CN102840429A - Novel support used for calibrating transient electromagnetic field uniformity quickly - Google Patents
Novel support used for calibrating transient electromagnetic field uniformity quickly Download PDFInfo
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- CN102840429A CN102840429A CN2012103086414A CN201210308641A CN102840429A CN 102840429 A CN102840429 A CN 102840429A CN 2012103086414 A CN2012103086414 A CN 2012103086414A CN 201210308641 A CN201210308641 A CN 201210308641A CN 102840429 A CN102840429 A CN 102840429A
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- positioning ring
- support
- knob
- electromagnetic field
- transient electromagnetic
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Abstract
The invention discloses a novel support used for calibrating transient electromagnetic field uniformity quickly. The support comprises a supporting bar (1), a positioning ring (2), a rotary disk (3), a knob (4) and a test bar (5), wherein the positioning ring (2) is arranged on the top of the supporting bar (1). A plurality of grooves (21) are arranged in the inner periphery of the positioning ring (2), at least one connecting key (22) is arranged on the center of the positioning ring (2), one end of each connecting key (22) is fixedly connected with the knob (4), and the other end of each connecting key (22) is hinged with a positioning key (23). A flange (31) is arranged on one side of the rotary disk (3) and provided with a gap (32) matched with the positioning key (23), and the outer diameter of the flange (31) is smaller than the inner diameter of the positioning ring (2). A rotating shaft (33) is arranged in the center of the rotary disk (3). The flange (31) penetrates into the positioning ring (2), and the positioning key (23) can penetrate through the gap (32). The knob (4) is installed on the rotating shaft (33) and can rotate around the rotating shaft (33). The test bar (5) is fixedly connected on one side of the rotary disk (3). When the support is adopted in a system calibrating the transient electromagnetic field uniformity, calibrating speed can be accelerated obviously.
Description
Technical field
The present invention relates to a kind of support device, particularly a kind of New-support that is used for quickly calibrated transient electromagnetic field field uniformity.
Background technique
When calibrating the field uniformity of transient electromagnetic field, need to use calibration system usually and test a plurality of location points.When calibrating the field uniformity of transient electromagnetic field, not only need stent support and fixing test probe, and need position through the bracket adjustment test probe.Particularly, during the field uniformity of calibration transient electromagnetic field, need change the height of probe through the adjusting support usually, even need to realize the change of probe positions through traversing carriage.Support of the prior art is very inconvenience when being used to calibrate the field uniformity of transient electromagnetic field, and calibration speed is slow.
At present, be starved of a kind of New-support that is used for the field uniformity of quickly calibrated transient electromagnetic field.
Summary of the invention
The purpose of this invention is to provide a kind of New-support that is used for quickly calibrated transient electromagnetic field field uniformity.
The New-support that is used for quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises strut, positioning ring, rotating disc, knob and reference test bar, and said positioning ring is located at the top of said strut, and interior all sides of said positioning ring are provided with a plurality of grooves; The center of said positioning ring is provided with at least one connecting key; One end and the said knob of each said connecting key are affixed, and the other end and the positioning key of each said connecting key are hinged, and a side of said rotating disc is provided with the flange of external diameter less than said positioning ring internal diameter; Said flange is provided with the breach that cooperates with said positioning key; The center of a side that is provided with said flange of said rotating disc is provided with rotating shaft, and said flange pierces into said positioning ring, and said positioning key can pass said breach; Said knob is installed in the said rotating shaft; And said knob can rotate around said rotating shaft, and said reference test bar is fixed in a side relative with said flange of said rotating disc, and said reference test bar is provided with at least one probe fixing device.
Preferably, an end of said connecting key is provided with first screw, and said knob is provided with second screw that cooperates with said first screw, and it is affixed that said connecting key passes through said first screw and said second screw and said knob.
Preferably, the other end of said connecting key is provided with not threaded through hole, and said connecting key is hinged through said through hole and said positioning key.
Preferably, said positioning ring is provided with fixed base, and said positioning ring is fixed in the top of said strut through said fixed base.
Preferably, said support also comprises the base affixed with the bottom of strut.
Preferably, the adjustable height of said strut.
Preferably, the length-adjustable of said reference test bar.
Preferably, said probe fixing device is located at the terminal and/or middle of said reference test bar.
The present invention has following beneficial effect:
(1) when adopting said support in the system of the field uniformity of calibrating transient electromagnetic field, calibration speed is obviously accelerated;
(2) said support is to the position of probe and the degree of regulation height of angle;
(3) said rack making cost is low, easy to use.
Description of drawings
The schematic representation of the New-support that is used for quickly calibrated transient electromagnetic field field uniformity that Fig. 1 provides for the embodiment of the invention;
The schematic representation that is connected of positioning ring 2, rotating disc 3 and the knob 4 of the New-support that is used for quickly calibrated transient electromagnetic field field uniformity that Fig. 2 provides for the embodiment of the invention;
The plan view of positioning ring 2 when Fig. 3 is counterclockwise rotated by the edge for knob 4;
Fig. 4 is the plan view of positioning ring 2 when stopping the rotation the fixed-site of knob 4 and reference test bar 5.
Embodiment
Below in conjunction with accompanying drawing and embodiment summary of the invention of the present invention is done further to describe.
The New-support that is used for quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises strut 1, positioning ring 2, rotating disc 3, knob 4, reference test bar 5 and base 6, and is as shown in Figure 1.Positioning ring 2 is located at the top of strut 1.In the present embodiment, positioning ring 2 is provided with fixed base 24, and positioning ring 2 is fixed in the top of strut 1 through fixed base 24.The bottom of strut 1 and base 6 are affixed.Interior all sides of positioning ring 2 are provided with a plurality of grooves 21, and the center of positioning ring 2 is provided with at least one connecting key 22, and an end and the knob 4 of each connecting key 22 are affixed, and the other end of each connecting key 22 and positioning key 23 are hinged, as shown in Figure 2.In the present embodiment, the center of positioning ring 2 is provided with four connecting keys 22 that for example are symmetrically distributed.In the present embodiment, an end of each connecting key 22 is provided with first screw 221, and knob 4 is provided with second screw 41 that cooperates with first screw 221, and connecting key 22 is affixed with knob 4 through first screw 221 and second screw 41.The other end of each connecting key 22 is provided with not threaded through hole 222, and connecting key 22 is hinged through through hole 222 and positioning key 23.One side of rotating disc 3 is provided with the flange 31 of external diameter less than positioning ring 2 internal diameters, and flange 31 is provided with the breach 32 that cooperates with positioning key 23.The center of a side that is provided with flange 31 of rotating disc 3 is provided with rotating shaft 33, and flange 31 pierces into positioning ring 2, and positioning key 23 can pass breach 32, and knob 4 is installed in the rotating shaft 33, and knob 4 can 33 rotate around the shaft.The side relative with flange 31 that reference test bar 5 is fixed in rotating disc 3, reference test bar 5 is provided with at least one probe fixing device 51.Probe fixing device 51 is located at the terminal and/or middle of reference test bar 5, is used for fixing probe.In the present embodiment, the end of reference test bar 5 is provided with for example probe fixing device 51.In the present embodiment, the height of strut 1 is for example adjustable, and the length of reference test bar 5 is for example adjustable.
As shown in Figure 3; When knob 4 is followed the usual practice when counterclockwise rotating; Knob 4 drives connecting keys 22 along counterclockwise rotating, connecting key 22 and then drive that positioning key 23 is deviate from the groove 21 and to the breach 32 that passes rotating disc 3 near the direction at positioning ring 2 centers, afterwards; Knob 4 driven rotary dishes 3 are along counterclockwise rotating, and rotating disc 3 and then drive reference test bar 5 are along counterclockwise rotating.Knob 4 also can be rotated along clockwise direction.Situation when situation when knob 4 quilts are rotated in a clockwise direction and knob 4 are counterclockwise rotated by the edge is similar.When making reference test bar 5 arrive test position through rotary knob 4; Knob 4 stops the rotation; Positioning key 23 gets in the groove 21 to the breach that passes rotating disc 3 away from the direction at positioning ring 2 centers 32; And positioning key 23 is in alignment with connecting key 22, and the position of rotating disc 3 key 23 that is positioned is fixing, and then makes the position of reference test bar 5 be fixed.
When adopting said support in the system of the field uniformity of calibrating transient electromagnetic field, calibration speed is obviously accelerated.Said support is to the position of probe and the degree of regulation height of angle.Said rack making cost is low, easy to use.
Should be appreciated that the above detailed description of technological scheme of the present invention being carried out by preferred embodiment is schematic and nonrestrictive.Those of ordinary skill in the art is reading on the basis of specification of the present invention and can make amendment to the technological scheme that each embodiment put down in writing, and perhaps part technical characteristics wherein is equal to replacement; And these are revised or replacement, do not make the spirit and the scope of the essence disengaging various embodiments of the present invention technological scheme of relevant art scheme.
Claims (8)
1. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity; It is characterized in that; This support comprises strut (1), positioning ring (2), rotating disc (3), knob (4) and reference test bar (5), and said positioning ring (2) is located at the top of said strut (1), and interior all sides of said positioning ring (2) are provided with a plurality of grooves (21); The center of said positioning ring (2) is provided with at least one connecting key (22); One end of each said connecting key (22) and said knob (4) are affixed, and the other end of each said connecting key (22) and positioning key (23) are hinged, and a side of said rotating disc (3) is provided with the flange (31) of external diameter less than said positioning ring (2) internal diameter; Said flange (31) is provided with the breach (32) that cooperates with said positioning key (23); The center of a side that is provided with said flange (31) of said rotating disc (3) is provided with rotating shaft (33), and said flange (31) pierces into said positioning ring (2), and said positioning key (23) can pass said breach (32); Said knob (4) is installed in the said rotating shaft (33); And said knob (4) can rotate around said rotating shaft (33), and said reference test bar (5) is fixed in a side relative with said flange (31) of said rotating disc (4), and said reference test bar (5) is provided with at least one probe fixing device (51).
2. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1; It is characterized in that; One end of said connecting key (22) is provided with first screw (221); Said knob (4) is provided with second screw (41) that cooperates with said first screw (221), and said connecting key (22) is affixed with said knob (4) through said first screw (221) and said second screw (41).
3. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1; It is characterized in that; The other end of said connecting key (22) is provided with not threaded through hole (222), and said connecting key (22) is hinged through said through hole (222) and said positioning key (23).
4. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1; It is characterized in that; Said positioning ring (2) is provided with fixed base (24), and said positioning ring (2) is fixed in the top of said strut (1) through said fixed base (24).
5. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, said support also comprises the affixed base (6) in bottom with strut (1).
6. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, the adjustable height of said strut (1).
7. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, the length-adjustable of said reference test bar (5).
8. the New-support that is used for quickly calibrated transient electromagnetic field field uniformity according to claim 1 is characterized in that, said probe fixing device (51) is located at the terminal and/or middle of said reference test bar (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210308641.4A CN102840429B (en) | 2012-08-27 | 2012-08-27 | Novel support used for calibrating transient electromagnetic field uniformity quickly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210308641.4A CN102840429B (en) | 2012-08-27 | 2012-08-27 | Novel support used for calibrating transient electromagnetic field uniformity quickly |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102840429A true CN102840429A (en) | 2012-12-26 |
| CN102840429B CN102840429B (en) | 2014-06-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210308641.4A Expired - Fee Related CN102840429B (en) | 2012-08-27 | 2012-08-27 | Novel support used for calibrating transient electromagnetic field uniformity quickly |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2044738U (en) * | 1988-06-06 | 1989-09-20 | 林永恩 | Mini-tripod |
| JPH10145128A (en) * | 1996-11-11 | 1998-05-29 | Toshiba Corp | Antenna equipment |
| CN2886584Y (en) * | 2006-02-20 | 2007-04-04 | 十大科技有限公司 | Radiation testing platform |
| CN101978278A (en) * | 2008-02-20 | 2011-02-16 | 微波视点公司 | Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested |
| CN201851850U (en) * | 2010-10-21 | 2011-06-01 | 王公强 | Portable video player fixing support frame |
| CN102462155A (en) * | 2010-11-03 | 2012-05-23 | 夏新珍 | Telescopic rotary dining table |
| CN202746872U (en) * | 2012-08-27 | 2013-02-20 | 北京无线电计量测试研究所 | Novel bracket for quickly correcting field uniformity of transient electromagnetic field |
-
2012
- 2012-08-27 CN CN201210308641.4A patent/CN102840429B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2044738U (en) * | 1988-06-06 | 1989-09-20 | 林永恩 | Mini-tripod |
| JPH10145128A (en) * | 1996-11-11 | 1998-05-29 | Toshiba Corp | Antenna equipment |
| CN2886584Y (en) * | 2006-02-20 | 2007-04-04 | 十大科技有限公司 | Radiation testing platform |
| CN101978278A (en) * | 2008-02-20 | 2011-02-16 | 微波视点公司 | Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested |
| CN201851850U (en) * | 2010-10-21 | 2011-06-01 | 王公强 | Portable video player fixing support frame |
| CN102462155A (en) * | 2010-11-03 | 2012-05-23 | 夏新珍 | Telescopic rotary dining table |
| CN202746872U (en) * | 2012-08-27 | 2013-02-20 | 北京无线电计量测试研究所 | Novel bracket for quickly correcting field uniformity of transient electromagnetic field |
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| Publication number | Publication date |
|---|---|
| CN102840429B (en) | 2014-06-18 |
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