CN103163407B - A kind of test the conversion method of multiple TCH test channels in system - Google Patents
A kind of test the conversion method of multiple TCH test channels in system Download PDFInfo
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- CN103163407B CN103163407B CN201110413313.6A CN201110413313A CN103163407B CN 103163407 B CN103163407 B CN 103163407B CN 201110413313 A CN201110413313 A CN 201110413313A CN 103163407 B CN103163407 B CN 103163407B
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Abstract
The invention discloses the conversion method of multiple TCH test channels in a kind of electronic product test system, the end of each TCH test channel that this technical scheme is included in test system arranges one for judging the most ready switch of this TCH test channel；Create the queue starting test command of all TCH test channels for depositing test system；Step 1, judges that each TCH test channel of test system is the most ready successively, if ready, is stored in by the startup test command of this ready TCH test channel in startup test command queue, every certain time interval the most repeatedly；Step 2, starts test command from starting to extract test command queue and starts the test of respective channel, extracts next again and start test command, the most repeatedly after having tested from startup test command queue；Wherein, step 1 and step 2 work alone, and coordinate by starting the data harmonization of test command queue, it is achieved the automatic conversion of the TCH test channel of test system.By this conversion method, it is achieved the automatic conversion of the many TCH test channels in electronic product test system, improve the utilization ratio of test instrunment.
Description
Technical field
The present invention relates to electronic product field tests, particularly relate in a kind of electronic product test system is multiple
The method that TCH test channel is changed automatically.
Background technology
The means of testing of electronic product is mostly for utilize the physical size of product of large-scale production, electronics at present
The feature that characteristic is consistent, the method using testing mould, test product is put in testing mould and realize and survey
The quick connection of the equipment such as test instrument instrument, with computer integrated control thus complete parameters test.By
More expensive in test instrunment, for the consideration of the factor such as cost and equipment volume, nearly all use single set tester
Device coordinates passage switching to realize the test of the pipeline system to multiple products.
The method application is very universal, is relatively suitable for many pcb boards yoke plate test of electronic product, and having connection can
Lean on, advantage that testing efficiency is high.Test especially with pipeline mode, make test equipment the most incessantly
Test, be effectively increased the utilization ratio of test equipment.But there are some products due to product attribute
Reason, it is impossible to enough carry out the automatic assembly line pattern test of yoke plate state, need to be grasped by hand by operator
Put into testing mould to test, so put into testing mould at product and from testing mould, take out process
In, testing meter and instrument would be at waiting state, it is impossible to tests, and causes the use of test instrumentation to be imitated
Rate is relatively low, causes the waste of power of test.To this situation, it is common that use a set of test instrumentation to connect A, B
Two testing moulds, when i.e. A tests, operator are replaced the work of test product, A to B
After having tested, operator send instruction and allow test system switch to B to test, and vice versa.As
This, toward complex Alternating, improves the service efficiency of test instrunment.For the test of major part product, especially test
Cycle is longer, and the method is effective, but for test period the shortest product, effect is the most less
Substantially, if the such as testing time shorter than the time changing test product a lot of in the case of, test instrumentation
Service efficiency is the lowest.If increase TCH test channel, as it is shown in figure 1, such as increase C, D to test mould
Tool or more testing mould, can solve this problem, but operator operate two or more or more survey
Test die, easily tired, it is impossible to ensure that operation is accurately.If multiple operator operate, need to solve
The certainly coordination problem of many people operation.If also using traditional pipeline system test pattern, i.e. according to
A-＞ B-＞ C-＞ D-＞ A-＞ ... order test, each passage all can be judged by each streamline one by one,
Flow process as shown in Figure 2, if any of which or multiple passage are not used by, this work just there is no need,
Also lose time.
Summary of the invention
Because the drawbacks described above of prior art, the technical problem to be solved is the electronics in prior art
On the basis of multiple TCH test channel streamline switching modes of product testing system, it is provided that one can improve test and set
The method that multiple TCH test channels of standby utilization ratio are changed automatically.
For achieving the above object, the invention provides a kind of method that TCH test channel automatically switches, technical scheme is as follows:
End at each TCH test channel is provided for judging the most ready switch of this passage；
Create one and start test command queue, for depositing the startup test command of all TCH test channels；
Step 1, judges that each TCH test channel is the most ready successively, if ready, by this TCH test channel
Start test command to be stored in created startup test command queue.So the most repeatedly hold
OK.
Step 2, starts test command from starting to extract test command queue, and starts the survey of corresponding TCH test channel
Examination, again from starting extraction subsequent command test command queue after having tested, performs the most repeatedly.
Wherein step 1 and step 2 work alone, and coordinate by starting the data harmonization in test command queue,
Carry out the control that the TCH test channel in test process is changed automatically.
Further, described time interval is less than the minima of the single-piece testing time of all products to be measured.
Further, described time interval is 20ms.
Further, described time interval includes going needed for judging the most ready step of each passage successively
Tremble the judgement time.
Further, judge that the most ready step of each TCH test channel is by TCH test channel end successively
The state of switch carry out judging.
Further, the end of each TCH test channel is provided with testing mould, and electronic product to be measured is located in surveying
Carry out on test die testing.
Further, the switch of TCH test channel end is disposed on the testing mould of TCH test channel end.
Further, being arranged at the switch on the testing mould of TCH test channel end is limit switch.
The beneficial effects of the present invention is: to the electronic product test system hardware structure of prior art substantially without
In the case of change, will determine that the state of each TCH test channel and start test the two process separately.Further,
Judge that each TCH test channel is the most ready the most successively by one, and opening ready TCH test channel
Dynamic test command is stored in the step of the test command queue being pre-created and another one from starting test command queue
Middle extraction starts test command and starts the working alone of step of test of corresponding TCH test channel, controls whole test
System, decreases the time waited in test process, it is achieved the automatic conversion between each TCH test channel.Relative to existing
There is the pipeline system method of testing of technology, particularly in the case of having one or more TCH test channel untapped, this
The method of invention can significantly reduce the test system vacant waiting time in test process.In combination with product to be measured
The practical situation of product, the reasonably time interval in setting steps one, it is also possible to reduce test system at test process
In the vacant waiting time.So, the method utilizing the present invention, can improve the use effect of test instrunment significantly
Rate.
Below with reference to accompanying drawing, the technique effect of design, concrete structure and the generation of the present invention is described further,
To be fully understood from the purpose of the present invention, feature and effect.
Accompanying drawing explanation
Fig. 1 is the system connection figure (as a example by four TCH test channels) of electronic product test system in prior art.
Fig. 2 is the control flow chart (as a example by four TCH test channels) of electronic product of the prior art test system.
Fig. 3 is the control flow chart (as a example by four TCH test channels) of the electronic product test system using the present invention.
Detailed description of the invention
Illustrate embodiments of the invention below in conjunction with the accompanying drawings.
Electronic product test system as shown in Figure 1, it can be seen that this test system has four TCH test channels
A, B, C and D, one end of each TCH test channel is connected to test instrunment by TCH test channel conversion equipment
With control this test system computer, the other end is connected to respective testing mould, whole test process by
Computer integrated control.In the prior art, pipeline system method of testing as shown in Figure 2 is utilized, to respectively
Individual TCH test channel works the most as follows: judge that this TCH test channel is the most ready, if ready,
Just start the test of this TCH test channel, if offhand ready or this TCH test channel does not uses, then under entering
One TCH test channel.And apply aspects of the present inventions to this test system, at each testing mould
On a limit switch is set, when tested electronic product is placed in testing mould and puts in place, limit switch
Conducting, after test product is taken out from testing mould, limit switch disconnects.As it is shown on figure 3, in control
Make and the computer-controlled program of this test system is opened up a thread, such as the thread one in Fig. 3, this thread
Record successively with the cycle of 20ms (debounce wherein comprising 10ms judges the time) and store each TCH test channel
The state of limit switch, and successively to the state of the limit switch that each TCH test channel is recorded and storage
This TCH test channel limit switch previous record state is compared to judge whether this TCH test channel prepares
Ready.If the state once recorded before the limit switch of a TCH test channel is for disconnecting, and this record
State is conducting, then be judged as that this TCH test channel is ready for, and by the startup of this TCH test channel
Test command is stored in startup test command queue.And control other the one of the computer-controlled program of test system
Individual thread, thread two as shown in Figure 3, this thread is from starting extraction startup survey successively test command queue
Examination order, and according to starting the test of test command startup respective channel, the test of this passage is arrived after completing again
Start and test command queue is extracted next one startup test command, be repeated successively.Two threads are independent
Work, coordinates by starting the data harmonization of test command queue, it is achieved the TCH test channel in test process is automatic
Switching.
By above technical scheme, it is achieved that in the case of test system hardware structure is not the most changed, multiple
The automatic switchover of TCH test channel, decreases the vacant waiting time in test process, improves the use of test instrunment
Efficiency.
In the present embodiment, the number of the TCH test channel of test system is four.Certainly, the present invention is not limited to this,
TCH test channel can be freely increased and decreased as required, it is achieved the automatic switchover between multiple TCH test channels in actually used.
The preferred embodiment of the present invention described in detail above.Should be appreciated that those of ordinary skill in the art
Just many modifications and variations can be made according to the design of the present invention without creative work.Therefore, all technology neck
The technical staff in territory is the most on the basis of existing technology by logical analysis, reasoning or limited
Test available technical scheme, all should be in the protection domain being defined in the patent claims.
Claims (8)
1. the conversion method of multiple TCH test channels in an electronic product test system, it is characterised in that
End at each TCH test channel of described electronic product test system arranges one for judging this TCH test channel
The most ready switch；
Create the queue starting test command of all TCH test channels for depositing described test system；
Step 1, performs following steps: judge the described of described test system successively the most repeatedly
Each TCH test channel is the most ready, if ready, the described startup of this ready TCH test channel is surveyed
Examination order is stored in described startup test command queue；
Step 2, performs following steps: extract described startup from described startup test command queue and test life repeatedly
Make and start the test of corresponding described TCH test channel, extract from described startup test command queue again after having tested
Next starts test command；
Wherein, step 1 and step 2 work alone, and are coordinated by the data harmonization of described startup test command queue,
Carry out the control of the conversion automatically of the TCH test channel of described test system.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 1, it is special
Levying and be, described time interval is less than the minima of the single-piece testing time of all electronic products to be measured.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 2, it is special
Levying and be, described time interval includes that the debounce needed for judging the most ready step of this passage successively is sentenced
Break time.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 3, it is special
Levying and be, described time interval is 20ms.
5. according to the conversion method of multiple TCH test channels in the electronic product test system described in claim 1 or 4,
It is characterized in that, judge that the most ready step of each TCH test channel is by TCH test channel end successively
The state of switch carries out judging.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 5, it is special
Levying and be, the end of each TCH test channel is provided with testing mould, and electronic product to be measured is located in testing mould
On carry out testing.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 6, it is special
Levying and be, the switch of described TCH test channel end is disposed on the testing mould of TCH test channel end.
The conversion method of multiple TCH test channels in electronic product test system the most according to claim 7, it is special
Levying and be, the switch of described TCH test channel end is limit switch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201110413313.6A CN103163407B (en) | 2011-12-13 | 2011-12-13 | A kind of test the conversion method of multiple TCH test channels in system |
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| CN201110413313.6A CN103163407B (en) | 2011-12-13 | 2011-12-13 | A kind of test the conversion method of multiple TCH test channels in system |
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| CN103163407A CN103163407A (en) | 2013-06-19 |
| CN103163407B true CN103163407B (en) | 2016-08-24 |
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| CN104394040A (en) * | 2014-12-11 | 2015-03-04 | 深圳市彩煌通信技术有限公司 | Parallel separator test method and device based on network analyzer |
| CN107843827A (en) * | 2017-10-23 | 2018-03-27 | 上海斐讯数据通信技术有限公司 | A kind of mainboard automatic test control device, system and method |
| CN109617629A (en) * | 2019-01-10 | 2019-04-12 | 广东小天才科技有限公司 | Control method, device, equipment and medium for radio frequency test |
| CN112558553B (en) * | 2020-11-26 | 2022-02-11 | 苏州谷夫道自动化科技有限公司 | Method and system for executing channel command of multi-channel numerical control system |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6227373B1 (en) * | 1997-07-14 | 2001-05-08 | Delta Design, Inc. | Electronic device handling system and method |
| EP1271163A1 (en) * | 2001-06-20 | 2003-01-02 | STMicroelectronics Limited | Methods and systems for testing electronic devices |
| CN1518312A (en) * | 2003-01-17 | 2004-08-04 | ��Ϊ��������˾ | Method of multi-channel data processing |
| CN101118264A (en) * | 2006-08-03 | 2008-02-06 | 环隆电气股份有限公司 | Wireless high-frequency integration test system and test method thereof |
| CN101122851A (en) * | 2007-09-12 | 2008-02-13 | 华为技术有限公司 | Data processing method and processor |
| CN101355469A (en) * | 2007-07-26 | 2009-01-28 | 华为技术有限公司 | Method for processing network address and route node |
| CN101572635A (en) * | 2008-04-30 | 2009-11-04 | 新奥特（北京）视频技术有限公司 | Data transmission scheduling method based on channel configuration |
| CN102063385A (en) * | 2010-12-23 | 2011-05-18 | 深圳市金宏威实业发展有限公司 | Memory management method and system |
-
2011
- 2011-12-13 CN CN201110413313.6A patent/CN103163407B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6227373B1 (en) * | 1997-07-14 | 2001-05-08 | Delta Design, Inc. | Electronic device handling system and method |
| EP1271163A1 (en) * | 2001-06-20 | 2003-01-02 | STMicroelectronics Limited | Methods and systems for testing electronic devices |
| CN1518312A (en) * | 2003-01-17 | 2004-08-04 | ��Ϊ��������˾ | Method of multi-channel data processing |
| CN101118264A (en) * | 2006-08-03 | 2008-02-06 | 环隆电气股份有限公司 | Wireless high-frequency integration test system and test method thereof |
| CN101355469A (en) * | 2007-07-26 | 2009-01-28 | 华为技术有限公司 | Method for processing network address and route node |
| CN101122851A (en) * | 2007-09-12 | 2008-02-13 | 华为技术有限公司 | Data processing method and processor |
| CN101572635A (en) * | 2008-04-30 | 2009-11-04 | 新奥特（北京）视频技术有限公司 | Data transmission scheduling method based on channel configuration |
| CN102063385A (en) * | 2010-12-23 | 2011-05-18 | 深圳市金宏威实业发展有限公司 | Memory management method and system |
Non-Patent Citations (1)
| Title |
|---|
| 基于CPLD的程控多路切换开关设计;王呈健等;《计算机测量与控制》;20090430;第17卷(第4期);正文第754-746页 * |
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