CN103728475A - 电波暗室 - Google Patents

电波暗室 Download PDF

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Publication number
CN103728475A
CN103728475A CN201210382910.1A CN201210382910A CN103728475A CN 103728475 A CN103728475 A CN 103728475A CN 201210382910 A CN201210382910 A CN 201210382910A CN 103728475 A CN103728475 A CN 103728475A
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CN
China
Prior art keywords
ferrite
length
anechoic chamber
absorbed
gap
Prior art date
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Pending
Application number
CN201210382910.1A
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English (en)
Inventor
何等乾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN201210382910.1A priority Critical patent/CN103728475A/zh
Priority to TW101138092A priority patent/TW201415038A/zh
Priority to US13/669,462 priority patent/US20140104093A1/en
Publication of CN103728475A publication Critical patent/CN103728475A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Aerials With Secondary Devices (AREA)

Abstract

一种电波暗室，包括一周壁及一顶壁，该周壁及顶壁的内表面铺设有若干正六边形的铁氧体板，这些铁氧体板紧密排列呈蜂窝状，每一铁氧体板的边长小于待吸收电磁波的波长的四分之一。所述电波暗室的铁氧体板呈正六边形，边长小于待吸收电磁波的波长的四分之一，相邻的两铁氧体板的对应边之间形成的缝隙的长度小于四分之一电磁波的长度，使大部分射入缝隙内的电磁波被吸收，提高了电波暗室的吸波率，确保测试结果的准确性。

Description

电波暗室
技术领域
本发明涉及一种电波暗室。
背景技术
电磁兼容（Electromagnetic Compatibility，EMC）测试需要使用电波暗室作为测试场地。通常电脑及手机等电子产品的电磁波频率范围一般为30MHz至1GHz(波长范围为10米至0.3米)。现有电波暗室的周壁及顶壁的内表面上通常铺设若干方形的铁氧体板，以便于吸收电磁波，但这些铁氧体板之间形成的缝隙连接起来的长度有可能大于0.075米（即大于最短波的波长的四分之一）。在进行电磁兼容测试时，部分电磁波射入这些较长的缝隙，经电波暗室周壁及顶壁的反射，再沿缝隙反射至暗室内，降低了该电波暗室的吸收率，影响测试精度。
发明内容
有鉴于此，有必要提供一种具有较高吸波率的电波暗室。
一种电波暗室，包括一周壁及一顶壁，该周壁及顶壁的内表面铺设有若干正六边形的铁氧体板，这些铁氧体板紧密排列呈蜂窝状，每一铁氧体板的边长小于待吸收电磁波的波长的四分之一。
相较现有技术，所述电波暗室的铁氧体板呈正六边形，边长小于待吸收电磁波的波长的四分之一，相邻的两铁氧体板的对应边之间形成的缝隙的长度小于四分之一电磁波的长度，使大部分射入缝隙内的电磁波被吸收，提高了电波暗室的吸波率，确保测试结果的准确性。
附图说明
图1为本发明电波暗室的较佳实施方式立体组装图。
图2为图1中的II部分的放大图。
主要元件符号说明
电波暗室 100
屏蔽室 10
测试台 30
天线 50
底壁 12
周壁 14
顶壁 16
铁氧体板 300
缝隙 302
待测物 500
如下具体实施方式将结合上述附图进一步说明本发明。
具体实施方式
请一并参阅图1及图2，本发明电波暗室100的较佳实施方式包括一屏蔽室10、一测试台30及一天线50。该屏蔽室10包括一底壁12、自该底壁12的四周向上延伸的一周壁14及一设置在周壁14的顶部的顶壁16。
该周壁14及顶壁16的内表面紧密排列若干铁氧体材料制成的铁氧体板300。每一铁氧体板300的呈正六边形，这些铁氧体板300不易连接形成较长缝隙。铁氧体板300的每一边的长度小于四分之一待吸收的电磁波的波长。因此，相邻的两铁氧体板300的对应边之间形成的缝隙302的长度小于四分之一待吸收的电磁波的波长。本实施方式中,每一铁氧体板300的边长小于7.5厘米,即缝隙302的长度也小于7.5厘米。
使用时，将一待测物500安装于该测试台30上，该待测物500正对天线50，该电波暗室100对该待测物500进行测试。待测物500发出的电磁波射入缝隙302时，由于每一缝隙302的长度小于四分之一电磁波的波长，使射入缝隙302的电磁波大部分被吸收，降低电磁波的非必要反射率，提高了电波暗室100的吸波率，确保测试结果的准确性。本实施方式中，该待测物500为电脑及手机等电子产品。
在其他实施方式中，该电波暗室100的底壁12的上表面也紧密排列若干铁氧体板300。

Claims (3)

1.一种电波暗室，包括一周壁及一顶壁，该周壁及顶壁的内表面铺设有若干正六边形的铁氧体板，这些铁氧体板紧密排列呈蜂窝状，每一铁氧体板的边长小于待吸收电磁波的波长的四分之一。
2.如权利要求1所述的电波暗室，其特征在于：每相邻的两铁氧体板的对应边之间形成一缝隙，该缝隙的长度小于四分之一待吸收的电磁波的长度。
3.如权利要求1或2所述的电波暗室，其特征在于：每一铁氧体板的边长小于7.5厘米。
CN201210382910.1A 2012-10-11 2012-10-11 电波暗室 Pending CN103728475A (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201210382910.1A CN103728475A (zh) 2012-10-11 2012-10-11 电波暗室
TW101138092A TW201415038A (zh) 2012-10-11 2012-10-16 電波暗室
US13/669,462 US20140104093A1 (en) 2012-10-11 2012-11-06 Electromagnetic anechoic chamber

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CN201210382910.1A CN103728475A (zh) 2012-10-11 2012-10-11 电波暗室

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106255397A (zh) * 2015-06-04 2016-12-21 鸿富锦精密工业(武汉)有限公司 电子装置壳体

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* Cited by examiner, † Cited by third party
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TR201516419A2 (tr) * 2015-12-19 2016-06-21 Istanbul Link Haberlesme Sanayi Ve Ticaret Ltd Sirketi Kablosuz haberleşme ci̇hazlari test i̇stasyonu

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4023174A (en) * 1958-03-10 1977-05-10 The United States Of America As Represented By The Secretary Of The Navy Magnetic ceramic absorber
US3596270A (en) * 1969-09-24 1971-07-27 Sakae Fukui Microwave absorbing wall element
US5642118A (en) * 1995-05-09 1997-06-24 Lockheed Corporation Apparatus for dissipating electromagnetic waves
SE508365C2 (sv) * 1996-11-04 1998-09-28 Ericsson Telefon Ab L M Radiotelefon med hög antenneffektivitet
US8013775B2 (en) * 2007-04-30 2011-09-06 Viasat, Inc. Radio frequency absorber
CN102269783A (zh) * 2010-06-02 2011-12-07 鸿富锦精密工业（深圳）有限公司 全电波暗室

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106255397A (zh) * 2015-06-04 2016-12-21 鸿富锦精密工业(武汉)有限公司 电子装置壳体

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TW201415038A (zh) 2014-04-16

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Application publication date: 20140416