CN1268670A - Multifunctional safe standard automatic test device - Google Patents
Multifunctional safe standard automatic test device Download PDFInfo
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- CN1268670A CN1268670A CN 99103110 CN99103110A CN1268670A CN 1268670 A CN1268670 A CN 1268670A CN 99103110 CN99103110 CN 99103110 CN 99103110 A CN99103110 A CN 99103110A CN 1268670 A CN1268670 A CN 1268670A
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Abstract
The present invention relates to multifunctional safety specitification automatic testing device which includes microcomputer controller, keyboard, display, interface respectively connected with microcomputer controller, sine wave producing circuit, function selector, selection switch, leakage current tester and output automatic switch matrix circuit, transformer circuit and testing circuit connected between function selector and selection switch. The sine wave producing circuit connects to transformer circuit by function selector, selection switch connects with automatic switch matrix circuit, then connects to different testing point of object to be tested.
Description
The present invention relates to a kind of proving installation, relate to a kind of multifunctional automatic test device that is used for the test of security appliance specification or rather.
Can implement safety utilization of electric power in order to make electrical equipment, and stipulated the standard of safe electrical appliance, this standard-required electrical equipment need be by multinomial safety requirements test, comprise earth loop impedance test, alternating current-direct current voltage-withstand test, megger test, leakage current test and charged running test etc., could standard compliant at last safe electrical appliance by these tests.
But general commercially available safety requirements tester mostly only has the test function of unitem, or a tester only has the test function of two projects, and the user then need use a plurality of testers if will do the safety requirements test of multiple project for same electrical equipment simultaneously.Because the user need buy a plurality of testers, cause cost to promote, and a plurality of tester also will take many spaces (volume).
Referring to Fig. 1, if will make a tester have full automatic multinomial program test function, then need a plurality of testers 81 are combined, comprise earth loop impedance test device 811, ac voltage withstanding tester 812, DC break down voltage tester 813, insulation impedance tester 814, leakage current tester 815 and AC power supply 816, each tester 811-816 is connected with computer (PLC) 83 by computer interface 821-826, simultaneously, need to write Control Software to computer 83, and by computer 83 centralized control.The input end of the output terminal of each tester 811-816 and a programmable switch case 84 joins, and the output terminal of this formula switch box 84 able to programme and determinand 2 join, and computer 83 also connects programmable switch case 84 by computer interface 827
Above-mentioned measuring technology has following shortcoming:
1. cost is too high and to take volume too big;
2. distribution is too complicated is difficult for using;
3. system's distribution is too many;
4. need to write again in addition the computer Control Software;
Because the technical disadvantages that exists is too many, at present, above-mentioned measuring technology seldom is used.
The purpose of this invention is to provide a kind of multifunctional safe standard automatic test device, can overcome the existing shortcoming of above-mentioned tester, can finish test simultaneously, and line is few, simple in structure, easy to use the multiple safety requirements of determinand.
The object of the present invention is achieved like this: a kind of multifunctional safe standard automatic test device, include microcomputer controller, it is characterized in that: also include sinusoidal wave generation circuit, power amplifier, function selector, transforming circuit, test circuit group, selected on-off circuit and output automatic transfer switch matrix circuit; Described microcomputer controller is connected with sinusoidal wave generation circuit, function selector, selected on-off circuit and output automatic transfer switch matrix circuit respectively, described sinusoidal wave generation circuit, power amplifier, function selector, transforming circuit, test circuit group, selected on-off circuit and output automatic transfer switch matrix circuit are linked in sequence, and described output automatic transfer switch matrix circuit is connected with each test point on the determinand; Described function selector is made up of more than one switch, described transforming circuit is made up of the transformer that produces different voltages, current value more than, described test circuit group has more than one test circuit, described selected on-off circuit is made up of more than one selector switch, the consistent and corresponding connection of order of number of selector switch in the number of test circuit and the selected on-off circuit in the number of transformer, the test circuit group in the number of selector switch and the transforming circuit in the function selector.
Also include the interface that can be connected, be connected with described microcomputer controller with other peripheral unit.
Also include the keyboard that is used for the input test project, be connected with described microcomputer controller.
Also include the display that is used to show test results, be connected with described microcomputer controller.
More than one transformer includes low voltage and high current transformer, high voltage low current transformer and the middle high current transformer of voltage in the described transforming circuit.
The more than one test circuit of described test circuit group includes earth loop impedance test circuit, Hi-pot test circuit and AC power supply circuit.
A selector switch that also includes the leakage current tester and be attached thereto, microcomputer controller connect leakage current tester and this selector switch respectively, and this selector switch connects described output automatic transfer switch matrix circuit.
Each test procedure work is controlled and coordinated to proving installation of the present invention by microcomputer controller.This microcomputer controller joins by a lead and a sinusoidal wave generation circuit, this sine wave generation circuit joins by a lead and a transforming circuit, this transforming circuit joins by a lead and an output automatic transfer switch matrix circuit, and this output automatic transfer switch matrix circuit cooperates determinand to carry out the test of different test events.Output automatic transfer switch matrix circuit is controlled by microcomputer controller, and be connected to different test points on the determinand, when a certain electrical equipment of test, set multinomial test event by the user, make microcomputer controller control sinusoidal wave generation circuit and produce a sine wave of setting, this sine wave is exported suitable testing power supply through transforming circuit, and this testing power supply is again through output automatic transfer switch matrix circuit, and input to test point on the determinand, carry out multinomial safety requirements test simultaneously.
Microcomputer controller is used for the action of each parts of control device, when determinand is tested, by the conducting or the dissengaged positions of set switch in control function selector switch and the selector switch, finishes various test events.
Further specify technology of the present invention below in conjunction with embodiment and accompanying drawing.
Fig. 1 is to use the structural principle block diagram of the multi-tester of traditional test technology.
Fig. 2 utilizes proving installation of the present invention to carry out the testing principle block diagram.
Fig. 3 is the structural principle block diagram of proving installation most preferred embodiment of the present invention.
Unit number related among the figure is: microcomputer controller 11, sinusoidal wave generation circuit 13, function selector 17, transforming circuit 31, output automatic transfer switch matrix circuit 5.
Referring to Fig. 2, the present invention is a kind of " multifunctional safe standard automatic test device ", can do multinomial safety requirements tests such as earth loop impedance test, alternating current-direct current voltage-withstand test, megger test, leakage current test and charged running test to an electrical equipment 2 (determinand).It is a kind of multifunctional safe standard automatic test device.
Referring to Fig. 3, a kind of optimum implementation of multifunctional safe standard automatic test device 1 shown in the figure.Include a microcomputer controller 11, this microcomputer controller 11 is used to control and coordinate the running of each parts on this device 1 and the carrying out of every test procedure.Microcomputer controller 11 is connected with a sinusoidal wave generation circuit 13 (sinusoidal wave generation circuit able to programme) by lead, makes it produce a sine wave.This sine wave generation circuit 13 is connected with a power amplifier 15 by lead again, 15 in this power amplifier is connected with set array switch sw1, sw2 and sw3 in the function selector 17 respectively by lead, each switch sw1, sw2 and sw3 are connected by several set in lead and the transforming circuit 31 transformers respectively again, each transformer is used to the voltage and the current value that provide different, and is connected by several set in lead and the test circuit group 40 test circuits respectively.
In one embodiment of the invention, several set transformers can be respectively the high current transformer 37 of voltage in a low voltage and high current transformer 33, the high voltage low current transformer 35 and in this transforming circuit 31.Several set test circuits can be respectively an earth loop impedance test circuit 41, a Hi-pot test circuit 43 and an AC power supply circuit 45 in this test circuit group 40.Wherein low voltage and high current transformer 33 is connected with earth loop impedance test circuit 41 by lead, high voltage low current transformer 35 is connected with Hi-pot test circuit 43 by lead, and 37 of high current transformers of middle voltage are connected with AC power supply circuit 45 by lead.Each test circuit is connected by array switch sw4, sw5 and sw6 set in lead and the selected on-off circuit 47 respectively, each switch is connected with output automatic transfer switch matrix circuit 5 by lead respectively again, and, the determinand 2 that connects is thereon carried out every test by several test points on the output automatic transfer switch matrix circuit 5.
In the present invention, microcomputer controller 11 also can be connected with parts such as function selector 17, selected on-off circuit 47 and output automatic transfer switch matrix circuits 5 by lead respectively, to control the output state of each parts.In addition, microcomputer controller 11 also is connected with keyboard 61 and display 63 by lead, is used for the input test project and shows test results, and also is connected with an interface 65 by lead, and this interface 65 is connected with other peripherals.Microcomputer controller 11 also can be connected with a leakage current tester 49 by lead, and this leakage current tester 49 is connected by switch sw7 set in lead and the selector switch 47.
The present invention is to a certain electrical equipment (determinand 2) when testing, set test event by the user on request by keyboard 61, make the sinusoidal wave generation circuit 13 of microcomputer controller 11 controls, produce required sine wave, this sine wave is again through processing Hou of transforming circuit 31, be converted to required testing power supply, this testing power supply is more in regular turn through the processing of selected on-off circuit 47 and output automatic transfer switch matrix circuit 5, be input to each test point, determinand 2 is tested by several test events that set.
Below in conjunction with each safety requirements test event, the technology of apparatus of the present invention is described.
(1) earth loop impedance test: produce a sine wave by the sinusoidal wave generation circuit 13 of microcomputer controller 11 controls according to setting value, this sine wave amplifies Hou through power input amplifier 15 rate of doing works, inputs to function selector 17 again.At this moment, microcomputer controller 11 makes switch sw1 conducting and switch sw2 and sw3 cut off on the switch of control function selector switch 17.Sine wave is output to low voltage and high current transformer 33, makes transformation and produces required testing power supply, inputs to selected on-off circuit 47 through earth loop impedance test circuit 41 again.At this moment, each switch of selected on-off circuit 47 will be subjected to the control of microcomputer controller 11, and make switch sw4 conducting, and switch sw5, sw6 and sw7 cut-out, testing power supply carries out earth loop impedance test through the test point of output automatic transfer switch matrix circuit 5 input determinands 2.
(2) megger test: produce a sine wave by the sinusoidal wave generation circuit 13 of microcomputer controller 11 controls according to setting value, this sine wave amplifies through power input amplifier 15 rate of doing works.Function selector 17 is subjected to microcomputer controller 11 controls, and make its switch sw2 conducting, and switch sw1 and sw3 cut off, sinusoidal wave input high voltage low current transformer 35, make transformation and convert required testing power supply to, this testing power supply is input to selected on-off circuit 47 through Hi-pot test circuit 43 again.At this moment, selected on-off circuit 47 is subjected to the control of microcomputer controller 11, and makes its switch sw5 conducting, and makes its switch sw4, sw6 and sw7 cut off, testing power supply carries out megger test through exporting the test point that automatic transfer switch matrix circuit 5 inputs to determinand 2.
(3) interchange, DC break down voltage test: this exchanges, the DC break down voltage test is identical with the testing procedure of megger test, is just inputed to the test point difference of determinand 2 by automatic transfer switch matrix circuit 5.
(4) leakage current test: produce a sine wave by the sinusoidal wave generation circuit 13 of microcomputer controller 11 controls according to setting value, this sine wave amplifies Hou through power input amplifier 15 rate of doing works, is input to function selector 17.At this moment, function selector 17 is subjected to the control of microcomputer controller 11, and makes its switch sw3 conducting, and its switch sw1 and sw2 cut off, and sine wave is input to the middle high current transformer 37 of voltage, makes transformation and converts required testing power supply to.This testing power supply exports selected on-off circuit 47 again to behind AC power supply circuit 45.At this moment, selected on-off circuit 47 is subjected to the control of microcomputer controller 11, makes its switch sw4 and sw5 cut off, and switch sw6 and sw7 conducting, and testing power supply inputs to the test point of determinand 2 through output automatic transfer switch matrix circuit 5.Simultaneously, by the test signal of microcomputer controller 11 by 49 outputs of leakage current tester, then switch sw7 in selected on-off circuit 47 and automatic transfer switch matrix circuit 5 input to the test point of determinand 2, and it is carried out the leakage current test.
(5) charged running test: produce a sine wave by the sinusoidal wave generation circuit 13 of microcomputer controller 11 controls according to setting value, this sine wave amplifies Hou through power input amplifier 15 rate of doing works, is input to function selector 17.Function selector 17 is subjected to the control of microcomputer controller 11, makes its switch sw3 conducting, and switch sw1 and sw2 cut-out.Sine wave is input to the middle high current transformer 37 of voltage, makes transformation and converts required testing power supply to.Testing power supply is input to selected on-off circuit 47 through AC power supply circuit 45 again.At this moment, selected on-off circuit 47 is because of being subjected to the control of microcomputer controller 11, make switch sw6 conducting once more, switch sw4, sw7 and sw5 cut off, testing power supply is input to the test point of determinand 2 through output automatic transfer switch matrix circuit 5, tests this determinand 2 after above-described one, two, three, four test of process, whether also can run well, and non-fault.
Learn by the above, cooperate the switching of function selector 17 and selected on-off circuit 47 by power amplifier 15 of the present invention, but the multi-functional running of timesharing is promptly done different test jobs in different time, can fill part and utilize amplifier 15 to realize purpose low-cost and that dwindle the proving installation volume.And controlled by the microprocessor cpu of same microcomputer controller 11 with the present invention's output automatic transfer switch matrix circuit 5 that uses of arranging in pairs or groups, test automatically with different function programs between different test points determinand.
The above only is a most preferred embodiment of the present invention, architectural feature of the present invention do not limit to what this, anyly be familiar with this operator in technical scheme of the present invention, variation of being done or modification all should be encompassed in the claim of the present invention.
Claims (7)
1. multifunctional safe standard automatic test device, include microcomputer controller, it is characterized in that: also include sinusoidal wave generation circuit, power amplifier, function selector, transforming circuit, test circuit group, selected on-off circuit and output automatic transfer switch matrix circuit; Described microcomputer controller is connected with sinusoidal wave generation circuit, function selector, selected on-off circuit and output automatic transfer switch matrix circuit respectively, described sinusoidal wave generation circuit, power amplifier, function selector, transforming circuit, test circuit group, selected on-off circuit and output automatic transfer switch matrix circuit are linked in sequence, and described output automatic transfer switch matrix circuit is connected with each test point on the determinand; Described function selector is made up of more than one switch, described transforming circuit is made up of the transformer that produces different voltages, current value more than, described test circuit group has more than one test circuit, described selected on-off circuit is made up of more than one selector switch, the consistent and corresponding connection of order of number of selector switch in the number of test circuit and the selected on-off circuit in the number of transformer, the test circuit group in the number of selector switch and the transforming circuit in the function selector.
2. multifunctional safe standard automatic test device according to claim 1 is characterized in that: also include the interface that can be connected with other peripheral unit, be connected with described microcomputer controller.
3. multifunctional safe standard automatic test device according to claim 1 is characterized in that: also include the keyboard that is used for the input test project, be connected with described microcomputer controller.
4. multifunctional safe standard automatic test device according to claim 1 is characterized in that: also include the display that is used to show test results, be connected with described microcomputer controller.
5. multifunctional safe standard automatic test device according to claim 1 is characterized in that: more than one transformer includes low voltage and high current transformer, high voltage low current transformer and the middle high current transformer of voltage in the described transforming circuit.
6. multifunctional safe standard automatic test device according to claim 1 is characterized in that: the more than one test circuit of described test circuit group includes earth loop impedance test circuit, Hi-pot test circuit and AC power supply circuit.
7. multifunctional safe standard automatic test device according to claim 1, it is characterized in that: a selector switch that also includes the leakage current tester and be attached thereto, microcomputer controller connects leakage current tester and this selector switch respectively, and this selector switch connects described output automatic transfer switch matrix circuit.
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CN 99103110 CN1268670A (en) | 1999-03-24 | 1999-03-24 | Multifunctional safe standard automatic test device |
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CN 99103110 CN1268670A (en) | 1999-03-24 | 1999-03-24 | Multifunctional safe standard automatic test device |
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Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100342239C (en) * | 2001-11-23 | 2007-10-10 | Nxp股份有限公司 | Switch equipment provided with integrated tester |
CN101354418B (en) * | 2008-09-22 | 2011-07-13 | 河南省电力公司商丘供电公司 | Power transformer test method without disconnecting wire |
CN102253296A (en) * | 2011-06-09 | 2011-11-23 | 上海市电力公司 | Method for testing comprehensive device of transformer |
CN102323522A (en) * | 2011-06-01 | 2012-01-18 | 上海沪工汽车电器有限公司 | Voltage withstand test method of vehicle central cable connector |
CN102565562A (en) * | 2010-12-31 | 2012-07-11 | 上海市电力公司 | Comprehensive testing device for electrical test of transformer |
CN102809692A (en) * | 2012-08-01 | 2012-12-05 | 天水七四九电子有限公司 | Device and method for testing insulation resistance and dielectric strength of power module |
CN103364702A (en) * | 2012-04-02 | 2013-10-23 | 威光自动化科技股份有限公司 | Test system |
CN107407705A (en) * | 2015-01-13 | 2017-11-28 | 欧米克朗电子有限公司 | Transformer testing device and transformer testing method |
CN110007200A (en) * | 2019-01-11 | 2019-07-12 | 华为技术有限公司 | A kind of test circuit, equipment and system |
CN112198431A (en) * | 2020-09-30 | 2021-01-08 | 广东奥科伟业科技发展有限公司 | Opening and closing curtain motor test system |
CN112557800A (en) * | 2020-12-24 | 2021-03-26 | 上海新时达机器人有限公司 | Factory-leaving electric testing device and testing method for robot |
-
1999
- 1999-03-24 CN CN 99103110 patent/CN1268670A/en active Pending
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100342239C (en) * | 2001-11-23 | 2007-10-10 | Nxp股份有限公司 | Switch equipment provided with integrated tester |
CN101354418B (en) * | 2008-09-22 | 2011-07-13 | 河南省电力公司商丘供电公司 | Power transformer test method without disconnecting wire |
CN102565562A (en) * | 2010-12-31 | 2012-07-11 | 上海市电力公司 | Comprehensive testing device for electrical test of transformer |
CN102323522A (en) * | 2011-06-01 | 2012-01-18 | 上海沪工汽车电器有限公司 | Voltage withstand test method of vehicle central cable connector |
CN102253296A (en) * | 2011-06-09 | 2011-11-23 | 上海市电力公司 | Method for testing comprehensive device of transformer |
CN103364702A (en) * | 2012-04-02 | 2013-10-23 | 威光自动化科技股份有限公司 | Test system |
CN102809692A (en) * | 2012-08-01 | 2012-12-05 | 天水七四九电子有限公司 | Device and method for testing insulation resistance and dielectric strength of power module |
CN107407705A (en) * | 2015-01-13 | 2017-11-28 | 欧米克朗电子有限公司 | Transformer testing device and transformer testing method |
US10914778B2 (en) | 2015-01-13 | 2021-02-09 | Omicron Electronics Gmbh | Transformer testing device, and method for testing a transformer |
CN110007200A (en) * | 2019-01-11 | 2019-07-12 | 华为技术有限公司 | A kind of test circuit, equipment and system |
CN112198431A (en) * | 2020-09-30 | 2021-01-08 | 广东奥科伟业科技发展有限公司 | Opening and closing curtain motor test system |
CN112198431B (en) * | 2020-09-30 | 2024-04-16 | 广东奥科伟业科技发展有限公司 | Motor test system for opening and closing curtain |
CN112557800A (en) * | 2020-12-24 | 2021-03-26 | 上海新时达机器人有限公司 | Factory-leaving electric testing device and testing method for robot |
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