CN103699044A - Inside test module - Google Patents
Inside test module Download PDFInfo
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- CN103699044A CN103699044A CN201310418542.6A CN201310418542A CN103699044A CN 103699044 A CN103699044 A CN 103699044A CN 201310418542 A CN201310418542 A CN 201310418542A CN 103699044 A CN103699044 A CN 103699044A
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Abstract
The invention relates to an inside test module. The inside test module comprises an NIOS II control system, an upper computer, a synchronous trigger unit, a clock unit, a digital I/O (input/ output) unit, a data acquisition unit, a communication unit and a power supply unit, wherein the upper computer is connected with the NIOS II control system through the communication unit; the synchronous trigger unit, the digital I/O unit, the data acquisition unit, the clock unit and the power supply unit are connected with the NIOS II control system respectively; the NIOS II control system comprises a download debugging module, a system configuration module, an FPGA (field programmable gate array) module and a storer; the FPGA module is connected with the download debugging module, the system configuration module and the storer respectively. The inside test module can remotely test and control equipment in real time, thus effectively reducing the equipment testing cost.
Description
Technical field
The present invention relates to a kind of checkout equipment, relating in particular to a kind ofly provides the built-in test module of detection, isolated fault and automatic test capability for complication system or device interior.
Background technology
Development along with new and high technology, the electronic equipment in military and civilian field is more and more intelligent, function is more and more polynary change also, but whether the normal operation of equipment is directly connected to the function of whole system, whether realize, even be related to national military security, thus these equipment also need intellectuality and reliably means detect and control, find fast problem place when facilitating equipment to break down, thereby reduced the expense of plant maintenance, saved servicing time.
At present, complication system or the equipment of domestic conventional military and civilian are a lot, but monitoring, control and means of testing that neither one is general, once equipment, break down, problem investigation and maintenance of equipment take time and effort very much, and some equipment is arranged on the place of high radiation or itself just has stronger radiation, and Long Term Contact may damage health.
Summary of the invention
The object of the present invention is to provide a kind of can overcome traditional testing apparatus detect numerous and diverse, versatility is poor and the easy built-in test module to defects such as human body damage.
For achieving the above object, the invention provides a kind of built-in test module, comprise NIOS II control system, host computer, synchronous trigger element, clock unit, digital I/O unit, data acquisition unit, communication unit and power supply unit; Described host computer is connected by communication unit with described NIOS II control system, and described synchronous trigger element, digital I/O unit, data acquisition unit, clock unit and power supply unit are connected with NIOS II control system respectively;
Described NIOS II control system comprises downloads debugging module, system configuration module, FPGA module and storer, and described FPGA module is connected with described download debugging module, system configuration module and storer respectively.
Described NIOS II control system is also connected with for measuring the temperature measuring unit of the temperature of described NIOS II control system.
Described data acquisition unit comprises low-speed DAQ unit and high-speed data acquisition unit.
Described communication unit comprises ethernet communication unit and inner serial communication unit.
Described storer comprises FLASH storer and SDRAM storer.
The present invention has following beneficial effect:
Built-in test module of the present invention is passed through data acquisition unit, the collection that NIOS II control system and communication unit are real-time, the parameter information of monitoring and uploading device machine, thereby realize the remote monitoring of equipment machine fault, and then reduction testing apparatus cost, spare part supply depot storage and maintenance personal's quantity, described NIOS II control system is uploaded to the running parameter information of described equipment machine in host computer by described communication unit, user can realize the observation to equipment machine by described host computer, monitoring and control, described NIOS II control system stores the running parameter information of described equipment machine in described storer into simultaneously, be convenient to the historical data that user inquires about described equipment machine running parameter.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Wherein, 1 is that NIOS II control system, 2 is that synchronous trigger element, 3 is that digital I/O unit, 4 is that clock unit, 5 is that low-speed DAQ unit, 6 is that high-speed data acquisition unit, 7 is that ethernet communication unit, 8 is that inner serial communication unit, 9 is that temperature measuring unit, 10 is power supply unit.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail:
With reference to figure 1, the present invention includes NIOS II control system 1, host computer, synchronous trigger element 2, clock unit 4, numeral I/O unit 3, data acquisition unit, communication unit and power supply unit 10, described NIOS II control system 1 is connected by communication unit with host computer, and described communication unit comprises ethernet communication unit 7 and inner serial communication unit 8, and described NIOS II control system 1 comprises download debugging module, system configuration module, FPGA module and storer, described NIOS II control system 1 comprises download debugging module, system configuration module, FPGA module and storer, described FPGA module respectively with described download debugging module, system configuration module and storer are connected, described data acquisition unit comprises low-speed DAQ unit 5 and high-speed data acquisition unit 6, described NIOS II control system 1 is connected by data acquisition unit with equipment machine, described storer comprises FLASH storer and SDRAM storer, described synchronous trigger element 2, clock unit 4, numeral I/O unit 3 is connected with described NIOS II control system 1 respectively, described power supply unit 10 respectively with described NIOSII control system 1, host computer, synchronous trigger element 2, clock unit 4, numeral I/O unit 3, data acquisition unit and communication unit are connected, and in addition, described NIOS II control system 1 is also connected with for measuring the temperature measuring unit 9 of the temperature of described NIOS II control system 1.
This course of work of the present invention is:
The present invention adopts FPGA module as key control unit, it forms basic FPGA working environment with download debugging module, system configuration module and power supply unit 10, and FLASH storer and SDRAM storer have formed NIOS II control system 1 with the working environment of FPGA.
The digital signal of described high-speed data acquisition unit 6 and low-speed DAQ unit 5 collecting device machine running parameters, and described digital signal is input in described FPGA module by AD, described FPGA module is cached to described digital signal in described FLASH storer and SDRAM storer, produce current IO clock signal simultaneously, described digital I/O unit 3 is 5VTTL level by described IO clock signal from 3.3VTTL level conversion, finally by described communication unit, described digital signal and IO clock signal are sent to host computer, described host computer receives and shows described digital signal and IO clock signal, user can be long-range at described host computer, real-time running parameter in current device machine and the historical data of described equipment machine running parameter of checking, described synchronous trigger element 2 is the trigger pip of outside input, the IO clock signal of described FPGA module output is by described synchronous trigger element 2 triggerings and described IO clock signal is carried out setting and the modification of time delay and pulsewidth on the display interface of described host computer, user can be to the setting of the time delay of described IO clock signal and pulsewidth and modification on described host computer, that the clock signal that described clock unit 4 can provide the synchronizing clock signals of outside input or crystal oscillator is carried out is phase-locked, frequency division, frequency multiplication and beam splitting, and for described high-speed data acquisition unit 6 and low-speed DAQ unit 5 provide clock signal, simultaneously also for described NIOS II control system 1 provides work clock.In addition, the temperature information that temperature measuring unit 9 gathers in described built-in test module, and described temperature information is input in described NIOS II control system 1, described NIOS II control system 1 receives described temperature information, and described temperature information is uploaded to host computer.
The effect that the present invention reaches is:
1. improve diagnosis capability.The built-in test module with the design of good level can test chip, circuit board, system faults at different levels, realizes fault detect, fault isolation robotization control accuracy is high.
2. simplified apparatus maintenance.The application of described built-in test module can reduce repair information, general purpose test equipment, spare part supply depot storage and maintenance personal's quantity in a large number.
3. flexible expansion, customizing functions.This module can be controlled the output of a plurality of IO clock signals according to input condition, signal lag can be controlled in 5ns, and can to the time delay of signal and pulsewidth, modify by host computer interface, realizes flexibly and controlling; There is multi-channel analog acquisition channel, can gather multi-signal.
4. intelligent degree is high.The operations such as the duty of module and control execution can be controlled by host computer interface completely flexibly, also can check by the waveform window at host computer interface the duty of equipment machine simultaneously.
5. equipment telemonitoring is controlled.This Realization of Product by communication unit, realize the remote monitoring of equipment being carried out to duty, and can each running parameter be arranged online and be revised, realize the Long-distance Control of equipment working state.
6. there is the storage of equipment working state monitoring result, query function.Adopt the mode of wave recurrence to inquire about equipment working state, facilitate enquiry of historical data, intuitively reflect the duty of equipment.
Claims (5)
1. a built-in test module, is characterized in that, comprises NIOS II control system (1), host computer, synchronous trigger element (2), clock unit (4), digital I/O unit (3), data acquisition unit, communication unit and power supply unit (10); Described host computer is connected by communication unit with described NIOS II control system (1), and described synchronous trigger element (2), digital I/O unit (3), data acquisition unit, clock unit (4) and power supply unit (10) are connected with NIOS II control system (1) respectively;
Described NIOS II control system (1) comprises downloads debugging module, system configuration module, FPGA module and storer, and described FPGA module is connected with described download debugging module, system configuration module and storer respectively.
2. built-in test module according to claim 1, is characterized in that, described NIOS II control system (1) is also connected with for measuring the temperature measuring unit (9) of the temperature of described NIOS II control system (1).
3. built-in test module according to claim 1, is characterized in that, described data acquisition unit comprises low-speed DAQ unit (5) and high-speed data acquisition unit (6).
4. built-in test module according to claim 1, is characterized in that, described communication unit comprises ethernet communication unit (7) and inner serial communication unit (8).
5. built-in test module according to claim 1, is characterized in that, described storer comprises FLASH storer and SDRAM storer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310418542.6A CN103699044A (en) | 2013-09-12 | 2013-09-12 | Inside test module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310418542.6A CN103699044A (en) | 2013-09-12 | 2013-09-12 | Inside test module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103699044A true CN103699044A (en) | 2014-04-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201310418542.6A Pending CN103699044A (en) | 2013-09-12 | 2013-09-12 | Inside test module |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105159270A (en) * | 2015-07-02 | 2015-12-16 | 山东超越数控电子有限公司 | Method for verifying BIT monitoring effectiveness |
| CN107798853A (en) * | 2017-10-16 | 2018-03-13 | 陕西特恩电子科技有限公司 | A kind of remote terminal tester |
| CN109828175A (en) * | 2019-03-14 | 2019-05-31 | 四川海特亚美航空技术有限公司 | A kind of electronic sequence component built-in test method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105159270A (en) * | 2015-07-02 | 2015-12-16 | 山东超越数控电子有限公司 | Method for verifying BIT monitoring effectiveness |
| CN107798853A (en) * | 2017-10-16 | 2018-03-13 | 陕西特恩电子科技有限公司 | A kind of remote terminal tester |
| CN109828175A (en) * | 2019-03-14 | 2019-05-31 | 四川海特亚美航空技术有限公司 | A kind of electronic sequence component built-in test method |
| CN109828175B (en) * | 2019-03-14 | 2021-06-01 | 四川海特亚美航空技术有限公司 | Built-in test method for electronic sequential assembly |
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Application publication date: 20140402 |