CN203630301U - Multiple-connected-piece function testing device for electronic clinical thermometers - Google Patents

Multiple-connected-piece function testing device for electronic clinical thermometers Download PDF

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Publication number
CN203630301U
CN203630301U CN201320863526.3U CN201320863526U CN203630301U CN 203630301 U CN203630301 U CN 203630301U CN 201320863526 U CN201320863526 U CN 201320863526U CN 203630301 U CN203630301 U CN 203630301U
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CN
China
Prior art keywords
many
probe
plate
support plate
piece
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201320863526.3U
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Chinese (zh)
Inventor
张宏
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Hangzhou Hua'an Medical & Health Instruments Co Ltd
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Hangzhou Hua'an Medical & Health Instruments Co Ltd
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Priority to CN201320863526.3U priority Critical patent/CN203630301U/en
Application granted granted Critical
Publication of CN203630301U publication Critical patent/CN203630301U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses a multiple-connected-piece function testing device for electronic clinical thermometers. The device comprises a probe fixing seat arranged on a machine case, multiple groups of probes are uniformly distributed on the probe fixing seat, arrangement of each group of the probes corresponds to signal points needing to be detected on multiple-connected-piece PCs, multiple MCUs, the number of which corresponding to the number of the probe groups, are disposed in the machine case, and the MCUs are connected to a computer for displaying detection results; and a carrying plate for carrying the multiple-connected-piece PCBs is further disposed over the probe fixing seat, the carrying plate stands on the probe fixing seat through an elastic support mechanism, a plurality of through holes for the probes to pass through are distributed in the carrying plate, an air cylinder is disposed above the carrying plate, and a piston rod of the air cylinder is connected with a pressing block for pressing the carrying plate downward. Through adoption of the multiple connected piece function testing device, a function test can be performed on at least eight PCBs once; and, through adoption of automatic operation, the detection results can be visually displayed on the computer, and testing efficiency and testing accuracy are improved.

Description

How in flakes device for testing functions of a kind of electronic thermometer
Technical field
How in flakes the utility model relates to electronic thermometer technical field of measurement and test, particularly a kind of electronic thermometer device for testing functions.
Background technology
Electronic thermometer manufacture process is divided into multiple working procedure, wherein, in COB Al wire bonding operation, needs electronic thermometer to carry out one-time detection after Al wire bonding completes, and confirms that its function is normal, also can be described as the whether whole conductings of its circuit of test.
The simple frock of general use, carries out monolithic test now, and efficiency is very low.Pick-up unit after improvement and method, although can reach the object of detection, but owing to can only detect 2~4 in flakes at every turn, in testing process, need the manual fixing pcb board of depression bar that promotes, and need to be by observing display screen and listening to the modes such as sound, whether the function of artificial judgment clinical thermometer is normal, and therefore detection speed is slower, and efficiency is lower.
Utility model content
The utility model has overcome existing deficiency in above-mentioned prior art, and how in flakes a kind of device for testing functions of the electronic thermometer with high-level efficiency, pin-point accuracy that has adopted automation mechanized operation is provided.
The technical solution of the utility model is achieved in that
How in flakes device for testing functions of a kind of electronic thermometer, comprise cabinet, be provided with a probe holder in cabinet upper end, on probe holder, be evenly distributed with the probe that many groups vertically arrange, arranging of each group probe is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, in cabinet, be provided with multiple quantity MCU corresponding with probe groups number, a MCU of each corresponding connection of group probe, described MCU is all connected to show the computing machine of testing result; Above probe holder, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate moving up and down, support plate stands on probe holder by elastic supporting mechanism, on support plate, be distributed with multiple through holes that pass for probe, above support plate, be provided with a cylinder, the piston rod of cylinder is connected with the briquetting in order to lower carrier plate.
For accurately convenient, many connecting piece PCB plates are fixed on to test position place accurately, as preferably, be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set at support plate upper surface, on many connecting piece PCB plates, correspondence is provided with at least two jacks, and salient point is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.
As preferably, described elastic supporting mechanism comprises multiple columns that are distributed in support plate edge, column upper end and support plate lower surface are fixedly linked, on probe holder, correspondence is provided with multiple grooves in order to accommodating column, in groove, be fixed with spring, column lower end inserts in groove and is connected with spring.Support plate pressurized pressing spring at present in the time that support plate pressure is cancelled, resets under the elastic force of spring.
Be pressed onto or damage by pressure the electric elements on many connecting piece PCB plates for fear of briquetting, as preferably, on the bottom surface of briquetting, be provided with many groups in order to avoid being pressed onto the protector of the electric elements on many connecting piece PCB plates.
As preferably, every group of protector is all made up of two cell bodies of size, between two cell bodies of size, is spaced apart 1~5mm.Protector is to design according to the structure of pcb board.
As preferably, described briquetting comprises the upper and lower pressing plate that spaced and parallel is arranged, is provided with the bakelite plate that polylith stacks between upper and lower pressing plate, and upper and lower pressing plate and bakelite plate are fastening to be fitted together, and upper and lower pressing plate is poly (methyl methacrylate) plate.Bakelite plate and the combination of upper and lower pressing plate, weight is moderate, and good insulating is non-friable, can increase the service life.
As preferably, described many connecting piece PCB plates are to be connected to form by 8~16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.Many connecting piece PCB plates are to be connected to form by polylith pcb board, after test is good, then disassembles to come and assemble respectively each electronic thermometer.
Adopt the beneficial effects of the utility model of technique scheme to be:
Adopt after many device for testing functions in flakes of the present utility model, can carry out functional test at least 8 pcb boards at every turn, and adopt automation mechanized operation, can show intuitively on computers testing result, very clear, improve the accuracy of testing efficiency and test.
Accompanying drawing explanation
Fig. 1 is the schematic diagram that the utility model proving installation probe in the time that external force presses down support plate is piercing in support plate;
Fig. 2 is the structural representation of pressing plate bottom surface;
Fig. 3 is the connection diagram of support plate and column;
Fig. 4 is the schematic diagram that the utility model proving installation probe in the time that external force presses down support plate of another angle is piercing in support plate;
Fig. 5 places many connecting piece PCB plates and with the schematic diagram that probe is contacted when carrier plate with many connecting piece PCB plates under external force on support plate.
Embodiment
Embodiment of the present utility model is as follows:
Embodiment: how in flakes a kind of electronic thermometer device for testing functions, as shown in Fig. 1~5, comprise cabinet 1, be provided with a probe holder 2 in cabinet 1 upper end, on probe holder 2, be evenly distributed with 16 groups of probes 3 that vertically arrange, be that probe 3 is vertically fixed on probe holder 2, arranging of each group probe 3 is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, and this is pre-designed; In cabinet, be provided with 16 MCU (not shown), a MCU of each group probe 3 corresponding connection, described MCU is all connected to show the computing machine (not shown) of testing result, computing machine is just used for showing testing result, can simply regard a display screen as, the design of its software is very simple, does not relate to the improvement of software; Described many connecting piece PCB plates are to be connected to form by 16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.
Above probe holder 2, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate 4 moving up and down, support plate 4 is poly (methyl methacrylate) plate, support plate 4 stands on probe holder 2 by elastic supporting mechanism, described elastic supporting mechanism comprises multiple columns 5 that are distributed in support plate 4 edges, column 5 upper ends and support plate 4 lower surfaces are fixedly linked, on probe holder 2, correspondence is provided with multiple grooves 6 in order to accommodating column, in groove 6, be fixed with spring, column 5 lower ends are inserted in groove 6 and are connected with spring.
As shown in Figure 3, on support plate 4, be distributed with multiple through holes 7 that pass for probe, be provided with at least two salient points 11 in order to fixing many connecting piece PCB plates that pre-set at support plate 4 upper surfaces, on many connecting piece PCB plates, correspondence is provided with at least two jacks (not shown), and salient point 11 is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.The position of jack and salient point also pre-sets, and only salient point need be inserted in the jack on pcb board when the time comes.
As shown in Fig. 1,4,5, above support plate 4, be provided with a cylinder 8, cylinder 8 is fixed on cylinder fixed mount 9, and cylinder fixed mount 9 lower ends are connected with cabinet 1; The piston rod of cylinder 8 is connected with to press down the briquetting 10 of many connecting piece PCB plates and support plate.
As shown in Figure 1, described briquetting 10 comprises the upper and lower pressing plate 12,13 that spaced and parallel is arranged, between upper and lower pressing plate 12,13, be provided with the bakelite plate 14 that polylith stacks, upper and lower pressing plate 12,13 and bakelite plate 14 is fastening fits together, upper and lower pressing plate 12,13 is poly (methyl methacrylate) plate.
As shown in Figure 2, on the bottom surface of briquetting 10 that is the bottom surface of lower platen 13, be provided with 16 groups in order to avoid being pressed onto the protector 15 of the electric elements on many connecting piece PCB plates.Every group of protector is all made up of two cell bodies 16 of size, between two cell bodies 16 of size, is spaced apart 3mm.In the time that briquetting 10 contacts with many connecting piece PCB plates, the intersection between protector and the intersection of big or small cell body are pressed onto the junction of adjacent two pcb boards in many connecting piece PCB plates, and the electric elements on many connecting piece PCB plates are hidden in protector 15 just.
Concrete testing procedure is as follows:
(1), as shown in Figure 5, many connecting piece PCB plates 17 are positioned on the support plate 4 of many device for testing functions in flakes, make the signaling point on every pcb board corresponding with every group of probe location;
(2), open gauge tap, make cylinder promote briquetting and press down, in the time that contacting many connecting piece PCB plates 17, briquetting 10 continues to press down, and force support plate 4 to move down, thus make probe 3 touch the signaling point that needs detection on many connecting piece PCB plates 17 through the through hole on support plate, now cylinder stops action; Gauge tap has 3, and wherein 1 is cylinder control master switch 18, and other 2 is fixing gauge tap 19.Must be after cylinder control master switch 18 be pressed in this design, then press 2 fixing gauge tap 19 simultaneously, cylinder 8 just can promote briquetting and presses down many connecting piece PCB plates and it is fixed.
If only adopt 1 switch to control, may occur that operator places many connecting piece PCB plates on the other hand, press on the other hand the situation of switch, can bring danger to operator like this, exist unsafe risk.In this design, adopt and press 2 fixing gauge tap ability start-up operations simultaneously, just can prevent well above-mentioned risk
(3), probe is connected with the signal input tube pin of MCU, and MCU starts many connecting piece PCB plates to carry out Function detection, after having detected, testing result is transferred on computing machine and is shown by USB interface.
(4), operation-control switch, resets cylinder, and support plate resets under the effect of elastic supporting mechanism, now the many connecting piece PCB plates that detected is taken off, and places the many connecting piece PCB plates of next piece and repeats above-mentioned action and detect.

Claims (7)

1. how in flakes device for testing functions of an electronic thermometer, it is characterized in that: comprise cabinet, be provided with a probe holder in cabinet upper end, on probe holder, be evenly distributed with the probe that many groups vertically arrange, arranging of each group probe is all corresponding with the signaling point that needs on many connecting piece PCB plates to detect, in cabinet, be provided with multiple quantity MCU corresponding with probe groups number, a MCU of each corresponding connection of group probe, described MCU is all connected to show the computing machine of testing result; Above probe holder, be also provided with one horizontally disposed in order to that carry many connecting piece PCB plates and support plate moving up and down, support plate stands on probe holder by elastic supporting mechanism, on support plate, be distributed with multiple through holes that pass for probe, above support plate, be provided with a cylinder, the piston rod of cylinder is connected with the briquetting in order to lower carrier plate.
2. how in flakes device for testing functions of a kind of electronic thermometer according to claim 1, it is characterized in that: be provided with at least two salient points in order to fixing many connecting piece PCB plates that pre-set at support plate upper surface, on many connecting piece PCB plates, correspondence is provided with at least two jacks, and salient point is inserted in jack and many connecting piece PCB plates can be fixed on test position accurately.
3. how in flakes device for testing functions of a kind of electronic thermometer according to claim 1, it is characterized in that: described elastic supporting mechanism comprises multiple columns that are distributed in support plate edge, column upper end and support plate lower surface are fixedly linked, on probe holder, correspondence is provided with multiple grooves in order to accommodating column, in groove, be fixed with spring, column lower end inserts in groove and is connected with spring.
4. how in flakes a kind of electronic thermometer according to claim 1 device for testing functions, is characterized in that: on the bottom surface of briquetting, be provided with many groups in order to avoid being pressed onto the protector of the electric elements on many connecting piece PCB plates.
5. how in flakes a kind of electronic thermometer according to claim 4 device for testing functions, is characterized in that: every group of protector is all made up of two cell bodies of size, between two cell bodies of size, is spaced apart 1~5mm.
6. how in flakes device for testing functions of a kind of electronic thermometer according to claim 1, it is characterized in that: described briquetting comprises the upper and lower pressing plate that spaced and parallel is arranged, between upper and lower pressing plate, be provided with the bakelite plate that polylith stacks, upper and lower pressing plate and bakelite plate are fastening to be fitted together, and upper and lower pressing plate is poly (methyl methacrylate) plate.
7. how in flakes a kind of electronic thermometer according to claim 1 device for testing functions, is characterized in that: described many connecting piece PCB plates are to be connected to form by 8~16 pcb boards, and probe groups number, MCU number are all corresponding with the quantity of pcb board.
CN201320863526.3U 2013-12-16 2013-12-16 Multiple-connected-piece function testing device for electronic clinical thermometers Expired - Fee Related CN203630301U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320863526.3U CN203630301U (en) 2013-12-16 2013-12-16 Multiple-connected-piece function testing device for electronic clinical thermometers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320863526.3U CN203630301U (en) 2013-12-16 2013-12-16 Multiple-connected-piece function testing device for electronic clinical thermometers

Publications (1)

Publication Number Publication Date
CN203630301U true CN203630301U (en) 2014-06-04

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201320863526.3U Expired - Fee Related CN203630301U (en) 2013-12-16 2013-12-16 Multiple-connected-piece function testing device for electronic clinical thermometers

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103698688A (en) * 2013-12-16 2014-04-02 杭州华安医疗保健用品有限公司 Multi-continuous-chip function testing device and method for electronic clinical thermometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103698688A (en) * 2013-12-16 2014-04-02 杭州华安医疗保健用品有限公司 Multi-continuous-chip function testing device and method for electronic clinical thermometer

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GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140604

Termination date: 20191216