CN102759442B - Method for determining optical axis of diffractive optical element through position chromatism - Google Patents
Method for determining optical axis of diffractive optical element through position chromatism Download PDFInfo
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- CN102759442B CN102759442B CN201210237546.XA CN201210237546A CN102759442B CN 102759442 B CN102759442 B CN 102759442B CN 201210237546 A CN201210237546 A CN 201210237546A CN 102759442 B CN102759442 B CN 102759442B
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Abstract
The invention provides a method for determining an optical axis of a diffractive optical element through position chromatism, which can simply and effectively realize determination on the optical axis of a diffractive optical element in an optical system. The method comprises the following steps: (1) leading collimated light beam to pass through the diffractive optical element, using an observation device to observe different coloured light focuses of collimated light beam by generating position chromatism through diffraction; (2) rotating the diffractive optical element, observing different coloured light focuses by the observation device, and keeping the rotating position of the diffractive optical element rotating when the rotating angle of the rotating focus is minimal; and (3) determining the optical axis of the diffractive optical element through fitted straight line of the focuses. The method can determine the optical axis of the diffractive optical element in the optical system by smartly using the characteristic of superlong position chromatism of the diffractive optical element through simple and convenient operation. The device needed in the method is simple and easy to realize, and the determination result accuracy of the optical axis is high.
Description
Technical field
The present invention relates to a kind of defining method of optical axis of diffraction optical element.
Background technology
Structure based on excellence simplifies function, and diffraction optical element is applied to actual optical system more and more, derives the high precision adjustment orientation problem of diffraction optical element in optical system thereupon.Realize diffraction element consistent with the optical axis of other element of optical system, first will determine the optical axis of diffraction optical element.
At present, conventional defining method be by diffraction optical element or be attached thereto, structural benchmark determination optical axis that the constitutional detail that coordinates is formed in processing and manufacturing process, main Problems existing is that optical axis determination precision and the manufacture level degree of correlation are high, when needs hi-Fix, the benchmark only relying on manufacture process to be formed, is difficult to meet the demands.
Summary of the invention
The invention provides a kind of diffraction optical element chromatism of position and determine optical axis method, the determination of the optical axis to diffraction optical element in optical system can be realized simply and effectively.
For realizing above goal of the invention, the present invention proposes following basic solution:
Diffraction optical element chromatism of position determines optical axis method, comprises the following steps:
(1) make collimated light beam by described diffraction optical element, observed the collimated light beam different color light focus producing chromatism of position through diffraction by observation device;
(2) rotating diffraction optical element, observes different color light focus by observation device, when the focus rotation amount rotated is minimum, keeps the position of rotation of now rotating diffraction optical element;
(3) now namely each focus place fitting a straight line is defined as the optical axis of diffraction optical element.
Based on above basic scheme, the present invention has also done following optimization and has limited:
Above-mentioned collimated light beam is white light, or the quasi-monochromatic light of two or more coloured light, and (quasi-monochromatic light of two or more coloured light also can arrange corresponding accurate monochromatic filter by installation before white light is incident to diffraction optical element and realize.）
Above-mentioned observation device is continuous zoom microscope, or telescope, or the microscope of subsidiary axial guidance, or the collimator of subsidiary pre-objective.
Only can choose two kinds of different color light focuses and carry out the optical axis that fitting a straight line is defined as diffraction optical element.
The present invention has the following advantages:
1, make use of the feature of diffraction optical element overlength chromatism of position dexterously, the optical axis of diffraction optical element in optical system can be determined by easy operation.
2, required device is simple and easy to realize, and optical axis determination result degree of accuracy is high.
Accompanying drawing explanation
Fig. 1 is schematic diagram of the present invention.
Embodiment
Below in conjunction with accompanying drawing, to the further example explanation of the present invention.
The present invention utilizes the feature of diffraction optical element overlength chromatism of position, uses white light or two or more quasi-monochromatic light collimated light beam, through diffraction optical element, and by the whirligig of certain running accuracy, by observing focus on different color light axle, determines optical axis.
As shown in Figure 1,1 be wherein diffraction optical element; 2 is collimated light beam (white light, or the white light of more than subsidiary two kinds of coloured light accurate monochromatic filter, or the quasi-monochromatic light of two or more coloured light; 3 is whirligig, and observe by high-precision whirligig, the fitting precision of optical axis is relevant with the running accuracy of this whirligig; 4 is observation device (microscope of subsidiary axial guidance, or continuous zoom microscope, or telescope, or the collimator of subsidiary collimator objective).
Diffraction optical element chromatism of position is determined optical axis method and is specifically comprised the following steps:
(1) make collimated light beam by described diffraction optical element, observed the collimated light beam different color light focus producing chromatism of position through diffraction by observation device;
(2) rotating diffraction optical element, observes different color light focus by observation device, when the focus rotation amount rotated is minimum, keeps the position of rotation of now rotating diffraction optical element;
(3) choose two kinds of different color light focuses, the straight line that matching obtains can think the optical axis of diffraction optical element.
Claims (3)
1. diffraction optical element chromatism of position determines optical axis method, comprises the following steps:
(1) make collimated light beam by described diffraction optical element, observed the collimated light beam different color light focus producing chromatism of position through diffraction by observation device; Described collimated light beam is white light, or the quasi-monochromatic light of two or more coloured light;
(2) rotating diffraction optical element, observes different color light focus by observation device, when the focus rotation amount rotated is minimum, keeps the position of rotation of now rotating diffraction optical element;
(3) now namely each focus place fitting a straight line is defined as the optical axis of diffraction optical element.
2. diffraction optical element chromatism of position according to claim 1 determines optical axis method, it is characterized in that: described observation device is continuous zoom microscope, or telescope, or the microscope of subsidiary axial guidance, or the collimator of subsidiary pre-objective.
3. diffraction optical element chromatism of position according to claim 1 determines optical axis method, it is characterized in that: step (3) is only chosen two kinds of different color light focuses and carried out the optical axis that fitting a straight line is defined as diffraction optical element.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210237546.XA CN102759442B (en) | 2012-07-10 | 2012-07-10 | Method for determining optical axis of diffractive optical element through position chromatism |
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| CN201210237546.XA CN102759442B (en) | 2012-07-10 | 2012-07-10 | Method for determining optical axis of diffractive optical element through position chromatism |
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| CN102759442A CN102759442A (en) | 2012-10-31 |
| CN102759442B true CN102759442B (en) | 2015-01-07 |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105510002B (en) * | 2015-12-21 | 2017-12-26 | 中国科学院长春光学精密机械与物理研究所 | Transmission sphere ripple camera lens is fitted the determination method of optical axis |
| CN106773459B (en) * | 2016-12-16 | 2019-02-01 | 歌尔股份有限公司 | A kind of focusing method, device and camera for camera |
| CN106950688A (en) * | 2017-05-08 | 2017-07-14 | 苏州大学 | A kind of wide spectrum film photon screen space telescopic system |
Citations (3)
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| CN1864166A (en) * | 2003-08-25 | 2006-11-15 | 讯宝科技公司 | Axial chromatic aberration auto-focusing system and method |
| CN101553721A (en) * | 2006-12-14 | 2009-10-07 | 松下电器产业株式会社 | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
| CN102445329A (en) * | 2011-09-29 | 2012-05-09 | 中国航空工业集团公司洛阳电光设备研究所 | Rapid determining method for optical axis of continuous zoom lens |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008107274A (en) * | 2006-10-27 | 2008-05-08 | Olympus Corp | Device for measuring focal position |
| JP2010169473A (en) * | 2009-01-21 | 2010-08-05 | Konica Minolta Opto Inc | Method of detecting optical axis position of lens and method of measuring eccentricity |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1864166A (en) * | 2003-08-25 | 2006-11-15 | 讯宝科技公司 | Axial chromatic aberration auto-focusing system and method |
| CN101553721A (en) * | 2006-12-14 | 2009-10-07 | 松下电器产业株式会社 | Method for measuring optical characteristics of diffraction optical element and apparatus for measuring optical characteristics of diffraction optical element |
| CN102445329A (en) * | 2011-09-29 | 2012-05-09 | 中国航空工业集团公司洛阳电光设备研究所 | Rapid determining method for optical axis of continuous zoom lens |
Non-Patent Citations (3)
| Title |
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| JP特开2008-107274A 2008.05.08 * |
| JP特开2010-169473A 2010.08.05 * |
| 共轴光学系统计算机辅助光轴一致性装调研究;段学霆;《中国优秀硕士学位论文全文数据库工程科技II辑》;20070615(第6期);参见第26页第3.2.1节透射式定中心方法，图3-5 * |
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