Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
The embodiment of the present invention by testing apparatus control programmable power supply, electronic load is tested tested power supply, and the test data of collection, store electrons load is as the corresponding test data of tested power supply.
It is a kind of that the embodiment of the present invention provides: nuclear power station power detection system and method.
Described system comprises: programmable power supply, electronic load, testing apparatus, database, tested power supply;
Described testing apparatus comprises embedded controller and test data collection card;
The described programmable power supply of described embedded controller controls exports voltage magnitude, the frequency of tested power supply to, and controls the current value that passes into described electronic load;
Described electronic load is connected with described tested power supply, and the current value that passes into described electronic load equals to pass into the current value of described tested power supply;
Described test data collection card gathers the test data of described electronic load as the corresponding test data of described tested power supply, and the test data that gathers is deposited in described database.
Described method comprises: the voltage magnitude, the frequency that export tested power supply by the embedded controller controls programmable power supply of testing apparatus to, and control the current value that passes into electronic load, make the current value that passes into described electronic load equal to pass into the current value of described tested power supply;
Test data collection card by testing apparatus gathers the test data of described electronic load as the corresponding test data of described tested power supply, and the test data that gathers is deposited in database;
Detect the performance of tested power supply according to the test data that deposits database in.
In the embodiment of the present invention, by testing apparatus control programmable power supply, electronic load is tested tested power supply, and the test data of collection, store electrons load is as the corresponding test data of tested power supply.Owing to can knowing the performance condition of tested power supply according to the test data of storage, whether therefore can judge tested power supply still is fit to continue in nuclear power station work, perhaps can judge the power supply that tested power supply whether can replacing nuclear power have broken down in the station, thus guarantee nuclear power station can be reliably after new power more, operation safely.
For technical solutions according to the invention are described, describe below by specific embodiment.
Embodiment one:
Fig. 1 shows the structure of the nuclear power station power detection system that first embodiment of the invention provides, and for convenience of explanation, only shows the part relevant to the present embodiment.
Nuclear power station power detection system 1 comprises programmable power supply 11, electronic load 12, testing apparatus 13, database 14 and tested power supply 15.Wherein, testing apparatus 13 comprises embedded controller 131, test data collection card 132 etc.
Embedded controller 131 in testing apparatus 13 is controlled voltage magnitude, the frequency that programmable power supply 11 exports tested power supply 15 to, and controls the current value that passes into electronic load 12.This electronic load 12 also is connected with tested power supply 15 except with embedded controller 131 is connected, and the current value that passes into electronic load 12 equals to pass into the current value of tested power supply 15.
Test data collection card 132 in testing apparatus 13 gathers the test data of electronic load 12 as the corresponding test data of tested power supply 15, and the test data that gathers is deposited in database 14.
In the present embodiment, programmable power supply 11 is used for the voltage corresponding with this Voltage-output steering order according to the Voltage-output steering order output that receives to tested power supply 15, with the tested power supply of test different model and the different test events of tested power supply; Electronic load 12 is used for passing into the current value of this electronic load 12 according to the Current Control instruction setting that receives, in order to determine to pass into the current value of tested power supply 15;
The testing apparatus 13 of the present embodiment is American National instrument company (NATIONALINSTRUMENTS, NI) testing apparatus, and this testing apparatus 13 comprises embedded controller 131, test data collection card 132 etc.Wherein, this embedded controller 131 is mainly used in controlling whole testing process, such as the magnitude of voltage of controlling programmable power supply 11 outputs, controls the input current value of electronic load 12, and control test data collection card 132 gathers the test data of tested power supplys 15 etc.In the present embodiment, test data comprises the magnitude of voltage, current value of tested power supply 15 etc., and the test data that testing process is obtained all deposits in database, can judge the performance of tested power supply 15 according to the test data of database storage.
In first embodiment of the invention, by testing apparatus 13 control programmable power supplys 11,12 pairs of tested power supplys of electronic load are tested, and the test data of collection, store electrons load 12 is as the corresponding test data of tested power supply 15.Owing to can knowing the performance condition of tested power supply 15 according to the test data of storage, whether therefore can judge tested power supply 15 still is fit to continue in nuclear power station work, perhaps can judge the power supply that tested power supply 15 whether can replacing nuclear power have broken down in the station, thus guarantee nuclear power station can be reliably after new power more, operation safely.
Embodiment two:
Second embodiment of the invention is mainly described and is adopted nuclear power station power detection system 1 to detect AC-DC (AC-DC) power supply, when detecting the AC-DC power supply, programmable power supply 11 is for exchanging programmable power supply 21, electronic load 12 is DC Electronic Loads 22, and tested power supply 15 is the tested power supply 25 of AC-DC.Detect the structural drawing of AC-DC power supply as shown in Figure 2, for convenience of explanation, only show the part relevant to the present embodiment.
In the present embodiment, exchange programmable power supply 21 and DC Electronic Loads 22 general purpose interface bus (General Purpose Interface Bus is all arranged, GPIB) interface, be used for being connected with the embedded controller 231 of testing apparatus 23, this embedded controller 231 is identical with the embedded controller 131 of embodiment one.Embedded controller 231 is controlled output voltage amplitude, the frequency that exchanges programmable power supply 21 by the GPIB cable, control by the GPIB cable that is connected with DC Electronic Loads 22 current value that passes into this DC Electronic Loads 22.
Particularly, the annexation of the DC Electronic Loads of the present embodiment 22 and tested power supply 25, testing apparatus 23 specifically as shown in Figure 3, in Fig. 3, in DC Electronic Loads 22, the OUT positive and negative terminal connects respectively the positive and negative terminal of tested power supply 25; In DC Electronic Loads 22, the SCENCE positive and negative terminal connects respectively the positive and negative terminal of tested power supply 25.The OUT of this DC Electronic Loads 22 holds the simulation resistive load, and the SCENCE end realization of DC Electronic Loads 22 accurately measures tested power supply 25, and this accurately measures the voltage drop of removing on tested power supply 25 and DC Electronic Loads 22 cables.When the electric current and voltage frequency that gathers when needs surpassed 50Hz, Vmoniter that can be by reading DC Electronic Loads 22 and the output voltage of Imoniter were converted to output voltage, the electric current of tested power supply 25, and the output voltage of this Vmoniter is 0 to 10V.The conversion formula of tested power supply 25 is as follows:
Wherein, the V of above-mentioned formula is the output voltage of tested power supply 25, and I is the output current of tested power supply 25.
The present embodiment uses Switching Power Supply general specification GB/T14714-2008 and military hardware dc power supply general specification SJ 20825-2002 as the foundation of test AC-DC power source performance according to the micro-minicomputer system equipment, mainly tests test item as shown in table 1:
Table 1:
Further, at voltage magnitude, current amplitude, frequency, the power of the needed interchange programmable power supply 21 of above-mentioned 1-6 test item, and the input voltage of DC Electronic Loads 22, input current, consumed power also can read register through gpib interface and directly read.And the 7-10 test item such as voltage regulation factor need be passed through testing apparatus 23 analog outputs, load effect and need be passed through testing apparatus 23 digital outputs, then is obtained by test data collection card 232 collection analysises of testing apparatus 23.
The below describes respectively the method for testing that detects each test item of AC-DC power supply:
(1), output voltage ratings and the output current rating of the tested power supply 25 of test
In the present embodiment, testing apparatus 23 controls by the GPIB that connection exchanges programmable power supply 21 the specified input voltage value that this interchange programmable power supply 21 is output as tested power supply 25; The pattern of controlling this DC Electronic Loads 22 by the GPIB that connects DC Electronic Loads 22 is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage of this DC Electronic Loads 22, input current are distinguished output voltage ratings and the output current rating of corresponding tested power supply 25, obtain output voltage ratings and the output current rating of tested power supply 25 by input voltage, the input current that reads DC Electronic Loads 22.
(2), the laod stability of the tested power supply 25 of test
The present embodiment is adjusted the input current of DC Electronic Loads 22 after the input voltage of determining tested power supply 25, and then obtains the laod stability of tested power supply 25.
1, the input voltage of determining tested power supply 25 is 110% of rated voltage:
Testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 110% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
0
Adjust the electric current of DC Electronic Loads 22, make the electric current that passes into DC Electronic Loads 22 from the rated current of tested power supply 25, progressively be decremented to 20% of tested power supply 25 rated current according to default step-length, perhaps, make the electric current that passes into DC Electronic Loads 22 from 20% of tested power supply 25 rated current, progressively be incremented to the rated current of tested power supply 25 according to default step-length.Wherein, default step-length can be 5%, certainly, also can for other step-length, be not construed as limiting herein.After the electric current and time delay certain hour of each adjustment DC Electronic Loads 22, all record the voltage U of this DC Electronic Loads 22
i, wherein, i is from 1 to n, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
2, the input voltage of determining tested power supply 25 is 85% of rated voltage:
Testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 85% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
0'.
Adjust the electric current of DC Electronic Loads 22, make the electric current that passes into DC Electronic Loads 22 progressively be decremented to 20% of tested power supply 25 rated current from the rated current of tested power supply 25 according to default step-length, perhaps, make the electric current that passes into DC Electronic Loads 22 from 20% of tested power supply 25 rated current, progressively be incremented to the rated current of tested power supply 25 according to default step-length.Wherein, default step-length can be 5%, certainly, also can for other step-length, be not construed as limiting herein.After the electric current and time delay certain hour of each adjustment DC Electronic Loads 22, all record the voltage U of this DC Electronic Loads 22
i', wherein, the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
In the present embodiment, the laod stability of establishing tested power supply 25 is S
Negative,
Wherein, when voltage is 85% rated voltage, Δ U
0=| U
0'-U
i' |, U0=U
0'; When voltage is 110% rated voltage, Δ U
0=| U
0-U
i|, U0=U0.To in this example 1,2 two kind of laod stability S that situation obtains
NegativeGet wherein large value.
Certainly, the present embodiment except will exchange programmable power supply 21 be output as tested power supply 25 specified input voltage values 110% and 85%, also can for other numerical value, be not construed as limiting herein.
(3), the voltage stabilized range of the tested power supply 25 of test
The present embodiment is adjusted the load current of DC Electronic Loads 22 after the input voltage of determining tested power supply 25, and then obtains the voltage stabilized range of tested power supply 25.
1, testing apparatus 23 is controlled by GPIB and is exchanged the specified input voltage value that programmable power supply 21 is output as tested power supply 25; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
2
Adjust the load current of DC Electronic Loads 22, make the load current that passes into DC Electronic Loads 22 from the rated current of tested power supply 25, progressively be decremented to the minimum load electric current of tested power supply 25 according to default step-length, perhaps, make the load current that passes into DC Electronic Loads 22 from the minimum load electric current of tested power supply 25, progressively be incremented to the rated current of tested power supply 25 according to default step-length.Wherein, default step-length can be 5%, certainly, also can for other step-length, be not construed as limiting herein.After the electric current and time delay certain hour of each adjustment DC Electronic Loads 22, all record the voltage U of this DC Electronic Loads 22
j, wherein, j is from 1 to m, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
2, testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 85% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
2'.
Adjust the load current of DC Electronic Loads 22, make the load current that passes into DC Electronic Loads 22 from the rated current of tested power supply 25, progressively be decremented to the minimum load electric current of tested power supply 25 according to default step-length, perhaps, make the load current that passes into DC Electronic Loads 22 from the minimum load electric current of tested power supply 25, progressively be incremented to the rated current of tested power supply 25 according to default step-length.Wherein, default step-length can be 5%, certainly, also can for other step-length, be not construed as limiting herein.After the electric current and time delay certain hour of each adjustment DC Electronic Loads 22, all record the voltage U of this DC Electronic Loads 22
j', wherein, j is from 1 to m, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
3, testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 110% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
2".
Adjust the load current of DC Electronic Loads 22, make the load current that passes into DC Electronic Loads 22 from the rated current of tested power supply 25, progressively be decremented to the minimum load electric current of tested power supply 25 according to default step-length, perhaps, make the load current that passes into DC Electronic Loads 22 from the minimum load electric current of tested power supply 25, progressively be incremented to the rated current of tested power supply 25 according to default step-length.Wherein, default step-length can be 5%, certainly, also can for other step-length, be not construed as limiting herein.After the electric current and time delay certain hour of each adjustment DC Electronic Loads 22, all record the voltage U of this DC Electronic Loads 22
j", wherein, j is from 1 to m, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
In the present embodiment, the voltage stabilized range of establishing tested power supply 25 is S
Surely,
To the 1st kind of situation, Δ U
2=| U
2-U
j|, U
2=U
2To the 2nd kind of situation, Δ U
2=| U
2'-U
j' |, Δ U
2=U
2'; To the 3rd kind of situation, Δ U
2=| U
2" U
j" |, Δ U
2=U
2".To in this example 1,2,3 kind of voltage stabilized range S that situation obtains
Surely, get wherein maximal value.
Certainly, the present embodiment except will exchange programmable power supply 21 be output as the specified input voltage of tested power supply 25, specified input voltage value 110% and 85%, also can for other numerical value, be not construed as limiting herein.
(4), the voltage-regulation coefficient of the tested power supply 25 of test
The present embodiment is adjusted the output voltage that exchanges programmable power supply 11 after the input current of determining DC Electronic Loads 22, and then obtains the voltage-regulation coefficient of tested power supply 25.
1, testing apparatus 23 is constant current (CC) pattern by the pattern that GPIB controls DC Electronic Loads 22, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25; Control by GPIB and exchange the specified input voltage value that programmable power supply 21 is output as tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
4Adjust interchange programmable power supply 21 and be output as 110% of tested power supply 25 rated voltages, after the time delay certain hour, the voltage U of recorded electronic load 22
kAdjust again interchange programmable power supply 21 and be output as 85% of tested power supply 25 rated voltages, after the time delay certain hour, the voltage U of recorded electronic load 22
k'.Wherein, k is from 1 to N, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
2, testing apparatus 23 is constant current (CC) pattern by the pattern that GPIB controls DC Electronic Loads 22, and to set the electric current pass into this DC Electronic Loads 22 be 20% of tested power supply 25 load current values; Control by GPIB and exchange the specified input voltage value that programmable power supply 21 is output as tested power supply 25, the input voltage U of record DC Electronic Loads 22 this moment
4'.Adjust interchange programmable power supply 21 and be output as 110% of tested power supply 25 rated voltages, after the time delay certain hour, the voltage U of recorded electronic load 22
k1Adjust again interchange programmable power supply 21 and be output as 85% of tested power supply 25 rated voltages, after the time delay certain hour, the voltage U of recorded electronic load 22
k1'.Wherein, k1 is from 1 to M, and the time of time delay can be set as 10 seconds, certainly, also can be set as other times numerical value, is not construed as limiting herein.
In the present embodiment, the voltage-regulation coefficient of establishing tested power supply 25 is S
Electricity,
Wherein, Δ U
4Get | U
4-U
k|, | U
4-U
k' | and | U
4-U
k1|, | U
4-U
k1' | maximal value.
Certainly, the present embodiment except will exchange programmable power supply 21 be output as the specified input voltage of tested power supply 25, specified input voltage value 110% and 85%, also can for other numerical value, be not construed as limiting herein.
(5), the efficient of the tested power supply 25 of test
The present embodiment is adjusted the output voltage that exchanges programmable power supply 11 after the input current of determining DC Electronic Loads 22, and then obtains the power efficiency of tested power supply 25.
1, testing apparatus 23 is constant current (CC) pattern by the pattern that GPIB controls DC Electronic Loads 22, and to set the electric current pass into this DC Electronic Loads 22 be the load current value of tested power supply 25; Control by GPIB and exchange the specified input voltage value that programmable power supply 21 is output as tested power supply 25, exchange the output power of programmable power supply 21 and the absorbed power of DC Electronic Loads 22 by gpib interface from register read.
2, testing apparatus 23 is constant current (CC) pattern by the pattern that GPIB controls DC Electronic Loads 22, and to set the electric current pass into this DC Electronic Loads 22 be 20% of tested power supply 25 load current values; Control by GPIB and exchange the specified input voltage value that programmable power supply 21 is output as tested power supply 25, exchange the output power of programmable power supply 21 and the absorbed power of DC Electronic Loads 22 by gpib interface from register read.
3, testing apparatus 23 is constant current (CC) pattern by the pattern that GPIB controls DC Electronic Loads 22, and to set the electric current pass into this DC Electronic Loads 22 be 50% of tested power supply 25 load current values; Control by GPIB and exchange the specified input voltage value that programmable power supply 21 is output as tested power supply 25, exchange the output power of programmable power supply 21 and the absorbed power of DC Electronic Loads 22 by gpib interface from register read.
In the present embodiment, the power efficiency of establishing tested power supply 25 is η
Effect,
Wherein, P
OUTFor exchanging the output power of programmable power supply 21, P
INAbsorbed power for DC Electronic Loads 22.If P
OUTFor exchange programmable power supply 21 the electric current of DC Electronic Loads 22 be tested power supply 25 load
current values 50% the time output power, P
INFor DC Electronic Loads 22 the electric current of this DC Electronic Loads 22 be tested power supply 25 load
current values 50% the time absorbed power.
Certainly, the present embodiment except the current settings with DC Electronic Loads 22 be tested power supply 25 specified input current, rated current 20% and 50%, also can for other numerical value, be not construed as limiting herein.
(6), load current step overshoot amplitude, the transient recovery time of the tested power supply 25 of test
The present embodiment is after determining to exchange the output voltage of programmable power supply 21, adjustment passes into the electric current of DC Electronic Loads 22, test data collection card 232 by testing apparatus 23 gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz again, and be depicted as on the oscillograph 233 that waveform is presented at testing apparatus 23, and then load current step overshoot amplitude and the transient recovery time of obtaining tested power supply 25.
Fig. 4 shows the load current step overshoot amplitude of the tested power supply 25 of the present embodiment test and the structure connection layout of transient recovery time.
1, testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as the specified input voltage value of tested power supply 25; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be 50% of tested power supply 25 load current values, electronic load 22 produces a rising edge by testing apparatus 23, the current value that makes DC Electronic Loads 22 to 100% of the rated current of tested power supply 25, sees Fig. 5 by 50% step of the rated current of tested power supply 25 for details.Test data collection card 232 by testing apparatus 23 gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz again, and the Vmoniter signal that gathers is depicted as on the oscillograph 233 that waveform is presented at testing apparatus 23, put down in writing overshoot amplitude and the transient recovery time of tested power supply 25, specifically see also Fig. 6.
2, testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 85% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be 50% of tested power supply 25 load current values, produce a rising edge by testing apparatus 23, the current value that makes DC Electronic Loads 22 by 50% step of the rated current of tested power supply 25 to 100% of the rated current of tested power supply 25.Test data collection card 232 by testing apparatus 23 gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz again, and the Vmoniter signal that gathers is depicted as waveform, puts down in writing overshoot amplitude and the transient recovery time of tested power supply 25.
3, testing apparatus 23 is controlled interchange programmable power supply 21 by GPIB and is output as 110% of tested power supply 25 specified input voltage values; The pattern of controlling DC Electronic Loads 22 by GPIB is constant current (CC) pattern, and to set the electric current pass into this DC Electronic Loads 22 be 50% of tested power supply 25 load current values, produce a rising edge by testing apparatus 23, the current value that makes DC Electronic Loads 22 by 50% step of the rated current of tested power supply 25 to 100% of the rated current of tested power supply 25.Test data collection card 232 by testing apparatus 23 gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz again, and the Vmoniter signal that gathers is depicted as waveform, puts down in writing overshoot amplitude and the transient recovery time of tested power supply 25.
Certainly, the present embodiment except the power settings that will exchange programmable power supply 21 be tested power supply 25 rated voltage, rated voltage 85% and 110%, also can for other numerical value, be not construed as limiting herein.
(7), input voltage step overshoot amplitude, the transient recovery time of the tested power supply 25 of test
The present embodiment produces a rising edge by testing apparatus 23, triggers to exchange programmable power supply 21 output analog power step signals, and at this moment, this exchanges programmable power supply 21 as a power amplifier.Wherein, testing apparatus 23 can be chosen the Agilent power supply for generation of a rising edge, exchanges programmable power supply 21 and can choose the CHROMA power supply.
Fig. 7 shows the input voltage step overshoot amplitude of the tested power supply 25 of the present embodiment test, the structure connection layout of transient recovery time.In Fig. 7, testing apparatus 23 is the GPIB cable with 3 cables that interchange programmable power supply 21 is connected, and the rightmost side cable that is connected with DC Electronic Loads 22 is the GPIB cable.
1, adjust DC Electronic Loads 22, make the output that exchanges programmable power supply 21 from the load voltage value step of tested power supply 25 to 110% of tested power supply 25 load voltage values, the test data collection card 232 that passes through again testing apparatus 23 after the time delay certain hour gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz, and the Vmoniter signal that gathers is depicted as on the oscillograph 233 that waveform is presented at testing apparatus 23, see Fig. 8 for details, put down in writing overshoot amplitude and the transient recovery time of tested power supply 25 according to the data of Fig. 8 demonstration.In Fig. 8, ordinate V representative voltage, horizontal ordinate t represents the time, A is general Voltage-output amount, T
DBe transient delay time, T
RBe transient recovery time, T
τBe total transient recovery time.
2, adjust DC Electronic Loads 22, make the output that exchanges programmable power supply 21 from the load voltage value step of tested power supply 25 to 85% of tested power supply 25 load voltage values, the test data collection card 232 that passes through again testing apparatus 23 after the time delay certain hour gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz, and the Vmoniter signal that gathers is depicted as on the oscillograph 233 that waveform is presented at testing apparatus 23, and put down in writing overshoot amplitude and the transient recovery time of tested power supply 25.
(8), the switching on and shutting down characteristic of the tested power supply 25 of test
In the present embodiment, be operated in respectively zero load, semi-load and the full load of tested power supply 25 when DC Electronic Loads 22, make to exchange programmable power supply 21 output step signals, and the switching on and shutting down characteristic of testing tested power supply 25.
When the below was operated in tested power supply 25 unloaded with DC Electronic Loads 22, the switching on and shutting down characteristic of testing tested power supply 25 was that example describes.
Testing apparatus 23 produces a rising edge, triggers to exchange programmable power supply 21 output analog power step signals, and at this moment, this exchanges programmable power supply 21 as a power amplifier.Wherein, testing apparatus 23 can be chosen the Agilent power supply for generation of a rising edge, exchanges programmable power supply 21 and can choose the CHROMA power supply.During ratings when the magnitude of voltage that exchanges programmable power supply 21 outputs from the 0V step to tested power supply 25, the test data collection card 232 that passes through again testing apparatus 23 after the time delay certain hour gathers the Vmoniter signal of DC Electronic Loads 22 with the sampling rate of 200KHz, and the Vmoniter signal that gathers is depicted as on the oscillograph 233 that waveform is presented at testing apparatus 23, determine unused time and the fall time of tested power supply 25 according to the oscillogram of oscillograph 233 demonstrations, specifically as shown in Figure 9.In Fig. 9, UUT represents tested power supply 25
The switching on and shutting down characteristic that is operated in semi-load of tested power supply 25 and the tested power supply 25 of full load test when DC Electronic Loads 22 is not similarly given unnecessary details herein.
(9), ripple and the noise of the tested power supply 25 of test
In the present embodiment, control by GPIB load voltage value that the magnitude of voltage that exchanges programmable power supply 21 outputs is respectively tested power supply 25, load voltage value 85% and load voltage value 110% the time, the electric current of controlling DC Electronic Loads 22 is respectively the load current value of tested power supply 25 and ripple and the noise that minimum value is obtained tested power supply 25.Wherein, test the structure connection layout of the ripple of tested power supply 25 and noise as shown in figure 10, for convenience of explanation, only show part-structure.
The load voltage value of the below take the magnitude of voltage that control to exchange programmable power supply 21 outputs as tested power supply 25 obtains the ripple of tested power supply 25 and noise and describes as example.
It is the load voltage value of tested power supply 25 that test macro 23 controls by GPIB the magnitude of voltage that exchanges programmable power supply 21 outputs, controlling DC Electronic Loads 22 is the CC pattern, and the electric current pass into this DC Electronic Loads 22 is set is the rated current of tested power supply 25, then adopts the interchange shelves of the oscillograph 233 of testing apparatus 23 to obtain peak-to-peak value and the effective value of tested power supply AC compounent 25 this moment.Afterwards, regulating the electric current that passes into DC Electronic Loads 22 is the minimum current of tested power supply 25, then adopts the interchange shelves of the oscillograph 233 of testing apparatus 23 to obtain tested power supply 25 peak-to-peak value and the effective value of AC compounent at this moment.
The ripple of the corresponding tested power supply 25 of the peak-to-peak value of the AC compounent of obtaining due to test process, and therefore the noise of the corresponding tested power supply 25 of the effective value of AC compounent has obtained the peak-to-peak value of tested power supply 25 AC compounent and ripple and the noise that effective value can obtain tested power supply 25 afterwards.
In the present embodiment, test tested power supply 25 and be respectively 110% the ripple of 85% and load voltage value of load voltage value of this tested power supply 25 and noise at the magnitude of voltage that exchanges programmable power supply 21 outputs similarly, do not give unnecessary details herein.
in second embodiment of the invention, adopt and exchange programmable power supply 21, DC Electronic Loads 22, comprise embedded controller 231, the testing apparatus 23 of test data collection card 232 and oscillograph 233 forms the detection system of the tested power supply 25 of test, this detection system can detect the output voltage ratings of AC-DC power supply, output current rating, laod stability, voltage stabilized range, voltage-regulation coefficient, efficient, the load current step overshoot amplitude, the load current step transient recovery time, input voltage step overshoot amplitude, the input voltage step transient recovery time, the performances such as switching on and shutting down characteristic and ripple and noise, can judge according to the various performance parameters of obtaining whether tested power supply 25 meets in nuclear power station work, wherein, the tested power supply 25 of the present embodiment is the AC-DC power supply.
Embodiment three:
Third embodiment of the invention is mainly described and is adopted nuclear power station power detection system 1 to detect DC-to-dc (DC-DC) power supply, when detecting the DC-DC power supply, programmable power supply 11 is program-control DC power 31, electronic load 12 is DC Electronic Loads 32, and tested power supply 15 is the tested power supply 35 of DC-DC.Detect the structural drawing of DC-DC power supply as shown in figure 11.In Figure 11, testing apparatus 33 is connected with program-control DC power 31 by the GPIB cable, and in addition, this testing apparatus 33 also is connected with DC Electronic Loads 32 by GPIB, as the rightest connecting line of testing apparatus in Figure 11 33 with DC Electronic Loads 32.For convenience of explanation, Figure 11 only shows the part relevant to the present embodiment.
The present embodiment uses the DC-to-dc modular power source as the foundation of test DC-DC power source performance according to YD/T 732-200 * communication, mainly tests test item as shown in table 2:
Table 2:
The below describes respectively the method for testing that detects each test item of DC-DC power supply:
(1), the input direct voltage variation range of the tested power supply 35 of test
In the present embodiment, testing apparatus 33 controls by the GPIB that connection exchanges programmable power supply 31 the specified input voltage value that this interchange programmable power supply 31 is output as tested power supply 35; The pattern of controlling this DC Electronic Loads 32 by the GPIB that connects DC Electronic Loads 32 is the CC pattern, and to set the electric current pass into this DC Electronic Loads 32 be the load current value of tested power supply 35, the output voltage ratings of the corresponding tested power supply 35 of the input voltage of this DC Electronic Loads 32 records the output voltage ratings of this tested power supply 35.
Control by GPIB the maximum input voltage that program-control DC power 31 is output as tested power supply 35, the maximum input voltage of record DC Electronic Loads 32 this moment, the maximum output voltage of the corresponding tested power supply 35 of the maximum input voltage of this DC Electronic Loads 32; Control by GPIB the minimum input voltage that program-control DC power 31 is output as tested power supply 35 again, the minimum input voltage of record DC Electronic Loads 32 this moment, the minimum output voltage of the corresponding tested power supply 35 of minimum input voltage of this DC Electronic Loads 32.
In the present embodiment, if the maximum output voltage of the output voltage ratings of tested power supply 35 and this tested power supply 35 and with the difference of the minimum input voltage of this tested power supply 35 all be not more than these tested power supply 35 nominal output voltages ± 2%, judge that tested power supply 35 meets the requirement of nuclear power station on this performance of input direct voltage variation range.
(2), the output voltage setting value of the tested power supply 35 of test
In the present embodiment, testing apparatus 33 controls by the GPIB that connection exchanges programmable power supply 31 the specified input voltage value that this interchange programmable power supply 31 is output as tested power supply 35; The pattern of controlling this DC Electronic Loads 32 by the GPIB that connects DC Electronic Loads 32 is the CC pattern, and to set the electric current that passes into this DC Electronic Loads 32 be the load current value of tested power supply 35, records the input voltage of this DC Electronic Loads 32.
In the present embodiment, if the difference of the rated voltage of the input voltage of DC Electronic Loads 32 and tested power supply 35 is not more than these tested power supply 35 nominal output voltages ± 2%, judge that tested power supply 35 meets the requirement of nuclear power station on this performance of output voltage setting value.
(3), the voltage regulation factor of the tested power supply 35 of test
In the present embodiment, testing apparatus 33 controls by the GPIB that connection exchanges programmable power supply 31 the specified input voltage value that this interchange programmable power supply 31 is output as tested power supply 35; The pattern of controlling this DC Electronic Loads 32 by the GPIB that connects DC Electronic Loads 32 is the CC pattern, and to set the electric current pass into this DC Electronic Loads 32 be the load current value of tested power supply 35, the output voltage ratings of the corresponding tested power supply 35 of the input voltage of this DC Electronic Loads 32 records the output voltage ratings V of this tested power supply 35
0
1, testing apparatus 33 is controlled by GPIB and is exchanged the maximum voltage value that programmable power supply 31 is output as tested power supply 35 inputs, adjusting the electric current that passes into DC Electronic Loads 32 respectively is minimum current value and the load current value of tested power supply 35 loads, and records the output voltage of tested power supply 35 under above-mentioned 2 kinds of states.
2, testing apparatus 33 is controlled by GPIB and is exchanged the minimum voltage value that programmable power supply 31 is output as tested power supply 35 inputs, adjusting the electric current that passes into DC Electronic Loads 32 respectively is minimum current value and the load current value of tested power supply 35 loads, and records the output voltage of tested power supply 35 under above-mentioned 2 kinds of states.
With the output voltage ratings comparison with this tested power supply 35 of the output voltage of tested power supply 35 under above-mentioned 4 kinds of states, suppose that the voltage of deviation maximum of the output voltage ratings of the output voltage of tested power supply 35 under 4 kinds of states and tested power supply 35 is V
MAX, the precision of voltage regulation of tested power supply 35 is:
(4), the load regulation of the tested power supply 35 of test
In the present embodiment, testing apparatus 33 controls by the GPIB that connection exchanges programmable power supply 31 the specified input voltage value that this interchange programmable power supply 31 is output as tested power supply 35; The electric current of controlling respectively this DC Electronic Loads 32 by the GPIB that connects DC Electronic Loads 32 be load current value, the load current value of tested power supply 35 minimum value, load current value 50%, record respectively the input voltage of this DC Electronic Loads 32.
Suppose V
b0Be the specified input voltage value of tested power supply 35, V
b1Be the output voltage of tested power supply 35 when exporting the minimum value electric current, V
b2Be the output voltage of tested power supply 35 when exporting load current value, the load conciliation rate of tested power supply 35 is:
(5), the conversion efficiency of the tested power supply 35 of test
In the present embodiment, testing apparatus 33 controls by GPIB the voltage that program-control DC power 31 outputs equate with tested power supply 35 load voltage values, and controlling the electric current that passes into DC Electronic Loads 32 is the rated current of tested power supply 35.Exchange the output power of programmable power supply 21 and the input of DC Electronic Loads 22 (or absorption) power by gpib interface from register read more afterwards.
The conversion efficiency of tested power supply 35 is:
Wherein, P
0For exchanging the output power of programmable power supply 21, P
1Power input for DC Electronic Loads 22.
(6), the transient response of the tested power supply 35 of test
The present embodiment is controlled the program-control DC power 31 output voltages identical with the specified input voltage value of tested power supply 35 by GPIB, the output current of controlling again DC Electronic Loads 32 is from 25% step of tested power supply 35 load current values to 50% of load current value, then from 50% step of load current value to 25% of load current value.Test data collection card 322 by testing apparatus 33 gathers the Vmoniter signal of DC Electronic Loads 32 with the sampling rate of 200KHz, and the Vmoniter signal that gathers is depicted as on the oscillograph 333 that waveform is presented at testing apparatus 33, the DATA REASONING that shows according to oscillograph 333 goes out the maximal voltage overshoot amplitude of this tested power supply 35 and out-put supply and returns to the time used when satisfying the precision of voltage regulation and requiring.
Certainly, also can be after controlling the program-control DC power 31 outputs voltage identical with the specified input voltage value of tested power supply 35, the output current of controlling DC Electronic Loads 32 is from 50% step of tested power supply 35 load current values to 75% of load current value, again from 75% step of load current value to 50% of load current value, perhaps control DC Electronic Loads 32 and realize that the step of other numerical value changes, and is not construed as limiting herein.
In the present embodiment, if oscillogram from the peak value of voltage jump constantly, returning to output voltage finally satisfies the time that the precision of voltage regulation requires and is not more than 400 μ s, and the overshoot of the maximal voltage overshoot amplitude of tested power supply 35 does not surpass these tested power supply 35 out-put supply setting valves ± 5%, judges that tested power supply 35 meets the nuclear power station requirement at this performance item of transient response.
(7), the peak-to-peak noise voltage of the tested power supply 35 of test
In the present embodiment, the magnitude of voltage of controlling program-control DC power 31 outputs by GPIB is the load voltage value of tested power supply 35, controlling DC Electronic Loads 32 is the CC pattern, and the electric current that DC Electronic Loads 32 is set is the load current value of tested power supply 35, then adopts the interchange shelves of the oscillograph 233 of testing apparatus 23 to obtain peak-to-peak value and the effective value of tested power supply 35 AC compounent.
in third embodiment of the invention, adopt program-control DC power 31, DC Electronic Loads 32, comprise embedded controller 331, the testing apparatus 33 of test data collection card 332 and oscillograph 333 forms the detection system of the tested power supply 35 of test, this detection system can detect the input direct voltage variation range of DC-DC power supply, the output voltage setting value, voltage regulation factor, load regulation, conversion efficiency, the performance such as transient response and peak-to-peak noise voltage, can judge according to the various performance parameters of obtaining whether tested power supply 35 meets in nuclear power station work, wherein, the tested power supply 35 of the present embodiment is the DC-DC power supply.
Embodiment four:
Fourth embodiment of the invention is mainly described and is adopted nuclear power station power detection system 1 to detect AC-AC (AC-AC) power supply, when detecting the AC-AC power supply, programmable power supply 11 is for exchanging programmable power supply 41, electronic load 12 is alternating current electronic load 42, and tested power supply 15 is the tested power supply 45 of AC-AC.Detect the structural drawing of AC-AC power supply as shown in figure 12.In Figure 12, testing apparatus 43 is connected with alternating current electronic load with interchange programmable power supply 41 by the GPIB cable and is connected.For convenience of explanation, Figure 12 only shows the part relevant to the present embodiment.
The present embodiment uses power transformer and the total technical conditions of smoothing choke as the foundation of test AC-AC power source performance according to GB/T 15290-1994 electronic equipment, mainly tests test item as shown in table 3:
Table 3:
The method of testing of the load characteristic that detects the AC-AC power supply is described below:
1, testing apparatus 43 is controlled by GPIB and is exchanged the minimum operating voltage that programmable power supply 41 is output as tested power supply 45, the pattern of controlling alternating current electronic load 42 by GPIB is constant current (CC) pattern, and set respectively zero load, the semi-load and fully loaded that the electric current that passes into this alternating current electronic load 42 is tested power supply 45, then record respectively alternating current electronic load 42 in input voltage value and the input current value of above-mentioned three state.
2, control operating voltage and the maximum operating voltage that interchange programmable power supply 41 is output as tested power supply 45, repeat above-mentioned 1 step, obtain corresponding magnitude of voltage and current value.
Further, if tested power supply 45 requires its load to be necessary for power resistor, nuclear power station power detection system 1 also comprises power resistor.
Embodiment five:
Fifth embodiment of the invention is mainly described and is adopted nuclear power station power detection system 1 to detect DC-AC (DC-AC) power supply, when detecting the DC-AC power supply, programmable power supply 11 is program-control DC power 51, electronic load 12 is alternating current electronic load 52, its input voltage frequency is DC~440Hz, tested power supply 15 is the tested power supply 55 of DC-AC, and output voltage frequency is lower than 440Hz, also referred to as inverter.Detect the structural drawing of DC-AC power supply as shown in figure 13.In Figure 13, testing apparatus 53 is connected with alternating current electronic load with program-control DC power 51 by the GPIB cable and is connected, wherein pass through GPIB cable and alternating current electronic load 52 be connected as Figure 13 than the right side line.For convenience of explanation, Figure 13 only shows the part relevant to the present embodiment.
The present embodiment uses the test method of inverter part 2 as the foundation of test DC-AC power source performance from net type wind energy, solar power system according to GB20321.2-2006-T, mainly test test item as shown in table 4:
Table 4:
The below describes respectively each performance test method of DC-AC power supply that detects:
(1), output voltage, the output frequency of the tested power supply 55 of test
In the present embodiment, testing apparatus 53 controls by the GPIB that connects program-control DC power 51 the specified input voltage value that this program-control DC power 51 is output as tested power supply 55; The pattern of controlling this alternating current electronic load 52 by the GPIB that connects alternating current electronic load 52 is constant current (CC) pattern, and to set the electric current pass into this alternating current electronic load 52 be the load current value of tested power supply 55, and making the power of tested power supply 55 outputs is rated power.Due to the input voltage of this alternating current electronic load 52, output voltage ratings and the output current rating of the corresponding tested power supply 55 of input current difference, so by the load that GPIB directly reads alternating current electronic load 52, obtain output voltage, the output frequency of tested power supply 55.Control respectively again program-control DC power 51 and be output as 85% and 120% of tested power supply 55 specified input voltages, repeat output voltage, the output frequency of above-mentioned steps to obtain tested power supply 55.Certainly, except 85% and 120%, the output voltage that also can control program-control DC power 51 is other values, is not construed as limiting herein.
(2), the grade of load of the tested power supply 55 of test
In the present embodiment, testing apparatus 53 controls by the GPIB that connects program-control DC power 51 the specified input voltage value that this program-control DC power 51 is output as tested power supply 55; The pattern of controlling this alternating current electronic load 52 by the GPIB that connects alternating current electronic load 52 is constant current (CC) pattern, and to set the electric current that passes into this alternating current electronic load 52 be the load current value of tested power supply 55; After end is set, directly read the load of alternating current electronic load 52 by GPIB, obtain the output voltage of tested power supply 55.Keep at last the output voltage of program-control DC power 51 constant, then the load of controlling respectively alternating current electronic load 52 is 125% and 150% of tested power supply 55 rated current, repeats above-mentioned steps to obtain the output voltage of tested power supply 55.Certainly, except 125% and 150%, the load that also can control alternating current electronic load 52 is other values, is not construed as limiting herein.
(3), the open circuit loss of the tested power supply 55 of test
In the present embodiment, testing apparatus 53 controls by the GPIB that connects program-control DC power 51 the specified input voltage value that this program-control DC power 51 is output as tested power supply 55; Control this alternating current electronic load 52 by the GPIB that connects alternating current electronic load 52 and be output as unloaded output, and read the output power of this alternating current electronic load 52, obtain the open circuit loss of tested power supply 55.
(4), the output waveform of the tested power supply 55 of test
In the present embodiment, testing apparatus 53 controls by the GPIB that connects program-control DC power 51 the specified input voltage value that this program-control DC power 51 is output as tested power supply 55; Control this alternating current electronic load 52 by the GPIB that connects alternating current electronic load 52 and be rated power output.
The oscillograph card of employing oscillograph 533 reads half peak value and the odd harmonic value of sine value corresponding to tested
power supply 55 output voltages, and determine peak-to-peak value and the noise of this square wave according to the square wave figure that is presented at oscillograph 533, thereby determine the output waveform of tested power supply 55.For example, read half peak value and, three of sine value corresponding to tested
power supply 55 output voltages, square wave figure that the quintuple harmonics value is obtained as shown in figure 14 according to the oscillograph card, according to the square wave figure of Figure 14 determine in figure a, b value and
(5), the efficient of the tested power supply 55 of test
In the present embodiment, testing apparatus 53 controls by the GPIB that connects program-control DC power 51 the specified input voltage value that this program-control DC power 51 is output as tested power supply 55; Control this alternating current electronic load 52 by the GPIB that connects alternating current electronic load 52 and be rated power output.Read again the output power of program-control DC power 51 by GPIB, read the power input of alternating current electronic load 52, and then obtain the loss power of alternating current electronic load 52, finally obtain the efficient of tested power supply 55.
As a preferred embodiment of the present invention, when the output voltage of tested power supply 55 during higher than 440Hz, electronic load 12 is power resistor, and the hardware configuration of nuclear power station power detection system 1 connects as shown in figure 15, detects the respective performances of tested power supply according to this syndeton.
In fifth embodiment of the invention, adopt program-control DC power 51, alternating current electronic load 52, testing apparatus 53 to form the detection system of the tested power supply 55 of test, this detection system can detect the performances such as output voltage, output frequency, the grade of load, open circuit loss, output waveform and efficient of DC-AC power supply, can judge according to the various performance parameters of obtaining whether tested power supply 55 meets in nuclear power station work, wherein, the tested power supply 55 of the present embodiment is the DC-AC power supply.
Embodiment six:
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises rack, is used for installing programmable power supply 11, electronic load 12, the testing apparatus 13 of nuclear power station power detection system 1, and this rack has a plurality of interlayers, certain distance is arranged between each interlayer, be beneficial to heat radiation.
In the present embodiment, on rack, the spacing of each interlayer can equate, also can not wait, and such as being all 1U or 2U etc., is not construed as limiting herein.When only needing the power supply of one type of test, only need to use a rack, when needs are tested the power supply of Four types simultaneously, need to use 3 racks.As the NI testing apparatus as example, specifically see also Figure 16, take testing apparatus 13 in Figure 16, comprise 1 switch board, 2 test cabinets, switch board are mainly used in installing has the hardware of controlling function, such as the NI embedded controller 131 of programmable power supply 11, NI testing apparatus 13 etc.
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises: printer, this printer are used for printing with the test data of form mode with database 14 storages.
In the present embodiment, printer connection data storehouse 14, and print the test data of this database 14, make the test man check more intuitively and easily the test data of tested power supply.
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises: the over-current protecting unit of tested power supply 15.The over-current protecting unit of this tested power supply 15 is for detection of input current, input voltage, output current, the output voltage of tested power supply 15; and after any one exceeds default ratings in the input current that detects, input voltage, output current, output voltage, cut off power supply (programmable power supply 11) output of tested power supply 15 and cut off electronic load 12 loads.Further, underproof tested power supply 15 is reported to the police.Certainly, also can carry out overcurrent, overvoltage, overheated and short-circuit protection to programmable power supply 11 and electronic load 12, be not construed as limiting herein.
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises: temperature sensor.This temperature sensor is used for gathering the temperature of tested power supply 15, and after the temperature that gathers exceeds default temperature value, cuts off nuclear power station power detection system 1 power supply.Further, the tested power supply 15 of excess Temperature is reported to the police.The power supply of the present embodiment belongs to power device, and thermal value is larger, the easy damage equipment of too high temperature.In order to protect the safe operation of equipment, this nuclear power station power detection system 1 has adopted the temperature sensor collecting temperature, causes excess Temperature such as damaging at the rack sending out the hot fan, and after exceeding default temperature value, equipment will carry out power-off protection.Wherein, temperature sensor in the collection point of rack as shown in figure 17 but be not limited to Figure 17, in Figure 17, whole rack is of a size of 38Unit.
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises: the ground protection unit.This ground protection unit is used for the grounded parts of programmable power supply 11, electronic load 12 and tested power supply 15 is connected to corresponding protective ground terminal, to guarantee the needing equipment of ground connection to have protective ground to connect.Further, the protective ground conductor is greater than 5mm
2, the color of protective ground conductor is greenish-yellow double-colored.
As a preferred embodiment of the present invention, nuclear power station power detection system 1 also comprises: the insulation protection unit.This insulation protection unit is used for as required programmable power supply 11, electronic load 12 and tested power supply 15 being carried out corresponding Leakage Current to be processed.In the present embodiment, choose the insulating material protection nuclear power station power detection system 1 with enough insulating property, and according to the difference of range of application, Leakage Current be limited in do not affect safe ultimate value within.
Embodiment seven:
In order to detect more accurately the properties of tested power supply 15, the present embodiment adopts 1 pair of tested power supply 15 of nuclear power station power detection system to carry out long-time run with load, namely tested power supply 15 is carried out strike-machine and detects, and corresponding system construction drawing as shown in figure 18.Wherein, tested power supply 15 comprises above-mentioned AC-DC power supply, DC-DC power, AC-DC power supply, 4 kinds of power supplys of DC-AC power-supply.Testing apparatus 13 is from voltage, the current output value of Vmoniter and the tested power supply 15 of Imoniter end collection of electronic load 12, gather the temperature value of tested power supply 15 from temperature sensor, obtain the ripple of tested power supply 15 from oscillograph, and voltage, electric current, ripple, the temperature value that collects is depicted as curve, whether the test data of more tested power supply 15 and default qualified data work to judge tested power supply 15.Further, when tested power supply 15 broke down, record trouble occured constantly, and time precision is differentiated to millisecond, and after tested power supply 15 fault recoveries were normal, also record recovered constantly.
Further, this nuclear power station power detection system 1 also comprises man-machine interface, and this man-machine interface is used for receiving the test condition of test man's output, according to the corresponding test data of play-back command playback that receives and the duty that shows tested power supply 15.For example, if recover again normal after tested power supply 15 breaks down in the strike-machine process, show amber light; If tested power supply 15 is in malfunction for a long time, show red light etc., certainly, the color of display lamp can be changed as required, is not construed as limiting herein.
In seventh embodiment of the invention, when tested power supply 15 is dc output power, if the output dc voltage value of this tested power supply 15 that obtains with the 40Hz sampling rate, current value in preset range, this tested power supply 15 of judgement is qualified; When exchanging out-put supply, if the waveform effective value that obtains take 100 sampling rates of these tested power supply 15 output frequencies is divided equally the effective value of 40 waveforms as per second, this tested power supply 15 of judgement is qualified when tested power supply 15; When tested power supply 15 during for pulse out-put supply (5KHz), if the output voltage peak-to-peak value that obtains with 10 sampling rates of these tested power supply 15 output frequencies, output current peak-to-peak value in preset range, this tested power supply 15 of judgement is qualified.
Embodiment eight:
Figure 19 shows the nuclear power station power supply detection method that eighth embodiment of the invention provides, and details are as follows:
Step S201 exports voltage magnitude, the frequency of tested power supply to, and controls the current value that passes into electronic load by the embedded controller controls programmable power supply of testing apparatus, make the current value that passes into this electronic load equal to pass into the current value of this tested power supply.
In the present embodiment, embedded controller sends steering order to programmable power supply, so that this programmable power supply is exported corresponding voltage magnitude, frequency to tested power supply according to the steering order that receives, simultaneously, this embedded controller is also controlled the current value that passes into electronic load, and the current value that wherein passes into electronic load equals to pass into the current value of this tested power supply.
Step S202 gathers the corresponding test data of this tested power supply of test data conduct of this electronic load, and the test data that gathers is deposited in database by the test data collection card of testing apparatus.
Step S203 is according to the performance of the tested power supply of test data detection that deposits database in.
In the present embodiment, after the corresponding test voltage signal of tested power supply input, current signal, the embedded controller of testing apparatus sends acquisition instructions to the test data collection card of this testing apparatus, and this test data collection card gathers the output signal of input signal and this tested power supply of tested power supply again according to the acquisition instructions that receives.Wherein, the output signal of the input signal of tested power supply and tested power supply comprises voltage input signal, current input signal, Voltage-output signal, current output signal etc.After obtaining the test data of tested power supply, the test data of obtaining is deposited in database, with the test data obtained and qualified power parameter relatively, and then judge whether the performance of this tested power supply meets the requirements.
In eighth embodiment of the invention, can know the performance condition of tested power supply according to the test data of the tested power supply that obtains, whether therefore can judge tested power supply still is fit to continue in nuclear power station work, perhaps can judge the power supply that tested power supply 15 whether can replacing nuclear power have broken down in the station, thus guarantee nuclear power station can be reliably after new power more, operation safely.
Embodiment nine:
Ninth embodiment of the invention is mainly described when tested power supply is respectively AC-DC power supply, DC-DC power, AC-DC power supply, DC-AC power-supply, how to obtain the test data of above-mentioned 4 types of power supplys, and details are as follows:
One, when this tested power supply is AC-DC power supply:
In the present embodiment, when detecting AC-DC power supply, by exchanging programmable power supply output voltage amplitude, frequency to tested power supply, and regulate input voltage, the electric current of DC Electronic Loads and the test data of obtaining this AC-DC power supply by the oscillograph of testing apparatus.Wherein, the test data of obtaining comprises following at least one: the output voltage ratings of AC-DC power supply, output current rating, laod stability, voltage stabilized range, voltage-regulation coefficient, efficient, load current step overshoot amplitude, load current step transient recovery time, input voltage step overshoot amplitude, input voltage step transient recovery time, switching on and shutting down characteristic and ripple and noise.The concrete acquisition methods of each test data is identical with embodiment two, repeats no more herein.
Two, when tested power supply is DC-DC power:
In the present embodiment, when detecting DC-DC power, by program-control DC power, DC Electronic Loads and comprise that oscillographic testing apparatus obtains the test data of this DC-DC power.Wherein, this test data comprises input direct voltage variation range, output voltage setting value, voltage regulation factor, load regulation, conversion efficiency, transient response and peak-to-peak noise voltage at least one, the concrete acquisition methods of each test data is identical with embodiment three, repeats no more herein.
Three, when tested power supply is the AC-AC power supply:
In the present embodiment, when detecting the AC-AC power supply, obtain the test data of this AC-AC power supply by exchanging programmable power supply, alternating current electronic load and testing apparatus.Wherein, the test data of this AC-AC power supply comprises the load characteristic of this AC-DC power supply, and concrete acquisition methods is identical with embodiment's four, repeats no more herein.
Four, when tested power supply is DC-AC power-supply:
In the present embodiment, be divided into 2 kinds of situations when detecting DC-AC power-supply, a kind of be the output voltage frequency of DC-AC power-supply lower than 440Hz, a kind of is that the output voltage frequency of DC-AC power-supply is higher than 440Hz.
When the output voltage frequency of DC-AC power-supply during lower than 440Hz, by program-control DC power, alternating current electronic load and comprise that oscillographic testing apparatus obtains the test data of this DC-AC power-supply; When the output voltage frequency of this DC-AC power-supply during higher than 440Hz, by program-control DC power, power resistor and comprise that oscillographic testing apparatus obtains the test data of this DC-AC power-supply.In the present embodiment, no matter the output voltage frequency of DC-AC power-supply is lower than 440Hz or higher than 440Hz, all should obtain at least one test data of output voltage, output frequency, the grade of load, open circuit loss, output waveform and the efficient of this tested power supply, concrete acquisition methods sees embodiment five for details, repeats no more herein.
In the present embodiment, detect the different performance item of this tested power supply according to the difference of tested power supply model, and then judge according to the performance item that detects whether this tested power supply is the qualified power supply that meets in nuclear power station work.
Further, higher to the stability requirement of power supply based on nuclear power station, can carry out long run with load to tested power supply, namely tested power supply is carried out strike-machine, thereby filter out the more stable power supply of performance from the tested power supply after the above-mentioned test of process.Wherein, the tested power supply of the present embodiment comprises AC-DC power supply, DC-DC power, AC-AC power supply, DC-AC power-supply.
In the present embodiment, after tested power supply is carried out long-time run with load, obtain the strike-machine data of this tested power supply from electronic load, and judge stability, the reliability of this tested power supply according to the strike-machine data of obtaining, in addition, can also judge according to the strike-machine data of obtaining the degree of aging of this tested power supply.Wherein, the strike-machine data of the present embodiment comprise at least one item of output voltage, electric current and the ripple of this tested power supply.
The above is only preferred embodiment of the present invention, not in order to limiting the present invention, all any modifications of doing within the spirit and principles in the present invention, is equal to and replaces and improvement etc., within all should being included in protection scope of the present invention.