CN102831851A - Testing method and testing device of organic light emitting diode (OLED) substrate - Google Patents
Testing method and testing device of organic light emitting diode (OLED) substrate Download PDFInfo
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- CN102831851A CN102831851A CN2012103316505A CN201210331650A CN102831851A CN 102831851 A CN102831851 A CN 102831851A CN 2012103316505 A CN2012103316505 A CN 2012103316505A CN 201210331650 A CN201210331650 A CN 201210331650A CN 102831851 A CN102831851 A CN 102831851A
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Abstract
The embodiment of the invention provides a testing device and a testing method of an organic light emitting diode (OLED) substrate, which can shorten the test period of the OLED substrate and reduce the test cost. The device comprises an information loading substrate and a signal source; the signal loading substrate comprises a signal wire access module and a test signal access module, wherein the signal wire access module is used for being respectively connected with a data wire, a scanning wire, a power supply wire and a cathode wire of the OLED substrate; the testing signal access module is used for being connected with an external signal source, and providing a test signal respectively for the data wire, the scanning wire, the power supply wire and the cathode wire through the signal wire access module; and the signal source is used for being connected with the test signal access module of the signal loading substrate, and providing a test signal respectively for the data wire, the scanning wire, the power supply wire and the cathode wire through the signal loading substrate. The embodiment of the invention is applicable to the manufacturing field of the OLED substrate.
Description
Technical field
The present invention relates to OLED display technique field, relate in particular to a kind of method of testing and device of oled substrate.
Background technology
Adopt OLED (Organic Light-Emitting Diode; Organic Light Emitting Diode) display of organic electroluminescence is a kind of emerging flat-panel display device; Because its preparation technology is simple, cost is low, response speed is fast, be easy to realize advantage such as colour demonstration, obtained widespread use.And then along with the continuous improvement of the material property of the process technique of thin film transistor (TFT) and OLED, OLED is also more and more universal.
In order to reduce the fraction defective before the product export, be indispensable to the test of oled substrate.In the prior art,, at first need carry out vapor deposition to oled substrate for oled substrate is tested; Bind driving circuit then; Through the line by line scan pixel cell of substrate of this driving circuit, and the driving pixels unit lights OLED successively, checks successively whether this OLED exists defective.Yet adopt this mode, when OLED can't light, can't judge clearly that the defective of pixel cell still is the defective of driving circuit on the one hand, this method of testing fabrication cycle is longer on the other hand, and test technology is complicated, and cost is higher.
Summary of the invention
Embodiments of the invention provide a kind of method of testing and device of oled substrate, can shorten test duration, the reduction testing cost of oled substrate, and test technology are simple.
For achieving the above object, embodiments of the invention adopt following technical scheme:
On the one hand, the embodiment of the invention provides a kind of proving installation of oled substrate, comprises signal loading substrate and signal source;
Said signal loading substrate comprises:
Signal wire AM access module is used for being connected with data line, sweep trace, power lead and the cathode line of said oled substrate respectively;
Test signal AM access module is used for being connected with outside source, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module;
Said signal source is used for being connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.
Optional; Provide the signal source of test signal to comprise that annular inserts district and scan-probe to said sweep trace; Each access point in said belt access district is connected with a sweep trace respectively; Be loaded with the voltage that sweep trace is tested on the said scan-probe, said signal source is connected with the access point that said annular inserts the district through said scan-probe successively, line by line to every sweep trace test signal is provided.
Optional, to said sweep trace the signal source of test signal being provided is the signal source that comprises shift register, said signal source through said shift register line by line to every sweep trace test signal is provided.
Optional; Said signal source is specially to the signal that data line, sweep trace, power lead and cathode line provide respectively through said signal loading substrate: to said power lead supply voltage is provided; To said cathode line ground voltage is provided; To said data line driving voltage is provided, cut-in voltage is provided to said sweep trace.
On the other hand; The embodiment of the invention provides a kind of method of testing of oled substrate; Said method adopts proving installation that said oled substrate is tested; Said proving installation comprises signal loading substrate and signal source, and said signal loading substrate comprises signal wire AM access module and test signal AM access module, and this method comprises:
Data line, sweep trace, power lead and cathode line with said oled substrate is connected with said signal wire AM access module respectively;
To data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module; Said signal wire AM access module is connected with said signal source; Said signal source is connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.
Optional; Provide the signal source of test signal to comprise through said signal loading substrate to said sweep trace: annular inserts district and scan-probe; Each access point in said belt access district is connected with a sweep trace respectively, is loaded with the voltage that sweep trace is tested on the said scan-probe;
Said signal source is connected with the access point that said annular inserts the district through said scan-probe successively, line by line to every sweep trace test signal is provided.
Optional, to said sweep trace the signal source of test signal being provided through said signal loading substrate is the signal source that comprises shift register;
Said signal source through said shift register line by line to every sweep trace test signal is provided.
Optional, provide test signal to be specially to data line, sweep trace, power lead and cathode line respectively through said signal loading substrate:
To said power lead supply voltage is provided, ground voltage is provided, driving voltage is provided, cut-in voltage is provided to said sweep trace to said data line to said cathode line.
The embodiment of the invention provides a kind of proving installation and method of testing of oled substrate, and this proving installation is general proving installation for oled substrate.This device comprises signal loading substrate and signal source.Wherein the signal loading substrate comprises signal wire AM access module and test signal AM access module; Signal wire AM access module links to each other with data line, sweep trace, power lead and the cathode line of said oled substrate respectively; Test signal AM access module is connected with outside source; To data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module; And said signal source is used for being connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.Like this time to the test of oled substrate; No longer need carry out vapor deposition to said oled substrate; Bind special-purpose driving circuit then, but only provide test signal just can test to this OLED, thereby can shorten the test period of this OLED through this general proving installation; Reduce testing cost, test technology is simple.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
The proving installation structural representation of a kind of oled substrate that Fig. 1 provides for the embodiment of the invention;
The proving installation structural representation of the another kind of oled substrate that Fig. 2 provides for the embodiment of the invention;
Fig. 3 is the pixel-driving circuit synoptic diagram of oled substrate;
The proving installation structural representation of another oled substrate that Fig. 4 provides for the embodiment of the invention;
The method of testing schematic flow sheet of a kind of oled substrate that Fig. 5 provides for the embodiment of the invention.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.
The embodiment of the invention provides a kind of proving installation of oled substrate, and is as shown in Figure 1, and this proving installation comprises signal loading substrate 11 and signal source 12.
Wherein, said signal loading substrate 11 comprises signal wire AM access module 111 and test signal AM access module 112.
Signal wire AM access module 111 is used for being connected with data line, sweep trace, power lead and the cathode line of said oled substrate respectively.
Test signal AM access module 112 is used for being connected with outside source, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module.
Said signal source 12 is used for being connected with the test signal AM access module 112 of said signal loading substrate 11, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate 11.
Concrete, as shown in Figure 1, the signal wire AM access module 111 on the said signal loading substrate 11 includes the tie-in line of a plurality of sweep traces, is respectively applied for the sweep trace of said oled substrate to be connected; Signal wire AM access module 111 also includes the tie-in line of a plurality of data lines, is connected with the data line of said oled substrate respectively; Signal wire AM access module 111 also comprises the power lead tie-in line, is connected with the power lead of said oled substrate; Signal wire AM access module 111 also includes the cathode line tie-in line, is connected with the cathode line of said oled substrate.And test signal AM access module 112 is connected with signal source 12, and data line, sweep trace, power lead and the cathode line to said oled substrate provides test signal respectively.
Optional, as shown in Figure 2 when oled substrate is tested line by line, provide the signal source 12 of test signal to comprise that annular inserts district 121 and scan-probe 122 to said sweep trace.Wherein each access point in annular access district 121 is connected with a sweep trace respectively through said signal loading substrate 11; Be loaded with the voltage signal that sweep trace is tested on the said scan-probe 122; The access point that said scan-probe 122 inserts district 121 with said annular successively is to being connected, line by line to every sweep trace test signal is provided.
Wherein, said scan-probe 122 can artificially rotate line by line to every sweep trace test signal is provided, certainly, this scan-probe 122 can be made shuttling movement.
Further,, the display performance of the oled substrate under the different refresh rates can be detected, burn-in test can be realized simultaneously this oled substrate through controlling the movement rate of said scan-probe 122.
Simultaneously; Said signal source 12 is driving voltage through said signal loading substrate 11 to the test voltage signal that the data line of said OLED provides; The voltage that provides to power lead is supply voltage; The voltage that provides to cathode line is ground voltage, and the voltage that loads on the said scan-probe 122 is cut-in voltage.
Exemplary; With reference to the TFT driving circuit figure of oled substrate pixel shown in Figure 3, this driving circuit comprises transistor T 1 and T2, and the voltage that loads on the said scan-probe 122 is+10V; The cut-in voltage Vsc that promptly provides at the sweep trace to certain delegation is during for+10V; The driving voltage Vdata that provides to data line is+10V that the supply voltage that provides to power lead is+10V that the ground voltage that provides to cathode line is+0V.At this moment, if under this pixel operate as normal, transistor T 2 conductings, MM CAP Cs begins to charge, and along with the grid potential raising gradually of T1, T1 begins conducting, thereby lights the OLED of this row.And when there is defective in said TFT driving circuit; Abnormal during the show state of this oled substrate; If the sweep trace of this row opens circuit at a certain location of pixels; Then the OLED from the input end of sweep trace to the pixel cell of sweep trace trip point side is in illuminating state, and the OLED after trip point can't light; And if the sweep trace short circuit of this row, the situation that then can exist the OLED of multirow pixel to be lighted on this oled substrate.Also possibly there is other defective in certain said oled substrate, and the embodiment of the invention repeats no more at this.
What be worth explanation is, the TFT driving circuit of OLED pixel shown in Figure 3 only is used for exemplary explanation, and the TFT driving circuit of non-limiting oled substrate pixel of the present invention.Which kind of driving circuit embodiment of the invention is the pixel of this oled substrate specifically adopt do not do concrete qualification.
Based on above process, the realization that this oled substrate proving installation can be simple is tested every row of said oled substrate.
Optional, to said sweep trace the signal source 12 of test signal being provided can also be the signal source that comprises shift register, said signal source 12 through said shift register line by line to every sweep trace test signal is provided.Thereby can realize the test line by line to oled substrate, the detailed process present embodiment repeats no more at this.
Certainly, this moment, said signal source 12 was a driving voltage to the test signal that the data line of said OLED provides also through said signal loading substrate 11, and the voltage that provides to power lead is supply voltage, and the voltage that provides to cathode line is ground connection.
Optional, through the proving installation of said oled substrate, can also realize full frame test to OLED; At this moment; As shown in Figure 4, said signal source 12 is specially to the signal that data line, sweep trace, power lead and cathode line provide respectively through said signal loading substrate 11: to said power lead supply voltage is provided, to said cathode line ground voltage is provided; To said data line driving voltage is provided, cut-in voltage is provided to said sweep trace.
When oled substrate is carried out full frame test; When if this oled substrate does not have defective; This oled substrate is to be in the full frame state of lighting, and this moment when if there is the defective that opens circuit in the pixel of oled substrate, the pixel that opens circuit on this oled substrate can't be lighted.So can conveniently detect this oled substrate exists open defect.
Need to prove; The driving voltage, supply voltage and the ground voltage that in the reality test, provide to said sweep trace, data line, power lead and cathode line respectively; According to the difference of the specification requirement of oled substrate and difference, the embodiment of the invention is not done concrete qualification to this.
Wherein, said oled substrate proving installation preferably is used for the test to AMOLED (ActiveMatrix Organic Light Emission Display, active matrix/organic light emitting display) substrate.
Optional, this proving installation comprises signal loading substrate 11 and signal source 12.Wherein said signal loading substrate 11 can be arranged on FPC and go up (flexible printed circuit board claimed again in the abbreviation of Flexible Printed Circuit), and signal source 12 can be arranged on PCB and go up (abbreviation of Printed Circuit Board, printed circuit board (PCB)).
The embodiment of the invention provides a kind of proving installation of oled substrate, and this proving installation is general proving installation for oled substrate.This device comprises signal loading substrate and signal source.Wherein said signal loading substrate comprises signal wire AM access module and test signal AM access module; Signal wire AM access module links to each other with data line, sweep trace, power lead and the cathode line of said oled substrate respectively; Test signal AM access module is connected with outside source; To data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module; And said signal source is used for being connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.Like this time to the test of oled substrate; No longer need carry out vapor deposition to said oled substrate; Bind special-purpose chip for driving then, but only provide test signal just can test to this OLED, thereby can shorten the test period of this OLED through this general proving installation; Reduce testing cost, and test technology is simple.
The embodiment of the invention also provides a kind of method of testing of oled substrate; The proving installation that said method adopts embodiment one to provide is tested said oled substrate; As shown in Figure 1, said proving installation comprises signal loading substrate 11 and signal source 12, and said signal loading substrate 11 comprises signal wire AM access module 111 and test signal AM access module 112; As shown in Figure 5, this method comprises:
S501, data line, sweep trace, power lead and the cathode line with said oled substrate is connected with said signal wire AM access module 111 respectively.
Concrete, as shown in Figure 1, the signal wire AM access module 111 on the said signal loading substrate 11 includes the tie-in line of a plurality of sweep traces, is respectively applied for the sweep trace of said oled substrate to be connected; Signal wire AM access module 111 also includes the tie-in line of a plurality of data lines, is connected with the data line of said oled substrate respectively; Signal wire AM access module 111 also comprises the power lead tie-in line, is connected with the power lead of said oled substrate; Signal wire AM access module 111 also includes the cathode line tie-in line, is connected with the cathode line of said oled substrate.And test signal AM access module 112 is connected with signal source 12, and data line, sweep trace, power lead and the cathode line to said oled substrate provides test signal respectively.
S502, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module 111; Said signal wire AM access module 111 is connected with said signal source 12; Said signal source is connected with the test signal AM access module 112 of said signal loading substrate 11, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate 11.
Optional; When oled substrate is tested line by line; Provide the signal source of test signal to comprise through said signal loading substrate 11 to said sweep trace: annular inserts district and scan-probe; Each access point in said belt access district is connected with a sweep trace respectively, is loaded with the voltage that sweep trace is tested on the said scan-probe;
Said signal source is connected with the access point that said annular inserts the district through said scan-probe successively, line by line to every sweep trace test signal is provided.
Wherein, said scan-probe can artificially rotate line by line to every sweep trace test signal is provided, certainly, this scan-probe can be made shuttling movement.
Further,, the display performance of the oled substrate under the different refresh rates can be detected, burn-in test can be realized simultaneously this oled substrate through controlling the movement rate of said scan-probe.
When testing line by line; Said signal source 12 is driving voltage through said signal loading substrate 11 to the test signal that the data line of said OLED provides; The voltage that provides to power lead is supply voltage; The voltage that provides to cathode line is ground voltage, and the voltage that loads on the said scan-probe is cut-in voltage.
Optional, to said sweep trace the signal source of test signal being provided through said signal loading substrate is the signal source that comprises shift register;
Said signal source through said shift register line by line to every sweep trace test signal is provided.
Certainly, this moment, said signal source 12 was a supply voltage to the test signal that the data line of said OLED provides also through said signal loading substrate 11, and the voltage that provides to power lead is supply voltage, and the voltage that provides to cathode line is ground voltage.
Optional, through the proving installation of said oled substrate, can also realize full frame test to OLED.Wherein, provide test signal to be specially to data line, sweep trace, power lead and cathode line respectively through said signal loading substrate 11:
To said power lead supply voltage is provided, ground voltage is provided, the driving DC voltage is provided, cut-in voltage is provided to said sweep trace to said data line to said cathode line.
When oled substrate is carried out full frame test; When if this oled substrate does not have defective; This oled substrate is to be in the full frame state of lighting, and this moment when if there is the defective that opens circuit in the pixel of oled substrate, the pixel that opens circuit on this oled substrate can't be lighted.So can conveniently detect this oled substrate exists open defect.
Need to prove; The driving voltage, supply voltage and the ground voltage that in the reality test, provide to said sweep trace, data line, power lead and cathode line respectively; According to the difference of the specification requirement of oled substrate and difference, the embodiment of the invention is not done concrete qualification to this.
Wherein, said oled substrate method of testing preferably is used for the test to the AMOLED substrate.
Optional; Said oled substrate method of testing can be bound each signal wire of oled substrate through FPC; Link to each other with PCB through FPC then, only guide to scan signal line on the PCB this moment, through the test signal of scan signal line is provided on PCB; Position beyond PCB provides the test signal of all the other signal wires simultaneously, promptly can on PCB, just accomplish the detection to oled substrate.
Preferably; Said oled substrate method of testing is bound each signal wire of oled substrate through FPC, link to each other with PCB through FPC then, and each signal wire is guided on the PCB; Through the corresponding test signal of each signal wire is provided, promptly can on PCB, just accomplish detection to oled substrate on PCB.
The embodiment of the invention provides a kind of method of testing of oled substrate, and the proving installation that this method of testing adopts the foregoing description to provide is tested, and this proving installation is general proving installation for oled substrate.This device comprises signal loading substrate and signal source.Wherein the signal loading substrate comprises signal wire AM access module and test signal AM access module; Signal wire AM access module links to each other with data line, sweep trace, power lead and the cathode line of said oled substrate respectively; Test signal AM access module is connected with outside source; To data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module; And said signal source is used for being connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.Like this time to the test of oled substrate; No longer need carry out vapor deposition to said oled substrate; Bind special-purpose chip for driving then, but only provide test signal just can test to this OLED, thereby can shorten the test period of this oled substrate through this general proving installation; Reduce testing cost, and test technology is simple.
The above; Be merely embodiment of the present invention, but protection scope of the present invention is not limited thereto, any technician who is familiar with the present technique field is in the technical scope that the present invention discloses; Can expect easily changing or replacement, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of said claim.
Claims (8)
1. the proving installation of an oled substrate is characterized in that, comprises signal loading substrate and signal source;
Said signal loading substrate comprises:
Signal wire AM access module is used for being connected with data line, sweep trace, power lead and the cathode line of said oled substrate respectively;
Test signal AM access module is used for being connected with outside source, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module;
Said signal source is used for being connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.
2. proving installation according to claim 1; It is characterized in that; Provide the signal source of test signal to comprise that annular inserts district and scan-probe to said sweep trace, each access point in said belt access district is connected with a sweep trace respectively, is loaded with the voltage that sweep trace is tested on the said scan-probe; Said scan-probe is connected with the access point that said annular inserts the district successively, line by line to every sweep trace test signal is provided.
3. proving installation according to claim 1 is characterized in that, to said sweep trace the signal source of test signal being provided is the signal source that comprises shift register, said signal source through said shift register line by line to every sweep trace test signal is provided.
4. proving installation according to claim 1; It is characterized in that; Said signal source is specially to the signal that data line, sweep trace, power lead and cathode line provide respectively through said signal loading substrate: to said power lead supply voltage is provided; To said cathode line ground voltage is provided, driving voltage is provided, cut-in voltage is provided to said sweep trace to said data line.
5. the method for testing of an oled substrate; It is characterized in that; Said method adopts the oled substrate proving installation that said oled substrate is tested; Said oled substrate proving installation comprises signal loading substrate and signal source, and said signal loading substrate comprises signal wire AM access module and test signal AM access module, and this method comprises:
Data line, sweep trace, power lead and cathode line with said oled substrate is connected with said signal wire AM access module respectively;
To data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal wire AM access module; Said signal wire AM access module is connected with said signal source; Said signal source is connected with the test signal AM access module of said signal loading substrate, to data line, sweep trace, power lead and cathode line test signal is provided respectively through said signal loading substrate.
6. method of testing according to claim 5; It is characterized in that; Provide the signal source of test signal to comprise through said signal loading substrate to said sweep trace: annular inserts district and scan-probe; Each access point in said belt access district is connected with a sweep trace respectively, is loaded with the voltage that sweep trace is tested on the said scan-probe;
Said signal source is connected with the access point that said annular inserts the district through said scan-probe successively, line by line to every sweep trace test signal is provided.
7. method of testing according to claim 5 is characterized in that, to said sweep trace the signal source of test signal being provided through said signal loading substrate is the signal source that comprises shift register;
Said signal source through said shift register line by line to every sweep trace test signal is provided.
8. method of testing according to claim 5 is characterized in that, provides test signal to be specially to data line, sweep trace, power lead and cathode line respectively through said signal loading substrate:
To said power lead supply voltage is provided, ground voltage is provided, driving voltage is provided, cut-in voltage is provided to said sweep trace to said data line to said cathode line.
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| CN102831851B (en) | 2015-06-17 |
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