CN103257256B - 探针治具 - Google Patents
探针治具 Download PDFInfo
- Publication number
- CN103257256B CN103257256B CN201310157180.XA CN201310157180A CN103257256B CN 103257256 B CN103257256 B CN 103257256B CN 201310157180 A CN201310157180 A CN 201310157180A CN 103257256 B CN103257256 B CN 103257256B
- Authority
- CN
- China
- Prior art keywords
- pedestal
- grip block
- probe
- brace table
- present
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201310157180.XA CN103257256B (zh) | 2013-05-02 | 2013-05-02 | 探针治具 |
Applications Claiming Priority (1)
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CN201310157180.XA CN103257256B (zh) | 2013-05-02 | 2013-05-02 | 探针治具 |
Publications (2)
Publication Number | Publication Date |
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CN103257256A CN103257256A (zh) | 2013-08-21 |
CN103257256B true CN103257256B (zh) | 2016-01-20 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201310157180.XA Expired - Fee Related CN103257256B (zh) | 2013-05-02 | 2013-05-02 | 探针治具 |
Country Status (1)
Country | Link |
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CN (1) | CN103257256B (zh) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5404111A (en) * | 1991-08-03 | 1995-04-04 | Tokyo Electron Limited | Probe apparatus with a swinging holder for an object of examination |
CN2842429Y (zh) * | 2005-07-08 | 2006-11-29 | 卢德祥 | 直测式治具 |
CN202256392U (zh) * | 2011-08-29 | 2012-05-30 | 冀雅(廊坊)电子有限公司 | 用于测试液晶显示模块的夹具 |
CN202631587U (zh) * | 2012-01-18 | 2012-12-26 | 苏州赛腾精密电子有限公司 | 一种探针测试装置 |
CN203287404U (zh) * | 2013-05-02 | 2013-11-13 | 苏州金牛精密机械有限公司 | 探针治具 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4093600B2 (ja) * | 1995-09-14 | 2008-06-04 | 株式会社日立ハイテクノロジーズ | Ic測定治具及びic測定方法 |
-
2013
- 2013-05-02 CN CN201310157180.XA patent/CN103257256B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5404111A (en) * | 1991-08-03 | 1995-04-04 | Tokyo Electron Limited | Probe apparatus with a swinging holder for an object of examination |
CN2842429Y (zh) * | 2005-07-08 | 2006-11-29 | 卢德祥 | 直测式治具 |
CN202256392U (zh) * | 2011-08-29 | 2012-05-30 | 冀雅(廊坊)电子有限公司 | 用于测试液晶显示模块的夹具 |
CN202631587U (zh) * | 2012-01-18 | 2012-12-26 | 苏州赛腾精密电子有限公司 | 一种探针测试装置 |
CN203287404U (zh) * | 2013-05-02 | 2013-11-13 | 苏州金牛精密机械有限公司 | 探针治具 |
Also Published As
Publication number | Publication date |
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CN103257256A (zh) | 2013-08-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Fang Xueke Inventor before: Zhou Jianrong |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170629 Address after: 519199, Guangdong, Zhuhai province Doumen Town, 3 gold Wells Road (Comprehensive Building) second Patentee after: Zhuhai Rui Qi Electronics Co., Ltd. Address before: 215000 Suzhou high tech Industrial Development Zone, Jiangsu, No. 236 Songshan Road Patentee before: Suzhou Taurus Precision Machinery Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160120 Termination date: 20180502 |