CN102253296A - Method for testing comprehensive device of transformer - Google Patents
Method for testing comprehensive device of transformer Download PDFInfo
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- CN102253296A CN102253296A CN2011101532524A CN201110153252A CN102253296A CN 102253296 A CN102253296 A CN 102253296A CN 2011101532524 A CN2011101532524 A CN 2011101532524A CN 201110153252 A CN201110153252 A CN 201110153252A CN 102253296 A CN102253296 A CN 102253296A
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Abstract
The invention discloses a method for testing a comprehensive device of a transformer. The method comprises the following steps of: 1, performing initial set on a system, namely inspecting functions of system hardware and performing system reset of relays; 2, selecting test items by a background processing module to perform testing; 3, completing system testing and calculation, resetting all relays in a relay array, and skipping to the step 2. By the method, the transformer is subjected to different kinds of detection, and the problem of the frequent climbing of the transformer due to replacement of a detection device during every-time detection is solved, so various parameters of the transformer can be detected by the detection device arranged on the transformer only by one-time climbing to ensure that the transformer runs normally. By the method, the safety and reliability of the transformer can be improved, burdensome work tasks can be relieved, and the effectiveness of works also can be enhanced.
Description
Technical field
The present invention relates to a kind of transformer testing technology, be specifically related to a kind of method of testing of transformer integration unit.
Background technology
At present, along with rapid economic development, the user is more and more higher to the requirement of power supply enterprise, increases work efficiency, shortens the maintenance power off time and be each electricity consumption enterprise and resident to the basic demand and the emphasis performance assessment criteria of power department, has very important and urgent meaning.Transformer, its effect is many-sided, it can not only deliver to the electricity consumption area to electric energy by boosted voltage, can also be reduced to working voltages at different levels to voltage, to satisfy the needs of electricity consumption.Boost and step-down all must be finished by transformer, utilize transformer to improve voltage, reduced and sent electric loss.
In current power transformation operation equipment, the test event that belongs to transformer ' s type equipment is not only much but also more loaded down with trivial details, has accounted for workloads a large amount of in the routine work.Existing transformer electric test equipment all is the test function that a kind of instrument only has unitem basically, if need finish several content measurements, just needs repeated multiple times climbing transformer to carry out the operation of conversion wiring.In the test process, need the link of repetition a lot, for example the test event of a 110kV transformer has tens, take on-the-spot instrument and meter to and also have tens kinds, the staff climbs the number of times that transformer changes the test wiring up and down and also will more than once finish a whole set of test item by item and just must waste a large amount of time, the meaningless workload that increases operating personnel in the test, increased the probability of artificial fault, work efficiency is reduced.
Summary of the invention
The invention discloses a kind of method of testing of transformer integration unit, check each performance index of transformer, improve transformer security, reliability, alleviate the hard work task simultaneously, increase the actual effect of work.
For achieving the above object, the invention provides a kind of method of testing of transformer integration unit, be characterized in that the method includes the steps of:
Step 1 system carries out initial setting up, carries out the system reset of system hardware functional check and relay;
Step 2 background processing module is selected test event, if select the direct current resistance test, then jumps to step 2.1, if select the on-load tap changer test, then jumps to step 2.2, if select the test of low-voltage short-circuit impedance, then jumps to step 2.3;
Step 2.1 system carries out the direct current resistance test to transformer;
Step 2.1.1 relay switched system pilot relay switches, and forms the direct current resistance test circuit;
Step 2.1.2 control testing power supply switches to the testing power supply that is applicable to the direct current resistance test;
Step 2.1.3 system tests transformer, and the direct current resistance numerical value of direct current resistance test data collection system acquisition transformer transfers to the foreground processing module;
Step 2.1.4 foreground processing module is calculated direct current resistance numerical value, and jumps to step 3;
Step 2.2 system carries out the on-load tap changer test to transformer;
Step 2.2.1 relay switched system pilot relay switches, and forms the on-load tap changer test circuit;
Step 2.2.2 control testing power supply switches to the testing power supply that is applicable to the on-load tap changer test;
Step 2.2.3 system tests transformer, and the test number of on-load tap changer test data collection system acquisition transformer transfers to the foreground processing module;
Step 2.2.4 foreground processing module is calculated test number, and jumps to step 3;
Step 2.3 system carries out the test of low-voltage short-circuit impedance to transformer;
Step 2.3.1 relay switched system pilot relay switches, and forms low-voltage short-circuit impedance test circuit;
Step 2.3.2 control testing power supply switches to the testing power supply that is applicable to the test of low-voltage short-circuit impedance;
Test is advanced by step 2.3.3 system, and the test number of low-voltage short-circuit impedance test data collection system acquisition transformer transfers to the foreground processing module;
Step 2.3.4 foreground processing module is calculated test number, and jumps to step 3;
The method of testing of transformer integration unit of the present invention is compared with prior art, its advantage is, the present invention utilizes a pick-up unit, the power transformation device is carried out multiple detection, solved because each detection substitution detector more all, and the problem of frequently climbing transformer, only need once climb transformer, pick-up unit is installed on the transformer, just it is working properly to guarantee transformer to carry out multiple parameter detecting to transformer, adopts method of the present invention to detect, and can improve the transformer security, reliability, alleviate the hard work task simultaneously, increase the actual effect of work.
Description of drawings
Fig. 1 is the structural representation of the comprehensive test macro of a kind of transformer that method of testing was suitable for of transformer integration unit of the present invention;
Fig. 2 is the method flow diagram of the method for testing of transformer integration unit of the present invention;
Fig. 3 is the connection terminal synoptic diagram of transformer.
Embodiment
Below in conjunction with description of drawings the specific embodiment of the present invention.
The present invention has illustrated a kind of method of testing of transformer integration unit, only utilizes a device that transformer is carried out multiple test, further simplifies execute-in-place, reduces and repeats work, can effectively must increase work efficiency.
As shown in Figure 1, the suitable comprehensive test macro of a kind of transformer of method of testing of transformer integration unit of the present invention is described, this system comprises foreground processing module 1, direct current resistance test data collection system 2, on-load tap changer test data collection system 3, low-voltage short-circuit impedance test data collection system 4, testing power supply 5, relay switched system 6, background processing module 7, first power supply 8 and second source 9.
First power supply 8 and foreground processing module 1, direct current resistance test data collection system 2, on-load tap changer test data collection system 3 are connected with low-voltage short-circuit impedance test data collection system 4 circuit.Provide power supply to above-mentioned foreground processing module 1, direct current resistance test data collection system 2, on-load tap changer test data collection system 3 and low-voltage short-circuit impedance test data collection system 4 respectively.
Foreground processing module 1 connects direct current resistance test data collection system 2, on-load tap changer test data collection system 3, low-voltage short-circuit impedance test data collection system 4 and testing power supply 5 respectively by serial ports.The inlet circuit of testing power supply 5 connects second source 9, and the output terminal of this testing power supply 5 also circuit connects direct current resistance test data collection system 2, on-load tap changer test data collection system 3 and low-voltage short-circuit impedance test data collection system 4.The circuit of output terminal of foreground processing module 1 connects relay switched system 6, and this foreground processing module 1 also connects background processing module 7 by USB interface.Relay switched system 6 circuit are connected with relay array.
It is the chip of Dspic33f256mc710 that foreground processing module 1 adopts model, it comprises high speed microprocessor spare and accurate A/D test module, be responsible for the data collection task of direct current resistance test data collection system 2, on-load tap changer test data collection system 3 and low-voltage short-circuit impedance test data collection system 4, and the work of pilot relay switched system 6.42 huge relay arrays that relay is formed in relay switched system 6 these devices of control.When carrying out the test of different content, foreground processing module 1 is finished the phase place switching of necessary testing power supply and the switching of data acquisition by the control to relay array.
Background processing module 7 can adopt computing machine, finishes man-machine interaction work by the background application platform, carries out the management of data, the output of test report.
Testing power supply 5 adopts constant current source, and second source 9 is adjusted the duty of testing power supply 5 at any time.In the charging process that test is carried out, direct current resistance test data collection system 2, on-load tap changer test data collection system 3 and low-voltage short-circuit impedance test data collection system 4, this three road electric current has a progressive formation from small to large, and three the tunnel do not change simultaneously, in order to accelerate test speed, reduce the duration of charging, the constant current source energy output HIGH voltage that testing power supply 5 adopts in the present embodiment, big electric current bears high-powerly, adapts to different characteristic requirements
Specify the method flow of the method for testing of transformer integration unit of the present invention below in conjunction with Fig. 2 and Fig. 1.
Step 1 system carries out initial setting up, carry out the system reset of system hardware functional check and relay, wherein emphasis carries out resetting of relay switched system 6, foreground processing module 1 sends reset instruction to relay switched system 6, relay switched system 6 all relays of control are changed to open-circuit condition, make output be in open-circuit condition.
The background processing module 7 of step 2 system is selected test event, if select transformer is carried out the direct current resistance test, then jump to step 2.1, if select transformer is carried out the on-load tap changer test, then jump to step 2.2, if select transformer is carried out the test of low-voltage short-circuit impedance, then jump to step 2.3.
Step 2.1 system carries out the direct current resistance test to transformer.
Step 2.1.1 foreground processing module 1 sends the direct current resistance test instruction to relay switched system 6, and relay switched system 6 pilot relays switch, and forms the direct current resistance test circuit.
For example, during test transformer high-voltage side AB phase direct current resistance, the relay of relay switched system 6 first pilot relay array switching controls voltage acquisitions, voltage input end is connected by the relay acquisition circuit, the relay of relay switched system 6 switching controls electric currents output then, measuring current is flowed out from A phase current terminal, flow into from B phase current terminal.The connection terminal of transformer as shown in Figure 3.
Step 2.1.2 foreground processing module 1 sends the direct current resistance test instruction to testing power supply 5, and control testing power supply 5 switches to the testing power supply that is applicable to direct current resistance test test.
This testing power supply is a constant current source, and current value can adopt 1A, 5A, 10A.
Step 2.1.3 system tests the direct current resistance that transformer carries out under test of direct current resistance under the three-phase situation and the single-phase situation, the direct current resistance numerical value of transformers is gathered by direct current resistance test data collection system 2, and the numerical value of direct current resistance is transferred to foreground processing module 1.
1 pair of step 2.1.4 foreground processing module detects the direct current resistance numerical value that obtains, and flows through the electric current of transformer coil and the voltage at transformer coil two ends and calculates, and after the data of obtaining a result are finished in calculating, jumps to step 3.
Step 2.2 system carries out the on-load tap changer test to transformer.
Step 2.2.1 foreground processing module 1 sends the on-load tap changer instruction to relay switched system 6, and relay switched system 6 pilot relays switch, and forms the on-load tap changer test circuit.Relay switched system 6 first switched voltage input relaies make transformer high-voltage side input terminal AO, BO, and CO connects with the test loop of carrying is arranged, and the switch current output relay makes electric current output loop and high voltage side current lead-out terminal AO then, BO, CO connects.The connection terminal of transformer as shown in Figure 3.
Step 2.2.2 foreground processing module 1 sends the on-load tap changer instruction to testing power supply 5, and control testing power supply 5 switches to the testing power supply that is applicable to the on-load tap changer test.The electric current of the employed constant current source of on-load voltage regulation is 0.4A, and the constant current source response speed is 5us.
Step 2.2.3 system carries out transition waveform testing, test transit time and transition resistance test to transformer, the test number that transformer is gathered by on-load tap changer test data collection system 3,100us adopts a point, voltage obtains the resistance of coil divided by electric current, and the numerical value that test is obtained transfers to foreground processing module 1.
The emphasis of step 2.2.4 loaded switch test is a testing power supply, and this testing power supply will overcome the influence of inductance, can respond changes in resistance fast.Processing module 1 pair of transformer in foreground carries out the on-load tap changer test, obtains a test number.Be horizontal ordinate with time then, resistance value is an ordinate, the resistance time curve of the three-phase that draws.Draw behind resistance and the time relation figure, judge the quality of switch, if jump to step 3 according to the resistance time plot.
Step 2.3 system carries out the test of low-voltage short-circuit impedance to transformer.
Step 2.3.1 foreground processing module 1 sends the instruction of low-voltage short-circuit impedance to relay switched system 6, and relay switched system 6 pilot relays switch, and forms low-voltage short-circuit impedance test circuit.Relay switched system 6 first switched voltage input relaies are connected transformer high-voltage side input terminal AB and short-circuit impedance test loop, and the switch current output relay is connected electric current output loop and high voltage side current lead-out terminal AB then.Test AB mutually after, connecting BC phase test loop, test b C phase after finishing, is connected the CA phase again, test CA phase.The connection terminal of transformer as shown in Figure 3.
Step 2.3.2 foreground processing module 1 sends the instruction of low-voltage short-circuit impedance to testing power supply 5, relay switched system 6 transfer relay arrays, and control testing power supply 5 switches to the testing power supply that is applicable to the test of low-voltage short-circuit impedance.The power requirement of impedance measurement is: 50Hz exchanges, and deviation factor of wave is less than 3%.
Step 2.3.3 system carries out △/Y test and Y/ △ test to transformer, the test number that transformer is gathered by low-voltage short-circuit impedance test data collection system 4, and the numerical value that test is obtained transfers to foreground processing module 1.
1 pair of step 2.3.4 foreground processing module detects the test number that obtains and calculates.
(1) single transformer: to measure the calculating that is as the criterion of a shelves rated capacity
Calculating jumps to step 3 after finishing the data of obtaining a result.
Although content of the present invention has been done detailed introduction by above preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.After those skilled in the art have read foregoing, for multiple modification of the present invention with to substitute all will be conspicuous.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (4)
1. the method for testing of a transformer integration unit is characterized in that, the method includes the steps of:
Step 1 system carries out initial setting up, carries out the system reset of system hardware functional check and relay;
Step 2 background processing module (7) is selected test event, if select the direct current resistance test, then jumps to step 2.1, if select the on-load tap changer test, then jumps to step 2.2, if select the test of low-voltage short-circuit impedance, then jumps to step 2.3;
Step 2.1 system carries out the direct current resistance test to transformer;
Step 2.2 system carries out the on-load tap changer test to transformer;
Step 2.3 system carries out the test of low-voltage short-circuit impedance to transformer;
Step 3 system testing and calculating are finished, all relays in the reset relay array, and jump to step 2.
2. the method for testing of transformer integration unit as claimed in claim 1 is characterized in that, described step 2.1 also comprises following steps:
Step 2.1.1 relay switched system (6) pilot relay switches, and forms the direct current resistance test circuit;
Step 2.1.2 control testing power supply (5) switches to the testing power supply that is applicable to the direct current resistance test;
Step 2.1.3 system tests transformer, and the direct current resistance numerical value that transformer is gathered by direct current resistance test data collection system (2) transfers to foreground processing module (1);
Step 2.1.4 foreground processing module (1) is calculated test number, and jumps to step 3.
3. the method for testing of transformer integration unit as claimed in claim 1 is characterized in that, described step 2.2 also comprises following steps:
Step 2.2.1 relay switched system (6) pilot relay switches, and forms the on-load tap changer test circuit;
Step 2.2.2 control testing power supply (5) switches to the testing power supply that is applicable to the on-load tap changer test;
Step 2.2.3 system tests transformer, and the test number that transformer is gathered by on-load tap changer test data collection system (3) transfers to foreground processing module (1);
Step 2.2.4 foreground processing module (1) is calculated test number, and jumps to step 3.
4. the method for testing of transformer integration unit as claimed in claim 1 is characterized in that, described step 2.3 also comprises following steps:
Step 2.3.1 relay switched system (6) pilot relay switches, and forms low-voltage short-circuit impedance test circuit;
Step 2.3.2 control testing power supply (5) switches to the testing power supply that is applicable to the test of low-voltage short-circuit impedance;
Test is advanced by step 2.3.3 system, and the test number that transformer is gathered by low-voltage short-circuit impedance test data collection system (4) transfers to foreground processing module (1);
Step 2.3.4 foreground processing module (1) is calculated test number, and jumps to step 3.
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102981055A (en) * | 2012-11-30 | 2013-03-20 | 江苏省电力公司涟水县供电公司 | Tester for direct current resistance of transformer and parameter of on-load tap-changer of transformer |
| CN103196491A (en) * | 2013-03-22 | 2013-07-10 | 广州供电局有限公司 | Transformer integral comprehensive detection device |
| CN103364754A (en) * | 2013-07-16 | 2013-10-23 | 杭州西湖电子研究所 | Method for automatically measuring direct-current resistor, short-circuit impedance, on-load switch and non-load voltage ratio of transformer |
| CN104181362A (en) * | 2014-09-04 | 2014-12-03 | 杭州西湖电子研究所 | High-voltage multi-pole and multi-state switching device with shielding property |
| CN106291195A (en) * | 2016-08-31 | 2017-01-04 | 昆明耀龙置信变压器制造有限公司 | A kind of Intellectualized starting functional transformer comprehensive test device |
| CN107064635A (en) * | 2016-11-11 | 2017-08-18 | 郭云花 | Low-voltage short-circuit impedance tests auxiliary machine |
| CN107912059A (en) * | 2015-06-15 | 2018-04-13 | 欧米克朗电子有限公司 | The switching device operating method of switching device, test device and transformer measuring device |
| CN110763992A (en) * | 2019-11-28 | 2020-02-07 | 国网河北省电力有限公司电力科学研究院 | AC/DC comprehensive test method for on-load tap-changer of large transformer |
| CN111175597A (en) * | 2019-12-09 | 2020-05-19 | 中船重工(重庆)西南装备研究院有限公司 | Multifunctional transformer comprehensive experiment system and method |
| CN111381103A (en) * | 2020-05-12 | 2020-07-07 | 国网青海省电力公司海东供电公司 | On-load phase-change line changing device for single-channel transformer direct-current resistance tester |
| CN116990625A (en) * | 2023-09-27 | 2023-11-03 | 国网江苏省电力有限公司电力科学研究院 | Function switching system and method of intelligent quick-checking device of distribution transformer |
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Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102981055A (en) * | 2012-11-30 | 2013-03-20 | 江苏省电力公司涟水县供电公司 | Tester for direct current resistance of transformer and parameter of on-load tap-changer of transformer |
| CN103196491A (en) * | 2013-03-22 | 2013-07-10 | 广州供电局有限公司 | Transformer integral comprehensive detection device |
| CN103364754A (en) * | 2013-07-16 | 2013-10-23 | 杭州西湖电子研究所 | Method for automatically measuring direct-current resistor, short-circuit impedance, on-load switch and non-load voltage ratio of transformer |
| CN103364754B (en) * | 2013-07-16 | 2016-03-23 | 杭州西湖电子研究所 | A kind of automatic measuring transformer directly hinders, short resistance, have carry, the method for no-load voltage ratio |
| CN104181362A (en) * | 2014-09-04 | 2014-12-03 | 杭州西湖电子研究所 | High-voltage multi-pole and multi-state switching device with shielding property |
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| CN107912059A (en) * | 2015-06-15 | 2018-04-13 | 欧米克朗电子有限公司 | The switching device operating method of switching device, test device and transformer measuring device |
| CN106291195A (en) * | 2016-08-31 | 2017-01-04 | 昆明耀龙置信变压器制造有限公司 | A kind of Intellectualized starting functional transformer comprehensive test device |
| CN107064635A (en) * | 2016-11-11 | 2017-08-18 | 郭云花 | Low-voltage short-circuit impedance tests auxiliary machine |
| CN110763992A (en) * | 2019-11-28 | 2020-02-07 | 国网河北省电力有限公司电力科学研究院 | AC/DC comprehensive test method for on-load tap-changer of large transformer |
| CN111175597A (en) * | 2019-12-09 | 2020-05-19 | 中船重工(重庆)西南装备研究院有限公司 | Multifunctional transformer comprehensive experiment system and method |
| CN111381103A (en) * | 2020-05-12 | 2020-07-07 | 国网青海省电力公司海东供电公司 | On-load phase-change line changing device for single-channel transformer direct-current resistance tester |
| CN116990625A (en) * | 2023-09-27 | 2023-11-03 | 国网江苏省电力有限公司电力科学研究院 | Function switching system and method of intelligent quick-checking device of distribution transformer |
| CN116990625B (en) * | 2023-09-27 | 2023-12-08 | 国网江苏省电力有限公司电力科学研究院 | Function switching system and method of intelligent quick-checking device of distribution transformer |
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Owner name: STATE GRID CORPORATION OF CHINA BAODING TAIDA ELEC Free format text: FORMER OWNER: BAODING TAIDA ELECTRIC POWER EQUIPMENT CO., LTD. Effective date: 20121109 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20121109 Address after: 200002 Nanjing East Road, Shanghai, No. 181, No. Applicant after: Shanghai Electric Power Corporation Applicant after: State Grid Corporation of China Applicant after: Baoding Teda Electric Power Equipment Co., Ltd. Address before: 200002 Nanjing East Road, Shanghai, No. 181, No. Applicant before: Shanghai Electric Power Corporation Applicant before: Baoding Teda Electric Power Equipment Co., Ltd. |
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
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Application publication date: 20111123 |