CN103107528B - Power clamping electrostatic discharge protection circuit - Google Patents
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Abstract
本发明提供一种电源钳位静电放电保护电路,包括有电源管脚、接地管脚,以及用于感应静电放电电压的判定电路(310);用于将所述判定电路(310)感应到的静电放电电压信号记录并保留,以提供延时的延时电路(320);用于将所述延时电路(320)保留的静电放电电压信号转换为静电放电触发信号的触发电路(330)和用于在接收到所述静电放电触发信号后,泄放静电电流的钳位电路(340);本发明将判断电路和延时电路分开,避免了快速上电可能引起的钳位电路误触发,同时,在静电放电冲击时能够使所述钳位电路获得更长的开启时间,提高静电放电保护的可靠性。
The invention provides a power supply clamp electrostatic discharge protection circuit, including a power supply pin, a ground pin, and a determination circuit (310) for inducing electrostatic discharge voltage; used for inducing the determination circuit (310) An electrostatic discharge voltage signal is recorded and retained to provide a delay circuit (320); a trigger circuit (330) for converting the electrostatic discharge voltage signal retained by the delay circuit (320) into an electrostatic discharge trigger signal; and A clamping circuit (340) used to discharge the electrostatic current after receiving the electrostatic discharge trigger signal; the present invention separates the judgment circuit from the delay circuit, avoiding false triggering of the clamping circuit that may be caused by fast power-on, At the same time, the clamping circuit can obtain a longer turn-on time when the electrostatic discharge impacts, thereby improving the reliability of electrostatic discharge protection.
Description
技术领域technical field
本发明涉及集成电路芯片静电放电(Electronic Static Discharge,ESD)保护技术领域,特别涉及一种判定单元和延时单元分开的电源钳位ESD保护电路。The invention relates to the field of integrated circuit chip electrostatic discharge (Electronic Static Discharge, ESD) protection technology, in particular to a power clamp ESD protection circuit with a separate determination unit and delay unit.
背景技术Background technique
随着集成电路工艺特征尺寸的不断缩小,芯片的防静电泄放能力已经成为保证内部电路可靠工作的关键因素。静电泄放现象是指当两个带有不等电势的物体靠近或者接触时,二者之间发生静电电荷转移的瞬态过程。在先进的集成电路工艺水平下,器件的栅氧化层很薄,其等效的栅氧化层电容很小,当静电电荷积累在栅氧化层上时,会形成很大的等效栅压,导致器件或者电路的失效。对于集成电路芯片来说,静电冲击有不同的模式,对应也有不同的保护电路。在电源管脚对接地管脚或者输入/输出管脚对输入/输出管脚的冲击模式下,静电电荷会流经内部功能电路模块,造成内部电路的损伤。电源钳位ESD保护电路主要是针对上述两种冲击模式,在冲击来临时,给芯片提供一个有效的静电电荷释放通路,保证芯片内部功能电路不受冲击的损伤。With the continuous shrinking of the feature size of the integrated circuit process, the anti-static discharge capability of the chip has become a key factor to ensure the reliable operation of the internal circuit. The electrostatic discharge phenomenon refers to the transient process of electrostatic charge transfer between two objects with unequal potentials approaching or touching. At the advanced level of integrated circuit technology, the gate oxide layer of the device is very thin, and its equivalent gate oxide layer capacitance is very small. When electrostatic charges accumulate on the gate oxide layer, a large equivalent gate voltage will be formed, resulting in failure of a device or circuit. For integrated circuit chips, there are different modes of electrostatic shock, and correspondingly different protection circuits. In the impact mode of the power pin to the ground pin or the input/output pin to the input/output pin, the electrostatic charge will flow through the internal functional circuit module, causing damage to the internal circuit. The power clamp ESD protection circuit is mainly aimed at the above two impact modes. When the impact comes, it provides an effective electrostatic charge discharge path for the chip to ensure that the internal functional circuits of the chip are not damaged by the impact.
已有的电源钳位ESD保护电路的设计需要满足如下的条件:在ESD冲击来临时,由保护电路的电容-电阻或者电阻-电容模块给出一个有效信号,打开钳位晶体管以释放静电电荷。在正常充电电压来临时,钳位晶体管要求不被打开。The design of the existing power supply clamp ESD protection circuit needs to meet the following conditions: when the ESD strikes, the capacitor-resistor or resistor-capacitor module of the protection circuit gives an effective signal to turn on the clamp transistor to discharge the electrostatic charge. When the normal charging voltage comes, the clamping transistor is not required to be turned on.
电源快速上电使电源钳位ESD保护电路面临挑战:为了防止钳位ESD电路的误触发,需要电容-电阻或者电阻-电容模块的时间常数尽可能小;但是,太小的时间常数不能够保证钳位晶体管在ESD冲击之下有足够的开启时间。The fast power-up of the power supply makes the power clamp ESD protection circuit face challenges: in order to prevent false triggering of the clamp ESD circuit, the time constant of the capacitor-resistor or resistor-capacitor module needs to be as small as possible; however, too small a time constant cannot guarantee The clamp transistor has enough turn-on time under ESD strike.
图1所示为一种现有技术的电源钳位ESD保护电路,其工作原理如下:当一个ESD脉冲作用到电源管脚VDD时,节点B的电压上拉为VDD管脚的电压水平,经过两级反相器,钳位晶体管1的栅极电压上拉至电源管脚VDD的电压水平,然后钳位晶体管1启动,开始释放ESD冲击积累的静电电荷。等到由电阻R1和电容C1耦合的时间常数过去之后,节点B的电压变为逻辑低电平,经过两级反相器,钳位晶体管1的栅极电压下拉至接地管脚的电压水平,结束ESD保护过程。Figure 1 shows a power supply clamp ESD protection circuit of the prior art, and its working principle is as follows: when an ESD pulse is applied to the power supply pin VDD, the voltage of node B is pulled up to the voltage level of the VDD pin, and after In a two-stage inverter, the gate voltage of the clamping transistor 1 is pulled up to the voltage level of the power supply pin VDD, and then the clamping transistor 1 starts to discharge the electrostatic charge accumulated in the ESD impact. After the time constant coupled by resistor R1 and capacitor C1 has elapsed, the voltage of node B becomes a logic low level, and after two stages of inverters, the gate voltage of clamp transistor 1 is pulled down to the voltage level of the ground pin, ending ESD protection process.
正常上电的充电电压作用到电源管脚VDD时,节点B的电压会维持在接地管脚的电压水平,经过两级反相器,钳位晶体管1栅压始终处于低电平状态,保证了钳位晶体管1在正常上电时不被触发。When the charging voltage of normal power-on is applied to the power pin VDD, the voltage of node B will be maintained at the voltage level of the ground pin. After passing through the two-stage inverter, the gate voltage of the clamping transistor 1 is always in a low-level state, ensuring Clamp transistor 1 is not triggered during normal power-up.
如图1所示的现有技术的问题在于:电容C1和电阻R1同时承担了判定和延时的任务。为了获得足够的ESD开启延时(例如500ns),必须有足够大的电容C1和电阻R1,但是,这样在电源发生快速上电(例如100ns上升时间)时,经过电阻R1对电容C1的充电就会跟不上变化,此时,就会导致钳位晶体管1的误触发。The problem with the prior art shown in FIG. 1 is that the capacitor C1 and the resistor R1 undertake the tasks of determination and delay at the same time. In order to obtain a sufficient ESD turn-on delay (for example, 500ns), there must be a large enough capacitor C1 and resistor R1. However, when the power supply is powered on quickly (for example, 100ns rise time), the charging of capacitor C1 through resistor R1 is will not be able to keep up with the changes, and at this time, false triggering of the clamping transistor 1 will be caused.
发明内容Contents of the invention
为解决上述问题,本发明提供一种电源钳位静电放电保护电路,该保护电路将判断电路和延时电路分开,避免了快速上电可能引起的钳位电路误触发,同时,在静电放电冲击时能够使所述钳位电路获得更长的开启时间,提高静电放电保护的可靠性。In order to solve the above problems, the present invention provides a power supply clamp electrostatic discharge protection circuit, which separates the judgment circuit from the delay circuit, avoiding the false triggering of the clamp circuit that may be caused by fast power-on, and at the same time, the electrostatic discharge shock This can enable the clamping circuit to obtain a longer turn-on time and improve the reliability of electrostatic discharge protection.
为实现以上目的,本发明通过以下技术方案予以实现:To achieve the above object, the present invention is achieved through the following technical solutions:
一种电源钳位静电放电保护电路,包括有电源管脚、接地管脚、判定电路、延时电路、触发电路及钳位电路;其中:A power clamp electrostatic discharge protection circuit, including a power pin, a ground pin, a judgment circuit, a delay circuit, a trigger circuit and a clamp circuit; wherein:
电源管脚,用于连接电源,以提供电源电压;The power supply pin is used to connect the power supply to provide the power supply voltage;
接地管脚,用于提供低电平;Ground pin, used to provide low level;
判定电路,其连接于所述电源管脚及接地管脚之间,用于感应静电放电的电压信号;A determination circuit, which is connected between the power supply pin and the ground pin, and is used to induce the voltage signal of electrostatic discharge;
延时电路,其输入端与所述判定电路的输出端相连,用于将所述判定电路感应到的静电放电电压信号记录并保留,以提供延时;A delay circuit, the input end of which is connected to the output end of the determination circuit, is used to record and retain the electrostatic discharge voltage signal sensed by the determination circuit, so as to provide a delay;
触发电路,其输入端与所述延时电路的输出端相连,用于将所述延时电路保留的静电放电电压信号转换为静电放电触发信号;A trigger circuit, the input end of which is connected to the output end of the delay circuit, is used to convert the electrostatic discharge voltage signal retained by the delay circuit into an electrostatic discharge trigger signal;
钳位电路,其连接于所述电源管脚及接地管脚之间,且其输入端与所述触发电路的输出端相连,用于在接收到所述静电放电触发信号后,泄放静电电流。A clamp circuit, which is connected between the power supply pin and the ground pin, and its input end is connected to the output end of the trigger circuit, and is used to discharge the electrostatic current after receiving the electrostatic discharge trigger signal .
优选的,所述判定电路为二极管-容抗-阻抗电路,其进一步包括:Preferably, the determination circuit is a diode-capacitive reactance-impedance circuit, which further includes:
二极管,其阳极连接于所述电源管脚,其阴极与第一容抗元件的一端相连,并形成第一连接点;a diode whose anode is connected to the power supply pin, and whose cathode is connected to one end of the first capacitive reactance element to form a first connection point;
所述第一容抗元件的另一端与第一阻抗元件的一端相连,并形成第二连接点;所述第一阻抗元件的另一端连接于所述接地管脚;The other end of the first capacitive element is connected to one end of the first impedance element to form a second connection point; the other end of the first impedance element is connected to the ground pin;
所述第二连接点为该判定电路的输出端,其为所述延时电路提供静电放电电压信号。The second connection point is the output terminal of the determination circuit, which provides the electrostatic discharge voltage signal for the delay circuit.
优选的,所述第一容抗元件为电容,所述第一阻抗元件为电阻器。Preferably, the first capacitive reactance element is a capacitor, and the first impedance element is a resistor.
优选的,所述延时电路进一步包括:Preferably, the delay circuit further includes:
第二阻抗元件,其第一端点连接至所述电源管脚;a second impedance element, the first terminal of which is connected to the power supply pin;
第二容抗元件,其第一端点连接至所述电源管脚;a second capacitive reactance element, the first terminal of which is connected to the power supply pin;
第一N型MOS晶体管,其栅极连接至所述判定电路的输出端,其漏极连接至所述第二阻抗元件的第二端点,其源极连接至所述接地管脚;A first N-type MOS transistor, the gate of which is connected to the output terminal of the determination circuit, the drain of which is connected to the second terminal of the second impedance element, and the source of which is connected to the ground pin;
第二N型MOS晶体管,其栅极和漏极连接至所述第二容抗元件的第二端点,其源极连接至所述第二阻抗元件的第二端点;a second N-type MOS transistor, the gate and drain of which are connected to the second terminal of the second capacitive element, and the source of which is connected to the second terminal of the second impedance element;
第一P型MOS晶体管,其栅极和漏极连接至所述第二容抗元件的第二端点,其源极连接至所述第二阻抗元件的第二端点;a first P-type MOS transistor, the gate and drain of which are connected to the second terminal of the second capacitive element, and the source of which is connected to the second terminal of the second impedance element;
第二P型MOS晶体管,其栅极连接至所述第二容抗元件的第二端点,其漏极连接至所述接地管脚,其源极连接至所述第二阻抗元件的第二端点;A second P-type MOS transistor, the gate of which is connected to the second terminal of the second capacitive element, the drain of which is connected to the ground pin, and the source of which is connected to the second terminal of the second impedance element ;
所述第二阻抗元件的第二端点为该延时电路的输出端,其为所述触发电路提供静电放电电压信号。The second terminal of the second impedance element is the output terminal of the delay circuit, which provides an electrostatic discharge voltage signal for the trigger circuit.
优选的,所述第二阻抗元件为电阻器,所述第二容抗元件为电容。Preferably, the second impedance element is a resistor, and the second capacitive reactance element is a capacitor.
优选的,所述触发电路进一步包括:Preferably, the trigger circuit further includes:
第三P型MOS晶体管,其栅极连接至所述延时电路的输出端,其源极连接至所述电源管脚;A third P-type MOS transistor, the gate of which is connected to the output terminal of the delay circuit, and the source of which is connected to the power supply pin;
第三N型MOS晶体管,其栅极连接至所述延时电路的输出端,其源极连接至所述接地管脚,其漏极连接至所述第三P型MOS晶体管的漏极;A third N-type MOS transistor, the gate of which is connected to the output terminal of the delay circuit, the source of which is connected to the ground pin, and the drain of which is connected to the drain of the third P-type MOS transistor;
所述第三N型MOS晶体管的漏极为该触发电路的输出端,其为所述钳位电路提供所述静电放电触发电压信号。The drain of the third N-type MOS transistor is the output terminal of the trigger circuit, which provides the electrostatic discharge trigger voltage signal for the clamping circuit.
优选的,所述钳位电路为N沟道钳位晶体管,其栅极连接至所述触发电路的输出端,其源极连接至所述接地管脚,其漏极连接至所述电源管脚。Preferably, the clamping circuit is an N-channel clamping transistor, its gate is connected to the output terminal of the trigger circuit, its source is connected to the ground pin, and its drain is connected to the power supply pin .
本发明通过提供一种电源钳位静电放电保护电路,该保护电路将判断电路和延时电路分开,避免了快速上电可能引起的钳位电路误触发,同时,在静电放电冲击时能够使所述钳位电路获得更长的开启时间,提高静电放电保护的可靠性。The present invention provides a power supply clamp electrostatic discharge protection circuit, which separates the judgment circuit from the delay circuit, avoids false triggering of the clamp circuit that may be caused by fast power-on, and at the same time, can make all The above clamp circuit obtains a longer turn-on time and improves the reliability of electrostatic discharge protection.
附图说明Description of drawings
图1为现有技术中的电源钳位静电放电保护电路图;FIG. 1 is a circuit diagram of a power clamp electrostatic discharge protection circuit in the prior art;
图2为本发明一实施例中电源钳位静电放电保护电路的原理框图;Fig. 2 is a functional block diagram of a power supply clamp electrostatic discharge protection circuit in an embodiment of the present invention;
图3为本发明一实施例的电源钳位静电放电保护电路图;3 is a circuit diagram of a power clamp electrostatic discharge protection circuit according to an embodiment of the present invention;
图4(a)、(b)分别为图1、图3中电源钳位静电放电保护电路在ESD脉冲作用下的仿真结果;Figure 4 (a) and (b) are the simulation results of the power clamp electrostatic discharge protection circuit in Figure 1 and Figure 3 under the action of ESD pulses;
图5(a)、(b)分别是图1、图3中电源钳位静电放电保护电路在电源快速上电情况下的仿真结果。Figure 5(a) and (b) are the simulation results of the power clamp electrostatic discharge protection circuit in Figure 1 and Figure 3 under the condition of fast power-on.
具体实施方式Detailed ways
下面对于本发明所提出的一种电源钳位静电放电保护电路,结合附图和实施例详细说明。A power supply clamp electrostatic discharge protection circuit proposed by the present invention will be described in detail below with reference to the drawings and embodiments.
如图2和图3所示,本发明提供一种电源钳位静电放电保护电路,包括有电源管脚VDD、接地管脚VSS、判定电路310、延时电路320、触发电路330及钳位电路340;其中:As shown in Figure 2 and Figure 3, the present invention provides a power supply clamp electrostatic discharge protection circuit, including a power supply pin VDD, a ground pin VSS, a determination circuit 310, a delay circuit 320, a trigger circuit 330 and a clamping circuit 340; of which:
电源管脚VDD,用于连接电源,以提供电源电压;The power supply pin VDD is used to connect to a power supply to provide a power supply voltage;
接地管脚VSS,用于提供低电平;The ground pin VSS is used to provide low level;
判定电路310,其连接于所述电源管脚VDD及接地管脚VSS之间,用于感应静电放电的电压;A determination circuit 310, which is connected between the power supply pin VDD and the ground pin VSS, and is used to sense the voltage of electrostatic discharge;
延时电路320,其输入端与所述判定电路310的输出端相连,用于将所述判定电路310感应到的静电放电电压信号记录并保留,以提供延时;Delay circuit 320, its input end is connected with the output end of described judging circuit 310, is used for recording and retaining the electrostatic discharge voltage signal sensed by described judging circuit 310, to provide time delay;
触发电路330,其输入端与所述延时电路320的输出端相连,用于将所述延时电路320保留的静电放电电压信号转换为静电放电触发信号;A trigger circuit 330, whose input terminal is connected to the output terminal of the delay circuit 320, is used to convert the electrostatic discharge voltage signal retained by the delay circuit 320 into an electrostatic discharge trigger signal;
钳位电路340,其连接于所述电源管脚VDD及接地管脚VSS之间,且其输入端与所述触发电路330的输出端相连,用于在接收到所述静电放电触发信号后,泄放静电电流。The clamping circuit 340 is connected between the power supply pin VDD and the grounding pin VSS, and its input terminal is connected to the output terminal of the trigger circuit 330, for receiving the electrostatic discharge trigger signal, Discharge static electricity.
优选的,如图3所示,所述判定电路310为二极管-容抗-阻抗电路,其进一步包括:Preferably, as shown in Figure 3, the determination circuit 310 is a diode-capacitive reactance-impedance circuit, which further includes:
二极管311,其阳极连接于所述电源管脚VDD,其阴极与第一容抗元件的一端相连,并形成第一连接点A,即所述二极管311连接于所述电源管脚VDD和所述第一连接点A之间;Diode 311, its anode is connected to the power supply pin VDD, its cathode is connected to one end of the first capacitive reactance element, and forms a first connection point A, that is, the diode 311 is connected to the power supply pin VDD and the Between the first connection point A;
所述第一容抗元件的另一端与第一阻抗元件的一端相连,并形成第二连接点B;即所述第一容抗元件连接于所述第一连接点A及第二连接点B之间;所述第一阻抗元件的另一端连接于所述接地管脚VSS;The other end of the first capacitive reactance element is connected to one end of the first impedance element to form a second connection point B; that is, the first capacitive reactance element is connected to the first connection point A and the second connection point B between; the other end of the first impedance element is connected to the ground pin VSS;
所述第二连接点B为该判定电路310的输出端,其为所述延时电路320提供静电放电电压信号。The second connection point B is the output end of the determination circuit 310 , which provides an electrostatic discharge voltage signal for the delay circuit 320 .
优选的,所述第一容抗元件为电容312,所述第一阻抗元件为电阻器313。Preferably, the first capacitive reactance element is a capacitor 312 , and the first impedance element is a resistor 313 .
优选的,所述延时电路320进一步包括:Preferably, the delay circuit 320 further includes:
第二阻抗元件,其第一端点连接至所述电源管脚VDD;a second impedance element, the first terminal of which is connected to the power supply pin VDD;
第二容抗元件,其第一端点连接至所述电源管脚VDD;a second capacitive reactance element, the first terminal of which is connected to the power supply pin VDD;
第一N型MOS晶体管323,其栅极连接至所述判定电路310的输出端,其漏极连接至所述第二阻抗元件的第二端点,其源极连接至所述接地管脚VSS;The first N-type MOS transistor 323, its gate is connected to the output terminal of the determination circuit 310, its drain is connected to the second terminal of the second impedance element, and its source is connected to the ground pin VSS;
第二N型MOS晶体管324,其栅极和漏极连接至所述第二容抗元件的第二端点,其源极连接至所述第二阻抗元件的第二端点;A second N-type MOS transistor 324, the gate and drain of which are connected to the second terminal of the second capacitive element, and the source of which is connected to the second terminal of the second impedance element;
第一P型MOS晶体管325,其栅极和漏极连接至所述第二容抗元件的第二端点,其源极连接至所述第二阻抗元件的第二端点;The first P-type MOS transistor 325, its gate and drain are connected to the second terminal of the second capacitive element, and its source is connected to the second terminal of the second impedance element;
第二P型MOS晶体管326,其栅极连接至所述第二容抗元件的第二端点,其漏极连接至所述接地管脚VSS,其源极连接至所述第二阻抗元件的第二端点;The second P-type MOS transistor 326 has its gate connected to the second terminal of the second capacitive element, its drain connected to the ground pin VSS, and its source connected to the first terminal of the second impedance element. Two endpoints;
所述第二阻抗元件的第二端点为该延时电路320的输出端,其为所述触发电路330提供静电放电电压信号。The second terminal of the second impedance element is the output terminal of the delay circuit 320 , which provides the trigger circuit 330 with an electrostatic discharge voltage signal.
优选的,所述第二阻抗元件为电阻器321,所述第二容抗元件为电容322。Preferably, the second impedance element is a resistor 321 , and the second capacitive reactance element is a capacitor 322 .
优选的,所述触发电路330进一步包括:Preferably, the trigger circuit 330 further includes:
第三P型MOS晶体管331,其栅极连接至所述延时电路320的输出端,其源极连接至所述电源管脚VDD;The third P-type MOS transistor 331, its gate is connected to the output terminal of the delay circuit 320, and its source is connected to the power supply pin VDD;
第三N型MOS晶体管332,其栅极连接至所述延时电路320的输出端,其源极连接至所述接地管脚VSS,其漏极连接至所述第三P型MOS晶体管331的漏极;The third N-type MOS transistor 332, its gate is connected to the output terminal of the delay circuit 320, its source is connected to the ground pin VSS, and its drain is connected to the third P-type MOS transistor 331 Drain;
所述第三N型MOS晶体管332的漏极为该触发电路330的输出端,其为所述钳位电路340提供所述静电放电触发电压信号。The drain of the third N-type MOS transistor 332 is the output terminal of the trigger circuit 330 , which provides the electrostatic discharge trigger voltage signal for the clamping circuit 340 .
优选的,所述钳位电路340为N沟道钳位晶体管341,其栅极连接至所述触发电路330的输出端,其源极连接至所述接地管脚VSS,其漏极连接至所述电源管脚VDD。Preferably, the clamping circuit 340 is an N-channel clamping transistor 341, its gate is connected to the output terminal of the trigger circuit 330, its source is connected to the ground pin VSS, and its drain is connected to the The above-mentioned power supply pin VDD.
所述钳位电路340进一步用于在接收到所述静电放电触发信号后,提供一个电源与地之间的低阻通道,以泄放静电电流,保护内部电路;需要说明的是,此处的N沟道钳位晶体管341可由其他钳位器件代替,例如:可控硅SCR等。The clamping circuit 340 is further used to provide a low-impedance channel between the power supply and the ground after receiving the electrostatic discharge trigger signal to discharge the electrostatic current and protect the internal circuit; it should be noted that the The N-channel clamping transistor 341 can be replaced by other clamping devices, for example: SCR and the like.
以下内容是对所述电源钳位静电放电保护电路的工作原理进行详细描述,其包括在ESD冲击下和电源快速上电时的工作原理:The following content is a detailed description of the working principle of the power supply clamp electrostatic discharge protection circuit, including the working principle under ESD impact and when the power supply is powered on quickly:
当发生ESD冲击式,即突然出现一个电源VDD到地VSS的高压脉冲时,所述第二连接点B的电压上拉到较高电位,第一N型MOS晶体管323导通,并将连接点C下拉到0电位,所述连接点C为电阻器321的第二端点和第二N型MOS晶体管324的源极连接点;再通过第二N型MOS晶体管324将连接点E下拉到较低电位,所述连接点E为所述第二N型MOS晶体管324的栅极和漏极与所述电容322第二端点的连接点,所述连接点C为0电位且连接点D为高电位,则N沟道钳位晶体管341开启,此处的连接点D为所述N沟道钳位晶体管341的栅极与所述第三N型MOS晶体管332的漏极的连接点;短时间后所述第二连接点B变为0电位,所述第一N型MOS晶体管323关断,通过电阻器321对连接点C充电,所述连接点C变为高电平后,连接点D变为低电位,所述N沟道钳位晶体管341关断。其中,第一P型MOS晶体管325与第二P型MOS晶体管326构成电流镜,有效增加连接点C充电时的等效电容,从而增大关断延时。When an ESD impact occurs, that is, when a high-voltage pulse from the power supply VDD to the ground VSS suddenly appears, the voltage of the second connection point B is pulled up to a higher potential, the first N-type MOS transistor 323 is turned on, and the connection point C is pulled down to 0 potential, and the connection point C is the second end point of the resistor 321 and the source connection point of the second N-type MOS transistor 324; then the connection point E is pulled down to a lower level by the second N-type MOS transistor 324 potential, the connection point E is the connection point between the gate and drain of the second N-type MOS transistor 324 and the second terminal of the capacitor 322, the connection point C is 0 potential and the connection point D is a high potential , then the N-channel clamp transistor 341 is turned on, and the connection point D here is the connection point between the gate of the N-channel clamp transistor 341 and the drain of the third N-type MOS transistor 332; after a short time The second connection point B becomes 0 potential, the first N-type MOS transistor 323 is turned off, and the connection point C is charged through the resistor 321. After the connection point C becomes high level, the connection point D becomes is low, the N-channel clamp transistor 341 is turned off. Wherein, the first P-type MOS transistor 325 and the second P-type MOS transistor 326 form a current mirror, which effectively increases the equivalent capacitance when the connection point C is charged, thereby increasing the turn-off delay.
另一方面,当快速上电(设上升时间为100ns)时,由于电阻器313和电容312耦合的时间常数很小(约20ns),且二极管311承受一部分压降(约为其导通电压),从而保证连接点B的电压不会被上拉到较高电位,此时第一N型MOS晶体管323关断;同时,电源管脚VDD通过并联的电阻器321与电容322,将连接点C上拉到高电平,此时所述连接点D为0电位,所述N沟道钳位晶体管341关断。On the other hand, when the power is turned on quickly (assuming that the rise time is 100ns), the time constant of the coupling between the resistor 313 and the capacitor 312 is very small (about 20ns), and the diode 311 bears a part of the voltage drop (about its turn-on voltage) , so as to ensure that the voltage at the connection point B will not be pulled up to a higher potential, and at this time the first N-type MOS transistor 323 is turned off; at the same time, the power supply pin VDD connects the connection point C to pull up to high level, at this time the connection point D is at 0 potential, and the N-channel clamping transistor 341 is turned off.
下面,将利用电路仿真工具HSPICE分别对图1和图3中的电源钳位静电放电保护电路进行仿真,本次仿真基于标准CMOS130nm工艺库。Next, the circuit simulation tool HSPICE will be used to simulate the power supply clamp electrostatic discharge protection circuit in Figure 1 and Figure 3 respectively. This simulation is based on the standard CMOS130nm process library.
首先对两个电路的ESD性能进行仿真,图4(a)、(b)分别是图1、图2中两种ESD保护电路在ESD脉冲作用下的仿真结果;用峰值为2V,上升时间为5ns的方波模拟ESD电压;可以看出,在延时电路的时间常数都取为500ns时,本发明实施例中ESD保护电路仍能获得更大的延时。First, simulate the ESD performance of the two circuits. Figure 4 (a) and (b) are the simulation results of the two ESD protection circuits in Figure 1 and Figure 2 under the action of ESD pulses; the peak value is 2V, and the rise time is A square wave of 5 ns simulates the ESD voltage; it can be seen that when the time constants of the delay circuits are all taken as 500 ns, the ESD protection circuit in the embodiment of the present invention can still obtain a greater delay.
再对两个电路的应对快速上电的情形进行仿真,图5(a)、(b)分别是图1、图3中两种ESD保护电路在电源快速上电情况下的仿真结果;设电源电压峰值1.2V,上升时间100ns;可以看出,如图1的现有技术中ESD电路明显会引起误触发,而本发明实施例中的ESD保护电路能保证较好的关断,避免误触发。Then simulate the situation of the two circuits in response to fast power-on. Figure 5 (a) and (b) are the simulation results of the two ESD protection circuits in Figure 1 and Figure 3 under the condition of fast power-on; The peak voltage is 1.2V, and the rise time is 100ns; it can be seen that the ESD circuit in the prior art shown in Figure 1 will obviously cause false triggering, but the ESD protection circuit in the embodiment of the present invention can ensure better shutdown and avoid false triggering .
本发明通过提供一种电源钳位静电放电保护电路,该保护电路将判断电路和延时电路分开,避免了快速上电可能引起的钳位电路误触发,同时,在静电放电冲击时能够使所述钳位电路获得更长的开启时间,提高静电放电保护的可靠性。The present invention provides a power supply clamp electrostatic discharge protection circuit, which separates the judgment circuit from the delay circuit, avoids false triggering of the clamp circuit that may be caused by fast power-on, and at the same time, can make all The above clamp circuit obtains a longer turn-on time and improves the reliability of electrostatic discharge protection.
以上实施方式仅用于说明本发明,而并非对本发明的限制,有关技术领域的普通技术人员,在不脱离本发明的精神和范围的情况下,还可以做出各种变化和变型,因此所有等同的技术方案也属于本发明的范畴,本发明的专利保护范围应由权利要求限定。The above embodiments are only used to illustrate the present invention, but not to limit the present invention. Those of ordinary skill in the relevant technical field can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, all Equivalent technical solutions also belong to the category of the present invention, and the scope of patent protection of the present invention should be defined by the claims.
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CN104332976B (en) * | 2014-11-20 | 2017-05-17 | 辽宁大学 | High voltage compatible with electrostatic discharge power supply clamp circuit of integrated circuit |
CN105470938B (en) * | 2016-01-25 | 2018-04-06 | 珠海全志科技股份有限公司 | A kind of power clamp circuit for extending the electrostatic leakage time |
CN105680433B (en) * | 2016-03-24 | 2018-01-26 | 北京大学 | A kind of ESD power clamp protection circuit |
US10734806B2 (en) * | 2016-07-21 | 2020-08-04 | Analog Devices, Inc. | High voltage clamps with transient activation and activation release control |
CN106533419B (en) * | 2016-10-12 | 2022-11-01 | 格科微电子(上海)有限公司 | ESD protection circuit and clock path of MIPI interface |
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CN107732888A (en) * | 2017-10-19 | 2018-02-23 | 丹阳恒芯电子有限公司 | A kind of high performance ESD protection circuit in Internet of Things |
CN110120659B (en) * | 2018-02-06 | 2021-05-18 | 联发科技股份有限公司 | Electrostatic discharge protection device |
CN110518561B (en) * | 2019-07-26 | 2020-10-16 | 北京大学 | Power clamp ESD protection circuit and integrated circuit structure |
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