CN102830292B - System for quickly calibrating field uniformity of transient electromagnetic field - Google Patents
System for quickly calibrating field uniformity of transient electromagnetic field Download PDFInfo
- Publication number
- CN102830292B CN102830292B CN201210309353.0A CN201210309353A CN102830292B CN 102830292 B CN102830292 B CN 102830292B CN 201210309353 A CN201210309353 A CN 201210309353A CN 102830292 B CN102830292 B CN 102830292B
- Authority
- CN
- China
- Prior art keywords
- screw
- transient electromagnetic
- electromagnetic field
- flange
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
The invention discloses a system for quickly calibrating field uniformity of a transient electromagnetic field, and the system comprises a support (1), an oscilloscope (2) and at least one probe (3), wherein the support (1) comprises a supporting rod (11), an installation seat (12), a rotary ring (13), a positioning ring (14), a rotary disc (15), a knob (16) and a test rod (17), the test rod (17) is provided with at least one probe fixing device (171), and the probe (3) is electrically connected with the oscilloscope (2). The system has low requirement on a transient electromagnetic field generation device including a pulse signal source and can rapidly and accurately calibrate the field uniformity of the transient electromagnetic field. The support of the system not only can be used for supporting and fixing the probe, but also can be used for adjusting the position and the angle of the probe. Compared with a calibration system of the prior art, the calibration speed of system for the field uniformity of the transient electromagnetic field is obviously accelerated. The support of the system has high precision for adjusting the position and angle of the probe.
Description
Technical field
The present invention relates to the collimation technique field of the field uniformity of electromagnetic field, particularly a kind of system for quickly calibrated transient electromagnetic field field uniformity.
Background technology
For radio frequency electromagnetic field, IEC61000 series standard has provided the calibration steps of the field uniformity of two kinds of electromagnetic fields, i.e. constant field intensity calibration method and firm power calibration method.Constant field intensity calibration method is to set up a uniform field that field intensity is constant by adjusting forward direction output power, then each point in region to be measured is measured in each frequency range by a step-length of popping one's head in to specify through the field intensity of calibration.Firm power calibration method is different is with it to keep forward direction output power constant while measuring.
For transient electromagnetic field, MIL-STD-461F standard has adopted above-mentioned constant field intensity calibration method.But constant field intensity calibration method has the following disadvantages:
(1) single pulse signal that transient electromagnetic field is triggered by pulse signal source produces, in order to obtain constant electromagnetic field, need the output power of regulating impulse signal source repeatedly, therefore must both can accurately monitor the output power of pulse signal source used, can finely tune the output power of pulse signal source used again, to the transient electromagnetic field generation device including pulse signal source require high;
(2) conventionally need to monitor with high-voltage probe the output power of pulse signal source, sometimes be difficult in actual applications realize;
(3) alignment time longer, use inconvenient.
For transient electromagnetic field, if adopt firm power calibration method, also there is following problem:
(1) need pulse signal source repeatedly to trigger the multiple single pulse signals of output, the amplitude of each single pulse signal is difficult to be consistent completely, there is the unsettled problem of each single pulse signal of pulse signal source output, cause the accuracy of transient electromagnetic field uniformity calibration to reduce;
(2) requirement of pulse signals source output stability causes the cost of transient electromagnetic field generation device higher.
The system that is used for the field uniformity of calibrating transient electromagnetic field need to be tested multiple positions conventionally.While calibrating the field uniformity of transient electromagnetic field, not only need stent support and fixing test probe, and need to pass through position and the angle of bracket adjustment test probe.Particularly, while calibrating the field uniformity of transient electromagnetic field, conventionally need to, by regulating support change angle and the length of the reference test bar that is fixed with probe, even need by regulating support to realize the rotation of reference test bar around stationary shaft.Support of the prior art all can not directly be realized above-mentioned functions, therefore very inconvenient in the time of the field uniformity for calibrating transient electromagnetic field.
At present, be starved of and a kind of transient electromagnetic field generation device including pulse signal source required to low, quick, the calibration system of the field uniformity of transient electromagnetic field accurately and cheaply.
Summary of the invention
The object of this invention is to provide a kind of system for quickly calibrated transient electromagnetic field field uniformity.
System for quickly calibrated transient electromagnetic field field uniformity provided by the invention comprises support, oscillograph and at least one probe, described support comprises support bar, mount pad, swivel eye, locating ring, rotating disc, knob and reference test bar, described mount pad is located at the top of described support bar, one side of described locating ring is provided with the first flange, the external diameter of described the first flange mates with the internal diameter of described swivel eye, described the first flange is affixed through described swivel eye and described mount pad, the inner circumferential side of described locating ring is provided with multiple grooves, the center of described locating ring is provided with at least one connecting key, one end of each described connecting key and described knob are affixed, the other end and the positioning key of each described connecting key are hinged, one side of described rotating disc is provided with the second flange that external diameter is less than described locating ring internal diameter, described the second flange is provided with the breach coordinating with described positioning key, the described second flange Yi Ce center that is provided with of described rotating disc is provided with rotating shaft, described the second flange pierces into described locating ring from a side relative with described the first flange of described locating ring, and described positioning key can pass described breach, described knob is installed in described rotating shaft, and described knob can rotate around described rotating shaft, described swivel eye and described rotating disc are affixed, described reference test bar is fixed in a side relative with described the second flange of described rotating disc, described reference test bar is provided with at least one probe fixing device, described probe is fixed on described reference test bar by described probe fixing device, described probe is electrically connected with described oscillograph.
Preferably, described mount pad is annular and is provided with multiple the first screws, and described the first flange is provided with the second screw that multiple and described the first screw coordinates, and it is affixed that described locating ring passes through described the first screw and described the second screw and described mount pad.
Preferably, described swivel eye is provided with multiple the 3rd screws, and described rotating disc is provided with the 4th screw that multiple and described the 3rd screw coordinates, and it is affixed that described rotating disc passes through described the 3rd screw and described the 4th screw and described swivel eye.
Preferably, one end of each described connecting key is provided with the 5th screw, and described knob is provided with at least one the 6th screw coordinating with described the 5th screw, and it is affixed that described connecting key passes through described the 5th screw and described the 6th screw and described knob.
Preferably, the other end of each described connecting key is provided with not threaded through hole, and described connecting key is hinged by described through hole and described positioning key.
Preferably, described support also comprises the base affixed with the bottom of support bar.
Preferably, the height of described support bar is adjustable.
Preferably, the length of described reference test bar is adjustable.
Preferably, described probe fixing device is located at free end and/or the centre of described reference test bar.
The present invention has following beneficial effect:
(1) described system to the transient electromagnetic field generation device including pulse signal source require lowly, can calibrate the field uniformity of transient electromagnetic field quickly and accurately;
(2) support of described system not only can be used for supporting and static probe, and can be used in the position and the angle that regulate probe;
(3) compared with the calibration system of prior art, described system is obviously accelerated the calibration speed of transient electromagnetic field field uniformity;
(4) support of described system is high to the degree of regulation of the position of popping one's head in and angle;
(5) described system cost of manufacture is low, easy to use.
Brief description of the drawings
The schematic diagram of the system for quickly calibrated transient electromagnetic field field uniformity that Fig. 1 provides for the embodiment of the present invention;
The structural representation of the support of the system for quickly calibrated transient electromagnetic field field uniformity that Fig. 2 provides for the embodiment of the present invention;
The connection diagram of mount pad 12, swivel eye 13, locating ring 14, rotating disc 15 and the knob 16 of the support of the system for quickly calibrated transient electromagnetic field field uniformity that Fig. 3 provides for the embodiment of the present invention;
Fig. 4 is the vertical view of knob 16 locating ring 14 while being rotated in the counterclockwise direction;
Fig. 5 is the vertical view of the position of knob 16 and reference test bar 17 locating ring 14 when fixing of stopping the rotation.
Embodiment
Below in conjunction with drawings and Examples, summary of the invention of the present invention is further described.
The system for quickly calibrated transient electromagnetic field field uniformity that the present embodiment provides comprises support 1, oscillograph 2 and at least one probe 3, as shown in Figure 1.Support 1 comprises support bar 11, mount pad 12, swivel eye 13, locating ring 14, rotating disc 15, knob 16, reference test bar 17 and base 18, as shown in Figure 2.Mount pad 12 is located at the top of support bar 11.The bottom of support bar 11 and base 18 are affixed.The external diameter that one side of locating ring 14 is provided with the first flange 141, the first flanges 141 mates with the internal diameter of swivel eye 13, and the first flange 141 is affixed through swivel eye 13 and mount pad 12, as shown in Figure 3.In the present embodiment, mount pad 12 is for example annular and is provided with for example multiple the first screws 121, the first flange 141 is provided with for example multiple the second screws 145 that coordinate with the first screw 121, and locating ring 14 is affixed with mount pad 12 by the first screw 121 and the second screw 145, as shown in Figure 3.The inner circumferential side of locating ring 14 is provided with multiple grooves 142, and locating ring 14 center is provided with at least one connecting key 143, and one end of each connecting key 143 and knob 16 are affixed, and the other end of each connecting key 143 and positioning key 144 are hinged, as shown in Figure 3.In the present embodiment, locating ring 14 center is provided with four for example symmetrical connecting keys 143.One side of rotating disc 15 is provided with the second flange 151, the second flanges 151 that external diameter is less than locating ring 14 internal diameters and is provided with the breach 152 coordinating with positioning key 144.The second flange 151 Yi Ce centers that are provided with of rotating disc 15 are provided with rotating shaft 153.The second flange 151 pierces into locating ring 14 from a side relative with the first flange 141 of locating ring 14, and positioning key 144 can pass breach 152, and knob 16 is installed in rotating shaft 153, and knob 16 can 153 rotate around the shaft, and swivel eye 13 is affixed with rotating disc 15.Reference test bar 17 is fixed in a side relative with the second flange 151 of rotating disc 15, and reference test bar 17 is provided with at least one probe fixing device 171.In the present embodiment, swivel eye 13 is provided with for example multiple the 3rd screws 131, and rotating disc 15 is provided with multiple for example the 4th screws 154 that coordinate with the 3rd screw 131, and rotating disc 15 is affixed with swivel eye 13 by the 3rd screw 131 and the 4th screw 154.One end of each connecting key 143 is provided with for example the 5th screw 1431, and knob 16 is provided with at least one for example the 6th screw 161 coordinating with the 5th screw 1431, and connecting key 143 is affixed with knob 16 by the 5th screw 1431 and the 6th screw 161.The other end of each connecting key 143 is provided with for example not threaded through hole 1432, and connecting key 143 is hinged by through hole 1432 and positioning key 144.Probe fixing device 171 is located at centre and/or the free end of reference test bar 17.Probe 3 is fixed on reference test bar 17 by probe fixing device 171.Probe 3 is electrically connected with oscillograph 2.In the present embodiment, for example free end of reference test bar 17 is provided with a for example probe fixing device 171, and for example a probe 3 is fixed on reference test bar 17 by probe fixing device 171.In the present embodiment, the height of support bar 11 is for example adjustable, and the length of reference test bar 17 is for example adjustable.
As shown in Figure 4, in the time that knob 16 is for example counterclockwise rotated by edge, knob 16 drives connecting key 143 to rotate in the counterclockwise direction, connecting key 143 and then drive positioning key 144 are deviate from and the breach 152 through rotating disc 15 to the direction near locating ring 14 centers in groove 142, afterwards, knob 16 driven rotary dishes 15 rotate in the counterclockwise direction, and rotating disc 15 and then drive reference test bar 17 rotate in the counterclockwise direction.Knob 16 also can be rotated in a clockwise direction.Situation when situation when knob 16 is rotated in a clockwise direction and knob 16 are rotated is in the counterclockwise direction similar.In the time making reference test bar 17 arrive test position by rotation knob 16, knob 16 stops the rotation, positioning key 144 enters in groove 142 through the breach 152 of rotating disc 15 to the direction away from locating ring 14 centers, and positioning key 144 is in alignment with connecting key 143, be positioned key 144 of the position of rotating disc 15 is fixing, and then the position of reference test bar 17 is fixed, as shown in Figure 5.
Described system requires lowly to the transient electromagnetic field generation device including pulse signal source, can calibrate the field uniformity of transient electromagnetic field quickly and accurately.The support of described system not only can be used for supporting and static probe, and can be used in the position and the angle that regulate probe.Compared with the calibration system of prior art, described system is obviously accelerated the calibration speed of transient electromagnetic field field uniformity.The support of described system is high to the degree of regulation of the position of popping one's head in and angle.Described system cost of manufacture is low, easy to use.
Should be appreciated that the above detailed description of technical scheme of the present invention being carried out by preferred embodiment is illustrative and not restrictive.Those of ordinary skill in the art modifies reading the technical scheme that can record each embodiment on the basis of instructions of the present invention, or part technical characterictic is wherein equal to replacement; And these amendments or replacement do not make the essence of appropriate technical solution depart from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (9)
1. for the system of quickly calibrated transient electromagnetic field field uniformity, it is characterized in that, this system comprises support (1), oscillograph (2) and at least one probe (3), described support (1) comprises support bar (11), mount pad (12), swivel eye (13), locating ring (14), rotating disc (15), knob (16) and reference test bar (17), described mount pad (12) is located at the top of described support bar (11), one side of described locating ring (14) is provided with the first flange (141), the external diameter of described the first flange (141) mates with the internal diameter of described swivel eye (13), described the first flange (141) is affixed through described swivel eye (13) and described mount pad (12), the inner circumferential side of described locating ring (14) is provided with multiple grooves (142), the center of described locating ring (14) is provided with at least one connecting key (143), one end of each described connecting key (143) and described knob (16) are affixed, the other end of each described connecting key (143) and each corresponding positioning key (144) are hinged, one side of described rotating disc (15) is provided with the second flange (151) that external diameter is less than described locating ring (14) internal diameter, described the second flange (151) is provided with the breach (152) coordinating with described positioning key (144), described the second flange (151) Yi Ce center that is provided with of described rotating disc (15) is provided with rotating shaft (153), described the second flange (151) pierces into described locating ring (14) from a side relative with described the first flange (141) of described locating ring (14), and described positioning key (144) can pass described breach (152), described knob (16) is installed in described rotating shaft (153), and described knob (16) can rotate around described rotating shaft (153), described swivel eye (13) is affixed with described rotating disc (15), described reference test bar (17) is fixed in a side relative with described the second flange (151) of described rotating disc (15), described reference test bar (17) is provided with at least one probe fixing device (171), described probe (3) is fixed on described reference test bar (17) by described probe fixing device (171), described probe (3) is electrically connected with described oscillograph (2).
2. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, described mount pad (12) is annular and is provided with multiple the first screws (121), described the first flange (141) is provided with the second screw (145) that multiple and described the first screw (121) coordinates, and described locating ring (14) is affixed with described mount pad (12) by described the first screw (121) and described the second screw (145).
3. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, described swivel eye (13) is provided with multiple the 3rd screws (131), described rotating disc (15) is provided with the 4th screw (154) that multiple and described the 3rd screw (131) coordinates, and described rotating disc (15) is affixed with described swivel eye (13) by described the 3rd screw (131) and described the 4th screw (154).
4. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, one end of each described connecting key (143) is provided with the 5th screw (1431), described knob (16) is provided with at least one the 6th screw (161) coordinating with described the 5th screw (1431), and described connecting key (143) is affixed with described knob (16) by described the 5th screw (1431) and described the 6th screw (161).
5. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, it is characterized in that, the other end of each described connecting key (143) is provided with not threaded through hole (1432), and described connecting key (143) is hinged by described through hole (1432) and described positioning key (144).
6. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, described support also comprises the base (18) affixed with the bottom of support bar (11).
7. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, the height of described support bar (11) is adjustable.
8. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, the length of described reference test bar (17) is adjustable.
9. the system for quickly calibrated transient electromagnetic field field uniformity according to claim 1, is characterized in that, described probe fixing device (171) is located at free end and/or the centre of described reference test bar (17).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309353.0A CN102830292B (en) | 2012-08-27 | 2012-08-27 | System for quickly calibrating field uniformity of transient electromagnetic field |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309353.0A CN102830292B (en) | 2012-08-27 | 2012-08-27 | System for quickly calibrating field uniformity of transient electromagnetic field |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102830292A CN102830292A (en) | 2012-12-19 |
| CN102830292B true CN102830292B (en) | 2014-06-18 |
Family
ID=47333497
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210309353.0A Expired - Fee Related CN102830292B (en) | 2012-08-27 | 2012-08-27 | System for quickly calibrating field uniformity of transient electromagnetic field |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102830292B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115507760B (en) * | 2022-11-22 | 2023-03-24 | 唐山学院 | Tubular product external diameter caliber of multiplicable accuracy |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2155576Y (en) * | 1992-09-22 | 1994-02-09 | 南通电声总厂 | Narrow gap field tester |
| CN101702010A (en) * | 2009-10-20 | 2010-05-05 | 河北工业大学 | Magnetic field measuring device based on visual guiding robot |
| CN201732078U (en) * | 2010-06-04 | 2011-02-02 | 北京工业大学 | Rotary device for clamping magnetic memory sensor |
| CN202794352U (en) * | 2012-08-27 | 2013-03-13 | 北京无线电计量测试研究所 | System for quickly calibrating evenness of transient electromagnetic field |
-
2012
- 2012-08-27 CN CN201210309353.0A patent/CN102830292B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2155576Y (en) * | 1992-09-22 | 1994-02-09 | 南通电声总厂 | Narrow gap field tester |
| CN101702010A (en) * | 2009-10-20 | 2010-05-05 | 河北工业大学 | Magnetic field measuring device based on visual guiding robot |
| CN201732078U (en) * | 2010-06-04 | 2011-02-02 | 北京工业大学 | Rotary device for clamping magnetic memory sensor |
| CN202794352U (en) * | 2012-08-27 | 2013-03-13 | 北京无线电计量测试研究所 | System for quickly calibrating evenness of transient electromagnetic field |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102830292A (en) | 2012-12-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102830289B (en) | Novel system for quickly calibrating field uniformity of transient electromagnetic field | |
| CN102841263B (en) | Device for calibrating uniformity of transient electromagnetic field | |
| CN103117444B (en) | Arc guide rail angle adjustment testing frame for field strength antenna | |
| CN205333045U (en) | Increment type rotary encoder's calibration frock | |
| CN202794354U (en) | Novel system for rapidly calibrating field uniformity of transient electromagnetic fields | |
| CN109443332A (en) | A kind of laser measurement method of the anti-monitoring turntable shafting orthogonality in land | |
| CN108828485A (en) | A kind of field intensity probe omni-directional calibration system, method and holder device | |
| CN202794352U (en) | System for quickly calibrating evenness of transient electromagnetic field | |
| CN102830292B (en) | System for quickly calibrating field uniformity of transient electromagnetic field | |
| CN203950027U (en) | A kind of fault diagnosis near field probes calibrating installation | |
| CN103776354A (en) | Concentric detector | |
| CN102830290B (en) | System with bracket for calibrating field uniformity of transient electromagnetic field | |
| CN102830293A (en) | Method and system for quickly calibrating field uniformity of transient electromagnetic field | |
| CN202794349U (en) | System for calibrating field uniformity of transient electromagnetic fields | |
| CN102830291B (en) | System for calibrating field uniformity of transient electromagnetic field | |
| CN109282733B (en) | Experimental device for measure function surface roll angle under magnetic field regulation and control | |
| CN204302300U (en) | A kind of for radio frequency simulation turntable angular speed calibrating installation detecting element mount pad | |
| CN202794350U (en) | Device for calibrating field uniformity of transient electromagnetic field | |
| CN202794351U (en) | System with support for calibrating field uniformity of transient electromagnetic field | |
| CN204374765U (en) | A kind of calibrating installation for the target-seeking semi-matter simulating system of radio frequency | |
| CN217359491U (en) | Simple repose angle tester | |
| CN104516348A (en) | Calibration device and calibration method for radio frequency homing-based semi-physical simulation system | |
| JP2007187544A (en) | Nmr device and method of positioning same | |
| CN202746873U (en) | Bracket for quickly correcting field uniformity of transient electromagnetic field | |
| CN214277340U (en) | Deflection measuring instrument support |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140618 Termination date: 20150827 |
|
| EXPY | Termination of patent right or utility model |