CN102840428B - Bracket for quickly calibrating field uniformity of transient electromagnetic field - Google Patents
Bracket for quickly calibrating field uniformity of transient electromagnetic field Download PDFInfo
- Publication number
- CN102840428B CN102840428B CN201210308610.9A CN201210308610A CN102840428B CN 102840428 B CN102840428 B CN 102840428B CN 201210308610 A CN201210308610 A CN 201210308610A CN 102840428 B CN102840428 B CN 102840428B
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- screw
- flange
- ring
- support
- transient electromagnetic
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Abstract
The invention discloses a bracket for quickly calibrating the field uniformity of a transient electromagnetic field, which comprises a supporting rod (1), an installation base (2), a rotary ring (3), a positioning ring (4), a rotary disc (5), a knob (6) and a test rod (7). The installation base (2) is arranged at the top end of the supporting rod (1). A first flange (41) is arranged on one side of the positioning ring (4) and passes through the rotary ring (3) to be fixedly connected with the installation base (2). A plurality of grooves (42) are formed in the inner circumference of the positioning ring (4). At least one connecting bond (43) is arranged in the center of the positioning ring (4). One end of each connecting bond (43) is fixedly connected with the knob (6) while the other end thereof is hinged with a positioning bond (44). A second flange (51) is arranged on one side of the rotary disc (5), and the second flange (51) is provided with a gap (52). A rotary shaft (53) is arranged in the center of the rotary disc (5). The second flange (51) penetrates into the positioning ring (4). The knob (6) is installed on the rotary shaft (53) and can rotate around the rotary shaft (53). The rotary ring (3) is fixedly connected with the rotary disc (5). The test rod (7) is fixedly connected with the rotary disc (5). The bracket can remarkably accelerate the speed of calibrating the field uniformity of the transient electromagnetic field.
Description
Technical field
The present invention relates to a kind of support device, particularly a kind of support for quickly calibrated transient electromagnetic field field uniformity.
Background technique
While calibrating the field uniformity of transient electromagnetic field, conventionally need to apply calibration system and test multiple location points.While calibrating the field uniformity of transient electromagnetic field, not only need stent support and fixing test probe, and need to pass through the position of bracket adjustment test probe.Particularly, while calibrating the field uniformity of transient electromagnetic field, conventionally need to, by regulating support change the height of probe, even need to realize by traversing carriage the change of probe positions.Support of the prior art is very inconvenient in the time of the field uniformity for calibrating transient electromagnetic field, and calibration speed is slow.
At present, be starved of a kind of support of the field uniformity for quickly calibrated transient electromagnetic field.
Summary of the invention
The object of this invention is to provide a kind of support for quickly calibrated transient electromagnetic field field uniformity.
Support for quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises strut, fitting seat, rotating ring, positioning ring, rotating disc, knob and reference test bar, described fitting seat is located at the top of described strut, one side of described positioning ring is provided with the first flange, the external diameter of described the first flange mates with the internal diameter of described rotating ring, make described the first flange can through described rotating ring and described fitting seat affixed, the inner circumferential side of described positioning ring is provided with multiple grooves, the center of described positioning ring is provided with at least one connecting key, one end of each described connecting key and described knob are affixed, the other end and the positioning key of each described connecting key are hinged, one side of described rotating disc is provided with the second flange that external diameter is less than described positioning ring internal diameter, described the second flange is provided with the breach coordinating with described positioning key, the described second flange Yi Ce center that is provided with of described rotating disc is provided with rotating shaft, described the second flange pierces into described positioning ring from a side relative with described the first flange of described positioning ring, and described positioning key can pass described breach, described knob is installed in described rotating shaft, and described knob can rotate around described rotating shaft, described rotating ring and described rotating disc are affixed, described reference test bar is fixed in a side relative with described the second flange of described rotating disc, described reference test bar is provided with at least one probe fixing device.
Preferably, described fitting seat is ring and is provided with multiple the first screws, and described the first flange is provided with the second screw that multiple and described the first screw coordinates, and it is affixed that described positioning ring passes through described the first screw and described the second screw and described fitting seat.
Preferably, described rotating ring is provided with multiple the 3rd screws, and described rotating disc is provided with the 4th screw that multiple and described the 3rd screw coordinates, and it is affixed that described rotating disc passes through described the 3rd screw and described the 4th screw and described rotating ring.
Preferably, one end of each described connecting key is provided with the 5th screw, and described knob is provided with at least one the 6th screw coordinating with described the 5th screw, and it is affixed that described connecting key passes through described the 5th screw and described the 6th screw and described knob.
Preferably, the other end of each described connecting key is provided with not threaded through hole, and described connecting key is hinged by described through hole and described positioning key.
Preferably, described support also comprises the base affixed with the bottom of strut.
Preferably, the height of described strut is adjustable.
Preferably, the length of described reference test bar is adjustable.
Preferably, described probe fixing device is located at end or the centre of described reference test bar.
The present invention has following beneficial effect:
(1) in the time adopting described support in the system of field uniformity of calibrating transient electromagnetic field, can make calibration speed obviously accelerate;
(2) described support is high to the degree of regulation of the position of popping one's head in and angle;
(3) described rack making cost is low, easy to use.
Accompanying drawing explanation
The schematic diagram of the support for quickly calibrated transient electromagnetic field field uniformity that Fig. 1 provides for the embodiment of the present invention;
The connection diagram of fitting seat 2, rotating ring 3, positioning ring 4, rotating disc 5 and the knob 6 of the support for quickly calibrated transient electromagnetic field field uniformity that Fig. 2 provides for the embodiment of the present invention;
Fig. 3 is the plan view of knob 6 positioning ring 4 while being rotated in the counterclockwise direction;
Fig. 4 is the plan view of the position of knob 6 and reference test bar 7 positioning ring 4 when fixing of stopping the rotation.
Embodiment
Below in conjunction with drawings and Examples, summary of the invention of the present invention is further described.
Support for quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises strut 1, fitting seat 2, rotating ring 3, positioning ring 4, rotating disc 5, knob 6, reference test bar 7 and base 8, as shown in Figure 1.Fitting seat 2 is located at the top of strut 1.The bottom of strut 1 and base 8 are affixed.The external diameter that one side of positioning ring 4 is provided with the first flange 41, the first flanges 41 mates with the internal diameter of rotating ring 3, makes the first flange 41 to pass rotating ring 3 affixed with fitting seat 2, as shown in Figure 2.In the present embodiment, fitting seat 2 is for example ring and is provided with for example multiple the first screws 21, the first flange 41 is provided with for example multiple the second screws 45 that coordinate with the first screw 21, and positioning ring 4 is affixed with fitting seat 2 by the first screw 21 and the second screw 45, as shown in Figure 2.The inner circumferential side of positioning ring 4 is provided with multiple grooves 42, and the center of positioning ring 4 is provided with at least one connecting key 43, and one end of each connecting key 43 and knob 6 are affixed, and the other end of each connecting key 43 and positioning key 44 are hinged, as shown in Figure 2.In the present embodiment, the center of positioning ring 4 is provided with four for example symmetrical connecting keys 43.One side of rotating disc 5 is provided with the second flange 51, the second flanges 51 that external diameter is less than positioning ring 4 internal diameters and is provided with the breach 52 coordinating with positioning key 44.The second flange 51 Yi Ce centers that are provided with of rotating disc 5 are provided with rotating shaft 53.The second flange 51 pierces into positioning ring 4 from a side relative with the first flange 41 of positioning ring 4, and positioning key 44 can pass breach 52, and knob 6 is installed in rotating shaft 53, and knob 6 can 53 rotate around the shaft, and rotating ring 3 is affixed with rotating disc 5.Reference test bar 7 is fixed in a side relative with the second flange 51 of rotating disc 5, and reference test bar 7 is provided with at least one probe fixing device 71.In the present embodiment, rotating ring 3 is provided with for example multiple the 3rd screws 31, and rotating disc 5 is provided with multiple for example the 4th screws 54 that coordinate with the 3rd screw 31, and rotating disc 5 is affixed with rotating ring 3 by the 3rd screw 31 and the 4th screw 54.One end of each connecting key 43 is provided with for example the 5th screw 431, and knob 6 is provided with at least one for example the 6th screw 61 coordinating with the 5th screw 431, and connecting key 43 is affixed with knob 6 by the 5th screw 431 and the 6th screw 61.The other end of each connecting key 43 is provided with for example not threaded through hole 432, and connecting key 43 is hinged by through hole 432 and positioning key 44.Probe fixing device 71 is located at centre or the end of reference test bar 7, for static probe.In the present embodiment, the end of reference test bar 7 is provided with a for example probe fixing device 71.In the present embodiment, the height of strut 1 is for example adjustable, and the length of reference test bar 7 is for example adjustable.
As shown in Figure 3, in the time that knob 6 is for example counterclockwise rotated by edge, knob 6 drives connecting key 43 to rotate in the counterclockwise direction, connecting key 43 and then drive positioning key 44 are deviate from and the breach 52 through rotating disc 5 to the direction near positioning ring 4 centers in groove 42, afterwards, knob 6 driven rotary dishes 5 rotate in the counterclockwise direction, and rotating disc 5 and then drive reference test bar 7 rotate in the counterclockwise direction.Knob 6 also can be rotated in a clockwise direction.Situation when situation when knob 6 is rotated in a clockwise direction and knob 6 are rotated is in the counterclockwise direction similar.In the time making reference test bar 7 arrive test position by rotation knob 6, knob 6 stops the rotation, positioning key 44 enters in groove 42 through the breach 52 of rotating disc 5 to the direction away from positioning ring 4 centers, and positioning key 44 is in alignment with connecting key 43, be positioned key 44 of the position of rotating disc 5 is fixing, and then the position of reference test bar 7 is fixed.
In the time adopting described support in the system of field uniformity of calibrating transient electromagnetic field, can make calibration speed obviously accelerate.Described support is high to the degree of regulation of the position of popping one's head in and angle.Described rack making cost is low, easy to use.
Should be appreciated that the above detailed description of technological scheme of the present invention being carried out by preferred embodiment is illustrative and not restrictive.Those of ordinary skill in the art modifies reading the technological scheme that can record each embodiment on the basis of specification of the present invention, or part technical characteristics is wherein equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution depart from the spirit and scope of various embodiments of the present invention technological scheme.
Claims (9)
1. for the support of quickly calibrated transient electromagnetic field field uniformity, it is characterized in that, this support comprises strut (1), fitting seat (2), rotating ring (3), positioning ring (4), rotating disc (5), knob (6) and reference test bar (7), described fitting seat (2) is located at the top of described strut (1), one side of described positioning ring (4) is provided with the first flange (41), the external diameter of described the first flange (41) mates with the internal diameter of described rotating ring (3), make described the first flange (41) to pass described rotating ring (3) affixed with described fitting seat (2), the inner circumferential side of described positioning ring (4) is provided with multiple grooves (42), the center of described positioning ring (4) is provided with at least one connecting key (43), one end of each described connecting key (43) and described knob (6) are affixed, the other end of each described connecting key (43) is hinged with each corresponding positioning key (44), one side of described rotating disc (5) is provided with the second flange (51) that external diameter is less than described positioning ring (4) internal diameter, described the second flange (51) is provided with the breach (52) coordinating with described positioning key (44), described the second flange (51) Yi Ce center that is provided with of described rotating disc (5) is provided with rotating shaft (53), described the second flange (51) pierces into described positioning ring (4) from a side relative with described the first flange (41) of described positioning ring (4), and described positioning key (44) can pass described breach (52), described knob (6) is installed in described rotating shaft (53), and described knob (6) can rotate around described rotating shaft (53), described rotating ring (3) is affixed with described rotating disc (5), described reference test bar (7) is fixed in a side relative with described the second flange (51) of described rotating disc (5), described reference test bar (7) is provided with at least one probe fixing device (71).
2. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, described fitting seat (2) is ring and is provided with multiple the first screws (21), described the first flange (41) is provided with the second screw (45) that multiple and described the first screw (21) coordinates, and described positioning ring (4) is affixed with described fitting seat (2) by described the first screw (21) and described the second screw (45).
3. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, described rotating ring (3) is provided with multiple the 3rd screws (31), described rotating disc (5) is provided with the 4th screw (54) that multiple and described the 3rd screw (31) coordinates, and described rotating disc (5) is affixed with described rotating ring (3) by described the 3rd screw (31) and described the 4th screw (54).
4. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, one end of each described connecting key (43) is provided with the 5th screw (431), described knob (6) is provided with at least one the 6th screw (61) coordinating with described the 5th screw (431), and described connecting key (43) is affixed with described knob (6) by described the 5th screw (431) and described the 6th screw (61).
5. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, the other end of each described connecting key (43) is provided with not threaded through hole (432), and described connecting key (43) is hinged by described through hole (432) and described positioning key (44).
6. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, described support also comprises the base (8) affixed with the bottom of strut (1).
7. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, the height of described strut (1) is adjustable.
8. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, the length of described reference test bar (7) is adjustable.
9. the support for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, described probe fixing device (71) is located at end or the centre of described reference test bar (7).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201210308610.9A CN102840428B (en) | 2012-08-27 | 2012-08-27 | Bracket for quickly calibrating field uniformity of transient electromagnetic field |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201210308610.9A CN102840428B (en) | 2012-08-27 | 2012-08-27 | Bracket for quickly calibrating field uniformity of transient electromagnetic field |
Publications (2)
Publication Number | Publication Date |
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CN102840428A CN102840428A (en) | 2012-12-26 |
CN102840428B true CN102840428B (en) | 2014-06-18 |
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CN201210308610.9A Expired - Fee Related CN102840428B (en) | 2012-08-27 | 2012-08-27 | Bracket for quickly calibrating field uniformity of transient electromagnetic field |
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Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3604497A1 (en) * | 1986-02-13 | 1987-08-27 | Koenig & Meyer Gmbh & Co Kg | Vertically adjustable stand, in particular for loud-speaker casings |
US5725187A (en) * | 1996-07-01 | 1998-03-10 | Columbus Camera Group, Inc. | Camera mount device |
CN2886584Y (en) * | 2006-02-20 | 2007-04-04 | 十大科技有限公司 | Radiation testing platform |
DE102006050695B4 (en) * | 2006-10-24 | 2015-10-22 | Thales E-Transactions Gmbh | Terminal stand with swivel joint |
CN200976021Y (en) * | 2006-12-15 | 2007-11-14 | 深圳国人通信有限公司 | Clamp for antenna directivity diagram test |
CN102042465A (en) * | 2009-10-22 | 2011-05-04 | 鸿富锦精密工业(深圳)有限公司 | Electronic equipment and rotation device thereof |
CN102062284A (en) * | 2009-11-13 | 2011-05-18 | 鸿富锦精密工业(深圳)有限公司 | Fixing bracket |
CN202746873U (en) * | 2012-08-27 | 2013-02-20 | 北京无线电计量测试研究所 | Bracket for quickly correcting field uniformity of transient electromagnetic field |
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2012
- 2012-08-27 CN CN201210308610.9A patent/CN102840428B/en not_active Expired - Fee Related
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