CN103474011B - The measuring appliance of display panel reaction velocity and correlation technique - Google Patents
The measuring appliance of display panel reaction velocity and correlation technique Download PDFInfo
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Abstract
The present invention relates to a kind of measuring appliance, in order to measure the reaction velocity of a display panel, comprise a microcontroller and an OPTICAL SENSORS.Microcontroller provides a steering order, makes the display controller of display panel provide test pictures data according to steering order to display panel.OPTICAL SENSORS sensing display panel corresponds to the test pictures of these test pictures data, and provides the sensing signal of a correspondence, and this sensing signal is associated with brightness and a reaction signal.This reaction signal can in order to calculate the reaction velocity of this display panel.Correlation technique also discloses in the lump.
Description
Technical field
The invention relates to a kind of measuring appliance of display panel reaction velocity and relevant measuring method, and relate to a kind of display panel reaction timer of high-effect low cost and relevant measuring method especially.
Background technology
The audio-visual productss such as display panel, such as display panels are monitors, display, TV are presented the core parts of picture; In audio-visual products, be equipped with display controller, the content according to image to be shown provides picture (picture frame or frame) data to display panel, to present image frame to drive display panel.In order to ensure the quality of picture display, need the characteristic measuring display panel, make display controller can compensate the characteristic defective of display panel.Reaction velocity (responsetime) is namely a kind of very important display panel characteristic.For example, when switching to a secondary picture when display panel video display by a certain picture, if the reaction velocity of display panel is excessively slow, the phenomenons such as vision ghost will be caused, affect the quality of picture display.Display controller to cross the reaction velocity defect of driving compensating technique display panels such as (over-drive), but in order to correctly determine the degree compensated, can first must understand the reaction velocity of display panel itself.Therefore, how to measure the reaction velocity of display panel, also just become the research emphasis of modern information dealer.
But, the reaction velocity for display panel is measured, the solution that current industry is not good.For measuring the reaction velocity of display panel, the test pictures that display panel switches the different GTG of display need be controlled, and measure the picture quality that display panel institute actual displayed goes out, such as brightness.But known technology there is no method and effectively integrates " display panel control " and " picture quality is measured " these two keys.Moreover because the application such as 3-dimensional image day by day come into one's own, the turnover rate of display panel image switching is also more and more higher.In order to measure the reaction velocity of display panel under Gao Gengxin rate, display panel must be controlled and switch the different test pictures of display with Gao Gengxin rate; The display panel that existing known technology is then difficult to realize Gao Gengxin rate controls.
Summary of the invention
For overcoming the shortcoming of known technology, the reaction velocity measurement that the present invention is display panel provides one preferably solution, and can effectively integrate display panel and control to measure with picture quality, the reaction velocity that also can be applied under Gao Gengxin rate is measured.
An object of the present invention is to provide a kind of measuring appliance, in order to measure the reaction velocity of a display panel.Display panel couples and is controlled by a display controller.Measuring appliance then comprises a microcontroller, one or more OPTICAL SENSORS (photosensor), a signal amplifier and a converter.Microcontroller couples display controller, and provides a steering order according to a test command to display controller, and make display controller be able to according to steering order and provide test pictures data to display panel, each test pictures data correlation is in a test pictures; In one embodiment, steering order can make display controller automatically to the display panel periodically staggered test pictures data providing multiple different GTG.OPTICAL SENSORS in order to sense, display panel is relevant to the test pictures of test pictures data, and provides the sensing signal of a correspondence.Sensing signal is associated with brightness and a reaction signal.Signal amplifier couples OPTICAL SENSORS, in order to adjust the size of sensing signal, to produce one first signal.Converter is coupled between signal amplifier and microcontroller, in order to the first signal is converted to a secondary signal, and secondary signal is transferred to microcontroller.According to secondary signal, microcontroller can provide the measurement result of a correspondence.Wherein, the first signal and secondary signal can be a simulating signal and a digital signal respectively, and converter is then an analog-to-digital converter.
In one embodiment, when display controller sends test pictures data to display panel, an interruption (interrupt) signal can be sent to microcontroller in the lump, in order to indicate the sequential of test pictures; That is look-at-me is associated with the sequential of each test pictures data, in order to this measuring appliance synchronous and this display controller.Microcontroller can receive this look-at-me by display controller.
In one embodiment, measuring appliance comprises multiple OPTICAL SENSORS, and each OPTICAL SENSORS all in order to sense the picture of display panel display, and provides corresponding sensing signal.For example, different OPTICAL SENSORS can be used to the brightness sensing diverse location in same panel.Measuring appliance more can comprise a multiplexer, be coupled between each OPTICAL SENSORS and signal amplifier, optionally one of them of the sensing signal of all OPTICAL SENSORS is associated to reaction signal, makes reaction signal transfer to microcontroller via signal amplifier and converter.For example, multiplexer can make the sensing signal of different OPTICAL SENSORS be chosen as reaction signal and transfer to signal amplifier in turn.
In one embodiment, measuring appliance more comprises a gain control unit, couples signal amplifier, in order to adjust the gain of signal amplifier, makes the range of signal of the first signal be met the dynamic range (dynamicrange) of converter.For example, before measurement reaction velocity, microcontroller can make display panel show white picture (most high gray) via steering order, and measures its brightness by OPTICAL SENSORS, produces corresponding sensing signal; If this sensing signal has exceeded the dynamic range of converter after the gain of signal amplifier is amplified, gain control unit can reduce the gain of signal amplifier; If not yet reach the upper limit of dynamic range, then can increase the gain of signal amplifier.In one embodiment, signal amplifier can be the amplifier that an available digital signal controls its gain.
In one embodiment, measuring appliance comprises a mainboard and an external daughter board.Mainboard is in order to carry microcontroller, multiplexer, signal amplifier and converter; External daughter board is then coupled to mainboard via signal wire, in order to carry OPTICAL SENSORS.Different OPTICAL SENSORS can be installed on different external daughter boards.In one embodiment, OPTICAL SENSORS is installed on external daughter board in pluggable mode; Plug uses different types of OPTICAL SENSORS, can carry out different feature measurements, expands the function of measuring appliance, to meet follow-up newly-increased measurement demand.In one embodiment, the signal wire of different length between external daughter board and mainboard, can be used, to be applied on the display panel of different size, coordinate factory to produce line allotment Production requirement.
Measuring appliance more can comprise an interface port, is coupled to microcontroller, in order to be connected to a computer.Interface port can receive the test command sent by computer, and transfers to microcontroller.Interface port also can export the measurement result of measuring appliance to computer.Computer can run a testing tool formula, with the carrying out of automatically control survey.
Another object of the present invention is to provide a kind of measuring method of display panel reaction velocity, for coordinating a display controller with a measuring appliance, to measure a display panel; The method comprises: export a steering order to display controller, makes display controller provide test pictures data to display panel; An OPTICAL SENSORS sensing display panel to correspond to a test pictures of test pictures data, to produce a corresponding sensing signal, it is associated with brightness; And, export a reaction signal according to sensing signal; Wherein, reaction signal is in order to calculate the reaction velocity of display panel.
In one embodiment, steering order can be provided according to a test command to display controller; Wherein, steering order makes display controller periodically interlock and provides multiple test pictures data.
In one embodiment, can receive a look-at-me by display controller, this look-at-me is associated with the sequential of test pictures data, in order to synchro measure device and display controller.
In one embodiment, available one second OPTICAL SENSORS senses the picture of this display panel display, and to produce the second sensing signal of a correspondence, this second sensing signal is also associated with brightness; Further, with a multiplexer optionally according to one of them output-response signal of sensing signal and the second sensing signal.
In one embodiment, the reaction velocity of display panel calculates according to test pictures and corresponding reaction signal.
In order to have better understanding to above-mentioned and other aspect of the present invention, preferred embodiment cited below particularly, and coordinating accompanying drawing, being described in detail below:
Accompanying drawing explanation
Fig. 1 signal be measuring appliance according to one embodiment of the invention.
What Fig. 2 illustrated is the schematic diagram that Fig. 1 measuring appliance carries out measuring.
Main element symbol description
10: measuring appliance
12: signal amplifier
14: converter
16: gain control unit
18: mainboard
20: microcontroller
22: multiplexer
24-26: interface port
28: display panel
30: display controller
32: computer
K [.]: OPTICAL SENSORS
B [.]: external daughter board
L [.]: signal wire
A [.]: sensing signal
S1-S2: signal
S3: measurement result
S0: reaction signal
CMD: test command
SQ: look-at-me
SC: steering order
TP1, TP2: test pictures data
T: cycle
T1-t4: time point
Lv1-Lv2: GTG
Embodiment
Please refer to Fig. 1, what it was illustrated is according to the measuring appliance 10 of one embodiment of the invention, such as, in order to measure the characteristic of a display panel 28, reaction velocity.Display panel 28 couples and is controlled by a display controller 30, such as a display and control wafer.Include in measuring appliance 10 N number of OPTICAL SENSORS K [n] (n=1 to N, N be more than or equal to 1 integer), multiplexer 22, signal amplifier 12, converter 14, gain control unit 16 and a microcontroller 20.Multiplexer 22, signal amplifier 12, converter 14, gain control unit 16 can be installed on a mainboard 18 with microcontroller 20; Each OPTICAL SENSORS K [n] then can be installed on an external daughter board B [n] separately, and each external daughter board B [n] is coupled to mainboard 18(n=1 to N via a signal wire L [n]).Measuring appliance 10 is also provided with interface port 24 and 26.
In measuring appliance 10, a computer 32 is through interface port 26(such as universal serial bus interface port, i.e. a USB interface port) be coupled to microcontroller 20, make microcontroller 20 energy and computer 32 exchange data, such as numerical data.Computer 32 can be a PC, can run a testing tool formula, automatically to control the carrying out of display panel feature measurement.Interface port 26 can receive the test command CMD that computer 32 sends, and transfers to microcontroller 20.
Measuring appliance 10 is coupled to display controller 30 via interface port 24, make microcontroller 20 can and display controller 30 exchange message and information, such as digital message and information.Via interface port 24, microcontroller 20 couples display controller 30, and provide a steering order SC according to test command CMD to display controller 30, display controller 30 is made to be able to according to steering order SC and automatically to provide one or more test pictures data to display panel 28, as test pictures data TP1, TP2 etc.; The test pictures of each test pictures data in order to make display panel 28 show an association.In one embodiment, steering order SC can make display controller 30 automatically provide the different GTG test pictures data of a succession of cycle staggering to display panel 28.In another embodiment, when display controller 30 sends test pictures data to display panel 28, an interruption (interrupt) signal SQ can be sent, in order to indicate the sequential of test pictures to microcontroller 20 in the lump; That is look-at-me SQ is associated with the sequential of each test pictures data.Microcontroller 20 can receive this look-at-me SQ via interface port 24 by display controller 30.
In one embodiment, the switching cycle T of the test pictures that steering order SC can specify display controller 30 to produce, and red, the green and blue component of one first test pictures and red, the green and blue component of one second test pictures; Such as, red, the green and blue component of the first test pictures all can equal one first numerical value with the test pictures of corresponding one first GTG, and red, the green and blue component of the second test pictures all can equal a second value with the test pictures of corresponding one second GTG; First GTG and the second GTG can be different.In this embodiment, according to the switching cycle T specified by steering order SC, first display controller 30 provides the first test pictures data to show the first test pictures to make display panel 28, sends a look-at-me SQ to microcontroller 20 simultaneously; Then, after cycle T, provide the second test pictures data to make display panel 28 switch display second test pictures, also send look-at-me SQ to microcontroller 20 simultaneously; After another cycle T, display panel 28 first test pictures data are provided again, and similarly send look-at-me SQ to microcontroller 20; And in after another cycle T, display panel 28 second test pictures data are provided again, and send look-at-me SQ again to microcontroller 20.So periodically repeat to switch, until display controller 30 receives next steering order SC by microcontroller 20.In one embodiment, red, the green and blue component that the test pictures data of display controller 30 can specify it to show for each pixel of display panel 28 respectively.For example, the first test pictures data can be make the specific pixel of display panel 28 show the first GTG, and rest of pixels shows the second GTG.Second test pictures data can make specific pixel display the 3rd GTG of display panel 28, rest of pixels display the 4th GTG.
The picture that OPTICAL SENSORS K [n] shows in order to sense display panel 28, the brightness that such as display panel 28 sends in local, and provide the sensing signal a [n] of a correspondence, to n=1 to N.In one embodiment, different OPTICAL SENSORS K [n] can be used to sense the brightness that same display panel produces in diverse location.Multiplexer 22 is coupled between each OPTICAL SENSORS a [n] and signal amplifier 12, optionally make the sensing signal a [n] of different OPTICAL SENSORS K [n] be transferred to signal amplifier 12 in turn, this sensing signal a [n] being transferred to signal amplifier 12 is as a reaction signal S0.According to a gain, signal amplifier 12 is in order to the sensing signal a [n] (n be 1 to N one of them) selected by multiplexer 22, i.e. previous reaction signal S0, carries out the adjustment of signal magnitude, to produce the signal S1 of a correspondence.Converter 14 is coupled between signal amplifier 12 and microcontroller 20, in order to signal S1 is converted to signal S2, and signal S2 is transferred to microcontroller 20.Basis signal S2, microcontroller 20 can provide the measurement result S3 of a correspondence.Wherein, sensing signal a [n] and signal S1 can be simulating signals, and converter 14 is an analog-to-digital converter, therefore signal S2 can be digital signal, and measurement result S3 is digital information.Interface port 26 also can export the measurement result S3 of measuring appliance 10 to computer 32.According to reaction signal S0 with the signal S2 that derives or measurement result S3, microcontroller 20 and/or computer 32 just can calculate/count the characteristic of display panel 28, such as reaction velocity and/or reaction time.
In one embodiment, measuring appliance 10 comprises gain control unit 16, couple signal amplifier 12, in order to adjust the gain (gain namely between signal S1 and sensing signal a [n]) of signal amplifier 12, make the range of signal of signal S1 be met the dynamic range of converter 14.When a signal to be converted is converted to the converted signals of a correspondence by converter 14, namely the up/down limit of its dynamic range is associated with the extreme value (greatly/little value) of converted signals.If signal to be converted has certain a part of effusion dynamic range, the part of effusion dynamic range can be cut off as extreme value in signal after conversion, makes converted signals distortion and correctly cannot follow the change of this part.Relatively, if the amplitude of fluctuation of signal to be converted (range of signal) is much smaller than dynamic range, then the transformed error (as quantization error) of converted signals can be made to increase.Therefore, the range of signal of signal to be converted should meet the dynamic range of converter 14, makes corresponding converted signals can not distortion, and quantization error also can not be excessive.
In one embodiment, signal amplifier 12 can be the amplifier that an available digital signal controls its gain, and accordingly, gain control unit 16 is namely with the gain of Digital Signals signal amplifier 12.Gain control unit 16 can use hardware, firmware or software simulating; For example, the function of gain control unit 16 can perform firmware by microcontroller 20 and realize.It should be noted, in other embodiments, the gain of signal amplifier can preset, and therefore measuring appliance can omit gain control unit.In other words, gain control unit is not the necessary element of measuring appliance of the present invention.
Coordinate display controller 30 with measuring appliance 10 and be that display panel 28 carries out the method for feature measurement (as reaction velocity) and flow process can be described below.Computer 32 send to measuring appliance 10 open the beginning test command CMD to start measurement procedure.Before actual measurement display panel characteristic, microcontroller 20 controls display controller 30 by steering order SC, display panel 28 is made to show the white picture of most high gray (the brightest) by display controller 30, and measure its brightness by each OPTICAL SENSORS K [n], to produce corresponding sensing signal a [n]; If the signal S1 of sensing signal a [n] after the gain of signal amplifier 12 is amplified has exceeded the dynamic range of converter 14, gain control unit 16 can reduce the gain of signal amplifier 12; If not yet reach the upper limit of dynamic range, then can increase the gain of signal amplifier 12.After correcting thus, the range of signal of signal S1 just can meet the dynamic range of converter 14, fully to use the digital conversion resolution of converter 14.
After the gain of correction signal amplifier 12, computer 32 can indicate microcontroller 20 to start to carry out feature measurement via test command CMD, such as, test the reaction velocity that display panel 28 switches between the first GTG and the second GTG.Microcontroller 20 can send corresponding steering order SC to display controller 30, make the display panel 28 periodically test pictures of Alternation Display first GTG and the test pictures of the second GTG, and return a look-at-me SQ when each switch test picture to microcontroller 20.When display panel 28 shows test pictures, each OPTICAL SENSORS K [n] also measures.According to look-at-me SQ, the timing synchronization that microcontroller 20 can switch with picture, controls the switching of multiplexer 22 and the output of reaction signal S0 according to this, and collects signal S2, to integrate out measurement result S3 according to the sequential that picture switches.Measurement result S3 can be back to computer 32; If the testing tool formula of computer 32 judges to have obtained enough measurement results, just can send another test command CMD, such as, be the reaction velocity that test display panel 28 switches between the 3rd GTG and the 4th GTG.According to this test command CMD, microcontroller 20 can send another steering order SC, allows display controller 30 change and makes display panel 28 periodically repeatedly switch the test pictures of display the 3rd GTG and the 4th GTG.
As long as the microcontroller 20 due to measuring appliance 10 just can make display controller 30 automatically switch according to the cycle of specifying with single steering order SC provide multiple different test pictures, measuring appliance 10 is applicable to the display panel test of Gao Gengxin rate.The display controller 30 of Gao Gengxin rate because the display panel 28 of Gao Gengxin rate can be arranged in pairs or groups, and the function of Gao Gengxin rate display controller 30 itself is exactly the picture data that will coordinate the display panel 28 of Gao Gengxin rate and provide high frequency, high speed, therefore display controller 30 natural energy provides the test pictures data switched fast according to Gao Gengxin rate; Relatively, the test pictures data of high frequency, Gao Gengxin rate just need be provided by the microcontroller 20 of measuring appliance 10 yet.So, the cost of measuring appliance 10 just can reduce.Display controller 30 can perform suitable firmware to understand and to perform the steering order SC of microcontroller 20.
Moreover measuring appliance 10 can effectively integrate " display panel control " and " picture quality is measured " these two keys; Display panel controls to reach via steering order SC, and picture quality is measured and then synchronously can be integrated according to look-at-me SQ.Via the test command of computer 32, the feature measurement of display panel can robotization, reduces the manpower burden of tester, promotes the overall efficiency of display panel test.
In one embodiment, OPTICAL SENSORS K [n] is installed on external daughter board B [n] in pluggable mode; Different types of OPTICAL SENSORS is changed in plug, can carry out different feature measurements, expands the function of measuring appliance 10, to meet follow-up newly-increased measurement demand.For example, be furnished with the OPTICAL SENSORS of filter if change, just can in order to measure the brightness of a certain colouring component of display panel (such as red).In one embodiment, the signal wire L [n] of different length between each external daughter board B [n] and mainboard 18, can be used, to be applied on the display panel of different size, coordinate factory to produce line allotment Production requirement.For example, to test the display panel of large-size, longer signal wire L [n] can be used; Moreover, more OPTICAL SENSORS K [n] also can be used to test more how different positions.
Please refer to Fig. 2, what it illustrated is the schematic diagram carrying out display panel feature measurement according to one embodiment of the invention.Under the control of microcontroller 20, display controller 30 automatically makes display panel 28 repeatedly switch the test pictures of display GTG Lv1 and Lv2, such as say it is the test pictures showing GTG Lv1 at time point t1, the test pictures of display GTG Lv2 is switched at time point t2, the test pictures of GTG Lv1 is shown once again at time point t3, and the test pictures of display Lv2 is switched in time point t4, by that analogy.Time point t1, time interval between t2, t3 and t4 are cycle T.Accordingly, each OPTICAL SENSORS K [n] can measure the brightness that display panel 28 reality produces; Changed the reaction velocity can knowing display panel 28 by inference by brightness, and then display controller 30 can be compensated for the defect of reaction velocity.Microcontroller 20 can specify the numerical values recited of GTG Lv1, Lv2 and the length of cycle T via steering order SC; The sequential of time point t1 to t4 then can be learnt by look-at-me SQ.
In summary, compared to known display panel feature measurement technology, measuring technique of the present invention can effectively integrate display panel and control to measure with picture quality, and can reduce measuring appliance cost.Measuring technique of the present invention can robotization to heavens, reduces the human resources needed for test and cost.Moreover measurement of the present invention configuration also can have high flexibility and extendibility, be enough to be widely used in different update rate, the various display panel of different size and various different types of display characteristic and measure.
In sum, although the present invention with preferred embodiment disclose as above, so itself and be not used to limit the present invention.Persond having ordinary knowledge in the technical field of the present invention, without departing from the spirit and scope of the present invention, when being used for a variety of modifications and variations.Therefore, protection scope of the present invention is as the criterion when being defined by claims.
Claims (13)
1. a measuring appliance, in order to measure the reaction velocity of a display panel; This display panel couples a display controller, and this measuring appliance comprises:
One microcontroller, couples this display controller, provides a steering order to this display controller, makes this display controller provide test pictures data according to this steering order to this display panel; And
One OPTICAL SENSORS, in order to sense the test pictures this display panel being relevant to these test pictures data, to provide a corresponding sensing signal, this sensing signal is associated with brightness and a reaction signal, and this reaction signal is in order to calculate the reaction velocity of this display panel;
Wherein, this microcontroller also receives a look-at-me by this display controller, and this look-at-me is associated with the sequential of these test pictures data, in order to this measuring appliance synchronous and this display controller.
2. measuring appliance as claimed in claim 1, is characterized in that, this steering order makes this display controller periodically interlock and provides these test pictures data multiple.
3. measuring appliance as claimed in claim 1, is characterized in that, also comprise:
One multiplexer, is coupled to this OPTICAL SENSORS; And
One second OPTICAL SENSORS, is coupled to this multiplexer, the picture shown corresponding to this display panels of this test pictures of this test pictures data in order to sensing, and provides the second sensing signal of a correspondence, and this second sensing signal is associated with brightness;
Wherein, one of them of this sensing signal and this second sensing signal is optionally closed and is connected to this reaction signal and transfers to this microcontroller by this multiplexer.
4. measuring appliance as claimed in claim 1, is characterized in that, also comprise:
One signal amplifier, couples this OPTICAL SENSORS, in order to adjust the size of this sensing signal to produce one first signal;
One converter, is coupled between this signal amplifier and this microcontroller, in order to this first signal is converted to a secondary signal, and this secondary signal is transferred to this microcontroller; And
One gain control unit, couples this signal amplifier, in order to adjust a gain of this signal amplifier, makes a range of signal of this first signal meet a dynamic range of this converter.
5. measuring appliance as claimed in claim 4, it is characterized in that, this first signal and this secondary signal are respectively a simulating signal and a digital signal, and this converter is an analog-to-digital converter.
6. measuring appliance as claimed in claim 4, is characterized in that, also comprise:
One mainboard, in order to carry this microcontroller, this signal amplifier and this converter; And
One external daughter board, is coupled to this mainboard, in order to carry this OPTICAL SENSORS.
7. measuring appliance as claimed in claim 6; It is characterized in that, this OPTICAL SENSORS is installed on this external daughter board in pluggable mode.
8. measuring appliance as claimed in claim 1, is characterized in that, also comprise:
One interface port, is coupled to this microcontroller, in order to receive a test command, and transfers to this microcontroller.
9. measuring appliance as claimed in claim 4, it is characterized in that, this microcontroller also can provide the measurement result of a correspondence according to this secondary signal, and this measuring appliance also comprises:
One interface port, is coupled to this microcontroller, in order to export this measurement result.
10. a display panel reaction velocity measuring method, for coordinating a display controller to measure a display panel with a measuring appliance, the method comprises:
One steering order is exported to this display controller, makes this display controller provide test pictures data to this display panel;
Sense the test pictures this display panel corresponding to these test pictures data, to produce a corresponding sensing signal, this sensing signal is associated with brightness;
Receive a look-at-me by this display controller, this look-at-me is associated with the sequential of these test pictures data, in order to this measuring appliance synchronous and this display controller; And
A reaction signal is exported according to this sensing signal; Wherein, this reaction signal is in order to calculate the reaction velocity of this display panel.
11. measuring methods as claimed in claim 10, is characterized in that, also comprise and provide this steering order according to a test command to this display controller; Wherein, this steering order makes this display controller periodically interlock and provides these test pictures data multiple.
12. measuring methods as claimed in claim 10, is characterized in that, also comprise:
Sense the picture of this display panel display, to produce the second sensing signal of a correspondence, this second sensing signal is associated with brightness; And
Optionally export this reaction signal according to one of them of this sensing signal and this second sensing signal.
13. measuring methods as claimed in claim 10, is characterized in that, the reaction velocity of this display panel calculates according to this test pictures and this reaction signal.
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| CN104266754B (en) * | 2014-09-29 | 2016-10-05 | 深圳市华星光电技术有限公司 | Measure adjustment circuit, method and the optical measuring system of optical parametric |
| CN106710493A (en) * | 2015-08-03 | 2017-05-24 | 冠捷投资有限公司 | Method of measuring display device comprehensively |
| CN106291192A (en) * | 2016-08-22 | 2017-01-04 | 青岛海信电器股份有限公司 | The method of testing of a kind of interactive infrared touch one-piece machine response delay and device |
| CN106353613A (en) * | 2016-08-22 | 2017-01-25 | 青岛海信电器股份有限公司 | Method and device for testing response time delay of interactive infrared touch integrated machine |
| CN109003569B (en) * | 2018-07-16 | 2022-03-11 | 广州视源电子科技股份有限公司 | Method, device and equipment for determining tail time of display equipment and storage medium |
| CN110780143A (en) * | 2019-11-18 | 2020-02-11 | 西安闻泰电子科技有限公司 | Touch time delay test equipment and method |
| CN111402769B (en) * | 2020-04-14 | 2023-05-02 | 深圳市华星光电半导体显示技术有限公司 | Method for judging response speed of display panel |
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Effective date of registration: 20201022 Address after: No. 1, Xingzhu Road, Hsinchu Science Park, Taiwan, China Patentee after: MEDIATEK Inc. Address before: 405, 4th floor, 1st District, Shenzhen Bay science and technology ecological park, Aohai street, Nanshan District, Shenzhen City, Guangdong Province Patentee before: Mstar Semiconductor,Inc. Patentee before: MEDIATEK Inc. Effective date of registration: 20201022 Address after: 405, 4th floor, 1st District, Shenzhen Bay science and technology ecological park, Aohai street, Nanshan District, Shenzhen City, Guangdong Province Patentee after: Mstar Semiconductor,Inc. Patentee after: MEDIATEK Inc. Address before: 518057 Guangdong city of Shenzhen province Nanshan District Gao Xin Road China science and Technology Development Institute of Technology Park Building No. three tower 4-5 No. Patentee before: Mstar Semiconductor,Inc. Patentee before: MSTAR SEMICONDUCTOR Inc. |