CN110780143A - Touch time delay test equipment and method - Google Patents

Touch time delay test equipment and method Download PDF

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Publication number
CN110780143A
CN110780143A CN201911125313.9A CN201911125313A CN110780143A CN 110780143 A CN110780143 A CN 110780143A CN 201911125313 A CN201911125313 A CN 201911125313A CN 110780143 A CN110780143 A CN 110780143A
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module
touch
signal
time
driving
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宁新武
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Xian Wingtech Electronic Technology Co Ltd
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Xian Wingtech Electronic Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Abstract

The embodiment of the invention relates to the technical field of testing, and provides a touch time delay testing device and a method, wherein a driving module is used for triggering a first signal according to a control instruction and driving a touch input module to simulate and click an area corresponding to a tested element in a touch screen of a mobile terminal according to the first signal; the waveform testing module is used for receiving a first signal sent by the driving module and recording first time triggered by the first signal, receiving a second signal generated by a tested element based on the fact that the touch input module is stimulated to click a touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module; the control module is also used for outputting the touch time delay. Compared with the prior art, the method and the device for testing the time delay of the mobile terminal can obtain the delay time from the time when the touch screen is clicked to the time when the tested element of the mobile terminal is started, and the test of the system-level time delay is realized.

Description

Touch time delay test equipment and method
Technical Field
The invention relates to the technical field of testing, in particular to touch time delay testing equipment and a touch time delay testing method.
Background
As one of mainstream human-computer interaction technologies, the touch technology is widely applied to the field of intelligent mobile terminals, and has become an integral part of the daily life of people. At present, no mainstream intelligent mobile terminal adopts a touch screen, and a user can make a call, send a short message, read a book, send an email and other activities only by lightly clicking, sliding and other simple operations on the screen, and can experience various touch games.
The delay time is a key index for measuring the sensitivity of the touch system, and the accurate test of the delay time of the touch system has important guiding significance for the optimization of the touch system. In the prior art, the time delay of the touch screen can be tested only, and the system-level time delay can not be tested.
Disclosure of Invention
The invention aims to provide a touch time delay test device and a touch time delay test method, which can test the delay time from the time when a touch screen is clicked to the time when a tested element of a mobile terminal is started, and realize the test of system-level time delay.
In order to achieve the above purpose, the embodiment of the present invention adopts the following technical solutions:
in a first aspect, an embodiment of the present invention provides a touch delay testing device, including a control module, a waveform testing module, a driving module, and a touch input module, where the control module is electrically connected to the waveform testing module and the driving module, the waveform testing module is electrically connected to a tested element of a mobile terminal and the touch input module, and the driving module is electrically connected to the touch input module; the control module is used for sending a control instruction to the drive module when the tested element is tested; the driving module is used for triggering a first signal according to the control instruction and driving the touch input module to simulate and click an area corresponding to the element to be tested in the touch screen of the mobile terminal according to the first signal; the waveform testing module is used for receiving a first signal sent by the driving module and recording first time triggered by the first signal, receiving a second signal generated by a tested element based on the fact that the touch input module is stimulated to click a touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module; the control module is also used for outputting the touch time delay.
In a second aspect, an embodiment of the present invention provides a touch delay testing method, which is applied to the foregoing touch delay testing apparatus, and the method includes: the control module sends a control instruction to the driving module when testing the tested element; the driving module triggers a first signal according to the control instruction and drives the touch input module to simulate and click an area corresponding to the element to be tested in the touch screen of the mobile terminal according to the first signal; the waveform testing module receives a first signal sent by the driving module and records first time triggered by the first signal, and is used for receiving a second signal generated by a tested element based on the fact that the touch input module is stimulated to click a touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module; and the control module outputs the touch time delay.
Compared with the prior art, the embodiment of the invention provides a touch time delay test device and a method, a waveform test module records a first time triggered by a first signal for driving a touch input module to simulate to click a touch screen of a mobile terminal and a second time generated by a tested element based on a second signal generated by the touch input module when the touch input module simulates to click the touch screen, and calculates a time interval between the first time and the second time to obtain a touch time delay, wherein the touch time delay is delay time from the time of clicking the touch screen to the time of starting the tested element of the mobile terminal. Compared with the prior art, the embodiment of the invention can realize the test of the system-level time delay and provide test data for the optimization of the system-level time delay.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 shows a schematic structural diagram of a touch latency testing device according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of another touch delay testing device according to an embodiment of the present invention.
Fig. 3 shows a flowchart of a touch delay testing method according to an embodiment of the present invention.
Fig. 4 is a flowchart of the sub-steps of step S2 of fig. 3.
Icon: 10-touch delay test equipment; 101-a control module; 102-a drive module; 1021-a signal generator; 1022 — a drive circuit; 103-a touch input module; 104-a waveform testing module; 105-an input module; 106-an output module; 20-a mobile terminal; 201-the element under test.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that if the terms "upper", "lower", "inside", "outside", etc. indicate an orientation or a positional relationship based on that shown in the drawings or that the product of the present invention is used as it is, this is only for convenience of description and simplification of the description, and it does not indicate or imply that the device or the element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention.
Furthermore, the appearances of the terms "first," "second," and the like, if any, are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
It should be noted that the features of the embodiments of the present invention may be combined with each other without conflict.
As the touch screen in the mobile terminal is more and more widely used, the touch delay is a key index for measuring the sensitivity of a system, and therefore, the method is particularly important for testing the touch delay. In the prior art, the delay time of the touch screen is usually obtained by comparing the preset position of the painting brush with the preset position tested by the measuring instrument, and the delay time from the time when the touch screen is clicked to the time when a tested element of the mobile terminal is started is not tested.
In view of this, embodiments of the present invention provide a device and a method for testing touch latency, which are used to test a delay time from when a touch screen is clicked to when a device under test of a mobile terminal is turned on. This will be described in detail below.
Referring to fig. 1, fig. 1 is a schematic structural diagram illustrating a touch delay testing apparatus 10 according to an embodiment of the present invention. The touch delay test device 10 includes a control module 101, a driving module 102, a touch input module 103, and a waveform test module 104. The control module 101 is electrically connected to both the driving module 102 and the waveform testing module 104, the driving module 102 is electrically connected to the touch input module 103, and the waveform testing module 104 is electrically connected to both the tested device 201 and the touch input module 103 of the mobile terminal 20.
In this embodiment, the control module 101 is configured to send a control instruction to the driving module 102 when testing the device under test 201, where the control instruction includes test parameters required by the test, for example, a frequency and an amplitude of a first signal triggered by the driving module 102, and the test parameters may be default values stored in the control module 101 in advance. The control module 101 may be, but is not limited to, an integrated circuit chip having signal Processing capability, the control module 101 may be a general-purpose Processor including a Central Processing Unit (CPU), a Network Processor (NP), a voice Processor, a video Processor, etc., and may also be a digital signal Processor, an application specific integrated circuit, a field programmable gate array or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component. As an embodiment, the control module 101 may be, but is not limited to, a single chip.
In this embodiment, the driving module 102 is configured to trigger a first signal according to the control instruction, and drive the touch input module 103 to simulate clicking a touch screen of the mobile terminal 20 according to the first signal, where the first signal may be a preset voltage value. After receiving the control instruction sent by the control module 101, the driving module 102 triggers a first signal meeting the requirement of the control instruction, and sends the first signal to the touch input module 103, so that the touch input module 103 simulates clicking the touch screen of the mobile terminal 20. The driving module 102 may be composed of two independent functional modules of a functional module for triggering the first signal and a driving function, or may be a unified module integrating the function for triggering the first signal and the driving function.
In this embodiment, the touch input module 103 is configured to operate the touch screen of the mobile terminal 20 according to the first signal when receiving the first signal, so as to simulate clicking the touch screen of the mobile terminal 20. The touch input module 103 is pre-disposed in an area of the touch screen corresponding to the tested device 201, and the tested device 201 can be started by simulating and clicking the area of the touch screen corresponding to the tested device 201. The area corresponding to the device under test 201 may be a position where an icon corresponding to the device under test 201 is displayed on the touch screen display interface. Different tested elements 201 correspond to different areas in the touch screen. When the touch screen of the mobile terminal 20 is a capacitive screen, the capacitive screen utilizes current induction to change the capacitance value of the corresponding position of the screen to achieve the purpose of simulating clicking of the touch screen, at this time, the touch input module 103 is arranged above the touch screen and contacts with the touch screen, the touch input module 103 can be an electronic finger, and the electronic finger is a foil made of conductive metal. When the touch screen of the mobile terminal 20 is a resistive screen, the resistive screen achieves the purpose of simulating the click of the touch screen by changing the pressure of the corresponding position on the touch screen, at this time, the touch input module 103 may be disposed above the touch screen and in contact with the touch screen, or disposed above the touch screen and at a preset distance from the touch screen, the touch input module 103 may be an electronic pen, and the driving module 102 needs to drive the electronic pen to generate a pressure to the touch screen, so that the effect same as that of a real finger of a person clicking the touch screen is achieved.
In this embodiment, the device under test 201 of the mobile terminal 20 is activated to generate a second signal when the touch input module 103 simulates clicking the touch screen of the mobile terminal 20, wherein the second signal may be a voltage value greater than a preset threshold. The device under test 201 may be, but is not limited to, a motor, a speaker, a flashlight, etc. of the mobile terminal 20. For example, the tested component 201 is a speaker of the mobile terminal 20, and when the touch input module 103 simulates clicking an area corresponding to the speaker in the touch screen of the mobile terminal 20, the speaker is activated to generate a sound, and at this time, the speaker generates the second signal.
In this embodiment, since the waveform testing module 104 is electrically connected to the tested element 201, the waveform testing module 104 may obtain the second signal, and since the waveform testing module 104 is also electrically connected to the driving module 102, the waveform testing module 104 may further receive a first signal triggered by the driving module 102, the waveform testing module 104 records a first time for triggering the first signal and a second time for generating the second signal, and calculates a time interval between the first time and the second time, so as to obtain a touch delay, that is, a delay time from when the touch screen is clicked to when the tested element 201 of the mobile terminal 20 is turned on.
In the present embodiment, the waveform testing module 104 can be, but is not limited to, a digital oscilloscope, a sampling oscilloscope, a memory oscilloscope, etc.
On the basis of fig. 1, fig. 2 shows another structural form of the touch delay testing apparatus 10, please refer to fig. 2, and fig. 2 shows a schematic structural diagram of another touch delay testing apparatus 10 provided in the embodiment of the present invention. The driving module 102 in the touch delay test apparatus 10 includes a signal generator 1021 and a driving circuit 1022, wherein the signal generator 1021 is electrically connected with the driving circuit 1022 and the control module 101, and the driving circuit 1022 is electrically connected with the touch input module 103.
In this embodiment, the signal generator 1021 is configured to receive a control instruction sent by the control module 101, trigger a first signal according to the control instruction, and send the first signal to the driving circuit 1022. The first signal triggered by the signal generator 1021 may be a triangular wave, a sawtooth wave, a rectangular wave, or the like. According to the test parameters included in the control command, the signal generator 1021 may trigger a first signal satisfying a predetermined frequency, a predetermined amplitude, and a predetermined waveform. The signal generator 1021 may be, but is not limited to, a hardware with a trigger signal function, such as a crystal oscillator or a single chip.
In this embodiment, the driving circuit 1022 is configured to drive the touch input module 103 to simulate clicking the touch screen according to the first signal. According to the difference of the touch screen, the driving circuit 1022 may also be different, for example, when the touch screen is a capacitive touch screen, the driving circuit 1022 may be constructed by using a triode circuit or a single chip microcomputer, when the touch screen is a resistive touch screen, the driving module 102 may further include a physical element, and the driving circuit 1022 drives the physical element to drive the touch input module 103 to simulate clicking the touch screen.
In this embodiment, the touch delay test apparatus 10 further includes an input module 105, and the input module 105 is electrically connected to the control module 101. The input module 105 is used for receiving a test parameter, which may be, but is not limited to, a frequency, an amplitude, a waveform, etc., and sending the test parameter to the control module 101, and a user can set the test parameter through the input module 105. The input module 105 may be, but is not limited to, a keyboard, a touch screen, and the like.
In this embodiment, the control module 101 is further configured to send a control instruction to the signal generator 1021 according to the test parameter, and when the user inputs the test parameter through the input module 105, after receiving the test parameter, the control module 101 sends the control instruction to the signal generator 1021 according to the test parameter, so that the signal generator 1021 triggers the first signal meeting the requirement of the test parameter in the control instruction.
In this embodiment, the touch delay testing apparatus 10 further includes an output module 106, where the output module 106 is electrically connected to the control module 101, and the output module 106 is configured to output the touch delay under the control of the control module 101. The touch time delay can be output in a display mode or in a voice mode. When the touch delay is output by a display mode, the output module 106 may be, but is not limited to, a display, and the display may be, but is not limited to, an LED liquid crystal display, an LCD liquid crystal display, or the like. When the touch delay is output in a voice manner, the output module 106 may be, but is not limited to, a voice broadcaster, and the voice broadcaster may be a speaker, a loudspeaker, or the like.
It should be noted that the output module 106 may include both a display and a voice broadcaster.
As an embodiment, the output module 106 may also output the test parameters input by the user through the input module 105, so as to facilitate the user verification.
In order to clearly describe the work flow diagram of the touch delay testing device 10, an embodiment of the present invention further provides a touch delay testing method implemented by using the touch delay testing device 10, please refer to fig. 3, and fig. 3 shows a flow diagram of the touch delay testing method provided by the embodiment of the present invention, where the flow includes the following steps:
in step S1, the control module 101 sends a control command to the driving module 102 when testing the device under test 201.
In this embodiment, when testing the device under test 201, the control module 101 carries a control command of the test parameter and sends the control command to the driving module 102. The test parameter may be a default value pre-stored in the control module 101, or may be a value set by the user through the input module 105, where if the user does not set through the input module 105, the default value is used as the standard, and if the user sets through the input module 105, the value set by the user is used as the standard. For example, the default values are: the frequency is 12MHz, the amplitude is 5, the preset voltage threshold is 1.5, and when the user is not set, the test parameters in the control command are as follows: the frequency is 12MHz, the amplitude is 5, and the preset voltage threshold is 1.5. When the test parameters set by the user are as follows: the frequency is 15MHz, the amplitude is 8, the preset voltage threshold is 2, and the test parameters in the control command are as follows: the frequency is 15MHz, the amplitude is 8, and the preset voltage threshold is 2.
In step S2, the driving module 102 triggers a first signal according to the control instruction, and drives the touch input module 103 to simulate clicking an area corresponding to the detected component in the touch screen of the mobile terminal 20 according to the first signal.
In this embodiment, after receiving the control command, the driving module 102 triggers a first signal meeting the requirement of the test parameter in the control command.
As an embodiment, the first signal may be a preset voltage value, and the driving module 102 may periodically generate the preset voltage value to continuously perform simulated clicking on the touch screen of the mobile terminal 20, and finally obtain a plurality of touch delay test data. The generation period of the first signal may be determined by the frequency in the control command, for example, the frequency is 50Hz, and the period is 0.02 seconds, i.e., a preset voltage value is generated every 0.02 seconds.
In this embodiment, as an implementation manner, the driving module 102 includes a signal generator 1021 and a driving circuit 1022, the signal generator 1021 receives a control command sent by the control module 101, and triggers a first signal according to the control command, the driving circuit 1022 drives the touch input module 103 to simulate clicking on the touch screen according to the first signal, and step S2 includes sub-step S21 and sub-step S22.
Referring to fig. 4, fig. 4 is a flowchart illustrating the sub-steps of step S2 of fig. 3, wherein step S2 includes the following sub-steps:
in sub-step S21, the signal generator 1021 receives the control command sent by the control module 101, and triggers the first signal according to the control command and sends the first signal to the driving circuit 1022.
In the sub-step S22, the driving circuit 1022 drives the touch input module 103 to simulate clicking a region corresponding to the detected component in the touch screen according to the first signal.
In step S3, the waveform testing module 104 receives the first signal sent by the driving module 102 and records a first time triggered by the first signal, and is configured to receive a second signal generated by the tested component 201 based on the touch input module 103 and being stimulated when the touch input module simulates clicking the touch screen and records a second time generated by the second signal, and calculate a time interval between the first time and the second time to obtain a touch delay, and feed the touch delay back to the control module 101.
In this embodiment, the touch input module 103 stimulates the device 201 to be tested when the touch screen is clicked, the device 201 to be tested generates a second signal, the waveform test module 104 captures the second signal, the waveform test module 104 first determines whether the second signal is a signal generated by the device 201 to be tested being stimulated, and if so, records the time of the second signal.
As a specific embodiment, the second signal may be a voltage value greater than a preset threshold, and when the waveform test module 104 captures the second signal, it determines whether the second signal is greater than the preset threshold, and if so, it determines that the device 201 is activated and operated, and records the generation time of the second signal. In this embodiment, the preset threshold may be set by the input module 105, for example, if the preset threshold is 3, and the voltage value of the current second signal is 2.5, the waveform testing module 104 may determine that the second signal does not excite the device under test 201 to enter the working state, and may not record the time when the second signal occurs, and if the voltage value of the current second signal is 3.5, the waveform testing module 104 may determine that the second signal excites the device under test 201 to enter the working state, and the time when the second signal occurs is the second time.
In this embodiment, the waveform testing module 104 calculates a time interval between the first time and the second time, where the time interval is a touch delay, that is, a delay time from when the touch screen is clicked to when the device under test 201 of the mobile terminal 20 is turned on.
In step S4, the control module 101 outputs the touch delay.
In this embodiment, after receiving the touch delay sent by the waveform testing module 104, the control module 101 controls the output module 106 to output the touch delay.
In summary, the present invention provides a touch delay testing device and method, where the touch delay testing device includes a control module, a waveform testing module, a driving module and a touch input module, the control module is electrically connected to the waveform testing module and the driving module, the waveform testing module is electrically connected to a tested element of a mobile terminal and the touch input module, and the driving module is electrically connected to the touch input module; the control module is used for sending a control instruction to the drive module when the tested element is tested; the driving module is used for triggering a first signal according to the control instruction and driving the touch input module to simulate and click an area corresponding to the element to be tested in the touch screen of the mobile terminal according to the first signal; the waveform testing module is used for receiving a first signal sent by the driving module and recording first time triggered by the first signal, receiving a second signal generated by a tested element based on the fact that the touch input module is stimulated to click a touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module; the control module is also used for outputting the touch time delay. The method comprises the following steps: the control module sends a control instruction to the driving module when testing the tested element; the driving module triggers a first signal according to the control instruction and drives the touch input module to simulate and click an area corresponding to the element to be tested in the touch screen of the mobile terminal according to the first signal; the waveform testing module receives a first signal sent by the driving module and records first time triggered by the first signal, and is used for receiving a second signal generated by a tested element based on the fact that the touch input module is stimulated to click a touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module; and the control module outputs the touch time delay. Compared with the prior art, the method and the device for testing the time delay of the mobile terminal can obtain the delay time from the time when the touch screen is clicked to the time when the tested element of the mobile terminal is started, and the test of the system-level time delay is realized.
The above description is only for the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.

Claims (10)

1. A touch time delay test device is characterized by comprising a control module, a waveform test module, a driving module and a touch input module, wherein the control module is electrically connected with the waveform test module and the driving module;
the control module is used for sending a control instruction to the driving module when the tested element is tested;
the driving module is used for triggering a first signal according to the control instruction and driving the touch input module to simulate and click an area corresponding to the element to be tested in the touch screen of the mobile terminal according to the first signal;
the waveform testing module is used for receiving a first signal sent by the driving module and recording first time triggered by the first signal, receiving a second signal generated by the tested element based on the touch input module and being stimulated when the touch input module simulates to click the touch screen and recording second time generated by the second signal, calculating time intervals of the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module;
the control module is further used for outputting the touch time delay.
2. The touch delay test apparatus according to claim 1, wherein the driving module includes a signal generator and a driving circuit, the signal generator is electrically connected to the driving circuit and the control module, and the driving circuit is electrically connected to the touch input module;
the signal generator is used for receiving a control instruction sent by the control module, triggering a first signal according to the control instruction and sending the first signal to the driving circuit;
the driving circuit is used for driving the touch input module to simulate and click an area corresponding to the tested element in the touch screen according to the first signal.
3. The touch delay test apparatus of claim 2, wherein the signal generator is a crystal oscillator.
4. The touch delay test apparatus of claim 1, further comprising an input module, the input module being electrically connected to the control module;
the input module is used for receiving test parameters and sending the test parameters to the control module;
the control module is also used for sending a control instruction to the drive module according to the test parameters.
5. The touch latency test apparatus of claim 4, wherein the input module comprises a keyboard.
6. The touch delay test apparatus of claim 1, further comprising an output module, the output module being electrically connected to the control module;
the output module is used for outputting the touch time delay under the control of the control module.
7. The touch latency test apparatus of claim 6, wherein the output module includes a display.
8. The touch delay test apparatus of claim 1, wherein the touch input module comprises an electronic finger, the electronic finger being configured to cooperate with a capacitive touch screen.
9. A touch latency test method applied to the touch latency test apparatus of any one of claims 1 to 8, the method comprising:
the control module sends a control instruction to the driving module when testing the tested element;
the driving module triggers a first signal according to the control instruction, and drives the touch input module to simulate and click an area corresponding to the element to be tested in a touch screen of the mobile terminal according to the first signal;
the waveform testing module receives a first signal sent by the driving module and records first time triggered by the first signal, and is used for receiving a second signal generated by the tested element based on the touch input module and stimulated when the touch input module simulates to click the touch screen and recording second time generated by the second signal, calculating the time interval between the first time and the second time to obtain touch time delay, and feeding the touch time delay back to the control module;
and the control module outputs the touch time delay.
10. The touch delay test method of claim 9, wherein the driving module comprises a signal generator and a driving circuit, the signal generator is electrically connected to the driving circuit and the control module, and the driving circuit is electrically connected to the touch input module;
the driving module triggers a first signal according to the control instruction, and drives the touch input module to simulate and click the touch screen of the mobile terminal according to the first signal, wherein the steps comprise:
the signal generator receives a control instruction sent by the control module, triggers a first signal according to the control instruction and sends the first signal to the driving circuit;
the driving circuit drives the touch input module to simulate and click an area corresponding to the tested element in the touch screen according to the first signal.
CN201911125313.9A 2019-11-18 2019-11-18 Touch time delay test equipment and method Pending CN110780143A (en)

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CN112783707A (en) * 2021-01-26 2021-05-11 上海商米科技集团股份有限公司 Method and system for measuring click response time of touch screen

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Application publication date: 20200211