CN103698688A - Multi-continuous-chip function testing device and method for electronic clinical thermometer - Google Patents

Multi-continuous-chip function testing device and method for electronic clinical thermometer Download PDF

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Publication number
CN103698688A
CN103698688A CN201310724609.9A CN201310724609A CN103698688A CN 103698688 A CN103698688 A CN 103698688A CN 201310724609 A CN201310724609 A CN 201310724609A CN 103698688 A CN103698688 A CN 103698688A
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CN
China
Prior art keywords
many
support plate
pcb plates
probe
piece pcb
Prior art date
Application number
CN201310724609.9A
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Chinese (zh)
Inventor
张宏
Original Assignee
杭州华安医疗保健用品有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 杭州华安医疗保健用品有限公司 filed Critical 杭州华安医疗保健用品有限公司
Priority to CN201310724609.9A priority Critical patent/CN103698688A/en
Publication of CN103698688A publication Critical patent/CN103698688A/en

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Abstract

The invention discloses a multi-continuous-chip function testing device and a multi-continuous-chip function testing method for an electronic clinical thermometer. The testing device comprises a probe fixing seat arranged on a machine case, wherein multiple groups of probes are uniformly distributed on the probe fixing seat, the probes are distributed corresponding to to-be-detected signal points on a multi-continuous-chip PCB (printed circuit board), the machine case is internally provided with multiple groups of MCUs (micro control units) with the number corresponding to the number of the groups of the probes, the MCUs are connected with a computer for displaying a detecting result, a carrier plate for carrying the multi-continuous-chip PCB is also arranged above the probe fixing seat, the carrier plate is erected on the probe fixing seat through an elastic supporting mechanism, multiple through holes allowing the probes to penetrate through are formed in the carrier plate, an air cylinder is arranged above the carrier plate, and a piston rod of the air cylinder is connected with a pressing block for pressing the carrier plate downward. After the multi-continuous-chip function testing device disclosed by the invention is adopted, function testing can be performed on at least eight PCBs each time, and in addition, automatic operation is adopted, and the detecting result can be directly displayed on the computer, so that the testing efficiency and the testing accuracy are improved.

Description

How in flakes a kind of electronic thermometer device for testing functions and method
Technical field
The present invention relates to electronic thermometer technical field of measurement and test, particularly a kind of how in flakes device for testing functions and method of electronic thermometer.
Background technology
Electronic thermometer manufacture process is divided into multiple working procedure, wherein, in COB Al wire bonding operation, needs electronic thermometer to carry out one-time detection after Al wire bonding completes, and confirms that its function is normal, also can be described as the whether whole conductings of its circuit of test.
The simple frock of general use, carries out monolithic test now, and efficiency is very low.Pick-up unit after improvement and method, although can reach the object of detection, but owing to can only detect 2~4 in flakes at every turn, in testing process, need the manual fixedly pcb board of depression bar that promotes, and need to be by observing display screen and listening to the modes such as sound, whether the function of artificial judgment clinical thermometer is normal, so detection speed is slower, and efficiency is lower.
Summary of the invention
The present invention has overcome existing deficiency in above-mentioned prior art, and how in flakes a kind of electronic thermometer with high-level efficiency, pin-point accuracy that has adopted automation mechanized operation device for testing functions and method are provided.
Technical scheme of the present invention is achieved in that
How in flakes a kind of electronic thermometer device for testing functions, comprise cabinet, in cabinet upper end, be provided with a probe holder, on probe holder, be evenly distributed with the probe that many groups vertically arrange, arranging of each group probe is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, in cabinet, be provided with a plurality of quantity MCU corresponding with probe groups number, a MCU of each corresponding connection of group probe, described MCU is all connected to show the computing machine of testing result; Above probe holder, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate moving up and down, support plate stands on probe holder by elastic supporting mechanism, on support plate, be distributed with a plurality of through holes that pass for probe, above support plate, be provided with a cylinder, the piston rod of cylinder is connected with the briquetting in order to lower carrier plate.
For accurately convenient, many connecting piece PCB plates are fixed on to test position place accurately, as preferably, at support plate upper surface, be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set, on many connecting piece PCB plates, correspondence is provided with at least two jacks, and salient point is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.
As preferably, described elastic supporting mechanism comprises a plurality of columns that are distributed in support plate edge, column upper end and support plate lower surface are fixedly linked, on probe holder, correspondence is provided with a plurality of grooves in order to accommodating column, in groove, be fixed with spring, column lower end inserts in groove and is connected with spring.Support plate pressurized is pressing spring at present, when support plate pressure is cancelled, under the elastic force of spring, resets.
For fear of briquetting, be pressed onto or damage by pressure the electric elements on many connecting piece PCB plates, as preferably, on the bottom surface of briquetting, be provided with many groups in order to avoid being pressed onto the protector of the electric elements on many connecting piece PCB plates.
As preferably, every group of protector is all comprised of two cell bodies of size, between two cell bodies of size, is spaced apart 1~5mm.Protector is to design according to the structure of pcb board.
As preferably, described briquetting comprises the upper and lower pressing plate that spaced and parallel is arranged, is provided with the bakelite plate that polylith stacks between upper and lower pressing plate, and upper and lower pressing plate and bakelite plate are fastening to be fitted together, and upper and lower pressing plate is poly (methyl methacrylate) plate.Bakelite plate and the combination of upper and lower pressing plate, weight is moderate, and good insulating is non-friable, can increase the service life.
As preferably, described many connecting piece PCB plates are to be connected to form by 8~16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.Many connecting piece PCB plates are to be connected to form by polylith pcb board, after test is good, then disassembles to come and assemble respectively each electronic thermometer.
How in flakes electronic thermometer a function test method, comprises the steps: (1), many connecting piece PCB plates is positioned on the support plate of many device for testing functions in flakes, makes the signaling point on every pcb board corresponding with every group of probe location; (2), open gauge tap, make cylinder promote briquetting and press down, when contacting many connecting piece PCB plates, continues by briquetting to press down, and force support plate to move down, thus the through hole that probe is passed on support plate touches the signaling point that needs detection on many connecting piece PCB plates, and now cylinder stops action; (3), MCU starts many connecting piece PCB plates to carry out Function detection, after having detected, testing result is transferred on computing machine and is shown by USB interface; (4), operation-control switch, resets cylinder, and support plate resets under the effect of elastic supporting mechanism, now the many connecting piece PCB plates that detected is taken off, and places the many connecting piece PCB plates of next piece and repeats above-mentioned action and detect.
As preferably, in step (1), at support plate upper surface, be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set, the corresponding jack sleeve arranging on many connecting piece PCB plates can be fixed on many connecting piece PCB plates on test position accurately on salient point.
As preferably, in step (3), the software kit of operation has the display interface mating with many connecting piece PCB plates on computers, thus particular location that can the abnormal pcb board of Presentation Function.
Adopted the invention has the beneficial effects as follows of technique scheme:
Adopted after many device for testing functions in flakes of the present invention, can carry out functional test at least 8 pcb boards at every turn, and adopt automation mechanized operation, can show intuitively testing result on computers, very clear, improved the accuracy of testing efficiency and test.
Accompanying drawing explanation
Fig. 1 is the schematic diagram that proving installation of the present invention probe when external force presses down support plate is piercing in support plate;
Fig. 2 is the structural representation of pressing plate bottom surface;
Fig. 3 is the connection diagram of support plate and column;
Proving installation of the present invention probe when external force presses down support plate that Fig. 4 is another angle is piercing in the schematic diagram of support plate;
Fig. 5 for placing many connecting piece PCB plates and with the schematic diagram that probe is contacted during carrier plate with many connecting piece PCB plates under external force on support plate.
Embodiment
The specific embodiment of the present invention is as follows:
Embodiment: how in flakes a kind of electronic thermometer device for testing functions, as shown in Fig. 1~5, comprise cabinet 1, in cabinet 1 upper end, be provided with a probe holder 2, on probe holder 2, be evenly distributed with 16 groups of probes 3 that vertically arrange, be that probe 3 is vertically fixed on probe holder 2, arranging of each group probe 3 is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, and this is pre-designed; In cabinet, be provided with 16 MCU (not shown), a MCU of each group probe 3 corresponding connection, described MCU is all connected to show the computing machine (not shown) of testing result; Described many connecting piece PCB plates are to be connected to form by 16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.
Above probe holder 2, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate 4 moving up and down, support plate 4 is poly (methyl methacrylate) plate, support plate 4 stands on probe holder 2 by elastic supporting mechanism, described elastic supporting mechanism comprises a plurality of columns 5 that are distributed in support plate 4 edges, column 5 upper ends and support plate 4 lower surfaces are fixedly linked, on probe holder 2, correspondence is provided with a plurality of grooves 6 in order to accommodating column, in groove 6, be fixed with spring, column 5 lower ends are inserted in groove 6 and are connected with spring.
As shown in Figure 3, on support plate 4, be distributed with a plurality of through holes 7 that pass for probe, at support plate 4 upper surfaces, be provided with at least two salient points 11 in order to fixing many connecting piece PCB plates that pre-set, on many connecting piece PCB plates, correspondence is provided with at least two jacks (not shown), and salient point 11 is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.The position of jack and salient point also pre-sets, and only salient point need be inserted in the jack on pcb board when the time comes.
As shown in Fig. 1,4,5, above support plate 4, be provided with a cylinder 8, cylinder 8 is fixed on cylinder fixed mount 9, and cylinder fixed mount 9 lower ends are connected with cabinet 1; The piston rod of cylinder 8 is connected with to press down the briquetting 10 of many connecting piece PCB plates and support plate.
As shown in Figure 1, described briquetting 10 comprises the upper and lower pressing plate 12,13 that spaced and parallel is arranged, between upper and lower pressing plate 12,13, be provided with the bakelite plate 14 that polylith stacks, upper and lower pressing plate 12,13 and bakelite plate 14 is fastening fits together, upper and lower pressing plate 12,13 is poly (methyl methacrylate) plate.
As shown in Figure 2, on the bottom surface of briquetting 10 that is the bottom surface of lower platen 13, be provided with 16 groups in order to avoid being pressed onto the protector 15 of the electric elements on many connecting piece PCB plates.Every group of protector is all comprised of two cell bodies 16 of size, between two cell bodies 16 of size, is spaced apart 3mm.When briquetting 10 contacts with many connecting piece PCB plates, the intersection between protector and the intersection of big or small cell body are pressed onto the junction of adjacent two pcb boards in many connecting piece PCB plates, and the electric elements on many connecting piece PCB plates are hidden in protector 15 just.
Concrete testing procedure is as follows:
(1), as shown in Figure 5, many connecting piece PCB plates 17 are positioned on the support plate 4 of many device for testing functions in flakes, make the signaling point on every pcb board corresponding with every group of probe location;
(2), open gauge tap, make cylinder promote briquetting and press down, when contacting many connecting piece PCB plates 17, briquetting 10 continues to press down, and force support plate 4 to move down, thus make probe 3 through the through hole on support plate, touch the signaling point that needs detection on many connecting piece PCB plates 17, now cylinder stops action; Gauge tap has 3, and wherein 1 is that cylinder controls master switch 18, and other 2 is fixing gauge tap 19.Must be after cylinder be controlled master switch 18 and is pressed in this design, then press 2 fixedly gauge tap 19 simultaneously, cylinder 8 just can promote briquetting and presses down many connecting piece PCB plates and it is fixed.
If only adopt 1 switch to control, may occur that operator places many connecting piece PCB plates on the other hand, press on the other hand the situation of switch, can bring danger to operator like this, exist unsafe risk.In this design, adopt and press 2 fixedly gauge tap ability start-up operations simultaneously, just can prevent well above-mentioned risk
(3), probe is connected with the signal input tube pin of MCU, and MCU starts many connecting piece PCB plates to carry out Function detection, after having detected, testing result is transferred on computing machine and is shown by USB interface.
(4), operation-control switch, resets cylinder, and support plate resets under the effect of elastic supporting mechanism, now the many connecting piece PCB plates that detected is taken off, and places the many connecting piece PCB plates of next piece and repeats above-mentioned action and detect.

Claims (10)

1. electronic thermometer device for testing functions how in flakes, it is characterized in that: comprise cabinet, in cabinet upper end, be provided with a probe holder, on probe holder, be evenly distributed with the probe that many groups vertically arrange, arranging of each group probe is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, in cabinet, be provided with a plurality of quantity MCU corresponding with probe groups number, a MCU of each corresponding connection of group probe, described MCU is all connected to show the computing machine of testing result; Above probe holder, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate moving up and down, support plate stands on probe holder by elastic supporting mechanism, on support plate, be distributed with a plurality of through holes that pass for probe, above support plate, be provided with a cylinder, the piston rod of cylinder is connected with the briquetting in order to lower carrier plate.
2. a kind of electronic thermometer according to claim 1 device for testing functions how in flakes, it is characterized in that: at support plate upper surface, be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set, on many connecting piece PCB plates, correspondence is provided with at least two jacks, and salient point is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.
3. a kind of electronic thermometer according to claim 1 device for testing functions how in flakes, it is characterized in that: described elastic supporting mechanism comprises a plurality of columns that are distributed in support plate edge, column upper end and support plate lower surface are fixedly linked, on probe holder, correspondence is provided with a plurality of grooves in order to accommodating column, in groove, be fixed with spring, column lower end inserts in groove and is connected with spring.
4. how in flakes a kind of electronic thermometer according to claim 1 device for testing functions, is characterized in that: on the bottom surface of briquetting, be provided with many groups in order to avoid being pressed onto the protector of the electric elements on many connecting piece PCB plates.
5. how in flakes a kind of electronic thermometer according to claim 4 device for testing functions, is characterized in that: every group of protector is all comprised of two cell bodies of size, between two cell bodies of size, is spaced apart 1~5mm.
6. a kind of electronic thermometer according to claim 1 device for testing functions how in flakes, it is characterized in that: described briquetting comprises the upper and lower pressing plate that spaced and parallel is arranged, between upper and lower pressing plate, be provided with the bakelite plate that polylith stacks, upper and lower pressing plate and bakelite plate are fastening to be fitted together, and upper and lower pressing plate is poly (methyl methacrylate) plate.
7. how in flakes a kind of electronic thermometer according to claim 1 device for testing functions, is characterized in that: described many connecting piece PCB plates are to be connected to form by 8~16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.
8. how in flakes an electronic thermometer function test method, is characterized in that comprising the steps: (1), many connecting piece PCB plates is positioned on the support plate of many device for testing functions in flakes, makes the signaling point on every pcb board corresponding with every group of probe location; (2), open gauge tap, make cylinder promote briquetting and press down, when contacting many connecting piece PCB plates, continues by briquetting to press down, and force support plate to move down, thus the through hole that probe is passed on support plate touches the signaling point that needs detection on many connecting piece PCB plates, and now cylinder stops action; (3), MCU starts many connecting piece PCB plates to carry out Function detection, after having detected, testing result is transferred on computing machine and is shown by USB interface; (4), operation-control switch, resets cylinder, and support plate resets under the effect of elastic supporting mechanism, now the many connecting piece PCB plates that detected is taken off, and places the many connecting piece PCB plates of next piece and repeats above-mentioned action and detect.
9. a kind of electronic thermometer according to claim 8 function test method how in flakes, it is characterized in that: in step (1), at support plate upper surface, be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set, the corresponding jack sleeve arranging on many connecting piece PCB plates can be fixed on many connecting piece PCB plates on test position accurately on salient point.
10. a kind of electronic thermometer according to claim 8 function test method how in flakes, it is characterized in that: in step (3), the software kit of operation has the display interface mating with many connecting piece PCB plates on computers, thus particular location that can the abnormal pcb board of Presentation Function.
CN201310724609.9A 2013-12-16 2013-12-16 Multi-continuous-chip function testing device and method for electronic clinical thermometer CN103698688A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104777417A (en) * 2015-05-05 2015-07-15 常州信息职业技术学院 Modular PCB testing jig
CN108226703A (en) * 2016-12-22 2018-06-29 蓝思科技(长沙)有限公司 A kind of wrist-watch cover board loop circuit is without scuffing detection device

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CN203191515U (en) * 2013-04-03 2013-09-11 深圳市森力普电子有限公司 Testing tool
CN203630301U (en) * 2013-12-16 2014-06-04 杭州华安医疗保健用品有限公司 Multiple-connected-piece function testing device for electronic clinical thermometers

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Publication number Priority date Publication date Assignee Title
CN2792091Y (en) * 2005-03-15 2006-06-28 上海环达计算机科技有限公司 Circuit board cutting tool
CN201149615Y (en) * 2008-01-08 2008-11-12 福建捷联电子有限公司 Test arrangement for circuit board
US20110298630A1 (en) * 2009-08-07 2011-12-08 Advantest Corporation Test apparatus and test method
CN202075388U (en) * 2011-04-22 2011-12-14 苏州市科林源电子有限公司 ICT test fixture
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104777417A (en) * 2015-05-05 2015-07-15 常州信息职业技术学院 Modular PCB testing jig
CN108226703A (en) * 2016-12-22 2018-06-29 蓝思科技(长沙)有限公司 A kind of wrist-watch cover board loop circuit is without scuffing detection device

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Application publication date: 20140402