CN103792435A - Coupling component, and data measuring device and method for measuring scattering parameters - Google Patents
Coupling component, and data measuring device and method for measuring scattering parameters Download PDFInfo
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- CN103792435A CN103792435A CN201310753021.6A CN201310753021A CN103792435A CN 103792435 A CN103792435 A CN 103792435A CN 201310753021 A CN201310753021 A CN 201310753021A CN 103792435 A CN103792435 A CN 103792435A
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Abstract
The invention discloses a data measuring device for measuring scattering parameters. The data measuring device includes a coupling component and a vector network analyzer; the coupling component includes a first probe, a second probe, a first port connected with the first probe, and a second port connected with the second probe; the first probe and the second probe are respectively used for coupling radio frequency signals of a measured device; an output port of the vector network analyzer is used for connection with a public input port of the measured device; and an input port is connected with the first port or the second port of the coupling component, so as to measure a transmission coefficient the public input port of the measured device to the first probe and the second probe and measure a delay coefficient between the first probe and the second probe. The transmission coefficient and the delay coefficient are used to calculate scattering parameters of the measure device. By adopting the above method, in the invention, while the work condition of the measured device is not changed, the scattering parameters of the measured device are measured.
Description
Technical field
The present invention relates to microwave measurement field, particularly relate to a kind of for measuring coupling assembly, the data determination device and method of scattering parameter.
Background technology
Scattering parameter measurement is the common measurement means in frequency microwave field, and for multiport Microwave Net, scattering parameter comprises the isolation between reflection coefficient and the port of port.By the scattering parameter of measurement port, can assess intercoupling between the matching status of port and port and port.Vector network analyzer is the main measurement instrument of scattering parameter, because of normally coaxial-type of Meter Test port, therefore in the time measuring measured piece scattering parameter, radio-frequency joint need to be installed on measured piece, by radio-frequency cable, radio-frequency joint be connected with vector network analyzer.
Fig. 1 is the circuit connection diagram of existing measurement scattering parameter one embodiment, as shown in Figure 1, measured piece 11 comprises one section of microstrip line 111, for the scattering parameter of test microstrip line 111, need to use to comprise that the transition piece of microstrip line 211,212 and radio-frequency joint 213,214 is connected by cable measured piece 11 with vector network analyzer device 31.If need to obtain the scattering parameter at microstrip line 111 reference surface a places, need to adopt the technology such as " going to embed " or " TRL calibration ", the impact bringing to eliminate the transition pieces such as radio-frequency joint.When measured piece 11 is certain complete micro-part with power division network, by the measuring method of above-mentioned routine, need to destroy micro-integrality with power division network, insert the joint for measuring in measuring position, this mode can affect test result, produces unfavorable factor.
Summary of the invention
The technical matters that the present invention mainly solves is to provide a kind of for measuring coupling assembly, the data determination device and method of scattering parameter, so that in the situation that not changing measured piece duty, the scattering parameter of measured piece is measured.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: provide a kind of for measuring the coupling assembly of scattering parameter, comprise the first probe, the second probe, with the first pop one's head in the first port being connected and the second port being connected with the second probe; The first probe, the second probe be respectively used to be coupled measured piece radiofrequency signal so that radiofrequency signal for the measurement of scattering parameter.
Wherein, coupling assembly comprises the substrate for the first probe, the second probe, the first port and the second port are set.
Wherein, on substrate, can be provided with measured piece, measured piece and the first probe, the second probe, the first port and the second port are located on same substrate.
Wherein, the first probe and the second probe are not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and are greater than 0 total length that is less than measured piece; The first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, and the first probe and second is popped one's head in identical with the stiffness of coupling of measured piece.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: provide a kind of for measuring the data determination device of scattering parameter, comprise coupling assembly and vector network analyzer; Coupling assembly comprise the first probe, the second probe, with the first pop one's head in the first port being connected and the second port being connected with the second probe; The first probe, the second probe be respectively used to the to be coupled radiofrequency signal of measured piece; Vector network analyzer output port is for being connected with the public input port of measured piece, input port is connected with the first port or second port of coupling assembly, for measuring the retardation coefficient between public input port to the first probe of measured piece or the second transmission coefficient of popping one's head in and the first probe and the second probe, described transmission coefficient and retardation coefficient are for the measurement of described scattering parameter.
For solving the problems of the technologies described above, the technical scheme that the present invention adopts is: provide a kind of for measuring the method for scattering parameter, comprise step: measure in the 4 port Microwave Nets that the first probe, the second probe and the public input port of measured piece, output port form the public input port of measured piece to the retardation coefficient between transmission coefficient and the first probe and second probe of the first probe, the second probe, wherein, the first probe and the second probe are for the radiofrequency signal of the measured piece that is coupled; According to the scattering parameter of transmission coefficient and retardation coefficient calculating measured piece.
Wherein, the first probe and the second probe are not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and are greater than 0 total length that is less than measured piece; The first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, while that the first probe and second is popped one's head in is identical with the stiffness of coupling of measured piece.
Wherein, the acquisition pattern of retardation coefficient is the measurement of the vector network analyzer of electromagnetic field simulation software emulation or calibration.
Wherein, the acquisition pattern of transmission coefficient is to utilize the vector network analyzer of calibration to measure, and wherein, transmission coefficient comprises amplitude and phase place.
Wherein, the public input port of the close measured piece of the first probe, equal-(S41-S31 × G21)/(S41-S31 × G12) of reflection coefficient of the first probe corresponding measured piece position; Equal-(S31-S41 × G12)/(S41-S31 × G21) of reflection coefficient of the second probe corresponding measured piece position; Wherein, S31, S41 be radiofrequency signal from the public input port of measured piece to the first probe, second probe transmission coefficient, G12 is the retardation coefficient of radiofrequency signal from the first probe to the second probe, and G21 is the retardation coefficient of radiofrequency signal from the second probe to the first probe.
Wherein, the isolation between two identical its radio-frequency (RF) signal input end mouths of 4 port Microwave Nets is (S81-S71 × G12)/(S41-S31 × G12); Wherein, S31, S41 be in one 4 port Microwave Nets radiofrequency signal from the transmission coefficient of the public input port to two of a measured piece probe, S81, S71 be radiofrequency signal from one 4 port Microwave Nets the public input port of measured piece to the transmission coefficient of two probes in another 4 port Microwave Net, G12 is the retardation coefficient between one 4 port Microwave Net probes, the corresponding probe of S31, S71 is compared with other probes in place 4 port Microwave Nets separately, apart from the close together of described public input port.
The invention has the beneficial effects as follows: the situation that is different from prior art, the present invention arranges the first probe and second and pops one's head in to form 4 port Microwave Nets near measured piece, wherein, the first probe, second is popped one's head in for the radiofrequency signal of the measured piece that is coupled, public input port by measuring measured piece in 4 port Microwave Nets, to the retardation coefficient between transmission coefficient and the first probe and second probe of the first probe, the second probe, calculates the scattering parameter of measured piece.By the way, the present invention can, in the situation that not changing measured piece duty, measure the scattering parameter of measured piece.
Accompanying drawing explanation
Fig. 1 is the circuit connection diagram of existing measurement scattering parameter one embodiment;
Fig. 2 is the schematic flow sheet of scattering parameter measuring method one embodiment of the present invention;
The circuit connection diagram of one embodiment when Fig. 3 is data determination measurement device scattering parameter of the present invention;
Fig. 4 is schematic diagram embodiment illustrated in fig. 3;
Fig. 5 is the schematic diagram of isolation one embodiment between measurement port of the present invention;
Fig. 6 is the schematic diagram that coupling assembly of the present invention is measured;
Fig. 7 is the structural representation that coupling assembly of the present invention is measured microstrip line one embodiment;
Fig. 8 is the structural representation that coupling assembly of the present invention is measured another embodiment of microstrip line.
Embodiment
Below in conjunction with drawings and Examples, the present invention is described in detail.
In a preferred embodiment of the present invention, comprise coupling assembly and vector network analyzer for the data determination device of measuring scattering parameter.
Wherein, for measure the coupling assembly of scattering parameter comprise the first probe, the second probe, with the first pop one's head in the first port being connected and the second port being connected with the second probe.Wherein, the first probe and second is popped one's head in and is respectively used to be coupled the radiofrequency signal of measured piece.And the first probe and the second probe are while arranging, and the first probe and second is popped one's head in and is not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and be greater than 0 total length that is less than measured piece; Meanwhile, the first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, and the first probe and second is popped one's head in identical with the stiffness of coupling of measured piece.
In concrete application process, the first probe and the second probe can be arranged at measured piece both sides or homonymy radially.The operation wavelength of measured piece internal electrical magnetic wave can be calculated and draw according to the known correlation parameter of measured piece.
Public input port, the output port of the first probe, the second probe and measured piece form 4 port Microwave Nets.
The input port of vector network analyzer is connected with the first port or the second port, output terminal is connected with the public input port of measured piece, for measuring the public input port of 4 port Microwave Net measured piece to the retardation coefficient between transmission coefficient and the first probe and second probe of the first probe or the second probe.According to the scattering parameter of the transmission coefficient recording and retardation coefficient calculating measured piece.
In other embodiments, if vector network analyzer is multiport vector network analyzer, comprise multiple input ports, each input port is connected with the first port and the second port respectively simultaneously.
Refer to Fig. 2, Fig. 2 is the schematic flow sheet of scattering parameter measuring method one embodiment of the present invention, as shown in Figure 2, comprises the following steps:
Wherein, the acquisition pattern of retardation coefficient comprises the measurement of the vector network analyzer of electromagnetic field simulation software emulation and calibration.The acquisition pattern of transmission coefficient is the measurement of the vector network analyzer of calibration, and the transmission coefficient that adopts the vector network analyzer of calibration to measure comprises amplitude and phase place.
In the present embodiment, measured piece is a uniform transmission line, two test points are set in uniform transmission line, the first probe and the second probe are set near test point, between the first probe, the second probe and uniform transmission line, can carry out weak coupling by electric capacity or inductance, conventionally coupling magnitude is designed to be less than-20dB, to weaken the impact on uniform transmission line characteristic.
Wherein, the first probe and the second probe are not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and are greater than 0 total length that is less than measured piece; Meanwhile, the first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, and the first probe and second is popped one's head in identical with the stiffness of coupling of measured piece.In concrete application process, the first probe and the second probe can be arranged at measured piece both sides or homonymy radially.
Measure the public input port of measured piece to the retardation coefficient between transmission coefficient and the first probe and second probe of the first probe and the second probe by the vector network analyzer of calibration, the computing formula then drawing according to deriving through theory is calculated the scattering parameter of measured piece.
Refer to Fig. 3, the circuit connection diagram of one embodiment when Fig. 3 is data determination measurement device scattering parameter of the present invention, comprising: measured piece 31, the first radio-frequency joint 32, the second radio-frequency joint 33, the first probe 34, the second probe 35, vector network analyzer 36 and load 37.
Wherein, measured piece 31 comprises transmission line 311, and the transmission line 311 in the present embodiment is uniform transmission line.
The setting principle of the present embodiment is, two test points are set in uniform transmission line 311, utilization is passed through the vector network analyzer 36 of calibrating and is measured the retardation coefficient between transmission coefficient and the test point of the public input port to two of a measured piece test point, recycle corresponding computing formula, obtain the scattering parameter of test point position.
Be specially, (near the distance that reference surface b, reference surface arrange c) between the first probe 34, the second probe 35, the first probes 34 and the second probe 35 is d to 311 two test points of transmission line.
Wherein, the second radio-frequency joint 33 connects load 37.
For the more detailed measuring process of setting forth scattering parameter, describe below in conjunction with Fig. 3, Fig. 4.
Fig. 4 is schematic diagram embodiment illustrated in fig. 3, as shown in Figure 4, near uniform transmission line 311, arrange two at a distance of the first probe 34 for d and the second probe 35, wherein, d is not equal to the integral multiple of 1/2 transmission line 311 internal electrical magnetic wave operation wavelengths, and the first probe 34 and the second probe 35 are coupled by the mode of electric capacity or inductance with transmission line 311 respectively.This structure forms 4 port Microwave Nets, and wherein, port one (Port1), Port2 lay respectively at input end, the output terminal of transmission line 311, i.e. the first radio-frequency joint 32, the second radio-frequency joint 33.Port3, Port4 are connected with the first probe 34, the second probe 35 respectively.
Wherein, Port1 is public input port.
Utilize vector network analyzer 36 shown in Fig. 3 can measure transmission coefficient S31, the S41 of Port1 to Port3, Port4, and the retardation coefficient G21 of Port2 to retardation coefficient G12, the Port1 of Port1 to Port2.
As shown in Figure 4, V1, V2 are the vector voltage of the first probe 34, the second probe 35 corresponding transmission line 311 positions, and vector network analyzer 36 records as shown in Figure 3, wherein, and V1
+, V1
-incident wave voltage and the reflection wave voltage that V1 is corresponding, V2
+, V2
-incident wave voltage and the reflection wave voltage that V2 is corresponding.
Existing transmission line theory comprises as follows:
V1=V1
++V1
- （1）
V2=V2
++V2
- （2）
V1
+=V2
+×G12 （3）
V1
-=V2
-×G21 （4）
(j × A × d) is for Port2 is to the retardation coefficient of Port1, and (± j-1 opens the numerical value of radical sign, G12=1/G21 to G21=exp for j × A × d) arrive the retardation coefficient of Port2 for Port1, the propagation constant that A is uniform transmission line for G12=exp.
Associating equation (1)～(4), can obtain:
V1
-=（V2-V1×G21）/（G12-G21）
V1
+=（V2-V1×G12）/（G21-G12）
V2
-=（V1-V2×G12）/（G21-G12）
V2
+=（V2-V1×G21）/（G12-G21）
Wherein, because intercoupling between the first probe 34, the second probe 35 and transmission line 311, therefore, and S31=K × V1, S41=K × V2, wherein, K is coupling coefficient.
According to the definition of scattering parameter and above-mentioned existing theory, can try to achieve V2 position and to the reflection coefficient of load 37 directions be: S11
m=V2
-/ V2
+=-(S31-S41 × G12)/(S41-S31 × G21), impedance corresponding to V2 position is: Z0 × (1+S11
m)/(1-S11
m).In like manner, can try to achieve and can try to achieve V1 position and to the reflection coefficient of load 37 directions be: S=V1
-/ V1
+=-(S41-S31 × G21)/(S41-S31 × G12).
Refer to Fig. 5, Fig. 5 is the schematic diagram of isolation one embodiment between measurement port of the present invention, as shown in Figure 5, comprises the first transmission line 51, the second transmission line 52, the first probe 53, the second probe 54, the 3rd probe 55, the 4th probe 56 and 2 port networks.
Wherein, the input end of the first transmission line 51, output terminal connect respectively Port1, Port2, and the first probe 53, the second probe 54 connect respectively Port3, Port4.
Input end, the output terminal of the second transmission line 52 connect respectively Port5, Port6, and the 3rd probe 55, the 4th probe 56 connect respectively Port7, Port8.
Wherein, the distance between the first probe 53 and the second probe 54, the distance between the 3rd probe 55 and the 4th probe 56 is d, and d is not equal to the integral multiple of 1/2 first transmission line 51 or the second transmission line 52 operation wavelengths
Wherein, V1, V2 are respectively the vector voltage of the first probe 53, second probe 54 corresponding the first transmission line 51 positions, wherein, and V1
+, V1
-incident wave voltage and the reflection wave voltage that V1 is corresponding, V2
+, V2
-incident wave voltage and the reflection wave voltage that V2 is corresponding.
V5, V6 are respectively the vector voltage of the 3rd probe 55, the 4th probe 56 corresponding the second transmission line 52 positions, wherein, and V5
+, V5
-incident wave voltage and the reflection wave voltage that V5 is corresponding, V6
+, V6
-incident wave voltage and the reflection wave voltage that V6 is corresponding.
Schematic diagram shown in Fig. 5 can be measured the isolation between Port1 and Port5.Measuring principle is same as shown in Figure 4, through similarly deriving, can obtain:
V6
-=（V6-V5×G21）/（G12-G21）
V6
+=（V5-V6×G12）/（G21-G12）
V5
-=（V6-V5×G12）/（G21-G12）
V5
+=（V5-V6×G21）/（G12-G21）
Measure respectively transmission coefficient S31 and the S41 of public input port Port1 to Port3 and Port4, according to above-mentioned derivation and derivation embodiment illustrated in fig. 4, calculate V1
+=(S41-S31 × G12)/(G21-G12); Measure again transmission coefficient S71 and the S81 of public input port Port1 to Port7 and Port8, according to derivation, calculate V5
-=(S81-S71 × G12)/(G21-G12).According to the definition of S parameter, the isolation ISO between Prot1 and Port5
1-5=V5
-/ V1
+=(S81-S71 × G12)/(S41-S31 × G12).
Refer to Fig. 6, Fig. 6 is the schematic diagram that coupling assembly of the present invention is measured, and comprises microstrip line 61, the first probe 62, the second probe 63 and Port1, Port2, Port3, Port4.Wherein, the distance between the first probe 62 and the second probe 63 is d.
The measuring principle of popping one's head in Fig. 6 is, evenly measuring sonde 62,63, the first probes 62 being set in pairs near microstrip line 61, the second probe 63 can use etched mode to be printed on PCB.By testing public input port Port1 to the retardation coefficient between the transmission coefficient of the first probe 62, the second probe 63 and the first probe 62, the second probe 63, can calculate the scattering parameter of the first probe 62, the second probe 63 correspondence positions on even microstrip line 61.
Refer to Fig. 7, Fig. 7 is the structural representation that coupling assembly of the present invention is measured microstrip line one embodiment, comprises measured piece and measurement mechanism.
Wherein, measured piece comprises substrate 711, microstrip line 712, and measurement mechanism comprises the first probe 721, the second probe 722.
Wherein, the input end of microstrip line 712, output terminal are connected with respectively Port1, Port2, and the first probe 721, the second probe 722 are connected with respectively Port3, Port4.
In the present embodiment, even microstrip line 712, the first probe 721 and second probe 722 with characteristic impedance Z0 are produced on substrate 711 by PCB etch process, distance between probe is not equal to the integral multiple of 1/2 microstrip line 712 operation wavelengths, the first probe 721 and the second probe 722 by and microstrip line 712 between the gap equivalent capacity and the microstrip line 712 that form be coupled, formation has the 4 port Microwave Nets of Port1～Port4.
Refer to Fig. 8, Fig. 8 is the structural representation that coupling assembly of the present invention is measured another embodiment of microstrip line, comprises measured piece and measurement mechanism.
Wherein, measured piece comprises the first substrate 811 and is etched in the microstrip line 812 on the first substrate 811.
Measurement mechanism comprises the second substrate 821 and is etched in the probe of first on the second substrate 821 822 and the second probe 823.
Wherein, the input end of microstrip line 812, output terminal are connected with respectively Port1, Port2, and the first probe 822, the second probe 823 are connected with respectively Port3, Port4.
In the present embodiment, the even microstrip line 812 with characteristic impedance Z0 is produced on the first substrate 811 by PCB etch process, the first probe 822 and the second probe 823 are produced on the second substrate 821 by PCB etch process, distance between probe is not equal to the integral multiple of 1/2 microstrip line 812 operation wavelengths, the region of the second substrate 821 outside the first probe 822 and the second probe 823 removes to reduce the impact on microstrip line 812 as far as possible, the first probe 822 and the second probe 823 by and microstrip line 812 between the gap equivalent capacity and the microstrip line 812 that form be coupled, formation has the 4 port Microwave Nets of Port1～Port4.
In sum, the present invention, by place measuring sonde near measured piece, avoids being arranged on measured piece for the radio-frequency joint of connecting test cable, can in the situation that not changing measured piece duty, carry out the measurement of scattering parameter.Advantage specific as follows:
A. coupling assembly cost of manufacture is low, is applicable to being applied to the measurement of the various microwave circuit scattering parameters that adopt micro-band.
B. measuring method is simple, does not need to adopt special calibration measure, only need obtain the transmission coefficient of 4 port Microwave Nets of coupling probe and microstrip line formation.
C. can frequency measurement bandwidth, as long as being not equal to the integral multiple of 1/2 microstrip line operation wavelength, the distance of probe vertical between the axis of microstrip line can measure.
D. coupling probe uses PCB etch process, and dimensional accuracy is high, high conformity.
The foregoing is only embodiments of the invention; not thereby limit the scope of the claims of the present invention; every equivalent structure or conversion of equivalent flow process that utilizes instructions of the present invention and accompanying drawing content to do; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present invention.
Claims (11)
1. for measuring a coupling assembly for scattering parameter, it is characterized in that, comprise the first probe, the second probe, with the first pop one's head in the first port being connected and the second port being connected with the second probe;
Described the first probe, the second probe be respectively used to be coupled measured piece radiofrequency signal so that described radiofrequency signal for the measurement of scattering parameter.
2. coupling assembly according to claim 1, is characterized in that, described coupling assembly comprises the substrate for described the first probe, the second probe, the first port and the second port are set.
3. coupling assembly according to claim 2, is characterized in that, on described substrate, is provided with measured piece.
4. according to the coupling assembly described in claim 2 or 3, it is characterized in that, described the first probe and the second probe are not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and are greater than 0 total length that is less than measured piece;
Wherein, described the first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, and the first probe and second is popped one's head in identical with the stiffness of coupling of measured piece.
5. for measuring a data determination device for scattering parameter, it is characterized in that, comprise coupling assembly and vector network analyzer;
Described coupling assembly comprise the first probe, the second probe, with the first pop one's head in the first port being connected and the second port being connected with the second probe; Described the first probe, the second probe be respectively used to the to be coupled radiofrequency signal of measured piece;
Described vector network analyzer output port is for being connected with the public input port of measured piece, input port is connected with the first port or second port of described coupling assembly, for measuring the retardation coefficient between public input port to the first probe of measured piece or the second transmission coefficient of popping one's head in and the first probe and the second probe, described transmission coefficient and retardation coefficient are for the measurement of described scattering parameter.
6. for measuring a method for scattering parameter, it is characterized in that, comprise the following steps:
Measure in the 4 port Microwave Nets that the first probe, the second probe and the public input port of measured piece, output port form the public input port of measured piece to the retardation coefficient between transmission coefficient and the first probe and second probe of described the first probe, the second probe, wherein, described the first probe and the second probe are for the radiofrequency signal of the measured piece that is coupled;
According to the scattering parameter of described transmission coefficient and retardation coefficient calculating measured piece.
7. method according to claim 6, it is characterized in that, described the first probe and the second probe are not equal to respectively the integral multiple of 1/2 measured piece internal electrical magnetic wave operation wavelength perpendicular to the distance between the axis of measured piece, and are greater than 0 total length that is less than measured piece;
Wherein, described the first probe and the second probe be respectively used to the to be coupled radiofrequency signal of measured piece, and the first probe and second is popped one's head in identical with the stiffness of coupling of measured piece.
8. method according to claim 7, is characterized in that, the acquisition pattern of described retardation coefficient is the measurement of the vector network analyzer of electromagnetic field simulation software emulation or calibration.
9. method according to claim 7, is characterized in that, the acquisition pattern of described transmission coefficient is to utilize the vector network analyzer of calibration to measure, and wherein, described transmission coefficient comprises amplitude and phase place.
10. the method described according to Claim 8 or 9 any one, it is characterized in that, described the first probe is near the public input port of measured piece, equal-(S41-S31 × G21)/(S41-S31 × G12) of reflection coefficient of described the first probe corresponding measured piece position;
Equal-(S31-S41 × G12)/(S41-S31 × G21) of reflection coefficient of described the second probe corresponding measured piece position;
Wherein, S31, S41 are the transmission coefficient of radiofrequency signal from the public input port of described measured piece to described the first probe, the second probe, G12 is the retardation coefficient of radiofrequency signal from described the first probe to the second probe, and G21 is the retardation coefficient of radiofrequency signal from described the second probe to the first probe.
11. methods according to claim 10, is characterized in that, the isolation between two identical its radio-frequency (RF) signal input end mouths of 4 port Microwave Nets is (S81-S71 × G12)/(S41-S31 × G12);
Wherein, S31, S41 be in one 4 port Microwave Nets radiofrequency signal from the transmission coefficient of the public input port to two of a described measured piece probe, S81, S71 be radiofrequency signal from described one 4 port Microwave Nets the public input port of measured piece to the transmission coefficient of two probes in another 4 port Microwave Net, G12 is the retardation coefficient between described one 4 port Microwave Net probes, the corresponding probe of S31, S71 is compared with other probes in place 4 port Microwave Nets separately, apart from the close together of described public input port.
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| CN106405462A (en) * | 2016-08-30 | 2017-02-15 | 中国电子科技集团公司第十三研究所 | On-chip scattering parameter source tracing and uncertainty assessment method |
| CN106546827A (en) * | 2016-09-30 | 2017-03-29 | 中国电子科技集团公司第二十九研究所 | A kind of Pattern measurement method of phased array direction-finding device, circuit and system |
| CN110361685A (en) * | 2019-07-01 | 2019-10-22 | 北京无线电计量测试研究所 | A kind of wide-band oscilloscope probe transmission characteristic calibration method and system |
| CN112230069A (en) * | 2020-08-05 | 2021-01-15 | 北京经纬恒润科技股份有限公司 | Integrated circuit electromagnetic interference diagnostic system and method |
| CN113625055A (en) * | 2021-07-29 | 2021-11-09 | 河北师范大学 | Method for measuring composite dielectric constant of micron powder |
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