CN103616630A - Schottky diode reverse pulse energy tester - Google Patents
Schottky diode reverse pulse energy tester Download PDFInfo
- Publication number
- CN103616630A CN103616630A CN201310636350.2A CN201310636350A CN103616630A CN 103616630 A CN103616630 A CN 103616630A CN 201310636350 A CN201310636350 A CN 201310636350A CN 103616630 A CN103616630 A CN 103616630A
- Authority
- CN
- China
- Prior art keywords
- power supply
- diode
- switching circuit
- schottky diode
- electronic switching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a Schottky diode reverse pulse energy tester. The Schottky diode reverse pulse energy tester comprises a power supply, a square wave pulse generator and an electronic switching circuit. The square wave pulse generator is connected with an automatic oscillation stop control circuit. The Schottky diode reverse pulse energy tester is characterized in that the output end of the square wave pulse generator is connected with an electronic counter and the electronic switching circuit; the state of the electronic switching circuit is controlled by output pulses; the electronic switching circuit is connected with a constant current source through an inductor L; the negative electrode of a Schottky diode to be tested is connected to the position between the inductor L and the electronic switching circuit; the constant current source provides reverse breakdown voltages and currents for the diode through the inductor L. According to the Schottky diode reverse pulse energy tester, a reverse breakdown test for the Schottky diode is achieved, the reverse breakdown time of the diode can be controlled by controlling the duty ratio of pulse signals, after the test is finished, warning signals can be sent out, the number of times of reverse breakdown can be controlled, and the goal of adopting different test methods for Schottky diodes of different types is achieved.
Description
Technical field
The present invention relates to a kind of S Schottky Barrier Diode Reveres Impulse Energy Tester, in particular, relate in particular to the S Schottky Barrier Diode Reveres Impulse Energy Tester that a kind of reverse breakdown number of times of diode and time all can control and regulate.
Background technology
In order to guarantee to adopt the stability of schottky diode circuit, in the reverse impulse energy test examination of some application scenario schottky diodes, must carry out.Schottky diode is implemented " national military standard " now, has also listed this test examination in " national military standard " in, but also there is no the schottky diode reverse impulse tester of standard at present.
The reverse impulse energy test examination of schottky diode, its implication be schottky diode under reverse breakdown state, the reverse impulse electric current by identical with its forward current size, is used for detecting its reverse burn-out resistance.The width of its reverse impulse electric current is generally 2～4 μ s, and dutycycle is 50%, and pulse number is generally selected in 5～10.
Summary of the invention
The present invention is in order to overcome the shortcoming of above-mentioned technical matters, and the S Schottky Barrier Diode Reveres Impulse Energy Tester that a kind of reverse breakdown number of times of diode and time all can control and regulate is provided.
S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, comprises power supply, square-wave pulse generator and electronic switching circuit, and square-wave pulse generator is connected with automatic failure of oscillation control circuit; Its special feature is: the output terminal of described square-wave pulse generator is connected with electronic counter and electronic switching circuit, the pulse signal number that electronic counter sends square-wave pulse generator is counted, and the output terminal of electronic counter is connected with the control end of automatic failure of oscillation control circuit; The conducting of electronic switching circuit, cut-off state are subject to the control of the high and low level of square-wave pulse generator output pulse, electronic switching circuit is connected with constant current source by inductance L, the negative pole of schottky diode to be measured is connected between inductance L and electronic switching circuit, and constant current source provides breakdown reverse voltage and electric current to schottky diode to be measured by inductance L.
Square-wave pulse generator is for generation of the certain pulse signal of dutycycle, to control the reverse breakdown time of schottky diode to be measured by electronic switching circuit; The pulse number that electronic counter produces by calculating square-wave pulse generator, adds up the number of times of schottky diode reverse breakdown to be measured.When the reverse breakdown number of times of schottky diode to be measured reaches setting value, electronic counter sends and controls signal to automatic failure of oscillation control circuit and surveyed indicating circuit, automatic failure of oscillation control circuit can be controlled square-wave pulse generator and stop output pulse signal, test indicating circuit and produce indicator signal, to inform that personnel have this time tested.Constant current source is for charging to inductance L and providing stable reverse breakdown current to schottky diode to be measured, electronic switching circuit optionally conducting and cut-off according to receiving the high and low level of pulse, so that inductance L punctures schottky diode to be measured under the effect of constant current source, and after puncturing, maintain constant inverse current, to reach the object of the anti-reverse breakdown ability of test diode.
S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, on the supply lines of described power supply, be provided with Test Switchboard K, square-wave pulse generator and electronic counter are comprised of 555 timers and decade counter CD4017 respectively, and electronic switching circuit is comprised of triode TG1 and triode TG2;
The RST of 555 timers and Vcc pin are all connected to power supply and just go up, between DIS pin and THR pin, be provided with diode D2, TRIG pin through capacitor C 1 and power supply be connected, TRIG pin is just connected with power supply through resistance R 1, diode D1, variable resistor W2 and variable resistor W1 successively, and DIS pin is connected between variable resistor W1 and W2;
The OUT pin of 555 timers is connected with the input end of clock of decade counter CD4017; On 10 counter pulse output terminal Q0～Q9 of decade counter CD4017, be disposed with ten switches of K0～K9, on the circuit at each switch place, be also provided with light emitting diode;
The collector of triode TG2, emitter respectively through resistance R 4, variable resistor W3 be connected to power supply just with power supply on the ground, the collector of triode TG1 is connected with the output terminal of constant current source through inductance L, the emitter of TG1 is connected to power supply on the ground through resistance R 5, and the positive pole of schottky diode to be measured, negative pole are connected to respectively collector and the power supply ground of TG1; The base stage of TG2 is connected to through resistance R 2 on the OUT pin of 555 timers, and the base stage of TG1 is connected with the emitter of TG2.
S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, also comprise and test indicating circuit, having tested indicating circuit is comprised of light emitting diode D4, relay J and controllable silicon T2, controllable silicon T2 after connecting with the coil of relay J, be just connected to power supply and power supply ground between, after light emitting diode D4 is in series with a resistor, be connected between the control end and power supply ground of relay J, the control end of T2 is connected on the loop at K switch 0～K9 place after diode D3; Automatically failure of oscillation control circuit is comprised of controllable silicon T1, and the positive pole of controllable silicon T1, negative pole are connected to respectively TRIG pin, the power supply ground of 555 timers, and the control end of T1 is connected on the negative pole of diode D3.
The invention has the beneficial effects as follows: S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, by square-wave pulse generator, can produce the pulse signal that dutycycle is certain, electronic switching circuit is at the height of pulse signal, alternative conducting and cut-off under low level, by conducting and the cut-off of electronic switching circuit, can control constant current source through inductance L to the reverse breakdown of schottky diode to be tested and lasting inverse current is provided, effectively realized the reverse breakdown test to schottky diode, and the reverse breakdown time that can pass through the Duty ratio control schottky diode of control wave.By the electronic counter of the pulse number that can add up produced is set, and the signal that count down to of electronic counter inputs to automatic failure of oscillation control circuit and tests indicating circuit, not only realized after being completed and having sent warning signal, also can control the number of times of the reverse breakdown of schottky diode to be measured, reach the object of the schottky diode of different model being taked to different method of testings.
Accompanying drawing explanation
Fig. 1 is the circuit theory diagrams of S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention;
Fig. 2 is the circuit diagram of S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention;
Fig. 3 is the circuit diagram of constant current source in the present invention.
In figure: 1 power supply, 2 square-wave pulse generators, 3 electronic counters, 4 electronic switching circuits, 5 constant current sources, 6 automatic failure of oscillation control circuits, 7 have surveyed indicating circuit, 8 schottky diodes to be measured, 9 inductance L.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the invention will be further described.
As shown in Figure 1, provided the circuit theory diagrams of schottky diode reverse impulse energy test of the present invention, it comprises power supply 1, square-wave pulse generator 2, electronic counter 3, electronic switching circuit 4, constant current source 5, automatic failure of oscillation control circuit 6, has surveyed indicating circuit 7, schottky diode to be measured 8, inductance L 9 and Test Switchboard K; Shown power supply 1 is for providing stable operating voltage to whole tester, and Test Switchboard K is arranged in supply line, and it can adopt microswitch.The input end of square-wave pulse generator 2 is all connected with the control end of electronic switching circuit 4 with the input end of electronic counter 3, square-wave pulse generator 2 generation pulse signals are sent in electronic counter 3 and are counted, and the high and low level of pulse signal is for controlling conducting and the cut-off of electronic switching circuit 4.
Electronic switching circuit 4 can be controlled the work of constant current source 5 and inductance L, constant current source 5 can produce by inductance L the voltage that makes schottky diode 8 reverse breakdowns to be measured, and to it, provide lasting inverse current after schottky diode 8 reverse-conductings to be measured, to reach the test to schottky diode reverse breakdown.Electronic counter 3 can be set count number, as set between 1～10, when the pulse signal sending when square-wave pulse generator 2 reaches the numerical value of setting, electronic counter 3 will be exported " counting down to " signal to automatic failure of oscillation control circuit 6 and survey in indicating circuit 7, automatically failure of oscillation control circuit 6 control square-wave pulse generators 2 stop output pulse signal, test indicating circuit 7 output indicator signals, to provide staff to test end.
As shown in Figure 2, provided the circuit diagram of S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, shown Test Switchboard K is arranged at power supply and just goes up, square-wave pulse generator 2 is comprised of 555 timers, 1～No. 8 pin of 555 timers is respectively GND, TRIG, OUT, RST, CTRL, THR, DIS, Vcc pin, and it represents respectively ground, triggering, output, reset, control, threshold value, electric discharge, feeder ear; Shown No. 4 and No. 8 pins are all connected to power supply and just go up, and are in series with diode D2, to guarantee the electric discharge of No. 7 pins between No. 7 pins and No. 6 pins.No. 2 pin is connected to power supply on the ground by capacitor C 1, No. 2 pin is connected to power supply and is just gone up by resistance R 1, diode D1, variable resistor W2, variable resistor W1 successively, No. 7 pin is connected between variable resistor W1 and W2, No. 1 pin is connected to power supply on the ground through capacitor C 2, and No. 3 pins are pulse signal output end.Like this, by 555 timers, just formed the square-wave pulse generator 2 of exportable certain duty cycle pulse signal.
Shown electronic counter 3 is comprised of decade counter CD4017, and the input end of clock of CD4017 is connected with the output terminal of 555 timers, and the pulse number that CD4017 just can produce 555 timers is like this counted.On counter pulse output terminal Q0～Q9 of CD4017, be all in series with switch and light emitting diode, switch on output terminal Q0～Q9 is followed successively by K0～K9, if by K0～K9 number consecutively be 1,2 ..., 10, so which switch is closed, just can control CD4017 and count several times, the numbering of closed switch is also the number of times of the reverse breakdown tested of schottky diode 8 to be measured.
Shown electronic switching circuit 4 is comprised of triode TG1 and triode TG2, TG1, TG2 are positive-negative-positive triode, the collector of TG2, emitter respectively by resistance R 4, variable resistor W3 be connected to power supply just, power supply on the ground, the collector of TG1 is connected with the output terminal of constant current source through inductance L, the emitter of TG1 through resistance R 5 and power supply be connected, the negative pole of schottky diode 8 to be measured is connected with the collector of TG1, and the positive pole of schottky diode 8 to be measured is connected with power supply ground.The base stage of TG2 is connected with the output terminal of 555 timers through resistance R 2, the base stage of TG1 is connected with the emitter of TG2, like this, when the high level of 555 timer output pulse signals, the equal conducting of triode TG2, TG2, the electric current that constant current source produces flows into location through inductance L, triode TG1, resistance R 5, in schottky diode to be measured 8 now, does not have electric current to pass through.The pulse signal producing when 555 timers is when high level becomes low level, now diode TG2, TG1 all end, the self-induction electromotive force that inductance L produces can make schottky diode 8 reverse breakdowns to be measured, and constant current source 5 can provide the inverse current of constant magnitude to schottky diode 8 to be measured by inductance L, make schottky diode 8 to be measured in the low level time section of pulse signal all the time in reverse breakdown state.When the high level of next pulse arrives, triode TG2, TG1 again can conductings, repeat above-mentioned steps.When the reverse breakdown testing time of schottky diode diode 8 to be measured reaches setting value, CD4017 chip can be by diode D3 output test finishing control signal.
Shown automatic failure of oscillation control circuit 6 is comprised of controllable silicon T1, and the positive pole of controllable silicon T1 is connected with No. 2 pins of 555 timers, and the negative pole of T1 is connected with power supply ground; The positive pole of triode D3 is all connected with the circuit at K switch 0～K9 place, and the control end of T1 is connected with the negative pole of D3.Testing indicating circuit 7 is comprised of light emitting diode D4, relay J and controllable silicon T2, controllable silicon T2 after connecting with the coil of relay J, be just connected to power supply and power supply ground between, after light emitting diode D4 is in series with a resistor, be connected to power supply and the output control terminal of relay J.Like this, the pulse signal of inputting when decade counter CD4017 statistics reaches after the numerical value of setting, will export high level to the positive pole of diode D3, can make controllable silicon T1 and T2 conducting after D3 conducting.After T1 conducting, make No. 2 pins at 555 counter places all the time in low level, the 555 counter failures of oscillations, not output pulse signal again, so electronic switching circuit can not worked, and the test of schottky diode 8 to be measured stops.After T2 conducting, the coil conducting of relay J, the loop conducting at light emitting diode D4 place, light emitting diode D4 is luminous tests end with warning staff.
S Schottky Barrier Diode Reveres Impulse Energy Tester of the present invention, has realized the reverse breakdown test to schottky diode, and the reverse breakdown time that can pass through the Duty ratio control schottky diode of control wave.After being completed, can send warning signal, also can control the reverse breakdown number of times of schottky diode to be measured, reach the object of the schottky diode of different model being taked to different method of testings, can effectively to the performance of schottky diode, make evaluation.
Claims (3)
1. a S Schottky Barrier Diode Reveres Impulse Energy Tester, comprises power supply (1), square-wave pulse generator (2) and electronic switching circuit (4), and square-wave pulse generator is connected with automatic failure of oscillation control circuit (6); It is characterized in that: the output terminal of described square-wave pulse generator is connected with electronic counter (3) and electronic switching circuit (4), the pulse signal number that electronic counter sends square-wave pulse generator is counted, and the output terminal of electronic counter is connected with the control end of automatic failure of oscillation control circuit; The conducting of electronic switching circuit, cut-off state are subject to the control of the high and low level of square-wave pulse generator output pulse, electronic switching circuit is connected with constant current source (5) by inductance L (9), the negative pole of schottky diode to be measured (8) is connected between inductance L and electronic switching circuit, and constant current source provides breakdown reverse voltage and electric current to schottky diode to be measured by inductance L.
2. S Schottky Barrier Diode Reveres Impulse Energy Tester according to claim 1, it is characterized in that: on the supply lines of described power supply (1), be provided with Test Switchboard K, square-wave pulse generator (2) and electronic counter (3) are comprised of 555 timers and decade counter CD4017 respectively, and electronic switching circuit (4) is comprised of triode TG1 and triode TG2;
The RST of 555 timers and Vcc pin are all connected to power supply and just go up, between DIS pin and THR pin, be provided with diode D2, TRIG pin through capacitor C 1 and power supply be connected, TRIG pin is just connected with power supply through resistance R 1, diode D1, variable resistor W2 and variable resistor W1 successively, and DIS pin is connected between variable resistor W1 and W2;
The OUT pin of 555 timers is connected with the input end of clock of decade counter CD4017; On 10 counter pulse output terminal Q0～Q9 of decade counter CD4017, be disposed with ten switches of K0～K9, on the circuit at each switch place, be also provided with light emitting diode;
The collector of triode TG2, emitter respectively through resistance R 4, variable resistor W3 be connected to power supply just with power supply on the ground, the collector of triode TG1 is connected with the output terminal of constant current source (5) through inductance L, the emitter of TG1 is connected to power supply on the ground through resistance R 5, and the positive pole of schottky diode to be measured (8), negative pole are connected to respectively collector and the power supply ground of TG1; The base stage of TG2 is connected to through resistance R 2 on the OUT pin of 555 timers, and the base stage of TG1 is connected with the emitter of TG2.
3. S Schottky Barrier Diode Reveres Impulse Energy Tester according to claim 2, it is characterized in that: also comprise and test indicating circuit (7), having tested indicating circuit is comprised of light emitting diode D4, relay J and controllable silicon T2, controllable silicon T2 after connecting with the coil of relay J, be just connected to power supply and power supply ground between, after light emitting diode D4 is in series with a resistor, be connected between the control end and power supply ground of relay J, the control end of T2 is connected on the loop at K switch 0～K9 place after diode D3; Automatically failure of oscillation control circuit (6) is comprised of controllable silicon T1, and the positive pole of controllable silicon T1, negative pole are connected to respectively TRIG pin, the power supply ground of 555 timers, and the control end of T1 is connected on the negative pole of diode D3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310636350.2A CN103616630A (en) | 2013-12-03 | 2013-12-03 | Schottky diode reverse pulse energy tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310636350.2A CN103616630A (en) | 2013-12-03 | 2013-12-03 | Schottky diode reverse pulse energy tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103616630A true CN103616630A (en) | 2014-03-05 |
Family
ID=50167334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310636350.2A Pending CN103616630A (en) | 2013-12-03 | 2013-12-03 | Schottky diode reverse pulse energy tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103616630A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109164369A (en) * | 2018-09-03 | 2019-01-08 | 广东电网有限责任公司 | A kind of the test circuit and on-line testing method of heavy-duty diode |
| CN112600538A (en) * | 2020-12-07 | 2021-04-02 | 上海索迪龙自动化有限公司 | Multi-frequency pulse device, adjustable pulse device and duty ratio adjusting method |
| CN114184928A (en) * | 2021-11-24 | 2022-03-15 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
| CN114184928B (en) * | 2021-11-24 | 2024-05-28 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003084029A (en) * | 2001-09-12 | 2003-03-19 | Nippon Inter Electronics Corp | Reverse recovery time characteristic measuring device |
| JP2003098218A (en) * | 2001-09-21 | 2003-04-03 | Canon Inc | Semiconductor testing method |
| CN101504439A (en) * | 2009-03-17 | 2009-08-12 | 北京大学 | Poikilothermia Schottky diode characteristic tester |
| CN101587163A (en) * | 2009-06-16 | 2009-11-25 | 深圳市晶导电子有限公司 | Method for testing Schottky diode |
| CN203786258U (en) * | 2013-12-03 | 2014-08-20 | 济南晶恒电子有限责任公司 | Schottky diode reversed pulse energy tester |
-
2013
- 2013-12-03 CN CN201310636350.2A patent/CN103616630A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003084029A (en) * | 2001-09-12 | 2003-03-19 | Nippon Inter Electronics Corp | Reverse recovery time characteristic measuring device |
| JP2003098218A (en) * | 2001-09-21 | 2003-04-03 | Canon Inc | Semiconductor testing method |
| CN101504439A (en) * | 2009-03-17 | 2009-08-12 | 北京大学 | Poikilothermia Schottky diode characteristic tester |
| CN101587163A (en) * | 2009-06-16 | 2009-11-25 | 深圳市晶导电子有限公司 | Method for testing Schottky diode |
| CN203786258U (en) * | 2013-12-03 | 2014-08-20 | 济南晶恒电子有限责任公司 | Schottky diode reversed pulse energy tester |
Non-Patent Citations (1)
| Title |
|---|
| 陈守迎等: "肖特基二极管反向脉冲能量测试仪", 《山东电子》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109164369A (en) * | 2018-09-03 | 2019-01-08 | 广东电网有限责任公司 | A kind of the test circuit and on-line testing method of heavy-duty diode |
| CN112600538A (en) * | 2020-12-07 | 2021-04-02 | 上海索迪龙自动化有限公司 | Multi-frequency pulse device, adjustable pulse device and duty ratio adjusting method |
| CN114184928A (en) * | 2021-11-24 | 2022-03-15 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
| CN114184928B (en) * | 2021-11-24 | 2024-05-28 | 深圳同兴达科技股份有限公司 | Performance detection system and detection method for Schottky diode in display module |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107807319B (en) | Insulated gate bipolar transistor IGBT test circuit and method | |
| CN201066369Y (en) | Polarity tester for current mutual inductor | |
| CN106526476B (en) | Synchronous control device and method for power frequency follow current interruption capability test synthesis loop | |
| CN104330692A (en) | Polarity testing device of sleeve current transformer of main transformer | |
| CN203786258U (en) | Schottky diode reversed pulse energy tester | |
| CN103616630A (en) | Schottky diode reverse pulse energy tester | |
| CN203732715U (en) | Electric energy meter withstand voltage test device | |
| CN203849376U (en) | Breaker anti-tripping loop testing apparatus | |
| CN109193879A (en) | One kind being used for extensive Linear transformer driver tape jam charging method and device | |
| CN206740894U (en) | A kind of wink break time detector with 1 μ s detectabilities | |
| CN104101810B (en) | A kind of testing circuit based on LED group and detector | |
| CN209821349U (en) | Test circuit for electronic fuse thick film circuit | |
| CN204179638U (en) | A kind of residual current circuit breaker | |
| CN208013332U (en) | A kind of power device dv/dt test circuits and test board | |
| CN203444044U (en) | High-voltage capacitor charging and discharging test device | |
| US9274165B2 (en) | Tester for lightning arresters counter | |
| CN206074753U (en) | A kind of dry-type air-core reactor turn-to-turn insulation overvoltage checks circuit | |
| CN104836550A (en) | High-voltage pulse power supply trigger controller | |
| CN102435943A (en) | Testing arrangement of vacuum circuit breaker | |
| CN204203402U (en) | A kind of proving installation of sleeve of main transformer current transformer polarity | |
| TWI445986B (en) | Test system | |
| CN204462211U (en) | Based on the ring ripple test signal generator of electronic switch | |
| CN100429853C (en) | CT open circuit protector with high sensitivity | |
| CN104764911A (en) | Ringing wave test signal generator based on electronic switches | |
| CN203688736U (en) | Insulating and medium impact voltage-withstand device based on Marx generator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20140305 |