CN103675575A - System and method for testing tested board card through single short dot group - Google Patents
System and method for testing tested board card through single short dot group Download PDFInfo
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- CN103675575A CN103675575A CN201210347995.XA CN201210347995A CN103675575A CN 103675575 A CN103675575 A CN 103675575A CN 201210347995 A CN201210347995 A CN 201210347995A CN 103675575 A CN103675575 A CN 103675575A
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Abstract
A system and method for testing a tested board card through a single short dot group are provided. A short dot group is predicted through an entity element of a standard board card, and a technological means of using the short dot group to test the tested board card is used after the short dot group is verified by the standard board card, so that the testing times in a short circuit test of an open circuit are reduced, and the technical effect of increasing the execution speed of the short circuit test of the open circuit is achieved.
Description
Technical field
The present invention relates to a kind of board testing system and method thereof, relate in particular to a kind of system and method thereof of using single short dot group to test tested board.
Background technology
After circuit board is created by production line, in order to ensure the quality of circuit board, conventionally can, to carrying out various tests by the produced circuit board of production line, for example, use circuit board testing instrument (In-Circuit Tester, ICT) testing circuit board.
Circuit board testing instrument can be with two stage testing circuit boards, first stage is open circuit short-circuit test (open/short test), in the first stage, whether the circuit on circuit board testing instrument meeting testing circuit board is correct, then, in subordinate phase, each element on the confirmation circuit board that circuit board testing instrument just can be detailed can correctly operate.
In fact, open circuit short-circuit test is the important step of circuit board testing instrument test circuit board, reason is that circuit board testing appliance requires is avoided because abnormal open circuit and/or the short circuit on circuit board, cause when each element on circuit board carries out DCO, judge the incorrect running of each element by accident.Wherein, in order to accelerate the speed of circuit board testing instrument test circuit board, the key index of open circuit short-circuit test is fast with accurate.
In open circuit short-circuit test, the measurement point on circuit board can be divided into a plurality of short dot group at present, wherein, be short circuit between any measurement point in each short dot group, and the measurement point in different short dot group can not be thought short circuit.For the measurement point that will meet in different short dot group is not the condition of short circuit, open circuit short-circuit test need to be tested the combination of all two measurement points, like this, when measurement point quantity on circuit board is very many, the testing time that carries out of open circuit short-circuit test can be very height, cause the increase of the time of open circuit short-circuit test.
In sum, since known prior art is medium-term and long-term, there is the too high problem of testing time in open circuit short-circuit test always, be therefore necessary to propose improved technological means, solve this problem.
Summary of the invention
Because prior art exists the too high problem of testing time in open circuit short-circuit test, the present invention discloses a kind of system and method thereof of using single short dot group to test tested board then, wherein:
The system that the single short dot of the disclosed use of the present invention group tests tested board, at least comprises: analysis module, and each solid element prediction short dot group in order on establishing criteria board, comprises a plurality of measuring positions in short dot group; Study module, on validation criteria board, whether short circuit between the confirmatory measurement point corresponding with measuring position respectively, and revise short dot group according to the result, and in order on testing standard board, not whether short circuit between the confirmatory measurement point corresponding with measuring position, and revise short dot group according to test result; Test module, in order to verify on tested board, whether short circuit between the thermometrically point corresponding with each measuring position in amended short dot group respectively, and in order to test between all thermometrically points on tested board whether short circuit, and after obtaining respectively this thermometrically point of short circuit, according to the thermometrically point being obtained, judge whether to exist abnormal short dot.
The method that the single short dot of the disclosed use of the present invention group tests tested board, its step at least comprises: the solid element prediction short dot group on establishing criteria board, comprises measuring position in short dot group; On validation criteria board, whether short circuit between the confirmatory measurement point corresponding with measuring position respectively, and revise short dot group according to the result; On testing standard board, not whether short circuit between the confirmatory measurement point corresponding with measuring position, and revise short dot group according to test result; Verify on tested board whether short circuit between the thermometrically point corresponding with measuring position in amended short dot group respectively; Test between all thermometrically points on tested board whether short circuit, and obtain the thermometrically point of short circuit; According to the thermometrically point being obtained, judge whether to exist abnormal short dot.
The disclosed System and method for of the present invention as above, and the difference between prior art is that the present invention passes through the solid element prediction Yi Ge short dot group with standard board, and after the standard of use board checking short dot group, use short dot group to test tested board, solve thus the existing problem of prior art, and can reach the technique effect of the execution speed that improves open circuit short-circuit test.
Accompanying drawing explanation
Fig. 1 is the system architecture diagram that the single short dot of use group proposed by the invention tests tested board.
Fig. 2 A is the method flow diagram that the single short dot of use group proposed by the invention tests tested board.
Fig. 2 B is the method flow diagram of the testing time of minimizing confirmatory measurement point proposed by the invention.
Fig. 2 C is the addition method process flow diagram of the corresponding information of output proposed by the invention.
Fig. 2 D is the detailed method process flow diagram of the thermometrically point of judgement short circuit proposed by the invention.
Critical piece Reference numeral:
110 analysis modules
120 study modules
130 test modules
140 output modules
170 storage modules
180 computing modules
Solid element prediction short dot group on step 210 establishing criteria board, comprises measuring position in short dot group
On step 220 validation criteria board, whether short circuit between the confirmatory measurement point corresponding with measuring position respectively, and revise short dot group according to the result
On step 230 testing standard board, not whether short circuit between the confirmatory measurement point corresponding with measuring position, and revise short dot group according to test result
Step 231 is divided into groups confirmatory measurement point
Step 233 is calculated the theoretical resistance between each grouping
Step 235 is measured the actual resistance between each grouping
Step 239 is when the difference of theoretical resistance and actual resistance meets preset value, and it is short circuit that judgement difference meets between the confirmatory measurement point that the grouping of preset value comprises
On the tested board of step 250 checking, whether short circuit between the thermometrically point corresponding with measuring position in amended short dot group respectively
The difference of step 264 computation and measurement value and resistance value
The corresponding information of step 268 output
Whether short circuit between all thermometrically points on the tested board of step 280 test, and obtain the thermometrically point of short circuit
The grouping of each row that step 283 comprises according to hot-wire array produces a plurality of trooping
Step 287 is according to the row of the resistance value judgement short circuit between the grouping of two in trooping
Embodiment
Below with reference to drawings and Examples, describe feature of the present invention and embodiment in detail, content is enough to make those skilled in the art can fully understand easily the applied technological means of technical solution problem of the present invention and implement according to this, realizes thus the attainable technique effect of the present invention.
The present invention can be after the short dot group (short group) of prediction standard board (golden board), on standard board, learn (learning), and revise short dot group according to learning outcome, then, use the amended short dot group pair Board Under Test card corresponding with standard board to test, use thus less testing time, correct judge on tested board, whether have abnormal short circuit (short) or open circuit (open).Wherein, standard board comprises a plurality of confirmatory measurement points, comprises the thermometrically point of equal number on tested board, and standard board the confirmatory measurement point comprising and the thermometrically point that tested board comprises have man-to-man corresponding relation.
" the short dot group " that proposed in the present invention comprises measuring position, each measuring position in short dot group all can correspond to the different confirmatory measurement points (nail) on standard board, similarly, each measuring position also corresponds to respectively the different thermometrically points on tested board.In addition, between the two confirmatory measurement points corresponding with any two measuring positions difference, must be short circuit.
What is particularly worth mentioning is that, in the present invention, with resistance value, to carry out the judgement of short circuit and open circuit, when the resistance value between two measurement points is during lower than short circuit threshold value, just define between this two measurement point is short circuit, and when the resistance value between two measurement points is higher than open circuit during threshold value, just defining between this two measurement point is open circuit.Wherein, measurement point can be confirmatory measurement point or thermometrically point, and in addition, short circuit threshold value is generally 3 ohm, and open circuit threshold value is 1000 ohm, but the present invention is not as limit.
The system architecture diagram that following elder generation tests tested board with the single short dot of Fig. 1 use proposed by the invention group illustrates System Operation of the present invention.As shown in Figure 1, system of the present invention contains analysis module 110, study module 120 and test module 130.
In order to add piece verifying speed, in the embodiment of part, study module 120 can be by all confirmatory measurement point groupings on standard board, and the confirmatory measurement of the same grouping of short circuit point, then, the circuit structure on establishing criteria plate, calculates respectively the theoretical resistance between each grouping.Then, measure respectively the actual resistance between each grouping, and judgement each grouping between theoretical resistance and the difference of actual resistance whether meet preset value, when the difference of the theoretical resistance between a certain grouping and actual resistance meets preset value, study module 120 can judge that it is short circuit that difference meets between the confirmatory measurement point that the grouping of preset value comprises.For example, study module 120 can be divided into A by 20 confirmatory measurement points, B, C, tetra-groups of D, in every group, there are five confirmatory measurement points, and five confirmatory measurement points in each grouping of short circuit, making any 2 confirmatory measurement points in same grouping is all short circuit, then, study module 120 can first be measured A grouping and B grouping, C grouping, actual resistance between D grouping, then measure B group and C grouping, actual resistance between D grouping, and the actual resistance between measurement C grouping and D grouping, and after measuring actual resistance, theoretical resistance and measured actual resistance are compared, judge thus A, B, C, D tetra-grouping comprise confirmatory measurement point between whether have short circuit.
In order to reduce the number of times of test, in the embodiment of part, test module 130 can be set up cycle tests (test sequence) according to all thermometrically points on tested board, and set up hot-wire array according to cycle tests, again hot-wire array is divided into two groupings that quantity is identical with behavior unit, and grouping again, until it is identical with previous arbitrary grouping to separate each comprised row combination, then, measure the resistance value between two groupings that each time separate, and according to the row of the measurement result judgement short circuit of resistance value, and then the resistance value of the corresponding thermometrically point of row of measurement short circuit, according to the resistance value of measuring, judge between each thermometrically point on tested board whether be short circuit thus.
For example, if test module 130 is set up the matrix of MxN using the thermometrically point on tested board as corresponding element, then, after M the corresponding thermometrically point of element that test module 130 can comprise at each row of short circuit, it is two groupings that each row is divided equally, namely each grouping has N/2 capable, and all row of the same grouping of short circuit, after namely making to be short circuit in the ranks with any two of grouping, measure the resistance value between two groupings, wherein, two groupings that separated are called as one " trooping " in the present invention.Then, again each row being divided equally is two groupings, each row combination that each grouping this time separating comprises is by can not be identical with previous arbitrary grouping, and all row of the same grouping of short circuit after grouping, and the resistance value between these two groupings that separate of measurement, until cannot separate different groupings, so, test module 130 can separate C and troop.For example, when matrix has 6 row (N=6), altogether can separate with the 1st, 2, 3 one of behavior groupings with the 4th, 5, another grouping of 6 behaviors (follow-up will be with " 123, 456 " mode is illustrated in one and troops, the combination of each row of two groupings), with the 2nd, 3, 4 one of behavior groupings with the 5th, 6, another grouping (" 234 of 1 behavior, 561 "), and with the 3rd, 4, 5 one of behavior groupings with the 6th, 1, another grouping (" 345 of 2 behaviors, 612 ") etc. three troop (C=3), namely test module 130 can be tested three resistance values, judge thus three whether short circuits of trooping.
Above-mentioned each in the ranks whether the test process of short circuit there are two specific characters:
The first, when x capable when the y behavior short circuit, the absolute value that the quantity of the grouping that test result is short circuit is x-y (| x-y|).The example that the above-mentioned N of take is 6, when the 1st row and the 3rd row short circuit, by there being two test results of trooping, it is short circuit, respectively the 1st row and the 3rd row trooping " 234,561 " and troop " 345,612 " in different grouping, and when the 1st row and the 2nd row short circuit, by only having a test result of trooping, be short circuit, namely the 1st row and the 3rd row are in troop " 234,561 " of different grouping.
Second, if only having a test result of trooping is short circuit, and other test results of trooping are all open circuits, two specific row that belong to different grouping during to be short circuit in test result troop and belong to same packets during to be open circuit in test result trooping are short circuit.The example that the above-mentioned N of take is 6, if only troop, the test result of " 123,456 " is short circuit, troop " 234,561 " with troop " 345,612 " test result for open circuit, because to only have the 1st row and the 6th row and the 3rd row and the 4th row be short circuit in test result, belong to different grouping in trooping and be to belong to same packets in trooping of opening a way in test result, therefore, represent the 1st row and the 6th row short circuit or the 3rd row and the 4th row short circuit.
According to above-mentioned two characteristics, when each test result of trooping is all short circuit, only need the test number of times identical with the number of trooping (C) just can know that in matrix, wantonly two provisional capitals are short circuits, when only having a test result of trooping to be short circuit, only need survey again once, namely altogether test C+1 time, just can know which two row in matrix are short circuits.
And when the number of trooping is greater than three (C>3) and have 2 to C-1 to troop for short circuit, need to be in trooping of open circuit test result, after belonging to the row combination of two of different grouping, add in queue, and during to be short circuit test result troop, after belonging to the row combination of two of different grouping, add in another one queue, then remove the combination repeating in two queues, so, remaining combination is the target that needs test.For example, when the matrix of MxN has 8 row (N=8), can be divided into " 1234, 5678 ", " 2345, 6781 ", " 3456, 7812 ", " 4567, 8123 " four troop (C=4), wherein, if troop " 2345, 6781 " with troop " 3456, when test result 7812 " is short circuit, test module 130 can will troop " 1234, 5678 " the first row of different grouping and fifth line in (follow-up the mode with " 15 " is represented), " 16 ", " 17 ", " 18 ", " 25 ", " 26 ", " 27 ", " 28 ", " 35 ", " 36 ", " 37 ", " 38 ", " 45 ", " 46 ", " 47 ", the two row combinations of " 48 ", and troop " 4567, 8123 " in " 48 " of different grouping, " 41 ", " 42 ", " 43 ", " 58 ", " 51 ", " 52 ", " 53 ", " 68 ", " 61 ", " 62 ", " 63 ", " 78 ", " 71 ", " 72 ", the two row combinations of " 73 " add in the first queue, and will troop " 2345, 6781 " with troop " 3456, 7812 " in " 26 " of different grouping, " 27 ", " 28 ", " 12 ", " 36 ", " 37 ", " 38 ", " 13 ", " 46 ", " 47 ", " 48 ", " 14 ", " 56 ", " 57 ", " 58 ", " 15 " and " 37 ", " 38 ", " 13 ", " 23 ", " 47 ", " 48 ", " 14 ", " 24 ", " 57 ", " 58 ", " 15 ", " 25 ", " 67 ", " 68 ", " 16 ", the two row combinations of " 26 " add in the second queue, wherein, and owing to all comprising " 15 " in the first queue and the second queue, " 16 ", " 25 ", " 26 ", " 27 ", " 28 ", " 36 ", " 37 ", " 38 ", " 46 ", " 47 ", the two row combinations of " 48 ", so after the two row combinations that repeat in test module 130 is deleted two queues, " 17 " are left in the first queue, " 18 ", " 35 ", " 45 " four two row combinations, " 12 " are left in the second queue, " 13 ", " 14 ", " 56 ", " 57 ", " 58 " six two row combinations, therefore, test module 130 can carry out the test of resistance value to ten remaining two row combinations of the first queue and the second queue, and two row that just can find out short circuit combine.
In addition, the present invention can also comprise attached output module 140, storage module 170 and computing module 180.
The difference of measured measured value when computing module 180 is responsible for calculating between the stored resistance value of storage module 170 and all thermometrically points of test module 130 on testing tested board whether short circuit, wherein, measure the confirmatory measurement point of the resistance value that is used to calculated difference corresponding with the thermometrically point of measuring the measured value that is used to calculated difference.When any one difference calculating when computing module does not meet preset value, output module 140 can be exported corresponding information.Generally speaking, the corresponding information that output module 140 is exported comprises the information that difference does not meet the thermometrically point of preset value, but the present invention is not as limit.
Then with an embodiment, explain orally operation system of the present invention and method, and please refer to the method flow diagram that the single short dot of Fig. 2 A use proposed by the invention group tests tested board.
When using the present invention to open a way short-circuit test, can carry out three phases, by analysis module 110, study module 120 and test module 130, undertaken respectively.
After the solid element prediction short dot group (step 210) of analysis module 110 establishing criteria boards, study module 120 can validation criteria board on, with the whether short circuit between corresponding confirmatory measurement point respectively of each measuring position, and according to the result modification short dot group (step 220).And then, study module 120 can testing standard board on, not whether short circuit between the confirmatory measurement point corresponding with measuring position, and according to test result modification short dot group (step 230).
Wherein, whether study module 120 is on testing standard board between not corresponding with measuring position confirmatory measurement point during short circuit, can be as shown in the flow process of Fig. 2 B, by confirmatory measurement point grouping (step 231) not corresponding with measuring position on standard board, and according to the wiring in the CAD (computer aided design) shelves of standard board, calculate respectively the theoretical resistance (step 233) between each grouping, afterwards, measure respectively the actual resistance (step 235) between each grouping, and theoretical resistance of each grouping of calculating respectively and the difference of actual resistance, when existing the theoretical resistance of a certain grouping and the difference of actual resistance to meet preset value, for example, when difference is greater than preset value, judge between the confirmatory measurement point that this grouping comprises to be short circuit (step 239).
Then get back to Fig. 2 A, whether short circuit between not corresponding with measuring position confirmatory measurement point on study module 120 testing standard boards, and revise after short dot group (step 230) according to test result, test module 130 can verify on tested board, whether short circuit (step 250) between the thermometrically point corresponding with measuring position in amended short dot group respectively.
When test module 130, verify produced the result and represent to exist in thermometrically point two during for short circuit, represent to exist extremely and open a way on tested board, if comprise in the present embodiment output module 140, output module 140 can output open circuit information (step 270).
In addition, if comprise storage module 170 and computing module 180 in the present embodiment, as shown in the flow process of Fig. 2 C, storage module 170 can confirmatory measurement point not corresponding with measuring position on study module 120 testing standard boards between whether short circuit, and revise after short dot group (step 230) according to test result, while storing between confirmatory measurement point not corresponding with measuring position on study module 120 testing standard boards whether short circuit, measure the resistance value (step 240) between each confirmatory measurement point.
Then, computing module 180 can calculate the difference (step 264) of the stored resistance value of storage module 170 and obtained measured value.Wherein, it is identical with the corresponding measuring position of thermometrically value of measuring the measured value that computing module calculated difference used that the confirmatory measurement of measuring the resistance value that computing module calculated difference used is put corresponding measuring position.
After the difference (step 264) of computing module 180 calculated resistance values and measured value, can judge whether each calculated difference meets preset value, for example difference is less than preset value, when the difference calculating when computing module 180 does not meet preset value, represent that the raw material that raw material that tested board is used and standard board use is different, if comprise output module 140 in the present embodiment, output module 140 can be exported corresponding information (step 268).
Continue to get back to Fig. 2 A, equally on the tested board of test module 130 checking respectively between the thermometrically point corresponding with measuring position in short dot group whether after short circuit (step 250), test module 130 can be tested between all thermometrically points on tested board whether short circuit, and obtains the thermometrically point (step 280) of short circuit.
Wherein, test module 130 can be as shown in the flow process of Fig. 2 D, according to all thermometrically points on tested board, set up cycle tests, and according to the cycle tests set up, set up the hot-wire array (step 282) of MxN, the capable various combinations of N that comprise according to hot-wire array are again divided into groups, until cannot separate each row combination that grouping comprises not with identical with the combination of grouping, produce thus a plurality of troop (steps 283).
Then, test module 130 can be measured the resistance value between two groupings that each time separate, and according to the row (step 287) of the measurement result judgement short circuit of resistance value, and then measure the resistance value between the corresponding thermometrically point of the element comprise with the row of judged short circuit, according to the resistance value of measuring, judge between each thermometrically point on tested board whether be short circuit (step 289) thus, so, test module 130 just can be obtained the thermometrically point of short circuit.
By above-mentioned known, the present invention only uses single short dot group, so do not need to consider between a plurality of short dot group can not short circuit situation, so can reduce the number of times of test short dot, therefore, the present invention can use compared with prior art testing time still less and complete the open circuit short-circuit test to tested board.
In sum, difference between known the present invention and prior art is to have the solid element prediction Yi Ge short dot group with standard board, and after the standard of use board checking short dot group, the technological means of using short dot group to test tested board, by this technological means, can solve the too high problem of testing time in the existing existing open circuit short-circuit test of background technology, and then reach the technique effect of the execution speed that improves open circuit short-circuit test.
Moreover, the method that the single short dot of use of the present invention group tests tested board, can be implemented in the combination of hardware, software or hardware and software, also can in computer system, with centralized system, realize or intersperse among with different elements the dispersing mode realization of some interconnected computer systems.
Although the disclosed embodiment of the present invention as above, yet described content is not in order to direct restriction scope of patent protection of the present invention.Any those skilled in the art are not departing under the prerequisite of the disclosed spirit and scope of the present invention, to doing some in the formal and details of enforcement of the present invention, change retouching, all belong to scope of patent protection of the present invention.Scope of patent protection of the present invention, still must be construed as limiting and be as the criterion with appending claims.
Claims (10)
1. the method that the single short dot of use group tests tested board, is characterized in that, the method at least comprises the following step:
Each solid element prediction short dot group on establishing criteria board, comprises a plurality of measuring positions in this short dot group;
Verify on this standard board, whether short circuit between the confirmatory measurement point corresponding with this measuring position respectively respectively, and revise this short dot group according to the result;
Test on this standard board, whether short circuit between not corresponding with these measuring positions confirmatory measurement point, and revise this short dot group according to test result;
Verify on tested board whether short circuit between the thermometrically point corresponding with each measuring position in this amended short dot group respectively;
Test between all thermometrically points on this tested board whether short circuit, and obtain respectively this thermometrically point of short circuit; And
The thermometrically point being obtained according to these judges whether to exist at least one abnormal short dot.
2. the method that the single short dot of use as claimed in claim 1 group tests tested board, it is characterized in that, test between all thermometrically points on this tested board the step of whether short circuit for to set up after hot-wire array with these thermometrically points, the grouping of each row comprising according to this hot-wire array produces a plurality of trooping, respectively this is trooped and comprises two groupings, the row that respectively this grouping comprises half quantity in this hot-wire array, and the combination of these row that respectively this grouping comprises is different, thus according to the row of the resistance value judgement short circuit between this this two grouping in trooping respectively, and according to respectively whether short circuit between this thermometrically point of the corresponding respectively resistance value between this thermometrically point judgement of the row of short circuit.
3. the method that the single short dot of use as claimed in claim 1 group tests tested board, it is characterized in that, the method is on this standard board of checking, the step of short circuit and on this standard board of test whether between the confirmatory measurement point corresponding with this measuring position respectively respectively, between not corresponding with these measuring positions confirmatory measurement point, whether after the step of short circuit, also comprise the step that stores the resistance value between each confirmatory measurement point.
4. the method that the single short dot of use as claimed in claim 3 group tests tested board, it is characterized in that, this step of testing between all thermometrically points on this tested board whether short circuit also comprises measures the step of putting the measured value between corresponding thermometrically point with this confirmatory measurement respectively, and the method is after measuring the step of the measured value between these thermometrically points, also comprise calculating respectively this measured value and the step of the difference of this resistance value respectively.
5. the method that the single short dot of use as claimed in claim 1 group tests tested board, it is characterized in that, this is tested on this standard board, between not corresponding with these measuring positions confirmatory measurement point, the step of short circuit also comprises after these confirmatory measurement point groupings, calculate the theoretical resistance between each grouping, and the actual resistance between each grouping of measurement, and in this theoretical resistance respectively when respectively the difference of this actual resistance meets preset value, it is the step of short circuit that judgement difference meets between the confirmatory measurement point that the grouping of this preset value comprises.
6. the system that the single short dot of use group tests tested board, is characterized in that, this system at least comprises:
Analysis module, each solid element prediction short dot group in order on establishing criteria board, comprises a plurality of measuring positions in this short dot group;
Study module, in order to verify on this standard board, whether short circuit between the confirmatory measurement point corresponding with this measuring position respectively respectively, and revise this short dot group according to the result, and in order to test on this standard board, whether short circuit between not corresponding with these measuring positions confirmatory measurement point, and revise this short dot group according to test result; And
Test module, in order to verify on tested board, whether short circuit between the thermometrically point corresponding with each measuring position in this amended short dot group respectively, and in order to test between all thermometrically points on this tested board whether short circuit, and after obtaining respectively this thermometrically point of short circuit, the thermometrically point being obtained according to these judges whether to exist at least one abnormal short dot.
7. the system that the single short dot of use as claimed in claim 6 group tests tested board, it is characterized in that, this test module is to produce a plurality of trooping after setting up hot-wire array with these thermometrically points, respectively this is trooped and comprises two groupings, the row that respectively this grouping comprises half quantity in this hot-wire array, and the combination of these row that respectively this grouping comprises is different, thus according to the row of the resistance value judgement short circuit between these two groupings of trooping respectively, and judge the respectively whether short circuit between this thermometrically point on this tested board according to the corresponding respectively resistance value between this thermometrically point of row of short circuit.
8. the system that the single short dot of use as claimed in claim 6 group tests tested board, is characterized in that, this system also comprises:
Storage module, in order to store the respectively resistance value between this confirmatory measurement point;
Computing module, puts after each measured value between corresponding thermometrically point in order to measure at this test module with this confirmatory measurement respectively, and calculating is this resistance value and the difference of this measured value respectively respectively; And
Output module, in order to when these differences do not meet preset value, exports corresponding information.
9. the system that the single short dot of use as claimed in claim 6 group tests tested board, it is characterized in that, this analysis module be according in these solid element in the Bill of Material (BOM) shelves of this standard board and CAD (computer aided design) shelves respectively the distributing position of this solid element predict this short dot group.
10. the system that the single short dot of use as claimed in claim 6 group tests tested board, it is characterized in that, this study module is by these confirmatory measurement point groupings, calculate the theoretical resistance between each grouping, measure the actual resistance between each grouping, and the difference of theoretical resistance and actual resistance between each grouping of judgement is while meeting preset value, it is short circuit that judgement difference meets between the confirmatory measurement point that the grouping of this preset value comprises.
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| CN113030704A (en) * | 2021-03-11 | 2021-06-25 | 山东英信计算机技术有限公司 | Mainboard test equipment, method and system and readable storage medium |
| CN113109694A (en) * | 2021-04-12 | 2021-07-13 | 北京电子工程总体研究所 | Method for detecting and positioning short circuit point of circuit board |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106226637A (en) * | 2016-08-04 | 2016-12-14 | 深圳市燕麦科技股份有限公司 | A kind of Short method of testing |
| CN106841889A (en) * | 2016-11-24 | 2017-06-13 | 深圳市燕麦科技股份有限公司 | A kind of short-circuit open test method and system |
| CN107329077A (en) * | 2017-08-16 | 2017-11-07 | 苏州易美新思新能源科技有限公司 | A kind of PCB soft boards drain current test method and device |
| CN108983019A (en) * | 2018-05-25 | 2018-12-11 | 中车青岛四方机车车辆股份有限公司 | Cable continuity test method, apparatus and test equipment |
| CN113030704A (en) * | 2021-03-11 | 2021-06-25 | 山东英信计算机技术有限公司 | Mainboard test equipment, method and system and readable storage medium |
| CN113109694A (en) * | 2021-04-12 | 2021-07-13 | 北京电子工程总体研究所 | Method for detecting and positioning short circuit point of circuit board |
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