CN103196583A - Junction temperature detection method for alternate current light-emitting diode (AC LED) based on peak wavelength - Google Patents
Junction temperature detection method for alternate current light-emitting diode (AC LED) based on peak wavelength Download PDFInfo
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- CN103196583A CN103196583A CN2013100912192A CN201310091219A CN103196583A CN 103196583 A CN103196583 A CN 103196583A CN 2013100912192 A CN2013100912192 A CN 2013100912192A CN 201310091219 A CN201310091219 A CN 201310091219A CN 103196583 A CN103196583 A CN 103196583A
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Abstract
The invention provides a junction temperature detection method for an alternate current light-emitting diode (AC LED) based on a peak wavelength. The junction temperature detection method is characterized by comprising the following steps: placing the AC LED under an initial temperature condition, powering on a sinusoidal AC voltage after the AC LED is stable, and obtaining the peak wavelength of the initial temperature by means of a spectrograph, a photochopper, a collection and transformation unit and a computer; adjusting temperature to gradually increase with the temperature interval of 5-10 DEG C, supplying the sinusoidal AC voltage after the AC LED is stable under all temperature conditions, and in a similar way obtaining peak wavelengths of all temperature conditions by means of equipment such as the spectrograph; matching relation lines between the peak wavelengths and temperatures; recovering room temperature and in a similar way obtaining the peak wavelength under the initial room temperature condition by means of the equipment such as the spectrograph; and obtaining the temperature corresponding to a room temperature peak wavelength, namely junction temperature, according to corresponding relation lines, connecting an AC power supply unit and the computer, connecting the spectrograph and the AC LED through an optical fiber, connecting the photochopper between the spectrograph and the collection and transformation unit, and respectively connecting the collection and transformation unit and the spectrograph on the computer.
Description
Technical field
The present invention relates to a kind of detection method of photovalve, particularly relate to a kind of junction temperature that detects alternating-current light emitting diode based on peak wavelength based on peak wavelength alternating-current light emitting diode junction temperature detection method.
Background technology
There are following five kinds of methods substantially in the junction temperature measurement at light emitting diode in the prior art at present: 1, try to achieve junction temperature by measuring pin temperature and chip dissipated power and thermal resistivity; 2, infrared thermography utilizes infrared noncontact thermometer directly to measure the temperature of led chip; 3, utilize the luminescent spectrum peak shift to measure junction temperature; 4, nematic crystal thermal imaging; 5, utilize the voltage temperature relation curve of diode PN junction voltage and junction temperature, record the junction temperature of light emitting diode.
But said method at be the measurement of the junction temperature of direct current light emitting diode, very difficult when carrying out junction temperature measurement at alternating-current light emitting diode, lack the method for carrying out junction temperature measurement at alternating-current light emitting diode.
Summary of the invention
The object of the present invention is to provide a kind of junction temperature that detects alternating-current light emitting diode based on peak wavelength based on peak wavelength alternating-current light emitting diode junction temperature detection method.The present invention provides a kind of non-direct contact type, the safer and influenced little detection method more accurately of measurement result to tested alternating-current light emitting diode.
A kind of junction temperature that detects alternating-current light emitting diode based on peak wavelength provided by the invention based on peak wavelength alternating-current light emitting diode junction temperature detection method, has such feature, have following steps: thermometer is linked to each other with sensor in placing constant temperature oven, be used for showing the temperature of constant temperature oven, the temperature in the constant temperature oven can be regulated; Place in the tested constant temperature oven of alternating-current light emitting diode under the initial temperature state, utilize the internal temperature of thermometer monitoring and record constant temperature oven, after a period of stabilisation, when the junction temperature of alternating-current light emitting diode reaches temperature with constant temperature oven when identical, connect AC power unit to the continuous sinusoidal voltage of alternating-current light emitting diode supply, adopt spectrometer to record the spectral distribution of alternating-current light emitting diode, utilize chopper to obtain one of them cycle spectrum in the interrupted spectrum of periodicity of certain frequency, and utilize to gather converting unit and gather the light signal of the spectrum in certain wavelength coverage in the one-period and light signal is converted to electric signal, obtained the initial temperature state peak wavelength in the spectrum in certain wavelength coverage of alternating-current light emitting diode according to electric signal by computing machine; Regulate the temperature of constant temperature oven, progressively increase from the temperature interval of beginning under the initial temperature state with 5 ℃ to 10 ℃, maximum temperature can not surpass the highest permission working temperature of alternating-current light emitting diode, under each state of temperature after a period of stabilisation, when the junction temperature of alternating-current light emitting diode reaches temperature with constant temperature oven when identical, supply identical above-mentioned sinusoidal voltage respectively for the alternating-current light emitting diode under each state of temperature, adopt spectrometer to record the spectral distribution of the alternating-current light emitting diode under each state of temperature, utilize chopper to obtain above-mentioned identical one-period spectrum, and utilize to gather converting unit and gather the light signal of the spectrum in above-mentioned identical certain wavelength coverage in the above-mentioned one-period under each state of temperature respectively and be converted to electric signal, obtained the peak wavelength under each state of temperature in the spectrum in certain wavelength coverage of alternating-current light emitting diode according to electric signal by computing machine; According to the peak wavelength of the alternating-current light emitting diode that obtains under each temperature, simulate the peak wavelength of alternating-current light emitting diode and the corresponding relation line of temperature; Take out alternating-current light emitting diode in the constant temperature oven, after the temperature of AC light-emitting diode returns to room temperature, to the identical above-mentioned lasting sinusoidal voltage of alternating-current light emitting diode supply, the employing spectrometer records the spectral distribution under the alternating-current light emitting diode room temperature state, utilize chopper to obtain above-mentioned identical one-period spectrum, and utilize to gather converting unit and gather under the room temperature state light signal of the spectrum in above-mentioned identical certain wavelength coverage in the above-mentioned one-period and be converted to electric signal, obtained by computing machine according to electric signal in the spectrum in above-mentioned certain wavelength coverage of alternating-current light emitting diode at the room temperature state peak wavelength; According to the corresponding relation line, obtain the temperature corresponding with the room temperature state peak wavelength, namely get at the sinusoidal ac that continues and depress junction temperature under the room temperature state of alternating-current light emitting diode, wherein, connect AC power unit and computing machine, supply continuous sinusoidal voltage by the computer control AC power unit, connect spectrometer and AC light-emitting diode by optical fiber, connect chopper between spectrometer and collection converting unit, connect collection converting unit and spectrometer on computers respectively.
Compared with prior art, effect of the present invention is:
Provided by the invention based on peak wavelength alternating-current light emitting diode junction temperature detection method at be alternating-current light emitting diode and to obtain the junction temperature data result accurate.The present invention has utilized the energy gap in the alternating-current light emitting diode to change with temperature, thereby causes the peak wavelength in the spectrum that alternating-current light emitting diode sends also can change.Because spectrometer directly contacts with the alternating-current light emitting diode right and wrong, by gathering the peak wavelength in the certain wavelength coverage of one of them cycle spectrum under each state of temperature, for optical data has been got rid of temperature effect to junction temperature, the sinusoidal voltage that continues to supply does not directly contact not safer yet, measurement result is influenced little, and is relatively more stable more accurate.And generally use alternating current in daily life, compared with the prior art, alternating-current light emitting diode junction temperature detection method practicality provided by the invention is stronger, ubiquity is stronger.
Description of drawings
Fig. 1 carries out the system chart that the alternating-current light emitting diode junction temperature detects in the embodiments of the invention;
Fig. 2 is spectral curve in 30 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 3 is spectral curve in 35 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 4 is spectral curve in 40 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 5 is spectral curve in 45 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 6 is spectral curve in 50 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 7 is spectral curve in 55 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 8 is spectral curve in 60 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Fig. 9 is spectral curve in 65 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 10 is spectral curve in 70 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 11 is spectral curve in 75 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 12 is spectral curve in 80 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 13 is spectral curve in 85 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 14 is spectral curve in 90 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 15 is spectral curve in 95 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 16 is spectral curve in 100 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 17 is spectral curve in 105 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 18 is spectral curve in 110 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention;
Figure 19 is the peak wavelength of alternating-current light emitting diode in the embodiments of the invention and the graph of a relation of temperature;
Figure 20 is that the junction temperature of alternating-current light emitting diode was obtained figure when peak wavelength was 436.65nm under the room temperature state in the embodiments of the invention.
Concrete case study on implementation
The present invention is further described below in conjunction with embodiment and accompanying drawing.
Fig. 1 carries out the system chart that the alternating-current light emitting diode junction temperature detects in the embodiments of the invention;
As shown in Figure 1, hardware system partly comprises in the detection method that provides in the present embodiment: tested alternating-current light emitting diode 1, computing machine 2, AC power unit 3, spectrometer 4, chopper 5, collection converting unit 6, constant temperature oven 7, sensor 8 and thermometer 9, tested alternating-current light emitting diode 1 is placed in the constant temperature oven 7, be provided with thermometer 9 and the sensor 8 that is connected with thermometer 9 in the constant temperature oven 7, for detection of the temperature in the constant temperature oven 7, the temperature of constant temperature oven 7 is adjustable.Connect AC power unit 3 and computing machine 2, supply continuous sinusoidal voltage by computing machine 2 control AC power unit 3, spectrometer 4 is connected with AC light-emitting diode 1 by optical fiber 10, chopper 5 is connected between spectrometer 4 and the collection converting unit 6, will gathers converting unit 6 respectively and all be connected on computers with spectrometer 4;
Fig. 2 is spectral curve in 30 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention,
The sinusoidal voltage that AC power unit output is continued, the frequency of this sinusoidal voltage is 50Hz, maximum voltage value is 110v;
Alternating-current light emitting diode to be measured is positioned in the constant temperature oven, the initial temperature of regulating constant temperature oven is 30 ℃, temperature with thermometer monitoring and record constant temperature oven internal environment, after a period of stabilisation, namely when the temperature of the junction temperature of alternating-current light emitting diode and constant temperature oven is identical when all being 30 ℃, connect the sinusoidal voltage that AC power unit continues to the alternating-current light emitting diode supply, adopt spectrometer to record the spectral distribution of alternating-current light emitting diode, the rotating speed of chopper is adjusted to 400r/s, obtained one of them the cycle spectrum in the periodically interrupted spectrum, utilize and gather the light signal that converting unit is gathered the spectrum of described one-period medium wavelength scope in 380nm to 780nm, and utilize the collection converting unit that described light signal is converted to electric signal, as shown in Figure 2, note the 30 ℃ curves of spectrum 11 of alternating-current light emitting diode in wavelength coverage 380nm to 780nm by COMPUTER DETECTION, obtain 30 ℃ of peak wavelengths 12 and be 433.45nm;
Fig. 3 to Figure 18 is respectively spectral curve in 35 ℃, 40 ℃, 45 ℃, 50 ℃, 55 ℃, 60 ℃, 65 ℃, 70 ℃, 75 ℃, 80 ℃, 85 ℃, 90 ℃, 95 ℃, 100 ℃, 105 ℃ and the 110 ℃ of following wavelength coverage 380nm to 780nm in the embodiments of the invention in turn
Regulate the temperature of constant temperature oven, progressively rise to 110 ℃ since 30 ℃ of intervals with 5 ℃, namely, regulating respectively and keeping the temperature of constant temperature oven is 35 ℃, 40 ℃, 45 ℃, 50 ℃, 55 ℃, 60 ℃, 65 ℃, 70 ℃, 75 ℃, 80 ℃, 85 ℃, 90 ℃, 95 ℃, 100 ℃, 105 ℃ and 110 ℃, under each state of temperature, stablize a period of time, when the junction temperature of alternating-current light emitting diode when identical with the temperature of constant temperature oven under above-mentioned each state of temperature, supply continuous 50Hz same as described above for respectively the alternating-current light emitting diode under above-mentioned each state of temperature, the 110v sinusoidal voltage, the employing spectrometer records the spectral distribution under above-mentioned each state of temperature of alternating-current light emitting diode respectively, the rotating speed of chopper is remained 400r/s, obtained one of them the cycle spectrum in the interrupted spectrum of periodicity under above-mentioned each state of temperature respectively, light signal and the utilization collection converting unit of utilizing the collection converting unit to gather the spectrum of described one-period medium wavelength scope in 380nm to 780nm under above-mentioned each state of temperature respectively are converted to electric signal with described light signal, as Fig. 3 to shown in Figure 180, according to described electric signal by computing machine alternating-current light emitting diode 35 ℃ of curves of spectrum 13 in the corresponding wavelength coverage 380nm to 780nm and obtain 35 ℃ of peak wavelengths 14 and be 433.65nm under above-mentioned each state of temperature under the detection record respectively, 40 ℃ of curves of spectrum 15 also obtain 40 ℃ of peak wavelengths 16 and are 433.8nm, 45 ℃ of curves of spectrum 17 also obtain 45 ℃ of peak wavelengths 18 and are 434.1nm, 50 ℃ of curves of spectrum 19 also obtain 50 ℃ of peak wavelengths 20 and are 434.15nm, 55 ℃ of curves of spectrum 21 also obtain 55 ℃ of peak wavelengths 22 and are 434.45nm, 60 ℃ of curves of spectrum 23 also obtain 60 ℃ of peak wavelengths 24 and are 434.75nm, 65 ℃ of curves of spectrum 25 also obtain 65 ℃ of peak wavelengths 26 and are 435.05nm, 70 ℃ of curves of spectrum 27 also obtain 70 ℃ of peak wavelengths 28 and are 435.45nm, 75 ℃ of curves of spectrum 29 also obtain 75 ℃ of peak wavelengths 30 and are 435.55nm, 80 ℃ of curves of spectrum 31 also obtain 80 ℃ of peak wavelengths 32 and are 435.85nm, 85 ℃ of curves of spectrum 33 also obtain 85 ℃ of peak wavelengths 34 and are 436.05nm, 90 ℃ of curves of spectrum 35 also obtain 90 ℃ of peak wavelengths 36 and are 436.4nm, 95 ℃ of curves of spectrum 37 also obtain 95 ℃ of peak wavelengths 38 and are 436.45nm, 100 ℃ of curves of spectrum 39 also obtain 100 ℃ of peak wavelengths 40 and are 436.9nm, 105 ℃ of curves of spectrum 41 also obtain 105 ℃ of peak wavelengths 42 and are 437.10nm, 110 ℃ of curves of spectrum 43 also obtain 110 ℃ of peak wavelengths 44 and are 437.20nm;
Figure 19 is the peak wavelength of alternating-current light emitting diode in the embodiments of the invention and the graph of a relation of temperature,
As shown in figure 19, according to the peak wavelength under above-mentioned each state of temperature in 12 to 110 ℃ of peak wavelengths 44 of 30 ℃ of peak wavelengths and the corresponding relation of temperature, the peak wavelength of alternating-current light emitting diode and the corresponding relation line 45 of temperature are drawn out in match, namely, corresponding relation line 45 as shown in Figure 19;
Figure 20 is that the junction temperature of alternating-current light emitting diode was obtained figure when peak wavelength was 436.65nm under the room temperature state in the embodiments of the invention,
From constant temperature oven, take out alternating-current light emitting diode, after the temperature for the treatment of the AC light-emitting diode returns to room temperature, supply above-mentioned identical 50Hz to alternating-current light emitting diode, the sinusoidal voltage that 110v continues, adopt spectrometer to record the spectral distribution of alternating-current light emitting diode, the rotating speed of chopper is remained 400r/s, obtained one of them cycle spectrum in the periodically interrupted spectrum under the room temperature state, utilization is gathered the light signal of the spectrum of described one-period medium wavelength scope in 380nm to 780nm under the converting unit collection room temperature state and is utilized the collection converting unit that described light signal is converted to electric signal, as shown in figure 20, note the curve of spectrum under the room temperature state of alternating-current light emitting diode in wavelength coverage 380nm to 780nm by COMPUTER DETECTION, obtaining the room temperature state peak wavelength is 436.65nm;
As shown in figure 20, according to above-mentioned corresponding relation line 45, obtain with the normal equalization chamber of alternating-current light emitting diode temperature state under peak wavelength 46 be the corresponding temperature of 436.65nm, namely, the junction temperature 47 that obtains being transfused under the room temperature state alternating-current light emitting diode of lasting sinusoidal voltage is 97 ℃, junction temperature 47 as shown in Figure 20.
Effect and the effect of invention
In sum, effect of the present invention and effect are:
Provided by the invention based on peak wavelength alternating-current light emitting diode junction temperature detection method at be alternating-current light emitting diode and to obtain the junction temperature data result accurate.The present invention has utilized the energy gap in the alternating-current light emitting diode to change with temperature, thereby causes the peak wavelength in the spectrum that alternating-current light emitting diode sends also can change, and corresponding relation is obvious.Because spectrometer directly contacts with the alternating-current light emitting diode right and wrong, by gathering the peak wavelength in the certain wavelength coverage of one of them cycle spectrum under each state of temperature, for optical data has been got rid of temperature effect to junction temperature, the sinusoidal voltage that continues to supply does not directly contact not safer yet, measurement result is influenced little, and is relatively more stable more accurate.And generally use alternating current in daily life, compared with the prior art, alternating-current light emitting diode junction temperature detection method practicality provided by the invention is stronger, ubiquity is stronger.
In addition, AC power unit is by computer control in method provided by the invention, can can write corresponding program to export the alternating-current voltage source of corresponding variation at the alternating-current light emitting diode of different operating voltage, the curve of spectrum of alternating-current light emitting diode also can and be gathered converting unit and be obtained by computer control by spectrometer, chopper under each temperature simultaneously, the corresponding relation line of junction temperature and peak point current drawn out in record, overcome the people for reading error, data result accuracy height, data repeatability is high.
Above-mentioned embodiment is that preferred case of the present invention is used for explanation the present invention, is not used for limiting protection scope of the present invention.
Claims (1)
- A junction temperature that detects alternating-current light emitting diode based on peak wavelength based on peak wavelength alternating-current light emitting diode junction temperature detection method, it is characterized in that having following steps:Thermometer is linked to each other with sensor in placing constant temperature oven, be used for showing the temperature of described constant temperature oven, the temperature in the described constant temperature oven can be regulated;Place in the described constant temperature oven of tested alternating-current light emitting diode under the initial temperature state, utilize the internal temperature of described thermometer monitoring and record constant temperature oven, after a period of stabilisation, when the junction temperature of alternating-current light emitting diode reaches temperature with constant temperature oven when identical, connect AC power unit to the continuous sinusoidal voltage of alternating-current light emitting diode supply, adopt spectrometer to record the spectral distribution of alternating-current light emitting diode, utilize chopper to obtain one of them cycle spectrum in the interrupted spectrum of periodicity of certain frequency, and utilize to gather converting unit and gather the light signal of the spectrum in certain wavelength coverage in the described one-period and described light signal is converted to electric signal, obtained the initial temperature state peak wavelength in the spectrum in described certain wavelength coverage of alternating-current light emitting diode according to described electric signal by computing machine;Regulate the temperature of constant temperature oven, progressively increase from the temperature interval of beginning under the initial temperature state with 5 ℃ to 10 ℃, maximum temperature can not surpass the highest permission working temperature of alternating-current light emitting diode, under each state of temperature after a period of stabilisation, when the junction temperature of alternating-current light emitting diode reaches temperature with constant temperature oven when identical, supply identical above-mentioned sinusoidal voltage respectively for the alternating-current light emitting diode under each state of temperature, adopt spectrometer to record the spectral distribution of the alternating-current light emitting diode under each state of temperature, utilize chopper to obtain described one-period spectrum, and utilize to gather converting unit and gather the light signal of the spectrum in certain wavelength coverage described in the described one-period under each state of temperature respectively and be converted to electric signal, obtained the peak wavelength under each state of temperature in the spectrum in described certain wavelength coverage of alternating-current light emitting diode according to electric signal by computing machine;According to the peak wavelength of the alternating-current light emitting diode that obtains under each temperature, simulate the peak wavelength of alternating-current light emitting diode and the corresponding relation line of temperature;Take out alternating-current light emitting diode in the constant temperature oven, after the temperature of AC light-emitting diode returns to room temperature, to the identical above-mentioned lasting sinusoidal voltage of alternating-current light emitting diode supply, the employing spectrometer records the spectral distribution under the alternating-current light emitting diode room temperature state, utilize chopper to obtain described one-period spectrum, and utilize to gather converting unit and gather under the room temperature state light signal of the spectrum in certain wavelength coverage described in the described one-period and be converted to electric signal, obtained by computing machine according to described electric signal in the spectrum in described certain wavelength coverage of alternating-current light emitting diode at the room temperature state peak wavelength;According to described corresponding relation line, obtain the temperature corresponding with described room temperature state peak wavelength, namely get at the sinusoidal ac that continues and depress junction temperature under the room temperature state of alternating-current light emitting diode,Wherein, connect described AC power unit and described computing machine, supply continuous sinusoidal voltage by the described AC power unit of described computer control, connect described spectrometer and described AC light-emitting diode by optical fiber, connect described chopper between described spectrometer and described collection converting unit, connect described collection converting unit and described spectrometer respectively on described computing machine.
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| CN112180227A (en) * | 2020-09-25 | 2021-01-05 | 浙江大学 | Non-contact type silicon carbide power device junction temperature online detection system and detection method |
| CN112945415A (en) * | 2021-02-09 | 2021-06-11 | 苏州长光华芯光电技术股份有限公司 | Laser array temperature detection method and device |
| CN113281008A (en) * | 2021-03-31 | 2021-08-20 | 昂纳信息技术（深圳）有限公司 | Chip welding state detection method for optical device |
| CN116222961A (en) * | 2023-02-20 | 2023-06-06 | 无锡市华辰芯光半导体科技有限公司 | Junction temperature testing method of semiconductor laser |
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