CN103604749A - Detector and diffuse transmission ratio measure system - Google Patents
Detector and diffuse transmission ratio measure system Download PDFInfo
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- CN103604749A CN103604749A CN201310629713.XA CN201310629713A CN103604749A CN 103604749 A CN103604749 A CN 103604749A CN 201310629713 A CN201310629713 A CN 201310629713A CN 103604749 A CN103604749 A CN 103604749A
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Abstract
The invention provides a detector and a diffuse transmission ratio measure system. The detector is applied to the diffuse transmission ratio measure system. The diffuse transmission ratio measure system comprises the detector, a light source system, a light splitting system and an electric control device; the electric control device is connected with the detector, the light source system and the light splitting system and provids electricity; and the detector is in the shape of a circle, and the inner surface of the detector is totally covered by a photoelectric detector. By using the detector provided by the invention, the measure accuracy does not depend on the characteristics of a material self, and the measure precision can be substantially improved.
Description
Technical field
The present invention relates to field of measuring technique, relate in particular to a kind of detector and diffuse transmittance measuring system.
Background technology
Along with the fast development of material subject, to optical material diffuse transmission characteristic, i.e. diffuse transmittance, high-acruracy survey very high requirement has been proposed.
The measurement of current known material diffuse transmittance is generally to adopt integrating sphere method to carry out, and in a hollow ball, settles a little detector.This method requires the diffuse transmission characteristic of material even as far as possible on any direction of space, otherwise very likely at the inner local speck that produces of integrating sphere, if the position that local speck produces is direct and detector position coincidence or approaching, can cause signal higher, thereby can cause larger measuring error, the situation that even there will be the diffuse transmittance measuring to be greater than 1.This characteristic is particularly evident when measuring the larger pattern glass of microscale, because the position of these local specks is closely related with material, therefore, even by the method for baffle plate being installed or also cannot effectively avoiding with many integrating spheres series process in integrating sphere inside, accuracy of measurement is limited by measured material always.
Summary of the invention
The invention provides a kind of detector and diffuse transmittance measuring system, the accuracy of measurement can be independently and material self-characteristic, and can greatly improve the precision of measurement.
The invention provides a kind of detector, be applied in diffuse transmittance measuring system, described diffuse transmittance measuring system comprises described detector, light-source system, beam splitting system and electric control gear, described electric-control system is connected and power supply is provided with described detector, light-source system, beam splitting system, described detector is circular, and the inside surface of described detector is covered completely by photodetector.
Preferably, offer a breach on described detector, when measuring, this breach is detected sample and is covered.
Preferably, described electric-control system is also for monitoring the degree of stability of described diffuse transmittance measuring system current/voltage.
Preferably, described electric-control system is also for controlling the operation of beam splitting system.
Preferably, described electric-control system is also for amplifying the electric current of detector output and realizing AD and change.
The present invention also provides a kind of diffuse transmittance measuring system, comprises the detector described in above-mentioned any one.
Preferably, described diffuse transmittance measuring system also comprises: calculation element, is connected with described detector, and according to following formula, calculates the diffuse transmittance τ of detected sample:
Wherein, I
100while not putting into light path for detected sample, the current value that described detector measurement obtains, I
0while being replaced by a light tight baffle plate for being detected sample, described detector measurement measures current value, I
xwhile putting into for detected sample, the current value that systematic survey obtains.
A kind of detector provided by the invention, described detector is circular, and the inside surface of described detector is covered completely by photodetector.Because detector inside is covered completely by photodetector, therefore, no matter which concrete orientation receives how much light, all can directly effectively be converted to electric power signal.Use detector provided by the invention, the accuracy measuring can be independently and material self-characteristic, and can greatly improve the precision of measurement.
Accompanying drawing explanation
Fig. 1 is the structural representation that has comprised the diffuse transmittance measuring system that the invention provides detector.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is further described.Following examples are only for technical scheme of the present invention is more clearly described, and can not limit the scope of the invention with this.
Face by reference to the accompanying drawings, is described in further detail the specific embodiment of the present invention.Following examples are used for illustrating the present invention, but do not limit the scope of the invention.
The present invention a kind of detector, be applied in diffuse transmittance measuring system as shown in Figure 1, this system comprises light-source system 1, beam splitting system 2, sample 3, spherical detector 4 and electric-control system 5; Electric-control system 5 is connected with detector 4, light-source system 1, beam splitting system 2 and power supply, detector 4 are provided is circular, and the inside surface of detector 4 is covered completely by photodetector.
Detector provided by the invention is circular, and the inside surface of described detector is covered completely by photodetector.Because detector inside is covered completely by photodetector, therefore, no matter which concrete orientation receives how much light, all can directly effectively be converted to electric power signal.Use detector provided by the invention, the accuracy measuring can be independently and material self-characteristic, and can greatly improve the precision of measurement.
Preferably, the degree of stability of current/voltage when this electric-control system 5 is also responsible for 1 real work of monitor optical origin system, and/or, the various actions of control beam splitting system 2, and/or, the electric current of spherical detector 4 outputs is amplified and realize AD and change.
Preferably, on spherical detector 4, there is an opening, be beneficial to light and enter.Sample 3 and the accurate laminating of spherical detector 4 opening parts, while measuring, this breach is detected sample and is covered.
Measuring principle is, the optical radiation that light-source system 1 sends is divided into needed monochromatic radiation through beam splitting system 2, monochromatic radiation is scattered into the random diffused light that all directions all have light after sample, because sample 3 is closely connected with spherical detector 4, therefore light all enters spherical detector 4.Because spherical detector 4 inside are detector, therefore, no matter which concrete orientation receives how much light, all can directly effectively be converted to electric power signal.During specific implementation, need according to following measurement procedure:
The diffuse transmittance that wherein τ is material, I
100while not putting into light path for sample 3, the current value that systematic survey obtains, I
0when sample 3 is replaced by a light tight baffle plate, systematic survey obtains current value, also referred to as background radiation, and I
xwhile putting into for sample 3, the current value that systematic survey obtains.
Design based on identical, the embodiment of the present invention also provides a kind of diffuse transmittance measuring system, comprises the detector described in above-mentioned any one.
Preferably, this diffuse transmittance measuring system is also drawn together: calculation element, is connected with detector 4, and according to following formula, calculates the diffuse transmittance τ of detected sample:
Wherein, I
100while not putting into light path for detected sample, the current value that described detector measurement obtains, I
0while being replaced by a light tight baffle plate for being detected sample, described detector measurement measures current value, I
xwhile putting into for detected sample, the current value that systematic survey obtains.
Use detector provided by the invention, the accuracy measuring can be independently and material self-characteristic, and can greatly improve the precision of measurement.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, do not departing under the prerequisite of the technology of the present invention principle; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (7)
1. a detector, it is characterized in that, be applied in diffuse transmittance measuring system, described system comprises described detector, light-source system, beam splitting system and electric control gear, described electric-control system is connected and power supply is provided with described detector, light-source system, beam splitting system, described detector is circular, and the inside surface of described detector is covered completely by photodetector.
2. detector as claimed in claim 1, is characterized in that, offers a breach on described detector, and when measuring, this breach is detected sample and covers.
3. detector as claimed in claim 1, is characterized in that, described electric-control system is also for monitoring the degree of stability of described diffuse transmittance measuring system current/voltage.
4. detector as claimed in claim 1, is characterized in that, described electric-control system is also for controlling the operation of beam splitting system.
5. detector as claimed in claim 1, is characterized in that, described electric-control system is also for amplifying the electric current of detector output and realizing AD and change.
6. a diffuse transmittance measuring system, is characterized in that, comprises the detector as described in claim 1-6 any one.
7. diffuse transmittance measuring system as claimed in claim 6, is characterized in that, also comprises: calculation element, is connected with described detector, and according to following formula, calculates the diffuse transmittance τ of detected sample:
Wherein, I
100while not putting into light path for detected sample, the current value that described detector measurement obtains, I
0while being replaced by a light tight baffle plate for being detected sample, described detector measurement measures current value, I
xwhile putting into for detected sample, the current value that systematic survey obtains.
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| CN201310629713.XA CN103604749A (en) | 2013-11-29 | 2013-11-29 | Detector and diffuse transmission ratio measure system |
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| CN201310629713.XA CN103604749A (en) | 2013-11-29 | 2013-11-29 | Detector and diffuse transmission ratio measure system |
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| CN103604749A true CN103604749A (en) | 2014-02-26 |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2153789Y (en) * | 1992-06-12 | 1994-01-19 | 中国人民解放军工程兵工程学院 | Automatic spectrum colorimeter |
| US20030102433A1 (en) * | 2000-10-30 | 2003-06-05 | Ciurczak Emil W. | Hemispherical detector |
| CN1514930A (en) * | 2001-08-13 | 2004-07-21 | ��ɹ���ѧ��ʽ���� | Spectrally separating apparatus and its method |
| CN1560585A (en) * | 2004-03-12 | 2005-01-05 | 宁波市二轻工业研究设计院 | Quickly measuring method and device for lens transmittivity |
| US20070165224A1 (en) * | 2006-01-13 | 2007-07-19 | Deck Francis J | Grating monochromator / spectrograph |
| CN201311324Y (en) * | 2008-11-18 | 2009-09-16 | 中国计量科学研究院 | Integrating sphere light collector |
| CN102235974A (en) * | 2010-04-20 | 2011-11-09 | 中国科学院上海硅酸盐研究所 | Device and method for testing full penetration rate of transparent ceramic bulk material |
| CN102565008A (en) * | 2011-12-28 | 2012-07-11 | 北京奥博泰科技有限公司 | Method and device for measuring transmittance of material by using integrating sphere |
-
2013
- 2013-11-29 CN CN201310629713.XA patent/CN103604749A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2153789Y (en) * | 1992-06-12 | 1994-01-19 | 中国人民解放军工程兵工程学院 | Automatic spectrum colorimeter |
| US20030102433A1 (en) * | 2000-10-30 | 2003-06-05 | Ciurczak Emil W. | Hemispherical detector |
| CN1514930A (en) * | 2001-08-13 | 2004-07-21 | ��ɹ���ѧ��ʽ���� | Spectrally separating apparatus and its method |
| CN1560585A (en) * | 2004-03-12 | 2005-01-05 | 宁波市二轻工业研究设计院 | Quickly measuring method and device for lens transmittivity |
| US20070165224A1 (en) * | 2006-01-13 | 2007-07-19 | Deck Francis J | Grating monochromator / spectrograph |
| CN201311324Y (en) * | 2008-11-18 | 2009-09-16 | 中国计量科学研究院 | Integrating sphere light collector |
| CN102235974A (en) * | 2010-04-20 | 2011-11-09 | 中国科学院上海硅酸盐研究所 | Device and method for testing full penetration rate of transparent ceramic bulk material |
| CN102565008A (en) * | 2011-12-28 | 2012-07-11 | 北京奥博泰科技有限公司 | Method and device for measuring transmittance of material by using integrating sphere |
Non-Patent Citations (3)
| Title |
|---|
| F.MANOOCHEHRI,ET AL.: "High-accuracy spectrometer for measurement of regular spectral transmittance", 《APPLIED OPTICS》, vol. 34, no. 19, 1 July 1995 (1995-07-01), pages 3686 - 3692, XP000537292, DOI: doi:10.1364/AO.34.003686 * |
| 李景镇: "《光学手册（上卷）》", 31 July 2010, article "辐射度学和光度学", pages: 539-542 * |
| 李景镇: "《光学手册（下卷）》", 31 July 2010, article "光学测试计量学", pages: 2718-2719 * |
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Application publication date: 20140226 |