CN102742021A - Solar simulator and measurement method using same - Google Patents
Solar simulator and measurement method using same Download PDFInfo
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- CN102742021A CN102742021A CN2010800628326A CN201080062832A CN102742021A CN 102742021 A CN102742021 A CN 102742021A CN 2010800628326 A CN2010800628326 A CN 2010800628326A CN 201080062832 A CN201080062832 A CN 201080062832A CN 102742021 A CN102742021 A CN 102742021A
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- 238000000691 measurement method Methods 0.000 title abstract 4
- 230000004044 response Effects 0.000 claims abstract description 48
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- 238000003556 assay Methods 0.000 claims description 54
- 238000001514 detection method Methods 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 20
- 230000003287 optical effect Effects 0.000 claims description 10
- 238000013480 data collection Methods 0.000 claims description 9
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- 230000001678 irradiating effect Effects 0.000 abstract 1
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- 230000008859 change Effects 0.000 description 29
- 238000010586 diagram Methods 0.000 description 14
- 229910052724 xenon Inorganic materials 0.000 description 14
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 14
- 230000009471 action Effects 0.000 description 12
- 238000012545 processing Methods 0.000 description 8
- 230000036962 time dependent Effects 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000004088 simulation Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000033228 biological regulation Effects 0.000 description 4
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- 230000036755 cellular response Effects 0.000 description 2
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- 230000007423 decrease Effects 0.000 description 2
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- 239000011521 glass Substances 0.000 description 2
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- 230000000630 rising effect Effects 0.000 description 2
- 241000272525 Anas platyrhynchos Species 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000013506 data mapping Methods 0.000 description 1
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- 238000005516 engineering process Methods 0.000 description 1
- -1 ethylidene vinyl Chemical group 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
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Abstract
Disclosed is a measurement method using a solar simulator which can shorten the light emission duration of a light source lamp and measure the output characteristics of a solar cell, even when said solar cell has slow response characteristics. Further disclosed is a solar simulator for implementing the measurement method. A measurement method using a solar simulator has: a step whereby one or more light sources are made to simultaneously emit a flash in which the top of the pulse waveform becomes level; and a step whereby a multi-point measurement of the current and voltage output from a solar cell to be measured is carried out by irradiating the flash onto the solar cell and sweeping the electronic load of the solar cell, while using an illuminance detector for illuminance control. The speed of instructions to an electronic load command is variably controlled in accordance with the response characteristics of the solar cell to be measured, and the current and voltage output from the solar cell are measured while the flash is irradiated onto the solar cell to be measured.
Description
Technical field
The invention relates to the solar simulator of the current-voltage characteristic that photo-electric conversion element and panel body thereof such as a kind ofly is used at a high speed, solar cell is measured on pinpoint accuracy ground (below, only be called characteristic) and utilize the assay method of solar simulator.
Background technology
The light transfer characteristic of photo-electric conversion elements such as solar cell, optical excitation electric device, optical inductor is under rayed, measures through the current-voltage characteristic of measuring said photo-electric conversion element.In the characteristic measurement of solar cell, be transverse axis with voltage, electric current is the longitudinal axis, the data mapping with collected obtains output characteristic curve.This curve generally is called the IV curve.
As the said determination method, comprise and utilize sunlight as the method for irradiates light and utilize the method for artificial light source as irradiates light.Wherein, utilize the method for artificial light source, comprise the method for use light stable (steady light) light source that patent documentation 1,2 etc. is put down in writing and use the method for stroboscopic light sources as irradiates light.
So far, along with the practicability of photo-electric conversion element, particularly light-receiving area big photo-electric conversion element such as solar cell (the following solar cell that only is called), its current-voltage characteristic is to be 1000W/m in sunlight standard illumination
2About radiation illumination under measure.Illumination during mensuration does not reach 1000W/m above reaching
2Part compensate calculating according to the calculating formula of illuminance compensation.
In the mensuration of the current-voltage characteristic of the big solar cell of area, must shine illumination 1000W/m equably to large-area sensitive surface
2About light.Therefore, when utilizing artificial light source, for example every 1m
2Irradiated area just need the powerful discharge lamp about tens of kw.And, when utilizing the powerful discharge lamp of this kind to produce light stable, must a large amount of electric power of stable supplying.Therefore, need the equipment of great scale, thereby lack actuality.
In using the solar simulator of light stable, use the xenon lamp of lighting usefulness continuously or metal halid lamp as illuminator.Figure 10 representes the illumination and the time relation of this lamp.So shown in the figure, this lamp from light need usually till stable to begin to illumination time-consuming more than tens of minutes.In addition, if do not continue under the same conditions to light, the illumination state that just can not reach capacity then reaches and measures requirement and need long time.On the other hand, if light for a long time, it is elongated to accumulate the time of lighting a lamp, and then illumination has tendency decrescence, causes illumination characteristic unstable.In addition, the rayed that the solar cell as tested body is carried out is that the irradiation time of tested body depends on the responsiveness of shutter through the opening and close and switch irradiation and shading of shutter, and irradiation time is usually more than several 100msec.If irradiation time is long, will causes the temperature rising of solar cell itself and make the high mensuration of accuracy become difficult.
In using the solar simulator of light stable, continue to light in order to make stable must the keeping of illumination, yet, continue to light the case temperature of accommodating light source is significantly risen.In addition, the part in the housing is owing to be exposed in the light through regular meeting, and becomes the reason of optical element (mirror, optical filter) deterioration.
In addition, after the illuminator of light stable extinguishes, light again and reach saturation condition to illumination and still need tens of minutes.For fear of this problem, the illuminator with light stable remains on the state that continues to light usually.Its result causes the accumulation of the illuminator of the light stable time of lighting to increase, and is easy to reach at short notice the lamp life-span.
Therefore, in the production line of solar module, if use the solar simulator of light stable mode, the radical of the lamp of consumption adds in the operating cost, thereby not only increases cost of determination, and increases the manufacturing cost of solar cell.
In the solar simulator of light stable, light source is longer to the time that the solar cell as tested body shines.Therefore, same solar cell is carried out the mensuration of IV curve repeatedly, the temperature of solar cell is risen.Generally speaking, if the temperature of solar cell rises, then output voltage has the tendency of reduction, and temperature rises, and also will reduce maximum output Pmax.Therefore, when using the solar simulator of light stable, measure the temperature of solar cell in the mensuration process, and carry out temperature-compensating according to specification institution is compensation.
Yet the temperature measuring not a duck soup of solar cell has following problem.For general dwelling house etc. the solar cell of electric power being provided is on glass range upon range of EVA (ethylidene vinyl acetate), solar battery cell, EVA in face side, and rear side is provided with resinous back-sheet, the stepped construction that the said range upon range of back of lamination forms.When on production line, measuring the temperature of solar cell, only can measure the temperature on back-sheet surface or the temperature of glass surface with this stepped construction.Therefore, even if from the light that solar simulator irradiated solar battery cell is temporarily risen because of receiving the light temperature, the temperature of correctly measuring solar battery cell itself also is quite difficult.The difficulty thereby the temperature that makes pinpoint accuracy ground measure solar battery cell becomes.Therefore, be difficult to correctly carry out temperature-compensating.
Therefore, motion has the method for not using light stable, measuring the current-voltage characteristic of the big solar cell of area through the generation flash of light.The light source that produces simulated solar irradiation through flash of light adopts xenon lamp, and assay method comprises that use is once glistened but the fluorescent lifetime assay method of long single flash of light; And use repeatedly flash of light but the assay method of the short flashing that fluorescent lifetime is lacked.
No matter be the current-voltage characteristic of utilizing which kind of flash spotting solar cell, therefore the problem in that the temperature that can as light stable, cause solar cell in the mensuration hardly rises has the advantage that need carry out temperature-compensating hardly.
In addition, utilize flash of light to carry out in the solar simulator of data collection,, compare, can alleviate the deterioration of optical element, thereby have the advantage that prolongs the lamp life-span with the above-mentioned solar simulator of light stable that utilizes because fluorescent lifetime shortens.
Yet generally speaking, xenon lamp is when some intense flash, and its illumination is irregular.Therefore, when carrying out a some intense flash, must give the allowed band about illumination ± 5%.And even the illumination when luminous is carried out illuminance compensation, but allowed band is big more, measures accuracy and reduces relatively.
In addition, if solar cell is carried out load scanning obtain the IV characteristic curve, must produce the long pulse that surpasses 100msec through once luminous.In order to produce the luminous of this long pulse, the dead time between once luminous and next time luminous must be grown.Therefore, in initial flash of light was lighted, if the adjustment of improper and illumination not exclusively because of illumination, lighting of next time must be waited for for a long time.Heavy load when in addition, flash of light is lighted can shorten the life-span as the xenon lamp of light source.
Repeatedly shine in the assay method of short flashing,, can lack the interval and carry out luminous because the load that flash of light is lighted is little.Because fluorescent lifetime is short, the inner situation (for example, temperature) of lamp can not change yet, thereby illumination is stable.Because the temperature as the solar cell of tested body can not rise, and need not carry out temperature-compensating yet.
Yet, utilize the mensuration of short flashing that following problem is also arranged.What Figure 11 represented is the short flashing waveform.As shown in the drawing, repeatedly the waveform of each flash of light of irradiation all has the shape of the chevron (amplitude of chevron bottom is about 1msec) of not having the par in the top.Therefore, in once flash of light is lighted, the data that can only collect one group (output current of illumination, solar cell and voltage).
No. 2886215 communique of [patent documentation 1] Japan Patent
[patent documentation 2] TOHKEMY 2003-31825 communique
Summary of the invention
Therefore, the assay method of existing solar simulator has as above problem.In at the slow solar cell of response characteristic, like many maqting type solar cell, when utilizing short pulse to measure, the problems referred to above cause easily following the trail of illumination change, make output crossed the low inappropriate situation of measuring.When utilizing light stable to measure,, can obviously worsen the life-span of optical elements such as lamp because the fluorescent lifetime of illuminator is long.
When measuring the output characteristic of the slow solar cell of response characteristic; The fluorescent lifetime of lamp is elongated not only obviously to be worsened the lamp life-span; And the irradiation that receives lamp owing to the solar cell as tested body for a long time heats up, and causes the solar cell output characteristic to change and influence mensuration accuracy.In addition, because minute is long, needing can for a long time luminous stroboscopic light sources, thereby causes the maximization increase cost of light source igniting device.
In view of the above problems; The objective of the invention is to: even if provide a kind of response characteristic slow solar cell, the fluorescent lifetime that also can as far as possible shorten illuminator is measured the assay method that utilizes solar simulator of solar cell output characteristic and is used to implement the solar simulator of this method.。
In order to solve above-mentioned problem, the assay method of solar simulator of the present invention comprises: light at least more than one light source simultaneously, the top of sending impulse waveform is the operation of the flash of light of flat condition; And with this flash irradiation to carrying out illumination control as the solar cell of tested body and through the luminance detection device when; The electronic load and the multi-site determination that scan this solar cell are from the electric current of solar cell output and the mensuration operation of voltage; The said assay method of solar simulator that utilizes is characterised in that; When the solar cell as tested body is shone this flash of light; According to the response characteristic of this solar cell and variable control to the indication speed of electronic load instruction, measure electric current and voltage that this solar cell is exported.
In order to solve above-mentioned problem, the assay method of the other type of solar simulator of the present invention comprises: light at least more than one light source simultaneously, the top of sending impulse waveform is the operation of the flash of light of flat condition; And with this flash irradiation to carrying out illumination control as the solar cell of tested body and through the luminance detection device when; The electronic load and the multi-site determination that scan this solar cell are from the electric current of solar cell output and the mensuration operation of voltage; The said assay method of solar simulator that utilizes is characterised in that; When the solar cell as tested body is shone this flash of light; According to the response characteristic of this solar cell and variable control to the indicated value of electronic load instruction and the sweep speed of adjustment electronic load instruction automatically, measure electric current and voltage that this solar cell is exported.
In said structure; The assay method of solar simulator that utilizes of the present invention also can be with this flash irradiation to the solar cell as tested body; Set the pattern of the sweep speed of numerous variations electronic load for each zone of the electronic load that is scanned; And select corresponding pattern to come the scanning electron load according to the response characteristic of the solar cell of tested body, measure electric current and the voltage exported as the solar cell of tested body.
The assay method that utilizes solar simulator of the present invention also can be according to the minute of the solar cell of tested body, make light source luminous at least once more than, the measuring point of electric current and voltage is divided into multiple spot respectively measures.
The assay method that utilizes solar simulator of the present invention also can make the fabric width of upper planar portion of optical pulse waveform of said flash of light below the above 500msec of 100msec.
The solar simulator that is used to implement the said determination method has: light source, and it is to the solar cell illumination flash as tested body; The luminance detection device, it detects the flash of light illumination of this light source; The load circuit of said tested body, it has electronic load; Control circuit, it carries out scan control to said electronic load; And data collection portion, it collects the electric current that said tested body exports and the data of voltage; Said solar simulator is characterised in that; The said control circuit of scan control electronic load is when shining this flash of light to the solar cell as tested body; According to the response characteristic of this solar cell and variable control to the indication speed of electronic load instruction, measure electric current and voltage that this solar cell is exported.
In addition, the solar simulator that is used to implement the said determination method has: light source, and it is to the solar cell illumination flash as tested body; The luminance detection device, it detects the flash of light illumination of this light source; The load circuit of said tested body, it has electronic load; Control circuit, it carries out scan control to said electronic load; And data collection portion; It collects the electric current that said tested body exports and the data of voltage; Said solar simulator is characterised in that, the said control circuit of scan control electronic load is to should flash of light as the solar cell irradiation of tested body the time, according to the response characteristic of this solar cell and variable control to the indicated value of electronic load instruction; Automatically the sweep speed of adjustment electronic load instruction is measured electric current and voltage that this solar cell is exported.
The invention effect
Among the present invention, at flash irradiation during as the solar cell of determinand, according to the response characteristic of solar cell and the command speed of variable control electronic load instruction the time, the sweep speed of variable control electronic load instruction.Even if when measuring the solar cell of low-response, also only need the sweep speed of the electronic load instruction of the part of low-response is postponed to get final product.Therefore, can shorten minute, the flash time of light source is dropped to minimum necessary limit.Thereby do not waste lighting the time of illuminator, prolong the lamp life-span.In addition, can the fluorescent lifetime of illuminator be made as 100msec～500msec, thereby measure the output characteristic of the slow solar cell of response characteristic through once glistening.
The slow part of the response characteristic of solar cell and fast part are different and different because of the solar cell kind.According to the difference of the kind of each solar cell, the change pattern of the load scanning speed of setting can improve the efficient of measuring the solar cell output characteristic.
The operating point of the part of solar cell low-response is owing to the difference of solar cell kind on the production line flow process is disperseed.In order to remedy this dispersion, set the pattern of different load scanning speed to each zone, thus the output characteristic of the solar cell that near the characteristic of optimal action point that can use identical pattern to measure the part of low-response is disperseed.
The light source that assay method of the present invention is not limited only to light continuously also can be used in the light source of pulsed illumination lamp.Therefore, also can use the middle pulse of fabric width about 4msec～10msec of the wave mode upper planar portion of led pulse to measure the output characteristic of the slow solar cell of response, reduce number of light emission times as far as possible, thereby prolong the lamp life-span.
The non-single light source that only limits to of assay method that utilizes solar simulator of the present invention also can use a plurality of light sources.Owing to can shorten the fluorescent lifetime of a plurality of light sources, thereby can reduce the price of solar simulator.
Description of drawings
Fig. 1 is the figure of the waveform of the single flash of light of expression.
Fig. 2 is the figure of the waveform of pulse flash of light in the expression.
Fig. 3 be embodiment of the present invention assay method solar simulator one the example calcspar.
The key diagram of the method for adjustment of the change speed of the electronic load of Fig. 4 when measuring the output characteristic as the solar cell of tested body among the present invention.
Fig. 5 is the key diagram of the present invention at the embodiment of Current Control.
Fig. 6 is the waveform key diagram under the elongated situation of minute under the single flash of light.
Fig. 7 is the key diagram of the embodiment of the present invention under voltage control.
Fig. 8 is repeatedly the key diagram of the embodiment of flash spotting.
Fig. 9 is the key diagram of change pattern of the electronic load command speed of embodiment 4.
Figure 10 is the figure that representes the illumination and the time relation of light stable with the illumination oscillogram of the light source light waveform of schematically representing existing solar simulator.
Figure 11 is the figure of the waveform of expression short flashing.
[main element symbol description]
1: illuminator
2: power circuit (comprising pulse fabric width control circuit etc.)
3: the luminance detection device
4: solar cell
5: electronic load device
6: computer
6a: data processing plate
6b: simulation output board
7: the data collection plate
8: the electronic load instruction circuit
Embodiment
Following with reference to the description of drawings embodiments of the invention.Fig. 1 is an employed single flash of light waveform in assay method of the present invention.Fig. 2 is the waveform of middle pulse flash of light.Fig. 3 be embodiment of the present invention assay method solar simulator one the example calcspar.The method of adjustment key diagram of the change speed of the electronic load of Fig. 4 when measuring the output characteristic as the solar cell of tested body among the present invention.Fig. 5 is the key diagram of the embodiment of the present invention under Current Control.Fig. 6 is the waveform key diagram of the elongated situation of minute under single flash of light.Fig. 7 is the key diagram of the present invention at voltage-controlled embodiment.Fig. 8 is repeatedly the key diagram of the embodiment of flash spotting.Fig. 9 is the key diagram of change pattern of the electronic load command speed of embodiment 4.
< 1>is used for the form of impulse waveform of the light source light of assay method of the present invention
Single flash of light is the DC power supply that uses exportable big electric current, the mode that the xenon lamp flash of light is lighted.As shown in Figure 1, the illumination of the initial part of optical pulse waveform fluctuates up and down, and illumination is constant subsequently.In the assay method that uses this single flash of light; Impulse waveform illumination keep constant during in; In the time of control load, collect, carry out the output mensuration of this solar cell from the electric current and the data of voltage exported as the solar cell of tested body.
In assay method of the present invention, light source light is non-to only limit to single flash of light, also can use the pulsed illumination lamp.The output characteristic of the slow solar cell of response is measured in the middle pulse of the fabric width that also can use led pulse waveform upper planar portion as shown in Figure 2 about as 4msec～10msec through assay method of the present invention.
< 2>structure of solar simulator
Fig. 3 representes the structure of the solar simulator of suitable assay method of the present invention.Solar simulator is made up of illuminator 1, power circuit 2 (containing pulse fabric width control circuit etc.), luminance detection device 3, electronic load device 5, computer 6, data processing plate 6a, simulation output board 6b, data collection plate 7 and electronic load instruction circuit 8.Solar cell 4 is a tested body.
Illuminator 1 has only 1 in Fig. 3, but also can be a plurality of.
Illuminator 1 can be an xenon lamp etc.Power circuit 2 contains pulse fabric width control circuit, makes the flatness of the upper planar portion of illumination waveform become required form.Owing to do not have direct relation with content of the present invention, therefore omit the explanation of its structure at this.Like the oscillogram of Fig. 1 illustration schematically, make illuminator 1 flash light emission through power circuit 2, the upper planar portion of control optical pulse waveform is below the above 500msec of about 100msec.The fabric width of light pulse must suitably be confirmed according to the response characteristic as the solar cell of tested body.For example, as shown in Figure 1 under the situation of the solar cell that response characteristic is slow, need the upper planar portion of impulse waveform be controlled at below the above 500msec of 100msec.Under the situation of the solar cell that response is very slow, can be adjusted to about maximum 500msec.Otherwise, the solar cell that response characteristic is fast, as shown in Figure 1, need the upper planar portion of impulse waveform be controlled to be less than 100msec, even less than 4msec.
When the upper planar portion of impulse waveform was about 100～500msec, even the solar cell of low-response, also not needing repeatedly glistens lit a lamp, only need once flash of light just can export mensuration.
As shown in Figure 3, in the above-described embodiment, the illumination of the illuminator 1 that flash of light is lit a lamp is through detecting with the lamp 1 relative luminance detection device 3 that is made up of solar cell.These luminance detection device 3 preferred solar battery cells that have identical performance with tested body that use.
In the solar simulator of the present invention, as tested body and need variable with current/voltage that the solar cell 4 of light source 1 opposite configuration is exported.Therefore, on the lead-out terminal of this solar cell 4, connect electronic load device 5.Electronic load device is made up of load circuit, DC power supply, shunt resistance etc.
Electric current that above-mentioned solar cell 4 is exported and voltage and luminance detection device 3 measured illumination data are collected through the data gathering system of solar simulator of the present invention.As shown in Figure 3, this data gathering system is by the computer 6 with data processing plate 6a and simulation output board 6b with being that the electronic circuit of collecting after the digital signal is that the data collection plate 7 that main body forms connects and composes with analog signal conversion.Electronic load instruction circuit 8 is connected computer 6 with electronic load device 5, data are sent to electronic load device 5 from computer 6.
< 3>adjustment of irradiation illumination
Below explanation when the output characteristic of measuring as the solar cell of tested body adjustment from the method for the illumination of the irradiates light that illuminator shone.
At first, the adjustment of luminance detection device 3 such as following carrying out.In the position that the solar cell 4 as determination object is disposed, the configuration baseline solar cell to be replacing solar cell 4, and luminance detection device 3 is disposed at the position of regulation.Set the data of short circuit current Isc with the open voltage Voc of benchmark solar cell in advance at data processing plate 6a.In luminance detection device 3, also set short circuit current Isc and the data of opening voltage Voc (or maximum power Pmax) at data processing plate 6a in advance.Then make xenon lamp 1 luminous, and measure the output of benchmark solar cell this moment and the output of luminance detection device 3.Can try to achieve the illumination of xenon lamp 1 from the output of benchmark solar cell, also can through will this moment output and the illumination of xenon lamp 1 of luminance detection device 3 carry out correspondingly, utilize luminance detection device 3 to measure the illumination of xenon lamp 1.
Data processing plate 6a is with predefined regulation illumination (1000W/m
2) compare at the operational part of computer 6 with luminance detection device 3 measured illumination.Output order according to the operation result of operational part control simulation output board 6b is adjusted illumination, and this simulation output board 6b is used to control the voltage that applies as the xenon lamp 1 of light source.In addition, simulation output board 6b also possesses the signal efferent, the control signal that output is controlled the charging voltage of DC power supply in the power circuit 2 of Fig. 2.
As stated, can obtain the illumination that makes xenon lamp 1 automatically and become regulation illumination (1000W/m
2) condition (applying voltage).Then, configuration replaces the benchmark solar cell and begins mensuration as the solar cell of tested body.The adjustment of luminance detection device 3 only need be carried out once, from beginning for the second time, just can be according to the luminance detection value of luminance detection device 3, and utilizing the operational part of computer 6 to ask for the illumination that makes xenon lamp 1 automatically becomes regulation illumination (1000W/m
2) condition (applying voltage).
So, in the present invention, can adjust the illumination of xenon lamp 1 automatically through the luminance detection device 3 and the operational part of computer 6, thus the past by manual operation, need the illumination adjustment of long duration, can accomplish at short notice.Because irradiation time does not increase, therefore, can not cause temperature rising as the solar cell of tested body.Therefore can improve in the existing method and to cause the characteristic variations of solar cell because of irradiation time is long, and therefore caused be difficult to carry out the shortcoming that pinpoint accuracy is measured.
One example of solar simulator of the present invention is according to constituting as stated.Then, with the modulating voltage of appropriateness illuminator 1 flash of light is lighted, and detect its illumination through luminance detection device 3.Measured illumination by data collection plate 7 collect the back, at operational part and the setting (1000W/m of data processing plate 6a
2) compare computing.If detection illumination is identical with setting or near (this scope is called allowed band), then directly carry out the output mensuration of solar cell 4.
Compare with setting when being higher or lower than allowed band if detect illumination, modulating voltage increases and decreases and illumination is controlled to be setting (comprising allowed band) automatically.Grasp the variation characteristic of modulating voltage and illumination in advance, can adjust illumination according to modulating voltage.
< 4>change of the indicated value of electronic load in the assay method of the present invention
When the adjusted illumination of method of adjustment of the irradiation illumination through above-mentioned < 3>during, control the electronic load device 5 that links to each other with solar cell 4 according to the output of instruction circuit 8, the curtage that increase and decrease is exported from solar cell 4 near setting.The in short-term chien shih command value of instruction circuit 8 about with 20 μ sec changes and electronic load device 5 scanned.When carrying out this kind load scanning, change sweep speed according to response characteristic as the solar cell of tested body.Fig. 4 is the key diagram of the change method of velocity of expression adjustment electronic load.The short circuit current Isc of benchmark solar cell is set in data processing plate 6a with the data in advance of opening voltage Voc and optimal action electric current I pm or optimal action voltage Vpm, voltage or electric current is changed in time implement.In the existing assay method that the dotted line of Fig. 4 is represented, voltage or electric current change with certain speed.In contrast, among the present invention, voltage or electric current are freely to change with respect to the time.Particular content is explained as follows.
< 5>embodiment 1 of assay method of the present invention
According to Fig. 5 the embodiment of following solar cell is described, near this solar cell (the regional M of Fig. 9) low-response and the soon current/voltage value (optimal action point) that shows maximum power in other load areas (the regional N1 of Fig. 9 and regional N2) response.In the present embodiment, instruct through the Current Control electronic load.According to the operating current of electronic load instruction manipulation solar cell, the magnitude of voltage of instrumentation from exporting as the solar cell of tested body.The time dependent pattern a of Fig. 5 (b) expression current-order, b, c.Fig. 5 (a) is the output characteristic curve that is obtained according to time dependent pattern a, b, the c of current-order.
At (a) of Fig. 5 and (b), the existing assay method of solar cell is measured in pattern a (dotted line) expression with the current-order of certain speed.Pattern b (single-point line) expression comes the existing assay method of instrumentation solar cell output characteristic with the current-order of slower certain speed.
The time dependent pattern of current-order in pattern c (solid line) the expression assay method of the present invention.In the figure, pattern c represent with pattern a with identical minute, at optimal action point periphery, adjust current-order, the situation of the output characteristic of instrumentation solar cell with the midrange speed of the change speed of the change speed of pattern a and pattern b.In assay method of the present invention; Because change the speed of current-order, even the slow solar cell of response characteristic can obtain the correct output characteristic curve c (solid line) shown in Fig. 5 (a) in the short as far as possible time according to the response characteristic of solar cell.
The pattern a of prior art instructs according to certain speed and changes current-order, therefore the current-order situation more Zao than solar cell response characteristic can take place.Under solar cell is failed the state of abundant response current command value, with regard to instrumentation characteristic of solar cell, the output characteristic curve a (dotted line) of the Fig. 5 (a) that therefore obtains, the inside part of the output characteristic that just is equivalent to measure.
The pattern b of prior art instructs according to certain speed and changes current-order, after solar cell fully responds, measures output characteristic again, has largely postponed current-order over time.Under this situation, the flash of light waveform of illuminator has shape as shown in Figure 6 and fluorescent lifetime (instrumentation time) is elongated.Fig. 6 (a) expression electronic load command speed (current-order) is pattern a, b and c over time.The flash of light waveform of illuminator during Fig. 6 (b) expression pattern b.Even if the output characteristic of instrumentation solar cell under this kind state, its output characteristic also are instrumentations under the state that solar cell can't fully respond current instruction value.Therefore, the output characteristic curve b of Fig. 5 that obtains (a) (single-point line), the inside part of the output characteristic that just is equivalent to measure.
As stated, prolong fluorescent lifetime (instrumentation time), the luminous thermal conductance of illuminator causes the mensuration that can't carry out pinpoint accuracy as the output characteristic reduction of the solar cell of tested body.In addition, the prolongation of instrumentation time can make the volume of lamp lighting device increase, thereby causes cost to increase.
Assay method of the present invention is measured the solar cell of low-response in the short as far as possible time, therefore can not produce the as above problem that is produced when the assay method that utilizes pattern a and pattern b is measured.
< 6>embodiment 2 of assay method of the present invention
The embodiment of the solar cell of following other modes is described according to Fig. 7; This solar cell is to show near (the regional M of Fig. 9) low-response current/voltage value (optimal action point) of maximum power, and responds fast solar cell at other load area (the regional N1 of Fig. 9 and regional N2).In the present embodiment, instruct through the voltage control electronic load.According to the operation voltage of electronic load instruction manipulation solar cell, the current value of instrumentation from exporting as the solar cell of tested body.The time dependent pattern a of Fig. 7 (b) expression voltage instruction, b, c.The output characteristic curve of Fig. 7 (a) for being obtained according to time dependent pattern a, b, the c of voltage instruction.
At (a) of Fig. 7 and (b), the existing assay method of solar cell is measured in pattern a (dotted line) expression with the voltage instruction of certain speed.Pattern b (single-point line) expression comes the existing assay method of instrumentation solar cell with the voltage instruction of slower certain speed.
The time dependent pattern of voltage instruction in pattern c (solid line) the expression assay method of the present invention.In this case, pattern c represent with pattern a with identical minute, at optimal action point periphery, adjust voltage instruction, the situation of the output characteristic of instrumentation solar cell with the middle change speed of the change speed of the change speed of pattern a and pattern b.In assay method of the present invention; Because change the speed of voltage instruction according to the response characteristic of solar cell; Therefore, the slow solar cell of response characteristic can obtain the correct output characteristic curve c (solid line) shown in Fig. 5 (a) in the short as far as possible time.
The pattern a of prior art instructs according to certain speed and changes voltage instruction over time, therefore the voltage instruction situation more Zao than solar cell response characteristic can take place.Under solar cell is failed the state of abundant response voltage command value, with regard to instrumentation characteristic of solar cell, the inside part of the output characteristic that the output characteristic curve a (dotted line) of the Fig. 7 (a) that therefore obtains just is equivalent to measure.
The pattern b of prior art instructs according to certain speed and changes voltage instruction over time, after solar cell fully responds, measures output characteristic again, has largely postponed voltage instruction over time.Even if the output characteristic of instrumentation solar cell under this kind state, its output characteristic also are instrumentations under the state that solar cell can't fully respond voltage instruction value.The inside part of the output characteristic that the output characteristic curve b of Fig. 7 that therefore, obtains (a) (single-point line) just is equivalent to measure.
Identical with embodiment 1, prolong fluorescent lifetime (instrumentation time), the luminous thermal conductance of illuminator causes the mensuration that can't carry out pinpoint accuracy as the output characteristic reduction of the solar cell of tested body.In addition, the prolongation of instrumentation time can make the volume of lamp lighting device increase, thereby causes cost to increase.
In the assay method of the present invention, in the short as far as possible time, measure the solar cell of low-response, therefore can not produce the as above problem that is produced when the assay method that utilizes pattern a and pattern b is measured.
< 7>embodiment 3 of assay method of the present invention
When using the light source of fluorescent lifetime weak point, as shown in Figure 8, it is repeatedly glistened, cut apart mensuration.For example according to the single-point line b of the existing assay method of embodiment 1 with under the time dependent situation of electric current; When measuring the output characteristic of the quite slow solar cell of response characteristic, can impulse waveform be divided into and the suitable measuring point of impulse waveform A portion and B portion of Fig. 8 (a).At the first luminous place of Fig. 8 (b), assay method according to the present invention is measured the A portion measuring point of Fig. 8 (a).At the second luminous place of Fig. 8 (b), assay method according to the present invention is measured the B portion measuring point of Fig. 8 (a).The same with the pattern c of Fig. 5 (b) and Fig. 7 (b); After through assay method of the present invention load command speed suitably being adjusted; Use cheap lamp lighting device; Under the situation of the output characteristic that does not change solar cell, can obtain the characteristic of solar cell of pinpoint accuracy at short notice.
< 8>embodiment 4 of assay method of the present invention
The response characteristic of solar cell is different with the kind of solar cell, even if the solar cell of identical type is also variant.The difference of the response characteristic of solar cell is represented the dispersion of the optimal action point position of response characteristic.To comprise optimal action point the zone be set at regional M, the zone except that this is set at regional N1 and regional N2.And will carry out medelling in the alter mode of the electronic load indicated value of regional M, N1 and N2.Fig. 9 is the key diagram of mode initialization.The dispersity of schematically having represented the optimal action point of 3 kinds of solar module A, B, C among the figure; And set the regional M of electronic load indicated value, and postpone to set the change speed of load according to the response speed of solar module with the mode that comprises this optimal action point.In addition regional N1 and N2 then accelerate the change speed of electronic load.
Set the change pattern of the change speed of electronic load according to the difference of solar cell kind, can measure the output characteristic of the solar cell that the optimal action point of the part with low-response disperses with identical change pattern.When on production line, the output characteristic of the slow solar cell of multiple type response characteristic being measured, the change pattern of the change speed through setting electronic load respectively can easily corresponding machine change.
Claims (7)
1. assay method that utilizes solar simulator, this method comprises:
Light at least more than one light source simultaneously, the top of sending impulse waveform is the operation of the flash of light of flat condition; And
With this flash irradiation to carrying out illumination control as the solar cell of tested body and through the luminance detection device when, the electronic load and the multi-site determination that scan this solar cell be from the electric current of solar cell output and the mensuration operation of voltage,
The said assay method of solar simulator that utilizes is characterised in that,
To should flash of light the time as the irradiation of the solar cell of tested body, according to the response characteristic of this solar cell and variable control to the indication speed of electronic load instruction, measure electric current and voltage that this solar cell is exported.
2. assay method that utilizes solar simulator, this method comprises:
Light at least more than one light source simultaneously, the top of sending impulse waveform is the operation of the flash of light of flat condition; And
With this flash irradiation to carrying out illumination control as the solar cell of tested body and through the luminance detection device when, the electronic load and the multi-site determination that scan this solar cell be from the electric current of solar cell output and the mensuration operation of voltage,
The said assay method of solar simulator that utilizes is characterised in that,
When the solar cell as tested body is shone this flash of light; According to the response characteristic of this solar cell and variable control to the indicated value of electronic load instruction and the sweep speed of adjustment electronic load instruction automatically, measure electric current and voltage that this solar cell is exported.
3. the assay method that utilizes solar simulator according to claim 1 and 2 is characterized in that,
This flash irradiation is arrived the solar cell as tested body; Set the pattern of the sweep speed of numerous variations electronic load for each zone of the electronic load that is scanned; And select corresponding pattern to come the scanning electron load according to the response characteristic of the solar cell of tested body, measure electric current and the voltage exported as the solar cell of tested body.
4. according to each described assay method that utilizes solar simulator in the claim 1 to 3, it is characterized in that,
According to the minute of the solar cell of tested body, make light source luminous at least once more than, the measuring point of electric current and voltage is divided into multiple spot respectively measures.
5. according to each described assay method that utilizes solar simulator in the claim 1 to 4, it is characterized in that,
The fabric width of the upper planar portion of the optical pulse waveform of said flash of light is below the above 500msec of 100msec.
6. solar simulator, it has:
Light source, it is to the solar cell illumination flash as tested body;
The luminance detection device, it detects the flash of light illumination of this light source;
The load circuit of said tested body, it has electronic load;
Control circuit, it carries out scan control to said electronic load; And
Data collection portion, it collects the electric current that said tested body exports and the data of voltage;
Said solar simulator is characterised in that,
The said control circuit of scan control electronic load is when shining this flash of light to the solar cell as tested body; According to the response characteristic of this solar cell and variable control to the indication speed of electronic load instruction, measure electric current and voltage that this solar cell is exported.
7. solar simulator, it has:
Light source, it is to the solar cell illumination flash as tested body;
The luminance detection device, it detects the flash of light illumination of this light source;
The load circuit of said tested body, it has electronic load;
Control circuit, it carries out scan control to said electronic load; And
Data collection portion, it collects the electric current that said tested body exports and the data of voltage,
Said solar simulator is characterised in that,
The said control circuit of scan control electronic load is when shining this flash of light to the solar cell as tested body; According to the response characteristic of this solar cell and variable control to the indicated value of electronic load instruction; Automatically the sweep speed of adjustment electronic load instruction is measured electric current and voltage that this solar cell is exported.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009273143A JP5328041B2 (en) | 2009-12-01 | 2009-12-01 | Solar simulator and measurement method using solar simulator |
| JP2009-273143 | 2009-12-01 | ||
| PCT/JP2010/071535 WO2011068142A1 (en) | 2009-12-01 | 2010-11-25 | Solar simulator and measurement method using same |
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| CN102742021A true CN102742021A (en) | 2012-10-17 |
| CN102742021B CN102742021B (en) | 2015-09-09 |
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| CN201080062832.6A Expired - Fee Related CN102742021B (en) | 2009-12-01 | 2010-11-25 | Solar simulator and utilize the assay method of solar simulator |
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| JP (1) | JP5328041B2 (en) |
| CN (1) | CN102742021B (en) |
| TW (1) | TWI586219B (en) |
| WO (1) | WO2011068142A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109000737A (en) * | 2018-09-21 | 2018-12-14 | 国网辽宁省电力有限公司电力科学研究院 | A kind of transmission line of electricity monitoring sensor solar energy-battery group test method |
| CN110361089A (en) * | 2019-06-13 | 2019-10-22 | 上海复瞻智能科技有限公司 | A kind of transient state photometric detection device of optical analog |
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| JPS6169290A (en) * | 1985-09-13 | 1986-04-09 | Hitachi Ltd | Color deviation correcting circuit |
| JP5761372B2 (en) * | 2011-12-05 | 2015-08-12 | コニカミノルタ株式会社 | Device for measuring spectral sensitivity of solar cells |
| JP6140814B2 (en) * | 2012-05-14 | 2017-05-31 | テュフ ラインランド（シャンハイ）カンパニー リミテッド | Photovoltaic element evaluation method, measurement system configuration, and method of using the measurement system configuration |
| TWI487887B (en) * | 2014-03-19 | 2015-06-11 | Ind Tech Res Inst | Apparatus and method for inspecting light source |
| US9866171B2 (en) | 2015-10-13 | 2018-01-09 | Industrial Technology Research Institute | Measuring device for property of photovoltaic device and measuring method using the same |
| CN105551991B (en) * | 2015-12-14 | 2018-04-17 | 西安交通大学 | A kind of solar energy low power Condensation photovoltaic battery indoor test device and test method |
| CN112781619A (en) * | 2020-12-30 | 2021-05-11 | 中电科仪器仪表(安徽)有限公司 | Side-lighting simulator suitable for AM0 spectrum |
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| JP2003031825A (en) * | 2001-07-13 | 2003-01-31 | Nisshinbo Ind Inc | Solar simulation method for measuring solar cell, and solar simulator using the same |
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| US6876187B2 (en) * | 2000-07-04 | 2005-04-05 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion characteristics |
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- 2010-11-25 CN CN201080062832.6A patent/CN102742021B/en not_active Expired - Fee Related
- 2010-11-25 WO PCT/JP2010/071535 patent/WO2011068142A1/en active Application Filing
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| JP2003031825A (en) * | 2001-07-13 | 2003-01-31 | Nisshinbo Ind Inc | Solar simulation method for measuring solar cell, and solar simulator using the same |
| US20040056648A1 (en) * | 2002-07-26 | 2004-03-25 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
| CN1892239A (en) * | 2005-06-17 | 2007-01-10 | 日清纺织株式会社 | Measurement method using solar simulator |
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| CN110361089A (en) * | 2019-06-13 | 2019-10-22 | 上海复瞻智能科技有限公司 | A kind of transient state photometric detection device of optical analog |
Also Published As
| Publication number | Publication date |
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| TW201146090A (en) | 2011-12-16 |
| CN102742021B (en) | 2015-09-09 |
| TWI586219B (en) | 2017-06-01 |
| JP2011119322A (en) | 2011-06-16 |
| WO2011068142A1 (en) | 2011-06-09 |
| JP5328041B2 (en) | 2013-10-30 |
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