CN102645764A - Liquid crystal display (LCD) transmissivity testing method and device - Google Patents
Liquid crystal display (LCD) transmissivity testing method and device Download PDFInfo
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- CN102645764A CN102645764A CN201210118197XA CN201210118197A CN102645764A CN 102645764 A CN102645764 A CN 102645764A CN 201210118197X A CN201210118197X A CN 201210118197XA CN 201210118197 A CN201210118197 A CN 201210118197A CN 102645764 A CN102645764 A CN 102645764A
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- 238000012360 testing method Methods 0.000 title claims abstract description 31
- 239000004973 liquid crystal related substance Substances 0.000 title abstract description 6
- 230000003321 amplification Effects 0.000 claims abstract description 21
- 238000003199 nucleic acid amplification method Methods 0.000 claims abstract description 21
- 230000003287 optical effect Effects 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 10
- 230000005540 biological transmission Effects 0.000 claims description 29
- 238000005259 measurement Methods 0.000 claims description 18
- 238000000691 measurement method Methods 0.000 claims description 11
- 230000008569 process Effects 0.000 claims description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 5
- 229910052710 silicon Inorganic materials 0.000 claims description 5
- 239000010703 silicon Substances 0.000 claims description 5
- 230000003595 spectral effect Effects 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000012545 processing Methods 0.000 abstract description 7
- 238000010200 validation analysis Methods 0.000 abstract 1
- 230000004044 response Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000009434 installation Methods 0.000 description 4
- 230000008520 organization Effects 0.000 description 4
- 238000012827 research and development Methods 0.000 description 3
- 238000011160 research Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 210000002858 crystal cell Anatomy 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
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Abstract
The invention provides a liquid crystal display (LCD) transmissivity testing method and a LCD transmissivity testing device. The method comprises the steps of transmitting testing light rays by using a light-emitting diode (LED); adjusting point light source rays emitted from the LED into parallel light rays by using a light filter; projecting the parallel light rays on a photodiode through a testing LCD, and converting an optical signal into an electric signal through the photodiode; amplifying the electric signal through a wideband amplification circuit and converting the electric signal into a digital signal through an analog/digital converter; and processing the digital signal by using a processor, and outputting the testing result. The LCD transmissivity testing device is low in application cost, convenient to use and maintain and is suitable for factories, and the requirements of development validation and production testing of production line can be met.
Description
Technical field
The present invention relates to LCD research and development and production test technical field, more particularly, relate to a kind of LCD transmission measurement method and apparatus.
Background technology
The LCD LCD is the abbreviation of Liquid Crystal Display; The structure of LCD is in the middle of two parallel glass, to place liquid crystal; The tiny electric wire that many vertical and levels are arranged in the middle of two sheet glass; Whether seeing through switches on controls shaft-like quartzy molecular changes direction, and light refraction is come out to produce picture.Because LCD utilizes the electrooptical effect of liquid crystal; Transmissivity and reflectivity through circuit control liquid crystal cells; Can produce different gray-levels and reach the nearly beautiful image of 1,670 ten thousand kinds of colors, what its imaging results will be good than CRT is many, has substituted the picture reproducer that CRT becomes main flow now.
The isoparametric test of response speed, transmitance that influences the LCD performance is an important link in LCD research and development and the production run.At present, the response speed of test LCD, transmitance etc. need to adopt relatively more expensive equipment, for example DMS-501, DMS-803, CA210, LCD-5200, BM-5 etc.These equipment existence cost an arm and a leg, and maintaining is complicated, is unfavorable for shortcomings such as workshop streamline use simultaneously.
The reason of aforesaid apparatus expensive is that these equipment have precision height, fast, the advantages of wide application range of response speed.But some is used as the eyeglass LCD of active 3D eyes tests have more than is needed so high response speed and precision, so adopt this kind equipment to research and develop checking, the test that particularly is applied to production line can cause the serious waste of resource.
Summary of the invention
In view of the above problems, the purpose of this invention is to provide a kind of LCD transmission measurement method and apparatus that can be fit to research and develop checking and production line production test application demand.
According to an aspect of the present invention, a kind of LCD transmission measurement method is provided, has comprised:
Utilize light emitting diode to send test and use light;
The pointolite light furnishing parallel rays that utilizes optical filter that said light emitting diode is sent;
Said parallel rays is projected on the photodiode through LCD to be tested, light signal is transformed into electric signal by said photodiode;
Analog to digital converter is delivered in the amplification of said electric signal process wideband amplification circuit converted to digital signal;
Utilize processor that said digital signal is handled, output test result.
Wherein, preferred scheme is that said photodiode adopts high speed PIN silicon photocell.
In addition, preferably scheme is, the device spectral range of said photodiode is 450nm～110nm, and junction capacity Ct is 3pF.
In addition, preferably scheme is, said light emitting diode is by the LED driving circuit driven for emitting lights, and LCD to be tested is by the work of LCD driving circuit drives, and said processor is controlled said LED driving circuit and the work of said LCD driving circuit drives respectively.
In addition, preferred scheme is that said wideband amplification circuit is amplified said electric signal by two operational amplifier branch two-stages.
According to a further aspect in the invention; A kind of LCD transmission measurement device is provided; Comprise light emitting diode, optical filter, photodiode, wideband amplification circuit, analog to digital converter and processor, wherein, between said optical filter and said photodiode, form LCD put area to be tested;
Said light emitting diode is used to send test and uses light;
The pointolite light furnishing parallel rays that said optical filter sends said light emitting diode;
Said parallel rays projects on the photodiode through LCD to be tested, by said photodiode light signal is transformed into electric signal;
Wideband amplification circuit amplifies said electric signal;
The electrical signal conversion of said analog to digital converter after with said amplification becomes digital signal;
Said processor is handled said digital signal, outputs test result.
Preferably, the present invention adopts the high-speed silicon PIN photodiode to carry out light signal collection, amplifies through broadband operational amplifier, by high-speed ADC signal is converted into digital quantity, finally in MCU, calculates transmitance, contrast and response time.
LCD transmittance method of testing provided by the invention is cheap with the device application cost, and use, easy to maintenance can be satisfied research and development checking and production line production test demand, and the most suitable factory uses.
In order to realize above-mentioned and relevant purpose, one or more aspects of the present invention comprise the characteristic that the back will specify and in claim, particularly point out.Following explanation and accompanying drawing have specified some illustrative aspects of the present invention.Yet, the indication of these aspects only be some modes that can use in the variety of way of principle of the present invention.In addition, the present invention is intended to comprise all these aspects and their equivalent.
Description of drawings
Through with reference to below in conjunction with the explanation of accompanying drawing and the content of claims, and along with to more complete understanding of the present invention, other purpose of the present invention and result will understand more and reach easy to understand.In the accompanying drawings:
Fig. 1 is the process flow diagram according to LCD transmission measurement method of the present invention;
Fig. 2 is the LCD transmission measurement principle schematic according to the embodiment of the invention;
Fig. 3 is the logical organization synoptic diagram according to the LCD transmission measurement device of the embodiment of the invention;
Fig. 4 is the signal processing circuit logical organization synoptic diagram according to the embodiment of the invention;
Fig. 5 A and Fig. 5 B are respectively a kind of profile embodiment synoptic diagram according to LCD transmission measurement device of the present invention.
Identical label is indicated similar or corresponding feature or function in institute's drawings attached.
Embodiment
Below will combine accompanying drawing that specific embodiment of the present invention is described in detail.
Fig. 1 shows the process flow diagram according to LCD transmission measurement method of the present invention.
As shown in Figure 1; When needs carry out transmission measurement to LCD; Need be placed on LCD to be tested between testing light source and the electrooptical device, so that the light quantitative Analysis that sees through LCD to be tested according to testing light source goes out the transmitance of LCD to be tested, therefore; In step S110, at first utilize light emitting diode to send test and use light; Because light emitting diode is a pointolite, and the light of test LCD transmitance needs parallel rays, so, in step S120, the pointolite light furnishing parallel rays that utilizes optical filter that said light emitting diode is sent; Then, this parallel rays is projected on the photodiode through LCD to be tested, light signal is transformed into electric signal (step S130) by photodiode; Then analog to digital converter is delivered in this electric signal process wideband amplification circuit amplification and converted to digital signal (step S140); Utilize processor that this digital signal is handled at last, (step S150) outputs test result.
The principle of work of above-mentioned method of testing is as shown in Figure 2; Test is sent by light emitting diode 110 with light; With pointolite light furnishing directional light, parallel rays projects on the photodiode 101 through LCD108 to be tested through optical filter 109, by photodiode 101 light signal is transformed into electric signal; 102 amplifications of electric signal process wideband amplification circuit are delivered to analog to digital converter 103 and are converted digital signal to; 104 pairs of digital signals of processor are handled, and calculate parameters such as transmitance, contrast and response time, show through display 105.
In an embodiment of the present invention, the light emitting diode 110 in the proving installation is by LED driving circuit 107 driven for emitting lights, and LCD108 to be tested is by the 106 driving work of LCD driving circuit, and two driving circuits are all by processor 104 controls.The power supply of total system has system's power supply 111 to provide.
Fig. 3 shows the logical organization according to the LCD transmission measurement device of the embodiment of the invention.
As shown in Figure 3; LCD transmission measurement device 300 provided by the invention comprises light emitting diode 310, optical filter 320, photodiode 330, wideband amplification circuit 340, analog to digital converter 350 and processor 360; The light that light emitting diode 310 produces is adjusted to parallel rays through filtering 320; This parallel rays converts electric signal into through the optical signals photodiode 330 behind the LCD to be tested; Then by wideband amplification circuit 340 amplify, analog to digital converter 350 converts digital signal into and inputs to processor 360 and handle, and finally obtains the test result of the transmittance of LCD to be tested.
Key Circuit in the LCD transmission measurement device provided by the invention is a signal processing circuit, and Fig. 4 is the signal processing circuit logical organization synoptic diagram according to the embodiment of the invention.As shown in Figure 4, photodiode 401 adopts high speed PIN silicon photocell, and model is SPDI433.Spectral range is 450nm～110nm, and junction capacity Ct has only 3pF, and spectral range is wide, and response speed is fast.
Wideband amplification circuit is amplified electric signal by 402,403 fens two-stages of two operational amplifiers.Wherein, the first order is formed electric current by operational amplifier 402 changes voltage mutual conductance amplifying circuit, and the current signal of photodiode is transformed into voltage signal, and VN provides the bias voltage of photodiode, guarantees its operate as normal.Subtraction, ratio amplifying circuit are formed by operational amplifier 403 in the second level, first order signal is amplified, and deduct bias voltage VN.Biasing circuit is made up of operational amplifier 405, and stable bias voltage is provided.Operational amplifier 402,403 adopts high speed amplifier OPA322, bandwidth 20MHz, bias current 0.2pA; Operational amplifier 405 adopts general amplifier, and bias current is low to get final product.Pass to analog to digital converter ADC through the signal after the processing and amplifying through interface 404 and carry out data acquisition process.
Require R3=R4 in the entire circuit, R2=R5.Then the signal of circuit output formula is:
MCU in this signal processing circuit (microprocessor) and analog to digital converter (ADC) adopt high speed processing chip MSP430F5132, and its ADC sample rate can reach 1us.
Fig. 5 A and Fig. 5 B show a kind of profile embodiment according to LCD transmission measurement device of the present invention respectively, and wherein, Fig. 5 A is a front view, and Fig. 5 B is a side view.
Shown in Fig. 5 A and Fig. 5 B, 501 is LCD transmission measurement device main body, and 502 is display, can show test results.503 is key zone, comprises the setting of switching on and shutting down and functional parameter.504 is the LCD driving interface, through the action of this interface by proving installation control LCD.505 is the photo-detector diode put area, and 506 is emitting led put area, and 507 is LCD put area to be measured.507 region distances should be able to be regulated automatically, so that adapt to different LCD eyeglasses.
As above describe according to LCD transmission measurement installation method of the present invention and device with the mode of example with reference to accompanying drawing.But, it will be appreciated by those skilled in the art that the LCD transmission measurement installation method and the device that propose for the invention described above, can also on the basis that does not break away from content of the present invention, make various improvement.Therefore, protection scope of the present invention should be confirmed by the content of appending claims.
Claims (11)
1. LCD transmission measurement method comprises:
Utilize light emitting diode to send test and use light;
The pointolite light furnishing parallel rays that utilizes optical filter that said light emitting diode is sent;
Said parallel rays is projected on the photodiode through LCD to be tested, light signal is transformed into electric signal by said photodiode;
Analog to digital converter is delivered in the amplification of said electric signal process wideband amplification circuit converted to digital signal;
Utilize processor that said digital signal is handled, output test result.
2. LCD transmission measurement method as claimed in claim 1, wherein,
Said photodiode adopts high speed PIN silicon photocell.
3. LCD transmission measurement method as claimed in claim 2, wherein, said.
The device spectral range of said photodiode is 450nm～110nm, and junction capacity Ct is 3pF.
4. LCD transmission measurement method as claimed in claim 1, wherein,
Said light emitting diode is by the LED driving circuit driven for emitting lights, and LCD to be tested is by the work of LCD driving circuit drives, and said processor is controlled said LED driving circuit and the work of said LCD driving circuit drives respectively.
5. LCD transmission measurement method as claimed in claim 1, wherein,
Said wideband amplification circuit is amplified said electric signal by two operational amplifier branch two-stages.
6. a LCD transmission measurement device comprises light emitting diode, optical filter, photodiode, wideband amplification circuit, analog to digital converter and processor, wherein, between said optical filter and said photodiode, forms LCD put area to be tested;
Said light emitting diode is used to send test and uses light;
The pointolite light furnishing parallel rays that said optical filter sends said light emitting diode;
Said parallel rays projects on the photodiode through LCD to be tested, by said photodiode light signal is transformed into electric signal;
Wideband amplification circuit amplifies said electric signal;
The electrical signal conversion of said analog to digital converter after with said amplification becomes digital signal;
Said processor is handled said digital signal, outputs test result.
7. LCD transmission measurement device as claimed in claim 6; Wherein, Said light emitting diode is by the LED driving circuit driven for emitting lights, and LCD to be tested is by the work of LCD driving circuit drives, and said processor is controlled said LED driving circuit and the work of said LCD driving circuit drives.
8. LCD transmission measurement device as claimed in claim 6, wherein, said photodiode adopts high speed PIN silicon photocell.
9. LCD transmission measurement device as claimed in claim 8, wherein, the device spectral range of said photodiode is 450nm～110nm, junction capacity Ct is 3pF.
10. LCD transmission measurement device as claimed in claim 6, wherein, said wideband amplification circuit is amplified said electric signal by two operational amplifier branch two-stages.
11. LCD transmission measurement device as claimed in claim 6, wherein, the distance of said LCD put area to be tested is adjustable.
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| CN201210118197.XA CN102645764B (en) | 2012-04-20 | 2012-04-20 | Liquid crystal display (LCD) transmissivity testing method and device |
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Cited By (3)
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| CN103036553A (en) * | 2012-12-10 | 2013-04-10 | 青岛歌尔声学科技有限公司 | Photoelectric signal switching circuit and plasma television stylus |
| CN109656037A (en) * | 2019-01-02 | 2019-04-19 | 海的电子科技(苏州)有限公司 | The measurement method of display screen flicker degree based on photodiode |
| CN109752871A (en) * | 2019-03-21 | 2019-05-14 | 京东方科技集团股份有限公司 | A kind of device and method for testing display panel transmitance |
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| CN109656037A (en) * | 2019-01-02 | 2019-04-19 | 海的电子科技(苏州)有限公司 | The measurement method of display screen flicker degree based on photodiode |
| CN109752871A (en) * | 2019-03-21 | 2019-05-14 | 京东方科技集团股份有限公司 | A kind of device and method for testing display panel transmitance |
| CN109752871B (en) * | 2019-03-21 | 2021-11-23 | 京东方科技集团股份有限公司 | Equipment and method for testing transmittance of display panel |
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