, thereby be more suitable for practicality.
The object of the invention to solve the technical problems realizes by the following technical solutions.A kind of smart card proving installation proposing according to the present invention, it is for testing smart card, respectively this smart card has upper surface, lower surface, the first connection gasket, the second connection gasket and adhesive body, this first connection gasket is positioned at this upper surface, this second connection gasket and this adhesive body are positioned at this lower surface, wherein this smart card proving installation comprises the first test module and the second test module, this first test module has first circuit board, the first probe base, force fit plate and multiple the first probe groups, this first probe base is between this first circuit board and this force fit plate, this first probe base has first surface, second surface, the first through hole, body and positioning convex portion, this first surface is towards this first circuit board, this second surface is towards this force fit plate, respectively this first through hole is communicated with this first surface and this second surface, this positioning convex portion protrudes from this body, respectively this first probe groups is incorporated into this first circuit board, respectively this first probe groups run through respectively this first through hole, and respectively this first probe groups protrudes from this second surface, this force fit plate has the hole of appearing, respectively this appears hole and appears respectively this first probe groups, wherein each respectively this first connection gasket of this first probe groups correspondence, this second test module has the second probe base, pedestal and the second probe groups, this second probe base has the 3rd surface, the 4th surface and the second through hole, the 3rd surface is towards this force fit plate, the 4th surface is towards this pedestal, respectively this second through hole is communicated with the 3rd surface and the 4th surface, respectively this second probe groups is incorporated into this pedestal, respectively this second probe groups run through respectively this second through hole, and respectively this second probe groups protrudes from the 3rd surface, wherein, respectively respectively this second connection gasket of this second probe groups correspondence.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid smart card proving installation, wherein this first test module has locating part, and this first probe base has stopper slot, this stopper slot is arranged with in this first surface, this locating part has limiting section and joint portion, and this limiting section is arranged at this stopper slot, and this joint portion is incorporated into this force fit plate.
Aforesaid smart card proving installation, wherein this first test module has elastic component, and respectively this elastic component is between this first probe base and this force fit plate, and respectively this elastic component has first end and the second end, respectively this first end this first probe base of conflicting, respectively this second end this force fit plate of conflicting.
Aforesaid smart card proving installation, wherein this force fit plate has detent, mobile this detent that is placed in of this positioning convex portion of this first probe base.
Aforesaid smart card proving installation, wherein this force fit plate has stitching surface, and this detent has groove bottom, and this stitching surface is towards this second test module, and respectively this appears hole and is communicated with this stitching surface and this groove bottom.
Aforesaid smart card proving installation, wherein this first test module separately has guide posts, and this first probe base has guide hole, and respectively this guide hole is positioned at this body, and respectively this guide posts is incorporated into this force fit plate, and each mobile this guide hole that is placed in of this guide posts.
Aforesaid smart card proving installation, wherein this first probe groups has the first probe set, the first probe and the first elastic component, and this first probe and this first elastic component are arranged in this first probe set, and this first probe protrudes from this first probe set.
Aforesaid smart card proving installation, wherein this second probe base has the groove of stepping down, respectively this groove of stepping down is arranged with the 3rd surface in this second probe base, and respectively this step down groove correspondence respectively this adhesive body with this adhesive body of accommodating respectively this smart card.
Aforesaid smart card proving installation, wherein respectively this groove of stepping down is communicated with respectively this second through hole.
Aforesaid smart card proving installation, wherein this second test module has load bearing seat and motion bar, and this pedestal is arranged at this load bearing seat, and this this load bearing seat of motion bar contact, can move up and down this load bearing seat.
Aforesaid smart card proving installation, wherein this pedestal has second circuit board and plate body, and this second circuit board is incorporated into this plate body, and this plate body is between this second circuit board and load bearing seat.
Aforesaid smart card proving installation, wherein this second probe groups has the second probe set, the second probe and the second elastic component, and this second probe and this second elastic component are arranged in this second probe set, and this second probe protrudes from this second probe set.
The present invention compared with prior art has obvious advantage and beneficial effect.The present invention tests this first connection gasket of described smart card by this first test module, and is tested the second connection gasket of described smart card by this second test module, with the testing process of simplified intelligent card.The present invention has significant progress technically, and has obvious good effect, is really a new and innovative, progressive, practical new design.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, and for above and other object of the present invention, feature and advantage can be become apparent, below especially exemplified by preferred embodiment, and coordinate accompanying drawing, be described in detail as follows.
Brief description of the drawings
Fig. 1 is according to one embodiment of the present of invention, a kind of stereographic map of smart card proving installation.
Fig. 2 is according to one embodiment of the present of invention, a kind of exploded perspective view of the first test module.
Fig. 3 is according to one embodiment of the present of invention, the side sectional view of this first test module.
Fig. 4 is according to one embodiment of the present of invention, a kind of exploded perspective view of the second test module.
Fig. 5 is according to one embodiment of the present of invention, the side sectional view of this second test module.
Fig. 6 is according to one embodiment of the present of invention, the stereographic map of a kind of test platform, smart card and this smart card proving installation.
Fig. 7 is according to one embodiment of the present of invention, the upward view of described smart card.
Fig. 8 is according to one embodiment of the present of invention, the vertical view of described smart card.
Fig. 9 is according to one embodiment of the present of invention, and this smart card proving installation is tested the process flow diagram of described smart card.
Figure 10 is according to one embodiment of the present of invention, and this smart card proving installation is tested the process flow diagram of described smart card.
Figure 11 is the side sectional view of existing known proving installation.
[main element symbol description]
100: 110: the first test modules of smart card proving installation
111: 112: the first probe bases of first circuit board
112a: first surface 112b: second surface
112c: the first through hole 112d: body
112e: positioning convex portion 112f: stopper slot
112g: guide hole 113: force fit plate
113a: appear hole 113b: detent
113c: stitching surface 113d: groove bottom
114: the first probe groups 114a: the first probe set
114b: the first probe 114c: the first elastic component
115: locating part 115a: limiting section
115b: joint portion 116: elastic component
116a: first end 116b: the second end
117: 120: the second test modules of guide posts
121: the second probe base 121a: the 3rd surface
121b: the 4th surperficial 121c: the second through hole
121d: the groove 122 of stepping down: pedestal
122a: second circuit board 122b: plate body
123: the second probe groups 123a: the second probe set
123b: the second probe 123c: the second elastic component
124: load bearing seat 125: motion bar
200: smart card 210: upper surface
220: 230: the first connection gaskets of lower surface
240: the second connection gaskets 250: adhesive body
300: proving installation 310: test platform
320: probe 400: smart card
410: connection gasket 420: upper surface
430: lower surface 500: test platform
510: guide rail 511: guide pass
520: adjustment part 600: driving member
G1: the first spacing
Embodiment
Technological means and effect of taking for reaching predetermined goal of the invention for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, to its embodiment of smart card proving installation, structure, feature and effect thereof of proposing according to the present invention, be described in detail as follows.
Refer to Fig. 1, it is one embodiment of the present of invention, a kind of smart card proving installation 100, it comprises the first test module 110 and the second test module 120, in the present embodiment, this the second test module 120 is positioned at the below of this first test module 110, refer to Fig. 1, Fig. 2 and Fig. 3, this first test module 110 has first circuit board 111, the first probe base 112, force fit plate 113, the first probe groups 114, locating part 115, elastic component 116 and guide posts 117, this first probe base 112 is between this first circuit board 111 and this force fit plate 113, this first probe base 112 has first surface 112a, second surface 112b, the first through hole 112c, body 112d, positioning convex portion 112e, stopper slot 112f and guide hole 112g, this first surface 112a is towards this first circuit board 111, this second surface 112b is towards this force fit plate 113, respectively this first through hole 112c is communicated with this first surface 112a and this second surface 112b, this positioning convex portion 112e protrudes from this body 112d, this stopper slot 112f is arranged with in this first surface 112a, respectively this guide hole 112g is positioned at this body 112d, respectively this first probe groups 114 is incorporated into this first circuit board 111, respectively this first probe groups 114 run through respectively this first through hole 112c, and respectively this first probe groups 114 protrudes from this second surface 112b, the spacing of this force fit plate 113 and this first probe base 112 has the first spacing G1, and this force fit plate 113 has the hole of appearing 113a, detent 113b and stitching surface 113c, respectively this appears hole 113a and appears respectively this first probe groups 114, this positioning convex portion 112e of this first probe base 112 is movably placed in this detent 113b, and this detent 113b has groove bottom 113d, this stitching surface 113c is towards this second test module 120, respectively this appears hole 113a and is communicated with this stitching surface 113c and this groove bottom 113d, this first probe groups 114 has the first probe set 114a, the first probe 114b and the first elastic component 114c, this the first probe 114b and this first elastic component 114c are arranged in this first probe set 114a, and this first probe 114b protrudes from this first probe set 114a, this locating part 115 has limiting section 115a and joint portion 115b, this limiting section 115a is arranged at this stopper slot 112f, this joint portion 115b is incorporated into this force fit plate 113, only can in this first spacing G1, move to limit this force fit plate 113, respectively this elastic component 116 is between this first probe base 112 and this force fit plate 113, respectively this elastic component 116 has first end 116a and the second end 116b, respectively this first end 116a this first probe base 112 of conflicting, respectively this second end 116b this force fit plate 113 of conflicting, when this force fit plate 113 is subject to external force contact and moves and compress described elastic component 116 towards this first probe base 112, described elastic component 116 provides this force fit plate 113 pressing strength, respectively this guide posts 117 is incorporated into this force fit plate 113, and respectively this guide posts 117 is movably placed in this guide hole 112g, carry out rectilinear motion to guide this force fit plate 113.
Refer to Fig. 4 and Fig. 5, this second test module 120 has the second probe base 121, pedestal 122, the second probe groups 123, load bearing seat 124 and motion bar 125, this second probe base 121 has the 3rd surperficial 121a, the 4th surperficial 121b, the second through hole 121c and the groove 121d that steps down, the 3rd surperficial 121a is towards this force fit plate 113, the 4th surperficial 121b is towards this pedestal 122, respectively this second through hole 121c is communicated with the 3rd surperficial 121a and the 4th surperficial 121b, respectively this groove 121d that steps down is arranged with in the 3rd surperficial 121a, in the present embodiment, respectively this groove 121d that steps down is communicated with respectively this second through hole 121c, or in other embodiments, respectively this groove 121d that steps down is arranged with respectively in the 3rd surperficial 121a with each this second through hole 121c, it there is no the relation of connection, in the present embodiment, this pedestal 122 is between this second probe base 121 and this load bearing seat 124, and this pedestal 122 is arranged at this load bearing seat 124, this this load bearing seat 124 of motion bar 125 contacts, this load bearing seat 124 can be moved up and down, or in other embodiments, this motion bar 125 is directly to drive this pedestal 122, this pedestal 122 can be moved up and down, this pedestal 122 has second circuit board 122a and plate body 122b, this second circuit board 122a is incorporated into this plate body 122b, and this plate body 122b is between this second circuit board 122a and load bearing seat 124, respectively this second probe groups 123 is incorporated into this second circuit board 122a of this pedestal 122, and respectively this second probe groups 123 run through respectively this second through hole 121c, and respectively this second probe groups 123 protrudes from the 3rd surperficial 121a, this second probe groups 123 has the second probe set 123a, the second probe 123b and the second elastic component 123c, this the second probe 123b and this second elastic component 123c are arranged in this second probe set 123a, and this second probe 123b protrudes from this second probe set 123a.
Refer to Fig. 6, for the present invention is arranged at test platform 500, with testing smart card 200, this test platform 500 has two guide rails 510 and two adjustment parts 520, respectively this guide rail 510 has guide pass 511, described guide pass 511 is in order to carry described smart card 200, described smart card 200 can be moved on described guide pass 511, described adjustment part 520 is positions of adjusting described guide rail 510, make described smart card 200 can align this first test module 110 and this second test module 120, refer to Fig. 6, Fig. 7 and Fig. 8, respectively this smart card 200 has upper surface 210, lower surface 220, the first connection gasket 230, the second connection gasket 240 and adhesive body 250, this first connection gasket 230 is positioned at this upper surface 210, this second connection gasket 240 and this adhesive body 250 are positioned at this lower surface 220, refer to Fig. 9, in the time that described smart card 200 is delivered to test position by described guide rail 510, respectively these the first probe groups 114 correspondences respectively this first connection gasket 230 with test respectively whether this first connection gasket 230 normal, respectively these the second probe groups 123 correspondences respectively this second connection gasket 240 with test respectively whether this second connection gasket 240 normal, respectively this step down groove 121d correspondence respectively this adhesive body 250 with accommodating respectively this adhesive body 250, to avoid respectively this smart card 200 when the test, described adhesive body 250 damages because of the pressing of this force fit plate 113.
The testing process of described smart card 200 is as follows, first, refer to Fig. 6 and Fig. 9, drive this motion bar 125 with a driving member 600 (can be selected from pneumatic cylinder or oil hydraulic cylinder), and make this this pedestal 122 of load bearing seat 124 pushing tows, this second probe base 121 is risen to this guide pass 511 of described guide rail 510 with high, because described the second probe groups 123 is the 3rd surperficial 121a that protrude from this second probe base 121, therefore, described smart card 200 be subject to described the second probe groups 123 pushing tow and higher than described guide pass 511, then, refer to Figure 10, drive this first test module 110 to decline with another driving member (figure does not draw), make conflict this first connection gasket 230 of described smart card 200 of this force fit plate 113, and then make this second connection gasket 240 that is positioned at described lower surface 220 compress described the second probe groups 123, and respectively this second elastic component 123c of this second probe groups 123 of compression, this second probe 123b is dropped to the 3rd surperficial 121a with high, and respectively this second probe 123b conflicts and is positioned at respectively respectively this second connection gasket 240 of this lower surface 220, finally, this first test module 110 is again toward declining, make respectively this first probe 114b of this first probe groups 114 be positioned at respectively respectively this first connection gasket 230 of this upper surface 210 via appearing 113a conflict in hole described in this force fit plate 113, test respectively this first connection gasket 230 and this second connection gasket 240 of described smart card 200 with this first test module 110 and this second test module 120, in the present embodiment, this smart card proving installation 100 can be tested 16 smart cards 200 simultaneously, or in other embodiments, this smart card proving installation 100 can be tested more or less smart card 200.
The present invention tests this first connection gasket 230 of described smart card 200 by this first test module 110, and is tested the second connection gasket 240 of described smart card 200 by this second test module 120, to simplify the testing process of described smart card 200.
The above, it is only preferred embodiment of the present invention, not the present invention is done to any pro forma restriction, although the present invention discloses as above with preferred embodiment, but not in order to limit the present invention, any those skilled in the art, do not departing within the scope of technical solution of the present invention, when can utilizing the technology contents of above-mentioned announcement to make a little change or being modified to the equivalent embodiment of equivalent variations, in every case be the content that does not depart from technical solution of the present invention, foundation technical spirit of the present invention is to any simple modification made for any of the above embodiments, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.
Claims (12)
1. a smart card proving installation, it is for testing smart card, respectively this smart card has upper surface, lower surface, the first connection gasket, the second connection gasket and adhesive body, this first connection gasket is positioned at this upper surface, this second connection gasket and this adhesive body are positioned at this lower surface, it is characterized in that this smart card proving installation comprises:
The first test module, it has first circuit board, the first probe base, force fit plate and the first probe groups, this first probe base is between this first circuit board and this force fit plate, this first probe base has first surface, second surface, the first through hole, body and positioning convex portion, this first surface is towards this first circuit board, this second surface is towards this force fit plate, respectively this first through hole is communicated with this first surface and this second surface, this positioning convex portion protrudes from this body, respectively this first probe groups is incorporated into this first circuit board, respectively this first probe groups run through respectively this first through hole, and respectively this first probe groups protrudes from this second surface, this force fit plate has multiple holes that appear, respectively this appears hole and appears respectively this first probe groups, wherein each respectively this first connection gasket of this first probe groups correspondence, and
The second test module, it has the second probe base, pedestal and the second probe groups, this second probe base has the 3rd surface, the 4th surface and the second through hole, the 3rd surface is towards this force fit plate, the 4th surface is towards this pedestal, respectively this second through hole is communicated with the 3rd surface and the 4th surface, respectively this second probe groups is incorporated into this pedestal, respectively this second probe groups run through respectively this second through hole, and respectively this second probe groups protrudes from the 3rd surface, wherein, each respectively this second connection gasket of this second probe groups correspondence.
2. smart card proving installation according to claim 1, it is characterized in that wherein this first test module has locating part, this first probe base has stopper slot, this stopper slot is arranged with in this first surface, this locating part has limiting section and joint portion, this limiting section is arranged at this stopper slot, and this joint portion is incorporated into this force fit plate.
3. smart card proving installation according to claim 1, it is characterized in that wherein this first test module has elastic component, respectively this elastic component is between this first probe base and this force fit plate, respectively this elastic component has first end and the second end, respectively this first end this first probe base of conflicting, respectively this second end this force fit plate of conflicting.
4. smart card proving installation according to claim 1, is characterized in that wherein this force fit plate has detent, mobile this detent that is placed in of this positioning convex portion of this first probe base.
5. smart card proving installation according to claim 4, is characterized in that wherein this force fit plate has stitching surface, and this detent has groove bottom, and this stitching surface is towards this second test module, and respectively this appears hole and is communicated with this stitching surface and this groove bottom.
6. smart card proving installation according to claim 1, it is characterized in that wherein this first test module separately has guide posts, this first probe base has guide hole, respectively this guide hole is positioned at this body, respectively this guide posts is incorporated into this force fit plate, and each mobile this guide hole that is placed in of this guide posts.
7. smart card proving installation according to claim 1, it is characterized in that wherein this first probe groups has the first probe set, the first probe and the first elastic component, this first probe and this first elastic component are arranged in this first probe set, and this first probe protrudes from this first probe set.
8. smart card proving installation according to claim 1, it is characterized in that wherein this second probe base has the groove of stepping down, respectively this groove of stepping down is arranged with the 3rd surface in this second probe base, and respectively this step down groove correspondence respectively this adhesive body with this adhesive body of accommodating respectively this smart card.
9. smart card proving installation according to claim 8, is characterized in that wherein respectively this groove of stepping down is communicated with respectively this second through hole.
10. smart card proving installation according to claim 1, is characterized in that wherein this second test module has load bearing seat and motion bar, and this pedestal is arranged at this load bearing seat, and this this load bearing seat of motion bar contact, can move up and down this load bearing seat.
11. smart card proving installations according to claim 10, is characterized in that wherein this pedestal has second circuit board and plate body, and this second circuit board is incorporated into this plate body, and this plate body is between this second circuit board and load bearing seat.
12. smart card proving installations according to claim 1, it is characterized in that wherein this second probe groups has the second probe set, the second probe and the second elastic component, this second probe and this second elastic component are arranged in this second probe set, and this second probe protrudes from this second probe set.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW102101698 | 2013-01-16 | ||
| TW102101698A TW201430349A (en) | 2013-01-16 | 2013-01-16 | Smart card testing apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103926481A true CN103926481A (en) | 2014-07-16 |
Family
ID=51144774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310044115.6A Pending CN103926481A (en) | 2013-01-16 | 2013-02-04 | Smart card testing device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN103926481A (en) |
| TW (1) | TW201430349A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459211A (en) * | 2014-11-05 | 2015-03-25 | 中山市智牛电子有限公司 | Circuit board placing device applied to tester |
| CN112309486A (en) * | 2019-07-26 | 2021-02-02 | 第一检测有限公司 | Chip testing device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113791251B (en) * | 2021-11-15 | 2022-03-29 | 新恒汇电子股份有限公司 | Method, device and product for detecting failure of SIM card |
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| TWM423838U (en) * | 2011-11-08 | 2012-03-01 | Chip Guard Co Ltd | Inspection apparatus for integrated circuit chip |
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2013
- 2013-01-16 TW TW102101698A patent/TW201430349A/en unknown
- 2013-02-04 CN CN201310044115.6A patent/CN103926481A/en active Pending
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|---|---|---|---|---|
| US5247246A (en) * | 1987-04-17 | 1993-09-21 | Everett Charles Technologies, Inc. | Testing of integrated circuit devices on loaded printed circuit boards |
| GB2367369A (en) * | 2000-06-06 | 2002-04-03 | Ate Services Ltd | A test fixture for testing a printed circuit board |
| CN1704762A (en) * | 2004-05-26 | 2005-12-07 | 名威科技实业有限公司 | Internal circuit detection method and detection apparatus used thereby |
| TWM346800U (en) * | 2008-06-27 | 2008-12-11 | Ramct Technology Corp | Memory test device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459211A (en) * | 2014-11-05 | 2015-03-25 | 中山市智牛电子有限公司 | Circuit board placing device applied to tester |
| CN112309486A (en) * | 2019-07-26 | 2021-02-02 | 第一检测有限公司 | Chip testing device |
| CN112309486B (en) * | 2019-07-26 | 2024-04-12 | 第一检测有限公司 | Chip testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201430349A (en) | 2014-08-01 |
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Application publication date: 20140716 |