CN103558501A - Outage condition detection circuit - Google Patents
Outage condition detection circuit Download PDFInfo
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- CN103558501A CN103558501A CN201310587279.3A CN201310587279A CN103558501A CN 103558501 A CN103558501 A CN 103558501A CN 201310587279 A CN201310587279 A CN 201310587279A CN 103558501 A CN103558501 A CN 103558501A
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- effect transistor
- field effect
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- optical coupling
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Abstract
The invention discloses an outage condition detection circuit. The outage condition detection circuit comprises an optically coupled isolator and a field-effect transistor. A resistor R2 is connected between the output end of the optically coupled isolator and the ground. The output end of the optically coupled transistor is connected to the grid of the field-effect transistor. A capacitor is connected between the grid of the field-effect transistor and the ground. The drain of the field-effect transistor is connected with a power supply through a resistor R3. The drain of the field-effect transistor is connected to the negative electrode of a diode. The positive electrode of the diode is connected to the source of the field-effect transistor. A buzzer is connected between the source of the field-effect transistor and the ground. The field-effect transistor is a P-type field-effect transistor. The outage condition detection circuit has the advantages that when connected to a power supply circuit, the outage condition detection circuit can detect outage conditions, give an alarm when outage happens and facilitate circuit maintenance by personnel.
Description
Technical field
The present invention relates to integrated circuit fields, relate in particular a kind of outage condition testing circuit.
Background technology
In a lot of occasions, for example: commercial production control, hospital, server etc., it can not have a power failure, and power-off suddenly not only will bring massive losses to production, also will bring irreparable fault to medical treatment, bring serious threat to people's life security.Due to the connection problem of aging of circuit, especially, in circuit is built building for a long time, aging circuit is individual very distinct issues, after circuit disconnects, maintenance is a very loaded down with trivial details problem, need check each branch, detect again the node of power-off, then keep in repair.
Summary of the invention
The invention provides a kind of outage condition testing circuit, it is connected in feed circuit, can detect powering-off state, at power-off alarm, is convenient to personnel circuit is keeped in repair.
For solving above-mentioned technical matters, the present invention by the following technical solutions:
A kind of outage condition testing circuit, it comprises optical coupling isolator and field effect transistor, between the output terminal of described optical coupling isolator and ground, be connected with resistance R 2, the output terminal of described optical coupling isolator is connected on the grid of field effect transistor, between the grid of described field effect transistor and ground, be connected with electric capacity, the drain electrode of described field effect transistor is connected with power supply by resistance R 3, the drain electrode of described field effect transistor is connected on the negative electrode of diode, on the source electrode of the anodic bonding being on the scene effect pipe of described diode, between the source electrode of described field effect transistor and ground, be connected with hummer, described field effect is P type field effect transistor.
Further technical scheme is:
As preferably, the input end of described optical coupling isolator is connected with resistance R 1.
Further, the resistance of described resistance R 1 is 45 kilohms-50 kilohms.
As preferably, the grid of described field effect transistor is connected on the output terminal of optical coupling isolator by resistance R 4.
As preferably, the model of described optical coupling isolator is TLP126.
Compared with prior art, the invention has the beneficial effects as follows:
1, the present invention is connected in feed circuit or branch circuit, and when circuit or branch circuit power-off, it starts to report to the police, and is convenient to personnel and finds power-off branch and deenergizing circuit is keeped in repair.
2, circuit structure of the present invention is simple, with low cost, is easy to realize.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Fig. 1 is circuit theory diagrams of the present invention.
Embodiment
Below in conjunction with accompanying drawing, the present invention is further illustrated.Embodiments of the present invention include but not limited to the following example.
[embodiment]
A kind of outage condition testing circuit as shown in Figure 1, it comprises optical coupling isolator and field effect transistor, between the output terminal of described optical coupling isolator and ground, be connected with resistance R 2, the output terminal of described optical coupling isolator is connected on the grid of field effect transistor, between the grid of described field effect transistor and ground, be connected with electric capacity, the drain electrode of described field effect transistor is connected with power supply by resistance R 3, the drain electrode of described field effect transistor is connected on the negative electrode of diode, on the source electrode of the anodic bonding being on the scene effect pipe of described diode, between the source electrode of described field effect transistor and ground, be connected with hummer, described field effect is P type field effect transistor.
In the present invention, the input end of optical coupling isolator is directly connected in power-supply circuit or circuit branch, when not having a power failure, and optical coupling isolator work, the voltage in resistance R 2 approaches field effect transistor Vdd, field effect transistor cut-off, warning device hummer is not worked.Electric capacity, for stablizing the voltage of fet gate, prevents that alternating voltage zero-crossing from change too greatly grid voltage and producing misoperation.When circuit or branch road power-off, optical coupling isolator is not worked, field effect transistor conducting, and warning circuit is started working.
For optical coupling isolator is protected, the input end of described optical coupling isolator is connected with resistance R 1.1 metering function of resistance R, avoids that electric current is excessive to cause damage to optical coupling isolator.
For better protection is to optical coupling isolator, the resistance of described resistance R 1 is 45 kilohms-50 kilohms.
For field effect transistor is protected, the grid of described field effect transistor is connected on the output terminal of optical coupling isolator by resistance R 4.The same metering functions that rise of resistance R 4, avoid that electric current is excessive to cause damage to field effect transistor.
In order further to strengthen performance of the present invention, the model of described optical coupling isolator is TLP126.The superior performance of TLP126, power consumption is little, and reliability is high, can improve the overall performance of this circuit.
Be as mentioned above embodiments of the invention.The present invention is not limited to above-mentioned embodiment, and anyone should learn the structural change of making under enlightenment of the present invention, and every have identical or close technical scheme with the present invention, within all falling into protection scope of the present invention.
Claims (5)
1. an outage condition testing circuit, it is characterized in that: it comprises optical coupling isolator and field effect transistor, between the output terminal of described optical coupling isolator and ground, be connected with resistance R 2, the output terminal of described optical coupling isolator is connected on the grid of field effect transistor, between the grid of described field effect transistor and ground, be connected with electric capacity, the drain electrode of described field effect transistor is connected with power supply by resistance R 3, the drain electrode of described field effect transistor is connected on the negative electrode of diode, on the source electrode of the anodic bonding being on the scene effect pipe of described diode, between the source electrode of described field effect transistor and ground, be connected with hummer, described field effect is P type field effect transistor.
2. a kind of outage condition testing circuit according to claim 1, is characterized in that: the input end of described optical coupling isolator is connected with resistance R 1.
3. a kind of outage condition testing circuit according to claim 2, is characterized in that: the resistance of described resistance R 1 is 45 kilohms-50 kilohms.
4. a kind of outage condition testing circuit according to claim 1, is characterized in that: the grid of described field effect transistor is connected on the output terminal of optical coupling isolator by resistance R 4.
5. a kind of outage condition testing circuit according to claim 1, is characterized in that: the model of described optical coupling isolator is TLP126.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310587279.3A CN103558501A (en) | 2013-11-21 | 2013-11-21 | Outage condition detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310587279.3A CN103558501A (en) | 2013-11-21 | 2013-11-21 | Outage condition detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103558501A true CN103558501A (en) | 2014-02-05 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310587279.3A Pending CN103558501A (en) | 2013-11-21 | 2013-11-21 | Outage condition detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103558501A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0435371A2 (en) * | 1989-12-19 | 1991-07-03 | Philips Patentverwaltung GmbH | Power supply device with non-symmetric monitoring |
| CN101743674A (en) * | 2007-05-22 | 2010-06-16 | 菲尼克斯电气公司 | Circuit arrangement for fault notification |
| CN102332699A (en) * | 2011-07-28 | 2012-01-25 | 深圳市良辉科技有限公司 | Ground wire safety voltage control system |
| CN202305717U (en) * | 2011-10-13 | 2012-07-04 | 瑞谷科技(深圳)有限公司 | AC power failure quick detection circuit |
| JP2012145363A (en) * | 2010-11-03 | 2012-08-02 | Easymore Industrial Co Ltd | Failure detection and protection circuit of dc power supply system |
| CN203572908U (en) * | 2013-11-21 | 2014-04-30 | 成都市宏山科技有限公司 | Power-failure status detection alarm circuit |
-
2013
- 2013-11-21 CN CN201310587279.3A patent/CN103558501A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0435371A2 (en) * | 1989-12-19 | 1991-07-03 | Philips Patentverwaltung GmbH | Power supply device with non-symmetric monitoring |
| CN101743674A (en) * | 2007-05-22 | 2010-06-16 | 菲尼克斯电气公司 | Circuit arrangement for fault notification |
| JP2012145363A (en) * | 2010-11-03 | 2012-08-02 | Easymore Industrial Co Ltd | Failure detection and protection circuit of dc power supply system |
| CN102332699A (en) * | 2011-07-28 | 2012-01-25 | 深圳市良辉科技有限公司 | Ground wire safety voltage control system |
| CN202305717U (en) * | 2011-10-13 | 2012-07-04 | 瑞谷科技(深圳)有限公司 | AC power failure quick detection circuit |
| CN203572908U (en) * | 2013-11-21 | 2014-04-30 | 成都市宏山科技有限公司 | Power-failure status detection alarm circuit |
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Application publication date: 20140205 |