CN103718063B - 基于铽的探测器闪烁体 - Google Patents
基于铽的探测器闪烁体 Download PDFInfo
- Publication number
- CN103718063B CN103718063B CN201280037639.6A CN201280037639A CN103718063B CN 103718063 B CN103718063 B CN 103718063B CN 201280037639 A CN201280037639 A CN 201280037639A CN 103718063 B CN103718063 B CN 103718063B
- Authority
- CN
- China
- Prior art keywords
- imaging system
- scintillator
- scintillator arrays
- array
- light output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910052771 Terbium Inorganic materials 0.000 title claims description 27
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 title description 6
- 230000005855 radiation Effects 0.000 claims abstract description 35
- 229910052684 Cerium Inorganic materials 0.000 claims abstract description 28
- 238000003384 imaging method Methods 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims abstract description 14
- 238000003491 array Methods 0.000 claims description 39
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 23
- 238000002591 computed tomography Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 3
- 210000003205 muscle Anatomy 0.000 claims description 2
- 229910010293 ceramic material Inorganic materials 0.000 claims 2
- 239000002131 composite material Substances 0.000 claims 2
- 238000011896 sensitive detection Methods 0.000 claims 1
- 239000002023 wood Substances 0.000 claims 1
- 238000007689 inspection Methods 0.000 description 22
- 230000009471 action Effects 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000005611 electricity Effects 0.000 description 2
- 238000000295 emission spectrum Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000010791 quenching Methods 0.000 description 2
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 230000002688 persistence Effects 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
- C09K11/7767—Chalcogenides
- C09K11/7769—Oxides
- C09K11/7771—Oxysulfides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
- G01T1/2023—Selection of materials
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Biochemistry (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Luminescent Compositions (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161512452P | 2011-07-28 | 2011-07-28 | |
| US61/512,452 | 2011-07-28 | ||
| PCT/IB2012/053372 WO2013014557A1 (en) | 2011-07-28 | 2012-07-03 | Terbium based detector scintillator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103718063A CN103718063A (zh) | 2014-04-09 |
| CN103718063B true CN103718063B (zh) | 2017-04-26 |
Family
ID=46545429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280037639.6A Active CN103718063B (zh) | 2011-07-28 | 2012-07-03 | 基于铽的探测器闪烁体 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9322935B2 (enExample) |
| EP (1) | EP2737340B1 (enExample) |
| JP (1) | JP6215825B2 (enExample) |
| CN (1) | CN103718063B (enExample) |
| RU (1) | RU2605518C2 (enExample) |
| WO (1) | WO2013014557A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105738939B (zh) * | 2016-04-01 | 2019-03-08 | 西安电子科技大学 | 基于碳化硅PIN二极管结构的β辐照闪烁体探测器 |
| CN115932932A (zh) * | 2022-11-03 | 2023-04-07 | 宁波虔东科浩光电科技有限公司 | 一种闪烁体探测阵列的信号处理方法及成像设备 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0235387A2 (en) * | 1985-12-30 | 1987-09-09 | General Electric Company | Radiation detector employing solid state scintillator material and preparation methods therefor |
| CN1111603A (zh) * | 1994-01-26 | 1995-11-15 | 西门子公司 | 一种半透明度高的发光材料制造方法 |
| CN101107206A (zh) * | 2004-05-17 | 2008-01-16 | 皇家飞利浦电子股份有限公司 | 荧光陶瓷及其制备方法 |
| CN101253128A (zh) * | 2005-07-25 | 2008-08-27 | 圣戈本陶瓷及塑料股份有限公司 | 稀土氧硫化物闪烁体及其生产方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3974389A (en) | 1974-11-20 | 1976-08-10 | Gte Sylvania Incorporated | Terbium-activated rare earth oxysulfide X-ray phosphors |
| JP2928677B2 (ja) * | 1991-06-21 | 1999-08-03 | 株式会社東芝 | Ｘ線検出器およびｘ線検査装置 |
| US5882547A (en) | 1996-08-16 | 1999-03-16 | General Electric Company | X-ray scintillators and devices incorporating them |
| JP3777486B2 (ja) | 1997-07-08 | 2006-05-24 | 株式会社日立メディコ | 蛍光体及びそれを用いた放射線検出器及びｘ線ｃｔ装置 |
| JP3741302B2 (ja) * | 1998-05-06 | 2006-02-01 | 日立金属株式会社 | シンチレータ |
| US7282713B2 (en) * | 2004-06-10 | 2007-10-16 | General Electric Company | Compositions and methods for scintillator arrays |
| RU2410407C2 (ru) * | 2005-04-19 | 2011-01-27 | Конинклейке Филипс Электроникс Н.В. | СПОСОБ ПОЛУЧЕНИЯ Gd2O2S:Pr С ОЧЕНЬ КРАТКОВРЕМЕННЫМ ПОСЛЕСВЕЧЕНИЕМ ДЛЯ КОМПЬЮТЕРНОЙ ТОМОГРАФИИ |
| WO2007004099A1 (en) * | 2005-07-05 | 2007-01-11 | Philips Intellectual Property & Standards Gmbh | Gd2o2s: pr for ct with a very short afterglow due to the use of yb as a scavenger for eu |
| WO2007083248A1 (en) | 2006-01-18 | 2007-07-26 | Philips Intellectual Property & Standards Gmbh | Method of making a gos ceramic using single-axis hot pressing and a flux aid |
| US20100231892A1 (en) * | 2006-08-15 | 2010-09-16 | Koninklijke Philips Electronics N. V. | Method of measuring and/or judging the afterglow in ceramic materials and detector |
| WO2008075296A2 (en) | 2006-12-20 | 2008-06-26 | Koninklijke Philips Electronics N.V. | Hot axial pressing method |
| US8294112B2 (en) | 2008-08-08 | 2012-10-23 | Koninklijke Philips Electronics N.V. | Composite scintillator including a micro-electronics photo-resist |
| EP2443656B1 (en) * | 2009-06-17 | 2018-11-07 | The Regents of the University of Michigan | Photodiode and other sensor structures in flat-panel x-ray imagers and method for improving topological uniformity of the photodiode and other sensor structures in flat-panel x-ray imagers based on thin-film electronics |
| JP2012185123A (ja) * | 2011-03-08 | 2012-09-27 | Sony Corp | 放射線撮像装置および放射線撮像装置の製造方法 |
-
2012
- 2012-07-03 RU RU2014107693/28A patent/RU2605518C2/ru not_active IP Right Cessation
- 2012-07-03 US US14/234,639 patent/US9322935B2/en active Active
- 2012-07-03 WO PCT/IB2012/053372 patent/WO2013014557A1/en not_active Ceased
- 2012-07-03 JP JP2014522175A patent/JP6215825B2/ja active Active
- 2012-07-03 EP EP12737351.2A patent/EP2737340B1/en active Active
- 2012-07-03 CN CN201280037639.6A patent/CN103718063B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0235387A2 (en) * | 1985-12-30 | 1987-09-09 | General Electric Company | Radiation detector employing solid state scintillator material and preparation methods therefor |
| CN1111603A (zh) * | 1994-01-26 | 1995-11-15 | 西门子公司 | 一种半透明度高的发光材料制造方法 |
| CN101107206A (zh) * | 2004-05-17 | 2008-01-16 | 皇家飞利浦电子股份有限公司 | 荧光陶瓷及其制备方法 |
| CN101253128A (zh) * | 2005-07-25 | 2008-08-27 | 圣戈本陶瓷及塑料股份有限公司 | 稀土氧硫化物闪烁体及其生产方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20140177783A1 (en) | 2014-06-26 |
| EP2737340A1 (en) | 2014-06-04 |
| EP2737340B1 (en) | 2019-04-24 |
| US9322935B2 (en) | 2016-04-26 |
| RU2014107693A (ru) | 2015-09-10 |
| CN103718063A (zh) | 2014-04-09 |
| WO2013014557A1 (en) | 2013-01-31 |
| JP2014529060A (ja) | 2014-10-30 |
| RU2605518C2 (ru) | 2016-12-20 |
| JP6215825B2 (ja) | 2017-10-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |