CN101118264A - Wireless high-frequency integration test system and test method thereof - Google Patents
Wireless high-frequency integration test system and test method thereof Download PDFInfo
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- CN101118264A CN101118264A CNA2006101086842A CN200610108684A CN101118264A CN 101118264 A CN101118264 A CN 101118264A CN A2006101086842 A CNA2006101086842 A CN A2006101086842A CN 200610108684 A CN200610108684 A CN 200610108684A CN 101118264 A CN101118264 A CN 101118264A
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Abstract
The present invention relates a wireless high-frequency integration testing system and a testing method, the wireless high-frequency integration testing system comprises a control unit, a plurality of test units, a testing device and a testing switch unit. The present invention switches a plurality of test routes for testing wireless high-frequency products to be tested by the control units in collocation with the testing switch unit; and tests the wireless high-frequency products to be tested at random according to the testing demand of each test unit so as to reduce the expenses for purchasing the expensive testing device, to avoid mutual interference in testing a plurality of wireless high-frequency products to be tested, and to greatly reduce the unused time of the testing device and the average testing time of products to be tested.
Description
Technical field
The present invention relates to a kind of product test system, be meant a kind of wireless high-frequency integration test system and method for testing thereof especially.
Background technology
In the epoch with keen competition, product does not only require that the speed of listing wants fast, with regard to the quality of by-product this generic request is arranged also, and therefore speed and the accuracy in product test all can influence the quality and the customer satisfaction of product.
The method of wireless high-frequency product test at present, be on the test environment of each product to be measured, dispose the proving installation that to test the multinomial characterisitic parameter that this product to be measured possesses, make proving installation can test single product to be measured one to one, when preventing to test simultaneously a plurality of product to be measured, especially when test wireless signal product, the problem of phase mutual interference can appear.For with stable correctness that improves measurement signal and the test duration of quickening product to be measured, traditional method is that the requirement manufacturer a large amount of expense of stake is bought more proving installation, and to a large amount of maintenance cost of these proving installations generations, this method of testing has improved testing cost significantly.
In order to solve high testing cost problem to the wireless high-frequency product, a kind of integration test system has appearred, this system utilizes above-mentioned proving installation to add the platform to be measured that maximum two need are changed in regular turn, finish all test actions, to shorten or to reduce the artificial running time of placing product to be measured, reduce the expense of buying more and the maintenance cost of proving installation.When this integration test system is carried out test at the proving installation desire, after must a platform to be tested tests every characterisitic parameter of product to be measured in order therein, just can be converted to every characterisitic parameter that another platform to be tested tests another product to be measured in order.Yet such method of testing but can only reduce the time that the operator puts product to be measured, can't solve the problem that is idle for too long of proving installation also.
In addition since the expense of buying more of proving installation with and maintenance cost, for the test function of proving installation, testable characterisitic parameter is many more, then expense is just high more.Therefore relatively, have to sacrifice the testable characterisitic parameter of product to be measured,, but then, the phenomenon that to take into account fully but may occur to product quality to reach the purpose that reduces testing cost and shorten the test duration.
Summary of the invention
The purpose of this invention is to provide a kind of wireless high-frequency integration test system and method for testing thereof, this method is by control module and collocation test switch unit, switch the test path of a plurality of tests product to be measured, and according to the testing requirement of each to-be-measured cell, test product to be measured randomly, buy more the expense of proving installation, phase mutual interference between when avoiding testing product to be measured, significantly reduce the idle time of proving installation and the mean test time of product to be measured with minimizing.
For reaching above-mentioned purpose, the invention provides a kind of wireless high-frequency integration test system, its technical characterictic is as follows:
A plurality of to-be-measured cells, and each to-be-measured cell can propose a test request according to its testing requirement;
One control module can receive this test request, and carries out a test procedure according to this test request, and then produces a controlling signal;
One test switch unit can receive this controlling signal, and switches to this to-be-measured cell that proposes test request according to this; And
One proving installation is subjected to the control of this control module, can test switch unit by this and electrically connect described to-be-measured cell to test.
For reaching above-mentioned purpose, the invention provides a kind of wireless high-frequency integration method of testing, its technical characterictic is as follows:
Whether judge has a to-be-measured cell to propose a test request in the integration test system; And
According to this test request, carry out a test procedure, and produce a controlling signal;
According to this controlling signal, determine the test path of the required test of a proving installation; And
According to this test procedure and the test path that determined, carry out the test of the interior product to be measured of this to-be-measured cell, and produce a test result.
In sum, control module of the present invention can judge whether to-be-measured cell is arranged according to its testing requirement in the integration test system, propose a test request randomly earlier.Then, control module can be carried out test procedure according to the test request that to-be-measured cell proposed, and produces controlling signal.The test switch unit then can be further according to the controlling signal that control module provided, in a plurality of test paths, select one of them corresponding test path, make proving installation can test the interior product to be measured of this to-be-measured cell further to the to-be-measured cell that proposes test request.
By above-mentioned technical characterictic, advantage provided by the present invention is, utilizes control module to control the test that this integration test system is made product to be measured.
Another advantage provided by the present invention is under this integration test system, to have a plurality of to-be-measured cells, can test a plurality of products to be measured, buys more the expense of proving installation with minimizing.
An advantage more provided by the present invention is that each to-be-measured cell can be tested the multinomial characterisitic parameter of a product to be measured.
An advantage more provided by the present invention is, utilizes control module and collocation test switch unit, switches the test path of a plurality of products to be measured.
An advantage more provided by the present invention is, this integration test system is when carrying out the test of a certain characterisitic parameter, all products to be measured need not be tested in order, and after need not waiting until that each product to be measured is all finished the test of this characterisitic parameter, the test of next characterisitic parameter could be carried out.Otherwise, promptly be the test action that the stochastic and dynamic TCM is finished all several product different qualities parameters to be measured.
An advantage more provided by the present invention is, owing to utilize the test switch unit to come the switch test path, therefore can avoid when the product to be measured of test wireless high-frequency, and phase mutual interference each other is to improve the test accuracy of product to be measured.
An advantage more provided by the present invention is, because this integration test system system is according to the testing requirement of each to-be-measured cell, test product to be measured randomly, therefore can significantly reduce the idle time of proving installation, also significantly reduce the mean test time of product to be measured.
Description of drawings
Fig. 1 is the block schematic diagram of the integration test system of content of the present invention;
Fig. 2 is the control module control proving installation of content of the present invention and the block schematic diagram of test switch unit; And
Fig. 3 is the process flow diagram of the integrated test method of content of the present invention.
Symbol description among the figure
First to-be-measured cell 21
The first subtest unit 213
Second to-be-measured cell 22
The second subtest unit 223
N to-be-measured cell 23
Proving installation 40
First change-over switch 521
Second change-over switch 522
The 3rd change-over switch 523
The 4th change-over switch 524
The 5th change-over switch 525
The 6th change-over switch 526
The 7th change-over switch 527
The 3rd test path 533
The 4th test path 534
The 5th test path 535
The 6th test path 536
The 7th test path 537
The 8th test path 538
Embodiment
Integration test system provided by the present invention is to control the test of supporting distributed devices and the test of different chipsets with identical computer protocol, and is applicable to the workbench of all product tests, especially is applicable to the test of wireless high-frequency product.
Please refer to shown in Figure 1ly, be the block schematic diagram of the integration test system of content of the present invention.Integration test system comprises a control module 10, a plurality of to-be-measured cell (first to-be-measured cell 21 is to N to-be-measured cell 23), instruction transmission unit 30, proving installation 40 and test switch unit 50.Each above-mentioned to-be-measured cell comprises a device to be measured and a subtest unit respectively, promptly first to-be-measured cell 21 comprises one first device 211 to be measured and one first subtest unit 213, second to-be-measured cell 22 comprises one second device 221 to be measured and one second subtest unit, 223, the N to-be-measured cells 23 comprise a N device 231 to be measured and a N subtest unit 233.
Above-mentioned device to be measured (first device 211 to the N devices 231 to be measured to be measured) also is the workbench that measures product to be measured in order to place the product to be measured of required test.And above-mentioned subtest unit (the first subtest unit 213 is to N subtest unit 233) is computer installation, and each subtest unit is linked to its pairing device to be measured respectively.Therefore, when the product needed to be measured on first device 211 to be measured measured, first device 211 to be measured can propose a test request to control module 10 by the first subtest unit 213.When the product needed to be measured on second device 221 to be measured measured, second device 221 to be measured can propose a test request to control module 10 by the second subtest unit 223.In like manner, when the product needed to be measured on the N device 231 to be measured measured, N device 231 to be measured can propose a test request to control module 10 by N subtest unit 233.
Proving installation 40 is linked to above-mentioned control module 10 and test switch unit 50, in order to control according to control module 10, measure each to-be-measured cell (first to-be-measured cell 21 is to N to-be-measured cell 23) randomly, so proving installation 40 can for a comprehensive tester (one-boxtester, OBT), an Agilent N4010A or ACE IQ View/Flex etc.Test switch unit 50 then is linked to control module 10 and each to-be-measured cell (first to-be-measured cell 21 is to N to-be-measured cell 23), test switch unit 50 can be opened the path of test according to the controlling signal that control module 10 is provided, and test path is independence and mutually insulated separately, and the path of this test is to decide according to the test request that above-mentioned device to be measured (first to-be-measured cell 21 is to N to-be-measured cell 23) is proposed.
That is to say, suppose when one of them above-mentioned to-be-measured cell proposes a test request to control module 10 according to its testing requirement, control module 10 can be carried out test procedure, and the corresponding test path of control test switch unit 50 open these to-be-measured cells, make proving installation 40 be tested this to-be-measured cell.Thus, integration test system provided by the present invention only needs a proving installation 40, by testing switch unit 50 switch test path constantly, just can test a plurality of products to be measured, significantly reducing the expense buy more proving installation 40, and the expense of maintenance test device 40 backward.
Please refer to shown in Figure 2ly, be the control module control proving installation of content of the present invention and the block schematic diagram of test switch unit.Test switch unit 50 switches control circuit 510 by one and a plurality of change-over switch is formed.And the quantity of change-over switch determines along with user's demand, and is arranged in a tree structure.
With present embodiment, comprise seven change-over switches in the test switch unit 50, be respectively first change-over switch 521, second change-over switch 522, the 3rd change-over switch 523, the 4th change-over switch 524, the 5th change-over switch 525, the 6th change-over switch 526 and the 7th change-over switch 527, each change-over switch all is linked to control switching circuit 510.Wherein, first change-over switch 521 is linked to second change-over switch 522 and the 3rd change-over switch 523, second change-over switch 522 is linked to the 4th change-over switch 524 and the 5th change-over switch 525,523 of the 3rd change-over switches are linked to the 6th change-over switch 526 and the 7th change-over switch 527, therefore at the output terminal of testing switch unit 50, can support eight test paths, and these eight test paths are all independence and mutually insulated separately, are respectively first test path 531, second test path 532, the 3rd test path 533, the 4th test path 534, the 5th test path 535, the 6th test path 536, the 7th test path 537 and the 8th test path 538.Each test path corresponds to one of them to-be-measured cell respectively, and promptly test path has eight, and to-be-measured cell also is eight.
Control control switching circuit 510 when control module 10 output one controlling signal, control switching circuit 510 can be controlled the change action of each change-over switch further, and then the test path opened of the output terminal of decision test switch unit 50.When test switch unit 50 determines a test path, 40 tests that can carry out the pairing to-be-measured cell of this test path of proving installation.
In order further to set forth content of the present invention, ask Fig. 1 to shown in Figure 3, wherein Fig. 3 is the process flow diagram of the integrated test method of content of the present invention.After integration test system started, the element of test macro inside all can be got back to init state, as step S310.The init state of the default integration test system of the embodiment of the invention is earlier open first test path 531.
Then, integration test system can be detected its inner one of them to-be-measured cell (first to-be-measured cell 21 is to N to-be-measured cell 23) further and whether propose a test request according to its testing requirement, as step S320.Because it is open that present embodiment is preset first test path, 531 elder generations, and then the integration test system meeting begins to detect by first to-be-measured cell 21 of 531 correspondences of first test path whether the test request proposition is arranged earlier.If first to-be-measured cell does not propose test request as yet, represent that product to be measured may not insert in first device 211 to be measured as yet, even also do not have any product to be measured in arbitrary device to be measured and insert, at this moment, integration test system can continue to wait for, in product to be measured is inserted first device 211 to be measured at least, and first device 211 to be measured also proposes test request to control module 10 by the first subtest unit 213.When if first to-be-measured cell has proposed test request to control module 10, control module 10 can be carried out test procedure, and produces a controlling signal according to test request, as step S330.
If all characterisitic parameters of product to be measured are not tested as yet and are finished in all to-be-measured cells, then get back to step S320, control module 10 can continue to wait for that next to-be-measured cell proposes test request, to test the characterisitic parameter of product to be measured in the next to-be-measured cell further.If all characterisitic parameters of product to be measured in all to-be-measured cells have been tested finish, then finish test procedure, as step S360.
Wherein, each to-be-measured cell (first to-be-measured cell 21 is to N to-be-measured cell 23) all has the ability that measures the above-mentioned multinomial characterisitic parameter of product to be measured (multi-function), and can propose test request according to its testing requirement randomly.That is to say, this integration test system is when carrying out the test of a certain characterisitic parameter, need not carry out to N to-be-measured cell 23 by first to-be-measured cell 21 in order, and after need not waiting until that each to-be-measured cell is all finished the test of this characterisitic parameter, could carry out the test of next characterisitic parameter.Thus, just can reduce the time that proving installation 40 leaves unused significantly, and the test duration of reducing test product to be measured.
Accompanying drawing provided by the present invention only provides reference and explanation usefulness, is not to be used for the present invention is limited.The above only is the present invention's preferable possible embodiments, and is non-so promptly limit to the present invention's claim, thus use such as instructions of the present invention and icon content institute for it equivalent structure change, all in like manner be contained in the present invention's the scope, close and give Chen Ming.
Claims (19)
1. integration test system, the field that it is applied to wireless or high frequency is characterized in that comprising:
A plurality of to-be-measured cells, and each to-be-measured cell can propose a test request according to its testing requirement;
One control module can receive this test request, and carries out a test procedure according to this test request, and then produces a controlling signal;
One test switch unit can receive this controlling signal, and switches to this to-be-measured cell that proposes test request according to this; And
One proving installation is subjected to the control of this control module, can test switch unit by this and electrically connect described to-be-measured cell to test.
2. integration test system as claimed in claim 1 is characterized in that each to-be-measured cell also comprises a device to be measured and a subtest unit.
3. integration test system as claimed in claim 2 is characterized in that this device to be measured connects this subtest unit, proposes this test request to this control module.
4. integration test system as claimed in claim 2 is characterized in that described subtest unit is a computer installation.
5. integration test system as claimed in claim 1 is characterized in that this test switch unit also comprises:
At least one change-over switch is in order to switch the test path between one of this proving installation and described test cell; And
A control switching circuit is controlled the change action of this change-over switch according to this controlling signal.
6. integration test system as claimed in claim 5, the binding that it is characterized in that described change-over switch are that tree structure is arranged.
7. integration test system as claimed in claim 5 is characterized in that each change-over switch provides two kinds of test paths.
8. integration test system as claimed in claim 1, it is characterized in that this integration test system further comprises an instruction transmission unit, in order to binding bridge, make described to-be-measured cell be able to randomly test request is sent to this control module as described to-be-measured cell and this control module.
9. integration test system as claimed in claim 8 is characterized in that this instruction transmission unit is a hub.
10. integration test system as claimed in claim 1 is characterized in that this proving installation is a comprehensive tester.
11. a test switch unit is arranged in the integration test system in a wireless or high frequency field, it is characterized in that including:
A plurality of change-over switches are in order to form the test path of a plurality of independences separately and mutually insulated; And
A control switching circuit is electrically connected at described change-over switch, in order to control the change action of this change-over switch.
12. test switch unit as claimed in claim 11 is characterized in that the binding between the described change-over switch is arranged with tree structure.
13. test switch unit as claimed in claim 11 is characterized in that each change-over switch determines two kinds of test paths.
14. an integrated test method is characterized in that comprising:
Whether judge has a to-be-measured cell to propose a test request in the integration test system; And
According to this test request, carry out a test procedure, and produce a controlling signal;
According to this controlling signal, determine the test path of the required test of a proving installation; And
According to this test procedure and the test path that determined, carry out the test of the interior product to be measured of this to-be-measured cell, and produce a test result.
15. integrated test method as claimed in claim 14 is characterized in that this to-be-measured cell is to propose this test request according to its testing requirement, with this controlling signal of further generation.
16. integrated test method as claimed in claim 15 is characterized in that this proving installation is the demand according to this to-be-measured cell, tests the different characterisitic parameter of this product to be measured.
17. integrated test method as claimed in claim 14 is characterized in that this to-be-measured cell is sent to a control module with this test request, to carry out this test procedure and to produce this controlling signal.
18. integrated test method as claimed in claim 17 is characterized in that this test request is to be sent to this control module by network.
19. integrated test method as claimed in claim 14 is characterized in that the field of this Test Application in wireless or high frequency.
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| CNA2006101086842A CN101118264A (en) | 2006-08-03 | 2006-08-03 | Wireless high-frequency integration test system and test method thereof |
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Cited By (8)
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| CN101907666A (en) * | 2010-07-29 | 2010-12-08 | 福建捷联电子有限公司 | Automatic test system for energy consumption of electrical product and automatic test method thereof |
| US8335944B2 (en) | 2009-07-21 | 2012-12-18 | Wistron Corporation | Automatic testing apparatus |
| CN103163407A (en) * | 2011-12-13 | 2013-06-19 | 上海明凯照明有限公司 | Conversion method of multiple testing channels of testing system |
| CN103164311A (en) * | 2011-12-16 | 2013-06-19 | 环旭电子股份有限公司 | Method for automatically testing communication function of object to be tested |
| CN104808096A (en) * | 2014-01-28 | 2015-07-29 | 沈阳中科奥维科技股份有限公司 | Wireless module automatic test device and method based on instrument control |
| CN104364663B (en) * | 2012-04-17 | 2017-02-22 | 庞巴迪运输有限公司 | train test platform |
| CN112905452A (en) * | 2021-02-02 | 2021-06-04 | 环荣电子(惠州)有限公司 | Wireless multiplex testing system and method thereof |
| CN113567153A (en) * | 2021-09-23 | 2021-10-29 | 深圳市星卡软件技术开发有限公司 | One-key action test method and device and computer equipment |
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2006
- 2006-08-03 CN CNA2006101086842A patent/CN101118264A/en active Pending
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| US8335944B2 (en) | 2009-07-21 | 2012-12-18 | Wistron Corporation | Automatic testing apparatus |
| CN101963930B (en) * | 2009-07-21 | 2013-06-12 | 纬创资通股份有限公司 | Automatic test device |
| CN101907666A (en) * | 2010-07-29 | 2010-12-08 | 福建捷联电子有限公司 | Automatic test system for energy consumption of electrical product and automatic test method thereof |
| CN101907666B (en) * | 2010-07-29 | 2012-08-08 | 福建捷联电子有限公司 | Automatic test system for energy consumption of electrical product and automatic test method thereof |
| CN103163407A (en) * | 2011-12-13 | 2013-06-19 | 上海明凯照明有限公司 | Conversion method of multiple testing channels of testing system |
| CN103163407B (en) * | 2011-12-13 | 2016-08-24 | 浙江明凯照明有限公司 | A kind of test the conversion method of multiple TCH test channels in system |
| CN103164311B (en) * | 2011-12-16 | 2015-04-29 | 环旭电子股份有限公司 | Method for automatically testing communication function of object to be tested |
| CN103164311A (en) * | 2011-12-16 | 2013-06-19 | 环旭电子股份有限公司 | Method for automatically testing communication function of object to be tested |
| CN104364663B (en) * | 2012-04-17 | 2017-02-22 | 庞巴迪运输有限公司 | train test platform |
| CN104808096A (en) * | 2014-01-28 | 2015-07-29 | 沈阳中科奥维科技股份有限公司 | Wireless module automatic test device and method based on instrument control |
| CN112905452A (en) * | 2021-02-02 | 2021-06-04 | 环荣电子(惠州)有限公司 | Wireless multiplex testing system and method thereof |
| CN112905452B (en) * | 2021-02-02 | 2024-02-02 | 环荣电子(惠州)有限公司 | Wireless multiplexing test system and method thereof |
| CN113567153A (en) * | 2021-09-23 | 2021-10-29 | 深圳市星卡软件技术开发有限公司 | One-key action test method and device and computer equipment |
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