CN102916339B - A kind of laser controller devices and methods therefor based on interference fringe image phase feedback - Google Patents

A kind of laser controller devices and methods therefor based on interference fringe image phase feedback Download PDF

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Publication number
CN102916339B
CN102916339B CN201210134210.0A CN201210134210A CN102916339B CN 102916339 B CN102916339 B CN 102916339B CN 201210134210 A CN201210134210 A CN 201210134210A CN 102916339 B CN102916339 B CN 102916339B
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interference
wavelength
interference image
interference fringe
semiconductor laser
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CN102916339A (en
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周延周
陈辞
徐金雄
白玉磊
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Guangdong University of Technology
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Guangdong University of Technology
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  • Semiconductor Lasers (AREA)

Abstract

A kind of laser controller based on interference fringe image phase feedback, including temperature-control circuit, critesistor, semiconductor cooler, heat sink, semiconductor laser, fiber coupler, optical fiber 1, optical fiber 2, interference image phase measurement cells, ARM11 embedded controller;Wherein, interference image phase measurement cells includes optical fiber 2, lens L, quartz wedge and CMOS camera;First, on 1% output illumination of semiconductor laser to quartz wedge, forming reflection type interference image, CMOS camera is filmed, and sends into ARM11 embedded controller and carries out phase wave length mapping calculation;Secondly, the regulation temperature value of temperature-control circuit is regulated in real time by pid algorithm.The laser controller of the present invention is used for the field such as optical-fibre communications and high-acruracy survey, owing to many pixels are average and the bandpass filtering effect of Fourier conversion, the certainty of measurement of semiconductor laser output light wavelength can reach 0.1pm (24 hours drift < 1pm), and can accurate preset regulation.

Description

A kind of laser controller devices and methods therefor based on interference fringe image phase feedback
Technical field
The present invention relates to one of the core component in the field such as optical-fibre communications and high-acruracy survey: semiconductor laser controller fills Putting, control semiconductor laser sends can accurate preset regulation and Wavelength stabilized laser.
Technical background
In high-rate data transmission techniques, people have developed DWDM (high density wavelength-division multiplex) technology, and it makes full use of The communication bandwidth of every road optical fiber, it is achieved that high-speed high capacity optic communication.This technology ultimate principle is in order to different optical signals Distinguish, the most do not produce interference, it is desirable to the wavelength of Different lightwave is different, and must strictly limit within a certain range. This just require every road light wave wavelength can accurate preset regulation, and keep stable in data transmission procedure.Quasiconductor swashs Light device is one of core devices of optical fiber high density wavelength-division multiplex technique.
Change semiconductor laser operating temperature can control it produce different wave length light, it is achieved optical wavelength preset and Regulation.But, the temperature control precision of traditional semiconductor laser controller is the highest.The precision of output light wavelength can control At ± 0.02nm, in order to improve the digital data transmission capacity of optical fiber high density wavelength-division multiplex technique, it is necessary for increasing substantially The control accuracy of semiconductor laser output light wavelength.
The present invention proposes a kind of laser controller based on interference fringe image phase feedback so that it is can control quasiconductor and swash Light device sends can accurate preset regulation and Wavelength stabilized output light (24 hours drift < 1pm of wavelength).Thus expand light Fine transmission capacity, reaches more than single fiber-optic transfer 1000 data channels/ripple, promotes the technical performance of fiber optic communication equipment.
Summary of the invention
The present invention proposes a kind of Semiconductor Laser and controls the apparatus and method of output light wavelength, passes through Laser Measurement The reflection type interference image that device output light is formed on quartz wedge, controls the operating temperature of laser instrument so that it is output light is permissible Accurate preset regulation and Wavelength stabilized.
The technical solution of the present invention is as follows:
A kind of laser controller based on interference fringe image phase feedback, including temperature-control circuit, critesistor, half Conductor refrigerator, heat sink, semiconductor laser, fiber coupler, optical fiber 1, interference image phase measurement cells, ARM11 embedding Formula controller.Wherein, interference image phase measurement cells includes optical fiber 2, lens L, quartz wedge and CMOS camera.
As it is shown in figure 1, the 1% of semiconductor laser output light by intelligent acess image feedback system, shine a folder Angle is the quartz wedge of 5 °, and wedge both sides are all 4% reflections, forms reflection type interference image.Use CMOS camera, by interferogram As captured in real-time gets off.The analytical expression of stripe pattern is:
Wherein: (m n) represents the pixel coordinate of CMOS camera, θ0For the anglec of rotation, and 0 < θ0< π/4,For initial phase angle, A is the DC component of interference fringe, and b is the amplitude of interference fringe, and c is fringe number.
In ARM11 embedded controller, carry out the data that wavelength calculates and PID controls process.
First the interference image that CMOS camera photographs is carried out two-dimensional fourier transform.The frequency domain presentation of interference image Formula is:
Wherein: (u, v) represents the frequency coordinate of striped, and M is unidirectional number of pixels.
After interference fringe image removes DC component, in amplitude-frequency spy's figure of its Fourier transformation, the phase place of peak point is exactly Under optical maser wavelength at that time, the corresponding interference produced on wedge average thickness d winds phase placeOutput light when laser instrument During wavelength linear change, after solving winding, obtain interferometric phase at different wavelengthsFinally according to phase placeWith reflecting of wavelength The relation of penetrating obtains optical maser wavelengthThe bandpass filtering effect converted due to the mean effort of many pixels and Fourier, ripple Long certainty of measurement can reach ± 0.1pm.
In the present invention, after completing image feedback phase measurement, adjusted by the temperature of pid algorithm output semiconductor laser Joint value, as shown in Figure 1.Pid algorithm formula is as follows:
v ( t ) = K p e ( t ) + K i ∫ 0 t e ( τ ) d τ + K d d d t e ( t ) ,
Wherein, v (t) is temperature adjustment value, provides prefabricated value for temperature-control circuit;KpIt it is proportional gain;KiIt is that integration increases Benefit;KdIt it is the differential gain;E is the error between wavelength preset value and interference image wavelength value of calculation, and t is the time.
Compared with prior art, it is an advantage of the current invention that:
The present invention is the high-precision phase measurement value utilizing interference image, calculates current optical maser wavelength, anti-by PID Feedback controls semiconductor laser thermal sediment operating temperature.Optical wavelength is preset with directly using temperature or electric current to carry out and compared with control, There are 2 features:
(1) interference fringe image is after two-dimensional fourier transform, and the certainty of measurement of laser instrument output light wavelength is the highest ± 0.1pm;
(2) feedback speed of interference image phase feedback controller is 7fps, and the nargin of system response time is big.
Accompanying drawing explanation
Fig. 1 is present invention laser controller based on interference fringe image phase feedback schematic diagram
Fig. 2 is that wedge interferes wavelength measurement result
(a) interference fringe image
The amplitude-frequency characteristic figure of (b) interference fringe image
During the output light wavelength linear change of (c) laser instrument, phase place variation diagram
Detailed description of the invention
Below in conjunction with embodiment and accompanying drawing, the invention will be further described, but should not limit the scope of the invention.
First refer to the structural representation that Fig. 1, Fig. 1 are laser controllers based on interference fringe image phase feedback, also It it is the structural representation of the embodiment of the present invention.
As seen from Figure 1, present invention laser controller based on interference fringe image phase feedback, control electricity including temperature Road, critesistor, semiconductor cooler, heat sink, semiconductor laser, fiber coupler, optical fiber 1, interference image phase measurement Unit, ARM11 embedded controller.Wherein, interference image phase measurement cells includes optical fiber 2, lens L, quartz wedge and CMOS camera.
In image feedback phase measurement, the semiconductor laser by 1% exports light by fiber coupler incoming image Feedback system, as shown in Figure 1.Optical fiber coupling output light is shaped as directional light through lens, shines the quartz that angle is 5 ° On wedge, and reflect on wedge two surface, formed and interfere.Due to the parallel rake of wedge, interference is a linear fringe image. Use CMOS camera, interference image captured in real-time is got off, sees Fig. 2 (a).By usb bus, it is embedded that image sends into ARM11 Controller carries out two-dimensional fourier transform, shown in result such as Fig. 2 (b).Phase place corresponding to peak point after its Fourier conversion Being exactly under optical maser wavelength at that time, the corresponding interference produced on wedge average thickness d winds phase placeFig. 2 (c) is one Practical measuring examples, when the output light wavelength linear change of laser instrument, after solving winding, the phase that every interference fringe image sequence pair is answered PositionMapping relations according to phase place with wavelength obtain optical maser wavelengthThus can measure quasiconductor to swash The optical wavelength of light device output light.The bandpass filtering effect converted due to the mean effort of many pixels and Fourier, the measurement essence of wavelength Degree can reach ± 0.1pm.
The wavelength value obtained is compared with wavelength preset value, obtains temperature adjustment value through PID control unit, thus control half The operating temperature of conductor laser, thus semiconductor laser can export accurate preset regulation and Wavelength stabilized light.
Experiment proof it is an advantage of the invention that use CMOS camera shooting wedge interference image, through Fourier conversion with After, can accurate Laser Measurement wavelength change, the certainty of measurement of wavelength can reach ± 0.1pm.Interference image phase feedback control The feedback speed of device processed is 7fps, and the control nargin of system response time is big.Can control that semiconductor laser sends can be accurate Preset regulation and Wavelength stabilized light (24 hours drift < 1pm of wavelength), to reach the rigors of fiber optic multiplexing.

Claims (2)

1. a laser controller based on interference fringe image phase feedback, including temperature-control circuit, thermocouple resistance, partly leads Chiller, heat sink, semiconductor laser, fiber coupler, optical fiber 1, interference image phase measurement cells and ARM11 are embedded Controller;Described interference image phase measurement cells includes optical fiber 2, lens L, quartz wedge and CMOS camera.
2. a method based on interference fringe image phase measurement, it is characterised in that concretely comprise the following steps:
1), semiconductor laser output light by after fiber coupler, by 1: 99 beam splitting;1% output light of semiconductor laser Through by optical fiber 2, after lens L collimation, shine on the quartz wedge that angle is 5 °, be all 4% reflection in wedge both sides, instead Penetrating light and form interference image, got off by interference image captured in real-time by CMOS camera, the analytical expression of this interference image is:
In formula, (m, n) represents the pixel coordinate of CMOS camera, and M is unidirectional sum of all pixels, θ0Rotation for linear type interference fringe Corner, and 0 < θ0< π/4,For the initial phase angle of interference fringe, a is the DC component of interference fringe, and b is interference fringe Amplitude, c is fringe number;
2), interference image data send into ARM11 embedded controller wavelength computing unit carry out two-dimensional Fourier transform, obtain The frequency-domain expression of interference image:
In formula, (u v) represents the frequency coordinate of striped;The phase place that interference image two-dimensional Fourier transform amplitude-frequency peak value is corresponding is Winding phase place at current time;Elapsed time solves winding and calculates, and obtaining optical maser wavelength is:In formula, d is wedge Average thickness;
3), by by 2) in the wavelength value that obtains compare with wavelength preset value, regulated temperature-control circuit in real time by pid algorithm Regulation temperature value.
CN201210134210.0A 2012-04-19 2012-04-19 A kind of laser controller devices and methods therefor based on interference fringe image phase feedback Expired - Fee Related CN102916339B (en)

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CN114088010B (en) * 2021-11-18 2022-08-19 中国科学院长春光学精密机械与物理研究所 Interference three-dimensional morphology resolving method

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