CN1924986A - Plane display adjusting method - Google Patents

Plane display adjusting method Download PDF

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Publication number
CN1924986A
CN1924986A CN 200610058005 CN200610058005A CN1924986A CN 1924986 A CN1924986 A CN 1924986A CN 200610058005 CN200610058005 CN 200610058005 CN 200610058005 A CN200610058005 A CN 200610058005A CN 1924986 A CN1924986 A CN 1924986A
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CN
China
Prior art keywords
test pattern
adjusting method
measurement data
plane display
display adjusting
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CN 200610058005
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Chinese (zh)
Inventor
沈毓铨
黄伟哲
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Novatek Microelectronics Corp
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Novatek Microelectronics Corp
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Publication date
Priority claimed from US11/162,114 external-priority patent/US20060279563A1/en
Application filed by Novatek Microelectronics Corp filed Critical Novatek Microelectronics Corp
Publication of CN1924986A publication Critical patent/CN1924986A/en
Pending legal-status Critical Current

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Abstract

The present invention relates to a plane display adjusting method comprising the following steps: initial setting the plane display and optical meter; delaying a preset time; displaying a test pattern on the plane display; delaying another preset time; repeatedly measuring the test pattern to obtain sufficient value by the optical measure till the enough data are obtained; repeatedly displaying the test pattern to show all the ones; finally, analyzing all the measuring value to calculate the correct parameters of the control circuit, and setting the parameters of the control circuit.

Description

Plane display adjusting method
Technical field
The present invention relates to a kind of plane display adjusting method, and be particularly related to a kind of plane display adjusting method that is used to set the control circuit parameter.
Background technology
Flat-panel screens (flat panel display), film liquid crystal display (thin filmtransistor liquid crystal display for example, abbreviate TFT LCD as), be made up of numerous optics, chemistry and circuit component, the change that wherein influences display characteristics such as brightness, color is because of extremely many.For example in the change aspect the control circuit (controller) because of comprising demoder (decoder), eliminate interleaving signal (de-interlace), and noise filtering (noise filtering).In the change aspect the LCD module because of comprising backlight (backlight), thin film transistor (TFT), colored filter (colorfilters).If part does not have its performance of strict keyholed back plate when a large amount of the manufacturing separately, the demonstration image quality between the last product is inevitable widely different.For the image quality difference of final products is controlled within the acceptable range, the manufacturer of manufacturing must carry out the school and transfer (calibration).Transfer or do not carry out if do not do the school, significant side effects will take place, for example color error ratio (color-bias), colour temperature mistake (color temperature error), contrasted low (low contrast) or GTG deviation (gray-bias) etc.
Flow process is transferred as shown in Figure 1 in traditional school.At first, show test pattern, obtain measurement data in step 104 with optics meter (optics meter) then, in step 106 analysis to measure data in step 102.Next, in the required correct parameter of step 108 calculating control circuit, and adjust the parameters of control circuit with result of calculation.At last, check in step 110 whether the school accent is finished.Further transfer in the school if desired, just get back to step 102 and repeat whole flow process, otherwise flow process so far finishes.
Traditional correcting and regulating method has many shortcomings.For example each test pattern is only measured once, is easy to generate error.Before the demonstration test pattern of step 102, and obtaining of step 104 all not have delay before the measurement data, and the unstable instantaneous meeting of flat-panel screens and optical metrology device causes error.In addition, multiple if desired test pattern or repeatedly measurement are to such an extent as to must repeatedly repeat can waste the time cost of many personnel and equipment from showing the tediously long flow process of test pattern, measurement, analysis adjustment parameter.
Summary of the invention
The purpose of this invention is to provide a kind of plane display adjusting method, its advantage is for obtaining the measurement data of multiple test pattern earlier, and collective analysis is once adjusted all parameters then, transfers flow process, the cost of saving time to quicken the school.
Another purpose of the present invention provides a kind of plane display adjusting method, can take multiple measurements at same test pattern, and collective analysis measurement data then is to reduce error.
Another object of the present invention provides a kind of plane display adjusting method, its advantage is for all having one period time delay, to get rid of the unstable instantaneous error that is caused of flat-panel screens and optical metrology device before showing test pattern and before obtaining measurement data.
A further object of the present invention provides a kind of plane display adjusting method, possesses the advantage of above three kinds of plane display adjusting methods simultaneously.
For reaching above-mentioned and other purpose, the present invention proposes a kind of plane display adjusting method, comprises the following steps: that (a) uses flat-panel screens to show a plurality of test patterns, and obtains the measurement data of above-mentioned test pattern; And, set the parameter of the control circuit of flat-panel screens (b) according to all measurement data.
For reaching above-mentioned and other purpose, the present invention proposes a kind of plane display adjusting method, comprises the following steps: that (a) uses flat-panel screens to show test pattern; (b) repeat to obtain the measurement data of test pattern, till measurement data is enough; And, set the parameter of the control circuit of flat-panel screens (c) according to all measurement data.
For reaching above-mentioned and other purpose, the present invention proposes a kind of plane display adjusting method, comprises the following steps: (a) initial setting flat-panel screens and optical metrology device.(b) postpone one section Preset Time.(c) use flat-panel screens to show test pattern.(d) postpone another section Preset Time.(e) use the optical metrology device to obtain the measurement data of test pattern.At last, (f) according to all measurement data, set the parameter of the control circuit of flat-panel screens.
For reaching above-mentioned and other purpose, the present invention proposes a kind of plane display adjusting method, comprises the following steps: (a) initial setting flat-panel screens and optical metrology device.(b) postpone one section Preset Time.(c) use flat-panel screens to show test pattern.(d) postpone another section Preset Time.(e) reuse the measurement data that the optical metrology device is obtained test pattern, till measurement data is enough.(f) check whether shown all test patterns.(g) if still have test pattern not show, then get back to step (c), show next test pattern.At last, (h) according to all measurement data, set the parameter of the control circuit of flat-panel screens.
As described in preferred embodiment of the present invention, plane display adjusting method of the present invention can take multiple measurements at same test pattern, and collective analysis measurement data then is so can reduce error.In addition, the present invention is the measurement data that obtains multiple test pattern earlier, and collective analysis is once adjusted all parameters then, does not need replicate analysis, adjustment, transfers flow process, the cost of saving time so can quicken the school.Moreover, flow process of the present invention is before showing test pattern and before obtaining measurement data, all have enter steady state (SS) one period time delay, so can get rid of the unstable instantaneous error that causes of flat-panel screens and optical metrology device to wait for flat-panel screens and optical metrology device.
For above and other objects of the present invention, feature and advantage can be become apparent, the present invention's cited below particularly preferred embodiment, and conjunction with figs. are described in detail below.
Description of drawings
Fig. 1 is traditional plane display adjusting method process flow diagram.
Fig. 2 is the hardware pipeline figure that is pursuant to the plane display adjusting method of one embodiment of the invention.
Fig. 3 is the operational flowchart that is pursuant to the plane display adjusting method of one embodiment of the invention.
The main element description of symbols
102~110: flow chart step
201: the test pattern generator
202: main frame
203: flat-panel screens
204: power module
205: the optical metrology device
206: debug in the school
207: the user interface
301~320: flow chart step
Embodiment
Fig. 2 is the hardware pipeline figure of plane display adjusting method according to an embodiment of the invention.In the present embodiment, debugging and 206 can accept user operation by user interface 207 in the school, controls whole flow process.At first, produce test pattern, offer main frame 202 by test pattern generator 201.Main frame 202 is accepted the power supply supply of power module 204, and drives flat-panel screens 203 to show test pattern.Then, by the test pattern that optical metrology device 205 measurement plane displays 203 show, obtain every data.At last, debug and 206 can collect above-mentioned measurement data in the school, analyzes, and the correlation parameter with the control circuit of flat-panel screens 203 is set at right value then.
The display characteristic that the general closed planar display needs the school to transfer has a variety of, for example brightness, color, striped demonstration etc.At different display characteristics, flat-panel screens 203 will show different test patterns, and optical metrology device 205 can produce different measurement data, and the control circuit parameter of accepting at last to adjust, set also is not quite similar.In the present embodiment, the kind of test pattern comprises complete black, complete white, GTG complete series, red complete series, green complete series, blue complete series, the colour of skin, sky blue, grass green, striped arrangement combination and dynamic image etc. at least.So-called " complete series " is meant the complete series color of same colour system, comprised from minimum to the highest various GTG values (gray scale).
Entire flow as for present embodiment please refer to Fig. 3.Fig. 3 is that flow process is from step 301 according to the operational flowchart of the plane display adjusting method of present embodiment.
At first, anti-ly copy inspection what step 301 carried out that the school debugs.Here anti-copied the project that inspection can comprise any amount, decides on user's demand, for example checks whether the password that the user inputs is correct, check anti-ly to copy device (the Key Pro (trade name) that for example is commonly called as) and whether exist, and other inspection.The specific hardware of will arranging in pairs or groups could be carried out if debug in the school, for example must carry out in embedded system (embedded system), above-mentioned anti-ly copy inspection and can also comprise checking whether hardware serial number is correct, and check whether the data (for example Yu She identification literal or number) that are stored in hardware are correct.If step 301 anti-copied inspection and pass through totally, just carry out next procedure 302.Otherwise if there is any one to prevent that copying inspection does not pass through, flow process just directly finishes.
Copy after the inspection by anti-, at step 302 initial setting flat-panel screens and optical metrology device, postpone one section Preset Time in step 304, use flat-panel screens to show first test pattern, postpone another section Preset Time in step 308 then in step 306.Next, use the optical metrology device to obtain the measurement data of test pattern in step 310.Check in step 312 whether the measurement data of present test pattern is enough then.If data not enough, flow process can be got back to step 310 to obtain more measurement data.If data are enough, just enter step 314.
Next, all test patterns whether had been shown step 314 inspection.If still there is test pattern not show, the step 316 of arriving is selected next pattern, gets back to step 306 then and shows next test pattern.Otherwise, if all test patterns showed all that flow process can enter step 318, analyze all measurement data, with the required correct parameter of the control circuit that calculates flat-panel screens.At last, be the right value that step 318 calculates in step 320 with the parameter setting of above-mentioned control circuit.
By above explanation as can be known, plane display adjusting method of the present invention can take multiple measurements at same test pattern, and collective analysis measurement data then is so can reduce error.In addition, the present invention is the measurement data that obtains multiple test pattern earlier, and collective analysis is once adjusted all parameters then, does not need replicate analysis, adjustment, transfers flow process, the cost of saving time so can quicken the school.Moreover, flow process of the present invention is before showing test pattern and before obtaining measurement data, all have enter steady state (SS) one period time delay, so can get rid of the unstable instantaneous error that causes of flat-panel screens and optical metrology device to wait for flat-panel screens and optical metrology device.
In addition, the present invention has multiple test pattern, can be used to the multiple display characteristic of school leveling face display, for example brightness, color, striped demonstration etc.And meeting of the present invention is at thinking that the display characteristic that transfer in the school collects measurement data, and changes the analytical calculation mode of data, to set corresponding control circuit parameter.But so the yield value (gain) that the present invention transfers except the prior art school and the shift value (offset), all other parameters that can also school regulation and control system circuit, it is more comprehensive that the school is transferred.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; any person of ordinary skill in the field; without departing from the spirit and scope of the present invention; when can doing a little change and improvement, so protection scope of the present invention is as the criterion when looking the claim person of defining.

Claims (29)

1. a plane display adjusting method is characterized in that comprising the following steps:
(a) use flat-panel screens to show a plurality of test patterns, and obtain the measurement data of above-mentioned these test patterns; And
(b), set the parameter of the control circuit of this flat-panel screens according to all measurement data.
2. the plane display adjusting method according to claim 1 is characterized in that also comprising before in step (a):
Carry out at least one and prevent copying inspection;
If above-mentioned/above-mentioned these prevent that copying inspection does not pass through, and then stops this plane display adjusting method totally.
3. the plane display adjusting method according to claim 2, it is characterized in that above-mentioned/above-mentioned these anti-copy inspection comprise at least following one of them: check whether hardware serial number correct, check whether the data that are stored in hardware correct, check whether anti-to copy the password whether device exist and checks the user to import correct.
4. the plane display adjusting method according to claim 1 is characterized in that step (a) also comprises:
(a1) use this flat-panel screens to show test pattern;
(a2) obtain the measurement data of this test pattern;
(a3) check whether shown all test patterns; And
(a4) if still have test pattern not show, then get back to step (a1), show next test pattern.
5. the plane display adjusting method according to claim 4 is characterized in that the measurement data of this test pattern is to use the optical metrology device to obtain, and this plane display adjusting method also comprises before in step (a1):
This flat-panel screens of initial setting and this optical metrology device; And
Postpone first Preset Time;
And between step (a1) and step (a2), also comprise:
Postpone second Preset Time.
6. the plane display adjusting method according to claim 4 is characterized in that step (a2) also comprises:
(a21) obtain the measurement data of this test pattern;
(a22) check whether the measurement data of this test pattern is enough; And
(a23) if the measurement data deficiency of this test pattern is then got back to step (a21), to obtain more measurement data.
7. the plane display adjusting method according to claim 1 is characterized in that step (b) also comprises:
(b1) analyze all measurement data, to calculate the required correct parameter of this control circuit; And
(b2) parameter setting with this control circuit is the right value that step (b1) calculates.
8. the plane display adjusting method according to claim 1, the kind that it is characterized in that this test pattern comprise complete black, complete white, GTG complete series, red complete series, green complete series, blue complete series, the colour of skin, sky blue, grass green, striped arrangement combination and dynamic image at least.
9. a plane display adjusting method is characterized in that comprising the following steps:
(a) use flat-panel screens to show test pattern;
(b) repeat to obtain the measurement data of this test pattern, till measurement data is enough; And
(c), set the parameter of the control circuit of this flat-panel screens according to all measurement data.
10. the plane display adjusting method according to claim 9 is characterized in that also comprising before in step (a):
Carry out at least one and prevent copying inspection;
If above-mentioned/above-mentioned these prevent that copying inspection does not pass through, and then stops this plane display adjusting method totally.
11. the plane display adjusting method according to claim 9, it is characterized in that above-mentioned/above-mentioned these anti-copy inspection comprise at least following one of them: check whether hardware serial number correct, check whether the data that are stored in hardware correct, check whether anti-to copy the password whether device exist and checks the user to import correct.
12. the plane display adjusting method according to claim 9 is characterized in that the measurement data of this test pattern is to use the optical metrology device to obtain, this plane display adjusting method also comprises before in step (a):
This flat-panel screens of initial setting and this optical metrology device; And
Postpone first Preset Time;
And between step (a) and step (b), also comprise:
Postpone second Preset Time.
13. the plane display adjusting method according to claim 9 is characterized in that step (b) also comprises:
(b1) obtain the measurement data of this test pattern;
(b2) check whether the measurement data of this test pattern is enough; And
(b3) if the measurement data deficiency of this test pattern is then got back to step (b1), to obtain more measurement data.
14. the plane display adjusting method according to claim 9 is characterized in that also comprising between step (b) and step (c):
Check whether shown all test patterns; And
If still have test pattern not show, then get back to step (a), show next test pattern.
15. the plane display adjusting method according to claim 9 is characterized in that step (c) also comprises:
(c1) analyze all measurement data, to calculate the required correct parameter of this control circuit; And
(c2) parameter setting with this control circuit is the right value that step (c1) calculates.
16. the plane display adjusting method according to claim 9, the kind that it is characterized in that this test pattern comprise complete black, complete white, GTG complete series, red complete series, green complete series, blue complete series, the colour of skin, sky blue, grass green, striped arrangement combination and dynamic image at least.
17. a plane display adjusting method is characterized in that comprising the following steps:
(a) initial setting flat-panel screens and optical metrology device;
(b) postpone first Preset Time;
(c) use this flat-panel screens to show test pattern;
(d) postpone second Preset Time;
(e) use this optical metrology device to obtain the measurement data of this test pattern; And
(f), set the parameter of the control circuit of this flat-panel screens according to all measurement data.
18. the plane display adjusting method according to claim 17 is characterized in that also comprising before in step (a):
Carry out at least one and prevent copying inspection;
If above-mentioned/above-mentioned these prevent that copying inspection does not pass through, and then stops this plane display adjusting method totally.
19. the plane display adjusting method according to claim 18, it is characterized in that above-mentioned/above-mentioned these anti-copy inspection comprise at least following one of them: check whether hardware serial number correct, check whether the data that are stored in hardware correct, check whether anti-to copy the password whether device exist and checks the user to import correct.
20. the plane display adjusting method according to claim 17 is characterized in that step (e) also comprises:
(e1) obtain the measurement data of this test pattern;
(e2) check whether the measurement data of this test pattern is enough; And
(e3) if the measurement data deficiency of this test pattern is then got back to step (e1), to obtain more measurement data.
21. the plane display adjusting method according to claim 17 is characterized in that also comprising between step (e) and step (f):
Check whether shown all test patterns; And
If still have test pattern not show, then get back to step (c), show next test pattern.
22. the plane display adjusting method according to claim 17 is characterized in that step (f) also comprises:
(f1) analyze all measurement data, to calculate the required correct parameter of this control circuit; And
(f2) parameter setting with this control circuit is the right value that step (f1) calculates.
23. the plane display adjusting method according to claim 17, the kind that it is characterized in that this test pattern comprise complete black, complete white, GTG complete series, red complete series, green complete series, blue complete series, the colour of skin, sky blue, grass green, striped arrangement combination and dynamic image at least.
24. a plane display adjusting method is characterized in that comprising the following steps:
(a) initial setting flat-panel screens and optical metrology device;
(b) postpone first Preset Time;
(c) use this flat-panel screens to show test pattern;
(d) postpone second Preset Time;
(e) reuse the measurement data that this optical metrology device is obtained this test pattern, till measurement data is enough;
(f) check whether shown all test patterns;
(g) if still have test pattern not show, then get back to step (c), show next test pattern; And
(h), set the parameter of the control circuit of this flat-panel screens according to all measurement data.
25. the plane display adjusting method according to claim 24 is characterized in that also comprising before in step (a):
Carry out at least one and prevent copying inspection;
If above-mentioned/above-mentioned these prevent that copying inspection does not pass through, and then stops this plane display adjusting method totally.
26. the plane display adjusting method according to claim 25, it is characterized in that above-mentioned/above-mentioned these anti-copy inspection comprise at least following one of them: check whether hardware serial number correct, check whether the data that are stored in hardware correct, check whether anti-to copy the password whether device exist and checks the user to import correct.
27. the plane display adjusting method according to claim 24 is characterized in that step (e) also comprises:
(e1) use this optical metrology device to obtain the measurement data of this test pattern;
(e2) check whether the measurement data of this test pattern is enough;
(e3) if the measurement data deficiency of this test pattern is then got back to step (e1), to obtain more measurement data;
28. the plane display adjusting method according to claim 24 is characterized in that step (h) also comprises:
(h1) analyze all measurement data, to calculate the required correct parameter of this control circuit; And
(h2) parameter setting with this control circuit is the right value that step (h1) calculates.
29. the plane display adjusting method according to claim 24, the kind that it is characterized in that this test pattern comprise complete black, complete white, GTG complete series, red complete series, green complete series, blue complete series, the colour of skin, sky blue, grass green, striped arrangement combination and dynamic image at least.
CN 200610058005 2005-08-29 2006-02-24 Plane display adjusting method Pending CN1924986A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/162,114 US20060279563A1 (en) 2005-06-13 2005-08-29 Method for calibrating flat panel display
US11/162,114 2005-08-29

Publications (1)

Publication Number Publication Date
CN1924986A true CN1924986A (en) 2007-03-07

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103474011A (en) * 2012-06-08 2013-12-25 晨星软件研发(深圳)有限公司 Measurer of display panel reaction speed and correlation method
CN109961750A (en) * 2017-12-26 2019-07-02 联咏科技股份有限公司 The driving device and its operating method of display panel

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103474011A (en) * 2012-06-08 2013-12-25 晨星软件研发(深圳)有限公司 Measurer of display panel reaction speed and correlation method
CN103474011B (en) * 2012-06-08 2016-03-16 晨星软件研发(深圳)有限公司 The measuring appliance of display panel reaction velocity and correlation technique
CN109961750A (en) * 2017-12-26 2019-07-02 联咏科技股份有限公司 The driving device and its operating method of display panel

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