CN103063961B - Single event effect testing device and system - Google Patents
Single event effect testing device and system Download PDFInfo
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- CN103063961B CN103063961B CN201210590234.7A CN201210590234A CN103063961B CN 103063961 B CN103063961 B CN 103063961B CN 201210590234 A CN201210590234 A CN 201210590234A CN 103063961 B CN103063961 B CN 103063961B
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- 230000000694 effects Effects 0.000 title claims abstract description 39
- 239000002245 particle Substances 0.000 claims abstract description 62
- 238000009434 installation Methods 0.000 claims description 44
- 230000005855 radiation Effects 0.000 claims description 29
- 238000006073 displacement reaction Methods 0.000 claims description 6
- 239000007787 solid Substances 0.000 claims description 6
- 238000004088 simulation Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000005086 pumping Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 3
- 239000002699 waste material Substances 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005510 radiation hardening Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
The invention discloses a single event effect testing device and a system, wherein the testing device comprises: rotary mechanism and with the test mother board that rotary mechanism links to each other, be provided with a plurality of test daughter boards on the test mother board, wherein: each test daughter board is used for mounting a device to be tested; the rotating mechanism is used for acquiring a control request and driving the test mother board to rotate or stop according to the control request, so that each test daughter board receives high-energy charged particles radiated by the accelerator towards a fixed direction. In the test device, the number of the test daughter boards and the number of the tested devices are increased, the times of replacing the tested devices are reduced, and the problems that in the prior art, the operation is complex due to the fact that the tested devices need to be frequently replaced, and the resources of the accelerator are wasted when the tested devices are replaced for vacuumizing operation at every time are solved.
Description
Technical field
The present invention relates to Space Radiation Effects modelling technique field, relate to a kind of single particle effect proving installation and system in particular.
Background technology
There is many high energy charged particles in space environment; and the various aircraft such as spacecraft, satellite usually can because of the radiation of these high energy charged particles when running in cosmic space; produce various fault, the fault caused by single particle effect in various fault accounts for major portion.
Single particle effect refers to that single high energy particle and the semiconductor devices state of bringing out device that interacts changes, even causes a kind of phenomenon of permanent damage, and single particle effect affects reliability and the serviceable life of various aircraft.
Therefore, how the single particle effect of the electronic devices and components of aircraft is tested, thus certain radiation hardening measure can be taked, improve its reliability, become the emphasis that people study day by day.
By carrying out single particle effect ground simulation test to measured device in prior art, study its regular and dependence factor, for aircraft radiation hardening technology provides reference.
Single particle effect ground simulation test needs to carry out under vacuum conditions, when carrying out single particle effect simulation test, measured device is needed to be placed in test board, test board is placed in vacuum cavity, and is fixed on accelerator test platform, then vacuumizes vacuum cavity, under radiation environment, produce high energy charged particles by accelerator, be radiated on the measured device of test board, in irradiation process, measured device detected in real time.But existing this test mode, the measured device that test board can be placed is limited, and all need when changing the measured device on test board to carry out vacuum pumping to vacuum cavity at every turn, in vacuum, the resource of accelerator is not utilized, therefore, when measured device quantity is more, add number of operations, make complex operation, and waste the resource of accelerator.
Summary of the invention
In view of this, the invention provides a kind of single particle effect proving installation and system, for solving the problem of the resource of complex operation and waste accelerator in prior art.
For achieving the above object, the invention provides following technical scheme:
A kind of single particle effect proving installation, comprising: rotating mechanism and the test motherboard be connected with described rotating mechanism, described test motherboard is provided with multiple test daughter board, wherein:
Each test daughter board is for installing measured device;
Described rotating mechanism for obtaining the request of control, and drives described test motherboard to rotate according to control request or stops, and makes each test daughter board receive the high energy charged particles of accelerator towards the radiation of fixed-direction institute.
Preferably, controling parameters is carried in described control request, described controling parameters comprises: time parameter, speed parameter, direction parameter and displacement parameter, then the concrete control request according to carrying controling parameters of described rotating mechanism drives described test motherboard to rotate or stopping according to described controling parameters.
Preferably, the described rotating mechanism control module that comprises rotating shaft, be arranged on the performance element in rotating shaft and be connected with described performance element;
Described test motherboard is specifically connected with described performance element;
Described control module, specifically for driving described performance element around described axis of rotation or stopping according to control request, rotates to drive described test motherboard or stops.
Preferably, also comprise the shell be provided with towards the irradiation mouth in described radiation from machine direction, described shell is used for being connected with rotating mechanism, and described test motherboard and described test daughter board is covered.
Preferably, also comprise bearing and web member, described bearing outer ring is connected with described shell, is fixed by described shell; Described bearing inner race is connected with described test motherboard by web member, rotates or stop together with described test motherboard.
Preferably, described rotating mechanism adopts closed loop step motor control system or servo control system.
Preferably, described test daughter board by connector vertical be inserted on described test motherboard, form polygonal solid structure.
Preferably, described test motherboard is circular configuration.
Preferably, described bearing is for intersecting ball bearing.
A kind of single particle effect test macro, comprise the proving installation described in above-mentioned any one, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on described accelerator test platform, and is positioned in the radiation direction of described accelerator.
Known via above-mentioned technical scheme, compared with prior art, present disclosure provides a kind of single particle effect proving installation and system, comprise at this proving installation: rotating mechanism and the test motherboard be connected with rotating mechanism, described test motherboard is provided with multiple test daughter board, by measured device being arranged on test daughter board, rotating mechanism drives test motherboard rotate or stop according to control request, makes each test daughter board receive the high energy charged particles of accelerator towards fixed-direction radiation.In this proving installation, test motherboard is driven by rotating mechanism, make it possible on test motherboard, arrange polylith test daughter board, thus increase the quantity of test daughter board, and then add the quantity of measured device, decrease the number of times changing measured device, solve in prior art, the problem making complex operation owing to needing to change measured device frequently, and each measured device of changing carries out the problem that the resource of accelerator is wasted in vacuum pumping.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to the accompanying drawing provided.
Fig. 1 is the plan structure schematic diagram of an embodiment of a kind of single particle effect proving installation of the present invention;
Fig. 2 is the plan structure schematic diagram of another embodiment of a kind of single particle effect proving installation of the present invention;
Fig. 3 is the A-A face sectional structure schematic diagram of another embodiment of a kind of single particle effect proving installation of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Present disclosure provides a kind of single particle effect proving installation and system, comprise at this proving installation: rotating mechanism and the test motherboard be connected with described rotating mechanism, described test motherboard is provided with multiple test daughter board, wherein: by measured device being arranged on test daughter board, and driving test motherboard rotate or stop by rotating mechanism according to control request, each test daughter board receives the high energy charged particles of accelerator towards fixed-direction radiation.In this proving installation, test motherboard is driven by rotating mechanism, make it possible to arrange multiple test daughter board on test motherboard, and then increase the quantity of test daughter board, thus add the quantity of measured device, decrease the number of times changing measured device, solve in prior art, the problem making complex operation owing to needing to change measured device frequently, and each measured device of changing carries out the problem that the resource of accelerator is wasted in vacuum pumping.
See Fig. 1, show the plan structure schematic diagram of a kind of single particle effect proving installation of the present invention.
Composition graphs 1, this proving installation can comprise: rotating mechanism 100 tests motherboard 101, test daughter board 102, wherein:
Described test motherboard 101 is provided with multiple test daughter board 102;
Described rotating mechanism 100 is connected with described test motherboard 101;
Each test daughter board 102 is for installing measured device 102A;
Wherein, described test motherboard is provided with multiple test daughter board, each test daughter board all can be used for installing measured device 102A;
Described rotating mechanism 100 for obtaining the request of control, and drives described test motherboard 101 rotate or stop according to control request, makes each test daughter board 102 receive the high energy charged particles that accelerator produces towards fixed-direction.
Wherein, described rotating mechanism can have multiple way of realization, controls to ask by obtaining and drives described test motherboard rotate or stop.
Wherein, described control request can be produced into by the inner corresponding program of rotating mechanism; Also this rotating mechanism is sent to after generating by the computing equipment of outside or system;
Wherein, described control request can comprise rotates the request of control and stops controlling request, and described rotation control request can make this rotating mechanism rotate, and described stopping control request can make this rotating mechanism stop;
In this proving installation, described rotating mechanism can drive according to different control requests described test motherboard to rotate or stop, concrete, first can control request according to rotation drives described test motherboard to rotate, when turning to a certain position, the test daughter board being in this position can be made to receive the high energy charged particles accelerated towards fixed-direction radiation, then controlling request according to stopping drives described test motherboard to stop, after the measured device on the test daughter board being positioned at this position completes single particle effect test, rotating mechanism controls request according to rotation again and drives test motherboard to rotate, until the measured device on described test daughter board all can complete single particle effect test.
It should be noted that, the position of the time that rotating mechanism drives test motherboard to rotate and stopping all being arranged by internal processes or external system program, make this rotating mechanism described test motherboard periodically can be driven to rotate or stop, the measured device that the difference on this test motherboard is tested on daughter board all can carry out single particle effect test.
Wherein, described test daughter board can be inserted on described test motherboard by connector, and the number of its plug-in mounting and position are not concrete to be limited;
Wherein, what test daughter board can be vertical is inserted on test motherboard, forms polygonal solid structure;
It should be noted that, the size of test daughter board does not have concrete regulation, and test daughter board can select different sizes according to the size of proving installation; Therefore, the quantity of the measured device that each test daughter board is installed also is not particularly limited, and according to the test size of daughter board and the size of measured device itself, test daughter board can be installed the measured device of suitable quantity.
It should be noted that, the shape of test motherboard and size are not concrete yet to be limited, and according to test daughter board plug-in mounting position and the difform test motherboard of structure choice, also can select satisfactory test motherboard according to the size of accelerator test platform;
Wherein, test motherboard can be designed to circular configuration, ensures the maximization at rotating range build-in test motherboard area.
As a specific embodiment, be set to circular configuration to test motherboard, it is provided with 12 test daughter boards is example, can be as shown in Figure 1, test motherboard 101 arranges 12 test daughter boards 102, every block test daughter board 102 all installs measured device 102A, and wherein, what test daughter board was vertical is inserted on test motherboard, 12 pieces of test daughter boards join end to end, adjacent two test daughter boards can shape at an angle of 90, relative two test daughter boards are parallel to each other, and form polygonal solid structure; Certainly also have other way of realization, this is no longer going to repeat them.
In the present embodiment, rotating mechanism is connected with test motherboard, test motherboard is provided with multiple test daughter board, measured device is arranged on test daughter board, drive test motherboard rotate or stop by rotating mechanism, make the measured device on each test daughter board all can receive the high energy charged particles of accelerator towards fixed-direction radiation.Because this proving installation can rotate, therefore multiple test daughter board can be set, thus increase the quantity of the measured device be arranged on test daughter board, making, when carrying out single particle effect test, to decrease the number of times changing measured device, solving in prior art, due to the measured device limited amount tested at every turn, needs are frequently changed measured device and make the problem of complex operation, and carry out vacuum pumping during each replacing measured device, waste the problem of the resource of accelerator.
Described control request can carry controling parameters, and described rotating mechanism can drive according to the control request of carrying controling parameters described test motherboard to rotate or stop;
Wherein, described controling parameters comprises: time parameter, speed parameter, direction parameter and displacement parameter;
Time parameter can comprise the stand-by time of rotating mechanism, when also namely rotating mechanism drives test motherboard periodically to carry out rotating and stopping, often rotating the schedule time once namely stopped afterwards; Thus after test daughter board is provided with measured device, the measured device on each test daughter board all can receive the radiation of accelerator.The time that this stand-by time can be carried out needed for single particle effect test according to measured device sets;
Speed parameter can comprise rotating mechanism rotate time velocity amplitude or accekeration, can make described rotating mechanism average rate rotate or accelerate rotate.
Direction parameter can comprise the rotation direction of rotating mechanism, such as rotates clockwise or rotates counterclockwise;
Displacement parameter can comprise the rotation displacement of rotating mechanism, and when rotating mechanism turns to a certain ad-hoc location according to described displacement parameter, then the test daughter board being in a certain ad-hoc location receives the high energy charged particles of accelerator towards fixed-direction radiation.
According to above-mentioned controling parameters, described rotating mechanism can according to this controling parameters, drive described test motherboard to rotate or stop, after the measured device on a test daughter board completes single particle effect test, rotating mechanism can drive this test motherboard to rotate again, next test daughter board is stopped in precalculated position, receives the high energy charged particles of radiation from machine.
In this proving installation, rotating mechanism is for obtaining the control request of carrying different controling parameters, and according to carrying the control request of controling parameters, drive described test motherboard with a certain fixing speed or acceleration, and turn to a certain specific position along a certain specific direction and then stop operating, make the measured device be positioned on the test daughter board of this ad-hoc location can receive the high energy charged particles of accelerator towards fixed-direction radiation, carry out single particle effect test, after the measured device on this test daughter board completes single particle effect test, then rotating mechanism can drive test motherboard to turn to next test daughter board can to receive accelerator and then stop towards the position of the high energy charged particles of fixed-direction radiation again, and then carry out single particle effect simulation test, by periodically rotating and stopping, the measured device of the test daughter board on this test motherboard is made all to receive the high energy charged particles of radiation from machine, complete single particle effect simulation test.
See Fig. 2, show the structural representation of the another embodiment of a kind of single particle effect of the present invention proving installation, Fig. 3 is the A-A face sectional structure schematic diagram of this single particle effect proving installation.
Composition graphs 2 and Fig. 3, this proving installation can comprise: rotating mechanism 200, test motherboard 201 and test daughter board 202, described test motherboard 201 is provided with multiple test daughter board 202, each test daughter board 202 can install measured device 202A, wherein, the function of each ingredient of this proving installation can see above-described embodiment;
Be with the difference of above-described embodiment, this proving installation also comprises the shell 203 be provided with towards the radiation port in described radiation from machine direction, described test motherboard 201 and described test daughter board 202 for being connected with rotating mechanism 200, and cover by described shell 203;
Wherein, described shell is provided with radiation port, can make the high energy charged particles that the test daughter board reception accelerator being in this radiation port produces, the shape of described radiation port is not concrete to be limited, and the test daughter board being in this radiation port can be made to receive the high energy charged particles of accelerator generation.
The shape of described shell is not particularly limited, and can adopt rectangular structure or cylindrical structural;
Composition graphs 2 and Fig. 3, the control module (not shown) that described rotating mechanism 200 can comprise turning axle 200A, be arranged on the performance element 200B in rotating shaft and be connected with described performance element;
Described rotating shaft can be connected with shell 203, is fixed by shell;
Described test motherboard 201 can be connected with described performance element 200B;
Described control module specifically may be used for driving described performance element 200B around described axis of rotation or stopping according to control request, rotates or stop driving described test motherboard.
Wherein, described control module can be arranged in rotating mechanism, is connected with described performance element, for controlling the execution of performance element.
Because the rotating shaft of shell by described rotating mechanism is fixed, described performance element around described axis of rotation or stopping, can being rotated to drive described test motherboard or stops.
This proving installation can also comprise bearing 204 and web member 205, and described bearing outer ring is connected with described shell, is connected, rotates or stop together with described test motherboard by described bearing 204 inner ring by described web member 205 with described test motherboard 201.
Wherein, described web member is used for connection bearing and test motherboard.
Described bearing can for intersecting ball bearing;
Wherein, described bearing can adopt the bearing of low friction systems, make the pressure of this proving installation on bearing can meet the driving of rotating mechanism, and the weight and volume of described bearing all can be selected according to the situation of this proving installation.
In this single particle effect proving installation, by by bearing respectively with shell with test motherboard and be connected, described rotating mechanism can be rotated or stop by the described test motherboard of easier drive by bearing, the measured device making to be arranged on each the test daughter board on test motherboard all can receive the high energy charged particles that accelerator produces at fixed-direction, thus carries out single particle effect simulation test.
It should be noted that, described test daughter board can be inserted on described test motherboard by connector, and the number of its plug-in mounting and position are not concrete to be limited;
Wherein, what test daughter board can be vertical is inserted on test motherboard, forms polygonal solid structure;
It should be noted that, the size of test daughter board does not have concrete regulation, and test daughter board can select different sizes according to the size of proving installation; Therefore, the quantity of the measured device that each test daughter board is installed also is not particularly limited, and according to the test size of daughter board and the size of measured device itself, test daughter board can be installed the measured device of suitable quantity.
It should be noted that, the shape of test motherboard and size are not concrete yet to be limited, and according to test daughter board plug-in mounting position and the difform test motherboard of structure choice, also can select satisfactory test motherboard according to the size of test platform;
Wherein, test motherboard can be designed to circular configuration, ensures the maximization at rotating range build-in test motherboard area.
As a specific embodiment, be set to circular configuration to test motherboard, it is provided with 12 test daughter boards is example, can be as shown in Figures 2 and 3, test motherboard 201 arranges 12 test daughter boards 202, every block test daughter board 202 is provided with 3 measured device 202A, and wherein, what test daughter board was vertical is inserted on test motherboard, 12 pieces of test daughter boards join end to end, adjacent two test daughter boards can shape at an angle of 90, relative two test daughter boards are parallel to each other, and form polygonal solid structure; Certainly also have other way of realization, this is no longer going to repeat them.
Wherein, described rotating mechanism can adopt closed loop step motor control system or servo control system, drives the rotation of test motherboard by producing moment.
In the present embodiment, by shell is connected with rotating mechanism, bearing and shell with test motherboard and be connected, rotating mechanism may rotate by easier drive test motherboard, make the measured device on each test daughter board can receive the high energy charged particles that accelerator produces at fixed-direction, complete single particle effect test and test.
The invention also discloses a kind of single particle effect test macro, comprise the proving installation as described in above-mentioned all embodiments, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on described accelerator test platform, and is positioned in the radiation direction of described accelerator;
In this test macro, rotating mechanism is when driving described test motherboard to rotate or stopping, each test daughter board can be made to receive the high energy charged particles of accelerator towards fixed-direction radiation, the measured device be positioned on test daughter board is made to carry out single particle effect simulation test, due to the rotation of rotating mechanism, increase and decrease the number of test daughter board, thus add the quantity of measured device, decrease the number of times changing measured device, solve in prior art and need to change measured device frequently, make the problem of complex operation, and each measured device of changing carries out the problem that accelerator resource is wasted in vacuum pumping.
In this instructions, each embodiment adopts the mode of going forward one by one to describe, and what each embodiment stressed is the difference with other embodiments, between each embodiment identical similar portion mutually see.For device disclosed in embodiment, because it corresponds to the method disclosed in Example, so description is fairly simple, relevant part illustrates see method part.
To the above-mentioned explanation of the disclosed embodiments, professional and technical personnel in the field are realized or uses the present invention.To be apparent for those skilled in the art to the multiple amendment of these embodiments, General Principle as defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention can not be restricted to these embodiments shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (10)
1. a single particle effect proving installation, is characterized in that, comprising: rotating mechanism and the test motherboard be connected with described rotating mechanism, described test motherboard is provided with multiple test daughter board, wherein:
Each test daughter board is for installing measured device;
Described rotating mechanism for obtaining the request of control, and drives described test motherboard to rotate according to control request or stops, and makes each test daughter board receive the high energy charged particles of accelerator towards the radiation of fixed-direction institute;
Described test daughter board is inserted on described test motherboard by connector.
2. proving installation according to claim 1, it is characterized in that, controling parameters is carried in described control request, described controling parameters comprises: time parameter, speed parameter, direction parameter and displacement parameter, then the concrete control request according to carrying controling parameters of described rotating mechanism drives described test motherboard to rotate or stopping according to described controling parameters.
3. proving installation according to claim 1, is characterized in that, the control module that described rotating mechanism comprises rotating shaft, is arranged on the performance element in rotating shaft and is connected with described performance element;
Described test motherboard is specifically connected with described performance element;
Described control module, specifically for driving described performance element around described axis of rotation or stopping according to control request, rotates to drive described test motherboard or stops.
4. proving installation according to claim 1, is characterized in that, also comprises the shell be provided with towards the irradiation mouth in described radiation from machine direction, and described shell is used for being connected with rotating mechanism, and described test motherboard and described test daughter board is covered.
5. proving installation according to claim 4, is characterized in that, also comprises bearing and web member, and described bearing outer ring is connected with described shell, is fixed by described shell; Described bearing inner race is connected with described test motherboard by web member, rotates or stop together with described test motherboard.
6. proving installation according to claim 1, is characterized in that, described rotating mechanism adopts closed loop step motor control system or servo control system.
7. proving installation according to claim 1, is characterized in that, described test daughter board by connector vertical be inserted on described test motherboard, form polygonal solid structure.
8. proving installation according to claim 1, is characterized in that, described test motherboard is circular configuration.
9. proving installation according to claim 5, is characterized in that, described bearing is for intersecting ball bearing.
10. a single particle effect test macro, it is characterized in that, comprise the proving installation described in any one of claim 1 ~ 9, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on described accelerator test platform, and is positioned in the radiation direction of described accelerator.
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| CN201210590234.7A CN103063961B (en) | 2012-12-28 | 2012-12-28 | Single event effect testing device and system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103616631B (en) * | 2013-11-15 | 2017-02-15 | 中国空间技术研究院 | Method for conducting device proton signal-event test through accelerator high-energy proton |
| CN104505125B (en) * | 2014-12-04 | 2018-07-13 | 中国科学院微电子研究所 | Multi-channel SRAM single-particle test method and device |
| CN105223494B (en) * | 2015-09-25 | 2016-09-28 | 中国人民解放军国防科学技术大学 | A kind of system single particle effect detection method based on parallel testing and system |
| CN106855613A (en) * | 2015-12-07 | 2017-06-16 | 上海精密计量测试研究所 | A kind of device for the test of secondary power supply module single-particle radiation effect |
| CN105895163B (en) * | 2016-03-28 | 2018-09-28 | 工业和信息化部电子第五研究所 | Single particle effect detection method based on mirror back-up and system |
| CN106841845B (en) * | 2016-12-15 | 2021-06-29 | 华中师范大学 | Method and system for testing radiation resistance of electronic device |
| CN106908672A (en) * | 2017-01-24 | 2017-06-30 | 王洋 | A kind of single particle radiation experiment test device, system and method |
| CN109917204B (en) * | 2019-03-07 | 2021-08-17 | 中国科学院近代物理研究所 | Single event effect testing device and method based on joint robot |
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