CN102914283A - Method and device for measuring light beam angle - Google Patents

Method and device for measuring light beam angle Download PDF

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Publication number
CN102914283A
CN102914283A CN2012103911943A CN201210391194A CN102914283A CN 102914283 A CN102914283 A CN 102914283A CN 2012103911943 A CN2012103911943 A CN 2012103911943A CN 201210391194 A CN201210391194 A CN 201210391194A CN 102914283 A CN102914283 A CN 102914283A
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China
Prior art keywords
light beam
angle
beam angle
measuring method
testing part
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CN2012103911943A
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Chinese (zh)
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蓝景恒
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Individual
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Individual
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Priority to CN2012103911943A priority Critical patent/CN102914283A/en
Publication of CN102914283A publication Critical patent/CN102914283A/en
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Abstract

The invention aims to overcome the defects of the present method, provides a method for measuring a light beam angle and also provides a device for measuring the light beam angle. The method comprises the following steps: amplifying a flare angle of parallel light beam passing by a telescope system relative to a horizontal line; causing the light beam to enter into a photoelectric detector, detecting the position information of the center of the light beam on a sensor by the photoelectric detector, and simply converting the position information, thereby obtaining angle information; simultaneously receiving the information of an electronic level meter and the photoelectric detector by a data processing unit; giving an inclined angle between the axis and the horizontal line in the whole light beam angle measuring device system by the electronic level meter; indirectly giving the inclined angle between a to-be-measured light beam and the axis of the whole light beam angle measuring device system by the photoelectric detector; calculating, thereby obtaining the inclined angle between the to-be-measured light beam and the horizontal line; and performing by using a peripheral circuit, thereby sending a numerical value of the inclined angle between the to-be-measured light beam and the horizontal line to a display unit.

Description

Beam angle measuring method and device
Technical field
The invention belongs to optical field, special optical detection field relates to the photodetector system that a kind of beam angle detects.
Technical background
In the debugging of optical research, experiment and equipment, often need directional light that accurately incident angle is arranged.Thereby at first must measure or relative angle that the precise monitoring directional light is advanced, to adjust the angle of light source or optical element.
Telescopic system is the object of infinite distance to object distance, and namely directional light carries out angle enlargement; Incident is directional light, and outgoing also is equality light.If do not regulate telescopic system, its angle enlargement multiple immobilizes.Therefore, can utilize telescope that directional light is carried out angle enlargement, with accurate measurement.
At present, in general Experiments of Optics, to the adjustment of the incident angle of directional light member's micro-judgment by experiment.As require primary optical axis and chief ray to be positioned at or during near level angle, utilize certain distance aperture outer and that absolute altitude is fixed to be benchmark, by mobile aperture, if in this process, light beam is constant all the time at the aperture height, can think that then beam angle is level.But, be difficult to guarantee that aperture or other benchmark its absolute altitude in moving process are constant all the time, and, very trouble regulated like this.And for example, wish adds parallel flat, light splitting flat board or catoptron regulating the chief ray level miter angle of accurately transferring, or requires light beam accurately to advance along vertical angle, and then existing method will be more difficult even has no way of doing it.
Summary of the invention
The object of the invention is to overcome the deficiency of present method, be provided for detecting the method for beam angle.Purpose of the present invention also is to be provided for detecting the equipment of beam angle.
Basic conception of the present invention is: utilize telescopic system to treat the angle of surveying the directional light light beam and amplify, it is incident on the photoelectricity testing part afterwards; Whole device has electrolevel, and it can determine that at least device is at the relative angle of a direction and surface level; Light beam becomes the position of image and level meter institute measuring angle to calculate by data processor at photoelectricity testing part can draw light beam with respect to the horizontal plane or the angle of vertical plane; Show by display screen again.
Concrete solution of the present invention is: adopt telescopic system to treat the angle of surveying the directional light light beam and amplify, its object lens adopt achromatic objective, in order to the directional light in certain wavelength coverage is measured, its angle enlargement ratio can be 3 to 50 times.Telescopic system, the same straight line of photoelectricity testing part are placed successively, and between each device certain intervals are arranged; Being centered close on the described straight line of photoelectricity testing part.Level meter should can be determined device at least at the relative angle of a direction and surface level, and available two mutual coplanars are the one dimension electrolevel of placement vertically, also can adopt the electrolevel of a two dimension; Level meter and telescopic system, photoelectricity testing part relative position are fixed.The signal of photoelectricity testing part and electrolevel enters data processing unit after peripheral circuit is processed, calculate at last light beam with respect to the horizontal plane or the angle of vertical plane and show by display unit.Whole measuring system should have the mechanisms such as attached support, base with fixing and adjustment height, angle.
Described telescopic system is Kepler's type telescope, also can adopt Galileo telescope;
The object lens of described telescopic system are achromatic objective, and eyepiece is achromatic eyepiece;
Described photoelectricity testing part is the PSD position sensor, also can be other face battle array photosensitive devices;
Described electrolevel is the Two-dimensional electron level meter;
Described data processing unit is single-chip microcomputer, also can adopt other microprocessors;
The present invention compares with existing method, and following advantage is arranged:
1) owing to adopting electrolevel, therefore whole device is not needed to regulate, be positioned over an accurate angle position, use more convenient.
2) owing to adopting telescopic system that beam angle is amplified, therefore measure, monitor angle more accurate, and the small distance translation there is not impact to measurement result.
3) because photoelectricity testing part and electrolevel are same with a data processing unit, so cost.
By description and the example of following accompanying drawing, and also by appended claim, embodiments of the present invention and benefit thereof will become obvious to those skilled in the art.
Description of drawings
Fig. 1 beam angle measuring method schematic diagram
Fig. 2 beam angle measurement mechanism schematic diagram
Specific embodiment
Fig. 1 is beam angle measuring method schematic diagram, and parallel beam is by telescopic system, and the subtended angle of its relative level line is exaggerated; Light beam carries out photoelectricity testing part again, and photoelectricity testing part can detect the positional information of beam center on sensor, and this positional information can draw angle information by simple conversion; Data processing unit receives the information of electrolevel and photoelectricity testing part simultaneously, electrolevel provides whole beam angle measurement mechanism system axis and horizontal angle, photoelectricity testing part can provide the angle of light beam to be measured and whole beam angle measurement mechanism system axis indirectly, can draw light beam to be measured and horizontal angle through calculating; After carrying out, peripheral circuit can deliver to the numerical value of light beam to be measured and horizontal angle on the display unit.
Fig. 2 is beam angle measurement mechanism schematic diagram, and light beam 21 forms an angle with whole beam angle measurement mechanism system axis 22 and incides on the telescopic system 30.Telescopic system 30 is comprised of achromatic objective 31 and eyepiece 32, is keplerian telescope.Light beam 21 is through behind the telescopic systems 30, and its angle with whole beam angle measurement mechanism system axis 22 becomes the fixed multiplying power amplification.Light beam 21 direct projections enter on the photoelectricity testing part 41 (such as the PSD position sensor), and photoelectricity testing part 41 can cooperate peripheral circuit and data processing unit 42 to calculate the angle of light beam and whole beam angle measurement mechanism system axis 22.Electrolevel 43 can be measured whole beam angle measurement mechanism system axis 22 and horizontal angle.Data processing unit 42 can obtain light beam to be measured and horizontal angle according to above-mentioned two angles and by simple computation, and numerical value is delivered on the display unit 51.Electric battery 40 provides power supply for PSD position sensor 41, data processing unit 42, electrolevel 43, display unit 51.61 pairs of all devices of mechanical cover are fixed.

Claims (6)

1. the beam angle measuring method relates to the photodetector system that a kind of beam angle detects with device, it is characterized in that: utilize telescopic system (30) to treat the angle of surveying the directional light light beam and amplify, it is incident on the photoelectricity testing part (41) afterwards; Whole device has electrolevel (43), and it can determine that at least device is at the relative angle of a direction and surface level; Light beam becomes the position of image and electrolevel (43) institute measuring angle to calculate by data processing unit (42) at photoelectricity testing part (41) can draw light beam with respect to the horizontal plane or the angle of vertical plane; Show by display unit (51) again; Electric battery 40 provides power supply for PSD position sensor 41, data processing unit 42, electrolevel 43, display unit 51; Telescopic system, the same straight line of photoelectricity testing part are placed successively, and between each device certain intervals are arranged; Being centered close on the described straight line of photoelectricity testing part.
2. beam angle measuring method according to claim 1 and device is characterized in that described telescopic system is Kepler's type telescope, also can adopt Galileo telescope.
3. according to claim 1 to 2 described beam angle measuring method and devices, the object lens that it is characterized in that described telescopic system are achromatic objective, and eyepiece is achromatic eyepiece.
4. beam angle measuring method according to claim 1 and device is characterized in that described photoelectricity testing part is the PSD position sensor, also can be other face battle array photosensitive devices.
5. beam angle measuring method according to claim 1 and device is characterized in that described electrolevel is the Two-dimensional electron level meter.
6. beam angle measuring method according to claim 1 and device is characterized in that described data processing unit is single-chip microcomputer, also can adopt other microprocessors.
CN2012103911943A 2012-10-16 2012-10-16 Method and device for measuring light beam angle Pending CN102914283A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012103911943A CN102914283A (en) 2012-10-16 2012-10-16 Method and device for measuring light beam angle

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Application Number Priority Date Filing Date Title
CN2012103911943A CN102914283A (en) 2012-10-16 2012-10-16 Method and device for measuring light beam angle

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CN102914283A true CN102914283A (en) 2013-02-06

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108731631A (en) * 2018-05-31 2018-11-02 西安中科迅捷光电科技有限公司 A kind of one-dimensional angle detection methods

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06147890A (en) * 1992-11-12 1994-05-27 Topcon Corp Automatic vertical angle compensator
CN2438099Y (en) * 2000-07-13 2001-07-04 马一聪 Measuring telescope with leveler
CN2468009Y (en) * 2001-02-28 2001-12-26 中国人民解放军第二炮兵工程学院科研部 Photoelectric dipmeter
CN2554597Y (en) * 2002-07-09 2003-06-04 浙江大学 Digital surveyor's level of automatic adjusting horizontal position
US20080069406A1 (en) * 2006-09-19 2008-03-20 C/O Pentax Industrial Instruments Co., Ltd. Surveying Apparatus
CN102080968A (en) * 2009-11-27 2011-06-01 田荣生 Precision approach path indicator field testing instrument

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06147890A (en) * 1992-11-12 1994-05-27 Topcon Corp Automatic vertical angle compensator
CN2438099Y (en) * 2000-07-13 2001-07-04 马一聪 Measuring telescope with leveler
CN2468009Y (en) * 2001-02-28 2001-12-26 中国人民解放军第二炮兵工程学院科研部 Photoelectric dipmeter
CN2554597Y (en) * 2002-07-09 2003-06-04 浙江大学 Digital surveyor's level of automatic adjusting horizontal position
US20080069406A1 (en) * 2006-09-19 2008-03-20 C/O Pentax Industrial Instruments Co., Ltd. Surveying Apparatus
CN102080968A (en) * 2009-11-27 2011-06-01 田荣生 Precision approach path indicator field testing instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108731631A (en) * 2018-05-31 2018-11-02 西安中科迅捷光电科技有限公司 A kind of one-dimensional angle detection methods

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Application publication date: 20130206