CN103063961A - Single event effect testing device and system - Google Patents
Single event effect testing device and system Download PDFInfo
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- CN103063961A CN103063961A CN2012105902347A CN201210590234A CN103063961A CN 103063961 A CN103063961 A CN 103063961A CN 2012105902347 A CN2012105902347 A CN 2012105902347A CN 201210590234 A CN201210590234 A CN 201210590234A CN 103063961 A CN103063961 A CN 103063961A
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Abstract
The invention discloses a single event effect testing device and a system. The single event effect testing device comprises a rotating mechanism and a testing mother board connected with the rotating mechanism. The testing mother board is provided with a plurality of testing daughter boards. Each testing daughter board is used for installing devices to be tested. The rotating mechanism is used for acquiring control requests and drives the testing mother board to rotate or stop according to the control requests, and therefore each testing daughter board receives high-energy charged particles radiated by an accelerator towards a fixed direction. According to the testing device, the number of the testing daughter boards and the number of the devices to be tested are increased, times of changing the devices to be tested are reduced, and the problems that operation is troublesome due to the fact that the devices to be tested need to be changed frequently and resources of the accelerator are wasted due to the fact that vacuumizing processing is carried out when the devices to be tested are changed and in the prior art can be solved.
Description
Technical field
The present invention relates to Space Radiation Effects modelling technique field, relate in particular a kind of single particle effect proving installation and system.
Background technology
There are many high energy charged particles in the space environment; and the various aircraft such as spacecraft, satellite usually can be because of the radiation of these high energy charged particles when moving in the cosmic space; produce various faults, the fault that is caused by single particle effect in various faults accounts for main ratio.
Single particle effect refers to that the interact state that brings out device of single high energy particle and semiconductor devices changes even causes a kind of phenomenon of permanent damage, and single particle effect affects reliability and the serviceable life of various aircraft.
Therefore, how the single particle effect of the electronic devices and components of aircraft is tested, thereby can be taked certain radiation hardening measure, improve its reliability, become the emphasis that people study day by day.
By measured device is carried out the single particle effect ground simulation test, study its regular and dependence factor, for aircraft radiation hardening technology provides reference in the prior art.
The single particle effect ground simulation test need to carry out under vacuum environment, when carrying out the single particle effect simulation test, measured device need to be placed in the test board, test board places in the vacuum cavity, and is fixed on the accelerator test platform, then vacuum cavity is vacuumized, under radiation environment, produce high energy charged particles by accelerator, be radiated on the measured device of test board, in the irradiation process measured device is detected in real time.But existing this test mode, the measured device that test board can be placed is limited, and all need vacuum cavity is carried out vacuum pumping when changing measured device on the test board at every turn, in vacuum, the resource of accelerator does not obtain utilizing, therefore, when measured device quantity is more, increased number of operations, so that complex operation, and the resource of having wasted accelerator.
Summary of the invention
In view of this, the invention provides a kind of single particle effect proving installation and system, the problem that is used for solving the prior art complex operation and wastes the resource of accelerator.
For achieving the above object, the invention provides following technical scheme:
A kind of single particle effect proving installation comprises: rotating mechanism and the test motherboard that links to each other with described rotating mechanism, be provided with a plurality of test daughter boards on the described test motherboard, wherein:
Each test daughter board is used for installing measured device;
Described rotating mechanism is asked for obtaining to control, and according to controlling the described test motherboard rotation of request driving or stopping, so that each tests daughter board reception accelerator towards the high energy charged particles of fixed-direction institute radiation.
Preferably, the control parameter is carried in described control request, described control parameter comprises: time parameter, speed parameter, direction parameter and displacement parameter, then the concrete control request according to carrying the control parameter of described rotating mechanism is rotated according to the described test motherboard of described control driving parameter or is stopped.
Preferably, the described rotating mechanism control module that comprises rotating shaft, be arranged on the performance element in the rotating shaft and be connected with described performance element;
Described test motherboard specifically links to each other with described performance element;
Described control module is concrete for driving described performance element according to the control request around described rotating shaft rotation or stopping, to drive described test motherboard rotation or to stop.
Preferably, also comprise the shell that is provided with towards the irradiation mouth of described radiation from machine direction, described shell is used for linking to each other with rotating mechanism, and described test motherboard and described test daughter board are covered.
Preferably, also comprise bearing and web member, described bearing outer ring links to each other with described shell, is fixed by described shell; Described bearing inner race links to each other with described test motherboard by web member, rotates or stops with described test motherboard.
Preferably, described rotating mechanism adopts closed loop step motor control system or servo control system.
Preferably, described test daughter board forms the polygon spatial structure by vertical being inserted on the described test motherboard of connector.
Preferably,, described test motherboard is circular configuration.
Preferably, described bearing is for intersecting ball bearing.
A kind of single particle effect test macro, comprise above-mentioned each described proving installation, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on the described accelerator test platform, and is positioned on the radiation direction of described accelerator.
Via above-mentioned technical scheme as can be known, compared with prior art, the present invention openly provides a kind of single particle effect proving installation and system, in this proving installation, comprise: rotating mechanism and the test motherboard that links to each other with rotating mechanism, be provided with a plurality of test daughter boards on the described test motherboard, by measured device being installed on the test daughter board, rotating mechanism drives the rotation of test motherboard according to the control request or stops, so that each test daughter board receives accelerator towards the high energy charged particles of fixed-direction radiation.In this proving installation, drive the test motherboard by rotating mechanism, so that can polylith test daughter board be set at the test motherboard, thereby increase the quantity of test daughter board, and then increased the quantity of measured device, and reduced the number of times of changing measured device, solved in the prior art, so that the problem of complex operation, and change the problem that measured device carries out the resource of vacuum pumping waste accelerator because measured device need to be changed frequently at every turn.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art, the below will do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art, apparently, accompanying drawing in the following describes only is embodiments of the invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to the accompanying drawing that provides other accompanying drawing.
Fig. 1 is the plan structure synoptic diagram of an embodiment of a kind of single particle effect proving installation of the present invention;
Fig. 2 is the plan structure synoptic diagram of another embodiment of a kind of single particle effect proving installation of the present invention;
Fig. 3 is the A-A face sectional structure synoptic diagram of another embodiment of a kind of single particle effect proving installation of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
The present invention openly provides a kind of single particle effect proving installation and system, in this proving installation, comprise: rotating mechanism and the test motherboard that links to each other with described rotating mechanism, be provided with a plurality of test daughter boards on the described test motherboard, wherein: by measured device being installed on the test daughter board, and drive the test motherboard by rotating mechanism according to control request and rotate or stop, each test daughter board receives accelerator towards the high energy charged particles of fixed-direction radiation.In this proving installation, drive the test motherboard by rotating mechanism, so that can a plurality of test daughter boards be set at the test motherboard, and then the quantity of increase test daughter board, thereby increased the quantity of measured device, reduced the number of times of changing measured device, solved in the prior art, so that the problem of complex operation, and change the problem that measured device carries out the resource of vacuum pumping waste accelerator because measured device need to be changed frequently at every turn.
Referring to Fig. 1, show the plan structure synoptic diagram of a kind of single particle effect proving installation of the present invention.
In conjunction with Fig. 1, this proving installation can comprise: rotating mechanism 100 test motherboards 101, test daughter board 102, wherein:
Be provided with a plurality of test daughter boards 102 on the described test motherboard 101;
Described rotating mechanism 100 links to each other with described test motherboard 101;
Each test daughter board 102 is used for installing measured device 102A;
Wherein, be provided with a plurality of test daughter boards on the described test motherboard, all can be used for installing measured device 102A on each test daughter board;
Described rotating mechanism 100 is asked for obtaining to control, and according to controlling described test motherboard 101 rotations of request drive or stopping, so that each tests the high energy charged particles that daughter board 102 reception accelerators produce towards fixed-direction.
Wherein, described rotating mechanism can have multiple way of realization, can rotate or stops to get final product by obtaining control request and driving described test motherboard.
Wherein, described control request can be produced into by the inner corresponding program of rotating mechanism; After generating, computing equipment that also can be by the outside or system send to this rotating mechanism;
Wherein, described control request can comprise rotates the control request and stops the control request, described rotation control request can so that this rotating mechanism rotate, described stop the control request can be so that this rotating mechanism stops;
In this proving installation, described rotating mechanism can drive according to different control requests described test motherboard rotation or stop, concrete, can drive described test motherboard rotation according to rotating the control request first, when turning to a certain position, can receive the high energy charged particles of accelerating towards the fixed-direction radiation so that be in the test daughter board of this position, then stop according to stopping the described test motherboard of control request driving, after the measured device on the test daughter board that is positioned at this position is finished the single particle effect test, rotating mechanism rotates according to rotating control request driving test motherboard again, until the measured device on the described test daughter board all can be finished the single particle effect test.
Need to prove, rotating mechanism drives test the motherboard time of rotating and the position that stops and all can arranging by internal processes or external system program, so that this rotating mechanism can periodically drive described test motherboard rotation or stop, so that all can carrying out single particle effect, testing the measured device on the test of the difference on this test motherboard daughter board.
Wherein, described test daughter board can be inserted on the described test motherboard by connector, and the number of its plug-in mounting and position be concrete the restriction not;
Wherein, what the test daughter board can be vertical is inserted on the test motherboard, forms the polygon spatial structure;
Need to prove that the size of test daughter board does not have concrete regulation, the test daughter board can be selected different sizes according to the size of proving installation; Therefore, the quantity of the measured device of installing on each test daughter board is not concrete restriction also, can according to the size of test daughter board and the size of measured device itself, the measured device of suitable quantity be installed at the test daughter board.
Need to prove that the shape of test motherboard and size be not concrete restriction also, can according to test daughter board plug-in mounting position and the difform test motherboard of structure choice, also select satisfactory test motherboard according to the size of accelerator test platform;
Wherein, the test motherboard can be designed to circular configuration, guarantees the maximization at rotating range build-in test motherboard area.
As a specific embodiment, be set to circular configuration with the test motherboard, it is provided with 12 test daughter boards is example, can be as shown in Figure 1, at test motherboard 101 12 test daughter boards 102 are set, on the every test daughter board 102 measured device 102A is installed all, wherein, what the test daughter board was vertical is inserted on the test motherboard, 12 test daughter boards join end to end, adjacent two test daughter boards can shape at an angle of 90, two relative test daughter boards are parallel to each other, and form the polygon spatial structure; Certainly also have other way of realization, give unnecessary details no longer one by one at this.
In the present embodiment, rotating mechanism links to each other with the test motherboard, be provided with a plurality of test daughter boards on the test motherboard, measured device is installed on the test daughter board, the measured device on each test daughter board drives the test motherboard by rotating mechanism and rotates or stop, so that all can receive accelerator towards the high energy charged particles of fixed-direction radiation.Because this proving installation can rotate, therefore a plurality of test daughter boards can be set, thereby increase the quantity that is installed in the measured device on the test daughter board, so that when carrying out the single particle effect test, reduced the number of times of changing measured device, solve in the prior art, because the measured device limited amount of each test, need the frequent measured device and so that the problem of complex operation, and carry out vacuum pumping, the problem of the resource of waste accelerator at every turn when changing measured device.
Described control request portability control parameter, described rotating mechanism can drive described test motherboard according to the control request of carrying the control parameter and rotate or stop;
Wherein, described control parameter comprises: time parameter, speed parameter, direction parameter and displacement parameter;
Time parameter can comprise the stand-by time of rotating mechanism, also is that rotating mechanism drives that the test motherboard periodically rotates and when stopping, the schedule time that every rotation once namely stops afterwards; Thereby after the test daughter board was equipped with measured device, the measured device on each test daughter board all can receive the radiation of accelerator.This stand-by time can be carried out the single particle effect required time of test according to measured device and be set;
Speed parameter can comprise velocity amplitude or the accekeration when rotating mechanism rotates, can be so that rotation is rotated or accelerated to described rotating mechanism average rate.
Direction parameter can comprise the rotation direction of rotating mechanism, such as clockwise rotating or rotate counterclockwise etc.;
Displacement parameter can comprise the rotation displacement of rotating mechanism, when rotating mechanism turns to a certain ad-hoc location according to described displacement parameter, then is in the test daughter board reception accelerator of a certain ad-hoc location towards the high energy charged particles of fixed-direction radiation.
According to above-mentioned control parameter, described rotating mechanism can be controlled parameter according to this, driving described test motherboard rotates or stops, after the measured device on the test daughter board is finished the single particle effect test, rotating mechanism can again drive this test motherboard and rotate, so that next test daughter board stops in the precalculated position, receive the high energy charged particles of radiation from machine.
In this proving installation, rotating mechanism is used for obtaining the control request of carrying different control parameters, and according to the control request of carrying the control parameter, drive described test motherboard with a certain fixing speed or acceleration, and turn to a certain specific position along a certain specific direction and then stop operating, so that the measured device that is positioned on the test daughter board of this ad-hoc location can receive accelerator towards the high energy charged particles of fixed-direction radiation, carry out the single particle effect test, after the measured device on this test daughter board is finished the single particle effect test, then rotating mechanism can again drive the test motherboard and turns to next test daughter board and can receive accelerator and then stop towards the position of the high energy charged particles of fixed-direction radiation, and then carry out the single particle effect simulation test, by periodic rotation with stop, so that the measured device of the test daughter board on this test motherboard all receives the high energy charged particles of radiation from machine, finish the single particle effect simulation test.
Referring to Fig. 2, show the structural representation of the another embodiment of a kind of single particle effect proving installation of the present invention, Fig. 3 is the A-A face sectional structure synoptic diagram of this single particle effect proving installation.
In conjunction with Fig. 2 and Fig. 3, this proving installation can comprise: rotating mechanism 200, test motherboard 201 and test daughter board 202, be provided with a plurality of test daughter boards 202 on the described test motherboard 201, on each test daughter board 202 measured device 202A can be installed, wherein, the function of each ingredient of this proving installation can be referring to above-described embodiment;
Be with the difference of above-described embodiment, this proving installation also comprises the shell 203 that is provided with towards the radiation port of described radiation from machine direction, described shell 203 is used for linking to each other with rotating mechanism 200, and described test motherboard 201 and described test daughter board 202 are covered;
Wherein, described shell is provided with radiation port, can receive the high energy charged particles that accelerator produces so that be in the test daughter board of this radiation port, the shape of described radiation port is concrete the restriction not, can be so that be in the test daughter board of this radiation port and receive the high energy charged particles that accelerator produces and get final product.
The shape of described shell is concrete the restriction not, can adopt rectangular structure or cylindrical structural;
In conjunction with Fig. 2 and Fig. 3, the control module (not shown) that described rotating mechanism 200 can comprise turning axle 200A, be arranged on the execution 200B in the rotating shaft and be connected with described performance element;
Described rotating shaft can link to each other with shell 203, is fixed by shell;
Described test motherboard 201 can link to each other with described performance element 200B;
Described control module specifically can be for driving described performance element 200B around described rotating shaft rotation or stopping, to drive described test motherboard rotation or to stop according to the control request.
Wherein, described control module can be arranged in the rotating mechanism, is connected with described performance element, is used for the execution of control performance element.
Because shell fixes the rotating shaft of described rotating mechanism, so that described performance element can rotate or stop around described rotating shaft, rotate or stop driving described test motherboard.
This proving installation can also comprise bearing 204 and web member 205, and described bearing outer ring links to each other with described shell, is linked to each other with described test motherboard 201 by described web member 205 by described 204 inner rings, rotates or stops with described test motherboard.
Wherein, described web member is used for connection bearing and test motherboard.
Described bearing can be for intersecting ball bearing;
Wherein, described bearing can adopt the bearing of low friction systems, so that the pressure of this proving installation on bearing can satisfy the driving of rotating mechanism, and the weight and volume of described bearing all can be selected according to the situation of this proving installation.
In this single particle effect proving installation, by bearing is linked to each other with the test motherboard with shell respectively, described rotating mechanism rotates by can the easier drive described test motherboard of bearing or stops, so that each measured device tested on daughter board that is arranged on the test motherboard all can receive the high energy charged particles that accelerator produces at fixed-direction, thereby carry out the single particle effect simulation test.
Need to prove that described test daughter board can be inserted on the described test motherboard by connector, the number of its plug-in mounting and position be concrete the restriction not;
Wherein, what the test daughter board can be vertical is inserted on the test motherboard, forms the polygon spatial structure;
Need to prove that the size of test daughter board does not have concrete regulation, the test daughter board can be selected different sizes according to the size of proving installation; Therefore, the quantity of the measured device of installing on each test daughter board is not concrete restriction also, can according to the size of test daughter board and the size of measured device itself, the measured device of suitable quantity be installed at the test daughter board.
Need to prove that the shape of test motherboard and size be not concrete restriction also, can according to test daughter board plug-in mounting position and the difform test motherboard of structure choice, also select satisfactory test motherboard according to the size of test platform;
Wherein, the test motherboard can be designed to circular configuration, guarantees the maximization at rotating range build-in test motherboard area.
As a specific embodiment, be set to circular configuration with the test motherboard, it is provided with 12 test daughter boards is example, can be as shown in Figures 2 and 3, at test motherboard 201 12 test daughter boards 202 are set, on the every test daughter board 202 3 measured device 202A are installed, wherein, what the test daughter board was vertical is inserted on the test motherboard, 12 test daughter boards join end to end, adjacent two test daughter boards can shape at an angle of 90, two relative test daughter boards are parallel to each other, and form the polygon spatial structure; Certainly also have other way of realization, give unnecessary details no longer one by one at this.
Wherein, described rotating mechanism can adopt closed loop step motor control system or servo control system, drives the rotation of test motherboard by producing moment.
In the present embodiment, by shell is linked to each other with rotating mechanism, bearing links to each other with the test motherboard with shell, rotating mechanism may rotate by easier drive test motherboard, so that the measured device on each test daughter board can receive accelerator in the high energy charged particles that fixed-direction produces, finish single particle effect test test.
The invention also discloses a kind of single particle effect test macro, comprise such as the described proving installation of above-mentioned all embodiment, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on the described accelerator test platform, and is positioned on the radiation direction of described accelerator;
In this test macro, rotating mechanism is when driving described test motherboard rotation or stopping, can be so that each test daughter board receives accelerator towards the high energy charged particles of fixed-direction radiation, so that the measured device that is positioned on the test daughter board carries out the single particle effect simulation test, because the rotation of rotating mechanism, increased and decreased the number of test daughter board, thereby increased the quantity of measured device, reduced the number of times of changing measured device, having solved needs to change frequently measured device in the prior art, so that the problem of complex operation, and change the problem that measured device carries out vacuum pumping waste accelerator resource at every turn.
Each embodiment adopts the mode of going forward one by one to describe in this instructions, and what each embodiment stressed is and the difference of other embodiment that identical similar part is mutually referring to getting final product between each embodiment.For the disclosed device of embodiment, because it is corresponding with the disclosed method of embodiment, so description is fairly simple, relevant part partly illustrates referring to method and gets final product.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the present invention.Multiple modification to these embodiment will be apparent concerning those skilled in the art, and General Principle as defined herein can in the situation that does not break away from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (10)
1. a single particle effect proving installation is characterized in that, comprising: rotating mechanism and the test motherboard that links to each other with described rotating mechanism, be provided with a plurality of test daughter boards on the described test motherboard, wherein:
Each test daughter board is used for installing measured device;
Described rotating mechanism is asked for obtaining to control, and according to controlling the described test motherboard rotation of request driving or stopping, so that each tests daughter board reception accelerator towards the high energy charged particles of fixed-direction institute radiation.
2. system according to claim 1, it is characterized in that, the control parameter is carried in described control request, described control parameter comprises: time parameter, speed parameter, direction parameter and displacement parameter, then the concrete control request according to carrying the control parameter of described rotating mechanism is rotated according to the described test motherboard of described control driving parameter or is stopped.
3. system according to claim 1 is characterized in that, the control module that described rotating mechanism comprises rotating shaft, is arranged on the performance element in the rotating shaft and is connected with described performance element;
Described test motherboard specifically links to each other with described performance element;
Described control module is concrete for driving described performance element according to the control request around described rotating shaft rotation or stopping, to drive described test motherboard rotation or to stop.
4. system according to claim 1 is characterized in that, also comprises the shell that is provided with towards the irradiation mouth of described radiation from machine direction, and described shell is used for linking to each other with rotating mechanism, and described test motherboard and described test daughter board are covered.
5. system according to claim 4 is characterized in that, also comprises bearing and web member, and described bearing outer ring links to each other with described shell, is fixed by described shell; Described bearing inner race links to each other with described test motherboard by web member, rotates or stops with described test motherboard.
6. system according to claim 1 is characterized in that, described rotating mechanism adopts closed loop step motor control system or servo control system.
7. system according to claim 1 is characterized in that, described test daughter board forms the polygon spatial structure by vertical being inserted on the described test motherboard of connector.
8. system according to claim 1 is characterized in that, described test motherboard is circular configuration.
9. system according to claim 1 is characterized in that, described bearing is for intersecting ball bearing.
10. single particle effect test macro, it is characterized in that, comprise each described proving installation of claim 1 ~ 9, accelerator and accelerator test platform, described accelerator is towards fixed-direction radiation high energy charged particles, described proving installation is arranged on the described accelerator test platform, and is positioned on the radiation direction of described accelerator.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103616631A (en) * | 2013-11-15 | 2014-03-05 | 中国空间技术研究院 | Method for conducting device proton signal-event test through accelerator high-energy proton |
| CN104505125A (en) * | 2014-12-04 | 2015-04-08 | 中国科学院微电子研究所 | Multichannel SRAM single-event test method and device |
| CN105223494A (en) * | 2015-09-25 | 2016-01-06 | 中国人民解放军国防科学技术大学 | A kind of system single particle effect detection method based on parallel testing and system |
| CN105895163A (en) * | 2016-03-28 | 2016-08-24 | 工业和信息化部电子第五研究所 | Single event effect detection method and system based on image backup |
| CN106841845A (en) * | 2016-12-15 | 2017-06-13 | 华中师范大学 | A kind of electronic device radiation resistance method of testing and system |
| CN106855613A (en) * | 2015-12-07 | 2017-06-16 | 上海精密计量测试研究所 | A kind of device for the test of secondary power supply module single-particle radiation effect |
| CN106908672A (en) * | 2017-01-24 | 2017-06-30 | 王洋 | A kind of single particle radiation experiment test device, system and method |
| CN109917204A (en) * | 2019-03-07 | 2019-06-21 | 中国科学院近代物理研究所 | A kind of single particle effect test device and method based on articulated robot |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05226446A (en) * | 1992-02-17 | 1993-09-03 | Hitachi Ltd | Evaluation device for single event in semiconductor device and method therefor |
| CN1153308A (en) * | 1995-12-22 | 1997-07-02 | 株式会社信浓电子 | IC test handler |
| CN2453518Y (en) * | 2000-12-13 | 2001-10-10 | 中国科学院近代物理研究所 | Ground imitating equipment for single article effect accelerator |
| US20060015785A1 (en) * | 2004-07-15 | 2006-01-19 | Byoung-Ok Chun | Test apparatus for mixed-signal semiconductor device |
| CN102332307A (en) * | 2011-07-28 | 2012-01-25 | 中国空间技术研究院 | Test system and method for single event effect of SRAM (System Random Access Memory) type FPGA (Field Programmable Gate Array) |
| CN202256531U (en) * | 2011-09-29 | 2012-05-30 | 北京时代民芯科技有限公司 | Test system used for multi-channel aerospace device single event effect |
| CN102495355A (en) * | 2011-12-31 | 2012-06-13 | 中国科学院微电子研究所 | Laser pulse single particle effect simulation system |
-
2012
- 2012-12-28 CN CN201210590234.7A patent/CN103063961B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05226446A (en) * | 1992-02-17 | 1993-09-03 | Hitachi Ltd | Evaluation device for single event in semiconductor device and method therefor |
| CN1153308A (en) * | 1995-12-22 | 1997-07-02 | 株式会社信浓电子 | IC test handler |
| CN2453518Y (en) * | 2000-12-13 | 2001-10-10 | 中国科学院近代物理研究所 | Ground imitating equipment for single article effect accelerator |
| US20060015785A1 (en) * | 2004-07-15 | 2006-01-19 | Byoung-Ok Chun | Test apparatus for mixed-signal semiconductor device |
| CN102332307A (en) * | 2011-07-28 | 2012-01-25 | 中国空间技术研究院 | Test system and method for single event effect of SRAM (System Random Access Memory) type FPGA (Field Programmable Gate Array) |
| CN202256531U (en) * | 2011-09-29 | 2012-05-30 | 北京时代民芯科技有限公司 | Test system used for multi-channel aerospace device single event effect |
| CN102495355A (en) * | 2011-12-31 | 2012-06-13 | 中国科学院微电子研究所 | Laser pulse single particle effect simulation system |
Non-Patent Citations (2)
| Title |
|---|
| 叶宗海 等: "空间环境及其效应综合研究", 《实践五号卫生空间探测与试验成果学术会议论文集》 * |
| 高山山 等: "SRAM单粒子效应监测平台的设计", 《核电子学与探测技术》 * |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103616631A (en) * | 2013-11-15 | 2014-03-05 | 中国空间技术研究院 | Method for conducting device proton signal-event test through accelerator high-energy proton |
| CN103616631B (en) * | 2013-11-15 | 2017-02-15 | 中国空间技术研究院 | Method for conducting device proton signal-event test through accelerator high-energy proton |
| CN104505125A (en) * | 2014-12-04 | 2015-04-08 | 中国科学院微电子研究所 | Multichannel SRAM single-event test method and device |
| CN105223494A (en) * | 2015-09-25 | 2016-01-06 | 中国人民解放军国防科学技术大学 | A kind of system single particle effect detection method based on parallel testing and system |
| CN106855613A (en) * | 2015-12-07 | 2017-06-16 | 上海精密计量测试研究所 | A kind of device for the test of secondary power supply module single-particle radiation effect |
| CN105895163A (en) * | 2016-03-28 | 2016-08-24 | 工业和信息化部电子第五研究所 | Single event effect detection method and system based on image backup |
| CN105895163B (en) * | 2016-03-28 | 2018-09-28 | 工业和信息化部电子第五研究所 | Single particle effect detection method based on mirror back-up and system |
| CN106841845A (en) * | 2016-12-15 | 2017-06-13 | 华中师范大学 | A kind of electronic device radiation resistance method of testing and system |
| CN106841845B (en) * | 2016-12-15 | 2021-06-29 | 华中师范大学 | Method and system for testing radiation resistance of electronic device |
| CN106908672A (en) * | 2017-01-24 | 2017-06-30 | 王洋 | A kind of single particle radiation experiment test device, system and method |
| CN109917204A (en) * | 2019-03-07 | 2019-06-21 | 中国科学院近代物理研究所 | A kind of single particle effect test device and method based on articulated robot |
| CN109917204B (en) * | 2019-03-07 | 2021-08-17 | 中国科学院近代物理研究所 | Single event effect testing device and method based on joint robot |
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