CN103811595A - Waxing process - Google Patents

Waxing process Download PDF

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Publication number
CN103811595A
CN103811595A CN201210457559.8A CN201210457559A CN103811595A CN 103811595 A CN103811595 A CN 103811595A CN 201210457559 A CN201210457559 A CN 201210457559A CN 103811595 A CN103811595 A CN 103811595A
Authority
CN
China
Prior art keywords
chip
wax
waxing
ceramic disc
nitrogen gun
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201210457559.8A
Other languages
Chinese (zh)
Inventor
张恒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN201210457559.8A priority Critical patent/CN103811595A/en
Publication of CN103811595A publication Critical patent/CN103811595A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination

Abstract

The invention relates to a waxing process. The waxing process is characterized by comprising the steps of adjusting pressure of a nitrogen gun to 0.6MPa, enabling a muzzle of the nitrogen gun to be slantly opposite to the surface of a chip, and starting the nitrogen gun to blow the surface of the chip clean; heating a wax stick and a ceramic disc to 110 DEG C, coating the ceramic disc with wax in a dropped mode, and consuming 0.3g of wax per piece; enabling the chip to adhere to the ceramic disc, covering the chip with a certain number of dust-free paper, pressurizing the ceramic disc for 2min, and enabling pressure to be 0.6MPa; performing cooling to 40 DEG C, taking out the ceramic disc, and finishing the waxing. According to the process, waxing uniformity is further precisely guaranteed through the waxing temperature and pressure, the piece cracking rate can be effectively reduced, chip quality is guaranteed, and accordingly product profits are improved.

Description

A kind of Wax enhancement
Technical field
The present invention relates to a kind of Wax enhancement, belong to optoelectronic areas.
Background technology
In LED production field, in order to improve the heat radiation of chip, often need chip to carry out attenuate, and attenuate is very easy to originally to grind with regard to frangible chip, at present, conventionally before attenuate, chip is pasted on ceramic disk by specific attenuate wax, and Wax enhancement is not very perfect conventionally at present, therefore, in thinning process, still there is a large amount of fragments.
Summary of the invention
The present invention is directed to the deficiency that prior art exists, a kind of Wax enhancement is provided.
The technical scheme that the present invention solves the problems of the technologies described above is as follows: a kind of Wax enhancement, it is characterized in that, and described process is as follows:
(1) nitrogen gun pressure is adjusted to 0.6MPa, nitrogen gun muzzle, tiltedly to chip surface, is opened to nitrogen gun, chip surface is blown clean;
(2) rod wax and ceramic disk are heated to 110 ℃, then wax is dripped and is coated on ceramic disk, every consumes 0.3g wax;
(3) wafer is attached on ceramic disk to bedding dust-free paper, platen pressurization 2min, pressure 0.6MPa;
(4) be cooled to 40 ℃, take out ceramic disk, the end of waxing.
The invention has the beneficial effects as follows: wax temperature and pressure are further accurately guaranteed the uniformity of waxing by technique of the present invention, can effectively reduce sliver rate simultaneously, guaranteed the quality of chip, thereby improved the profit of product.
Embodiment
Below principle of the present invention and feature are described, example, only for explaining the present invention, is not intended to limit scope of the present invention.
A kind of Wax enhancement, is characterized in that, described process is as follows:
(1) nitrogen gun pressure is adjusted to 0.6MPa, nitrogen gun muzzle, tiltedly to chip surface, is opened to nitrogen gun, chip surface is blown clean;
(2) rod wax and ceramic disk are heated to 110 ℃, then wax is dripped and is coated on ceramic disk, every consumes 0.3g wax;
(3) wafer is attached on ceramic disk to bedding dust-free paper, platen pressurization 2min, pressure 0.6MPa;
(4) be cooled to 40 ℃, take out ceramic disk, the end of waxing.
The foregoing is only preferred embodiment of the present invention, in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.

Claims (1)

1. a Wax enhancement, is characterized in that, described process is as follows:
(1) nitrogen gun pressure is adjusted to 0.6MPa, nitrogen gun muzzle, tiltedly to chip surface, is opened to nitrogen gun, chip surface is blown clean;
(2) rod wax and ceramic disk are heated to 110 ℃, then wax is dripped and is coated on ceramic disk, every consumes 0.3g wax;
(3) chip is attached on ceramic disk to bedding dust-free paper, platen pressurization 2min, pressure 0.6MPa;
(4) be cooled to 40 ℃, take out ceramic disk, the end of waxing.
CN201210457559.8A 2012-11-15 2012-11-15 Waxing process Pending CN103811595A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201210457559.8A CN103811595A (en) 2012-11-15 2012-11-15 Waxing process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210457559.8A CN103811595A (en) 2012-11-15 2012-11-15 Waxing process

Publications (1)

Publication Number Publication Date
CN103811595A true CN103811595A (en) 2014-05-21

Family

ID=50708081

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210457559.8A Pending CN103811595A (en) 2012-11-15 2012-11-15 Waxing process

Country Status (1)

Country Link
CN (1) CN103811595A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104409582A (en) * 2014-11-19 2015-03-11 迪源光电股份有限公司 LED (light-emitting diode) wafer pasting method
CN110098286A (en) * 2018-01-29 2019-08-06 山东浪潮华光光电子股份有限公司 A kind of pasting method in the LED wafer substrate thinning of simplicity

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104409582A (en) * 2014-11-19 2015-03-11 迪源光电股份有限公司 LED (light-emitting diode) wafer pasting method
CN110098286A (en) * 2018-01-29 2019-08-06 山东浪潮华光光电子股份有限公司 A kind of pasting method in the LED wafer substrate thinning of simplicity
CN110098286B (en) * 2018-01-29 2020-05-08 山东浪潮华光光电子股份有限公司 Surface mounting method in thinning of LED wafer substrate

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Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20140521