CN103065913A - Repair method for plasma panel low-discharging defects - Google Patents
Repair method for plasma panel low-discharging defects Download PDFInfo
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- CN103065913A CN103065913A CN2012105878742A CN201210587874A CN103065913A CN 103065913 A CN103065913 A CN 103065913A CN 2012105878742 A CN2012105878742 A CN 2012105878742A CN 201210587874 A CN201210587874 A CN 201210587874A CN 103065913 A CN103065913 A CN 103065913A
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Abstract
The invention discloses a repair method for plasma panel low-discharging defects, and relates to a production process of plasma panels. The repair method for the plasma panel low-discharging defects can reduce waste effectively and save cost. The repair method for the plasma panel low-discharging defects is characterized by being arranged between a sealing and exhausting process and a module process. The repair method for the plasma panel low-discharging defects comprises the following process steps: step1, first burn-in is carried out on a panel; step2, users detect whether a low-discharging phenomenon exists in the panel, and if the low-discharging phenomenon exists in the panel, step3 is carried out, or the subsequent module process is carried out; step3, secondary burn-in is carried out on the panel and step4 is carried out; and step4, the users detect whether the low-discharging phenomenon still exists in the panel, and if the low-discharging phenomenon exists in the panel, the panel is scrapped, or the subsequent module process is carried out.
Description
Technical field
The present invention relates to the production technology of plasma panel, the method that especially article on plasma display screen low discharge is repaired in the production process.
Background technology
At present; the manufacture craft of plasma panel (referred to as screen) has reached the requirement that a large amount of generations are produced; the process of the front dielectric insulation layer of making (FD) that extensively adopts in present industry, rear dielectric insulation layer (RD), storage barrier (BR), fluorescent material (PH), MgO protective layer is at first to use the substrate of spraying process operation processing before glass to spray one deck slurry; form protective medium, storage barrier or the luminescent phosphor that we need by operations such as drying, sintering, then realize the making of MgO by evaporation.In the production process of these operations, can produce inevitably the defective of uneven thickness, this type of defective may cause screen to occur the low discharge defective when lighting.Be the control product quality, improve the product yields, just need to check and repair these defectives.Check that reparing process mainly comprises: visual examination, defect review and defect repair.
The low discharge defective that existing low discharge renovation technique occurs mainly for the rear display screen of plasma assembling of screen after the assembling module, apply certain voltage and carry out brightness adjustment by keep electrode, scan electrode and the addressing electrode of the module on the display screen after the article on plasma assembling at the PDP display unit, when low discharge appears in screen, adjust the waveform of described voltage and finish the low discharge reparation, for example change the time location of described voltage waveform medium-high frequency waveform and repair.The method can only be debugged reparation to the drive circuit that causes low discharge can not solve the low discharge defective that this body structure of screen causes, in case determine to scrap processing by shielding this plasma electric to be regarded as when this body structure causes low discharge.
The said module operation of this paper adds the assemblies such as drive circuit unit, complete machine backboard for screen exactly, makes it become a plasma assembling display screen that can show various picture images.Described envelope row operation refers to the plasma panel front-back baseboard is carried out sealing-in, discharges simultaneously the air between the front-back baseboard, injects the processes such as discharge gas.
Summary of the invention
The objective of the invention is for the deficiencies in the prior art, provide a kind of and can effectively reduce waste, the method for cost-effective plasma panel low discharge defect repair.
The restorative procedure of a kind of plasma panel low discharge defective disclosed by the invention is such: comprise following processing step between the envelope of plasma panel row's operation and module operation:
Step 1: screen is carried out for the first time ageing: in the unit lattice of screen, apply the first waveform voltage between electrode and the scan electrode keeping of homonymy, applying the second waveform voltage between electrode and the scan electrode keeping of offside; Described the first waveform voltage is the waveform that positive pulse and negative pulse alternately occur, be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each positive pulse, and the waveform of the negative pulse in the first waveform voltage is the waveform that described positive pulse is passed through gained behind X-axis mirror image, the Y-axis mirror image successively; The second waveform voltage is all identical with amplitude and the cycle of the first waveform voltage, and phase difference is 180 °;
Step 2: detect screen and whether have the low discharge phenomenon: if exist, execution in step 3, otherwise enter follow-up module operation;
Step 3: carry out again seasoned to screen: in the unit lattice of screen, apply the 3rd waveform voltage between electrode and the scan electrode keeping of homonymy, applying the 4th waveform voltage between electrode and the scan electrode keeping of offside; Described the 3rd waveform voltage is the waveform that positive pulse and negative pulse alternately occur, and be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each pulse, and the waveform of the negative pulse in the 3rd waveform voltage passes through the waveform of gained behind X-axis mirror image, the Y-axis mirror image successively for its positive pulse; Described the 3rd waveform voltage is all identical with the 4th waveform voltage amplitude and cycle, and phase difference is 180 °; And the positive peak of the sine wave of each pulse or quasi-sine-wave is higher than the sine wave of first each pulse of waveform voltage or the positive peak of quasi-sine-wave in the 3rd waveform voltage, the negative peak of the sine wave of each pulse or quasi-sine-wave is lower than the sine wave of first each pulse of waveform voltage or the negative peak of quasi-sine-wave in the 3rd waveform voltage, and the rise time of each pulse is shorter than the rise time of each pulse in the first waveform voltage in the 3rd waveform voltage; Then execution in step 4;
Step 4: detect screen and whether still have the low discharge phenomenon: if exist, screen is scrapped, otherwise entered follow-up module operation.
Preferably, each pulse in described the first waveform voltage: the rise time is 500 ~ 700ns, and the positive peak of the quasi-sine-wave in the rise time is less than 20% of continuous voltage, and the absolute value of the quasi-sine-wave negative peak in the rise time is 20% of continuous voltage; Duty ratio is 20 ~ 25%, and continuous voltage is 230 ~ 340V; Be 900 ~ 1100ns fall time, has sine wave or the quasi-sine-wave at least one cycle behind trailing edge, and the absolute value of the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave is less than 10% of continuous voltage.
Preferably, described the first waveform electric voltage frequency is 30K ~ 35KHz, and the described first time, seasoned time remaining was 4 ~ 5 hours.
Preferably, each pulse in described the 3rd waveform voltage: the rise time is 300 ~ 600ns, and the positive peak of the quasi-sine-wave in the rise time is 25 ~ 35% of continuous voltage, and the absolute value of the quasi-sine-wave negative peak in the rise time is 25 ~ 45% of continuous voltage; Duty ratio is 20 ~ 25%, and continuous voltage is 240 ~ 370V; Be 900 ~ 1100ns fall time, has sine wave or the quasi-sine-wave at least one cycle behind trailing edge, and the absolute value of the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave is less than 10% of continuous voltage.
Preferably, the 3rd waveform voltage frequency is 30K ~ 45KHz, described again seasoned time remaining 2 ~ 3 hours.
Preferably, low discharge detection method in described step 2 and the step 4 is the detection method of lighting a lamp, comprise: use detector to make screen luminous, judge that there is the low discharge phenomenon in screen when screen is upper when occurring with respect to the darker cell in normal region or cell that can not be luminous.
Preferably, in described step 2 and step 4, when there is not the low discharge phenomenon in screen, at first according to judging the grade of screen in the photoelectric characteristic of screen of lighting a lamp when checking, and then enter follow-up module operation.
In sum, owing to adopted technique scheme, the invention has the beneficial effects as follows:
Low discharge defect-restoration method therefor of the present invention module behind screen envelope row row that advances can not cause damage to other structures, the especially drive circuit on the screen after the module operation, thereby reduce the waste of other materials.
On the other hand, restorative procedure of the present invention has increased the again step of ageing, has reduced screen because the scrappage of low discharge defective has improved efficient, has saved cost.
Description of drawings
Examples of the present invention will be described by way of reference to the accompanying drawings, wherein:
Fig. 1 is restorative procedure flow chart of the present invention.
Fig. 2 adopts the inventive method to carry out the state of a cell shielding in the low discharge defect repair process.
Fig. 3 is a specific embodiment of the first waveform voltage among the present invention.
Fig. 4 is a specific embodiment of the 3rd waveform voltage among the present invention.
Mark among the figure: 1 is front glass substrate; 2 is rear glass substrate; 3 is dielectric layer; 4 is the MgO protective layer; 5 is scan electrode; 6 for keeping electrode; 7 is addressing electrode; 8 is phosphor powder layer; 9 are the storage barrier; 10 is plasma.
Embodiment
Disclosed all features in this specification, or the step in disclosed all methods or the process except mutually exclusive feature and/or step, all can make up by any way.
Disclosed arbitrary feature in this specification (comprising any accessory claim, summary and accompanying drawing) is unless special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, unless special narration, each feature is an example in a series of equivalences or the similar characteristics.
Such as Fig. 1, the restorative procedure of a kind of plasma panel low discharge defective disclosed by the invention is such: comprise following processing step between the envelope of plasma panel row's operation and module operation:
Step 1: screen is carried out the ageing first time: such as Fig. 2, can find out that each side arranging one on the front glass substrate 1 of each cell keeps electrode 6 and scan electrode 5.When carrying out ageing, in the unit lattice of screen, apply the first waveform voltage keeping between electrode 6 and the scan electrode 5 of homonymy, applying the second waveform voltage between electrode and the scan electrode keeping of offside.Described the first waveform voltage is the waveform that positive pulse and negative pulse alternately occur, be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each positive pulse, and the waveform of the negative pulse in the first waveform voltage is the waveform that described positive pulse is passed through gained behind X-axis mirror image, the Y-axis mirror image successively; The second waveform voltage is all identical with amplitude and the cycle of the first waveform voltage, phase difference is 180 °, that is to say that putting on the voltage that cell one side keeps between electrode and the scan electrode keeps voltage delay half period between electrode and the scan electrode with respect to opposite side;
Step 2: detect screen and whether have the low discharge phenomenon: if exist, execution in step 3, otherwise enter follow-up module operation;
Step 3: carry out again seasoned to screen: in the unit lattice of screen, apply the 3rd waveform voltage between electrode and the scan electrode keeping of homonymy, applying the 4th waveform voltage between electrode and the scan electrode keeping of offside; Described the 3rd waveform voltage is the waveform that positive pulse and negative pulse alternately occur, and be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each pulse, and the waveform of the negative pulse in the 3rd waveform voltage passes through the waveform of gained behind X-axis mirror image, the Y-axis mirror image successively for its positive pulse; Described the 3rd waveform voltage is all identical with the 4th waveform voltage amplitude and cycle, and phase difference is 180 °; And the positive peak of the sine wave of each pulse or quasi-sine-wave is higher than the sine wave of first each pulse of waveform voltage or the positive peak of quasi-sine-wave in the 3rd waveform voltage, the negative peak of the sine wave of each pulse or quasi-sine-wave is lower than the sine wave of first each pulse of waveform voltage or the negative peak of quasi-sine-wave in the 3rd waveform voltage, and the rise time of each pulse is shorter than the rise time of each pulse in the first waveform voltage in the 3rd waveform voltage; Then execution in step 4;
Step 4: detect screen and whether still have the low discharge phenomenon: if exist, screen is scrapped, otherwise entered follow-up module operation.
The one-period specific embodiment of the first waveform voltage as described in such as Fig. 3 being: each cycle comprises positive negative pulse stuffing.Take positive pulse as example, 1. its rise time is 500 ~ 700ns, the positive peak of the quasi-sine-wave in the rise time 5. less than continuous voltage 3. 20%, quasi-sine-wave negative peak absolute value 4. in rise time is 20% of continuous voltage, because being the sine-wave superimposed by a plurality of single-frequency ingredient standards, here " sine wave " form, therefore its positive peak is not identical with the exhausted degree value of negative peak, therefore in the text this type of is obtained " sine wave " by a plurality of different standard sine waves stacks and be defined as quasi-sine-wave, the sine wave in the corresponding literary composition should be understood to the standard sine wave of a single-frequency composition; Duty ratio is 20 ~ 25%, and continuous voltage is 230 ~ 340V; 2. be 900 ~ 1100ns fall time, has sine wave or the quasi-sine-wave at least one cycle behind trailing edge, and the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave absolute value 6. are less than 10% of continuous voltage.From Fig. 3, we can find out that the negative pulse waveform in the cycle just in time is that the positive pulse ripple is through the waveform reach take Y-axis as the symmetry axis mirror image take X-axis as symmetry axis axle mirror image after.Positive peak described here is true amplitude maximum in one-period sine wave or the quasi-sine-wave, and negative peak is negative amplitude minimum in one-period sine wave or the quasi-sine-wave.
Such as Fig. 4, the specific embodiment of described the 3rd waveform voltage one-period: each cycle comprises positive negative pulse stuffing.Take positive pulse as example, 1. the rise time is 300 ~ 600ns, the positive peak of the quasi-sine-wave in the rise time 5. be continuous voltage 3. 25 ~ 35%, the quasi-sine-wave negative peak absolute value 4. in the rise time is 25 ~ 45% of continuous voltage; Duty ratio is 20 ~ 25%, and continuous voltage is 240 ~ 370V; 2. be 900 ~ 1100ns fall time, has sine wave or the quasi-sine-wave at least one cycle behind trailing edge, and the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave absolute value 6. are less than 10% of continuous voltage.From Fig. 4, we can find out that the negative pulse waveform in the cycle just in time is that the positive pulse ripple is through the waveform reach take Y-axis as the symmetry axis mirror image take X-axis as symmetry axis axle mirror image after.
In another embodiment of the present invention, described the first waveform electric voltage frequency is 30K ~ 35KHz, and the described first time, seasoned time remaining was 4 ~ 5 hours.The 3rd waveform voltage frequency is 30K ~ 45KHz, described again seasoned time remaining 2 ~ 3 hours.Low discharge detection method in described step 2 and the step 4 be the detection method of lighting a lamp, and comprising: use detector to make screen luminous, judge to shield when occurring with respect to the darker cell in normal region or cell that can not be luminous and have the low discharge phenomenon when screen is upper.
In another embodiment of the present invention, in described step 2 and step 4, when there is not the low discharge phenomenon in screen, at first according to judging the grade of screen in the photoelectric characteristic of screen of lighting a lamp when checking, and then enter follow-up module operation.
Grade judgement to the detection of screen low discharge and screen all belongs to this area technological means commonly used, is not described in detail in this its detailed process.
Such as Fig. 2, the present invention the screen of low discharge occurs for the first time behind the ageing Principles is such: when at scan electrode Scanning Electrode and keep again to apply between the electrode Sustain Electrode and be higher than for the first time high voltage of ageing voltage, impel MgO and discharge gas to excite secondary electron, the secondary electron transition discharges ultraviolet energy, and the ultraviolet energy excitated fluorescent powder sends the visible light of itself.Ageing helps fully to activate the physical property on MgO surface again, reaches stable after it is caught fire, and the cell that can low discharge occur to fail " activation " in the ageing process in the first time is effectively repaired, and reduces the scrappage of screen.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature or any new combination that discloses in this manual, and the arbitrary new method that discloses or step or any new combination of process.
Claims (7)
1. the restorative procedure of a plasma panel low discharge defective is characterized in that, arranges in the envelope of plasma panel to comprise following processing step between operation and the module operation:
Step 1: screen is carried out for the first time ageing: in the unit lattice of screen, apply the first waveform voltage between electrode and the scan electrode keeping of homonymy, applying the second waveform voltage between electrode and the scan electrode keeping of offside; Described the first waveform voltage is the waveform that positive pulse and negative pulse alternately occur, be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each positive pulse, and the waveform of the negative pulse in the first waveform voltage is the waveform that described positive pulse is passed through gained behind X-axis mirror image, the Y-axis mirror image successively; The second waveform voltage is all identical with amplitude and the cycle of the first waveform voltage, and phase difference is 180 °;
Step 2: detect screen and whether have the low discharge phenomenon: if exist, execution in step 3, otherwise enter follow-up module operation;
Step 3: carry out again seasoned to screen: in the unit lattice of screen, apply the 3rd waveform voltage between electrode and the scan electrode keeping of homonymy, applying the 4th waveform voltage between electrode and the scan electrode keeping of offside; Described the 3rd waveform voltage is the waveform that positive pulse and negative pulse alternately occur, and be superimposed with sine wave or the quasi-sine-wave at least one cycle on the rising edge of each pulse, and the waveform of the negative pulse in the 3rd waveform voltage passes through the waveform of gained behind X-axis mirror image, the Y-axis mirror image successively for its positive pulse; Described the 3rd waveform voltage is all identical with the 4th waveform voltage amplitude and cycle, and phase difference is 180 °; And the positive peak of the sine wave of each pulse or quasi-sine-wave is higher than the sine wave of first each pulse of waveform voltage or the positive peak of quasi-sine-wave in the 3rd waveform voltage, the negative peak of the sine wave of each pulse or quasi-sine-wave is lower than the sine wave of first each pulse of waveform voltage or the negative peak of quasi-sine-wave in the 3rd waveform voltage, and the rise time of each pulse is shorter than the rise time of each pulse in the first waveform voltage in the 3rd waveform voltage; Then execution in step 4;
Step 4: detect screen and whether still have the low discharge phenomenon: if exist, screen is scrapped, otherwise entered follow-up module operation.
2. method according to claim 1, it is characterized in that, each pulse in described the first waveform voltage: the rise time is 500 ~ 700ns, and the positive peak of the quasi-sine-wave in the rise time is less than 20% of continuous voltage, and the absolute value of negative peak is 20% of continuous voltage; Duty ratio is 20 ~ 25%, and continuous voltage is 230 ~ 340V; Be 900 ~ 1100ns fall time, is superimposed with sine wave or the quasi-sine-wave at least one cycle after trailing edge finishes, and the absolute value of the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave is less than 10% of continuous voltage.
3. method according to claim 2 is characterized in that, described the first waveform electric voltage frequency is 30K ~ 35KHz, and seasoned time remaining is 4 ~ 5 hours for the first time.
4. method according to claim 1 and 2, it is characterized in that, each pulse in described the 3rd waveform voltage: the rise time is 300 ~ 600ns, and the positive peak of the quasi-sine-wave in the rise time is 25 ~ 35% of continuous voltage, and the absolute value of negative peak is 25 ~ 45% of continuous voltage; Duty ratio is 20 ~ 25%, and continuous voltage is 240 ~ 370V; Be 900 ~ 1100ns fall time, is superimposed with sine wave or the quasi-sine-wave at least one cycle behind trailing edge, and the absolute value of the sine wave behind the described trailing edge or the negative peak of quasi-sine-wave is less than 10% of continuous voltage.
5. method according to claim 4 is characterized in that, the 3rd waveform voltage frequency is 30K ~ 45KHz, described again seasoned time remaining 2 ~ 3 hours.
6. method according to claim 1, it is characterized in that, low discharge detection method in described step 2 and the step 4 is the detection method of lighting a lamp, comprise: use detector to make screen luminous, judge that there is the low discharge phenomenon in screen when screen is upper when occurring with respect to the darker cell in normal region or cell that can not be luminous.
7. method according to claim 4 is characterized in that, in described step 2 and step 4, when there is not the low discharge phenomenon in screen, at first according to judging the grade of screen in the photoelectric characteristic of screen of lighting a lamp when checking, and then enters follow-up module operation.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111415594A (en) * | 2020-04-08 | 2020-07-14 | 吴勇建 | Plasma display capable of realizing voltage stabilizing circuit |
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| US6340866B1 (en) * | 1998-02-05 | 2002-01-22 | Lg Electronics Inc. | Plasma display panel and driving method thereof |
| CN101241673A (en) * | 2008-03-07 | 2008-08-13 | 南京华显高科有限公司 | Experienced driving method for plasma display screen |
| CN101251974A (en) * | 2008-03-14 | 2008-08-27 | 南京华显高科有限公司 | Ageing drive method of plasma display screen |
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| CN111415594A (en) * | 2020-04-08 | 2020-07-14 | 吴勇建 | Plasma display capable of realizing voltage stabilizing circuit |
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