CN103716033B - A kind of method of Auto-matching multrirange switching point - Google Patents
A kind of method of Auto-matching multrirange switching point Download PDFInfo
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- CN103716033B CN103716033B CN201310717739.XA CN201310717739A CN103716033B CN 103716033 B CN103716033 B CN 103716033B CN 201310717739 A CN201310717739 A CN 201310717739A CN 103716033 B CN103716033 B CN 103716033B
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Abstract
A kind of method of Auto-matching multrirange switching point, it includes setting range initial value, completes initial range switching, the switching of control range, measurement and 5 steps of adjust automatically range switching point, a kind of method for Auto-matching multrirange switching point that the present invention is provided, range switching point can not be matched correctly when changing conventional multi-range measurement, cause easily to crash during range swithching, the method of the Auto-matching range of the present invention, Auto-matching optimal switching point improves measurement accuracy without crashing.
Description
Technical field
It is exactly specifically to be related to a kind of be used for the progress of multi-range measurement equipment the invention belongs to digital processing field
The method of Auto-matching switching point.
Background technology
At present, in many measurement occasions, the scope of measurement signal is very big, and the measurement range of A/D modulus conversion chips has
Limit, usually 0~2000mV, ensures measurement accuracy, it is necessary to carry out multrirange switching, such as to adapt to big measurement range
Shown in accompanying drawing 1, by taking two grades of ranges as an example, i.e., including x1 grades and x10 grades, MCU micro-control unit controls A/D modulus conversion chips turn
Change, carry out the switching of range automatically by A/D modulus conversion chips transformation result.Under normal circumstances, the amount of A/D modulus conversion chips
Journey scope is 0~2000mV, then preferable switching point is:In x10 grades of ranges, when A/D measured values (or conversion value)>2000mV
When be switched to x1 grades of ranges;In x1 grades of ranges, when A/D measured values (or conversion value)<X10 grades of ranges are switched to during 200mV, i.e.,
X1 grades of actual range measurement range is 200~2000mV, and x10 grades of actual range measurement range is 0~200mV.
But in actual applications, all there is error in every grade of measurement, it is impossible to matched fully according to theoretical value, it is likely that occur
Current potential is measured at x1 grades<200mV and be switched to x10 grades, x10 grades measure current potentials>2000mV switches back into x1 grades again, causes switch
Toggle, produce deadlock.General solution is to moving down, such as to be arranged on 190mV by x1 grades of switching point, but because
For in x1 grades of error 1mV, equivalent to x10 grades range 10mV, solution will cause the deterioration in accuracy of data in this.
The content of the invention
The purpose of the present invention is to be directed to existing multi-range measurement equipment during range switching is carried out due to switching
It can not be equipped with by theoretical value, reduce the technological deficiency of measurement accuracy there is provided a kind of method of Auto-matching multrirange switching point,
The optimal switching point of Auto-matching range improves measurement accuracy without crashing.
Technical scheme
In order to realize above-mentioned technical purpose, a kind of method of Auto-matching multrirange switching point of present invention design, its feature
It is, it includes following steps:
(1) two gears are set to be respectively x1 and x10 grades, it is mark A to define x1 grades of ranges, x10 grades of ranges are mark B;
The initial value variable of x1 grades of range switching points is V1, and the initial value variable of x10 grades of range switching points is V10, and x10 grades of ranges switch to mark
Will C;
(2) mark A=1 is put, range switching mark X=1 is put, initial range switching is completed;
(3) if range switching mark X=1, MCU micro-control unit will control switching range, after the completion of, remove range
Switching mark X, makes X=0;When MCU micro-control unit controls are switched to x10 grades of range, range shelves mark A=1, mark C=are put
When 1, MCU micro-control unit controls are switched to x1 grades of range, range shelves mark B=1 is put;
(4) A/D modulus conversion chip conversion output values are read, if output valve is no more than range initial value, then it represents that signal is just
Often, measure effective, this is measured, and removes x10 grades of range switching mark C, makes C=0, otherwise needs switching range, turn
Enter step 5;
(5) current range shelves mark is checked, if mark A=1, puts range switching mark X=1, be transferred to step 4 and complete
Range switches;If indicating B=1, x10 grades of range switching mark C are checked, if C=1, then it represents that repeat range switching, need
X1 grades of initial value variable Vs 1 are adjusted, reduce switching point initial value, the 4th step and the 5th step process is repeated.
Beneficial effect
A kind of method for Auto-matching multrirange switching point that the present invention is provided, range when changing conventional multi-range measurement
Switching point can not be matched correctly, cause easily to crash during range swithching, the method for Auto-matching range of the invention, Auto-matching
Optimal switching point improves measurement accuracy without crashing.
Brief description of the drawings
Accompanying drawing 1 is existing two ranges annexation schematic diagram.
Accompanying drawing 2 is the logical schematic of the present invention.
Embodiment
With reference to the accompanying drawings and examples, the present invention will be further described.
Embodiment
As shown in Figure 2, a kind of method of Auto-matching multrirange switching point, it is characterised in that it includes following
Step:
(1) two gears are set to be respectively x1 and x10 grades, it is mark A to define x1 grades of ranges, x10 grades of ranges are mark B;
The initial value variable of x1 grades of range switching points is V1, and the initial value variable of x10 grades of range switching points is V10;X10 grades of ranges switch to mark
Will C;
(2) mark A=1 is put, range switching mark X=1 is put, initial range switching is completed;
(3) if range switching mark X=1, MCU micro-control unit will control switching range, after the completion of, remove range
Switching mark X, another X=0;When MCU micro-control unit controls are switched to x10 grades of range, range shelves mark A=1, mark C=are put
When 1, MCU micro-control unit controls are switched to x1 grades of range, range shelves mark B=1 is put;
(4) A/D modulus conversion chip conversion output values are read, if output valve is no more than range initial value, then it represents that signal is just
Often, measure effective, this is measured, and removes x10 grades of range switching mark C, makes C=0, otherwise needs switching range, turn
Enter step 5;
(5) current range shelves mark is checked, if mark A=0, puts range switching mark X=1, be transferred to step 4 and complete
Range switches;If indicating B=1, x10 grades of range switching mark C are checked, represent that repeating range cuts if C=1 is indicated
Change, it is necessary to adjust x1 grades of initial value variable Vs 1, reduction switching point initial value repeats the 4th step and the 5th step process.
A kind of method for Auto-matching multrirange switching point that the present invention is provided, range when changing conventional multi-range measurement
Switching point can not be matched correctly, cause easily to crash during range swithching, the method for Auto-matching range of the invention, Auto-matching
Optimal switching point improves measurement accuracy without crashing.
Claims (1)
1. a kind of method of Auto-matching multrirange switching point, it is characterised in that it includes following steps:
(1) two gears are set to be respectively x1 and x10 grades, it is mark A to define x1 grades of ranges, x10 grades of ranges are mark B;X1 grades
The initial value variable of range switching point is V1, and the initial value variable of x10 grades of range switching points is V10;X10 grades of ranges switch to mark C;
(2) mark A=1 is put, range switching mark X=1 is put, initial range switching is completed;
(3) if range switching mark X=1, MCU micro-control unit will control switching range, after the completion of, remove range switching
Indicate X, make X=0;When MCU micro-control unit controls are switched to x10 grades of range, range shelves mark A=1, mark C=1, MCU are put
When micro-control unit controls are switched to x1 grades of range, range shelves mark B=1 is put;
(4) A/D modulus conversion chip conversion output values are read, if output valve is no more than range initial value, then it represents that signal is normal, are surveyed
Amount is effective, and this is measured, and removes x10 grades of range switching mark C, makes C=0, otherwise needs switching range, is transferred to step
5;
(5) current range shelves mark is checked, if mark A=1, puts range switching mark X=1, step 4 is transferred to and completes range
Switching;X10 grades of range switching mark C are checked if B=1 is indicated, if mark C=1, then it represents that repeat range switching, need
X1 grades of initial value variable Vs 1 are adjusted, reduce switching point initial value, the 4th step and the 5th step process is repeated.
Priority Applications (1)
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CN201310717739.XA CN103716033B (en) | 2013-12-18 | 2013-12-18 | A kind of method of Auto-matching multrirange switching point |
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CN201310717739.XA CN103716033B (en) | 2013-12-18 | 2013-12-18 | A kind of method of Auto-matching multrirange switching point |
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CN103716033A CN103716033A (en) | 2014-04-09 |
CN103716033B true CN103716033B (en) | 2017-08-11 |
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CN111090006A (en) * | 2018-10-23 | 2020-05-01 | 深圳市茁壮网络股份有限公司 | Small resistance measuring device based on weak signal |
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JP3520913B2 (en) * | 2000-06-09 | 2004-04-19 | 日本電気株式会社 | Signal line control method |
JP4859610B2 (en) * | 2006-09-29 | 2012-01-25 | 富士通セミコンダクター株式会社 | Buffer circuit and control method thereof |
CN201004072Y (en) * | 2007-02-12 | 2008-01-09 | 上海四达电子仪表有限公司 | An automatic gear conversion and range measurement circuit |
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Non-Patent Citations (1)
Title |
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自动量程转换电路设计;黄利君;《西安石油学院学报(自然科学版)》;20030331;第18卷(第2期);第63-66页 * |
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