CN202421094U - Nontransparent material normal spectral emissivity measurement device - Google Patents
Nontransparent material normal spectral emissivity measurement device Download PDFInfo
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- CN202421094U CN202421094U CN2012200206123U CN201220020612U CN202421094U CN 202421094 U CN202421094 U CN 202421094U CN 2012200206123 U CN2012200206123 U CN 2012200206123U CN 201220020612 U CN201220020612 U CN 201220020612U CN 202421094 U CN202421094 U CN 202421094U
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Abstract
The utility model discloses a nontransparent material normal spectral emissivity measurement device. Key points of the technical scheme are that: a graphite heating body is arranged in a cylindrical cavity, and is communicated with a water cooled electrode which is communicated with a direct current power supply; a semispherical water cooled flange is arranged on the top of the cylindrical cavity; observation holes are uniformly formed in the semispherical water cooled flange opposite to a groove on the top of the graphite heating body; a detector is arranged outside an observation hole on one side, and a water chopper and a reflector are arranged outside an observation hole on the other side; the detector and the water chopper are connected with a microprocessor control system through a wire respectively; the microprocessor control system is connected with a manual intelligent regulator through a wire; the manual intelligent regulator is connected with the direct current power supply through a wire; a spherical mirror is arranged outside a middle observation hole in the semispherical water cooled flange; a Fourier infrared spectrometer and a computer are assembled and matched with the spherical mirror; and a vacuumizing device is arranged on the semispherical water cooled flange. The device is high in heating speed, vacuum degree and measurement accuracy.
Description
Technical field:
The utility model relates to the device that spectral emittance is accurately measured, particularly a kind of measurement mechanism that is suitable for nontransparent lubricious material mensuration to spectral emittance.
Background technology:
Spectral emittance is an important parameter of the hot rerum natura of exosyndrome material, and the spectral emittance data have important scientific meaning and using value in fields such as actinometry, heat conduction, the efficiency of heating surface, infrared remote sensing, optical constant assessments accurately.In recent years; Although the spectral emittance measuring technique has obtained development at full speed; But the measuring accuracy of its measuring accuracy, especially high temperature section still can not satisfy scientific research and demands of applications, therefore is badly in need of a kind of high temperature of development, wide wavelength, high precision material spectrum emissivity measurement device.
At present, the measuring method of spectral emittance is a lot, like emittance pairing comparision, reflectometry, calorimetry etc.No matter use the sort of method to measure emissivity, want accurate measure spectrum emissivity, how accurately wherein most critical problem is exactly, the temperature on Measuring Object surface.Temp measuring method commonly used at present has two kinds: the one, and utilize thermopair to measure; Normally be welded on thermopair near the of object under test surf zone or put into object under test inside to thermopair, be similar to and think that the temperature of this point is the temperature on surface to be measured through punching.A kind of in addition method is to measure with Radiation Temperature Measurement Instrument, and normally boring forms artificial black matrix near the object under test surf zone, measures the temperature of artificial black matrix, the promptly approximate temperature of thinking the object under test surface with Radiation Temperature Measurement Instrument.For metal material,, when middle low temperature, differ less with the temperature of high precision thermocouple measurement and the temperature in zone to be measured, but when high temperature, both errors are bigger, usually more than 10 degrees centigrade because the thermal conductivity coefficient of metal is higher.For nonmetallic materials; Because thermal conductivity coefficient is low, object under test surface temperature gradient is big, even if under middle low temperature; It is also very big that the temperature that thermopair records and the true temperature in zone to be measured differ; And at high temperature, surface temperature gradient even can reach 100 degrees centigrade, this will cause spectral emittance to measure great error.Obviously, no matter be with thermopair or Radiation Temperature Measurement Instrument, the temperature that records only is near the temperature the zone to be measured, is not the true temperature in zone to be measured.And the two temperature difference is along with the rising of measuring temperature, and difference can be increasing, and this is the difficult problem that present spectral emittance measurement faces.Though the multispectral radiation temperature measurement technology that proposes at present, the directly temperature on Measuring Object surface based on least square method and neural network.But multispectral radiation temperature measurement theory is based upon accurately on the emissivity model, and many factors such as emissivity model and body surface roughness, wavelength, temperature are closely related, are difficult to find a pervasive spectral emittance model.Present stage, the precision of multispectral radiation temperature measurement can't satisfy the demand that spectral emittance is measured.To the problems referred to above, developing a kind of high temperature, wide wavelength, high-precision spectral emittance measurement mechanism all is very significant to scientific research and practical application.
Summary of the invention:
The purpose of the utility model is a kind of measurement mechanism that is suitable for non-transparent material normal direction spectral emittance of design.
The technical scheme of the utility model is, a kind of non-transparent material normal direction spectral emittance measurement mechanism, and it comprises the semisphere water-cooling flange; Graphite heating body; It is characterized in that: in circular cylindrical cavity, be provided with graphite heating body, the graphite heating body top is provided with groove, and graphite heating body is connected with water cooled electrode; Water cooled electrode is communicated with high-power DC power supply; Be provided with the semisphere water-cooling flange at the circular cylindrical cavity top, be evenly equipped with three observation ports on the semisphere water-cooling flange corresponding, be separately installed with single wavelength detector and chopper, gold-plated catoptron in the observation port outside of both sides with the groove at graphite heating body top; Single wavelength detector is connected with microprocessor control system respectively through lead with chopper; Microprocessor control system is connected with Intelligence Regulator through lead, and Intelligence Regulator is connected with high-power DC power supply through lead, and the outside, intermediate sight hole on the semisphere water-cooling flange is provided with spherical reflector; What cooperate assembling with spherical reflector has Fourier infrared spectrograph and a computing machine, on the semisphere water-cooling flange, is provided with vacuum extractor.Observation port on the described semisphere water-cooling flange, one of them is a sphere center position, two are symmetrical in sphere center position in addition, are 15 degree angles with normal.Said observation port is the KBr window.
The utility model need not to consider the surface temperature gradient of testing sample for using thermopair and radiation survey meter, its temperature measurement accuracy is greatly improved, and has reduced the spectral emittance error that causes owing to the measurement temperature error in the measuring process in the past; The scope that the utility model can record emissivity is 500 degrees centigrade to 3000 degrees centigrade, and wavelength coverage is: 1.5 μ m-25 μ m, and firing rate is fast, and vacuum tightness is higher, and the precision of measurement is high.
Description of drawings:
Fig. 1 is the structural representation of the utility model.
Embodiment:
Describe embodiment in detail in conjunction with accompanying drawing:
A kind of non-transparent material normal direction spectral emittance measurement mechanism, it comprises semisphere water-cooling flange 12, graphite heating body 13; In circular cylindrical cavity 14, be provided with graphite heating body, the graphite heating body top is provided with groove 17, and graphite heating body is connected with water cooled electrode 16; Water cooled electrode is communicated with high-power DC power supply 1, is provided with heat-barrier material 15 in the graphite heating external, is provided with the semisphere water-cooling flange at the circular cylindrical cavity top; Be evenly equipped with three observation ports 8 on the semisphere water-cooling flange corresponding with the groove at graphite heating body top, described observation port, one of them is a sphere center position; Two are symmetrical in sphere center position in addition, are 15 degree angles with normal, and observation port is the KBr window; Be separately installed with single wavelength detector 7 and chopper 10, gold-plated catoptron 9 in the observation port outside of both sides; Single wavelength detector is connected with microprocessor control system 3 respectively through lead with chopper; Microprocessor control system is connected with Intelligence Regulator 2 through lead; Intelligence Regulator is connected with high-power DC power supply through lead, and the outside, intermediate sight hole on the semisphere water-cooling flange is provided with spherical reflector 4, cooperate with spherical reflector assemble Fourier infrared spectrograph 5 and computing machine 6 arranged; On the semisphere water-cooling flange, be provided with vacuum extractor 11, outside circular cylindrical cavity, be provided with water-cooling system.
The job step of the utility model is,
1, with the high temperature blackbody furnace infrared Fourier infrared spectrometer is calibrated.
2, measure the spectral radiant energy of high temperature furnace under design temperature point with Fourier infrared spectrograph; And with the data storage that records to computing machine, the distance that should guarantee high temperature furnace and Fourier infrared spectrograph when measuring object under test surface emissivity energy apart from consistent.
3, on Intelligence Regulator, set the time and the temperature that will heat.
4, start water circulation system and vacuum pump, treat that vacuum tightness reaches 10
-4During Pa, start the DC heating device.
5, reach 500 when spending when temperature, chopper wheel is started working, and temperature measurement system output temperature signal is to attemperating unit.
6, attemperating unit is regulated the heating current size automatically according to predefined heat time heating time and temperature value.
7, treat that temperature reaches setting value after, start the infrared Fourier infrared spectrometer and measure object under test surface emissivity energy, and store the radiation energy value under the temperature spot to be measured.
8, computing machine is sought the blackbody radiation energy value under the uniform temp point, and contrast, draws the spectral emittance value.
The scope that the utility model is measured emissivity is 500 degrees centigrade to 3000 degrees centigrade, and wavelength coverage is: 1.5 μ m-25 μ m.
Claims (3)
1. non-transparent material normal direction spectral emittance measurement mechanism; It comprises the semisphere water-cooling flange, and graphite heating body is characterized in that: in circular cylindrical cavity, be provided with graphite heating body; The graphite heating body top is provided with groove; Graphite heating body is connected with water cooled electrode, and water cooled electrode is communicated with high-power DC power supply, is provided with the semisphere water-cooling flange at the circular cylindrical cavity top; Be evenly equipped with three observation ports on the semisphere water-cooling flange corresponding with the groove at graphite heating body top; Be separately installed with single wavelength detector and chopper, gold-plated catoptron in the observation port outside of both sides, single wavelength detector is connected with microprocessor control system respectively through lead with chopper, and microprocessor control system is connected with Intelligence Regulator through lead; Intelligence Regulator is connected with high-power DC power supply through lead; Outside, intermediate sight hole on the semisphere water-cooling flange is provided with spherical reflector, and what cooperate assembling with spherical reflector has Fourier infrared spectrograph and a computing machine, on the semisphere water-cooling flange, is provided with vacuum extractor.
2. a kind of non-transparent material normal direction spectral emittance measurement mechanism as claimed in claim 1 is characterized in that: the observation port on the described semisphere water-cooling flange, and one of them is a sphere center position, two are symmetrical in sphere center position in addition, are 15 degree angles with normal.
3. a kind of non-transparent material normal direction spectral emittance measurement mechanism as claimed in claim 1, it is characterized in that: said observation port is the KBr window.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200206123U CN202421094U (en) | 2012-01-17 | 2012-01-17 | Nontransparent material normal spectral emissivity measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200206123U CN202421094U (en) | 2012-01-17 | 2012-01-17 | Nontransparent material normal spectral emissivity measurement device |
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| Publication Number | Publication Date |
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| CN202421094U true CN202421094U (en) | 2012-09-05 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012200206123U Expired - Fee Related CN202421094U (en) | 2012-01-17 | 2012-01-17 | Nontransparent material normal spectral emissivity measurement device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565116A (en) * | 2012-01-17 | 2012-07-11 | 河南师范大学 | Device for measuring normal spectral emissivity of non-transparent material |
| CN104048945A (en) * | 2014-06-09 | 2014-09-17 | 清华大学 | Spectral emissivity steady testing system and method |
| CN104076060A (en) * | 2014-06-09 | 2014-10-01 | 清华大学 | Transient spectral emissivity test system and method |
-
2012
- 2012-01-17 CN CN2012200206123U patent/CN202421094U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565116A (en) * | 2012-01-17 | 2012-07-11 | 河南师范大学 | Device for measuring normal spectral emissivity of non-transparent material |
| CN104048945A (en) * | 2014-06-09 | 2014-09-17 | 清华大学 | Spectral emissivity steady testing system and method |
| CN104076060A (en) * | 2014-06-09 | 2014-10-01 | 清华大学 | Transient spectral emissivity test system and method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120905 Termination date: 20130117 |
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| CF01 | Termination of patent right due to non-payment of annual fee |